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1998 Modeling Stresses of Contacts in Wire Saw Slicing
1998 Modeling Stresses of Contacts in Wire Saw Slicing
1998 Modeling Stresses of Contacts in Wire Saw Slicing
1 Introduction with abrasives is supplied and carried by the wire during the
cutting process.
Wire saw slicing is an emerging technology for wafer produc-
According to the nature of its manufacturing process, the
tion in photovoltaic (PV) and semiconductor industry because
wiresaw cutting belongs to the category of free abrasive machin-
of its ability to cut crystalline and polycrystalline ingots and
ing (FAM), and can be classified as machining of brittle materi-
produce a very thin wafer with a small kerf loss and high yield. als with loose abrasive particles. The abrasives (e.g., SiC) are
It is being commonly used for the production of Si wafers in
free third-body particles caught at the contact surface, that are
PV industry, and has the potential to find widespread application
forced by the wire to attack the silicon ingot surface like a
for ingots with large diameters and of ceramic materials. A
number of minute cutting agents. For lightly loaded particles,
schematic of the wire saw is shown in Fig. 1. The single wire
only plastic indentation is formed, and there is no material
is fed from the supply spool through the pulley and tension
removal. With heavily loaded particles they penetrate and indent
control unit to the four wire guides that are grooved with a
the surface to a certain depth and cause isolated chips and cracks
constant pitch, p. The take-up spool collects the used wires.
to form. Superposition of the normal and tangential forces as
Multiple strands of wire web are formed by winding the wire
well as the motion of the high speed wire at indentation cause
on the wire guides through grooves. Such wire web can provide
the rolling motions of the abrasive particles, generating lever
100 to 400 wires to slice an ingot into hundreds of wafers, at
effects. Due to this rolling-indentingprocess and the stress con-
the same time, when the ingot is fed in the direction shown.
centration resulting from surface discontinuity and cracks, large
The wire is pulled by the torque exerted by the main drive and
slave drive, as shown. The tension on the wire is maintained stresses are transmitted to the material and cause it to splinter
by the feedback control unit at a prescribed value. The wire and form cracks and chips. The grip particle is then unloaded
can move at a speed of 5 to 15 m/s in both directions by and free to resume its rolling motion when constrained once
again to indent. An illustration of this process is shown in Fig.
reversing the direction of the main and slave drives. The slurry
2. The rolling-indenting motions of all grip particles cause the
wire to slice the materials with which the contact is made.
Contributedby the Electricaland ElectronicPackagingDivisionfor publication In this paper, we propose a contact stress model due to the
in the JOURNALOFELECTRONICPACKAGING.Manuscriptreceivedby the EEPD
March 12, 1997;revisionreceivedJanuary29, 1998. AssociateTechnicalEditor: rolling-indentingprocess for wire saw slicing. Stresses incurred
A. J. Rafanelli. during the cutting process are derived as dimensionless stress
Journal of Electronic Packaging Copyright © 1998 by ASME JUNE 1998, Vol. 120 / 123
ire guid
wire we
Fig. 1 Schematic of wire saw used in slicing ingots. A wire web is formed
by winding a single wire along the grooved wire guides. The abrasive
slurry is poured between the wire web and the ingot.
Fig. 2 Illustration of the rolling-indenting process. Due to the combina-
tion of the tangential and normal forces applied by the wire on the SiC
measures, which are functions of normalized dimensionless pa- abrasive, the surface indentation occurs on the silicon ingot (hardness
of SiC: 2500 Kg/mm2; of Si: 1000 Kg/mm=). Moreover, the SiC will roll in
rameters of coordinates. The results can be used to predict the the direction shown due to the moving wire. As a result, chips are formed
stresses caused by the wire saw slicing and to determine the on the substrate surface.
optimal size and geometry of the abrasives.
Nomenclature
a = radius of the uppermost level of in- cr = stress (subscripts indicating the di- = dimensionless geometric parameter
denting cone which remains in con- rection) (4 = z / a )
tact u = strain (subscripts indicating the di- # = coefficient of friction between wire
e = penetration depth of the contact area rection) and medium surface
b = penetration depth of noncontact area N = normal force applied on the abrasive R = rotation matrix
a = angle of the indenting tip of abrasive f = tangential force (ff = #N) C., = parameter related to material prop-
E = Young's modulus of the medium p = dimensionless geometric parameter erties and contact
u = Poisson ratio of the medium (p = r/a)
///
Fig. 4 The indentation model for the abrasive on the material surface.
Oto'qr-VOrz
The parameters are as follows: a--radius of the uppermost level of the
indenting cone which remains in contact with the medium (Si ingot); ~ - - Fig. 5 Components of stress elements due to the forces applied by the
depth of the contact areas from the vertex to the level of circle with indenting abrasive particle. The distance of the stress element from the
radius a; b--distance of the nonoontact area to the original surface of origin is R, with a projection of r onto the xy-plane and z onto the z-axis.
the medium; O - - t h e origin of coordinate frame; V - - t h e vertex of the The normal stresses, ~Tr, 0"0, and ¢, as well as the shear stress o% are
cone of the abrasive. shown.
7raeE ,/f12 + 4 ~ + 4
N = 2(1 - u2) • (15)
3.2.2 Stresses Due to the Tangential Force. The tangen- where Cm = / d ( 4 ( 1 -- U2)) is a parameter related to material
tial force at the contact can be expressed as f = # N if the properties and contact.
coefficient of friction, #, is constant and known. We consider Since we assume that the tangential force is acting along the
this tangential force as a concentrated force in an infinite elastic x-direction, i.e., at y = 0 plane, the above equations can be trans-
medium (ingot) acting along the direction of 0 = 0, or the x- formed to cylindrical coordinate system and be rewritten as
direction of the Cartesian coordinates. This is known as the
ao-r Cmp~
Cerruti's problem (Mal and Singh, 1991). The Cartesian coor-
eE (pZ _1_ 42)3/2
dinate system is chosen here for convenience. The stress compo-
nents can be written in terms of the Cartesian coordinates.
= -----~
2rrR
12 (
_ -R- T + (R -7-772 R 2 _ y2 _ R + z / (16)
× p2+42 +((~-+4~+4)~(p~+42) (27)
ac% _ C,,,px [ 1 - 2u
cry =
fx
- -
[ _ 3 y 2 _l=2u
+
{3R 2 - x 2 -
2Rx2~] ~E (p2 + 42)3,2 [_(,fp2 + 42 + 4)2
27rR3[ - ~ - (R+z)2\ R+zJJ (17)
3 ftxz 3
2 +42p:]
(18)
crz -- 27rR 5
fY 3X 2 1 - 2u a a r o _ aao~_ O. (29)
~ -- -2~R3
- - - ~ - + -( -e- - -+- ~z) eE eE
1.5
1,0
1.5
L\:: /
a~& E e. aoJE E /
2.0 I I I 2.0
Fig. 6 Stress contours of Cx at 0 = 0 w i t h / x = 0.05. The Poisson ratio Fig. 8 Stress contours of ¢ , at 0 = 0 w i t h / ~ = 0.05 and v = 0.12
of silicon is ~ = 0.12.
x/a x/a
-2 -1 0 1
I / ~ I -2 -1 0 1 2
0.0
) 0.0
0.5 0.5
2.0 I I I 2.0
Fig. 7 Stress contours of ~ry at 0 = 0 w i t h / ~ = 0.05 and v = 0.12 Fig. 9 Stress contours of ~ x at 0 = 0 w i t h / ~ = 0.05 and J, = 0.12
2.2E-1 Acknowledgment
1.5 ~ The research has been supported by NSF (Grant No. DMI-
9634889) and GT Equipment Inc. (a phase II SBIR grant from
2.0 N [ I
/ DoE DE-FG02-95ER81978).