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PROTECTION PERFORMANCE TESTING IN IEC 61850, Liyang2010
PROTECTION PERFORMANCE TESTING IN IEC 61850, Liyang2010
BASED SYSTEMS
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Li Yang*, Peter Crossley*, Xin Sun**, Miles Redfern**, Wen An , Henri Grasset
Keywords: lEC 61850, Protection schemes, Performance comprehensive formal description of the substation
testing. automation system and the relationship of its functions to the
single line diagram representing the primary equipment
Abstract provided by System Configuration Language (SCL). It
provides a very high potential both for testing and
IEC 61850 offers significant advantages when compared maintenance of the system over its complete life-cycle.
against other substation communication protocols; in
particular the replacement of analogue and binary signals with Protection performance testing plays a very important role in
Ethernet messages reduces the cost of the system and the electric power system engineering, because it ensures that
improves flexibility and functionality. However, it also the protection functions implemented in relays of different
requires a new type of test bench suitable for the functional types are going to operate as designed in order to ensure the
and performance testing of IEC 61850 compatible protection fastest possible fault clearing. This paper will review the
relays and systems. Test sets used in such applications need to features of testing for conventional protection relays. New
have the functionality to perform coordinated and precisely approaches based on RTDS system and OMICRON test set
synchronised tasks as a part of a distributed, system wide test for IEC 61850 compatible relays will be investigated.
facility.
Methods for testing conventional protection relays will be 2 Review of conventional testing
reviewed and some of the issues that affect how we test the
next generation of relays will be discussed; the paper will also Generally, all testing improves the quality and reduces risks
investigate new approaches for testing IEC 61850 compatible both for the suppliers and consumers. Traditionally relays are
relays based on the Real Time Digital Simulator (RTDS) and tested by injecting signals, to check their current, voltage and
the OMICRON test set. The structure and implementation of contact input hardware, to check that the measuring elements
a new RTDS system based on IEC 61850 standard are and scheme logic are operating correctly, to check that their
proposed. A test model connecting the RTDS system and the settings are correct, and to check the contact output hardware.
secondary digital devices will be presented.
For substation automation, testing from device to system
levels was described, analysed and summarised in the Cigre
1 Introduction report 236 [2] . This report was used as input for IEC 618750-
10 defining conformance testing, but its content covers more
The widely deployment of Intelligent Electronic Devices than what are included in the standard. Detailed conformance
(lED), such as non-conventional instrument transformers testing procedures are issued and test centers were qualified
(NCIT, optical voltage and current transformers) and digital by UCA International Users Group - Subgroup Testing [3].
relays, has facilitated the implementation of next-generation This Cigre report also discusses the difference between
protection systems. The digital output signals of NCIT work product/device, system and project related testing.
as the input signals for the digital relays through a process bus
based on IEC 61850-9-2 standard. The process bus The R&D Testing sequence should start from Device Type
technology shows how NCIT break the constraints of Test, followed by the Integration Test and end with the
conventional CTs and VTs. It enables the use of a digital link System Test. The Conformance Test is the type test for
between electronic current/voltage transformers or merging standards like IEC 61850 for communication. Successful
units (MUs) and bay devices such as protective relays, bay Type Tests are the prerequisite to start the Integration Test,
controllers or meters [1]. where the new product is tested in a small fixed test system.
As the international standard for communications in For conventional testing the test device has to simulate the
substations, the key feature of IEC 61850 is its substation process through hard-wired interface between the
analogue and binary outputs of the test device and the synchronised tasks as a part of a distributed, system wide test
analogue and binary inputs of the test object. At the same facility.
time the test device has to monitor the relay outputs of the test
object in order to detect the operation of the lED and analyse The utilisation of system configuration information, the
it to determine if the performance meets the specification. The GOOSE mechanism, Sampled Values and Client/Server
operating time is usually measured by the test device from the SCADA Communication introduce several new issues for
simulated process change of state that has to trigger the tested testing the next generation of relays. The most obvious
function until the moment when it detects the operation of the change is the different way of wiring to obtain the signals.
lED relay output controlled by the tested function. The availability of machine readable, system wide
configuration information enables new, automated procedures
Traditionally protection test procedures are based on the use for the configuration of tests.
of test switches (e.g. FT switches); but that such test switches
are impractical with process bus applications. Analogue and The system configuration language implemented by IEC
contact signals accessed by traditional methods via test 61850 standard defines a file format that describes the
switches are remote from the relay location, and are components of the substation and the protection and
distributed throughout the substation. If test switches were to automation system in a way that allows most of the
be placed on the merging unit/process equipment interface, engineering tasks to be performed automatically.
impractically long testing leads would be required to establish
connection to a conventional test set. In addition there could OMICRON test sets are very well adopted in protection
be technical and safety problems due to the noise induced in relays testing. It utilise the NetSim Software (Network
such leads. Fortunately, test switches can and should be Simulator) , which provides predefined Test Cases and
designed out of schemes employing microprocessor-based Network Configurations to perform the tests. Standard
equipment, as is explained in reference [4]. The same network configurations with a simple parameter setup allow
argument applies to process bus schemes. When test switches instant "click and run" simulations with signal outputs via the
are designed out, it is of course necessary to use new test set. Fig. 1 shows the utilisation of system configuration
procedures adopting the advanced capabilities of modem information for testing a "stand-alone" relay.
protection equipment instead of test switches - this applies
equally for process bus systems where such switches are not
System
feasible. Configurator
It is a combination of advanced computer hardware and 4.2 Design of a new RTDS testing system.
Digital Voltage/Current
Monitoring
Signals
j
Fig. 4. Schematic diagram of RTDS close-loop testing design.
r------------------------ -- --- -------------------------- ------------------------------ -- --- -------------
FlTBUS REBUS !
The connection between the RIDS system and the CIM can
be configured as analogous to accommodate the existing
testing system as an intergradation phase. Otherwise, this
connection can be configured as digitised which means there
is a direct connection between the RTDS system and the CIM.
Fig. 6. RIDS based test system using GTNET
This is shown in Fig. 5.
Now with process bus, the relay has no physical current,
voltage or contact inputs, so there is no corresponding
hardware to check. The hardware performing a somewhat
analogous function, the optical transceivers, PRY chip, etc.,
are continuously self-tested with signal level margin detectors
and with data security codes (Le. CRC), so there is little if any
value in further testing the relay's process bus input/output
Fig. 5. Connection diagram between RTDS system and CIM hardware. The firmware that implements the measuring
elements and scheme logic is continuously checked again by
CRC, and the processors by watchdog timers.
4.2 Implementation of this new RTDS testing system.
References