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Infn S A0004165546 1
Infn S A0004165546 1
Infn S A0004165546 1
IR MOSFET - StrongIRFET™
D VDSS 300V
RDS(on) typ. 33m
G
Benefits
G D S
Improved Gate, Avalanche and Dynamic dv/dt Ruggedness
Gate Drain Source
Fully Characterized Capacitance and Avalanche SOA
Enhanced body diode dv/dt and di/dt Capability
Pb-Free ; RoHS Compliant ; Halogen-Free
Standard Pack
Base part number Package Type Orderable Part Number
Form Quantity
IRF300P227 TO-247AC Tube 25 IRF300P227
125 60
RDS(on), Drain-to -Source On Resistance (m )
I D = 30A
105
45
ID, Drain Current (A)
85
TJ = 125°C
65 30
45
TJ = 25°C
15
25
5 0
2 4 6 8 10 12 14 16 18 20 25 50 75 100 125 150 175
Figure 1 Typical On-Resistance vs. Gate Voltage Figure 2 Maximum Drain Current vs. Case Temperature
Final Datasheet Please read the important Notice and Warnings at the end of this document V2.0
www.infineon.com 2017-11-14
IR MOSFET-StrongIRFET™
IRF300P227
Table of Contents
Table of Contents
Applications …..………………………………………………………………………...……………..……………1
Benefits …..………………………………………………………………………...……………..…………….1
Ordering Table ….……………………………………………………………………………………………………1
Table of Contents ….………………………………………………………………………………………………...2
1 Parameters ………………………………………………………………………………………………3
2 Maximum ratings, Thermal, and Avalanche characteristics ………………………………………4
3 Electrical characteristics ………………………………………………………………………………5
4 Electrical characteristic diagrams ……………………………………………………………………6
Package Information ………………………………………………………………………………………………14
Qualification Information ……………………………………………………………………………………………15
Revision History …………………………………………………………………………………………..…………16
1 Parameters
Notes:
Repetitive rating; pulse width limited by max. junction temperature.
Limited by TJmax, starting TJ = 25°C, L = 1mH, RG = 50, IAS = 30A, VGS =10V.
ISD 20A, di/dt 1000A/µs, VDD V(BR)DSS, TJ 175°C.
Pulse width 400µs; duty cycle 2%.
Coss eff. (TR) is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS.
Coss eff. (ER) is a fixed capacitance that gives the same energy as Coss while VDS is rising from 0 to 80% VDSS.
R is measured at TJ approximately 90°C.
This value determined from sample failure population, starting TJ = 25°C, L= 1mH, RG = 50, IAS = 30A, VGS =10V.
3 Electrical characteristics
Table 5 Static characteristics
Values
Parameter Symbol Conditions Unit
Min. Typ. Max.
Drain-to-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 1mA 300 - - V
Breakdown Voltage Temp. Coefficient V(BR)DSS/TJ Reference to 25°C, ID = 1.0mA - 0.12 - V/°C
Static Drain-to-Source On-Resistance RDS(on) VGS = 10V, ID = 30A - 33 40 m
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 270µA 2.0 - 4.0 V
VDS = 240V, VGS =0V - - 10
Drain-to-Source Leakage Current IDSS µA
VDS = 240V,VGS = 0V,TJ =125°C - - 300
Gate-to-Source Forward Leakage IGSS VGS = 20V - - 100 nA
Gate Resistance RG - 2.7 -
IS - - 50
(Body Diode) showing the
G A
Pulsed Source Current integral reverse
ISM - - 189
(Body Diode) p-n junction diode.
S
1000 1000
VGS VGS
TOP 15V TOP 15V
10V 10V
7.0V 7.0V
6.0V 6.0V
5.5V 5.5V
100 5.0V 100 5.0V
4.5V 4.5V
BOTTOM 4.0V BOTTOM 4.0V
10 10 4.0V
4.0V
1000 3.2
I D = 30A
2.8
RDS(on) , Drain-to-Source On Resistance
VGS = 10V
I D, Drain-to-Source Current (A)
100 2.4
2.0
TJ = 175°C
(Normalized)
10 1.6
TJ = 25°C
1.2
1.0 0.8
VDS = 50V
60µs PULSE WIDTH 0.4
0.10 0.0
2 3 4 5 6 7 8
-60 -20 20 60 100 140 180
VGS, Gate-to-Source Voltage (V) TJ , Junction Temperature (°C)
1000000
VGS = 0V, f = 1 MHZ
14
Ciss = C gs + C gd, C ds SHORTED
100000 Crss = C gd I D= 30A
Coss = C ds + C gd 12
10 VDS= 150V
Ciss
VDS= 60V
1000 8
Coss
6
100 Crss
4
10
2
1
1 10 100 1000 0
VDS, Drain-to-Source Voltage (V) 0 10 20 30 40 50 60 70 80 90
Q G, Total Gate Charge (nC)
Figure 7 Typical Capacitance vs. Drain-to-Source Figure 8 Typical Gate Charge vs. Gate-to-Source
Voltage Voltage
1000
I SD, Reverse Drain Current (A)
100
TJ = 175°C
10
TJ = 25°C
VGS = 0V
0.1
0.0 0.4 0.8 1.2 1.6 2.0
VSD, Source-to-Drain Voltage (V)
1000
100
I D, Drain-to-Source Current (A)
100µsec
10
1msec
OPERATION IN THIS AREA
1 LIMITED BY R DS(on) 10msec
DC
0.1 Tc = 25°C
Tj = 175°C
Single Pulse
0.01
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
360 12
V(BR)DSS, Drain-to-Source Breakdown Voltage (V)
Id = 1.0mA
350 10
340 8
Energy (µJ)
330 6
320 4
310 2
300 0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180 0 50 100 150 200 250 300 350
140 4.5
RDS(on), Drain-to -Source On Resistance (m )
20 1.0
0 25 50 75 100 125 150 175 200 -75 -50 -25 0 25 50 75 100 125 150 175
I D, Drain Current (A) TJ , Temperature ( °C )
Figure 13 Typical On-Resistance vs. Drain Figure 14 Threshold Voltage vs. Temperature
Current
D = 0.50
Thermal Response ( Z thJC ) °C/W
0.1 0.20
0.10
0.05
0.01 0.02
0.01
0.001
SINGLE PULSE Notes:
( THERMAL RESPONSE ) 1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
0.0001
1E-006 1E-005 0.0001 0.001 0.01 0.1
t 1 , Rectangular Pulse Duration (sec)
100
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming Tj = 150°C and
Tstart =25°C (Single Pulse)
Avalanche Current (A)
10
exceeded.
3. Equation below based on circuit and waveforms shown in
300 Figures 23a, 23b.
4. PD (ave) = Average power dissipation per single avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for voltage
increase during avalanche).
200 6. Iav = Allowable avalanche current.
7. DT = Allowable rise in junction temperature, not to exceed Tjmax
(assumed as 25°C in Figure 15, 16).
tav = Average time in avalanche.
100 D = Duty cycle in avalanche = tav ·f
ZthJC(D, tav) = Transient thermal resistance, see Figures 14)
PD (ave) = 1/2 ( 1.3·BV·Iav) = T/ ZthJC
Iav = 2T/ [1.3·BV·Zth]
0 EAS (AR) = PD (ave)·tav
25 50 75 100 125 150 175
Starting T J , Junction Temperature (°C)
50 60
I F = 20A I F = 30A
VR = 150V 50 VR = 150V
40
TJ = 25°C TJ = 25°C
TJ = 125°C TJ = 125°C
40
30
I RRM (A)
I RRM (A)
30
20
20
10
10
0 0
100 200 300 400 500 600 700 800 900 1000 100 200 300 400 500 600 700 800 900 1000
diF /dt (A/µs) diF /dt (A/µs)
Figure 18 Typical Recovery Current vs. dif/dt Figure 19 Typical Recovery Current vs. dif/dt
2500 3000
I F = 20A I F = 30A
VR = 150V 2500 VR = 150V
2000
TJ = 25°C TJ = 25°C
TJ = 125°C TJ = 125°C
2000
1500
QRR (nC)
QRR (nC)
1500
1000
1000
500
500
0 0
100 200 300 400 500 600 700 800 900 1000 100 200 300 400 500 600 700 800 900 1000
diF /dt (A/µs) diF /dt (A/µs)
Figure 20 Typical Stored Charge vs. dif/dt Figure 21 Typical Stored Charge vs. dif/dt
Figure 22 Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET™ Power MOSFETs
Figure 23a Unclamped Inductive Test Circuit Figure 23b Unclamped Inductive Waveforms
Figure 24a Switching Time Test Circuit Figure 24b Switching Time Waveforms
Figure 25a Gate Charge Test Circuit Figure 25b Gate Charge Waveform
5 Package Information
6 Qualification Information
Qualification Information
Industrial
Qualification Level (per JEDEC JESD47F) †
Revision History
Major changes since the last revision
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IMPORTANT NOTICE
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Edition 2015-05-06 The information given in this document shall in no delivery terms and conditions and prices please
Published by event be regarded as a guarantee of conditions or contact your nearest Infineon Technologies office
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values stated herein and/or any information WARNINGS
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