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Tema 1 Introduction To Measurement Theory-S2020 - Second Part
Tema 1 Introduction To Measurement Theory-S2020 - Second Part
True
Value ?
#1 : 5.5 cm.
#2 : 5.4 cm.
#3 : 5.1 cm.
#4 : 5.3 cm. Measurement Results
#5 : 5.15 cm.
P 90 95 99
1 6.31 12.71 63.66
2 2.92 4.30 9.92
3 2.35 3.18 5.84
¿L? 4
5
2.13
2.02
2.78
2.57
4.60
4.03
6 1.94 2.45 3.71
7 1.89 2.36 3.50
8 1.86 2.31 3.36
9 1.83 2.26 3.25
10 1.81 2.23 3.17
∞ 1,6 1.96 2.58
So, we look at the tables of the probability distribution and see
#1 : 5.5 cm. that for a determinate probability there is a constant (k) that
#2 : 5.4 cm. depends of the number of readings (degrees of freedom in the
#3 : 5.1 cm. case of t‐student distribution.
#4 : 5.3 cm.
5 readings are 4 degrees of freedom, and for a probability of 95%,
#5 : 5.1 cm. we obtain a k constant : k = 2.78 (P = 95%, t‐student (N‐1 = 4))
Now, we express our measurement result as:
L= mean ± k∙ s
¿L? That is: L = 5.28 ± 0.22 cm (k = 2.78)
for a confidence margin of 95%
This should be interpreted as the length can be any value between
4.06 cm and 5.50 cm with a 95% of probability
That is, there is a 5% of probability that the length were less than
4.06 5.28 5.5
4.06 cm and more than to 5.50 cm .
P=95%
5 Juan José Ramos Castro & Mireya Fernández Chimeno
ETSETB-DEE-UPC ELECTRONIC INSTRUMENTATION & OPTOELECTRONICS
uc ( y ) g (u ( x1 ), u ( x2 )...., u ( xn ))
6 Juan José Ramos Castro & Mireya Fernández Chimeno
ETSETB-DEE-UPC ELECTRONIC INSTRUMENTATION & OPTOELECTRONICS
u c ( y) g (u ( x 1 ), u ( x 2 )...., u ( x n ), x 1 , x 2 ....x n )
To estimate the uncertainty of y is necessary to know the
uncertainty of each of the input variables . For this, ISO
Guide to the expression of uncertainty in measurement
describes two methods:
N independent measurements.
N
1
Arithmetic Mean q
N
qk
k 1
2
Adjusted standard sq
1 n
qk q
deviation N 1 k 1
s(q)
Experimental standard u (q ) s(q )
N
deviation of the mean
s(q2 )
s(q1)
u(q2 ) q2 q1 u(q1)
Considerations:
(q)
u (q ) s(q )
N
Methodology to follow:
(q)
u (q ) s(q )
N
Example:
In a calibrated multimeter 10 measures of a resistance of 1 k 5%
are performed.
# 1 2 3 4 5 6 7 8 9 10
R () 1013 1016 1010 1009 1015 1017 1008 1250 1014 1012
Estimate the value of the resistor and the standard uncertainty of
the measurement.
Step 1: Analysis of the values obtained
The measurement number 8 is aberrant (with a tolerance of 5% in
the resistance the values obtained should be between 950 and
1050 ). Therefore we eliminate this reading.
𝑹 𝟏𝟎𝟏𝟐, 𝟕 𝛀 𝒔 𝑹 𝟑, 𝟐𝛀 𝒔 𝑹 𝟏, 𝟏𝛀
The true value of the measure (q) will be included in the interval q u( q )
with a probability of 68.27%.
On the other hand, you may want to express the result of the
measurement with an interval with a different probability (eg 95%).
t-student distribution
When the number of measurements N is small the coverage factor will be
obtained in the tables of t-Student distribution with N-1 degrees of freedom.
When N is large, the t-Student distribution becomes the normal distribution.
Degrees of freedom
Confidence interval
(N‐1)
P 90 95 99
1 6.31 12.71 63.66
2 2.92 4.30 9.92
3 2.35 3.18 5.84
4 2.13 2.78 4.60
5 2.02 2.57 4.03
6 1.94 2.45 3.71
7 1.89 2.36 3.50
8 1.86 2.31 3.36
9 1.83 2.26 3.25
10 1.81 2.23 3.17
∞ 1,6 1.96 2.58 t-student distribution, for different
degrees of freedom
1/(a+-a-) a
a a
u ( x)
a+ 3
a-
Nivel de
k confianza
1 68,27%
-a +a 1,645 90%
1,96 95%
a 3 99,73%
u ( x)
k
18 Juan José Ramos Castro & Mireya Fernández Chimeno
ETSETB-DEE-UPC ELECTRONIC INSTRUMENTATION & OPTOELECTRONICS
2/(a+-a-)
a- a+ a
a a
u ( x)
6
-a a a
u ( x)
2
f ( x)
1
u ( x)
a a 1/(a+-a-)
a a 12
a
a a
1
if a+ =a- =a f ( x) u ( x) a+
2a 3 a-
x 2
1 a
f ( x, , ) e 2 2
u ( x)
2 k
-a +a
x a
2/(a+-a-)
2 a x 0 a
f ( x) a u ( x)
ax 6
2 0 xa
a a- a+
a a
1 a
f ( x) a xa u ( x)
a x
2 2
2
-a a
Juan José Ramos Castro & Mireya Fernández Chimeno
ETSETB-DEE-UPC ELECTRONIC INSTRUMENTATION & OPTOELECTRONICS
f
u i ( y ) c i u ( xi ) ci
xi
The input variables are considered to be independents.
N N N N1 N
uc (Y) c c k ux i , x k c u ( x i ) 2 c i c k ux i , x k
2 2
i i
i 1 k 1 i 1 i 1 k i 1
u( x i , x k ) u( x i ) u( x k ) r( x i , x k )
Y y uc(Y)
R in
Vm Vs
Rg R in R s
+
R
Vs 1 s Vm
Vg Vm Rin
R in
-
10k
Vs 1 99.9V 100 V
10 M
25 Juan José Ramos Castro & Mireya Fernández Chimeno
ETSETB-DEE-UPC ELECTRONIC INSTRUMENTATION & OPTOELECTRONICS
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