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Low-Jitter Process-Independent DLL and PLL Based On Self-Biased Techniques (John G. Maneatis)
Low-Jitter Process-Independent DLL and PLL Based On Self-Biased Techniques (John G. Maneatis)
Vo_ Vo+
damping factor and the bandwidth to operating frequency ratio
are �Ietermined c�mpletely by a ratio of capacitances, Self-biasing
aVOids the necessity for external biasing, which can require special
bandgap bias circuits, by generating all of the internal bias
voltages and currents from each other so that the bias levels are
eomJ�letely determined by the operating conditions. Fabricated
in a 0.5-llm ]V -well CMOS gate array process, the PLL achieves
an operating frequency range of 0.0025 MHz to 550 MHz and
input tracking jitter of 384 ps at 250 MHz with 500 m V of low Fig. L Differential buffer delay stage with symmetric loads.
frequency square wave supply noise.
D
ELAY-LOCKED loops (DLL's) and phase-locked loops
(PLL's) are often used in the I/O intelfaces of clio-ital
bandwidth can in turn provide a very broad frequency range,
"'
minimized supply and substrate noise induced jitter with a high
integrated circuits in order to hide clock distribution delays and
to improve overall system timing. Tn these applications, DLL's
input tracking bandwidth, and, in general, very robust designs.
Other benefits include a fixed damping factor for PLL's and
and PLL's must closely track the input clock. However, the
input phase offset cancellation. Both the damping factor and
rising demand for high-speed I/O has created an increasingly
the bandwidth to operating frequency ratio are determined
noisy environment in which DLL's and PLL's must function,
completely by a ratio of capacitances giving effective process
This noise, typically in the form of supply and substrate noise,
technology independence. The key idea behind self-biasing
tends to cause the output clocks of DLL's and PLL's to jitter
is that it allows circuits to choose thc operating bias levels
from their ideal timing. With a shrinking tolerance for jitter in
in which they function bcst. By referencing all bias voltages
the decreasing period of the output clock, thc design of low
and currcnts to other generated bias voltages and currents,
jitter DLL's and PLL's has becomc very challenging.
thc opcrating bias levels are essentially established by the
Achieving low jitter in PLL and DLL designs can be
operating frequency, The need for external biasing, which can
difficult due to a number of design tradeoffs. Consider a
require special bandgap bias circuits, is completely avoided.
typical PLL which is based on a voltage controlled oscillator
This paper will bcgin by reviewing a differential buffer
(VCO). The amount of input tracking jitter produced as a
stage design that provides high supply and substrate noise
rcsult of supply and substrate noise is directly related to how
rejection and allows tile pos:,ibility of self-biasing. The loop
quickly the PLL can correct the output frequency. To reduce
architecture for self-biased DLL and PLL designs will be pre
the j Jitter, the loop bandwidth should be set as high as possible,
sented in Section III and Section IV, respectively. A number
Unfurtunately, the loop bandwidth is affected by many process
of other loop components are critical to achieving low jitter in
technology factors and is constrained to be well below the
DLL and PLL designs. Section V will describe an improved
lowest operating frequency for stability [1]. These constraints
phase-frequency comparator and differential-to-single-ended
can cause the PLL to have a narrow operating frequency range
converter. The paper will also present some experimental
and poor jitter performance. Although a typical DLL is based
results demonstrating the performance of the DLL and PLL
on a delay line and thus simpler from a control perspective, it
designs.
can have a limited delay range which leads to a set of problems
similar to that of the PLL.
II. DIFFERENTIAL BUFFER STAGE
This paper describes both a DLL and PLL design based
upon self-biased techniques [2J. Self-biasing can remove virtu- In order to achieve low jitter operation, DLL and PLL
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1724 IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 31. NO. 11, NOVEMBER 1996
�.,,"'..."" ......"-"-"'....'-'..'-'..-'.,-'..'...""..: "': '�"""...'.." ...",:..:",................., "..,.... ":......:..:,:,:,:..:..:,,...,-',..."" "..... .. ..)'.. ....,...." 1'·'-...." , . �
l !
.. ..''''
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...."" ....,.."-"-'''-',, "'..·..'..·....
.. ..
.....,...., "........ ......,·
·,·..." ..·.... ..,...... ......""'...............""'..
� VCTRL � �
delay range with low supply voltage requirements that scale The frequency response of the DLL can be analyzed with a
with the operating delay, The bias generator also provides continuous time approximation, where the sampling operation
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MANEATIS: LOW-JITTER PROCESS-INDEPENDENT DLL AND I'LL BASED ON SELr-IlIASED TECHNIQUES [725
\
for handwidths about a decade or more below the operating
frequency. This bandwidth constraint is also required for
stability due to the reduced phase margin near the higher Delay
order poles that result from the delay around the sampled
feedback loop. Because thc loop filtcr integrates the phase
error, the DLL has a first-ordcr closcd loop response. The "'-
VCTRL
rcsponse could be formulated in terms of input phase and
output phase. However, this set of variables is incompatible
with a continuous time analysis since the sampled nature Fig. 4. Typical symmetric load buffer stage delay as a function of control
- . -1
WN,
B. Bandwidth Tracking
the VCDL in order to obtain a broad delay range. Fig. 4 wherc GEFF is thc effcctivc buffer output capacitance.
shows their typical delay as a function of control voltage. Using a half-buffcr rcplica, the bias generator sets the buffer
The delay can change over a very broad range, but it is bias currcnt cqual to the current through a symmetric load
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1726 IEEE JOUR.'lAL OF SOLlD-STATE CIRCUITS, VOL. 31, NO. 11. NOVEMBER 1996
210
where k is the device transconductance of one of the PMOS D. Zero-Offset Charge Pump
devices. Taking the derivative with respect to VCTRL, the The self-biased DLL design requires a charge pump current
transconductance is given by that will vary several decades over the operating frequency
range. At low current levels, small charge offsets can lead to
gm =k,(VCTRL- VT)= V2.k.ID' (6) significant phase offsets, In addition, all phase comparators
where CB is defined as
for equal durations. The same is true for a phase-frequency
2· n ' CEFF or, equivalently, the total
comparator (PFC) which is used for in-phase locking. In order
buffer output capacitance for all stages. Taking the derivative
to successfully avoid a dead-band region in the PFC as seen
with respect to VCTRL, the VCDL gain is given hy
by the charge pump, the PFC must assert both UP and DN
dD CB
I I
outputs on cvcry cycle as shown in Fig. 6. A dead-band region
KDL = = -,- --,.'7 - ----
1 , 1
Self-biasing makes it possible to design a charge pump
WN
. ICH. KDL . FREF . to have zero static phase offset when bolli the UP and
WREF WREF C1
-- = -- -
1 1
DN outputs of the phase comparator are asserted for equal
=211' ·lcH·j{DL·
C1
durations on every cycle with in-phase inputs. By constructing
the charge pump from the symmetric load buffer stage, it
1 CB 1
= - . x . (2 . ID \ . -- . - can be guaranteed that the UP and DN currents for these
211' ) 4· ID C1
.
equal duration pulses completely cancel out and transfer no
1': CB net charge to the loop filter. A simplified schematic for
(l l)
the zero-offset charge pump is shown in Fig, 7, The charge
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MANEATIS: LOW-JITTER PROCESS-INDEPENDENT DLL AND PLL BASED ON SELF-BIASED TECHNIQUES 1727
Vee
A. Closed-Loop Response
-=- -=-
can be analyzed with a continuous time approximation for
bandwidths a decade or more below the operating frequency.
Fig. 8. Complete schematic of the offset-cancelled charge pump with sym
This bandwidlh cunstraint is also required for stability due to
metric loads.
the reduced phase margin near the higher order poles that result
from the delay around the sampled feedback loop. Because the
pump is composed of two NMOS source coupled pairs each loop filter integrates the charge representing the phase error
with a separate current source and connected by a current and the veo integrates the output frequency to form the output
mirror made from symmetric load elements. eharge will be phase, the PLL has a second-order closed response. Thc output
transferred from or to the loop filter connected to thc output phase, Po(s), is related to the input phase, P1(s), by
input or DN input, respectively, is switched high.
Po(s) (P1(S) - ( )
when the UP
and DN inputs asserted, the left source
?o(s)
With both the UP = "1 . ICH . R + __1 . Kv . �
coupled pair will behave like the half-buffer replica in the
N ) sC1 S
bias circuit and produce VCTRL at the current mirror node. The (12)
PMOS deviee in the right source coupled pair will have VCTRL
where ICH is the charge pump CUITent (A), R is the loop filter
at its gate and drain which is connected to the loop filter. This
resistor (n), C1 is the loop filter capacitance (F), and K v is
devic:e will then source the exact same buffer bias current that
the veo gain (Hz/V). The closed loop response is then given
is sunk by the remainder uf the suurce coupled pair. With no
net charge transferred to the loop filter, the charge pump will
have zero static phase offset.
by
Po(S) ( 1 +
S
)-1
=
. S
The complete schematic for the zero-offset charge pump PI(S) N I cH' (Ii + 1/(sC1))· Kv
is shown in Fig. 8. The current mirror is constructed from N (1 + C1 . R)
-
•
(13)
symmetric load elements. Also, the un selected source coupled 1 + s· C1· R+ S2/(ICH/C 1 · Kv/N)
pair outputs are connected to symmetric load elements to
or, equi valentI y, by
--
match the voltages at the other outputs. At this point, all of
Pr(s) - -
the elements necessary to construct a self-biased DLL have ro(s) -N· _ l+2'('(S/WN)
(14)
been considered. The following section shows that similar 1+2 ( (S/WN) + (S/WN)2
self-biasing techniques can be applied to a phase-locked loop, where (, defined as the damping factor, is given by
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1728 IEEE JOURNAL OF SOLID-STATE CIRCUTS, VOL 31, ]\iO. 11, NOVEMBER 1996
Freq
greater than one.
For a typical PLL, the charge pump current IcB, veo
gain [{v. and loop filter resistance R are constant [4]. These
conditions give rise to a constant damping factor and a
VCTRL
constant loop bandwidth. A constant bandwidth can constrain
the achievement of a wide operating frequency range and low
input tracking jitter. A PLL adjusts its output frequency, not Pig. 10. Typical VCO frequency as a function of control voltage when
the phase error that results from each cycle of the disturbance
will accumulate for many cycles until the loop can correct the
frequency error. The error will be accumulated for a number
of cycles proportional to the operating frequency divided by
the loop bandwidth. Thus, WN should be positioned as close as
possible to WR,"P to minimize the total phase error. In addition,
WN dcpcnds on ICB, [{v, R, and el, but not on WREF. All
Fi g . II. of the
of these parameters havc indcpcndent variability. However,
Transformation the loop filler [or integration of the loop
WN must be a decade below thc lowest operating frequency filter resistor.
for stability. The result is that Wry must bc conservatively
set for stability at the lowest opcrating frequency with worst
case process variations, rather than set for optimizcd jittcr
performance.
B. Bandwidth Tmrking
Ideally, both ( ami Wry /WREF should be constant so that Fig. 12. Complete self-biased PLL block diagram (clock distributIOn omit
there is no limit on the operating frequency range and so that
led).
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MANEATIS: LOW-JITtER PROCESS-INDEPENDENT DLL AND PLL BASED ON SELF-BIASED TECHNIQUES 1729
between the loop bandw idth and the operati ng frequency. ran ge achiev abl e by the veo operating open loop. The only
First,a re l a tionshi p between veo gain an d cont rol volt age process techn ol og y dependence is on a ratio of capacitances
is needed. The oscillation fre quenc y for an n-stage veo is that can be matched reasona bly well in layout. WN an d ( can
given by be aggressively set to minimi ze Jitter accumulation over all
operating frequencies.
F = -- =
1 k· (VCTIlL - VT) v' 2 . k . ID
= (17)
CB CB
-
2· n· t
where CB is once again defined as
is proporti on al to the square root of
2 . n . CEFF. Th us , the
E. PLL Capture Behavior
Ky
1 dF 1 k
(18)
a half c ycl e which will cause the charge pump to source or
dVCTRL CB sink on average half of its charge pump current to the loop
filter. The resulting cha n ge in c ont rol voltage is given by
= =
t hat
R-�- - y
(20)
For th e self-biased PLL, the eharge pump current, which is
- 2· 9m v'i3. k· ID prop ortion al to the buffer bias current, changes with the control
S ubst ituti ng in the exp res sions for JCH, K,-, and R, the
voltage and the veo ou tput frequency. This dependcncy
means that the rate of change in the control voltage or the
damping factor is then given by
veo output freq uency will increase when approaching higher
(
=
1 /1
.
2" V N
- lCH . Kv . R 2
. C1
frequencies and decrease when app roachin g lower frequencies .
The res ulting cha nge in eontml voltage is given by
2
=
1
--
2
1
J N
. x . (2 .Jn) .
CB
- .
k y
----:---::--
-c
8 · k· ID
- - G\ 1dVCTRL
dt
=
�
2
1 �
C1
. ICH
=
.
X· k
=1
C1
. (�cnu
T
- VT) 2 (26)
WN 1 2·( t = :..�1 1 ·
VCTRL( ) � _ VT
-
VCTRL t) t _ VT ·I (28)
21f FREF R · C1
""REF The control volt age as a function of t im e d urin g capture
. .
.
X�;7\[ !fl. . (22) only be able to slew toward lock at a con st aJl t rate using a fixed
charge pump current such that the loop bandwidth does not
The loop bandwidth to operating frequ e ncy ratio is also a exceed that required to lock <lit t he lowest operating frequency
constant times the square root of the ra ti o of the same two of interest. Thus, the self-biased PLL will exhibit much faster
c apa cita nces .
Thus, the l oop bandwidth will track operating
and, therefore, set s no constraint on the operating
frequency
frequency
, ,
loc ki n g times when loc king from similar or higher operating
frequen ci es _ If, h ow ev er the self-biased PLL is started at a
very low opera tin g frequ ency possibl y in the low kilohertz
range. The PLL ca n operate over the same broad frequency range, i t will exhibit very slow locking times.
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1730 IEEE JOURNAL OF SOLID-STATE CIRCUITS. VOL. 31. NO. 11. NOVEMBER 1996
4
--
�3
...
0::
tJ 2
>
oL-�-L�__L-�-L���L-�
Time (us)
� � � 4 � 0 1 2 3 4 5
Fig. 13. Self-biased PLL control voltage as a function oftime during capture.
UP
DN
Fig. 14. Phase-frequency comparator with equal short duration output pulses
16.
[or in-phase inputs.
Fig. Die micrograph of the dual-loop DLL and PLL.
Equal and short duration pulses at the UP and DN outputs of PLL's are typically designed to operate at twice the chip
the PFC are needed for in-phase inputs in order to eliminate operating frequency so that their outputs can be d ivided by two
a dead-band in the PFC as seen by the charge pump. Such in order to guarantee a 50% duty cycle [4]. This practice is
a dead-band will lead to additional input tracking jitter, as particularly wasteful if the delay elements generate differential
discussed in Section III-D. In order to guarantee equal and signa ls . The maximum operating frequency will be re duced
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MAN�ATlS: LOW-JITTER PROCESS-INDEPENDENT DLL AND PLL BASED ON SELF BIASED TECHNIQUES 1731
Fig. 17. Dual-loop DLL block diagram. 500mV/div --- 3Mps ----+ 100psJdiv
chip operating frequency if a single-ended output with 50% 250 MHz WITH 500 mV OF 1 MHz SQUARE WAVE SUPPLY NOISE
duty cycle can be obtained from the differential output signal. Operating frequency range: 0.0025 MHz-400 MHz @ 3.3 V
Minimum supply requirements: 2.45 V, 8.6 IlIA
The differential-to-single-ended converter circuit shown in
Fig. 15 can produce such a 50% duty cycle output. It is
Input offset, sensitivity: 112 ps, <100 ps/lOO MHz
Tracking jitter. sensitivity: 610 ps, 1165 pslV (P-P)
composed of two opposite phase NMOS differential amplifiers Cycle-to-cycle jitter, sensitivity: 262 ps, 430 pslV (P-P)
driving two PMOS common-source amplifiers connected by an Block area: 1.18 mm2
NMOS current mirror. The two NMOS differential amplificrs Technology: O.S-pm }I(-well CMOS gale array
arc constructed from symmetric load buffer stages using the
same NMOS current source hias voltage as the driving buffer TABLE II
stages so that they receive the correct common-mode input PLL PERFORMANCE CHA�'\,CTERISTICS MEASURED AT 250 MHz
voltage level. They provide signal amplification and a dc bias WITH 500 mV OF 1 MHz S QUA RE WAVE SUPPLY NOISE
point for the PMOS common-source amplifiers. The P:v10S Uperating frequency range: 0.0025 MHz-550 MHz @ 3.3 V
common-source amplifiers provide additional signal amplifi .\1inimu111 supp]y requirements: 2.10 V, 4.4 rnA
Input offset, sensitivity: <25 ps, <10 ps/lOD MHz
cation and conversion to a single-ended output through the
Tracking jitter, sensitivity: 384 ps, 704 pslV (P-P)
NMOS current mirror. Because the two levels of amplification Cycle-to-cycle jitter, sensitivity: 144 ps, 290 pslV (P-P)
are differentially balanced with a wide bandwidth, the oppos Block area: 1.91 mm
2
ing differential input transitions have equal delay to the output. Technology: D.S-pm N-well CMOS gale array
The limitations of this circuit in converting the differential
signal transitions into rising and faIling singlc-cnded output
in Fig. 18. This square wave supply noise has edge transition
transitions at medium and high bias levels are identical to
times less than 10 ns. It is important to note that low frequency
those of a divider in converting single direction transitions into
square wave supply noise is one of the most extreme jitter tests
rising and falling single-ended output transitions. However,
that can be performed on a I'LL. Sine wave supply noise at
using this circuit instead of a divider to generate a 50% duty
the loop bandwidth typically leads to much less jitter. The
cycle output can substantially relax the design constraints on
confincd ccntral pcaks indicate very low static phase offset
the VCO for high frequency designs.
sensitivity to supply voltage.
Performance characteristics of the dual-loop DLL and PLL
VI. EXPERIMENTAL RESULTS
are summarized in Table I and Table II, respectively. Both
I30th the self-biased DLL and PLL designs were fablicated designs have a frequency range spanning five orders of mag
in a O.5-�m N-well CMOS gate array process. A micrograph nitude. This large range should allow a single design to satisfy
of the fahricated design s with a superimposed floor plan is a variety of operating frequency requirements. The cycle-to
shown in Fig. 16. The loop filter capacitors for both the cycle jitter listed is the jitter i.n the period of the output. The
DLL and PLL are integrated on-chip using PMOS gate array measured jitter, although small, was increased by the gate array
devices. The capacitor arrays also contain an equal number of implementation of the loop filter capacitors which contain
NMOS devices that are in rows interleaved between the PMOS the interleaved rows of unrelated NMOS devices that lead
devices. These NMOS devices are used to make a supply to control voltage coupling to ground. The die area for the
bypass capacitor. The DLL design actually implemented was dual-loop DLL and PLL was: substantially increased by the
a dual-loop DLL design [2], [6], as shown in Fig. 17, which inefficient implementation of the loop filter capacitors. With
contains two cascaded DLL's to allow it to perform frequency custom silicon, the PLL only occupies 0.4 mm2.
multiplication and duty cycle adjustment. The PLL design performed about 50% better than the dual
The PLL input-to-output tracking jitter performance with loop DLL design. This difference in performancc may havc
500 m V of I MHz square wave supply noise is illustrated resulted from larger capacitive coupling to the DLL loop filter
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1732 IEEE JOURNAl OF SOr .TrJ-STATF. rTRrT JlTS. VOL. 1 1. NO. I I , NOVEMBER 1 996
capacitors since they werc cight timcs smaller than the PLL [2] 1. Mancatis, "Low-jitter process-independent DLL and PLL based on
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