Ministry of Education and Science of Ukraine

Kharkov National University of Radio Electronics

Organizing committee
V.Hahanov – Ukraine (chair) Institute of Control Sciences, Warsaw University of Technology by financial support of
P.Prinetto – Italy (co-chair) Aldec (USA) and HPP (Ukraine) firms organize International Scientific and Technical
R.Ubar – Estonia (co-chair) Conference:
M.Bondarenko – Ukraine
S.Hyduke – USA
M.Karavay – Russia
G.Krivoulya – Ukraine
V.Tarassenko – Ukraine
Y.Zorian – USA (program
chair)
W.Kuzmicz – Poland (tutorial industrial design and test will be presented by western researchers.
chair)
Local secretariat:
A. Yegorov
S. Chumachenko
IEEE Ukrainian Department
Tallinn Technical University
Moscow Institute of Control Sciences
Warsaw University of Technology
EAST-WEST DESIGN & TEST CONFERENCE - EWDTC'03
Yalta - Alushta, Crimea, Ukraine, September 17-21, 2003
Kharkov National University of Radio Electronics together with: Ministry of Education
and Science of Ukraine, IEEE Ukrainian Department, Tallinn Technical University, Moscow
East-West Design and Test Conference – EWDTC’03.
The objective of the conference is to coordinate and exchange experiences between leading
scientific schools and experts of the Eastern and Western Europe as well as of the USA in
the field of digital systems design and testing.
An overview of achievements and research results obtained by the scientists of the
postsocialistic States during the last five years will be presented by the researchers from
Eastern countries.
An overview of the state-of-the-art and of the most important progress trends of the
The conference will take place in the Crimea, in the beautiful resort of Yalta – Alushta,
which has unique climatic conditions and clear mountain air, in the best recreation star
hotel “Dubna”. Average air and water temperature in the Black Sea at this time is +24 oC.
We invite you to participate and submit your contribution to EWDTC’03, which includes
(but is not limited to) the following topics:
– BIST, Test and Debug, Fault Diagnosis
– Built In Self Repair and Reconfigurable Architectures
– Defect Oriented Testing and Modeling
– Design and Test for Analogue and Mixed Signal Applications
– EDA and Testing Tools for RF
– EDA Tools for Design and Synthesis on Architectural and Logic Levels
– Embedded Software Performance Analysis and Optimization
– Formal Verification Techniques of Complex Designs
– High-Performance Network and System on a Chip Design and Test
– Modeling and Synthesis of Embedded Systems
– Object Oriented System Specification and Design
– On-Line Testing and Fault Tolerance
– Real-Time Embedded Systems
– System Level Modeling, Simulation and Test generation
– Using the Unified Modeling Language for Embedded System Specification

– REASON Tutorial.
– August, 18, 2003. Design and Test Technology in University Education.
The official conference languages are: English (preferable) and Russian. The reports,
consisting of 4 - 8 full double-column pages should be sent to the Organizing committee in
Word.doc files (Times New Roman, 10, margins – 25mm from each side) before May, 31,
2003. Name and surname of each author, and E-mail address should be specified on the
title-page after the title.
Each participant has to transfer $50 of a registration fee to the BANK OF NEW YORK,
NEW YORK, to account No 890-0060-077 PROMINVESTBANK of Ukraine, for
Kharkov National University of Radio Electronics, Kharkov, account No 26001301812222/
840, MFO 351458 (with the note “East-West Design and Test Conference – EWDTC’03)
before August, 10, 2003. On-site registration will be possible, as well. Each participant
will receive the program of the conference and the invitation before August, 20, 2003.
Organizing committee address: Vladimir Hahanov, Design Automation Department,
Kharkov National University of Radio Electronics, Lenin ave, 14, Kharkov, 61166, Ukraine.
Tel.: +380-572-702.1326. E-mail: hahanov@kture.kharkov.ua