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Reliability Prediction Assessment

Article 2403160 from revision 01


Description ILC 2050 BI

Device category 3 - electronical article


Prediction done by: pyhm01
Prediction date: 2016-06-21

based on User Mode Environmental condition MTTF in h MTTF in a failure rate in FIT (λ basis)
at 25 °C with 21,00 % duty cycle SN 29500 GB, GC - Ground Benign, Controlled 2199152 251,04 454,7207
at 40 °C with 34,25 % duty cycle SN 29500 GB, GC - Ground Benign, Controlled 1184136 135,18 844,4977
at 55 °C with 100,00 % duty cycle SN 29500 GB, GC - Ground Benign, Controlled 284659 32,5 3512,9721

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