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Mcp3021a0t-E Ot
Mcp3021a0t-E Ot
Package Type
DAC
5-Pin SOT-23A
Comparator
–
VDD 1 5 SCL Sample 10-Bit SAR
AIN and +
MCP3021
Hold
VSS 2 Clock
I2C™
Control Logic
Interface
AIN 3 4 SDA
SCL SDA
DC ELECTRICAL SPECIFICATIONS
Electrical Characteristics: Unless otherwise noted, all parameters apply at V DD = 5.0V, VSS = GND, R PU = 2 kΩ
TA = -40°C to +85°C, I2C Fast Mode Timing: fSCL = 400 kHz (Note 3).
Parameters Sym Min Typ Max Units Conditions
DC Accuracy
Resolution 10 bits
Integral Nonlinearity INL — ±0.25 ±1 LSB
Differential Nonlinearity DNL — ±0.25 ±1 LSB No missing codes
Offset Error — ±0.75 ±3 LSB
Gain Error — -1 ±3 LSB
Dynamic Performance
Total Harmonic Distortion THD — -70 — dB VIN = 0.1V to 4.9V @ 1 kHz
Signal to Noise and Distortion SINAD — 60 — dB VIN = 0.1V to 4.9V @ 1 kHz
Spurious Free Dynamic Range SFDR — 74 — dB VIN = 0.1V to 4.9V @ 1 kHz
Analog Input
Input Voltage Range VSS-0.3 — VDD+0.3 V 2.7V ≤ VDD ≤ 5.5V
Leakage Current -1 — +1 µA
SDA/SCL (open-drain output)
Data Coding Format Straight Binary
High-level input voltage VIH 0.7 VDD — — V
Low-level input voltage VIL — — 0.3 VDD V
Low-level output voltage VOL — — 0.4 V IOL = 3 mA, RPU = 1.53 kΩ
Hysteresis of Schmitt trigger inputs VHYST — 0.05VDD — V fSCL = 400 kHz only
Note 1: Sample time is the time between conversions after the address byte has been sent to the converter. Refer
to Figure 5-6.
2: This parameter is periodically sampled and not 100% tested.
3: RPU = Pull-up resistor on SDA and SCL.
4: SDA and SCL = VSS to VDD at 400 kHz.
5: tACQ and tCONV are dependent on internal oscillator timing. See Figure 5-5 and Figure 5-6 for relation to
SCL.
TEMPERATURE SPECIFICATIONS
Electrical Characteristics: All parameters apply across the operating voltage range.
Parameters Symbol Min Typ Max Units Conditions
Temperature Ranges
Extended Temperature Range TA -40 — +125 °C
Operating Temperature Range TA -40 — +125 °C
Storage Temperature Range TA -65 — +150 °C
Thermal Package Resistances
Thermal Resistance, 5L-SOT23A θJA — 256 — °C/W
THIGH VHYS
TF TR
SCL TSU:STA
TLOW THD:DAT TSU:DAT TSU:STO
SDA
THD:STA
IN TSP
TBUF
TAA
SDA
OUT
0.25
1 0.251
0.20
0.8 0.20
0.8
0.15
0.6 Positive INL 0.15
0.6
0.10
0.4 0.10
0.4 Positive INL
INL (LSB)
0.005 0.005
INL (LSB)
0.2 0.2
0 0
-0.005
-0.2 -0.005
-0.2
-0.10 Negative INL -0.10
-0.4
-0.4
-0.15
-0.6 Negative INL
-0.15
-0.6
-0.20 -0.20
-0.8
-0.8
-0.25 -0.25
-1
-1
0 100 200 300 400
0 100 200 300 400
2 2
I C Bus Rate (kHz) I C Bus Rate (kHz)
FIGURE 2-1: INL vs. Clock Rate. FIGURE 2-4: INL vs. Clock Rate
(VDD = 2.7V).
0.25
1
0.25
1
0.20
0.8
Positive INL 0.20
0.8
0.15
0.6 0.15
0.6
0.10
0.4 0.10
0.4 Positive INL
0.005
0.2 0.005
INL (LSB)
INL (LSB)
0.2
0 0
-0.005
-0.2 -0.005
-0.2
-0.10
-0.4 Negative INL -0.10
-0.4 Negative INL
-0.15
-0.6 -0.15
-0.6
-0.20 -0.20
-0.8
-0.8
-0.25
-1
-0.25
-1
2.5 3 3.5 4 4.5 5 5.5 2.5 3 3.5 4 4.5 5 5.5
VDD (V) VDD (V)
FIGURE 2-2: INL vs. VDD - I2C Standard FIGURE 2-5: INL vs. VDD - I2C Fast Mode
Mode (fSCL = 100 kHz). (fSCL = 400 kHz).
0.5 0.5
0.4 0.4
0.3 0.3
0.2 0.2
0.1
INL (LSB)
0.1
INL (LSB)
0 0
-0.1 -0.1
-0.2 -0.2
-0.3 -0.3
-0.4 -0.4
-0.5 -0.5
0 256 512 768 1024 0 256 512 768 1024
Digital Code Digital Code
FIGURE 2-3: INL vs. Code FIGURE 2-6: INL vs. Code
(Representative Part). (Representative Part, VDD = 2.7V).
0.25
1 0.25
1
0.20
0.8 0.20
0.8
Positive INL
0.15
0.6 0.15
0.6 Positive INL
0.10
0.4 0.10
0.4
0.005 0.005
INL (LSB)
0.2 0.2
INL (LSB)
0 0
-0.005
-0.2 -0.005
-0.2
-0.10
-0.4 Negative INL -0.10
-0.4
-0.15
-0.6 -0.15
-0.6 Negative INL
-0.20
-0.8 -0.20
-0.8
-0.25
-1 -0.25
-1
-50 -25 0 25 50 75 100 125 -50 -25 0 25 50 75 100 125
FIGURE 2-7: INL vs. Temperature. FIGURE 2-10: INL vs. Temperature
(VDD = 2.7V).
0.25
1 1
0.25
0.20
0.8 0.20
0.8
0.15
0.6 0.15
0.6
0.10
0.4 Positive DNL 0.10
0.4
DNL (LSB)
0.005
0.2 DNL (LSB) 0.005
0.2 Positive DNL
0 0
-0.005
-0.2 -0.005
-0.2
-0.10
-0.4 -0.10
-0.4 Negative DNL
Negative DNL
-0.15
-0.6 -0.15
-0.6
-0.20
-0.8 -0.20
-0.8
-0.25
-1 -0.25
-1
0 100 200 300 400 0 100 200 300 400
2
I C Bus Rate (kHz) 2
I C Bus Rate (kHz)
FIGURE 2-8: DNL vs. Clock Rate. FIGURE 2-11: DNL vs. Clock Rate
(VDD = 2.7V).
1
0.25
1
0.25
0.20
0.8
0.20
0.8
0.15
0.6 0.15
0.6
0.10
0.4 Positive DNL
0.10
0.4 Positive DNL
0.005
DNL (LSB)
0.2
DNL (LSB)
0.005
0.2
0 0
-0.005
-0.2 -0.005
-0.2
-0.10
-0.4 Negative DNL -0.10
-0.4
Negative DNL
-0.15
-0.6 -0.15
-0.6
-0.20
-0.8 -0.20
-0.8
-0.25 -0.25
-1
-1
2.5 3 3.5 4 4.5 5 5.5 2.5 3 3.5 4 4.5 5 5.5
V DD (V) VDD (V)
FIGURE 2-9: DNL vs. VDD - I2C Standard FIGURE 2-12: DNL vs. VDD - I2C Fast
Mode (fSCL = 100 kHz). Mode (fSCL = 400 kHz).
0.5 0.5
0.4 0.4
0.3 0.3
0.2 0.2
DNL (LSB)
DNL (LSB)
0.1 0.1
0 0
-0.1 -0.1
-0.2 -0.2
-0.3 -0.3
-0.4 -0.4
-0.5 -0.5
0 256 512 768 1024 0 256 512 768 1024
FIGURE 2-13: DNL vs. Code FIGURE 2-16: DNL vs. Code
(Representative Part). (Representative Part, VDD = 2.7V).
0.25
1 1
0.25
0.20
0.8 0.20
0.8
0.15
0.6 0.15
0.6
0.10 0.10 Positive DNL
0.4 Positive DNL 0.4
DNL (LSB)
DNL (LSB)
0.005
0.2 0.005
0.2
0 0
-0.005
-0.2 -0.005
-0.2
-0.10 -0.10 Negative DNL
-0.4 -0.4
Negative DNL
-0.15
-0.6 -0.15
-0.6
-0.20
-0.8 -0.20
-0.8
-0.25
-1 -0.25
-1
-50 -25 0 25 50 75 100 125 -50 -25 0 25 50 75 100 125
FIGURE 2-14: DNL vs. Temperature. FIGURE 2-17: DNL vs. Temperature
(VDD = 2.7V).
0 0 0.251
fSCL = 100 kHz & 400 kHz
-0.025
-0.1 0.225
0.9
-0.05
-0.2 0.20.8
-0.075
-0.3 0.175
0.7
Offset Error (LSB)
Gain Error (LSB)
-0.1
-0.4 0.15
0.6
Fast Mode
-0.125
-0.5 (f SCL=100 kHz) Standard Mode 0.125
0.5
-0.15 (f SCL=400 kHz)
-0.6 0.10.4
-0.175
-0.7 0.075
0.3
-0.2
-0.8 0.05
0.2
-0.225
-0.9 0.025
0.1
-0.25
-1 0 0
2.5 3 3.5 4 4.5 5 5.5
2.5 3 3.5 4 4.5 5 5.5
VDD (V) VDD (V)
FIGURE 2-15: Gain Error vs. VDD. FIGURE 2-18: Offset Error vs. VDD.
1.5
0.375 0.50
2
0.45
1.8
0.2501
0.40
1.6
0.5
0.125
0.30
1.2 VDD = 5V
0 0.25
1
VDD = 2.7V
0.20
0.8
-0.125
-0.5 0.15
0.6
0.10
0.4
-0.250
-1
VDD = 5V 0.05
0.2 VDD = 2.7V
-0.375
-1.5 00
-50 -25 0 25 50 75 100 125 -50 -25 0 25 50 75 100 125
FIGURE 2-19: Gain Error vs. Temperature. FIGURE 2-22: Offset Error vs.
Temperature.
84
96 84
96
VDD = 5V
72
84 72
84 VDD = 5V
60
72 60
72
SINAD (dB)
SNR (dB)
48
60 48
60
VDD = 2.7V
VDD = 2.7V
36
48 36
Y 48
24
36 24
36
12
24 12
24
120 120
1 10 1 10
Input Frequency (kHz) Input Frequency (kHz)
FIGURE 2-20: SNR vs. Input Frequency. FIGURE 2-23: SINAD vs. Input Frequency.
-120 84
96
-12
-24 VDD = 5V
72
84
-24
-36 60
72
SINAD (dB)
THD (dB)
-36
-48 V DD = 5V 48
60 VDD = 2.7V
-48 VDD = 2.7V
-60 36
48
-60
-72 24
36
-72
-84 12
24
-84
-96 120
1 10 -40 -30 -20 -10 0
Input Frequency (kHz) Input Signal Level (dB)
FIGURE 2-21: THD vs. Input Frequency. FIGURE 2-24: SINAD vs. Input Signal
Level.
10
12 10
12
9.95
11.95
9.5
11.5
9.90
11.9
9.85
11.85 VDD = 2.7V
9.0
11 VDD = 5V
ENOB (rms)
ENOB (rms)
9.80
11.8
9.75
11.75 8.5
10.5
9.70
11.7
8.0
10
9.65
11.65
9.60
11.6 7.7
9.5
9.55
11.55
9.50
11.5 7.0
9
2.5 3 3.5 4 4.5 5 5.5 1 10
VDD (V) Input Frequency (kHz)
FIGURE 2-25: ENOB vs. VDD. FIGURE 2-28: ENOB vs. Input Frequency.
96
84 10
VDD = 5 V
84
72 -10
72
60 -30
Amplitude (dB)
VDD = 2.7V
SFDR (dB)
48
60 -50
36
48 -70
24 -90
36
-110
12
24
-130
120
0 500 1000 1500 2000 2500
1 10
Input Frequency (kHz) Frequency (Hz)
FIGURE 2-26: SFDR vs. Input Frequency. FIGURE 2-29: Spectrum Using I2C
Standard Mode (Representative Part, 1 kHz
Input Frequency).
10 250
0
-10
-20 200
-30
Amplitude (dB)
-40
150
IDD (µA)
-50
-60
-70 100
-80
-90
-100 50
-110
-120
-130 0
2.5 3 3.5 4 4.5 5 5.5
0 2000 4000 6000 8000 10000
VDD (V)
Frequency (Hz)
FIGURE 2-27: Spectrum Using I2C Fast FIGURE 2-30: IDD (Conversion) vs. VDD.
Mode (Representative Part, 1 kHz Input
Frequency).
200 100
180 90
160 80
140 70
120 60
IDDA (µA)
IDD (µA)
FIGURE 2-31: IDD (Conversion) vs. Clock FIGURE 2-34: IDDA (Active Bus) vs. Clock
Rate. Rate.
250 100
90
200 80 VDD = 5V
VDD = 5V 70
150 IDDA (µA) 60
IDD (µA)
50
100 40
V DD = 2.7V
30 VDD = 2.7V
50 20
10
0 0
-50 -25 0 25 50 75 100 125 -50 -25 0 25 50 75 100 125
FIGURE 2-32: IDD (Conversion) vs. FIGURE 2-35: IDDA (Active Bus) vs.
Temperature. Temperature.
100 60
90
50
80
70
40
60
IDDA (µA)
IDDS (pA)
50 30
40
30 20
20
10
10
0 0
2.5 3 3.5 4 4.5 5 5.5 2.5 3 3.5 4 4.5 5 5.5
VDD (V) V DD (V)
FIGURE 2-33: IDDA (Active Bus) vs. VDD. FIGURE 2-36: IDDS (Standby) vs. VDD.
100
10 VDD = 5V
IDDS (nA)
0.1
10 µF 0.1 µF
0.01
2 kΩ 2 kΩ
0.001
VDD
0.0001 AIN SDA
-50 -25 0 25 50 75 100 125 MCP3021
VSS SCL
Temperature (°C) VIN
1.6
FIGURE 2-39: Typical Test Configuration.
1.4
1.2
1
0.8
0.6
0.4
0.2
0
-50 -25 0 25 50 75 100 125
Temperature (°C)
Output Code
11 1111 1111 (1023)
11 1111 1110 (1022)
INL is a result of cumulative DNL errors and specifies 4.10 Active Bus Current (IDDA)
how much the overall transfer function deviates from a
The average amount of current over the time required
linear response. The method of measurement used in
to monitor the I2C bus. Any current the device con-
the MCP3021 ADC to determine INL is the “end-point”
sumes while it is not being addressed is referred to as
method.
Active Bus current.
4.7 Offset Error
4.11 Standby Current (IDDS)
Offset error is defined as a deviation of the code transi-
The average amount of current required while no con-
tion points that are present across all output codes.
version is occurring and while no data is being output
This has the effect of shifting the entire A/D transfer
(i.e., SCL and SDA lines are quiet).
function. The offset error is measured by finding the dif-
ference between the actual location of the first code
4.12 I2C Standard Mode Timing
transition and the desired location of the first transition.
The ideal location of the first code transition is located I2C specification where the frequency of SCL is
at 1/2 LSB above VSS. 100 kHz.
5.1.3 STOP DATA TRANSFER (C) The MCP3021 supports a bidirectional 2-wire bus and
data transmission protocol. The device that sends data
A low-to-high transition of the SDA line while the clock onto the bus is the transmitter and the device receiving
(SCL) is high determines a STOP condition. All data is the receiver. The bus has to be controlled by a
operations must be ended with a STOP condition. master device that generates the serial clock (SCL),
controls the bus access and generates the START and
5.1.4 DATA VALID (D) STOP conditions, while the MCP3021 works as a slave
The state of the data line represents valid data when, device. Both master and slave devices can operate as
after a START condition, the data line is stable for the either transmitter or receiver, but the master device
duration of the high period of the clock signal. determines which mode is activated.
SDA
ACK
On completion of the conversion(s) performed by the SDA 1 0 0 1 A2 A1 A0 R/W
MCP3021, the microcontroller must send a STOP bit to
Start
stop the communication. Bit
Device bits Address bits
The last bit in the device address byte is the R/W bit.
When this bit is a logic ‘1’, a conversion will be exe-
FIGURE 5-3: Initiating the Conversion,
cuted. Setting this bit to logic ‘0’ will also result in an
Address Byte.
“acknowledge” (ACK) from the MCP3021, with the
device then releasing the bus. This can be used for
device polling (refer to Section 6.3, “Device Polling”).
tACQ + tCONV is
initiated here
START READ/WRITE
Lower Data Byte (n)
SLAVE ADDRESS R/W A
17 18 19 20 21 22 23 24 25 26
SCL
1 0 0 1 1 0 1
ACK
ACK
SDA D6 D5 D4 D3 D2 D1 D0 X X
tACQ + tCONV is
initiated here
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27
SCL
S
T S
A Address Byte Upper Data Byte Lower Data Byte T
R O
T P
A D D D D A
S 1 0 0 1 A A A R
/ C C D D D D D D N
SDA 2 1 0 W K 0 0 0 0 9 8 7 6 K 5 4 3 2 1 0 X X A
K
P
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28
SCL
S
T
A
Address Byte Upper Data Byte (n) Lower Data Byte (n)
R
T
R A D D D A
C D D D D D D
A
SDA S 1 0 0 1 A2 A1 A0 / C
K 0 0 0 0 D
9 8 7 6 K 5 4 3 2 1 0 X X
C 0
K
W
VDD
Sampling
Switch
VT = 0.6V
RSS AIN SS RS = 1 kΩ
C SAMPLE
VA CPIN ILEAKAGE
VT = 0.6V = DAC capacitance
7 pF ±1 nA = 20 pF
VSS
Legend
VA = signal source
RSS = source impedance
AIN = analog input pad
CPIN = analog input pin capacitance
VT = threshold voltage
ILEAKAGE = leakage current at the pin
due to various junctions
SS = sampling switch
RS = sampling switch resistor
CSAMPLE = sample/hold capacitance
6.2 Connecting to the I2C Bus The number of devices connected to the bus is limited
only by the maximum bus capacitance of 400 pF. A
The I2C bus is an open collector bus, requiring pull-up possible configuration using multiple devices is shown
resistors connected to the SDA and SCL lines. This in Figure 6-3.
configuration is shown in Figure 6-2.
SDA SCL
VDD
PIC16F876
Microcontroller
Microcontroller
RPU MCP3021
RPU 24LC01
PICmicro®
SDA EEPROM
AIN
SCL Analog MCP3021
Input 10-bit ADC
Signal
TC74
RPU is typically: 10 kΩ for fSCL = 100 kHz Temperature
Sensor
2 kΩ for fSCL = 400 kHz
1 0 0 1 A2 A1 A0 0
SDA
VDD
Start Start
Bit Device bits Address bits R/W Bit Connection
MCP3021 response
Considerations
6.4.1 POWERING THE MCP3021
Device 3
VDD supplies the power to the device as well as the ref-
erence voltage. A bypass capacitor value of 0.1 µF is
recommended. Adding a 10 µF capacitor in parallel is Device 2
recommended to attenuate higher frequency noise
present in some systems.
FIGURE 6-6: VDD traces arranged in a
VDD ‘Star’ configuration in order to reduce errors
caused by current return paths.
VCC
6.4.3 USING A REFERENCE FOR
10 µF 0.1 µF
SUPPLY
VDD RPU RPU The MCP3021 uses VDD as power and also as a refer-
SCL
AIN ence. In some applications, it may be necessary to use
MCP3021 To
SDA Microcontroller a stable reference to achieve the required accuracy.
Figure 6-7 shows an example using the MCP1541 as a
4.096V 2% reference.
VDD
FIGURE 6-5: Powering the MCP3021.
VCC
6.4.2 LAYOUT CONSIDERATIONS 0.1 µF 1 µF
MCP1541
When laying out a printed circuit board for use with CL
4.096V
analog components, care should be taken to reduce Reference VDD RPU
Microcontroller
SDA
should be placed as close as possible to the device pin.
A bypass capacitor value of 0.1 µF is recommended.
Digital and analog traces should be separated as much
as possible on the board, with no traces running FIGURE 6-7: Stable Power and
underneath the device or the bypass capacitor. Extra Reference Configuration.
3 2 1
cdef
4 5
Note: In the event the full Microchip part number cannot be marked on one line, it will
be carried over to the next line thus limiting the number of available characters
for customer specific information.
* Standard device marking consists of Microchip part number, year code, week code, and traceability
code.
E1
p
B
p1 D
n 1
c
A A2
φ A1
L
β
Please specify which device, revision of silicon and Data Sheet (include Literature #) you are using.
• Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the
intended manner and under normal conditions.
• There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our
knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip's Data
Sheets. Most likely, the person doing so is engaged in theft of intellectual property.
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05/30/03