Fault Equivalence

• Two faults of a Boolean circuit are equivalent if they

transform the circuit such that the two fault circuits
have identical output functions.

Fault Dominance
If all tests of faults F1 detects another fault F2,then F2 is said to dominate F1.

Example:- A 3-input AND gate

F1 – SA1 fault in one Input of gate

F2 – SA1 in the gate Output

Then,

Tests for F1 - 011

Tests for F2 – 000,001,010,011,100,101,110

Thus,F2 dominates F1

• AND gate

Output s-a-1 dominates any input s-a-1

 • NAND gate

Output s-a-0 dominates any input s-a-1

• OR gate

Output s-a-0 dominates any input s-a-0

• NOR gate

Output s-a-1 dominates any input s-a-0

Fault Collapsing

• Reducing the set of faults to test by using equivalence and dominance is called fault
collapsing.

• If a set of faults is functionally equivalent, we only need to use one test to detect any single
one of them.

• Collapse Ratio= |set of collapsed faults|

|set of all faults|

Fault grading
• Fault grading is a procedure that rates testability by relating the
number of fabrication defects that can in fact be detected with a
 test vector set under consideration to the total number of
conceivable faults.
• Fault grading is the process of developing test vectors and
evaluating their effectiveness in detecting manufacturing defects.
• A measure of goodness of the vector set.

Types of Transition Test

1. Launch-Off-Shift-
• In LOS, the Scan Enable (SE) signal must be able to turn
off very quickly after the last shift clock and let the
logic settle before the capture clock occurs.
• Here the last shift of the scan chain load also serves as
the transition launch event.

2.Launch Off Capture-

• In LOC, the entire scan data shifting can be done at slow
speeds in Test mode, and then two at-speed clocks are
pulsed for launch and capture in functional mode.
• Once the data is captured, the data can be shifted out slowly
in test mode.
Comparison of LOS & LOC