Daftar Pustaka

1. Saleh, Rosaria (20 Februari 2013). "Pengertian dan Sejarah

Nanoteknologi". Harian Kompas.
2. Guozhong, Cao (2004). ‘’Nanostructures and Nanomaterials’’. University of
Washington
3. Jin Zhang, Zhong-lin Wang, Jun Liu, Shaowei Chen, Gang-yu Liu (2003).
‘’Self-Assembled Nanostructures’’. Kluwer Academic Publishers/
Plenum Publishers.
4. Binnig, G.; Rohrer, H. (1986). "Scanning tunneling microscopy". IBM Journal
of Research and Development. 30 (4): 355–69.
5. Kroto, H. W.; Heath, J. R.; O'Brien, S. C.; Curl, R. F.; Smalley, R. E. (1985).
"C60: Buckminsterfullerene". Nature. 318 (6042): 162–163.
6. Monthioux, Marc; Kuznetsov, V (2006). "Who should be given the credit for
the discovery of carbon nanotubes?" (PDF). Carbon. 44 (9): 1621–1623
7. su‐Jae King, Liu (June 11, 2012). "FinFET: History, Fundamentals and
Future". University of California, Berkeley. Symposium on VLSI Technology
Short Course
8. Nanoteknologi: Pengembangan ke Metrologi Nanomaterial. KOMPAS, Senin,
22 Juli 2013. Hal 13
9. Hitachi breaks SEM resolution barrier, www.labtechnologist.com, 10 Maret
2005
10. McMullan, D. (2006). "Scanning electron microscopy 1928–1965". Scanning.
17 (3): 175–185. doi:10.1002/sca.4950170309.
11. McMullan, D. (1988). "Von Ardenne and the scanning electron microscope".
Proc Roy Microsc Soc. 23: 283–288.
12. Knoll, Max (1935). "Aufladepotentiel und Sekundäremission
elektronenbestrahlter Körper". Zeitschrift für technische Physik. 16: 467–475.
13. von Ardenne M. Improvements in electron microscopes. GB 511204,
convention date (Germany) 18 February 1937
14. Zworykin VA, Hillier J, Snyder RL (1942) A scanning electron microscope.
ASTM Bull 117, 15–23.
15. Suzuki, E. (2002). "High-resolution scanning electron microscopy of
immunogold-labelled cells by the use of thin plasma coating of osmium".
Journal of Microscopy. 208 (3): 153–157. doi:10.1046/j.1365-
2818.2002.01082.x.
16. Ernst Ruska; translation by T Mulvey (January 1980). The Early Development
of Electron Lenses and Electron Microscopy. Applied Optics. 25. hlm. 820.