CERTIFICATE OF ACCREDITATION

The ANSI National Accreditation Board

Hereby attests that

BYK - Gardner
c/o BYK-Gardner USA
9104 Guilford Road
Columbia, MD 21046, USA
(and satellite locations as listed on the scope)

Fulfills the requirements of

ISO/IEC 17025:2017
In the fields of

CALIBRATION and TESTING

This certificate is valid only when accompanied by a current scope of accreditation document.
The current scope of accreditation can be verified at www.anab.org.

______________________________
R. Douglas Leonard Jr., VP, PILR SBU
Expiry Date: 28 April 2023
Certificate Number: AC-1534

This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017.
This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory
quality management system (refer to joint ISO-ILAC-IAF Communiqué dated April 2017).
 SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017

BYK – Gardner
Dr. Ing Torsten Gruhn, 17025 Quality Manager
Torsten.Gruhn@altana.com
Phone: +49 (8171) 3493 341
This scope applies to the following locations:

Headquarter Headquarter USA

c/o BYK – Gardner GmbH c/o BYK–Gardner USA
Lausitzerstr.8, 82538 Geretsried, Germany 9104 Guilford Rd., Columbia, MD 21046, USA

BYK-Gardner Service Point Spain BYK–Gardner Service Point France

c/o Actega Artística S.A c/o Eckart France S.A.S.
Calle Balmes 8, Suite: 3º 2ª, 08291 31 Rue Amilcar Cipriani 93400,
Ripollet, Spain Saint Ouen, France

BYK-Gardner Service Point China BYK-Gardner Service Point South Latin America
c/o BYK (Tongling) Co., Ltd. Shanghai Branch c/o MAST COMERCIAL E IMPORTADORA LTDA
Block 6A, Building A, No 88 Hong Cao Road, Rua Itaporanga, 340-B, Bairro Paraiso,
Xuhui District, Shanghai 200233, P.R China Santo André – SP, 09190-640, Brazi

BYK-Gardner Service Point Japan BYK-Gardner Service Point Austria, Hungary, Slovenia
c/o TETSUTANI CO., LTD c/o FRIEDRICH W. BLOCH GmbH
Chuo-ku, Osaka, Tokui cho 2-2-2, Japan Wagramerstrasse 201, 1210 Vienna, Austria

BYK-Gardner Service Point India

c/o IMCD India Private Limited
1101-03, B-Wing, ONE BKC,
Bandra Kurla Complex, Bandra East,
Mumbai, MH. Pin.: 400 051. India

CALIBRATION AND TESTING

Valid to: April 28, 2023 Certificate Number: AC-1534

Version 037 Issued: July 25, 2022 www.anab.org

Page 1 of 16
 CALIBRATION

Length – Dimensional Metrology

Reference Standard,
Expanded Uncertainty
Parameter/Equipment Range Method, and/or Locations5
of Measurement (+/-) Equipment
(0 to 100) µm 2.9 µm
Digital Film Thickness
(>100 to 250) µm 4.6 µm Certified Shims All
Units 1,3
(>250 to 3 000) µm 11 µm
(0 to 100) µm 9.9 µm
Digital Film Thickness
(>100 to 250) µm 11 µm Certified Shims All
micro-Tri-gloss 1,3
(>250 to 3 000) µm 15 µm
(0 to 100) µm 0.4 µm
Columbia, MD
Film Thickness Shims (>100 to 250) µm 0.6 µm Micrometer
Geretsried, Germany
(>250 to 3 000) µm 0.8 µm
Adhesion Tape Test Roller
Length (1 to 150) mm 0.1 mm Vernier Caliper Columbia, MD
Weight (1 to 3 000) gr 1.2 gr Scale Geretsried, Germany
Hardness, Shore A (70 to 90) Duro 1.8 Duro Durometer

Mass and Mass Related

Reference
Expanded Uncertainty Standard, Method,
Parameter/Equipment Range Locations 5
of Measurement (+/-) and/or Equipment
Scale, Timer, Columbia, MD
Density Cups 3 (8 to 101) ml 0.1 % of reading
Thermometer Geretsried, Germany
Kinematic Viscosity 3,4
Ford Cups 2.5 % of elapsed time Thermometer,
Columbia, MD
DIN Cups (10 to 100) sec 2 % of elapsed time Timer,
Geretsried, Germany
ISO Cups 2 % of elapsed time Certified Oil
Zahn Cups 2 % of elapsed time
(1 to 320 000 000) cP 0.14 cP Columbia, MD
Thermometer,
Rotational Viscosity3 Geretsried, Germany
Certified Oil
(40 to 141) KU 0.53 KU Santo André, Brazil

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Page 2 of 16
Photometry and Radiometry
Reference Standard,
Expanded Uncertainty
Parameter/Equipment Range Method, and/or Locations5
of Measurement (+/-) Equipment
(0 to 10) GU 0.21 GU
(>10 to 94) GU 0.61 GU
(>94 to 100) GU 0.41 GU
(158-168 GU at 20°) 0.34 GU
Gloss 1,2 Gloss Standards All
(148-158 GU at 45°) 0.34 GU
(128-138 GU at 60°) 0.33 GU
(108-118 GU at 75°) 0.31 GU
(100-110 GU at 85°) 0.36 GU
8°:di / 8°:de: L*: 0.25
(380-780 nm) a*: 0.10
b*: 0.10 Columbia, MD
ΔE*(CIELab): 0.29 Geretsried, Germany
ΔE*(CIELCH): 0.29 Ripollet, Spain
ΔE*(CIE94): 0.21 Saint Ouen, France
Color /
White Standard Shanghai, P.R China
Spectrophotometer 1,2
0°:45°a L*: 0.30 Santo André, Brazil
(380-780 nm) a*: 0.10 Osaka, Japan
b*: 0.10 Vienna, Austria
ΔE*(CIELab): 0.29 Mumbai, India
ΔE*(CIELCH): 0.29
ΔE*(CIE94): 0.29
8°:di / 8°:de: L*: 0.21
(380-780 nm) a*: 0.14
b*: 0.14 Columbia, MD
ΔE*(CIELab): 0.29 Geretsried, Germany
ΔE*(CIELCH): 0.29 Ripollet, Spain
ΔE*(CIE94): 0.29 Saint Ouen, France
Color / Pale Grey Standard
Shanghai, P.R China
Spectrophotometer 1,2 (BCRA)
0°:45°a L*: 0.42 Santo André, Brazil
(380-780 nm) a*: 0.14 Osaka, Japan
b*: 0.14 Vienna, Austria
ΔE*(CIELab): 0.46 Mumbai, India
ΔE*(CIELCH): 0.46
ΔE*(CIE94): 0.46

Version 037 Issued: July 25, 2022 www.anab.org

Page 3 of 16
Photometry and Radiometry
Reference Standard,
Expanded Uncertainty
Parameter/Equipment Range Method, and/or Locations5
of Measurement (+/-) Equipment
8°:di / 8°:de: L*: 0.21
(380-780 nm) a*: 0.14
b*: 0.18 Columbia, MD
ΔE*(CIELab): 0.31 Geretsried, Germany
ΔE*(CIELCH): 0.31 Ripollet, Spain
ΔE*(CIE94): 0.31 Saint Ouen, France
Color / Mid/Diff Standard
Shanghai, P.R China
Spectrophotometer 1,2 (BCRA)
0°:45°a L*: 0.35 Santo André, Brazil
(380-780 nm) a*: 0.14 Osaka, Japan
b*: 0.14 Vienna, Austria
ΔE*(CIELab): 0.40 Mumbai, India
ΔE*(CIELCH): 0.40
ΔE*(CIE94): 0.40
8°:di / 8°:de: L*: 0.42
(380-780 nm) a*: 0.20
b*: 0.21 Columbia, MD
ΔE*(CIELab): 0.51 Geretsried, Germany
ΔE*(CIELCH): 0.51 Ripollet, Spain
ΔE*(CIE94): 0.51 Saint Ouen, France
Color / Deep Grey Standard
Shanghai, P.R China
Spectrophotometer 1,2 (BCRA)
0°:45°a L*: 0.71 Santo André, Brazil
(380-780 nm) a*: 0.14 Osaka, Japan
b*: 0.20 Vienna, Austria
ΔE*(CIELab): 0.75 Mumbai, India
ΔE*(CIELCH): 0.75
ΔE*(CIE94): 0.75
8°:di / 8°:de: L*: 0.28
(380-780 nm) a*: 0.26
b*: 0.21 Columbia, MD
ΔE*(CIELab): 0.44 Geretsried, Germany
ΔE*(CIELCH): 0.44 Ripollet, Spain
ΔE*(CIE94): 0.43 Saint Ouen, France
Color / Deep Pink Standard
Shanghai, P.R China
Spectrophotometer 1,2 (BCRA)
0°:45°a L*: 0.42 Santo André, Brazil
(380-780 nm) a*: 0.28 Osaka, Japan
b*: 0.21 Vienna, Austria
ΔE*(CIELab): 0.55 Mumbai, India
ΔE*(CIELCH): 0.55
ΔE*(CIE94): 0.55

Version 037 Issued: July 25, 2022 www.anab.org

Page 4 of 16
Photometry and Radiometry
Reference Standard,
Expanded Uncertainty
Parameter/Equipment Range Method, and/or Locations5
of Measurement (+/-) Equipment
8°:di / 8°:de: L*: 0.42
(380-780 nm) a*: 0.35
b*: 0.71 Columbia, MD
ΔE*(CIELab): 0.90 Geretsried, Germany
ΔE*(CIELCH): 0.90 Ripollet, Spain
ΔE*(CIE94): 0.88 Saint Ouen, France
Color / Red Standard
Shanghai, P.R China
Spectrophotometer 1,2 (BCRA)
0°:45°a L*: 0.57 Santo André, Brazil
(380-780 nm) a*: 0.42 Osaka, Japan
b*: 1.28 Vienna, Austria
ΔE*(CIELab): 1.46 Mumbai, India
ΔE*(CIELCH): 1.46
ΔE*(CIE94): 1.43
8°:di / 8°:de: L*: 0.28
(380-780 nm) a*: 0.28
b*: 0.52 Columbia, MD
ΔE*(CIELab): 0.65 Geretsried, Germany
ΔE*(CIELCH): 0.65 Ripollet, Spain
ΔE*(CIE94): 0.65 Saint Ouen, France
Color / Orange Standard
Shanghai, P.R China
Spectrophotometer 1,2 (BCRA)
0°:45°a L*: 0.42 Santo André, Brazil
(380-780 nm) a*: 0.28 Osaka, Japan
b*: 0.86 Vienna, Austria
ΔE*(CIELab): 1.00 Mumbai, India
ΔE*(CIELCH): 1.00
ΔE*(CIE94): 0.98
8°:di / 8°:de: L*: 0.35
(380-780 nm) a*: 0.21
b*: 0.44 Columbia, MD
ΔE*(CIELab): 0.60 Geretsried, Germany
ΔE*(CIELCH): 0.60 Ripollet, Spain
ΔE*(CIE94): 0.60 Saint Ouen, France
Color / Bright Yellow Standard
Shanghai, P.R China
Spectrophotometer 1,2 (BCRA)
0°:45°a L*: 0.42 Santo André, Brazil
(380-780 nm) a*: 0.21 Osaka, Japan
b*: 0.42 Vienna, Austria
ΔE*(CIELab): 0.63 Mumbai, India
ΔE*(CIELCH): 0.63
ΔE*(CIE94): 0.63

Version 037 Issued: July 25, 2022 www.anab.org

Page 5 of 16
Photometry and Radiometry
Reference Standard,
Expanded Uncertainty
Parameter/Equipment Range Method, and/or Locations5
of Measurement (+/-) Equipment
8°:di / 8°:de: L*: 0.30
(380-780 nm) a*: 0.24
b*: 0.30 Columbia, MD
ΔE*(CIELab): 0.49 Geretsried, Germany
ΔE*(CIELCH): 0.49 Ripollet, Spain
ΔE*(CIE94): 0.49 Green/Diff Green Saint Ouen, France
Color /
Standard Shanghai, P.R China
Spectrophotometer 1,2
0°:45°a L*: 0.35 (BCRA) Santo André, Brazil
(380-780 nm) a*: 0.21 Osaka, Japan
b*: 0.28 Vienna, Austria
ΔE*(CIELab): 0.49 Mumbai, India
ΔE*(CIELCH): 0.49
ΔE*(CIE94): 0.49
8°:di / 8°:de: L*: 0.28
(380-780 nm) a*: 0.28
b*: 0.21 Columbia, MD
ΔE*(CIELab): 0.45 Geretsried, Germany
ΔE*(CIELCH): 0.45 Ripollet, Spain
ΔE*(CIE94): 0.45 Saint Ouen, France
Color / Cyan Standard
Shanghai, P.R China
Spectrophotometer 1,2 (BCRA)
0°:45°a L*: 0.42 Santo André, Brazil
(380-780 nm) a*: 0.28 Osaka, Japan
b*: 0.28 Vienna, Austria
ΔE*(CIELab): 0.58 Mumbai, India
ΔE*(CIELCH): 0.58
ΔE*(CIE94): 0.58
8°:di / 8°:de: L*: 1.20
(380-780 nm) a*: 1.84
b*: 1.42 Columbia, MD
ΔE*(CIELab): 2.62 Geretsried, Germany
ΔE*(CIELCH): 2.62 Ripollet, Spain
ΔE*(CIE94): 2.51 Saint Ouen, France
Color / Deep Blue Standard
Shanghai, P.R China
Spectrophotometer 1,2 (BCRA)
0°:45°a L*: 2.06 Santo André, Brazil
(380-780 nm) a*: 3.19 Osaka, Japan
b*: 2.47 Vienna, Austria
ΔE*(CIELab): 4.53 Mumbai, India
ΔE*(CIELCH): 4.53
ΔE*(CIE94): 4.23

Version 037 Issued: July 25, 2022 www.anab.org

Page 6 of 16
Photometry and Radiometry
Reference Standard,
Expanded Uncertainty
Parameter/Equipment Range Method, and/or Locations5
of Measurement (+/-) Equipment
Columbia, MD
Geretsried, Germany
Clarity Standards Ripollet, Spain
ASTM D1003 Saint Ouen, France
Clarity 1,2,6 (0 to 100) % 0.2 % Illuminant A, Shanghai, P.R China
ASTM D1003 Santo André, Brazil
Illuminant C Osaka, Japan
Vienna, Austria
Mumbai, India
Columbia, MD
Geretsried, Germany
Transmission Standards
Ripollet, Spain
ASTM D1003
Saint Ouen, France
(0 to 50) % 0.37 % Illuminant A,
Transmission 1,2,6 Shanghai, P.R China
(>50 to 100) % 0.07 % ASTM D1003
Santo André, Brazil
Illuminant C,
Osaka, Japan
ISO 13468
Vienna, Austria
Mumbai, India
Columbia, MD
Geretsried, Germany
Haze Standards
Ripollet, Spain
ASTM D1003
(0.1 to 1) % 0.1 % Saint Ouen, France
Illuminant A,
Haze 1,2,6 (>1 to 10) % 0.1 % Shanghai, P.R China
ASTM D1003
(>10 to 100) % 0.2 % Santo André, Brazil
Illuminant C,
Osaka, Japan
ISO 13468
Vienna, Austria
Mumbai, India
Columbia, MD
Geretsried, Germany
Ripollet, Spain
Saint Ouen, France
Wavescan / DOI 1,2 (0 to 99) units 1.7 units Orange Peel Standards Shanghai, P.R China
Santo André, Brazil
Osaka, Japan
Vienna, Austria
Mumbai, India
Columbia, MD
Optical Radiation – (50 to 200) fc 10.9 fc Geretsried, Germany
Spectroradiometer
Illuminance 1,3 (540 to 2 200) lx 117 lx Ripollet, Spain
Saint Ouen, France

Version 037 Issued: July 25, 2022 www.anab.org

Page 7 of 16
Photometry and Radiometry
Reference Standard,
Expanded Uncertainty
Parameter/Equipment Range Method, and/or Locations5
of Measurement (+/-) Equipment
Columbia, MD
(2 250 to 3 500) K 55 K
Optical Radiation - Color Geretsried, Germany
(3 800 to 4 350) K 74 K Spectroradiometer
Temperature 1,3 Ripollet, Spain
(6 300 to 6 700) K 82 K
Saint Ouen, France

Thermodynamic
Reference Standard,
Expanded Uncertainty
Parameter / Equipment Range Method and/or Locations5
of Measurement (+/-) Equipment
Columbia, MD
Type K Geretsried, Germany
Thermocouple Simulation 3 Universal Calibrator
(0 to 500) C 0.9 C Vienna, Austria
Shanghai, P.R China
Columbia, MD
Temperature (5 to 50) °C 0.65 °C Temperature Chamber
Geretsried, Germany
Columbia, MD
Humidity (30 to 80) %RH 1.8 %RH Temperature Chamber
Geretsried, Germany
Calculated from
Calculated from Columbia, MD
Dewpoint (10 to 30) °C temperature and
temperature and humidity Geretsried, Germany
humidity

Version 037 Issued: July 25, 2022 www.anab.org

Page 8 of 16
 TESTING
Dimensional
Reference Standard,
Expanded Uncertainty
Parameter/Equipment Range Method, and/or Locations5
of Measurement (+/-) Equipment
Certified Shims
(0 to 100) µm 2.9 µm BYK-Gardner working
Digital Film Thickness
(>100 to 250) µm 4.6 µm instructions All
Units 1,3
(>250 to 3 000) µm 11 µm Customer defined
procedures
Certified Shims
(0 to 100) µm 9.9 µm BYK-Gardner working
Digital Film Thickness
(>100 to 250) µm 11 µm instructions All
micro-Tri-gloss 1,3
(>250 to 3 000) µm 15 µm Customer defined
procedures
Micrometer
(0 to 100) µm 0.4 µm BYK-Gardner working
Columbia, MD
Film Thickness Shims (>100 to 250) µm 0.6 µm instructions
Geretsried, Germany
(>250 to 3 000) µm 0.8 µm Customer defined
procedures
Vernier Caliper
Scale
Adhesion Tape Test Roller
Durometer
Length (1 to 150) mm 0.1 mm Columbia, MD
BYK-Gardner working
Weight (1 to 3 000) gr 1.2 g Geretsried, Germany
instructions
Hardness, Shore A (70 to 90) Duro 1.8 Duro
Customer defined
procedures

Mechanical
Reference Standard,
Expanded Uncertainty
Parameter/Equipment Range Method, and/or Locations5
of Measurement (+/-) Equipment
Scale, Timer,
Thermometer
BYK-Gardner working Columbia, MD
Density Cups 3 (8 to 101) ml 0.1 % of reading
instructions Geretsried, Germany
Customer defined
procedures

Version 037 Issued: July 25, 2022 www.anab.org

Page 9 of 16
Mechanical
Reference Standard,
Expanded Uncertainty
Parameter/Equipment Range Method, and/or Locations5
of Measurement (+/-) Equipment
Thermometer, Timer,
Kinematic Viscosity 3,4
Certified Oil
Ford Cups 2.5 % of elapsed time
BYK-Gardner working Columbia, MD
DIN Cups (10 to 100) sec 2 % of elapsed time
instructions Geretsried, Germany
ISO Cups 2 % of elapsed time
Customer defined
Zahn Cups 2 % of elapsed time
procedures
Thermometer,
(1 to 320 000 000) cP 0.14 cP Certified Oil
Columbia, MD
3 BYK-Gardner working
Rotational Viscosity Geretsried, Germany
instructions
Santo André, Brazil
(40 to 141) KU 0.53 KU Customer defined
procedures

Optical
Reference Standard,
Expanded Uncertainty
Parameter/Equipment Range Method, and/or Locations5
of Measurement (+/-) Equipment
(0 to 10) GU 0.21 GU
(>10 to 94) GU 0.61 GU
Gloss Standards
(>94 to 100) GU 0.41 GU
BYK-Gardner working
(158-168 GU at 20°) 0.34 GU
Gloss 1,2 instructions All
(148-158 GU at 45°) 0.34 GU
Customer defined
(128-138 GU at 60°) 0.33 GU
procedures
(108-118 GU at 75°) 0.31 GU
(100-110 GU at 85°) 0.36 GU
8°:di / 8°:de: L*: 0.25
(380-780 nm) a*: 0.10
b*: 0.10 Columbia, MD
ΔE*(CIELab): 0.29 Geretsried, Germany
ΔE*(CIELCH): 0.29 White Standard Ripollet, Spain
ΔE*(CIE94): 0.21 BYK-Gardner working Saint Ouen, France
Color /
instructions Shanghai, P.R China
Spectrophotometer 1,2
0°:45°a L*: 0.30 Customer defined Santo André, Brazil
(380-780 nm) a*: 0.10 procedures Osaka, Japan
b*: 0.10 Vienna, Austria
ΔE*(CIELab): 0.29 Mumbai, India
ΔE*(CIELCH): 0.29
ΔE*(CIE94): 0.29

Version 037 Issued: July 25, 2022 www.anab.org

Page 10 of 16
Optical
Reference Standard,
Expanded Uncertainty
Parameter/Equipment Range Method, and/or Locations5
of Measurement (+/-) Equipment
8°:di / 8°:de: L*: 0.21
(380-780 nm) a*: 0.14
b*: 0.14 Columbia, MD
ΔE*(CIELab): 0.29 Geretsried, Germany
Pale Grey Standard
ΔE*(CIELCH): 0.29 Ripollet, Spain
(BCRA)
ΔE*(CIE94): 0.29 Saint Ouen, France
Color / BYK-Gardner working
Shanghai, P.R China
Spectrophotometer 1,2 instructions
0°:45°a L*: 0.42 Santo André, Brazil
Customer defined
(380-780 nm) a*: 0.14 Osaka, Japan
procedures
b*: 0.14 Vienna, Austria
ΔE*(CIELab): 0.46 Mumbai, India
ΔE*(CIELCH): 0.46
ΔE*(CIE94): 0.46
8°:di / 8°:de: L*: 0.21
(380-780 nm) a*: 0.14
b*: 0.18 Columbia, MD
ΔE*(CIELab): 0.31 Geretsried, Germany
Mid/Diff Standard
ΔE*(CIELCH): 0.31 Ripollet, Spain
(BCRA)
ΔE*(CIE94): 0.31 Saint Ouen, France
Color / BYK-Gardner working
Shanghai, P.R China
Spectrophotometer 1,2 instructions
0°:45°a L*: 0.35 Santo André, Brazil
Customer defined
(380-780 nm) a*: 0.14 Osaka, Japan
procedures
b*: 0.14 Vienna, Austria
ΔE*(CIELab): 0.40 Mumbai, India
ΔE*(CIELCH): 0.40
ΔE*(CIE94): 0.40
8°:di / 8°:de: L*: 0.42
(380-780 nm) a*: 0.20
b*: 0.21 Columbia, MD
ΔE*(CIELab): 0.51 Geretsried, Germany
Deep Grey Standard
ΔE*(CIELCH): 0.51 Ripollet, Spain
(BCRA)
ΔE*(CIE94): 0.51 Saint Ouen, France
Color / BYK-Gardner working
Shanghai, P.R China
Spectrophotometer 1,2 instructions
0°:45°a L*: 0.71 Santo André, Brazil
Customer defined
(380-780 nm) a*: 0.14 Osaka, Japan
procedures
b*: 0.20 Vienna, Austria
ΔE*(CIELab): 0.75 Mumbai, India
ΔE*(CIELCH): 0.75
ΔE*(CIE94): 0.75

Version 037 Issued: July 25, 2022 www.anab.org

Page 11 of 16
Optical
Reference Standard,
Expanded Uncertainty
Parameter/Equipment Range Method, and/or Locations5
of Measurement (+/-) Equipment
8°:di / 8°:de: L*: 0.28
(380-780 nm) a*: 0.26
b*: 0.21 Columbia, MD
ΔE*(CIELab): 0.44 Geretsried, Germany
Deep Pink Standard
ΔE*(CIELCH): 0.44 Ripollet, Spain
(BCRA)
ΔE*(CIE94): 0.43 Saint Ouen, France
Color / BYK-Gardner working
Shanghai, P.R China
Spectrophotometer 1,2 instructions
0°:45°a L*: 0.42 Santo André, Brazil
Customer defined
(380-780 nm) a*: 0.28 Osaka, Japan
procedures
b*: 0.21 Vienna, Austria
ΔE*(CIELab): 0.55 Mumbai, India
ΔE*(CIELCH): 0.55
ΔE*(CIE94): 0.55
8°:di / 8°:de: L*: 0.42
(380-780 nm) a*: 0.35
b*: 0.71 Columbia, MD
ΔE*(CIELab): 0.90 Geretsried, Germany
Red Standard
ΔE*(CIELCH): 0.90 Ripollet, Spain
(BCRA)
ΔE*(CIE94): 0.88 Saint Ouen, France
Color / BYK-Gardner working
Shanghai, P.R China
Spectrophotometer 1,2 instructions
0°:45°a L*: 0.57 Santo André, Brazil
Customer defined
(380-780 nm) a*: 0.42 Osaka, Japan
procedures
b*: 1.28 Vienna, Austria
ΔE*(CIELab): 1.46 Mumbai, India
ΔE*(CIELCH): 1.46
ΔE*(CIE94): 1.43
8°:di / 8°:de: L*: 0.28
(380-780 nm) a*: 0.28
b*: 0.52 Columbia, MD
ΔE*(CIELab): 0.65 Geretsried, Germany
Orange Standard
ΔE*(CIELCH): 0.65 Ripollet, Spain
(BCRA)
ΔE*(CIE94): 0.65 Saint Ouen, France
Color / BYK-Gardner working
Shanghai, P.R China
Spectrophotometer 1,2 instructions
0°:45°a L*: 0.42 Santo André, Brazil
Customer defined
(380-780 nm) a*: 0.28 Osaka, Japan
procedures
b*: 0.86 Vienna, Austria
ΔE*(CIELab): 1.00 Mumbai, India
ΔE*(CIELCH): 1.00
ΔE*(CIE94): 0.98

Version 037 Issued: July 25, 2022 www.anab.org

Page 12 of 16
Optical
Reference Standard,
Expanded Uncertainty
Parameter/Equipment Range Method, and/or Locations5
of Measurement (+/-) Equipment
8°:di / 8°:de: L*: 0.35
(380-780 nm) a*: 0.21
b*: 0.44 Columbia, MD
ΔE*(CIELab): 0.60 Geretsried, Germany
Bright Yellow Standard
ΔE*(CIELCH): 0.60 Ripollet, Spain
(BCRA)
ΔE*(CIE94): 0.60 Saint Ouen, France
Color / BYK-Gardner working
Shanghai, P.R China
Spectrophotometer 1,2 instructions
0°:45°a L*: 0.42 Santo André, Brazil
Customer defined
(380-780 nm) a*: 0.21 Osaka, Japan
procedures
b*: 0.42 Vienna, Austria
ΔE*(CIELab): 0.63 Mumbai, India
ΔE*(CIELCH): 0.63
ΔE*(CIE94): 0.63
8°:di / 8°:de: L*: 0.30
(380-780 nm) a*: 0.24
b*: 0.30 Columbia, MD
ΔE*(CIELab): 0.49 Green/Diff Green Geretsried, Germany
ΔE*(CIELCH): 0.49 Standard Ripollet, Spain
ΔE*(CIE94): 0.49 (BCRA) Saint Ouen, France
Color /
BYK-Gardner working Shanghai, P.R China
Spectrophotometer 1,2
0°:45°a L*: 0.35 instructions Santo André, Brazil
(380-780 nm) a*: 0.21 Customer defined Osaka, Japan
b*: 0.28 procedures Vienna, Austria
ΔE*(CIELab): 0.49 Mumbai, India
ΔE*(CIELCH): 0.49
ΔE*(CIE94): 0.49
8°:di / 8°:de: L*: 0.28
(380-780 nm) a*: 0.28
b*: 0.21 Columbia, MD
ΔE*(CIELab): 0.45 Geretsried, Germany
Cyan Standard
ΔE*(CIELCH): 0.45 Ripollet, Spain
(BCRA)
ΔE*(CIE94): 0.45 Saint Ouen, France
Color / BYK-Gardner working
Shanghai, P.R China
Spectrophotometer 1,2 instructions
0°:45°a L*: 0.42 Santo André, Brazil
Customer defined
(380-780 nm) a*: 0.28 Osaka, Japan
procedures
b*: 0.28 Vienna, Austria
ΔE*(CIELab): 0.58 Mumbai, India
ΔE*(CIELCH): 0.58
ΔE*(CIE94): 0.58

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Optical
Reference Standard,
Expanded Uncertainty
Parameter/Equipment Range Method, and/or Locations5
of Measurement (+/-) Equipment
8°:di / 8°:de: L*: 1.20
(380-780 nm) a*: 1.84
b*: 1.42 Columbia, MD
ΔE*(CIELab): 2.62 Geretsried, Germany
Deep Blue Standard
ΔE*(CIELCH): 2.62 Ripollet, Spain
(BCRA)
ΔE*(CIE94): 2.51 Saint Ouen, France
Color / BYK-Gardner working
Shanghai, P.R China
Spectrophotometer 1,2 instructions
0°:45°a L*: 2.06 Santo André, Brazil
Customer defined
(380-780 nm) a*: 3.19 Osaka, Japan
procedures
b*: 2.47 Vienna, Austria
ΔE*(CIELab): 4.53 Mumbai, India
ΔE*(CIELCH): 4.53
ΔE*(CIE94): 4.23
Clarity Standards Columbia, MD
ASTM D1003 Geretsried, Germany
Illuminant A, Ripollet, Spain
ASTM D1003 Saint Ouen, France
Clarity 1,2,6 (0 to 100) % 0.2 % Illuminant C, Shanghai, P.R China
BYK-Gardner working Santo André, Brazil
instructions Osaka, Japan
Customer defined Vienna, Austria
procedures Mumbai, India
Transmission Standards
Columbia, MD
ASTM D1003
Geretsried, Germany
Illuminant A,
Ripollet, Spain
ASTM D1003
Saint Ouen, France
(0 to 50) % 0.37 % Illuminant C,
Transmission 1,2,6 Shanghai, P.R China
(>50 to 100) % 0.07 % ISO 13468,
Santo André, Brazil
BYK-Gardner working
Osaka, Japan
instructions
Vienna, Austria
Customer defined
Mumbai, India
procedures

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Optical
Reference Standard,
Expanded Uncertainty
Parameter/Equipment Range Method, and/or Locations5
of Measurement (+/-) Equipment
Haze Standards
Columbia, MD
ASTM D1003
Geretsried, Germany
Illuminant A,
Ripollet, Spain
ASTM D1003
(0.1 to 1) % 0.1 % Saint Ouen, France
1,2,6 Illuminant C,
Haze (>1 to 10) % 0.1 % Shanghai, P.R China
ISO 13468,
(>10 to 100) % 0.2 % Santo André, Brazil
BYK-Gardner working
Osaka, Japan
instructions
Vienna, Austria
Customer defined
Mumbai, India
procedures
Columbia, MD
Geretsried, Germany
Orange Peel Standards Ripollet, Spain
BYK-Gardner working Saint Ouen, France
Wavescan / DOI 1,2 (0 to 99) units 1.7 units instructions Shanghai, P.R China
Customer defined Santo André, Brazil
procedures Osaka, Japan
Vienna, Austria
Mumbai, India
Spectroradiometer
Columbia, MD
BYK-Gardner working
Optical Radiation – (50 to 200) fc 10.9 fc Geretsried, Germany
instructions
Illuminance 1,3 (540 to 2 200) lx 117 lx Ripollet, Spain
Customer defined
Saint Ouen, France
procedures
Spectroradiometer
Columbia, MD
(2 250 to 3 500) K 55 K BYK-Gardner working
Optical Radiation - Color Geretsried, Germany
(3 800 to 4 350) K 74 K instructions
Temperature 1,3 Ripollet, Spain
(6 300 to 6 700) K 82 K Customer defined
Saint Ouen, France
procedures

Thermal
Reference Standard,
Expanded Uncertainty
Parameter / Equipment Range Method and/or Locations5
of Measurement (+/-) Equipment
Universal Calibrator
Columbia, MD
BYK-Gardner working
Thermocouple Type K Geretsried, Germany
instructions
Simulation 3 (0 to 500) C 0.9 C Vienna, Austria
Customer defined
Shanghai, P.R China
procedures

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 Thermal
Reference Standard,
Expanded Uncertainty
Parameter / Equipment Range Method and/or Locations5
of Measurement (+/-) Equipment
Temperature Chamber
BYK-Gardner working
Columbia, MD
Temperature (5 to 50) °C 0.65 °C instructions
Geretsried, Germany
Customer defined
procedures
Temperature Chamber
BYK-Gardner working
Columbia, MD
Humidity (30 to 80) %RH 1.8 %RH instructions
Geretsried, Germany
Customer defined
procedures
Calculated from
temperature and
humidity
Calculated from Columbia, MD
Dewpoint (10 to 30) °C BYK-Gardner working
temperature and humidity Geretsried, Germany
instructions
Customer defined
procedures
Calibration and Measurement Capability (CMC) is expressed in terms of the measurement parameter, measurement range, expanded uncertainty of measurement and
reference standard, method, and/or equipment. The expanded uncertainty of measurement is expressed as the standard uncertainty of the measurement multiplied by a
coverage factor of 2 (k=2), corresponding to a confidence level of approximately 95%.

Notes:
1. On-site calibration/testing services are available for this parameter; based on strict protocols, the same uncertainties are achieved on-site.
2. Applies to both instruments and standards (standards can only be calibrated in-laboratory)
3. Applies to instruments only
4. Drain time of certified calibration oil
5. The capabilities of all sites are identical using same procedures and equipment, under the same environment conditions.
6. Unit-less measure expressed as a percentage.
7. This scope is formatted as part of a single document including Certificate of Accreditation No. AC-1534.

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