a c Pearse Mow oe? Sate ny e fern. coasistia, a ee ee system isan optimized _cempuhing re SD o ae S iL abi ofthe mechanical ox eleetnizal _systena often ie: bs computing Constracats. designed fer perfarming so fe = Hiei AS te ta ah a Bi es Se ‘ ie: cammoncharocberietine. af embedded system are A D Single tenthoned = : ee me Ae ewbedded system 1s designed to perfurm specific ~r6pealedly.. Newer program versisa update can be dane 7070 ease. ‘ -22 Tightly Con strated. : cee —— eae 4a —embedded —tyclem have tightly censtoained deygn metrics \ Sith as tow cost, Pertible size, high perfomance, bimtted pouer —tonsutaphion and 20 on. 2) Reathve and real hme au Sealed paleee — chad ina Ataf sac) ge the system's. environment. and should Provides Wit uvthia as. spectfled km frame. result jg spelen Paduve changes tip soutet wig 9 ro_/ ~belayed Longpitatron way lat _ep t digit camera SE as 2 designed. ban Yet - Correcbness (correct funchining by phe syetém) —______~ 12) Safely C Probability that ystem will net cause have) > Design Vimebrice are the measures a a ee 2 features fa tyslese. — se 2-6 Embedded aipstem Ve. Gareral Poxpoce DES consish “of specific hardware, embedded DS. GEES consist tb geatrie bardwere »$ PDS. RES ik eesygned te perform _speufic set of Son GEES_it designed’ to perform various fonthamgo— s Dye aes eae bet in GLE it. NE es S PES is dete rminishe, 82 Da y Soe CPUS sin ECS are alterable by 80d were,ae 5 GO Hews cin we meet hort —aphnlzakim of £5 as ——Bere_are__maeny design me taice that impach the enabeda system —desigo. the hey challenge 1's that improving ane mebaic eadetthe warening af alates Ng ed inthe sabiacradin —the_desgner must be compbrhble with vaniwe inpplementahin Yethnalogies dad rust be able be ~ipuate from ane technelogy do —analher._ this earure best imple metatatin fora piven ysler: 2 Sieaplified Remaue fp dal a shige stoi 7 Ht_is_used_te sinuestipate 0s. af yevemve occurs due te. delayed —eaty of a prduct sin the market. —2It _assomes peak of morket 4ecurs a0 halfuay paint Lit) ofa ——prodvet life puen. -for_delayed entry. Shit ~.>-The__revenue for an on-time market tatry 1 area tf 4 on hime, > The_revenve_ far delaytd enty is. area_of 4 delayed. + Revenue tess =A Ltn time) = A bdelayed) + Hevcentage revenue rss = Alon tine) ~Aldelapst)}, het__ marke vise__angle be _@- ah ee oslo A lan dime)=2(4% 57h) 2 42 (Yq X Wx Wi rand) | fain _Aldelayed) = pkitcbrctchil titer 4 ¥ (2i-9)¥ (tu/-d) ong) Meta tee SMa ah 8 WBS a ae ein ae Wren tage revere lass = [whsho - wsdpp ¢ Ypuld tan8 ‘qd tend] /atane *100%. A reA) Be designs of dish drive bts. NRE xas 4 $100, 00d: 2and uxt, Uh Pn | 920 thine seattle ieaill 130s haves tsa te tosh of seach -pradath. te av ? URE cock assuming sell of 100 unite. — a0 af units ee en PnProcessor isa digital ied te Tete te ie a The__minimum _veguivement tobe a_.precessar isthe potest of —contraller and. datapath = nk — the different poe eae es areas fallaws 1) General. Purpare Processor (GPP) jo is a programmable _cincwil thal —can__peafarm. wariviike. a wae Lt consists. of program memory. sand governed. date path: the. ndiele . geen _and__ont_ ar more. feneral porpose Mbl. = Dsighogiaep NTE 3p) neh ahs ge ee Tt itda dyitel —elreuit designed to. ee ee —higital camera isa SBP. a eee tot nat Cee ee ae cm 2 Aplin ssp inbskw eae AE Oye a 1 . Tt isa programmable sincuit that ts Sgubisiad a perbicalar. Bie seinen i ey ae 2 Late Siapl Purpose Pracessar ___ 2 faster performance A 2 Size te smaflex a ae pee see > beiner —_pamer veguizement > High. WRE_tost - — es ee Langer time te. market. eames te > hess flexible gue OE elAe ie ; | 43 Design custo single aux pa: pz Dz. se his | Saige _alperithen ox Fonction that _camputes— the. desived output. Convert _algarithn inte. ~- 4s camplex. a ee ee ESME sss « ___Méinite State Machine ws! te dota) at | 2 Mas Fedisey RE ages pei neha —ehpath consists tf _intercannection tf rink nainalat oo i _.segvential components. Contralier consists af pure FSM. Complete —ceatraller design by implementing. FSI withesmbiaakimal bps s Ret Suet HESIOD Toeaplate, ees ie Fe 3 e i eaten baie ee while lth $2 Se Nah Oe amext statement» Loop. body x et bodys Ss PON a. aT IEP IPAS ip tit _lelement ec? heap Next aoc ares iene eae eS= As, ded. Eeesrs) 4 | Se Wet o } | = a | | | | 3 "re peeree jetta D State x Inputs Ax. 4s__ As nepey—raltaygoxh Ta * —he_—2: lo 0 0.4 x Sa) \ 4 eh 5) © x) | xx S| 4) | “OM 38 ss ow at alt yf | Hock 2a | a s ° ° oD. ce SEO:—~Bhowest Lammn th tole _t Lona) * es a LM Se PX Snare wire fhe eek soe soe Pe GLD- —— et eee ee a CEES oS cctincans lads ae while C2 90-5) } a ee ee marta 33 42 Yeats 5 * epee atwhile(ag ae: while () 90-3); ton "Lit; mi see? i 1, rat, ie ld “ r bia count =O; WO W2= pdt temp; el aees ae Et ~ 2 5Loe 8A suhsy bas ES. conkzellting dexnshle ate cephalad < Brigg ehh 5we Hee oT Ee eee tS ture t bt] mee) * (ils T~ mean):At Datimi zatia Ss ES a ——_Aptimization ithe technigueafimpraving. the design netics. sans ee Se et af _vartous de <—maedeiee, — a iia < ayaa ae oe — the. algorithms are Fa La tee ae time _complerity — and spate _tamplerity, and hene: try be debelop more ebfitieat _alternedvealgarithms. It ee decreasing of na._tf computations atl tiie spe perishes 7 pbctihle. hj gh Ot ee a while Li) £ alee 4 feat. 2 . Sais while tyl=0)§mei et to. Peliniadbe fa whether tlp. 1 bs aR ass ging Tie _desiga..rsL he 200? me may 27 pe Nap fp i cbpliiized BLD 2ESID ns. 3 _subtrac tar eee nan he eed) ge Se Uslng melliplegars. 2 a epee eed See So kee. PR sce aE Te ae eo49 phim: ay FM is ace a ese Lie ven, te eee io ore ee sage — minimization. State encoding 4s the hth tf assigniyp 4 unigue bit pattern... each state ‘aan FSM, We can use mare than. leg, ta)_bits encode _n states State minimizahin._it__the tach, mopig inh hte. Gat Ap Aca Aa cepa> lantrol_untt does nol store alpsrithen =e programmed into _meror 3.2 Operations fi art hte sooo 4) Fetch. hig age acl ~2s__indiated ty. —_lecationta__ memory pointed by lL. and stores. into IR. > Decade Instruction :_It determines Ae toNah Tress sen aed! __ty__the___ instruction __in__TR. secs = Bt pietead aoe BAe A aia eee aig) bee freet__mentary to Go registers of datapath. D Execute: The Due ae: on sepals eperationg. 1s: perpareed Sj moving deh through ALU- ecm rere——_ 40 —~ eae jeter Tao 5) Stave yan Te Th niles eS - he dotepath— xogltt . 4 PT ——— . 4 # Pipelini ere x a Pipelining 1s the — cee pp _inerease. “naan ret — ofa mixxopracessar— Tt aceumes._the independent pert hans — bbe prifarmed simul bintansty, ———— _2 Syperscalar molto processor —enecit 5¢ fod ah 00% igey. soe _ta__pavtllel= sand yepurves Hod at mare, ms “vit. Lary _leng Instruction Ward). Cpe is. _nnte. t6sor that encode. Save. edie tr TS 2 stobe _supersilay fe X4 machine tnstzvetian:— £3 Pespnamoter' View Programmer. daes_nat need yea vndess binding aa architecdare Mey just. need 0 know__sshichtnstro cde he executed. Generally there are on a as ta levels op assembly. level aad strvetired™ or ns Qirgs Se sets the te a. 7 fk, ce be..procested by. ee A bacties fa ot Messing nad as. rere Sa —ts_refaxenced inthe tnedenp pe an er * {Ses a NR 20 2g Lisgrammer's 2 Prog sam: andl dete - a a ee 2) Registers Bee ee ae 22.10 a pest Nea soa ath a DP Doterrupts = 3 ae 2D gperathig 55 stom 225 Develepmeat Envi vonmibil athe eat development _processs2 i Processar on which programs axe written» ©

Sioeulakin— canbe dene using Hb) and Las truction tet S;mulodistres Process 2-6 Soflwaze — Develyom Fee y a Assen! aE oe i ere naan a ee c Fike J ire by) . ¢23 ad eee £7 Applicaben Specific _Tashachm = Sat ee oe e As TP is the processor tage ted fra portiaalar.demata»~ es i yeas domain specific — but can be_preguemmaed a -Ep._microcontrelter, —Dipital Signal Processor a 2.8 elechian af mizrepractsioy —__ va a LD Sored (Clack geed ar instnuchons per 660d) 2) Posed reg virements. ie : at . 2 taht mottary space) J. a 2 Development environment Sa Sut Bckalbelb Sy predate ty Pi ae De, eee eee eee ee ee BeetPK n_memanychres mt werde. of nbi'te cath math wakes k2 0: of addrese input signals. tn iadicater na. of date signals. 2 —— aoe —? r/o: ttlord: read ox iarile st enable i read ax write only wher asserted. Consider a. _memoxy with 96 x 8. Seo ee te ee + 2Memoy sarite ability and. nal 3 oro bxite Ability — eee 3 Write ability is the manage and speed. hekons Tee i can b¢ written. The _ ranges if _uszrite ability. Orb em Miss emg res igh end pracessar ree yok arae) span 2 Mbddle range ¢ precester mittee to memery slewly > HASH, LEPROM) Dlower range Uspetid equipment usd fo wrte hb mentry > E/RIM, OI HM) Plow end Chit sored only daring febrication > Masked ROMY 2 chemo Devatrence it int eet cleat —__Sherage permanence 1s the. ebay a ee ih sedniedu aller thay asp bron _soxitlen._ The ranges are’ 8 DHigh end Cre ver lose bie D> Masked ROM) DMiddle range (halls bi far dogs ox years af ter powsr cot app > MAA) —as oe a an). “Dower ips Alb aay at pee how end Chste_bik— ee afer aisithen oe RS 2) Racdom or ine eer zy CHAM) = Tt can be vead and written naps. nee > Iti velatile memory = a > Electrically byte level erasing piste i; ne Pot er. as eee Wee eee> Read: valieienn sa 2 bRAM /me_is_active, transithr switch closes bit fs read ae | taritter és ie > During _write_operation.,transfers charge. to capacity : > During read speration, address line selected andcharge foam apatites. ed ee hime eal fess |TR a > Enhanced DRAM. > nhanced_peatt are built artund snventiapel DIAM. 22. Pe LE is a DRAM that ineludes_—seoall amount. tf shite BAM _s0_as_fr_aceesememany fa bp > birst, dat it checked in ShAM If ntsc date is ateetied fam DRAM so > fast _page mote DRAM 2 eccest rw. ttntense tase > batended dah out DRAM: FP with chiely spated CAs. eis > < ee ‘? oes e ue - 2 fa_rote t 1 locke edge, 2 Beuddstatic BALD Ret 3S + DRAM with build in menmary ve Pach contrallas 2 low cost nd high density ¥e . Non talatle AA Z = ee a a eapate Mache © MGS 85 SW eee creating adhe i aa Pilea tae lethal tC eee 4 a = Migh storage pexmantace = / > OTP ROM, pears 2 Eternal. ee sania ated = eae. zPhom : a etch nail gpa 2 Erece nec UN Tpke Males ) itd ee SF ee pee £ pao Ras = Byte level electri > Electriial corte ae rs a93 x2 ROMos bis k % PON pens eevee) WEN che gt at hipe — Tice aa oa 2 Se SS fast bi Atal. Bera One = stead sling sitet iomary. which i¢_ exp used ts (path sf mei ye i mM.Lmoy| Sea eas ; oe t—esipntd sing chek Rap > y TS eet TR at ne ess, —Absitly — cathe ff heeess eee ade. lt cenne, ye Lining a 1) Direct mapping ve 22 fully assoctative mapping u | >) _ Set astociahug app ig Bs eee 2 fig Ae septal ke p= Lache feplacement = eS eee | 2 Stadt reps eae keh replace: | + Randleme replacement eo Se it i. | . least recently wed lend) poheg rae ala N v 2 Fizstoin_frret aut CFL£0) paligy = Lache Udrile Techniguas — ties oe ee = Updating. the main mera. =e > Writes taaugh tyite te moin_memary whenever Sle “& isomen 2 Wespe-hack Abtnite fp main. memory etly when cache bhch ig hareg c EEA Je te 2 Lache Impacts wiley 6:565% hee oe aya. + gpl. ms ve ‘miss wale * miss. ae4 Communication Bas . his ia ce Be pe Asche atthe ee i 2 Peebocol describes te sulee fox communitabg stthin a bv. Ckah—cih-putcal ie called toancackin 22 bse spele - PAheh: aie is 4 processar ay memiry inuelued in data tuans for (theta bisection inditatec —divchin ah Pransferied late Address indicate where Cats shel go her come .dvom 2? Lendzl methods grp éthemes. fox ae tad. ending tbe tanger, me Pr Se 3 2 Strole Piabeal en ale *The_master_vsee ame zintza!. tne Dispasat tne) to b sathehe: 2 dat trons fey. cee ? the trans for ie considered ty Smee, after some fired tm “Mandchake Protocol pe gag > Master uses reguest tne to inhale transfor. > The servant uses acknowledge.20 NE Ss | B ~ Perigherale —atiny specific addrescoc in ie Ae riaibays addves: space, | An standard 2/0, but includes 110. te indicate sbethe x the acces ist memory ox t a peripheral. —— 2 La —memary mopped, no special ingtruthont axe- ieee , ——eemuaunicate with _peniphe vale. cr 2In_standard 11), memory address ie ngt st» bss i 5.5 Tal zrupde as | > Wing — feceel_282 appa at OD np_i—executig the main program. pe ea 22 Peripheral (PL) xecewes Mp data and _asserk. oe yew When yp _c0v0es ot, it saws. PC and ascerte Uta 21 detect Iota tod pute thtervipt address vache. on date bus. ieee Ca edd regs pp fhe. bpes ons hs = sng vel tired ttSb ee 5.9 Direct Mem. meng Mctees CO MBE > up_giues control. ) of zystem bos bHA controller ——- > uip—can_sexttote ith —_ ae meee Sep leta ae SSN ON > Priority Arbiter Sey 5 Bae 2 Eile. pip. 208. sormagagg are ia ae ee Anz abit eld rors, Steel bade bing37 Send D.2.2 Control system and PID Lantvallex- ph Sefloare coding of a_lIb_ Lontroller : £4 PTD Tusetiag. bianca z e Control _ system is_a_systenn _despaed to _ 5 Sebbth sal ean/ 2 ucahle, ia’ ast ome by setting desired reference input speed track_a_desited speed ty setting the cor’ |throte and breke inpntss > Avtomopile Cruse Cantrvoller Thess ~ controller seeks te make 2__cars > Thermostat notroller Zt forces a building temp ta desired temp. by turning en the__heater fer_er AC. and agisting fan_speed-tie the parbcvlar aspect 7 pee that we intend tp control. Lo Qetiince iapor itis the desired valve tbat we. want fp40 « 2 Z igning Loren Leap Control oe 5. hlant . Model of the plant is. to_make —\design phase easier ‘and derive the controller. for Throttl, Z %. ’ —|_2 tn flit sorfece at taph, speathipttle te 30 degiae = , Ug ye : = Measure the speed, late say 55 mph > Then, the _epvoti, that holde for all scenarta fives watadel. of the plant Bees Vine = Ooo ft OS iy SS. te * 60. $50. 5 * 30) ep: Ascume wwe rse_sionple Linear funeton pee gee Ps where, p= constont - ae desived speed| Soe eee a) X = Hse het typ 2 hat ctealy ctale = Ves, ne sy ne nie Py nee PF 7, Tat Steady siete, we ugat wet mw SHEEN O27 + ays HPs “Pe OF Hence, the control wile ts defined ass : My 2 Py = Doers, PE hiya 4% = 20 mph aed 142 50 mph TS Oe eae Pup ee 1 eA | Ea" is, i ea ee eae nee epee Se| % wy Co= 45) (Dee 20 wb - : 23 524 34 as ~75:.50 2680 43.80 | 3 59.74 28°76 ae 4 42.90 50.13, 55.46 Je asl ats 96. 34.03 59.80 é 4b: 97. 84.96 Ee | 4 97.53 82. 24 G29 7 = _ S286 65:98 9 48. #9 32-90 69.79 10 49.35 39.96 65.35 So : SO ahy: 33.07 65.74 12 49.5% 33,495 66:08oo woe | Tosca: paling —Perbamenice | boca? Dp oe 0:5 Py = a a com i a . zie eee Veena OTF oS Pry Pa i Ug = 07 (D279 4-015 Prgn Wa) + 0:5 Pre = Wo Set Cas Pt IOS Pog Dey ) Soe a.2° et COP tt 02 tat ep )(a5 Pic) | 1? Coe fee tent of Uy determines ate sf. decay ef ve 2Lar €=1, we will. grow without 2 Oherwise, Wy wll aseillete. Steeweet Fad. 1 System 1 <> 2! tonsiste of of measure plant ofp and error detectay to debacd errors) ex (ert) = al Acta tor (ue)| zs 95 peor t y an Viyy = OP ity FOF Uy = bly 252 design controller uy 2-P (7 = v4) T aS fee POS Ply =e = (0:2 ~9.5P) Yet 0:5 Px, = wy pte (0.7 ~0.5p)* y t $00.3 ~0.5¢)**y lo.220:5p ye bad Gata 210:3- 0:5P 47} CO-5Py, ~ we)” 10.7-0.5p/ <7 LL 0.2 -psp ey OTR ey ee6 - 2 |53 Relate odes 0, ; AS a Pa OR : a) 00% - O52 must be as small as possible + { fe. O:%-0.5P =p ¥ aor P EBay + 2.5.9 Aveld ecillahion EEE, rb WF - 2. i hen av eguel_ to 0. it fsa i PORE Bei oP fad. 4 = Per, i 4 Assome at steady Stole tes ses 2by t 4 eg 2 (0:72 0:SP) tee 4 0.5 Pry ~ Wo i or, (1-0-2 4 05P) Ye = O.5Pyy-- we > + ties 2 OS Poy ewe eS OS gee ky 0.35 40.5P O54 O5P 013405 P| 47 Peo. a we Sot 2 33, sabrte at 0,5, asci Mahon 2 Set P21 & avoid 18c/lehim, terrible SS pe Tp? rednd —— = pe General _Lenbral System +22 P_contvalley 2 Tt mulhplies the tracking ex var. we a2_constant. 1: eine wy) eres. cr ta hs faa : z a Sh tonsiders the sire af Se PvOM aver fae i tee,ee 3 P Lee . 2p = P* byt BiB yt Stina tip, ) > Pcantroh disturbance >I ensurec steady state _ 2 achieves desired shble toansienl behavior, — 2H som “error ever hime vatd_main©) Ee fox , x FS ed tale ub fe __sen.val, act. val, eve corre; o : PID DATA pid data % Pid Initialize C8 piddate)i___ eee i sohile (1) FP i iferente bet Value se 49 pe 2 ee tenn vals Sensor bet Ya 7 i fn hl he, atte vale 2 Bid Update Lepil.date, cen val, ref val) ee nS pidiehy Sor Valet ace scala aie ee : | 4¥ ee =f asi ee | |__ typedef struct PID. DA bible eynr sum; Mam wlbve amy > J oes : %pid..deta, double sen val 3: 50 iii acta EF S72) LPO Se a = pi > Mein * pidadele > ermrecum- aud Rida date => senuitalnpreviove = sen vale Bd. Pidadats => Doan? diffe a tetree lB PL ter + Dborw di ae tb Toning i i the _pucess. of oblon lag Z ea | — and bby ad-hecmethode. {>It fe necestary becauee 02 With onalphes, the plant_model may 42_compler = => Alport - | _P Start wth o smell P_, T2)=0 SE pifutreate D,. Sd its ais yr j >hecvease ba bit. W Increase Z, unkl ve ostiHa tion Ss) Repeat from 2 onht performance cannot be Porther jm proved.54 ane. we _cotth, _Lemputer Bator Lontrol —# . 4) Bvantizatin— and Overt Se __ | = Quantiation 066078 when a sygnal must be altered — Beh A _memory —cons bratiats. —— te re = | s Anttpmehe ope ratins cause _gvanh za tad. ia ae re 2 by: Aisne —an_gperatin_vesults_D. Zh but it tan | pat fon shored ac 4-hrf _ frat tional nurdber_. £0, 0-25 2s ehoosed ; > bverflou ceckvs when operihim ovdpuk a number. | _with_omgnrode feo large tobe vepresto ted ere 24.0" si Cbnt) gt) ES LOF sip (nt) By are ee OSHe | | a eS Pears Mee| | —22Lamputatonal belay |_ => Zhe computation causes delay t actur that esas achotin See —| the _implementa tian delay wet beng lle. | > Sofheare delay ts ae to a, | | oD |; 5Y ae ee & a i Technology BBall busta (VEST IN IC Technology 8-2 Sem Cuetm (a$70) Io Technology SMa Pisaniy hogic Dewie (PLD) TC Technolgy aS eer eee Lf. IC 4; ‘wren, Steps LC is _2 _serutondveter wafer in which —lariews active and passive components along wth x LLYN, are fabricated sn extremely ; : ——}—The__variouc steps far, IC manufac toring are55 sg eee Dpductone 4 _phfer tsa round hie of —semttonductoy t pete suchas silicon» In Tl, Sihi'con Tani ie acts | s Purifsedpalyerystalline $b ie Annie et fe heated te produce molten liguid. _ 24 spooll_piece of coli 6 Zit depped sate m abba ii _____2 bolid silicon te_slowly pitlled from the mele. 2 the liquid cook pum single erystale 24 thin vownd wafer 1s cot using wafer in Ihe wafer surface 1s _emathened. by polishing. Eee leaned end dried using high purty lace particle chemizale, : | on ee ay eo2 mahe SD eta 20 thee, tn. layer af ee eS i aa a ay, coe a{ | Wie te 5F iy & Pt ah che a tected we, verified —thip tx mavnted tints 4a eectete ot ts encapsulsted. fer _pritectio.. ]| Bg. wo 28s 2 befor condition before 2) decface includes film composition , bare surface bia end, —2eflec burly . Say |_2)> Zt ahfects’: : fl ips nate agi 0) photeresist -1o- wafer adhesin — > _—___balignment aceumly Li ‘ rvesolutien : | ed Uinewid thae —Tosioae of Peablap ply a | tia haa = Papert | >If mereaes adbssitn eb photasesist material t—_ the svbchote: oe | eigen ran etonie— ha te £0 minutos Da Sr i 90d al Baidecl i | Mbesion promoters Ihe Heramethyl disilizeas Lembs) axe Used te react chemially with az face and ep ce _-0H wrth organs. fin. chin group 2 Dbabreted —Lahng 4 +t thin _unitrm coating. photoresist is aceamplihal ial ly Spin codhing . : the phatsresist in tyuid farm is. poured ov —|_the wafer and then Spun ts ae ae (Ae —j—predute desired polm. thickness 1 abbc tod ty spin speed, ee Se pape ete a60 | 2 Soft Bake ; he wih réwtan< abel x. 2b-Wt by witght solvent. : - *Lt_snvalves drying or_removing df excess salyent. 2 helpe ta stpbile Le ycied Ze 2 improves adtesisy anol _uniformldy |_ > # /s keked in sven at 96°C fy 50 mins. transfers the mask _tmage tothe _ 2007s coated Matfer. eos i es | =the exposure time affech exttieal demension» With MeV ease tt 8 LD inere i 52 Develop é | eholuhle areas of photoresist ave—dissalied ty develapey chemical. _| +f walle putlems, . appear on wafer. { , x