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1-s2.0-S0955221921002983-mainSi3N4-SiO2 Ceramics by Digital Light
1-s2.0-S0955221921002983-mainSi3N4-SiO2 Ceramics by Digital Light
A R T I C L E I N F O A B S T R A C T
Keywords: Wave-transmitting materials are a kind of multi-functional materials that protect the normal operation of
Broadband transparent material communication and guidance systems of spacecraft in harsh environments. In this paper, we fabricate a
Si3N4-SiO2 broadband microwave transparent Si3N4-SiO2 composite ceramic with excellent performance through digital
3D printing
light processing (DLP) 3D printing technology. The influences of sintering temperature on the weight increase
Photocuring
rate, density, dimensional shrinkage, phase composition, microstructure, bending strength and dielectric prop
erties of Si3N4-SiO2 ceramic were all systematically studied. The strength of Si3N4-SiO2 ceramic sintered at 1350
℃ was 77 ± 5 MPa. The relative permittivity of the ceramic is within the range of less than 4, and the loss
tangent can be below 0.003. The 3D printed Si3N4-SiO2 ceramic material exhibited excellent wave-transparent
performance.
1. Introduction produce ceramic parts which can shorten the production cycle [19,20].
Digital light processing (DLP) 3D printing technology is a relatively
Wave-transmitting materials are an important part of missiles, mature AM technology, which can project and integrate the entire layer
aircraft radomes and antenna window panels. Nitride ceramics (Si3N4, during printing, so the printing speed is faster and the molding accuracy
BN, SiBN, etc.) have excellent thermal stability, thermal shock resis is higher. DLP takes ceramic slurry as the raw materials in the manu
tance, low dielectric constants and low dielectric loss. They still have facture of ceramic products. The ceramic slurry is prepared by mixing
good thermophysical properties and stability of dielectric properties in a ceramic powder, photosensitive resin, initiator and so on. The ceramic
wide temperature range. Si3N4 has high mechanical strength and particles are bonded into ceramic bodies with complex shapes after
excellent rain corrosion resistance [1–4]. However, the relative dielec exposure to a specific wavelength ultraviolet light for a few seconds
tric constant of Si3N4 ceramics is relatively high (ε = 7.9, tanδ = 0.0080, [21–24].
10 GHz, 25 ℃), resulting in a small tolerance on the thickness of the The refractive index difference between the Si3N4 powder and the
radome. This brings many difficulties in processing [5–7]. There are two resin is large, so the main problem is that the curing depth of the slurry is
main methods to reduce the dielectric properties of silicon nitride ce too low for fabricating Si3N4 ceramic via DLP 3D printing [25]. Up until
ramics: (1) preparation of porous silicon nitride ceramics and (2) syn now, some works have been focused on improving the curing depth of
thesis of Si2N2O composite materials [8–13]. However, it is difficult to pure Si3N4 ceramic slurry. For example, the amorphous SiO2 layer was
prepare a porous structure and the mechanical strength of the product is attached onto the surface of Si3N4 powder by surface oxidation. Another
also low [14–16]. So preparation of Si2N2O composite materials is the process is by adding other oxides to the Si3N4 ceramic slurry, such as
selected choice. Al2O3, which can increase its curing depth. However, very few works
The traditional ceramic molding process requires complex molds. It have been reported on sintered Si3N4 ceramics successfully [26,27].
is difficult to manufacture complicated components, which massively In this work, we are trying to get a 3D printed Si3N4-SiO2 ceramic,
increases fabricating costs and production times [17,18]. Additive which exhibits excellent mechanical properties and electromagnetic
manufacturing (AM) technology provides a more efficient way to properties. Ceramic slurry with 50 % solid content was prepared and
* Corresponding authors at: Key Laboratory of Space Manufacturing Technology (SMT), Chinese Academy of Sciences, Beijing, 100094, PR China.
E-mail addresses: duanwenyan03@yeah.net (W. Duan), wanggong@csu.ac.cn (G. Wang).
https://doi.org/10.1016/j.jeurceramsoc.2021.04.045
Received 23 January 2021; Received in revised form 13 April 2021; Accepted 23 April 2021
Available online 27 April 2021
0955-2219/© 2021 Published by Elsevier Ltd.
R. Chen et al. Journal of the European Ceramic Society 41 (2021) 5495–5504
2. Experimental procedure
2.1. Materials
(1) First, a CAD model was designed in the computer and imported 2.3. Characterizations
into the digital light processing 3D printer (Quickdemos Intelli
gent Manuf Acturing High-tech Co., Ltd, China). Then, according The density and porosity of Si3N4-SiO2 ceramics were measured by
to the light curing ability of the paste, we adjusted the exposure Archimedes method. The porosity test were performed on the mercury
time and light intensity. The photosensitive groups were cross- porosimeter (AutoPore V9600, USA). Fourier transform infrared spec
linked to produce a polymer network under ultraviolet light. troscopy (FTIR) measurements were performed on a Bruker Tensor-27
Three-dimensional parts were obtained layer by layer in a similar spectrometer at room temperature. The fracture surfaces of the prin
way. ted samples were observed by using a scanning electron microscope
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Fig. 4. Debinding and sintering of green bodies: (a) debinding, (b)sintering (For interpretation of the references to colour in this figure legend, the reader is referred
to the web version of this article).
(SEM, Hitachi S-8020) with an accelerating voltage of 5 kV, and trans 3. Results and discussion
mission electron microscopy (TEM, JEM-1200 F). Powder X-ray
diffraction (PXRD) measurements were performed on the Rigaku D/max 3.1. Cure depth of Si3N4 suspension
2500 powder X-ray diffractometer (Japan) with Cu-Kα radiation (λ =
1.5418 Å) in the reflection mode. The bending test in the three-point To evaluate the effect of sintering aids on the photocuring ability of
bending configuration was carried out on the Instron 5965 universal silicon nitride ceramic paste, the cure depth of Si3N4 and Si3N4-Y2O3-
testing machine (INSTRON Co., Ltd, Norwood, MA, USA). Five samples Al2O3 were compared. The Cure depth of Si3N4 and Si3N4-Y2O3-Al2O3
of each material were broken in bending. The real permittivity and loss suspension was exposed to ultraviolet light under the conditions as
tangent of the sample with a size of 22.86 × 10.16 × 3 mm3 and 15.799 shown in Fig. 6. The cure depth of each sample increased with incre
× 7.899 × 3 mm3 were measured in the frequency range of 8.2–12.4 mental increases of exposure energy. Under different light intensity, the
GHz and 12.4–18 GHz on a vector network analyzer (VNA, MS4644A; highest curing depth of Si3N4 slurry is 50 μm, and the lowest is 30 μm.
Japan). The highest curing depth of Si3N4-Y2O3-Al2O3 slurry is only 60 μm and
the lowest is 50 μm. It shows thus that the cure depth of the suspension
after adding Y2O3-Al2O3 is higher than the cure depth of the pure silicon
nitride slurry. Therefore, it can be proved that the addition of the Y2O3-
Al2O3 significantly enhances the photocuring ability of the Si3N4
ceramic slurry.
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Fig. 5. DLP printing of the ceramic cuboid (a) CAD model, (b) pyrolyzed body.
The specific values of porosity are shown in the Table 3. The open
porosity is measured by Archimedes drainage method. The open
porosity of sample S-1350 is the smallest. It shows that ceramics are the
densest at this temperature.
As the sintering temperature increases, the pore diameter decreases,
which means that the ceramic becomes densified. For ceramics sintered
at 1350 ◦ C, shows pores with pore diameter less than 100 nm (Fig.7) and
the open porosity rate is 18.27 %. This value is also consistent with the
value calculated by the Archimedes drainage method.
Table 1
Physical properties of Si3N4-SiO2 ceramics as a function of sintering
temperature.
Sample Temperature Weight loss Weight Linear Density
(℃) rate after gain rate shrinkage (g/cm3)
degreasing after (%)
(%) sintering
(%)
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Fig. 8. (a)FTIR spectra of the arcylate monomer, blending before and after UV curing, (b)FTIR spectra of the ceramic after pyrolyzed at different temperatures.
between acrylic groups and ceramic paste after UV irradiation. The peak indicating a ductile fracture. With the increase of sintering temperature,
at 1087 cm-1 can be assigned to Si-O-Si. With the increase in sintering the gap between printed layers decreased gradually, suggesting good
temperature, the peak value becomes stronger and it reaches the tallest interlayer bonding. Sample S-1200 and S-1300 (Fig. 10a-b) show many
peak at 1350 ℃, confirming that more Si-O-Si groups are formed, as pores in the section. As the temperature rised, the number of cracks
shown in Fig. 8 (b). The absorption peak at 912 cm− 1 corresponded to a decreased (Fig. 10c-d). In a higher-magnification (Fig. 10e-h), it was
stretching vibration of Si-N and the peak value became weaker as the found that the particle size of Si3N4 in sample S-1300 was larger than
temperature rises. It meant that the content of silicon nitride in ceramic that in S-1250, meanwhile, the number of pores decreased. With the
parts becomes reduced [30]. temperature increasing to 1350 ℃ and 1400 ℃, the samples had perfect
XRD was used to investigate the crystallization behavior of the fracture surfaces without cracks, contributing to the excellent mechan
ceramic samples, and the spectra are shown in Fig. 9. After sintered at ical properties.
1250 ℃, the diffraction peak appears at 2θ = 22◦ , which was consistent Transmission electron microscopy (TEM) was used to investigate the
with the first characteristic peak (110) of tridymite. Broad diff ;raction microstructure of raw Si3N4 powder and sample S-1350 (Fig. 11). Si3N4
humps were observed at 2θ = 31.5◦ , 33◦ , which indicated the amor lattice fringes were clearly observed in the TEM image (Fig. 11a). As
phous SiO2 is formed at the same time. With an increase in temperature, shown in Fig. 11(b–c), the sample S-1350 showed worm-like features,
the characteristic peak of Si3N4 gradually weaken, suggesting that more which was characteristic of amorphous materials. At the same time,
Si3N4 reacts to form SiO2. Meanwhile, when the temperature rises from there are lattice fringes different from the Si3N4 crystal, indicating the
1350 ◦ C to 1400 ◦ C, the crystalline peaks at 2θ of 26◦ decreased, sug formation of cristobalite. Fig. 10a shows the surface morphology of
gesting that the content of SiO2 decreased. The reason for this change is sample S-1350. The EDX spectrum of the sample S-1350 are shown in
that when the temperature rises directly to 1400 ◦ C, the surface layer of Fig. 12(b–c). It could be seen that the O elements appeared in the sin
Si3N4 is quickly oxidized to SiO2, and a dense layer is formed on the tered particles, which suggested that SiO2 amorphous layer and cristo
surface, which prevents oxygen from entering the inside of the sample. balite were formed after sintering.
Fig. 10 shows the SEM micrographs of samples sintered at different Fig. 13 shows a schematic oxidation reaction process of Si3N4 at high
temperatures. By controlling the heating rate and proper sample posi temperature. The largest amount of SiO2 is formed at 1350 ℃. However,
tioning in the heat treatment, the process can eliminate cracks, which with the increase in the pyrolyzed temperature (from 1350 ℃ to 1400
are caused by rapid heating. The fracture surface was not uniform, ℃), the amount of silicon oxide decreased. This may be attributed to the
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Fig. 10. SEM of fracture surface of Si3N4-SiO2 ceramics sintered at different temperatures, (a and e) S-1250, (b and f) S-1300, (c and g) S-1350 and (d and h) S-1400;
(e, f, g and h) at high magnifications (a, b, c and d).
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Fig. 11. TEM images of (a) raw Si3N4 powder and (b-c) sample S-1350.
Fig. 12. The TEM images the EDX spectrum of the Si3N4-SiO2 ceramic particles. (a) The microstructure of the Si3N4-SiO2 ceramic particles; (b-c) The EDX spectrum
of the Si3N4-SiO2 ceramic particles.
rearrangement of the Si3N4-SiO2 ceramic microstructure. The mass ratio 3.4. Mechanical properties
of each phase after sintering was calculated according to reaction (1),
and is shown in Table 2. The mechanical properties of S-1250, S-1300, S-1350 and S-1400
were measured by a three-point bending strength test. The results are
shown in Fig. 14. The bars were tested perpendicular to the x-y-plane in
mechanical tests. The results showed that the bending strength of the
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Fig. 13. The schematic synthetic reaction process of oxidation of silicon nitride at high temperature.
Table 2
Mass ratio of each phase after sintering.
Sample Si3N4(%) SiO2(%) YAG (%)
Table 3
Porosity of each phase after sintering.
Sample Open porosity(%)
S-1250 44.0 %
S-1300 38.0 %
S-1350 17.7 %
S-1400 18.1%
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Fig. 15. Dielectric constant of Si3N4-SiO2 ceramics, (a) The real permittivity, (b)The dielectric loss.
/ √̅̅̅̅̅̅̅̅̅̅̅̅̅̅̅̅
average ε value of samples increased from 3.11 to 3.57. In the same
h = λ0 2 ε-sin2 θp (5)
waveband, the real permittivity reached a maximum at 1350 ℃ and the
minimum at 1250 ℃. The increase of ε value was related to the full
Where θp is the Brewster angle. It can be seen that a change of the
densification of the sample. Additionally, the tangent loss decreased
dielectric constant will lead to a change in wall thickness, resulting in
with the increase of temperature. Generally, lower tan δ means better
the imbalance of the radome electrical thickness and cause a decline in
transmission rate, which can reduce the attenuation of electromagnetic
transmittance. In addition, the permittivity also determines the wall
waves when transmitted in the material. In other words, S-1400 had the
thickness tolerance. This brings great difficulties in the processing of
lowest dielectric loss tangent, which indicated that it could be a po
structural parts. As the loss tangent becomes larger, the energy is con
tential transparent material.
verted into heat during the process of passing through the radome.
Therefore, in order to achieve the minimum reflection and maximum
transmission, the new high temperature wave transmission material 3.6. Complex-shaped Si3N4-SiO2 ceramic parts fabricated by DLP
must have low dielectric constant and loss tangent (ε < 4,tanδ < 0.01) to
obtain ideal transmission [32–36]. The complex-shaped ceramic green body could be fabricated via the
As the sintering temperature increased from 1250 ℃ to 1400 ℃, the DLP method and then sintered into ceramic parts. Fig. 16 (a) shows the
Fig. 16. (a) The Si3N4-SiO2 ceramic with lattice structure, micrograph images of three structures: (b) 21 %, (c) 40 %, (d) 59.2 %.
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