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Fast Algorithm For Encoding The (255, 223) Reed-Solomon Code Over GF
Fast Algorithm For Encoding The (255, 223) Reed-Solomon Code Over GF
Fast Algorithm For Encoding The (255, 223) Reed-Solomon Code Over GF
Since there are (m + n) nodes other than the excitation The whole procedure is then repeated by assuming another
nodes, we can express in matrix form component to be faulty until all possible faulty components are
tried out. The designated faulty component is the one asso-
AV = B (3) ciated with the smallest value of d as computed from eqn. 6.
where V is the nodal voltage vector Conclusion: The essence of the present method is that it has
avoided the 'nonlinear' problem of solving the measurement
y = (vx, v2, - . . , vm+ny deviations in terms of the component deviations, but instead
changes the fault location procedure into a series of linear
A is a (m + n) x (m + n) matrix and B is a (m + n) x 1 matrix. equation solutions for the inaccessible nodal voltages. The
Suppose a fault exists due to the component Zkl outside actual computing time can be much less than that of solving a
tolerance. The elements of A and B are then constants as group of n equations for p x (m — 1) times, where p is the
computed from the nominal component values except in the number of components tested. The reason is that some of the
rows involving Zkl. Two rows would have elements as func- equation subsets to be solved are identical in routines assum-
tions of Zkl if both the fcth and /th nodes are not excitation ing different faulty components. The amount of time saving'
nodes, and only one row involves Zk, if either the /th or the /cth would depend on the particular system topology.
node is an excitation node. The matrixes in eqn. 3 can be parti- Measurement inaccuracies and fluctuations in component
tioned as values tend to reduce the resolution of the method. If the
acceptable ranges of the inaccessible nodal voltages conform-
x A2\tVA = lBA ing to the measurements begin to overlap in cases of different
(4) assumed faulty components, wrong predictions may be ob-
, AJ\V2) \B2)
tained. The proper choice of excitation and accessible nodes is
where important for best results. Multiple faults cannot be easily
located using this method because there would be too many
l = (vi,v2,...,vm)T possibilities of faulty components to be tested.
(3 5
6
MERRILL, H. M.: 'Failure diagnosis using quadratic programming'.
ibid., 1973, R-22, pp. 207-213
SRIYANANDA, H., TOWILL, D. R., and WILLIAMS, J. H.: 'Voting
must be equal to the rank of the augmented matrix techniques for fault diagnosis from frequency domain test data',
ibid., 1975, R-24, pp. 260-267
2 B1-AlV1\ 7 BROWN, F. D., MCALLISTER, N. F., and PERRY, R. P.: 'An application of
inverse probability to fault isolation', IRE Trans., 1962, MIL-6, pp.
* B2-A3Vl) 260-267
1= 1