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Purification of Phosphoric Acid from Waste Acid Etchant using


Layer Melt Crystallization
By Kwang-Joo Kim*

DOI: 10.1002/ceat.200500383

Spent acid etchant is the corrosive waste coming from the etching process of semiconductor manufacturing plants. This waste
solution consists of phosphoric acid, nitric acid and acetic acid, and includes various toxic metallic impurities. In this work, the
recovery of phosphoric acid from the waste etchant was conducted by removal of metallic impurities, nitric acid, and acetic
acid, using static melt crystallization. The effect of cooling rate, amount of seeds, subcooling, and sweating on the distribution
coefficient was investigated. Nitric acid and acetic acid were successfully removed by single-stage layer crystallization. The
quantity of metallic impurities of the purified phosphoric acid was 1/1000 times smaller than that of the crude etchant.

1 Introduction sulting from a low heat of fusion compared with heats of va-
porization. Therefore, a one-stage operation is required to
Spent etchant is the corrosive waste coming from the etch- reach high purities (theoretically only one in simple eutectic
ing process in semiconductor plants. This waste solution systems), and has been applied to separate close-boiling
consists of nitric acid, acetic acid, and phosphoric acid, and isomers, which can be separated practically in no other way
includes various toxic metallic impurities due to the reaction [5±7]. Melt crystallization also has the advantages of needing
between the acids and metallic elements of the semiconduc- no solvents and a reduced environmental hazard compared
tor boards, which are composed of several metallic films as to solution crystallization. Melt crystallization is mostly ap-
gate electrodes using Al, Al-Ta, poly-Si, and SiNx. plied to the separation and purification of organic materials
General techniques exist for the treatment of waste acid [8, 9]. Unfortunately, treatment of waste acid etchant has
mixtures, such as chemical precipitation, neutralization, re- never been studied by melt crystallization. It is interesting to
verse osmosis, catalytic reduction, and incineration [1]. Neu- explore crystallization to purify phosphoric acid from waste
tralization is used as the most popular method of treating acid etchant coming from the semiconductor industry.
waste acid solutions. It requires excessive chemicals until In this study, the recovery of highly purified phosphoric
neutralization is completed with the addition of base and acid with negligible metallic content, adaptable to the etch-
generates a large amount of neutralization heat. Reverse os- ant of semiconductor process, was carried out by static layer
mosis has also been used to treat or dispose of waste acidic melt crystallization. Optimum conditions were set for sepa-
mixtures, and is adequate for low contaminant levels [2]. Re- ration and purification of phosphoric acid from acid etchant.
verse osmosis cycles the solution through expensive filtra- The operating parameters investigated were cooling rate, de-
tion systems until the acid concentration of the correspond- gree of super-cooling, and sweating temperature.
ing stream is reduced to the level where it can be disposed of
by conventional means.
Incineration and catalytic reduction may also be used as 2 Experimental
disposal and recovery methods for waste acids [3, 4]. The
2.1 Materials
acids are converted to SOx and NOx under harsh conditions,
and these are undesirable methods due to the environmen- The waste etchant used in this work was kindly supplied
tally unfavorable result of the generation of acid rain. De- by the semiconductor etching process plant. Its composition
spite the extensive literature on the treatment of toxic, cor- is listed in Tab. 1.
rosive waste, the technical demand for a cost effective and
environmentally prudent method to treat pungent acidic Table 1. Composition of waste acid etchant.
waste is still increasing. Materials Composition
Melt crystallization has advantages for the production of
Al [ppb] 124497
highly purified products, such as operation at low tempera-
Fe [ppb] 550
tures compared to vapor-liquid processes, thus minimizing
Na [ppb] 259
decomposition of products, and low energy requirements, re-
Total metallic impurity [ppb] 125307
± Nitric acid [wt %] 3.4
[*] K.-J. Kim (author to whom correspondence should be addressed,
Phosphoric acid [wt %] 77.9
kjkim@hanbat.ac.kr), Crystallization Process & Engineering Laboratory,
Department of Chemical Engineering, Hanbat National University, Acetic acid [wt %] 5.4
SAN 16±1, Dukmyung-Dong, Yuseong-Gu, Daejeon 305±719, Republic
Water [wt %] 13.2
of Korea.

Chem. Eng. Technol. 2006, 29, No. 2  2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim 271
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2.2 Experimental Set-Up ture detected both with without seeds is presented in Fig. 2.
As can be seen, crystallization of phosphoric acid without
The apparatus used is shown in Fig. 1. The crystallizer was seeds is difficult.
a jacketed vessel made of Pyrex glass. Ethanol as coolant
was circulated inside of the annular glass vessel to control
the temperature. The crystallizer was 1000 mm long and had
300
a 30 mm inner diameter. Digital thermocouples were used
to measure the temperature of the melt, the circulating etha-
Without seed
nol, and the cooling surface. The melt temperature in the With seed
vessel was maintained above 10 C to experimentally deter- 280 Equillibrium curve

Temperature(K)
mine the equilibrium temperature of the acidic mixture.
Crystallization operation was started by suddenly cooling
the jacket temperature. The temperature in the crystallizer 260
was controlled by a PID temperature controller with an er-
ror range of ± 0.05 K. A compacted crystalline layer was
formed with needle-like crystals packed in the annular sur-
face. After approaching the specified temperature, residual 240
melt in the vessel was discharged. Additionally, in order to
remove the metallic impurities included in the surface of the
crystal, a partial melting operation was fulfilled. The melted 220
crystal was collected in the bottom of the vessel. Layer crys- 84 85 86 87 88 89 90
tallization was carried out by cooling the wall of the crystalli- Concentration(%)
zer at various cooling rates, which were set to be constant in
Figure 2. Solid-liquid equilibrium curve with nucleation point.
the range 0.01 to 5 K/min.

2.3 Seeding

As phosphoric acid was difficult to crystallize sponta-


neously without seeds due to a wide metastable zone width,
seeding was needed to generate nuclei. Seeding was tested
with wet seeds and dry seeds. Wet seeds were found to be
better as a result of being easier to handle and control com-
pared to dry seeds.
Fig. 3 shows examples of photographs of the crystallizer
during crystallization. After seeding in the metsatable zone,
Sieve nuclei were formed and grew as needle-like crystals, which
were then packed inside the crystallizer. The packing density
of the crystallizer could be controlled by the cooling temper-
ature and amount of seed. The seed was needle-like with size
of about 10 micron.
Figure 1. Experimental Apparatus: 1. Static layer crystallizer; 2. Vessel; 3. Pro-
gramming thermostatic bath with PID controller; 4. Temperature controller.

A small portion of melted crystal was diluted with ultra- Melt


pure water then analyzed for metallic impurities in the
mother liquor and crystal using ICP-MS (Inductively
th
id
Temperature

Coupled Plasma ± Mass Spectrometer). Potentiometric titra-


w
ne
zo
e

tion was used for analysis of the acid composition.


bl
ta

seeding
as
et

The melting point of phosphoric acid in acid etchant was


M

measured by a Lasentec system and was found to be 9.7 C. Crystal+melt

The Lasentec system is based on measurement of the varia-


tion of the number of particles with elapsed time [10]. The
point of disappearance was measured at various concentra-
tions and saturation temperatures, and was estimated at a
heating rate of 0.1 K/min. The solid-liquid diagram of the Concentration

phosphoric acid and water mixture and nucleation tempera- Figure 3. Photographs of the crystalline layer during crystallization.

272 http://www.cet-journal.com  2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim Chem. Eng. Technol. 2006, 29, No. 2
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3 Results and Discussion 1.0

0.9
3.1 Separation Processes Nitric acid
0.8 Acetic acid
The waste acid mixture includes nitric acid, 0.7
Metallic elements

acetic acid, and phosphoric acid. Before the re-


moval of metallic compounds from the waste 0.6

etchant, the acetic and nitric acids included 0.5

k
must be separated.
0.4
The removal of acetic acid and nitric acid for
purifying phosphoric acid from waste etchant is 0.3
characterized by the effective distribution coef-
0.2
ficient.
The effective distribution coefficient1) k is de- 0.1

fined by the ratio of mass fractions of impurity 0.0


in the residual xil and in the crystal xic [11]. 0.01 0.1 1 10

xic Cooling rate (K/min)


kˆ …1†
xil Figure 4. Effect of distribution coefficients of impurities on the cooling rate.

An effective distribution coefficient k close to


1 means that in a binary system almost no sepa-
ration occurs, while a k close to 0 means an al- 0.6 14

most perfect separation. Here 0 < k < 1 is an


12
essential condition of purification. Generally, 0.5

the effective distribution coefficient k increases


10
with increasing cooling rate and subcooling be- 0.4

Yield (wt%)
cause they induce a high growth rate and thus 8
cause the entrapment of impurities. Therefore, 0.3
k

the effective distribution coefficient depends on 6


the crystallization conditions. 0.2
Fig. 4 shows the effective distribution coeffi- 4
cients of acids and elemental aluminum against
0.1
cooling rates in the layer melt crystallization. k Yield
2

The melt was cooled from 25 C down to ±35 C


0.0 0
at a cooling rate of 0.5 K/min. The amount of
0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9
seeds was 0.004 g per gram of melt. Seed with an
average size of 10 micron was fed at ±10 C. The Content of Nitric acid in waste etchant(wt%)
sweating process was operated at a heating rate
Figure 5. Effect of nitric acid content on the distribution and yield.
of 0.5 K/min from ±35 C to ±10 C after drain-
ing of the residual melt in the vessel. The effec-
tive distribution coefficients of nitric acid, acetic acid, and to ±35 C at a cooling rate of 0.5 K/min. The amount of seeds
metallic elements are in the range 0.08±0.14, 0.1±0.15, and was 0.004 g per gram of melt. Seeds with an average size of
0.2±0.5, respectively, under the conditions investigated. A 10 micron were fed at ±10 C. The sweating process was op-
larger distribution coefficient results from a higher cooling erated at a heating rate of 0.5 K/min from ±35 C to ±10 C
rate, which leads to a higher growth rate. As can be seen, the after draining of the residual melt in the vessel. The effective
distribution coefficient of acid was found to be 0.04 at the distribution coefficient decreases with increasing amounts of
cooling rate of 0.08 K/min, which was equivalent to the crys- nitric acid. Acetic acid was not found to affect the distribu-
tal growth rate of 10±8 m/s. This means that a greater amount tion coefficient of metallic elements. This means that nitric
of acid impurities can be eliminated at lower subcooling and acid dissolves the metallic elements due to being a stronger
lower crystal growth rates. acid compared to phosphoric acid and acetic acid.
Fig. 5 shows the effect of nitric acid content on the distri- As a result, crystallization temperatures below ±48 C
bution coefficient and yield. The melt was cooled from 25 C were not desirable because acetic acid and nitric acid were
not separated. Phosphoric acid from the waste acid etchant
investigated in this study can be separated below cooling
± rates of 0.5 K/min and at above crystallization temperatures
1) List of symbols at the end of the paper. of ±48 C.

Chem. Eng. Technol. 2006, 29, No. 2  2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim http://www.cet-journal.com 273
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3.2 Removal of Metallic Compounds 10

Impurity behavior depends mainly on the supersaturation


because it affects the nucleation rate as well as the growth 1
rate. Metallic impurities included in phosphoric acid were
removed by controlling the cooling rate and amount of seeds

b (K/min)
in static layer crystallization.
0.1
Fig. 6 shows the effect of the cooling rate and amount of
seeds on the distribution coefficient. The melt feed was
85 wt % phosphoric acid and 15 wt % water including
2089 ppb Al, 96 ppb Fe, and 30 ppb Na. The melt was 0.01

cooled from 30 C to 5 C at a cooling rate of 0.5 K/min. The


amount of seeds was 0.004 g per gram of melt. The seeds
had an average size of 10 micron and were fed at 18 C. The 0.001
sweating process was operated at a heating rate of 0.5 K/min 0.1 1 10

from 5 C to 25 C after draining of the residual melt in the ∆ T max(K)

vessel. The distribution coefficient of total metallic elements Figure 7. Plot of cooling rate against metastable zone width.
increases with increasing cooling rate and decreasing
amount of seeds. This means that a greater amount of impu-
rity is removed with lower cooling rates and larger amounts where kn is a constant related to the nucleation rate and n is
of seeds. the nucleation order.
In static layer crystallization, the cooling rate and amount The values of the order of nucleation rate n and the con-
of seeds are important parameters to be considered in super- stant of nucleation rate kn in Eq. (2) were evaluated by re-
saturation. Supersaturation is related directly to the metasta- gression analysis from the slopes and intercepts found in
ble zone width. The metastable zone width DTmax was taken Fig. 7. The order of the nucleation rate is 3.5.
as the difference between the equilibrium temperature and Fig. 8 shows the effect of the amount of seeds on the
the temperature at which nuclei were detected. metastable zone width and distribution coefficient of total
Metastable zone widths for saturation temperature and metallic elements. The melt was cooled from 30 C to 5 C at
cooling rate were plotted in log-log coordinates in Fig. 7. a cooling rate of 0.5 K/min. Seed with an average size of
The plots are found to give a good straight line. These results 10 micron was fed in melt at 18 C. The sweating process
show that the metastable zone width of the phosphoric acid was operated at a heating rate of 0.5 K/min from 5 C to
increases with the cooling rate for all the experimental con- 25 C after draining of the residual melt in the vessel. The
ditions explored. metastable zone width and distribution coefficient decrease
The relationship between metastable zone width DTmax with increasing amounts of seeds.
and cooling rate b is as follows [11, 12]: Fig. 9 shows the distribution coefficient of the metallic ele-
1 n ments against the fraction of sweating. A crystalline layer
log b = log kn + n log DTmax ± log S (2)
n formed with a feed composition of 85 wt % phos-
phoric acid and a cooling rate of 0.5 K/min was
1.0 used. It was found that the purity of the crystals
had a strong dependence on the amount of
0.001 (kg seed/kg melt) sweating. The distribution coefficient decreased
0.004 (kg seed/ kg melt)
0.8
0.01 (kg seed/kg melt) with an increase in the amount of sweating. The
purity of the crystals increases rapidly until 10 %
sweating. This means that the impurities formed
0.6
on growing crystals are mostly located on the sur-
face of the crystalline layer. Impure inclusions
k

0.4 occluded on the outside of the layer are easily


drained away at the beginning of the sweating
operation. This means the crystalline layer be-
0.2 gins to be melted from the surface of the layer.
After 20 % sweating, the crystal purity is nearly
constant although the sweating operation is still
0.0 in process. This means the impurity inclusions ex-
0.01 0.1 1 10
ist uniformly in the layer. Increasing the sweating
Cooling rate (K/min) temperature causes a considerable reduction of
Figure 6. Effect of cooling rate and seed content on the distribution coefficient. the metallic impurity of the crystals.

274 http://www.cet-journal.com  2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim Chem. Eng. Technol. 2006, 29, No. 2
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1.0 1.0 Table 2. Separation by multi-stage crystallization.

k Composition Crude Step 1 Step 2 Step 3 Step 4


∆Tmax
0.8 0.8 Nitric acid 3.4140 0.4119 ± ± ±
[wt %]

Phosphoric acid 77.9317 86.9987 89.784 89.008 89.726


0.6 0.6 [wt %]
∆ T max (K)

Acetic acid 5.4225 0.5723 ± ± ±

k
[wt %]
0.4 0.4
Water [wt %] 13.2318 12.0171 10.216 10.992 10.274

Operating conditions
0.2 0.2
Crystallization +25 ~ ±35 30~5 35~15 35~15
temperature [C]
0.0 0.0
0.000 0.002 0.004 0.006 0.008 0.010 0.012
Cooling rate 0.5 0.5 0.5 0.5
[K/min]
Seed concentration (kg seed/kg solution)
Amount of seeds 0.004 0.004 0.004 0.004
Figure 8. Effect of seed concentration on the metastable zone width and dis- [g/g]
tribution coefficient. Sweating ±10 25 30 30
temperature [C]

1.0 Sweating rate l 1 1 1


[K/min]
Impurity
Metallic elements
Al
0.8 Al [ppb] 124497.00 20890.70 7845.7 1022.2 194.29
Fe
Na
Fe [ppb] 550.84 96.38 43.12 25.61 22.77

0.6 Na [ppb] 259.27 30.68 12.04 9.20 6.60

Total impurity 125307.11 21017.76 7900.86 1057.01 223.66


k

[ppb]
0.4

0.2 4 Conclusions

In this work, the recovery of phosphoric acid from waste


0.0 acid etchant containing nitric acid, acetic acid, phosphoric
0 5 10 15 20 25 30 35
acid, and metallic elements was successfully conducted using
Sweating ( % ) static layer crystallization. The quantity of metallic impuri-
ties in the purified phosphoric acid was 1/30±1/1000 times
Figure 9. Distribution coefficients of the metallic elements during sweating.
smaller than that included in the crude etchant. Metallic im-
purities were reduced by hundreds of ppb through four-step
3.3 Muli-Step Crystallization layer melt crystallization. This purified phosphoric acid
could be recycled as an etchant in semiconductor process.
Multi-step crystallization processes were used due to their Received: November 25, 2005
difference of composition. Tab. 2 lists results for separation
by multi-stage crystallization with the operating conditions.
The crystallization temperature was set according to the Symbols used
composition of the mixture and productivity.
Acetic acid and nitric acid were perfectly removed during b [K/min] cooling rate
the first step of melt crystallization. The impurity level of k [±] distribution coefficient
the purified crystal was 1/30±1/1000 times smaller than the kn [s±1] constant related to nucleation rate
initial content of the crude etchant. Metallic impurities were n [±] nucleation order
reduced by hundreds of ppb through four-step crystalliza- S [kg/kg K] slope of solubility curve
tion. This purified phosphoric acid could be reused as an DTmax [±] metastable zone width
etchant in semiconductor process. xil [±] mass fraction of impurity in the melt
xic [±] mass fraction of impurity in the crystal

Chem. Eng. Technol. 2006, 29, No. 2  2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim http://www.cet-journal.com 275
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References [5] S. I. Hommeltoft, US Patent 5 603 812, 1997.


[6] J. Ulrich, J. Bierwirth, S. Henning, Sep. Purif. Methods 1996, 25 (1), 1.
[7] J. Ulrich, Proc. 10th Symp. on Ind. Crystallization (Eds: J. Nyvlt, S. Za-
[1] M. Stepanski, in Proc. 11th BIWIC (Ed: K. J. Kim), Hanbat National cek) Elservier Science, New York 1989.
University, Korea 2004. [8] K. J. Kim, J. Ulrich, J. Phys. D: Appl. Phys. 2001, 34, 1308.
[2] H. Wakamatsu, A. Mayusumi, N. Tanaka, OKI Technical Rev. 2001, 68 [9] K. J. Kim, J. Ulrich, J. Colloid Interface Sci. 2002, 252, 161.
(4), 23. [10] P. Barrett, G. Glennon, Trans IChemE 2002, 80, 799.
[3] W. Karner, W. Wurmbauer, K. H. Krivanec, J. Horn, US Patent 5 149 [11] K. J. Kim, J. Ulrich, Powder Technol. 2001, 121, 81.
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[4] L. D. Conant, A. Keus, US Patent 6 159 382, 2000.

______________________

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