The reliability prediction report summarizes the failure in time (FIT) and mean time between failures (MTBF) for the PNI RM3100 Magnetic Sensor based on MIL-HDBK-217F. It lists the part number, date, environment, and operating temperature. The FIT is calculated to be 6472 per 1E9 hours based on contributions from an IC/ASIC with 1000 gates and 3 magnetic sensors, with the sensors contributing most to the FIT total.
The reliability prediction report summarizes the failure in time (FIT) and mean time between failures (MTBF) for the PNI RM3100 Magnetic Sensor based on MIL-HDBK-217F. It lists the part number, date, environment, and operating temperature. The FIT is calculated to be 6472 per 1E9 hours based on contributions from an IC/ASIC with 1000 gates and 3 magnetic sensors, with the sensors contributing most to the FIT total.
The reliability prediction report summarizes the failure in time (FIT) and mean time between failures (MTBF) for the PNI RM3100 Magnetic Sensor based on MIL-HDBK-217F. It lists the part number, date, environment, and operating temperature. The FIT is calculated to be 6472 per 1E9 hours based on contributions from an IC/ASIC with 1000 gates and 3 magnetic sensors, with the sensors contributing most to the FIT total.
Reliability Prediction Report based on MIL-HDBK-217F
Part Number RM3100 Description PNI RM3100 Magnetic Sensor
Date 1/22/2018 Failure In Time (FIT) 6472 per 1E9 Hours Environment GM, ground mobile MTBF 154515 Hours Temperature (C°) 55.0
Part Description Qty Generic Name FIT, Unit PQ PL PE FIT
IC,ASIC Mag 1 MOS DLA 1000 Gates 10.0 1 1 4 40.0 Sen-S100 Sensor 3 Sen-S100 Sensor 208.6 20 1.5 12 938.9 FIT Total: 6472 notes: 1) Reliability data is either provided by component manufacturer or based on the Failure Rate Model per MIL-HDBK-217F 2) NA = Value not applicable