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  • NZ Edx-2

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    BUSTANUL RIZKY RIZKY
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    The document is an electron microscope image and analysis of a sample. It includes information like the instrument used, voltage, magnification, date, and pixel size of the image. The image shows the sample at 30 micrometers. The analysis lists the elements detected in the sample like carbon, nitrogen, oxygen, aluminum, and silicon along with their masses and atom percentages. It also provides a quantitative analysis of the elemental composition of the sample.

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    NZ EDX-2

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    The document is an electron microscope image and analysis of a sample. It includes information like the instrument used, voltage, magnification, date, and pixel size of the image. The image shows the sample at 30 micrometers. The analysis lists the elements detected in the sample like carbon, nitrogen, oxygen, aluminum, and silicon along with their masses and atom percentages. It also provides a quantitative analysis of the elemental composition of the sample.

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    © All Rights Reserved
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    8 views1 page

    NZ Edx-2

    Uploaded by

    BUSTANUL RIZKY RIZKY
    The document is an electron microscope image and analysis of a sample. It includes information like the instrument used, voltage, magnification, date, and pixel size of the image. The image shows the sample at 30 micrometers. The analysis lists the elements detected in the sample like carbon, nitrogen, oxygen, aluminum, and silicon along with their masses and atom percentages. It also provides a quantitative analysis of the elemental composition of the sample.

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    © All Rights Reserved
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    of 1

    NZ JEOL 1/1

    Title : IMG1
    ---------------------------
    Instrument : 6510(LA)
    Volt : 15.00 kV
    Mag. : x 1,000
    Date : 2022/11/22
    Pixel : 1024 x 768

    02
    02

    30
    30 µm
    µm
    02
    SiKa

    Acquisition Parameter
    15000 Instrument : 6510(LA)
    Acc. Voltage : 15.0 kV
    13500
    Probe Current: 1.00000 nA
    PHA mode : T3
    12000
    Real Time : 52.42 sec
    Live Time : 50.00 sec
    10500
    Dead Time : 4 %
    OKa

    9000 Counting Rate: 5409 cps


    Counts

    Energy Range : 0 - 20 keV


    7500
    6000
    AlKa
    CKa NKa

    4500
    3000
    1500
    0
    0.00 1.00 2.00 3.00 4.00 5.00 6.00 7.00 8.00 9.00 10.00

    keV
    ZAF Method Standardless Quantitative Analysis
    Fitting Coefficient : 0.0977
    Element (keV) Mass% Sigma Atom% Compound Mass% Cation K
    C K 0.277 9.41 0.10 14.01 1.9215
    N K* 0.392 4.41 0.12 5.63 5.2351
    O K 0.525 52.81 0.23 59.00 58.3506
    Al K 1.486 5.00 0.05 3.31 4.8473
    Si K 1.739 28.36 0.12 18.05 29.6455
    Total 100.00 100.00

    JED-2300 AnalysisStation

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