609_REL670_DIST.

dst:
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Test Object - Device Settings
. . .
Substation/Bay:
Substation: 220/66/11KV KPTCL SS Substation address: CHANPATNA
Bay: 66KV BEVUR LINE Bay address: 609
. . .
Device:
Name/description: REL670 V1.1 IEC Manufacturer: ABB
Device type: REL670 V1.1 Device address: 1
Serial/model number: I1837037
Additional info 1: Line A
Additional info 2: Distance Protection
. . .
Nominal Values:
f nom: 50.00 Hz Number of phases: 3
V nom (secondary): 110.0 V V primary: 66.00 kV
I nom (secondary): 1.000 A I primary: 400.0 A
. . .
Residual Voltage/Current Factors:
VLN / VN: 1.732 IN / I nom: 1.000
. . .
Limits:
V max: 200.0 V I max: 50.00 A
. . .
Debounce/Deglitch Filters:
Debounce time: 3.000 ms Deglitch time: 0.00 s
. . .
Overload Detection:
Suppression time: 50.00 ms
. . .
Other Device Properties:
Drop-out time: 20.00 ms

Test Object - Other RIO Functions

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CB Configuration
Description Name Value
CB trip time CB trip time 50.00 ms
CB close time CB close time 100.00 ms
Times for 52a, 52b in percent of CB time 52a, 52b % of CB 20.00 %

Test Object - Distance Settings

. . . .
System parameters:
Line length: 23.55 Ω Line angle: 78.63 °
PT connection: at line CT starpoint: Dir. line
Impedance correction no
1A/I nom:
Impedances in primary yes
values:
. . . .
Tolerances:
Tol. T rel.: 2.000 %
Tol. T abs. +: 115.0 ms Tol. T abs. -: 115.0 ms
Tol. Z rel.: 2.000 % Tol. Z abs.: 50.00 mΩ
. . . .
Grounding factor:
kL mag.: 0.000000 kL angle: 0.000000°
Separate arc resistance: no

Zone Settings:
Label Type Fault loop Trip time Tol. T rel Tol. T abs+ Tol. T abs- Tol. Z rel. Tol. Z abs
Z1LL Tripping L-L 24.00 ms 2.000 % 115.0 ms 115.0 ms 2.000 % 1.354 Ω
Z2LL Tripping L-L 374.0 ms 2.000 % 115.0 ms 115.0 ms 2.000 % 1.627 Ω
Z3LL Tripping L-L 1.024 s 2.000 % 115.0 ms 115.0 ms 2.000 % 2.023 Ω
Z4LL Tripping L-L 524.0 ms 2.000 % 115.0 ms 115.0 ms 2.000 % 600.7 mΩ
Z1LN Tripping L-E 24.00 ms 2.000 % 115.0 ms 115.0 ms 2.000 % 1.572 Ω
Z2LN Tripping L-E 374.0 ms 2.000 % 115.0 ms 115.0 ms 2.000 % 1.955 Ω
Z3LN Tripping L-E 1.024 s 2.000 % 115.0 ms 115.0 ms 2.000 % 2.581 Ω
Z4LN Tripping L-E 524.0 ms 2.000 % 115.0 ms 115.0 ms 2.000 % 1.022 Ω
PHSLL Starting L1-L2 +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 1.105 Ω
PHSLL Starting L2-L3 +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 1.105 Ω
PHSLL Starting L3-L1 +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 1.105 Ω
PHSLLL Starting L1-L2-L3 +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 1.296 Ω
PHSLN Starting L-E +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 3.074 Ω
Load non trip. L-E n/a n/a n/a n/a 2.000 % 1.600 Ω
encroachme
nt forward
LN
Load non trip. L-E n/a n/a n/a n/a 2.000 % 1.600 Ω
encroachme
nt reverse
LN
Load non trip. L1-L2 n/a n/a n/a n/a 2.000 % 1.386 Ω
encroachme
nt forward
LL
Load non trip. L1-L2 n/a n/a n/a n/a 2.000 % 1.386 Ω
encroachme
nt reverse
LL
Load non trip. L2-L3 n/a n/a n/a n/a 2.000 % 1.386 Ω
encroachme
nt forward
LL
Load non trip. L2-L3 n/a n/a n/a n/a 2.000 % 1.386 Ω
encroachme
nt reverse
LL
Load non trip. L3-L1 n/a n/a n/a n/a 2.000 % 1.386 Ω
encroachme
nt forward
LL
Load non trip. L3-L1 n/a n/a n/a n/a 2.000 % 1.386 Ω
encroachme
nt reverse
LL
Load non trip. L1-L2-L3 n/a n/a n/a n/a 2.000 % 1.600 Ω
encroachme
nt forward
LLL
Load non trip. L1-L2-L3 n/a n/a n/a n/a 2.000 % 1.600 Ω
encroachme
nt reverse
LLL
Z3LL Starting L-L +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 2.023 Ω
Z4LL Starting L-L +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 600.7 mΩ
Z3LN Starting L-E +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 2.581 Ω
Z4LN Starting L-E +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 1.022 Ω
X/Ω

100

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-125 -100 -75 -50 -25 0 25 50 75 100

R/Ω

Linked XRIO References

Reference Name Unit Value XRIO Path
RIO.DEVICE.NOMINALVALUES.INOM In 1.00 A RIO/Device/Nominal Values/In
RIO.DEVICE.NOMINALVALUES.VNO V_nom 110.00 V RIO/Device/Nominal Values/V nom
M

Test Settings
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Test model:
Test model: constant test current ITest: 2.000 A
Allow reduction of yes
ITest/VTest:
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Fault Inception:
Mode: random Angle: n/a
DC-offset: no
.
Times:
Prefault: 1.000 s Max. fault: 1.100 s
Postfault: 500.0 ms Time reference: fault inception
.
Other:
CB simulation: off Extended zones: not active
Switch off at zero yes
crossing:

Test Results
Shot Test: Fault Type L1-E
|Z| Phi t nom t act. Dev. ITest Result
18.60 Ω 78.63 ° 24.00 ms 15.70 ms -34.58 % 2.000 A Passed
39.24 Ω -10.00 ° 24.00 ms 24.30 ms 1.25 % 1.942 A Passed
33.33 Ω 78.63 ° 374.0 ms 374.0 ms 0% 2.000 A Passed
58.18 Ω 30.00 ° 374.0 ms 378.0 ms 1.069 % 1.310 A Passed
55.97 Ω 78.63 ° 1.024 s 1.027 s 0.293 % 1.362 A Passed
78.21 Ω 42.99 ° 1.024 s 1.026 s 0.1758 % 974.4 mA Passed
3.004 Ω -101.37 ° 524.0 ms 513.9 ms -1.927 % 2.000 A Passed
30.19 Ω -175.13 ° 524.0 ms 524.0 ms 0% 2.000 A Passed
61.70 Ω 78.63 ° no trip no trip n/a 1.235 A Passed
7.596 Ω -101.37 ° no trip no trip n/a 2.000 A Passed
X/Ω

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Shot Test: Fault Type L2-E

|Z| Phi t nom t act. Dev. ITest Result
18.60 Ω 78.63 ° 24.00 ms 12.90 ms -46.25 % 2.000 A Passed
46.29 Ω 20.00 ° 24.00 ms 24.50 ms 2.083 % 1.646 A Passed
39.24 Ω -10.00 ° 24.00 ms 24.20 ms 0.8333 % 1.942 A Passed
33.33 Ω 78.63 ° 374.0 ms 373.1 ms -0.2406 % 2.000 A Passed
58.18 Ω 30.00 ° 374.0 ms 376.2 ms 0.5882 % 1.310 A Passed
55.97 Ω 78.63 ° 1.024 s 1.026 s 0.1758 % 1.362 A Passed
78.21 Ω 42.99 ° 1.024 s 1.026 s 0.2246 % 974.4 mA Passed
3.004 Ω -101.37 ° 524.0 ms 515.9 ms -1.546 % 2.000 A Passed
30.19 Ω -175.13 ° 524.0 ms 527.1 ms 0.5916 % 2.000 A Passed
61.70 Ω 78.63 ° no trip no trip n/a 1.235 A Passed
7.596 Ω -101.37 ° no trip no trip n/a 2.000 A Passed
 X/Ω

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Shot Test: Fault Type L3-E

|Z| Phi t nom t act. Dev. ITest Result
18.60 Ω 78.63 ° 24.00 ms 13.60 ms -43.33 % 2.000 A Passed
46.29 Ω 20.00 ° 24.00 ms 25.70 ms 7.083 % 1.646 A Passed
39.24 Ω -10.00 ° 24.00 ms 26.00 ms 8.333 % 1.942 A Passed
33.33 Ω 78.63 ° 374.0 ms 374.3 ms 0.0802 % 2.000 A Passed
58.18 Ω 30.00 ° 374.0 ms 375.4 ms 0.3743 % 1.310 A Passed
55.97 Ω 78.63 ° 1.024 s 1.026 s 0.2344 % 1.362 A Passed
78.21 Ω 42.99 ° 1.024 s 1.026 s 0.1465 % 974.4 mA Passed
3.004 Ω -101.37 ° 524.0 ms 515.7 ms -1.584 % 2.000 A Passed
30.19 Ω -175.13 ° 524.0 ms 524.8 ms 0.1527 % 2.000 A Passed
61.70 Ω 78.63 ° no trip no trip n/a 1.235 A Passed
7.596 Ω -101.37 ° no trip no trip n/a 2.000 A Passed
 X/Ω

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Shot Test: Fault Type L1-L2

|Z| Phi t nom t act. Dev. ITest Result
10.63 Ω 78.63 ° 24.00 ms 14.60 ms -39.17 % 2.000 A Passed
39.79 Ω 12.94 ° 24.00 ms 24.30 ms 1.25 % 1.659 A Passed
38.33 Ω -10.00 ° 24.00 ms 23.50 ms -2.083 % 1.722 A Passed
18.94 Ω 78.63 ° 374.0 ms 367.2 ms -1.818 % 2.000 A Passed
50.00 Ω 20.00 ° 374.0 ms 377.0 ms 0.8021 % 1.320 A Passed
33.33 Ω 78.63 ° 1.024 s 1.027 s 0.2832 % 1.980 A Passed
60.74 Ω 30.00 ° 1.024 s 1.026 s 0.1758 % 1.087 A Passed
2.724 Ω -150.00 ° 524.0 ms 525.0 ms 0.1908 % 2.000 A Passed
16.67 Ω -180.00 ° 524.0 ms 527.2 ms 0.6107 % 2.000 A Passed
38.24 Ω 78.63 ° no trip no trip n/a 1.726 A Passed
3.989 Ω -101.37 ° no trip no trip n/a 2.000 A Passed
 X/Ω

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Shot Test: Fault Type L2-L3

|Z| Phi t nom t act. Dev. ITest Result
10.63 Ω 78.63 ° 24.00 ms 16.80 ms -30 % 2.000 A Passed
39.79 Ω 12.94 ° 24.00 ms 25.80 ms 7.5 % 1.659 A Passed
38.33 Ω -10.00 ° 24.00 ms 26.00 ms 8.333 % 1.722 A Passed
18.94 Ω 78.63 ° 374.0 ms 367.1 ms -1.845 % 2.000 A Passed
50.00 Ω 20.00 ° 374.0 ms 375.3 ms 0.3476 % 1.320 A Passed
33.33 Ω 78.63 ° 1.024 s 1.028 s 0.4297 % 1.980 A Passed
60.74 Ω 30.00 ° 1.024 s 1.026 s 0.1465 % 1.087 A Passed
2.724 Ω -150.00 ° 524.0 ms 525.7 ms 0.3244 % 2.000 A Passed
16.67 Ω -180.00 ° 524.0 ms 525.3 ms 0.2481 % 2.000 A Passed
38.24 Ω 78.63 ° no trip no trip n/a 1.726 A Passed
3.989 Ω -101.37 ° no trip no trip n/a 2.000 A Passed
 X/Ω

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Shot Test: Fault Type L3-L1

|Z| Phi t nom t act. Dev. ITest Result
10.63 Ω 78.63 ° 24.00 ms 14.60 ms -39.17 % 2.000 A Passed
39.79 Ω 12.94 ° 24.00 ms 24.90 ms 3.75 % 1.659 A Passed
38.33 Ω -10.00 ° 24.00 ms 27.00 ms 12.5 % 1.722 A Passed
18.94 Ω 78.63 ° 374.0 ms 373.2 ms -0.2139 % 2.000 A Passed
50.00 Ω 20.00 ° 374.0 ms 377.7 ms 0.9893 % 1.320 A Passed
33.33 Ω 78.63 ° 1.024 s 1.029 s 0.4785 % 1.980 A Passed
60.74 Ω 30.00 ° 1.024 s 1.027 s 0.2539 % 1.087 A Passed
2.724 Ω -150.00 ° 524.0 ms 524.9 ms 0.1718 % 2.000 A Passed
16.67 Ω -180.00 ° 524.0 ms 524.4 ms 0.0763 % 2.000 A Passed
38.24 Ω 78.63 ° no trip no trip n/a 1.726 A Passed
3.989 Ω -101.37 ° no trip no trip n/a 2.000 A Passed
 X/Ω

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Shot Test: Fault Type L1-L2-L3

|Z| Phi t nom t act. Dev. ITest Result
10.63 Ω 78.63 ° 24.00 ms 14.70 ms -38.75 % 2.000 A Passed
39.79 Ω 12.94 ° 24.00 ms 65.20 ms 171.7 % 1.915 A Passed
38.33 Ω -10.00 ° 24.00 ms 66.30 ms 176.3 % 1.988 A Passed
18.94 Ω 78.63 ° 374.0 ms 365.9 ms -2.176 % 2.000 A Passed
50.00 Ω 20.00 ° 374.0 ms 415.3 ms 11.04 % 1.524 A Passed
33.33 Ω 78.63 ° 1.024 s 1.067 s 4.199 % 2.000 A Passed
60.74 Ω 30.00 ° 1.024 s 1.048 s 2.344 % 1.255 A Passed
2.724 Ω -150.00 ° 524.0 ms 526.0 ms 0.3817 % 2.000 A Passed
16.67 Ω -180.00 ° 524.0 ms 523.9 ms -0.0191 % 2.000 A Passed
38.24 Ω 78.63 ° no trip no trip n/a 1.993 A Passed
3.989 Ω -101.37 ° no trip no trip n/a 2.000 A Passed
 X/Ω

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Shot Details:
.
Parameters:
Fault Type: L1-L2-L3
| Z |: 3.989 Ω Phi: -101.37 °
R: -786.3 mΩ X: -3.911 Ω
ITest: 2.000 A
.
Results:
t act.: no trip Assessment: Passed
t nom: no trip Dev.: n/a
t min: no trip t max: no trip

.
Fault Quantities (natural):
VL1: 7.979 V 0.00 °
VL2: 7.979 V -120.00 °
VL3: 7.979 V 120.00 °
IL1: 2.000 A 101.37 °
IL2: 2.000 A -18.63 °
IL3: 2.000 A 221.37 °
VFault: 7.979 V 0.00 °
IFault: 2.000 A 101.37 °
.
Cursor Data
Time Signal Value
Cursor 1 0.00 s <none> n/a
Cursor 2 1.100 s <none> n/a
C2 - C1 1.100 s n/a

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Test State:
Test passed