21.

EDT working
The test data volume increases exponentially with increase in circuit size. For large circuits,
the growing test data volume causes a significant increase in test cost because of much longer
test time and elevated tester memory requirements to store the test data
Test Data Volume ≈ Number of Scan Cells in all the Scan Chains × Scan Patterns

Although there exists software techniques for test compression that are implemented by
Automatic Test Pattern Generation(ATPG) tools in the form of complex algorithm, still it is
not enough to achieve high test compression. Therefore we go for Hardware based test
compression techniques by adding additional logic to the circuit, at the cost of increased area.
in conventional ATPG, the patterns consists of many ‘x’ or don’t care bits that increases the
test data volume and loading and unloading these bits to scan chains increases the tester time.
The decompressor consists of a ring generator The external inputs feeding the ring
generator are commonly referred as EDT channels. The outputs of the ring generator flops
will connect to scan chain inputs through a phase shifter consisting of XOR gates. phase
shifter helps supporting more scan chains than the degree of LFSR.
Compactor
EDT uses the spatial compactor which consists of group of XOR trees. It allows multiple
scan chains to be observed at the same time on a given scan output channel.
Scan cells can capture unknown or’X’ values from black boxes. An X captured in one of the
chain will then block the corresponding cell in other chain, resulting in loss of observability.
To deal with these issues, a mask controller is also found as a part of compactor logic.