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6 - Nonequilibrium Excess Carriers in Semiconductors
6 - Nonequilibrium Excess Carriers in Semiconductors
Chapter 6.
ex) in p-type material (𝑝0 ≫ 𝑛0) -> low-level injection: (𝛿𝑛(𝑡) ≫ 𝑝0)
High-level injection
The excess carrier concentration becomes comparable to or greater than the thermal-
equilibrium majority carrier concentrations.
ex) in p-type material (𝑝0 ≫ 𝑛0) -> high-level injection: (𝛿𝑛 𝑡 ~ 𝑝0)
for electrons
for holes
Ambipolar Transport
External E-field & Induced Internal E-field
Eapp Eapp
−−−− Ec −−−− Ec
External Eint
excitation
++++ Ev ++++ Ev
Ambipolar Transport
External E-field & Induced Internal E-field
−−−− Ec
The internal E-field holds the excess
electrons and holes together
Eint
Move together
++++ Ev
with a single effective mobility or diffusion coefficient
Ambipolar Transport
Ambipolar Transport Equation: intrinsic semiconductors
Ambipolar transport equation (for intrinsic)
Ambipolar mobility
Ambipolar transport
: excess carrier generation rate
: excess carrier recombination rate
Ambipolar Transport
Ambipolar Transport Equation: extrinsic semiconductors
For p-type semiconductor (under low injection) For n-type semiconductor (under low injection)
: excees minority carrier electron concentration under low injection : excees minority carrier hole concentration under low injection
: minority carrier lifetime under low injection : minority carrier hole lifetime under low injection
: excess carrier holegeneration rate : excess carrier generation rate
Ambipolar Transport
Ambipolar Transport Equation: Application
Ambipolar Transport
Example 6.2: for time variation
2. g’ = 0
solution
3. low injection: is constant
Ambipolar Transport
Example 6.4: for spatial variation
1.
2.
solution
Ambipolar Transport
Example 6.4: for spatial variation
Surface Effects
Surface States
The abrupt termination of the periodic potential at the surface results in a distribution of
allowed energy states within the bandgap