BRUKER ADVANCED X-RAY SOLUTIONS

Technical Data

Analytical performance
The S4 EXPLORER combines the analytical performance of a wavelength-dispersive X-ray
spectrometer and the advantages of space saving and cost efficiency like an energy-dispersive
X-ray spectrometer.
The improved light element analysis of the S4 EXPLORER is based on multilayer analyzer
crystals, very coarse collimators and close sample/X-ray tube coupling, but optimized by its
unique 75µm ultra thin X-ray tube window and innovative Pro4 Super High Transmission
sealed proportional counter.
Analysis range Beryllium to Uranium
Concentration range concentrations from sub ppm to 100%
Sample form powder, solid, liquid, paste, coating, slurry, film,
filter deposit, etc.
Sample size loose powder and liquids: up to 50 ml
solid, film, paper: to 51 mm (2‘‘) ø, 47 mm (1.8‘‘) height
Room planning
Mains 230 V 1p or 3p, 254 V 1p, 208 V 1p; 50 or 60 Hz
(Generator stability ± 0.0005% of the set value at main voltage fluctuations of ± 1%)
Detector gas not required
External cooling water not required
Vacuum pump vacuum pump integrated in spectrometer
Gas for analysis of
liquids or loose powders Helium or Nitrogen, at reduced or normal atmospheric pressure
(Sample and spectrometer chamber are separated by a programmable air lock (vacuum seal)
minimizing the helium consumption and pump-down times, increasing detector stability and
analytical reproducibility)
Dimensions 131cm x 84cm x 88cm; 390kg
51.6” x 33.1” x 34.6”
(height x width x depth, weight)
Quality & Safety DIN ISO 9001 / EN 29001
CE Certified
Fully Radiation Protected System (e.g. DIN 54113)

BRUKER AXS GMBH BRUKER AXS INC.

Oestliche Rheinbrueckenstr.50 5465 East Cheryl Parkway

D-76187 KARLSRUHE MADISON, WI 53711
GERMANY USA

TEL. (+49) (7 21) 5 95 -28 88
FAX (+49) (7 21) 5 95 - 45 87
http://www.bruker-axs.de
Email info@bruker-axs.de
TEL. (+1) (800) 234- XRAY Water Detector gas Compressed air Space
TEL. (+1) (608) 276- 3000
FAX (+1) (608) 276- 3006
http://www.bruker-axs.com
AIM 00865

Email info@bruker-axs.com

All configurations and specifications are subject to change without notice. Order No. B80-E00001 2001 BRUKER AXS Printed in Germany.
BRUKER ADVANCED X-RAY SOLUTIONS

SPECTROMETRY SOLUTIONS
S4 EXPLORER

The
Little
Giant
2
 5

BRUKER ADVANCED X-RAY SOLUTIONS

The whole periodic table

with just a mouse click?
S4 EXPLORER – The Little Giant!

height: 131 cm
51.6’’

Water

depth: 88 cm
34.6’’ Detector gas

width: 84 cm
33,1’’
3

Multi-element analysis with

the S4 EXPLORER – little effort
in sample preparation but
gigantic versatility
…
, ores, ceramics,
nerals
rocks, mi
liquids

crushing,ng
a ly s is for multi-ele ti-
mental pulverizi
a n
With XRF provements and op n.
ti m e im aratio
analy sis,
rt w ith sa mple prep 3 min
a l.
mization st or for this is minima
e a n d la b
Tim e
ses with th
u lti-e le m ental analy n-destructive
M a no
RER ensure cal me-
S4 EXPLO entally safe analyti
n m issolution
and enviro oesn’t require the d ples or
hd m
thod, whic uently the loss) of sa lvents,
(and co n se q
azardous
wast soe fusing
the disp o sa l o f h
l methods. pressing
as do a ll th e w et chemica
uids, loose
pouring
u analyse liq der pellets g dripping
decantin
th e r y o
Whe ssed pow our
metals, pre y
powders, ds – preparation of lace
d b ea o u r o rp
or fuse le: p
p le s is a lways simp e sample cup
sam th
directly into mple.
the sample can explore your sa
y o u
and then tion of
tin g to the prepara n, bind-
Data rela s the loss on ignitio 10 min
ch a dditional
samples, su dilutions and any a 2 min
or sily
ing agents rmation can be ea your 10 s
l in fo over omfr
chemica ire ctly taken
15 s
d o r d 10 s
inserte
network.
laboratory
 4

es
ieces, chips, wir
small p
lass, polymers, …
g
metals

direct
milling, cutting, ing
grinding, hot press
polishing

5s

2 min

1 min
preparation of solid and powder
materials within minutes
safe and fast direct analysis of
liquids and loose powders
direct measurement of small and
irregularly sized samples
6

S4 EXPLORER – let’s introduce

The Little Giant

220/110 V
 7

ines the
4 E X P LO RER comb e of a
The S erformanc X-ray
nalytical p e
superior a avelength dispersiv cibility
seque n tia l w h re du
pro
tro m e te r, such as hig ent analysis,
spec ht elem
vity for lig ving and
and sensiti ntages of space sa rsive
d v a pe
and the a y like an energy-dis
ie n c
cost effic
trometer.
X-ray spec rywhere,
E X P LO R ER fits eve nt of the
The S4 environme of the
e r in the clean dings
w h e th
th e ru g g ed surroun to be
lab or in hat is
c tio n si te , exactly w ce saving
produ per spa
from a pro
expected
ter.
spectrome nning cost
s
in st a lla tion and ru on doesn’t
The operati
al since its water
are minim ressed air, cooling
m p
require co as.
d e te cto rg
or S4 EXPLORER –
little in
space
operational costs
installation requirements
effort for setup and calibration
training required
gigantic in
integrated intelligence
analytical flexibility
sensitivity
reproducibility
sample through-put
8

Just one mouse click and you’ll

explore the whole periodic table –
S4 EXPLORER with SPECTRAplus

ACS total Automatic setup and

Calibration System
Totally Integrated Analytical
Intelligence
virtual, real-time display of
spectrometer and sample magazine
status
simple data transfer within
the Windows™ world and ease of
networking
 13

ation in
a l d ata communic TCP/IP
Inte rn on the
in X RF A plus is based re, the
e a s uri n g rou tin e
o f SPE C T R
e r P rinc iple. Therefo plus
A daily m ing and unloading ent RA
d Client/Serv ctionality of SPECT your
lo a su re m fu n uter within
means: the the starting of mea bove complete
on a ny co m p
ectro-
nd
samples a on to both, we kept, mple
a is available means that your sp al
lati e sa his tic
jobs. In re fort in mind. A larg utine network. T controlled or analy Aplus
r c o m rin g ro c an b e PE C T R
all, you a safe measu hput, meter e
yS
valuated b our network
in e a n d g c a n b e
magaz le throu data
omputer w
ithin y
high samp nsibilities from any c le, from your porta
ble PC,
guarantee r your other respo p
fo m
freeing yo
u or, for exa u are, via modem.
yo
in th e la b .
ra pidly d efin e d wherever
ent jo b s a re
put.
Measurem minimal operator in -
d w it h p re
le p
and starte nd easier than sam mea-
Even faste
r a
n se lec t o r create a
you ca e
paration; u just defin
b . F o r e x ample, yo analytical
suring jo e required matically
nts and th
the eleme d SPECTRAplus auto ns and
an conditio
accuracy st measuring
ts th e b e
selec
methods.
evaluation training or
o sp e c ia l technical ieve precise
N to ach
is required rement and the
expertise e a su
rt the m lly prin-
results. Sta sults are automatica
l re
analytica e.
a short tim
ted in just
9

Sequential wavelength-dispersive
XRF analysis with the
S4 EXPLORER – the better way …
Sample Collimator mask
Sequential wavelength-dispersive
Vacuum seal
Primary beam XRF analysis:
filter
Collimator best light element sensitivity
high count rates (up to one million
X-ray tube cps per element line) for high
accuracy and short measuring time
Analyzer best line resolution for accurate
crystal results
Pro4 – Sealed
proportional flexible background determination
counter for reliable trace element analysis

Scintillation
counter

een the
o n tra n sitions betw M-shell)
Electr (K-, L- and nergies)
s of atoms e
inner shell of wavelengths (or
X -ra y s t.
create elemen
stic of the ) uses this
Light ele
m en t characteri ence analysis (XRF ve and
sc tati
Ejected X-ray fluore radiation for quali
stic
electron characteri lement analysis.
ee
quantitativ r shells
si tio ns b e tween inne emical
ristic The tran rbed by c
h
Characte
ia tion f ato m s a re not distu ther advantage of
r a d o no
XRF
herefore a uid sam-
binding. T is that solid and liq reas
sis he
Inciden
t XRF analy nalyzed directly, w n of
a n b e a p o ratio
X-ray ples c ds require
eva
a l m e th o
optic
material.
the sample ele-
diation the ergy)
sc e n ce ra en
From fluore stic wavelength (or
c te ri y -disper-
Heavy e
lement Ejected ment chara rated either by energ n at an
p a tio
electron can be se r by reflec
e E D -X R F analysis o ngth-dispersive
siv vele
rystal (wa
analyzer c lysis).
na
WD-XRF a rs the advan
tage
sis o ffe
naly est
Characte
ristic WD-XRF a ount rates and the b
d ia tion h e st c
of the hig
XR F r a

resolution.
t
Inciden
X-ray
10

… realized in a totally new design –

look what’s inside:

Transmission Efficiency vs. Energy (eV)

for Pro4 Sealed Proportional Counter The analysis of very light elements
requires an extremely thin detector window.
New SHT Super High
Transmission window
Up to now the choice was a sealed pro-
1.00 portional counter with a Beryllium window
Na
of low transparency or a flow proportional
0.80 F
B P counter with a high transparency window,
C O
0.60 Si but with the requirement of a constant
N Al gas flow.
0.40
Mg For the first time the Pro4 Super
Traditional 25 µm
0.20 High Transmission sealed proportional
Na Beryllium window
counter offers ultra light element analysis
0.00
0 400 800 1200 1600 2000 with a closed detector.

citation,
000 W ex
– unique 1 V or 50 mA
up to 50 k X-ray tube
with
g ce ra m ic
uplin be window
– close co th in X-ray tu
m ultra
75 µ
eam filters
p to 1 0 primary b
– u tion of
se a l fo r safe opera
– vacuum loose pow
ders
liquids and
collimators
– up to 4
rystals
analyzer c
– up to 8 meter with
d er c o n trolled gonio ta
– enco 2The
Theta and
decoupled 0°/min
in g sp e e d up to 20
– scann on sealed
p e r H ig h Transmissi lements
e
– Pro4 Su al counter for light
propo rt io n
unter for
n c y sc in tillation co
ic ie
– high eff
ments
heavy ele optimal
c uu m o peration for
a
– stable v nd reproducibility
a
sensitivity
es based
im iz e d p umping tim ntrol of
– min m co
ual vacuu
on individ ck
lo
sample air

Water Detector gas Compressed air Space

 11

S4 EXPLORER and SPECTRA – plus

fully Integrated Analytical

Intelligence …

i-
with a min
d a rd le ss analysis calibrations
Stan ecific
r input or sp st detec-
mum of use st accuracy or lowe TRAplus
he EC
for the hig 4 EXPLORER and SP litative,
m its – S tion of qua
tion li less integra tative”) and
r a se a m
offe uanti
ss (”semiq
standardle ethods.
em
quantitativ al Intelli-
In teg ra te d Analytic ears of
The fully 40 y
a se d o n more than
gence is b nalysis.
x pe rie n c e in XRF a
e

precalibrated for all types

of materials
intelligent measuring strategies
applying the best parameters
totally flexible interactive data
evaluation
automatic correction of spectral
overlaps
fully integrated matrix correction
with fundamental parameters indivi-
dually calculated for each sample
(”variable alphas”)
simple and fast optimization with
material specific standard samples
 12

… and open communication

and unlimited data management
integrated data base for all sample data
flexible integration of external
sample data, for example from pre-
manual or
paration or results of other analytical automatic input
AXS -051066
methods of sample name
simple data transfer within the
Windows™ world and ease of networking
sample data from
preparation and
other analytical
methods

further
sample data

XRF results

spread sheet
calculations

SPC applications
(statistical
process control)

graphical
evaluations and
presentations
AXS -051066

integrated data base with selection of results by reports,

sample data sets specific criteria, such as documentation,
date and time, operator, documents, etc.
material, etc.
integration into
LIMS (laboratory
information
management
systems)