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@?????????????????? Modern Selectivity Techniques For LV System
@?????????????????? Modern Selectivity Techniques For LV System
@?????????????????? Modern Selectivity Techniques For LV System
Marcelo E. Valdes, PE
GE Industrial Solutions
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Too Coordinate or Not to Coordinate
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In an arc flash conscious world
• Should we perform a study to optimize
coordination ?
• Should we perform a study to optimize
protection ?
• Why do study graphics show coordination
but not protection ?
• Which is more important ?
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Tradition & Change
• Some call it an art and a science…
• A study in compromise…But
– National electrical code
– Electrical safety ( NFPA70E, IEEE 1584, OSHA )
– Business needs Well…
– Technology Sort of …
Demands both
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Traditional coordination
• Based on nesting time current curves
• All values RMS
• All behavior explained by a time-current-
curve
• Tolerance handled multiple ways…
Very conservative… or is it?
Based on bolted faults… but the real hazard are arcing faults !
Old fashioned !!!
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CURRENT IN AMPERES
1000
100
150A
800A LVPCB
Traditionally
Overcurrent protective
TIME IN SECONDS
devices are selected to
10
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Often Compromises
CURRENT IN AMPERES
1000
800A LVPCB
1000.00
Selectivity
150A
100
100.00
or
TIME IN SECONDS
10
10.00
Protection
Seconds
1
or
1.00
0.10
8 calories
0.01
both 0.10
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100 1,000 Amperes 10,000 100,000
Accomplish Both… it is possible
Beyond the time current curve
• Peak-let-through analysis
• Energy Nesting
• Energy measurement and proxies
• Zone based protection
– Differential
– Zone-Selective-Interlocking
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Peak-Let-Through Analysis
Adjustable
IOC
• Uses the known current limiting
characteristics of a downstream
device to derive IOC setting for
upstream device.
• Assumes upstream IOC is a simple
Current limiting
instantaneous current threshold
OCPD comparator
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How IOC works 1000
CURRENT IN AMPERES
800A LVPCB
Amperes
of the current they allow to flow
while interrupting to lower (peak- 0.0000 0.0042 0.0083
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Let-Through Curve Peak at test PF
Peak for symmetrical
• Graph of peak current
allowed by an interrupting Let-
OCPD versus “prospective” Through
fault current at test PF &
worst closing angle.
• For CB, drawing represents
worst phase !
• For fuses a “1” phase event… 3 phase, 1 or 2 fuses
may be slower
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Available Ibf = 30kA Quiz Peak at PF = 20% ~ 2.183 x RMS
Required PU
13kA
20 x 2.183 /1.41 31kA RMS
1
Available Ibf = 20kA RMS, X/R=4.9
2
X
1) What do you set IOC on CB1 to be selective with CB2? (CB is NOT
current limiting) PU 20X 1.83/1.41 31kA RMS
Ignoring tolerance
for simplicity
2) If CB 2 is Current Limiting, what can you set CB1 to?
PU 13/1.41 9.3kA RMS
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How used?
• Adjustable electronic TU upstream
• CL CB/Fuse downstream
• Knowing CL peak-let-through curve
• Commonly done in IEC markets
• How many manufacturer’s selectivity
tables were created
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I2t (Peak let-
through Energy Nesting
Energy) =
area under Ibf • Fuses: thermal energy… if
1
curve
fuse 2 total I2t let-through <
Ipeak (let-
through)
than fuse 1 melting energy
fuses are selective
2 • CB version works the same but
with mechanical energy
Melting Arcing
Amperes
Time Time
Clearing 0.0000 0.0042 0.0083
Time
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Seconds
Energy Nesting Selectivity
• For fuses it requires a ~ 2:1 ratio between
fuses of similar types & same manufacturer
• For CBs it requires a ratio ~2.6:1 & same
manufacturer
• Both tested & published by manufacturer
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Advanced “proprietary” Techniques
• Each manufacturer may have their own,
probably reflected in published selectivity
tables
• One manufacturer’s method follows
“Waveform Recognition” a proxy for
measuring energy; allows variable
settings in upstream CB/trip
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Waveform Recognition
Advantages
• Allows adjustment of upstream IOC
• Same PU regardless available Ibf
• Can be seen on TCC, does not need tables
Disadvantages
• Manufacturer specific
• Voltage specific
• Requires testing to verify
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Proxy for measuring energy waveform
• Each MCCB (& fuse) has characteristic
1000.00
250A CL MCCB
current & energy limitation capability
• ETU has to recognize “it” (waveform
100.00
Seconds
or upstream mechanical platform 1.00
No tables or calculations
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Interpreting the 1000.00
Upstream
800A LVPCB
WFR curve 100.00
Seconds
• Also shows selectivity may 1.00
stop at 85kA
• Current limitation “V
dependent” 0.10
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Amperes
1000.00
Seconds
upstream CB may be any
• How far selectivity extends 1.00
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Solutions build up
1) Small/med. OCPD selective with energy nesting
2) Smaller/medium OCPD selective under LVPCB &
large MCCB using WFR
Larger devices ?
3) Electronics improved protection no sacrifice
in protection
– Zone interlocking
– Differential (87B)
ZSI Recent improvements better solution than before…
Differential not necessarily too expensive or complex for LV
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ZSI Types
• Delay – traditional ST & GF
• Instantaneous
• Threshold
• Shape
• Directional inhibit
• Cross Voltage
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Zone-Selective-Interlocking (ZSI)
Receives signal &
• Identify fault location, Improve incorporate into trip logic
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100.00
In-Zone protection
• If 2 CB sense current over threshold (unrestrained upper tier)
1.00
Seconds
send signal, upper tier must receive
1000.00 1000.00
0.10
Seconds
“too” fast, & restraint
is “fast enough”
0.10 0.10
0.01 0.01
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100 Amperes 1,000 10,000 100 100,000
Amperes 1,000 10,000 100,000
How much shift is needed ?
ST shift
1000.00 1000.00 1000.00
100.00
X
100.00 100.00
maintains 3
X levels of
selectivity,
10.00 10.00 10.00
X
Instantaneous
Seconds
Seconds
Seconds
All unrestrained
1.00 1.00 1.00
In-Zone 2 upper restrained 1 upper restrained
protection only 2… if there
0.10 0.10 0.10
is a 50kA fault &
1 CB fails, is
selectivity really
0.01 0.01 0.01
1,000 Amperes 10,000 100,000 1,000 Amperes 10,000 100,000 1,000 Amperes 10,000 100,000
Seconds
shift
1.00 1.00 automatically
• ETU logic sets up other PU
automatically;
0.10 0.10
1 blocking,
1 restrained operation
0.01 0.01
1,000 Amperes 10,000 1,000 100,000
Amperes 10,000 100,000
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Threshold-ZSI User-Set
protective PU
User sets “1” threshold 10.00
• Trip units set “2” PU
Automatic Automatic
Seconds
• Lower “blocking PU” just low Blocking PU Restrained PU
enough to not overlap
• Upper “restrained” PU that 1.00
Seconds
Seconds
Seconds
issue if a CB
1.00 Enough shift1.00to maintain 1.00 fails to operate
selectivity regardless of
fault location but tight IF a CB fails to
backup always kept as well
operate is
0.10 0.10 0.10
additional
selectivity that
important ?
0.01 0.01 0.01
1,000 Amperes 10,000 1,000
100,000Amperes 10,000 1,000
100,000 Amperes 10,000 100,000
100.00 100.00
Upstream
Delays & shape can
Upstream GF
GF pickup be shifted
1.00 1.00 & ST shifted
Seconds
Seconds
0.10 0.10
0.01 0.01
100 Amperes 1,000 10,000 100,000 100 Amperes 1,000 10,000 100,000
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Solution
• Set threshold > expected
peak load and > potential
peak regenerative
current
• Use Directional-ZSI to
inhibit restraint when Issue restraint signal
power is reversed if power is forward,
Inhibit restraint if
power is reversed
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ZSI Types, Summary
• GF • Shapes can change
• ST • Downstream Delay
• Instantaneous can </= upstream
• Threshold • Restrained delays
• Directional (inhibiting) can overlap
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What about medium voltage?
51 • Can extend selectivity & fast AF
52 52 87T
87T protection to MV level
50 • 87T works well by itself if the CTs
ZSI can be accommodated
ZSI • Some relay(s) 87T & 50 can be
combined using ZSI blocking
ZSI ZSI
WFR • Multiple 50/51 elements with can
WFR ZSI to achieve similar results
Energy nesting
Distance, burden, transformer inrush, CT
size & class must be considered
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Modern MV CB
• More compact CB available CB
from most manufacturers installed
• All 3 cycles, or better! below
• Retrofits with = footprint as traditional
traditional switches switch
• MV relays with LV protection +
ZSI, hardwired, IEC 61850, or
other protocols
• Modern relays are fast!
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1,000.00 1,000.00
0.01
Blocking signal 0.01
from ST & Inst. ZSI
function in
0.001
downstream CB 0.00 1
Analog commit
1,000 10,000 100,000
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1,000
10,000 100,000
✔
Understand - signal out & in
10.00
Maximum ST PU tolerance
• Blocking signal Model
Maximum IOC PU tolerance
• If T-ZSI is used red
0.10
Maximum Ibf
pickup shifts left by PU
tolerance
0.01
processing time
3) Output contact time Relay output
0.01
4) + CB operation &
Fault Recognition t
Clearing time
0.00
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1,000 10,000
✔
100,000
100.00
Need to know MV Relay
• “real” IOC commit time
10.00 • I/O timing & logic timing
Adjust pickup • communication timing
1.00
• CB’s response timing
Relay commit = 1.33 X Pickup/Ifault
+ I/O Logic time = 1/8 cycle
0.10
+ Output SS contacts = 1/8 cycle
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References
IEEE papers on selectivity by M. E. Valdes et al:
• Advances in Protective Device Interlocking for Improved Protection and Selectivity, IEEE IAS
Transactions 2014
• Traditional Time - Current Curves Are Not Enough, Adding I^2t Considerations, IEEE IAS
Transactions 2013
• Optimized Instantaneous Protection Settings: Improving Selectivity and Arc-Flash Protection, IEEE
IAS Magazine, 2012
• Method for Determining Selective Capability of Current-Limiting Overcurrent Devices Using Peak
Let-Through Current; What Traditional Time-Current Curves Will Not Tell You, IEEE IAS
Transactions 2010
• Selectivity Analysis in Low-Voltage Power Distribution Systems With Fuses and Circuit Breakers,
IEEE IAS Transactions 2010
• Enhanced selectivity and protection via modern current- limiting circuit breakers, Industrial and
Commercial Power Systems Technical Conference, 2005 IEEE
Others on selectivity:
• Larsen, Ed; A new approach to low-voltage circuit breaker short-circuit selective coordination,
IEEE Industrial and Commercial Power Systems Technical Conference, 2008
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References
IEEE papers on substation protection by M. E. Valdes et al:
• CONSIDERATIONS FOR DIFFERENTIAL PROTECTION IN LV BUSES, IEEE Petroleum and Chemical
Industry Technical Conference (PCIC) 2015
• Arc Flash Hazard Reduction at Incoming Terminals of LV Equipment, Arc Flash Hazard Reduction at
Incoming Terminals of LV Equipment 2014
IEEE papers on Single Processor Concept by M. E. Valdes et al:
• The single-processor concept for protection and control of circuit breakers in low-voltage
switchgear, IEEE IAS Transactions 2004
• Ground-fault detection in multiple source solidly grounded systems via the single-processor
concept for circuit protection, IEEE IAS Transactions 2006
• Finding fault - Locating a ground fault in low-voltage, high-resistance grounded systems via the
single-processor concept for circuit protection, IEEE IAS Magazine, 2007
• Zone Based Protection for Low Voltage Systems; Zone Selective Interlocking, Bus Differential and
the Single Processor Concept, Industrial and Commercial Power Systems Technical Conference,
2008
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Questions ?
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