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Stevanovic 2016
Stevanovic 2016
Abstract. This paper highlights ongoing efforts to validate performance, reliability and robustness
of GE SiC MOSFETs for Aerospace and Industrial applications. After summarizing ruggedness and
reliability testing performed on 1.2kV MOSFETs, two application examples are highlighted. The
first demonstrates the 1.2kV device performance in a prototype high frequency 75kW Aviation
motor drive. The second highlights the experimental demonstration of a 99% efficient 1.0MW solar
inverter using 1.7kV MOSFET modules in a two-level topology switching at 8kHz. Both
applications illustrate that SiC advantage is not only in improved performance, but also in
significant system cost savings through simplifications in topology, controls, cooling and filtering.
I. Introduction
Silicon Carbide (SiC) power devices can operate at higher temperatures, higher voltages and
higher switching frequencies compared to existing silicon devices, resulting in greater power
converter efficiency, smaller size and improved bandwidth. Over the past decade, the SiC efforts at
GE have centered on development, maturation and system validation of 1.2kV to 3.3kV MOSFETs
for Aerospace and Industrial applications [1-7]. The primary focus has been on meeting system
requirements for high temperature, reliability and ruggedness. This paper summarizes the current
status of GE SiC MOSFET technology and assesses its readiness for those applications.
Section II of the paper summarizes the results of extensive internal and third-party testing of
discrete 1.2kV GE SiC MOSFETs where they show projected reliability comparable to mature
silicon power devices. In addition, extensive stress testing was performed to evaluate the device’s
avalanche capability, short circuit ruggedness, body diode stability, and terrestrial cosmic radiation
hardness. Section III highlights the device’s system-level performance and impact on a 75kW motor
drive for Aerospace applications. Section IV describes an experimental demonstration of a 1.0MW
SiC PV inverter with best-in-class system efficiency of 99%. Section V highlights manufacturing
scale-up activities in partnership with New York Power Electronics Manufacturing Consortium
(NY-PEMC) [8], which is focused on setting-up a 150mm wafer fab. The fab is expected to
significantly reduce the device cost - the remaining roadblock to a widespread SiC adoption in high
volume applications. The section also emphasizes that it’s possible to unlock significant savings in
other components/subsystems and achieve overall system savings even when SiC devices cost much
more than Si. Section VI summarizes the results and next steps.
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Materials Science Forum Vol. 858 895
demonstrate stable operation at high temperatures and the TO247-packaged 30A part (10mm2 chip
size) became the first power device to be qualified at 200oC in accordance with the automotive
AEC-Q101 reliability standard [3]. The 30A MOSFETs, both on-wafer and in discrete packages,
have been subjected to extensive and on-going accelerated stress testing. Weibull plots in Fig 1
depict accelerated high temperature gate bias (HTGB) testing (also known as time dependent
dielectric breakdown – or TDDB) of full 10mm2 MOSFETs. It is clear from the figure that the
majority (>99%) of these devices exhibits intrinsic wearout behavior. From each Weibull plot a
63% MTTF (mean time to failure) datapoint can be obtained and a corresponding accelerated
TDDB lifetime model can be derived by curve-fitting the datapoints as shown in Fig.2. The model
predicts that the gate oxide lifetime at use conditions is far beyond 100 years (1E6 hours).
Fig 1. Accelerated HTGB (TDDB) testing of Fig 2. TDDB lifetime model vs. E-field and
10mm2 SiC MOSFETs temperature for 10mm2 SiC MOSFETs
In addition, the discrete parts have been subjected to third-party reliability testing with the
feedback that “SiC MOSFETs show comparable behavior to Si MOSFETs”. The corresponding
experimental TDDB datapoints are shown in Fig.2 (black diamonds), illustrating good agreement
between GE and third-party gate oxide reliability results. If one applies this experimentally derived
acceleration factor to an extrinsic population of MOSFETs, the gate oxide failure rate of less than
10 FIT (failures per 109 device-hours) can be projected at the following use-conditions: Tj=150oC,
Vgs=20V (Fig 3). Such low FIT rates are typical for mature Si products. The significance of the
aforementioned discussion should not be underestimated, as it directly contradicts the long standing
perception that SiC MOSFETs cannot be as reliable as Si.
Table.1: Summary of performance, ruggedness and reliability testing of discrete 1.2kV SiC MOSFETs
Performance Key Attributes Application Impact
Stable; low ERR; good for Eliminates need for a-parallel diodes; module
Body diode
sync_rec with: tDEAD<1µs has extra floor space higher current rating
cooling design – instead of liquid, a simpler air cooling approach becomes practical. In a modern
more-electric aircraft there are 4 to 8 such converters and the aircraft-level mass reduction can be up
to 250kg.
Fig 4: a) Experimental 75kW, 20kHz SiC motor drive for Aviation applications. b) The 98.5% efficient inverter is 50%
smaller and has 70% lower losses than a Si design, enabling air cooling and aircraft-level savings of up to 250kg.
Fig 5: a) Experimental results for a 1.0MW, 1.0-1.5kVOC, 8kHz SiC PV inverter; b) current sharing between 3 direct-
paralleled modules per phase is excellent; c) CEC efficiency is nearly 99%; d) lower losses enable air-cooling design.
Fig 6: a) Comparison of power rating-vs-frequency between SiC- and Si-based air cooled three-phase inverters. While
similarly rated at low frequencies, the power ratings diverge above 2kHz. b) Due to the superior capabilities, the SiC-
based approach opens a new design space and offers overall savings even at device costs significantly higher than Si.
References
[1] L. Stevanovic et al., 25th IEEE APEC, Palm Springs, CA, February 21-25, 2010, pp. 401-407
[2] A. Bolotnikov et al., 24th IEEE ISPSD, Bruges, Belgium, June 4-7, 2012, pp. 389-392
[3] P. Losee et al., 26th IEEE ISPSD, Waikoloa, HI, June 15-19, 2014, pp. 297-300
[4] A. Bolotnikov et al., Materials Science Forum Vols. 778-780, 2014, pp 947-950
[5] J. Smolenski et al., IEEE-USA Annual Meeting, Cincinnati, OH, May 3-6, 2012:
http://www.ieeeusa.org/calendar/conferences/annualmeeting/2012/program/files/Friday/Track3/SiC-
Power-Conversion-Smolenski.pdf
[6] A. Bolotnikov et al., 30th IEEE APEC, Charlotte, NC, March 15 - 19, 2015, pp. 2445-2452
[7] P. Losee et al., ICSCRM 2015, Giardini Naxos, Italy, October 5 - 9, 2015, to be published
[8] http://ny-pemc.org/
Silicon Carbide and Related Materials 2015
10.4028/www.scientific.net/MSF.858
DOI References
[4] A. Bolotnikov et al., Materials Science Forum Vols. 778-780, 2014, pp.947-950.
10.4028/www.scientific.net/msf.778-780.947