BRUKER ADVANCED X-RAY SOLUTIONS BRUKER ADVANCED X-RAY SOLUTIONS

Technical Data

Goniometer
Operating mode vertical configuration, Theta/2 Theta
Measuring circle diameter
Max. useable angular range
401 mm
DIFFRACTION SOLUTIONS
(depending on accessories) -8° < 2 Theta < 170°
Smallest selectable step size
Reproducibility
0.0001°
±0.0001°
D4 ENDEAVOR
Absolute accuracy ≤ ±0.001°
Max. speed (depending on accessories) 25°/s
X-ray optics
Slits plug-in or motorized
Motorized detector slits and absorber changer
Secondary monochromators Graphite or LiF
Soller Slit 2.5° or 4°
Soller Slit for grazing incidence 0.12°, 0.23°, 0.35° or 0.47°
Göbel Mirror for Cu-, Co- or Cr-radiation
Detectors
Dynamic scintillation counter NaI or YAP
Proportional counter (Ca channel) filled with Ne-CO2
Energy-dispersive detector Sol-X (Li drifted Si detector)
Position-sensitive detector (1-dimensional) continuous flow ArCH4 gas,
active range 50 mm
Sample magazine 66 sample positions for 51.5 mm Ø
72 sample positions for 40 mm Ø
120 sample positions for 35 mm Ø
Automation interface optional
General room planning
Outer dimensions 166 x 84 x 110 cm (H x W x D)
Weight (without additional electronic units) 440 kg
Cooling water supply min. 3.5 l/min, 5 - 8 bar, 10°C - 20°C
Power supply 47 Hz - 63 Hz, 208 V - 240 V
Max. power consumption 5 kVA

BRUKER AXS GMBH BRUKER AXS INC.

Oestliche Rheinbrueckenstr. 50 5465 East Cheryl Parkway

D-76187 KARLSRUHE MADISON, WI 53711
GERMANY USA

TEL. (+49) (7 21) 5 95 -28 88 TEL. (+1) (800) 234- XRAY

FAX (+49) (7 21) 5 95 - 45 87 TEL. (+1) (608) 276- 3000
http://www.bruker-axs.de FAX (+1) (608) 276- 3006
Email info@bruker-axs.de http://www.bruker-axs.com
AIM 00724

Email info@bruker-axs.com

All configurations and specifications are subject to change without notice. Order No. B88-E00006 ©2001 BRUKER AXS Printed in Germany.
2 5

BRUKER ADVANCED X-RAY SOLUTIONS

D4 ENDEAVOR –
your perfect partner

Width: 84 cm

Height:
166 cm

Depth: 110 cm
3 4

tasks
f X -ra y d iffraction les.
The rang
eo your samp
d a s th e variety of se tasks
is as broa d solution for all the
ine
The comb DEAVOR.
EN
is our D4 is designe .
d for
D E A V O R le
The D4 EN t is still highly flexib
sk s b u k s fo r
specific ta OR masters all tas sis,
D4 ENDE
A V
n tita ti ve p hase aly a n
or qua stress
qualitative analysis or residual
le n.
peak profi n or structure solutio
ti o
determina high-precis
ion
E A V O R ’s
D ay
The D4 EN eter and modern X-r ent
o n io m e x c ell
2-circle g etectors guarantee peed
d d s
optics and sults – with unrivale e
re id
analytical b il ity to handle a w ry and
p a na
and the ca ples. Our revolutio pens
sa m to
variety of le handling concep ies.
e s a m p fp o ss ib ilit
uniqu u ndreamt-o AVOR with
v io u s ly
up pre ENDE
ad the D4 and
You can lo ifferent dimensions ge of
o f d e ra n
samples n d d efine a wid time.
c y a
consisten the same
n g jobs all at
m e a s u ri modular
D E A V O R and the lysis
The D4plusEN asurement and ana tive
me ualita
DIFFRAC e a perfect team. Q nda-
ak fu
routines m tive phase analysis, tions,
and qua n tita of re ec fl
e te r analysis sis
mental p a ra m
ry sta l s tru cture analy
and c re
real space ments via Internet a hts of
u re lig
and meas the pioneering high plus .
o f C
just a few EAVOR with DIFFRA
D
the D4 EN n e west mem
ber
AVO R, th e
D4 ENDE TION SOLUTIONS logy
F R AC chno
of our DIF ines state-of-the-art te all
b sm
family, com eration and a very
o p
with easy
footp ri n t. gned.
R – sim p ly well desi
AVO
D4 ENDE
6 7

Everything under control – Unlimited freedom for

no matter where or when your samples – sample handling
– D4 ENDEAVOR with the D4 ENDEAVOR
via networks
Perfect control by out
a n g in g s imple with
TCP/IP via Intranet or Internet ing ch
optics mak ent.
e. n m
Visual remote monitoring by
le s ar e the sam idea any realig Bragg-
stablished t data
o sa m p c le v e r le s : th e e
built-in video camera No tw up with a mp ellen
w h y we came – its revolutionary – Ideal sa metry provides exc
This is o g e o
Fast and easy support via Internet ENDEAVO
R
ives you Brentan tions
for the D4 ling concept. This g ample lity fo r all applica
qu a r low
nd
sample ha ossible flexibility fo r exam-
rs
a m p le s, thin films o y with
ts etr
st p
the greate nd selection. Whe mallest
the – Non-fla arallel-beam geom ptimum
access to : p eo
c o n s ta n t worldwide ternet. n a
preparatio powders, thin films all
, s absorp ti o n
a n d Soller sli
t is th
You have via the In d s m M ir ro r
r e nts in progress
se
ining pres unts, liquids, or even ed and Göbel
w a m e on
oft
and the s lly auto- measu re
quipped w r
ith
samp le a m o all b e in s e rt combinati ergy-dis-
n o lo g y V O R is e th e y ca n to 12 0 p les: the en cellent
The tech allow fu NDEA
Our D4 E . Whether you work ing.
ove
workp iec e s –
e time in th e u p ce n t s a m x
r D 4 EN DEAVOR s a n d sa mple ra th at the sam magazine
. – Fluores detector achieves e
of o u analy se
surements, entire analysis
m e
a video ca e Internet, you mis
s no analyzed ur D4 ENDEAVOR persiv e S o l-X
measurin g tim e
matic mea ata, but fo ssociated in optimum
in s hort, th e
n g e netw o rk s o r th
ac c ess to d hen
a ll positions o alytical limitations a re re su lts in the
chang ing –
. Data e xc h a ly h a v e
You not on k over its shoulder” if you
w an
The usual of a sample change .
ra
r o f samples -sensitive
automatic operator OR – A vast
n u m b e n
: the positio quisition
process is equipment and the nt/ser- can als o "lo o wo rk – as e
with the us y our D4 ENDEAV le tim e
e
between th s the TCP/IP-based
clie A VOR is at e laboratory. db s s ib
shortest po simultaneous data
ac
the D4 E N D E
to it in th eleminate loss
se
software u . This means that yo m any
u can
ta n ding next ct d e sign of th e
its d e te c to r with d ra stic ally without
we re s etworks The comp
a t all limit ring time
le
ver princip nitor measurements your
fro
m m un ic a tion over n If requi- E A V O R does not a is is reflec- c uts measu
o Perfect co ilities. D4 END xibility. T h
start and m the network for use nalysis
in
ta lly new possib the opera- e nsion of fle ay optics and de- of quality sks:
in r a u p to ive e w d im as your ta
computer ou can prepare you other opens u o r we can g port – faster
n
n u m b er of X-r ose fr om .
A s v e rsa tile
. Y
daily work tly in your office wh n if
ile red, eit h e r y o
tical sup ted in the ou to cho ENDEAVO
R.
c e n ic al or analy efore. to rs av a ilable for y the optimum o u r D 4
s d ir e g , e v r te ch tec ine
repo rt
ents are sti
ll run n in to
r than eve
rb les determ -plug
measurem not on the same co
ntinent and easie Your samp mponents, with push
c o
is
your office NDEAVOR. choice of
r D 4 E
as you

66 samples 72 samples 120 samples

Video-aided control
ø 51.5 mm ø 40 mm ø 35 mm
BRUKER AXS Support 66, 72, or 120 sample positions
with minimum space requirement
Maximum sample flexibility

8.5 - 40 mm 14 mm 4.7 mm
Quick sample changing for
high sample throughput
Intranet Analytical versatility through
Steel, PMMA, Steel Steel
shaped sample
push-plug optics
Scintillation counter,
TCP-IP internet mechanical magnetic magnetic energy-dispersive Sol-X or
User PC gripper gripper gripper position-sensitive detectors
8 15
Minimum preparation effort, as a wide
range of different sample sizes can be handled Maximum flexibility
simultaneously
Extremely rapid sample transfer to measuring
position to minimize processing time
– sample handling with
Powder samples
66, 72, or 120 positions in the sample magazi-
ne can be loaded and unloaded at any time
the D4 ENDEAVOR
Powder, liquid, or solid samples – a wide
variety of sample holders in one magazine for Suitably shaped samples
full analytical flexibility If you have solid
samples or sam-
ples that you can
prepare compact-
ly in the right di-
mensions, just insert
them directly and
get started.
Randomized fine powder is filled
in sample rings. You can choose
the ring size to suit the amount of
material available.
Environment-sensitive samples
Rings are available
for such samples.
The rings can even
be filled with liquids.
The measuring
surface is sealed
Oriented powder by a thin foil.

Irregularly shaped samples

Powder samples of materials that tend

to form a preferred orientation can be
prepared in sample rings based on the
"back-loading” principle.

Workpieces can be examined

non-destructively by placing them into
Thin, small samples suitable holder rings.

Small sample amounts

Rings providing a
background-free
silicon crystal per-
mitting analysis of
Spring loaded cases are available even the smallest
for mounting samples that cannot be sample amounts.
prepared as powder samples.
9 10

The entire analytical world On the trail of

of the D4 ENDEAVOR macroscopic properties –
residual stress analysis
microstrain
qualitative quantitative crystallite size crystal structure residual stress

rties of
✓ ✓ ✓
Construction
materials a c r o s c o pic prope nd delibe-
The m pe
h -te c h m aterials de n. X-ray
many hig tion chose
tely u po n the direc e and most well
ra itiv
is the defin technique
diffraction nd non-destructive
da mplete
Chemistry ✓ ✓ ✓ ✓ establishe
rm in a ti
for the dete cteristics in materi
o n of the co ls and
a
u a l c h a ra
resid
s.
workpiece stress in a
rm in e th e residual a reflection
To dete r shift of
Thin films ✓ ✓ ✓ wo rk p ie c e , the angula d at the largest
liably mea
sure
s a func-
must be re action angle and a ent
if fr cid
possible d gle between the in e. For
f th e a n su rfac
tion o n
ple
d the sam f the angular
b e a m a
X-ray ation o
te determin n measu-
Geology ✓ ✓ ✓ ✓ an accura kground is also ofte ection,
ac
shift, the b n to the complete re inten-
fl
d d itio fle n
ctio
red in a p ic a lly small re s.
e ty
due to th n angle
s a t la rg e diffractio
sitie ell
results as w sis
Ceramics ✓ ✓ ✓ ✓ ility of th
The reliab residual stress ana i-
p e e d o f
e
m c o
ly
mb
as the s n th e o ptimu
rgely o and the
depend la X-ray components he
e .T
nation of th nd analysis strategy ctrum
measurin g a le pe
s
ith its who
Metals ✓ ✓ ✓ ✓ ✓ A V O R w
D4 ENDE -ray technology is id ithout
X
eal for
w
of modern ’ll never want to do oft-
o u -s
this task. Y EAVOR with STRESS
D
the D4 EN ture.
in th e fu
ware
Mineralogy ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓
Pharma-
ceuticals
Standardless determination of
crystallite sizes and microstrain with TOPAS
by the perfect analytical consideration of the
Environment ✓ ✓ Fast and first-rate qualitative experiment
phase analysis using all data points Powerful crystal structure refinement and
Straightforward measuring determination from powder diffractograms
and analysis strategies for effective Efficient residual stress analysis using
Workpieces ✓ ✓ ✓ ✓ quantitative phase analysis the latest X-ray technologies
11 12

Crystal structures – Analysis down to the

D4 ENDEAVOR with TOPAS finest detail – microstrain
and crystallite size

f the data
s to th e quality o VOR, a
Than k 4 ENDEA
ea su re d with the D of the individual
m sis
iled analy impor-
more deta files reveals further ize
reflection
p ro tallite s
a tio n su ch as crys nvenient
tant inform in. Pioneering, co S.
stra PA
and micro ve for this task – TO
fo rm a ti size
and in n crystallite
e m e a cy,
ine th um accura
To determ ith m a x im
mple w measu-
within a sa a profile fitting to a
rm oftware
you perfo w ith TO PAS, the s ument
o n str
red reflecti the effects of the in e result
e rs a ll a pe . Th
consid n
sh
the profile the crystallite
e te rs o
param tting is
dardless fi of the
of this stan rdless determination e same
a th
size. Stand achieved in exactly
a in is
microstr
way. mposi-
p le is a c omplex co OPAS
If your sam phases and states, T ous
rent orph
tion of diffe to determine the am onents
can be us
ed se comp
a n d th e v arious pha parameter
content r a lattice
ate e s e parated o ormed. TOPAS
O R offers the ultim c a n b
t can be p
erf fines the
DEA V
The D4 EN e crystallographic q e
ues- refinemen ecause it exactly de cally.
b ati
ation r th es
solution fo ombined with the ex nly
te siv
n can do this fractogram mathem
tu r e determin action c .O complete
d if
Crystal s tru c iffr
powder d eralogy tions when pabilities of TOPAS f not r sample
s in g a b o ttom of you VOR and
m e n t u
and refine lytical methods in m try. Our
in analyti ca l c ibil s o
itie Get to th e
4 ENDEA
a is o p e n s up the poss l crystal struc- s with the D
ita l a n che m TOPAS nsiona ro p e rt ie
are v a
nic
nd inorga OPAS software n in g a 3-dime al powder diffrac- p
rg a nic o n ly re fi n TOPAS.
and o rtners T 2-dimensio ing the structure
AVOR pa fro m a
D4 ENDE fficient solution. tu re
b u t also dete
rmin
ly e m
for a high hemical to g ra
ic a l sa mples or c quently ab-initio. PAS: an
Mineralo g
mples fre A V O R and TO ION.
p ha rm a ceutical sa fractograms or N D E
Our D4 E FRACTION SOLUT
and x dif
ry comple is makes unbeata ble DIF
provide ve attering signals. Th
only weak
sc e optimum
rt a n t to c ombine th d detectors
it impo ents an
al compon ts.
X-ray optic alytical requiremen
to suit th e a n EA OR.
V
ti o n ? O ur D4 END
Your solu
13 14

Quantitative phase analysis Qualitative phase analysis

with the D4 ENDEAVOR – – it’s so easy with the
no trace gets lost D4 ENDEAVOR and DIFFRACplus

ment
im p o r ta nt require sis is
The most litative phase analy
qua wder
for reliable ent of accurate po
rem ata eva-
the measu s and a powerful d R
ram VO
diffractog are: our D4 ENDEA
ftw
luation so plus
AC .
and DIFFR o a phase ple
analy-
h o w y o u d
im
And this is Cplus – well known s
D IF F R A
sis with
iendly:
and user-fr measu-
te p is to define the mple
ts sa plus
– The firs the corresponding
d AC
ring jo b a n
m a g a z in e – FRD IF
the auto-
positions in the measurements sure
of ea
takes care u can define and m
. Y o
matically y time.
sa m ples at an
prio ri ty unrivaled
p y o u use our
ex t s te e com-
– In the n ware to compare th thou-
oft y
SEARCH s gram with the man se.
plete dif fra cto d ba
a ta
e n tr ie s in the ICDD strictions
sands of e any re
es not hav s, nor does
A R C H d o
SE tion
h ig h in te nsity reflec metries or shoul-
to ym
flection as plicated
compo- it neglect re sures that even com tion
v a rious phase s until e n flec
gram s for cond ders. This h extreme re an
sity of a ph
ase matter of se s- tu re s
phase mix also be analyzed
w it in
red in ten sitions in a n matches the mea n
the scatte mpletely the calc u la tio d re -
lia overl a p s c a
determine -su b tracted, co eri- ac curacy an ay.
d e assed. optimum w
us pl
gro u n ep t. T h ro-
R a nd DIF FRAC from back ection profiles. If th an let uremen e thod is unsurp se lect the app s
m o u
NDEAVO quanti- red re fl n uc
, yo bility of th is st step y gestion
The D4 E flexibility for exact measu io n s are know s a routine – In the la s from the list of sug work
um absolute pheral c o n dit
lysis run a se
priate pha Cplus take care of th idual
e
offer maxim analysis, where the amined tative ana d time-op-
se
tative pha nsities of the phases
ex the quanti y automatically an eed. R A
or let DIFF , in line with your in
div
on in te xa ctly the right full
operation u can’t beat this for
sp
automatic ished.
ally
reflecti in e d . T his is e y o
term
must be de DQUANT or TOPA
S. timized – up a setting s – fin
r , TO P AS opens results to
e analysis readsheet
job for eit h e UANT er h a nd e phase r th
g effic ie ncy of DQ On the oth nsion of quantitativ a n s fe
You can tr ord processing, sp h drag
nd in
The outsta the clever combinati and
on dime fully take lw wit
totally new AS enables you to l your usua rogram – so easy
d b y
is achieve us diffractometer c
o ntrol OP perimenta s p
analysis. T the effects of the ex - or graphic
n e o
of simulta t data analysis. nt . The com
en into accou measurement result ed for and d ro p .
h DIFFRAC
plus –

measurem e us w it
timum
fine the op for your setup on th d diffractogram is acto- DEAV O R liability
e a sily d e e a s u re tes d iffr The D4 EN assed in speed, re
You can ategy plete m PAS calcu
la u rp
n d analysis str n the com- ly sis . TO simply uns se.
meas u ri ng a go the ana f-u
c a l ta s k . Dependin e necessary to and ease-o
analy ti may b
the task, it
plexity of