METROLOGY AND COMPUTER AIDED INSPECTION

OBJECTIVES:
 To provide knowledge on various Metrological equipment available to measure the dimension
of the components.
 To provide knowledge on the correct procedure to be adopted to measure the dimension of
the components.

UNIT I .BASICS OF METROLOGY 5

Introduction to Metrology – Need for measurement – Dimensional and Form tolerances – Elements –
Work piece, Instruments – Persons – Environment –their effect on Precision and Accuracy – Errors in
Measurements – Causes & Types – Control – Types of standards & Practice.

UNIT II LINEAR AND ANGULAR MEASUREMENTS 10

Linear Measuring Instruments – Evolution – Types – Classification – Limit gauges – gauge design –
terminology – procedure – concepts of interchange ability and selective assembly – Angular
measuring instruments – Types – Bevel protractor, Angle gauges, Spirit levels, Sine bar – Angle
alignment telescope – Autocollimator – Applications.

UNIT III FORM & LASER MEASUREMENT 10

Principles and Methods of straightness – Flatness measurement – Thread measurement, gear
measurement, surface finish measurement, Roundness measurement – Applications. Use of Lasers –
Principle – Laser Interferometer– Application in Linear and Angular measurements – Testing of
machine tools using Laser Interferometer.

UNIT IV CO-ORDINATE MEASURING MACHINE

10
Co-ordinate measuring machine (CMM) – Contact type CMM – Configurations, parts and its
features, types of probes, probe compensation. Non-Contact type CMM – Features, probes,
Specifications. Errors in CMM measurement – Calibration of CMM – measuring scales, accuracy
– Moire fringes – Applications of CMM for dimensional and form measurements.

UNIT V MACHINE VISION & NANO METROLOGY 10

Machine vision system – Methods for sensing objects, image processing, segmentation, pattern
recognition. Filters in image processing and analysis. Image histogram and processing.
Applications in metrology. Nanometrology – Introduction – Principles – Nanometer metrology
systems – Methods of measuring length and surfaces to nano scale result with interferometers and
other devices.
OUTCOMES:
 Upon completion of this course, the Students can demonstrate different measurement
technologies and use of them in Industrial Components

TEXT BOOKS:
1. Jain R.K. “Engineering Metrology”, Khanna Publishers, 19th Edition, 2005.
2. Gupta. I.C., “Engineering Metrology”, Dhanpatrai Publications, 2005.
3. Whitehouse D.J., The Handbook of Surface and Nanometrology, CRC Press, 2011

REFERENCES:
1. Charles Reginald Shotbolt, “Metrology for Engineers”, 5th edition, Cengage Learning
EMEA, 1990.
2. Backwith, Marangoni, Lienhard, “Mechanical Measurements”, Pearson Education , 2006.
3. Galyer J.F.W. and Shotbolt C.R., “Metrology for Engineers”, O.R.Cassel, London,1993.
4. Thomas, “Engineering Metrology”, Butthinson & Co., 1984.
5. Bewoor A.K. and Kulkarni V.A., “Metrology and Measurements”, Tata McGraw-Hill, 2009.