Keysight N5991 Test Automation Software Platform For PCIe User Guide

Keysight N5991 PCIe Test
Automation Software
Platform
User Guide
Notices
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2 Keysight N5991 PCIe Test Automation Software Platform User Guide

Contents
1 Introduction
Overview 14
Document History 15
First Edition (October 2019) 15
2 ValiFrame PCIe Station

ValiFrame PCIe Station Configuration 18
Using Keysight IO VISA Connection Expert 26
Starting the PCIe Station 28
Configuring DUT 29
3 Using the Software

Introduction 44
Selecting, Modifying & Running Tests 46
Results 48
PCIe Parameters 50
Sequencer Parameters 50
Common Parameters 51
Procedure Parameters 56
4 2.5 & 5.0 GT/s ASIC Tests

Overview 64
Common Parameters for 2.5 & 5.0 GT/s ASIC Calibrations 64
Keysight N5991 PCIe Test Automation Software Platform User Guide 3

Contents
2.5 & 5.0 GT/s ASIC Calibrations 65

2.5G/5G Random Jitter Calibration 65
2.5G/5G ISI Calibration 67
2.5G/5G CMSI Calibration 69
2.5G/5G Eye Height Calibration 71
Receiver Tests 74
Common Parameters for Receiver Tests 74
Common Parameters specific for Data Rates 74
2.5G/5G Rx Compliance Test 76
2.5G/5G Rx Jitter Tolerance Test 79
2.5G/5G Rx Sensitivity Test 84
Receiver Setup Tests 87

Common Parameters for Receiver Setup Tests 87
2.5G/5G Rx Compliance Setup 88
5 8.0 GT/s ASIC Tests

Overview 92
Common Parameters for 8.0 GT/s ASIC Calibrations 92
8.0 GT/s ASIC Calibrations 93
8G TxEQ and Launch Voltage Calibration 93
8G Random Jitter Calibration 101
8G Insertion Loss Calibration 107
8G CMSI Calibration 111
8G DMSI Calibration 115
8G Stressed Jitter Eye Calibration 119
Receiver Tests 124

8G Rx EQ Coefficient Matrix Scan 126
8G Rx Pre-Shoot De-Emphasis Scan 132
8G Rx Stressed Jitter Eye Test 138
8G Rx Jitter Tolerance Test 143

Contents
Link Equalization Transmitter Tests 149

Common Parameters for Link Equalization Transmitter Tests 149
8G LEQ Tx Initial Preset Compliance Test 150
8G LEQ Tx Response Time Compliance Test 153

8G Rx Stressed Jitter Eye Setup 159

Overview 164
16G LF SJ Calibration 179
16G HF SJ Calibration 184
16G Unit Interval Calibration 189
16G TxEQ and Launch Voltage Measurement 193
16G ISI Adjustment Calibration 203
16G Initial Equalization Preset Optimization 207
16G Channel Calibration 215
16G Final Equalization Preset 231
16G Pre-Compliance Eye Calibration 238
16G Compliance Eye Calibration 243
16G Eye-Height and Width Measurement 247
16G Eye-Height and Width Scan 250

Contents
Receiver Tests 253

Common Parameters specific for Lanes 254
16G Rx Stressed Jitter Eye Test 267
Link Equalization Receiver Tests 279

Common Parameters for Link Equalization Receiver Tests 279
16G LEQ Rx Stressed Jitter Eye Test 280
16G LEQ Rx Jitter Tolerance Test 280


16G Rx Stressed Jitter Eye Setup 291

Overview 296

Contents

32G HF Sinusoidal Jitter Calibration 308
32G AWG Amplitude Correction Calibration 334
32G DM Sinusoidal Interference Calibration 337
32G CM Sinusoidal Interference Calibration 342
32G Final Equalization Preset Optimization 347
Receiver Tests 369

32G Rx Pre-Compliance Test 377

32G LEQ Rx Compliance Test 387

32G Rx Impairments Setup 389
8 2.5 & 5.0 GT/s CEM Tests

Overview 394
Common Parameters for 2.5 & 5.0 GT/s CEM Calibrations 394

Contents
2.5 & 5.0 GT/s CEM Calibrations 395

2.5G/5G Random Jitter Calibration 395
2.5G/5G De-Emphasis Calibration 398
2.5G/5G Eye Height Calibration 400
Receiver Tests 403

2.5G/5G Rx Compliance Test 405
2.5G/5G Rx Jitter Tolerance Test 408
2.5G/5G Rx Sensitivity Test 413

2.5G/5G Rx Compliance Setup 417
9 8.0 GT/s CEM Tests

Overview 420
Common Parameters for 8.0 GT/s CEM Calibrations 420
8.0 GT/s CEM Calibrations 421
8G Sinusoidal Jitter Calibration 435
8G Eye-Height and Width Calibration 444

Contents
Receiver Tests 456

8G Rx Preset Pre-Compliance Test 474
8G Rx Sensitivity Test 494

8G LEQ Rx Sensitivity Test 507


8G Rx Compliance Setup 520

Overview 526
Common Parameters for 16.0 GT/s CEM Calibrations 526

Contents
16.0 GT/s CEM Calibrations 527

16G RJ Calibration 535
16G LF SJ Calibration 541
16G HF SJ Calibration 546
16G Unit Interval Calibration 551
16G Final Equalization Preset 591
Receiver Tests 613



Contents


16G Rx Pre-Compliance Setup 660
11 8.0 GT/s U2 Tests

Overview 666
Common Parameters for 8.0 GT/s U2 Calibrations 666
8.0 GT/s U2 Calibrations 667
8G Sinusoidal Jitter Calibration 681
8G Eye-Height and Width Calibration 690

Contents
Receiver Tests 698

8G Rx Preset Pre-Compliance Test 711
8G Rx Sensitivity Test 725
8G LEQ Rx Sensitivity Test 729


8G Rx Compliance Setup 740

Keysight N5991 PCIe Test Automation Software
Platform
User Guide
1 Introduction
Overview / 14
Document History / 15
1 Introduction
Overview
This guide provides a detailed description of the Keysight N5991 PCIe Test
Automation Software Platform.
The BitifEye “ValiFrame” Test Automation software is globally marketed
and supported by Keysight Technologies as N5991. This document
describes in detail the calibrations and test procedures conducted by
N5991 ValiFrame for PCIe (Peripheral Component Interconnect) Gen5.
The N5991 software calibrates the stress conditions and controls all test
electronic equipment for automated receiver tolerance tests. The receiver
tests described in this document are implemented according to the
requirements of the Compliance Test Specification (CTS) and also offers
some custom characterization tests to provide more details on DUT
behavior beyond the specificlimits.
The N5991 PCIe Receiver tests support the Keysight Technologies J-BERT
M8020A and M8040 high-performance serial BERTs (Bit Error Ratio
Tester). An Infiniium oscilloscope is always required.

Introduction 1
Document History
First Edition (October 2019)
The first edition of this user guide describes functionality of software

version N5991 ValiFrame PCIe_1.00.

1 Introduction

Platform
User Guide
2 ValiFrame PCIe
Station
ValiFrame PCIe Station Configuration / 18
Starting the PCIe Station / 28
After the software has been installed, two icons are added to the desktop
as shown in Figure 1 and Figure 8. One is for the Station Configuration and
the other icon pertains to ValiFrame PCIe.
ValiFrame PCIe Station Configuration
Test Station Selection
The set of test instruments that are used for a specific application are
referred to in the following as “Test Station” or in short “Station”. The test
station is controlled by a suitable PC and the N5991 Test Automation
Software Platform.
The N5991 PCIe Station Configurator must be started prior to launching
ValiFrame. It allows you to select an application (such as PCI Express) and
the required set of instruments. Double-click the icon (see Figure 1) to
launch the software. Alternatively, to access the ValiFrame Station
Configuration on a Windows-based PC:
Click Start > BitifEye PCIe N5991 > PCIe Station Configurator (N5991).
Figure 1 Icon for PCIe Station Configurator
When the ValiFrame PCIe Station Configuration is launched, the Valiframe

Configuration Wizard appears as shown in Figure 2. The available Test
Stations are listed in the Select Station drop-down options.

ValiFrame PCIe Station 2
Figure 2 Station selection window
You may also select either (Microsoft) Excel or HTML as the viewer for test
results.
Next, you may optionally assign sounds that would mark the attainment of
different states of the program.
1 End of Sequencer plays the selected sound at the end of a sequence.
2 Connection diagram plays the selected sound every time a connection
diagram pops up.
3 Dialog Prompt plays the selected sound at each dialog prompt.
Select a sound tone from the following options available in the drop-down
options. The option ‘None’ disables the sound for the respective action.
• Car brake
• Feep Feep
• Ringing
• TaDa
• Tut
Click “Play” to test a sound before assigning it to a specific action.

Test Station Configuration
After selecting Test Station as PCIe Station, click Next to continue. The
Station Configuration stage of the Wizard is displayed as shown in
Figure 3. It shows the various options for instruments that can be used for
PCIe testing. It contains such options as:
Data Generator
The pattern generator is used to create patterns with specified stress
parameters. Available options are:
• JBERT M8020A (Keysight M8020A J-BERT High Performance BERT)
• JBERT M8040A (Keysight M8040A 64 Gbaud High-performance BERT)
The error detector of the selected data generator (BERT system) is used to
check for errors that may be contained in the data looped back from the
DUT (Device Under Test).
Figure 3 Station configuration window

Use Transition Time Converters on Data Out

For all such calibrations where the output of the BERT is directly
connected to the oscilloscope, it is required to use the high bandwidth
inputs of the scope to avoid any measurement artifacts, which may occur
due to the fast edges of the M8040A.
Using TTCs slows down the M8040A’s edge rates and allows for reduction
in the required BandWidth of the oscilloscope. Therefore, adding TTCs to
the setup provides for using low bandwidth inputs for all calibrations and
avoid re-connections on the oscilloscope.
Main Power Control
Select one of the options from the drop-down menu:
• Manual
• NetIo 230B (a power distribution unit with one 230 V input and four 230
V outlets)
• ALL4076
• SynaccessNP
Use External 100MHz Reference Clock Source
Select the “Use ext. 100 MHz Reference Clock Source” check box to use a
100 MHz reference clock as a clock source for the data generator and the
DUT to obtain a constant clock signal. It is required only in Common Clock
architecture.
Use Switch for Rx Tests
By using a Switch, you can test more than one lane without changing the
setup connections. This, in turn, largely reduces user interventions during
testing.
Select the “Use Switch for Rx Tests” check box to enable the “Switch
Configuration” button. Click this button to open the Rx Switch
Configuration dialog (see Figure 4), where you can select the “Rx Switch
Type”. The available options are:
• SP4T
• SP6T
• SP8T

Figure 4 Rx Switch Configuration window
To use a BitifEye 2100 Series Switch System, you require the license
option “N5991PA4_ADD (PCI Express Receiver Test Switch System
Support)”.
Map DUT Lanes to tests instrument channels
The “Map DUT Lanes to tests instrument channels” option is an alternative
to the Switch Matrix that is used to test several lanes without cabling
re-connections. If this check box is selected, the Rx DUT lanes can be
mapped to different data outputs of the generator instrument.
SigTest Configuration
The SigTest software is used in several calibration procedures to calculate
the eye height, eye width, and jitter parameters of the generated signal.
The SigTest Configuration dialog (see Figure 5) lets you select the
Installation directories, Jitter measurement template and EH/EW
measurement template used for the calibrations.
The SigTest software must be installed separately before ValiFrame is
started. PCI-SIG members can download the SigTest installer directly from
the PCI-SIG website.

There may be instances when the template names may change for
NOTE different SigTest versions. To automatically modify the template names,
click the “Default” button and the names are modified to correlate with
the required SigTest version.
Figure 5 SigTest Configuration window

Test Instrument Configuration
Once the PCIe station is configured, the instrument addresses must be set.
An example for instrument configuration is set as shown in Figure 6.
Figure 6 Instrument configuration window
Make sure that all the selected instruments for the test station are
NOTE connected to the test station PC controller by the remote control
interfaces such as LAN or USB.
After the installation process, all instruments are configured by default in

“Offline” mode. In the simulation mode, the hardware need not necessarily
be physically connected to the test controller PC. The ValiFrame software
cannot connect to any instrument in this mode. In order to control the
instruments that are connected to the PC, the instrument address must be
entered. The address depends on the bus type used for the connection, for
example, GPIB (General Purpose Interface BUS) or LAN (Local Area
Network). Most of the instruments used in the PCIe station require a VISA
(Virtual Instrument System Architecture) connection. To determine the
VISA address, run the “Connection Expert” (right-click the Keysight IO
Control icon in the task bar and select the first entry “Connection Expert”).

Copy the address string for each instrument from the Connection Expert
entries and paste it as the instrument address in the ‘Station Configuration
Wizard’. After the address strings have been entered, click Check
Connections to verify that the connections for the instruments are
established properly. If an erroneous instrument address configuration is
performed, the Wizard displays a prompt to indicate so.
When starting a specific test station configuration for the first time, all
NOTE instruments are set to the “Offline” mode. In this mode, the test
automation software does not connect to any instrument. This mode can
be used for demonstrations or checks only.

Using Keysight IO VISA Connection Expert
Introduction
The Keysight Connection Expert is recommended to setup new

connections or verify existing connections. Start the Connection Expert by
right-clicking on the Keysight IO Libraries Suite icon in the task bar and
selecting “Connection Expert”. A window similar to the one shown in
Figure 7 is displayed.
Figure 7 Keysight Connection Expert
Under “Instruments”, click Rescan.

For each instrument that must be connected, verify that the corresponding
information is listed on the menu to the left and that the VISA Address for
each instrument shows a green tick.
Once all the instruments to be used are listed properly, their address
strings can be entered in the Instrument Configuration stage of the Wizard
(see Figure 6). The recommended way of doing this is to copy and paste
each instrument address as follows:
Click the “VISA Address” field next to an instrument in the Connection
Expert and copy the address. Highlight the corresponding entry of that
instrument in the Test Station Connection window, paste the address in
the “Instrument Address” text field and click “Apply Address”. Repeat this
procedure for all the instruments being used, except standard specific
applications running on the oscilloscope.
The applications running on the oscilloscope use a different technology to
provide remote access to ValiFrame, called .NET Remoting
Communication. The remote access is only possible using a LAN
connection to the oscilloscope; therefore, only an IP address is used to
connect to such an instrument.
Once all the instruments are set with the appropriate addresses, tick the
check boxes for all such instruments, which shall be used by the Test
Automation Software. This will set the instrument mode to “Online”. Click
“Check Connections” to verify that the instrument addresses are valid.
Click “Finish” to save the changes and close the ValiFrame Configuration
Wizard.

Starting the PCIe Station
Start the ValiFrame PCIe Test Station by double-clicking “PCIe Valiframe

(N5991)” icon on the desktop as shown in Figure 8. Alternatively, click
Start > BitifEye PCIe N5991 >PCIe Valiframe.
Figure 8 PCIe Valiframe Test Station icon
Clicking the ValiFrame PCIe icon launches the PCIe N5991 Test
Automation window as shown in Figure 9.
Figure 9 ValiFrame PCIe user interface

The test parameters must be configured before running any test or

calibration procedure. Click the “NEW” button to open the Configure DUT
window (Figure 10).
Configuring DUT
The Configure DUT window allows you to select the DUT parameters, such
as DUT Type, Spec Version, Compliance Mode or Expert Mode and also
test parameters, which are related to the receiver test configuration. These
parameters shall be used later in several calibrations and test procedures.
Figure 10 Configure DUT panel

Configuration Parameters
The description for parameters that appear in the Configure DUT window
are listed in Table 1.
Table 1 List of Configuration Parameters and their description
Parameter name Description
DUT Parameters
DUT Name Name of the DUT. This is used to identify the product.
Serial Number Serial Number of the DUT. This is used to identify the product.
Version The available PCI Express specification versions are:

• 4.0—supports 2.5GT/s, 5.0GT/s, 8.0 GT/s and 16.0GT/s data rates
• 5.0—supports 32GT/s data rates
Interface Type Select one of the following interface types:

• ASIC
• CEM
• U.2
DUT Type The DUT type is filtered based on the selected Interface Type.
• For Interface Type ‘CEM’, DUT Type options are:
• Add-In Card: A graphics card (for example) can be tested according to the CEM specification.
• System: A mother board (for example) can be tested according to the CEM specification.
• For Interface Type ‘ASIC’, DUT Type options are:
• EndPoint: A PCIe (for example) endpoint is tested according to the Base specification.
• RootComplex: A PCIe chip (for example) is tested according to the Base specification.
• For Interface Type ‘U.2’, DUT Type options are:
• Host
• Device
Clock Architecture Select an option:

• Common Clock—The default clock architecture where all parts of the system use the same clock.
• Separate Ref Clocks Independent SSC
Description Text Field for Product Description
Test Parameters
User Name User name text field.
Comment Text field for user comments.
Initial Start Date Time stamp of the start of current session.
Last Test Date Time stamp of the last test conducted in the current session.

Parameter name Description
Compliance Mode Test are conducted as mandated by the CTS. The parameters that are shown in the calibrations and test procedures
cannot be modified by the user.
Expert Mode Calibration and tests can be conducted beyond the limits and constrains of the CTS and the DUT. The parameters that are
shown in the calibrations and test procedures can be modified by the user.
Data Rate The available data rates depend on the specification version and the interface type selected.
show the correlation between Data Rates, Interface Type and Specification
Version.
Table 2 Data Rates supported by M8040A
Interface Type Version 4.0 Version 5.0
ASIC 8.0 and 16.0GT/s 8.0*, 16.0* and 32.0GT/s
CEM 8.0 and 16.0GT/s 8.0* and 16.0*GT/s
U.2 8.0GT/s 8.0*GT/s
Table 3 Data Rates supported by M8020A
Interface Type Version 4.0 Version 5.0
ASIC 2.5, 5.0, 8.0 and 16.0GT/s 2.5*, 5.0*, 8.0, 16.0* and 32.0GT/s
CEM 2.5, 5.0, 8.0 and 16.0GT/s 2.5*, 5.0*, 8.0* and 16.0*GT/s
U.2 8.0GT/s 8.0*GT/s
*Gen5 Tests at these data rates are not yet defined by PCI-SIG. Currently, they are per-
formed as per Gen4 PHY Test Specification.

PCIe Parameters
On the Configure DUT window, click the “Show Parameters” button. The
“PCIe End Point Parameters” window is displayed, as shown in Figure 11.
Figure 11 PCIe Parameters configuration window
Depending on the selected speed class, the individual tabs are displayed.
The parameters displayed under “Rx All Data Rates” tab are described
further.

Generator SSC
The generator SSC is enabled only when the SRIS architecture is selected.
When enabled, the following parameters can be set:
• SSC Frequency
• Sin SSC Deviation
Power Switch Automation
If a Power Switch is used, the DUT is powered on/off automatically by the
software and the loopback training can be run without user intervention.
To select the Power Switch in the “PCIe End Point Parameters” dialog, you
must configure the same power switch that was previously selected in the
Station Configuration. When enabled, the following parameters can be set:
• Channel: This sets the channel number of the power switch channel,
which is connected to the DUT.
• Off – On duration: This is the duration between powering the DUT off
and then powering it on again.
• Settling time: This is the wait time after the DUT is powered on and
before the test continues with loopback training.
• Max retries for LB training: Maximum number of times that ValiFrame
tries to train the DUT into loopback mode. If it is not possible within
these tries, the test is aborted automatically. When “Power Switch
Automation” is unchecked, ValiFrame prompts you to retry every time
loopback fails.
External Reference Clock
The External Reference Clock option is available only for Common Clock
architecture. The user interface appears slightly different for Add-In Cards
/ End-point DUTs than for System / Root Complex DUTs.
For Add-In Cards / End-point DUT types, select the following parameters:
Figure 12 Ext. Ref. Clock Source for End-Point DUTs

• Use External 100MHz Reference Clock Source:

• If not selected, the clock output of the data generator is connected
directly to the DUT. As such, the Reference Clock Multiplier is not
required.
• If selected, the external reference clock provides the clock to the
DUT and to the data generator. Here, a reference clock multiplier is
used to connect the external reference clock to the data generator.
Currently, the option available to specify the way to connect the
external clock to the data generator is:
• Internal: Connects the external clock to the data generator
directly and the data generator uses its internal PLL.
For System / Root Complex DUT types, select the following parameters:
Figure 13 Ext. Ref. Clock Source for Root Complex DUTs
the External Reference Clock is not required as the DUT directly provides
the clock signal to the data generator. In such cases, the reference clock
multiplier is used to connect the DUT's clock to the data generator.
Currently, the option available to specify the way to connect the DUT's
clock to the data generator is:
• Internal: The clock is directly connected to the data generator and is
multiplied internally.
BER Reader
The Bit-Error measurement can be done using the JBERT Analyser or with
an Offline BER reader.
Receiver Setup Procedures
Include Rx Setup Procedures: Select this option to add the receiver setup
procedures to the test tree. In these procedures, the data generator is
configured for the calibrated compliance conditions, but BER test is not
performed.

Channels
For 2.5GT/s and 5.0GT/s ASIC:
• M8048A ISI Channel: Select the ISI channel from 0 to 7 for testing.
• Use ISI Channel Emulation: For M8020A setup, if the M8020A JBERT
option M8041A-0G5 is available, ISI can also be generated internally.
• Customize: Select the corresponding check box to enable this option.
The “ISI Channel Customization” dialog appears, as shown in Figure 14.
Here, you may fine-tune the selected ISI Channel by modifying the
insertion loss.
Figure 14 ISI Channel Customization window
For 5.0GT/s Systems:

• 3.5dB Link
• 6.0dB Link
For 8.0GT/s ASIC:
• No Channels (Only for spec version 3.0)
• Short Channel (Only for spec version 3.0)
• Long Channel
For 8.0GT/s CEM:
• CBB rev.2: Select the CBB rev. 2 check box to perform the receiver test
with the additional CBB gen2.
• CBB rev.3 riser card: The Rx tests must be performed with compliance
base board Gen3; therefore, the CBB rev.3 riser card check box is
selected by default.
• DUT Type: For System, select the PCIe Switch check box if the DUT is a
PCIe switch.

Fixtures
For 16GT/s ASIC:
• PCI Express 4.0 CEM Fixture Kit
• Generic
• BIT CEM Connector + M8048A
For 16GT/s CEM:
• PCI Express 4.0 CEM Fixture Kit
For 32GT/s ASIC:
• FR4 292
• FR4 MMPX
• Meg6 292
• Meg6 MMPX
ISI Channel
Select the following options for 8.0GT/s data rate:
• N915A-014
• M8048A-002
• M8041A-0G5 (Only available for M8020A)
• Customize: Click this button to open the ISI Channel Customization
dialog as shown in Figure 14. Here, you may set the Insertion loss at 0
GHz and 4 GHz.
ISI Adjustment
Select the following options for 16.0GT/s data rate:
• Emulated ISI: Select this option to combine the internal ISI generated
by the M8020A with the selected Hardware Traces to adjust the
insertion loss. Note that the M8020A JBERT option M8041A-0G5 is
required to perform this operation.
• Hardware Traces: Select this option to use the Hardware Traces only to
generate the ISI.
• M8041A-0G5 (Only available for M8020A)
For Gen4 CEM tests, the CTS only allows the official PCI-SIG Gen4 fixture
set. Therefore, the “PCI Express 4.0 CEM Fixture” and the ISI Adjustment
with “Hardware Traces” are the only available options.

Calibration
For 2.5GT/s and 5.0GT/s:
• Scope Connection: Choose the scope connection type as direct
connection to channel 1&3 and direct connection to channel 2&4.
• Use Transfer Function: Select this check box to embed or de-embed
the calibration boards, fixtures or additional cables using the transfer
function in the scope.
• Transfer function on Scope: Shows the path of the transfer function file
for the package model.
For 8.0GT/s, 16.0GT/s and 32.0GT/s:
• Scope Connection: Choose the scope connection type as either direct
connection to channel 1&3, direct connection to channel 2&4 or as
RealEdge.
• Embed Replica Channel: Select this option to use a transfer function to
embed the replica channel.
• Package Model on Scope: Shows the path of the transfer function file
for the package model.
• Replica Ch. + Package Model on Scope: Shows the path of the transfer
function file that combines the package model and the replica channel.
This option is used when replica channel is embedded.
• Replica Channel Model on Scope: Shows the path of the transfer
function file for the replica channel. This option is used when replica
channel is embedded.
• Eye Calibration Method: Select the tool used for the stressed eye
calibration. Available tool options are either Seasim or SigTest. Each
software uses a different methodology for jitter and eye measurements:
• Seasim: It is a processing tool that uses the standard method. A step
pattern with 256 1s and 0s is applied at the input of the calibration
channel and the step response is captured at the output of the
replica channel. The oscilloscope averages the step response, which
minimizes the noise. Step response defines the complete electrical
behavior of the channel and calculate a statistical eye. Seasim also
simulates the different impairments.
• SigTest: It uses the compliance channel methodology. A compliance
pattern is applied and the different impairments like random jitter,
sinusoidal jitter and differential and common mode sinusoidal
interference are added to the signal.

• Start with Minimum Loss Channel: If not selected, the Initial

Equalization Preset Optimization Calibration starts at -37dB. Then, the
Channel Calibration decreases channel loss with 0.5dB steps until Eye
Height and Width exceed the specification values (and the ratio is
similar to the nominal value) or until channel loss reaches a minimum of
-34dB.
If selected, the Initial Equalization Preset Optimization Calibration
starts at -27dB. Then, the Channel Calibration increases channel loss
with -0.5dB steps until Eye Height and Width slightly exceed the
specification values (and the ratio is close to the ratio of the nominal
eye) or until channel loss reaches a maximum of -37dB. The remaining
calibration procedures use that channel.
• Include Advanced Measurements: Select this option to add some
procedures to the calibration tree for debugging purposes.
Receiver Loopback Training
• Loopback Training Method: Determines how the loopback training is
performed. The available link training methods are Static Sequence,
Interactive Sequence and Vendor Specific.
• Static Sequence: JBERT sends a loopback training sequence to the
DUT. The training pattern is defined by several blocks, following the
standard sequence, which is described in the CTS.
• Interactive Sequence: This feature is only available for the M8020A
when the M8020A S02 option is installed. The training sequence
consists of three blocks: a “Link Down”, a “Wait” block, and “Link
Up”. The loop-back training is managed by the JBERT internally. It
can run the link equalization phase to optimize the performance of
communication.
• Vendor Specific: The loopback training can be performed on the
vendor’s DUT using custom tools, such as JTEC, I2C and so on.
• Link Training Suite Settings File: Shows the path of the link training file.
For the Vendor Specific option, this file should only contain the
loopback pattern for the generator and the analyzer.
• Link Training Suite Lane Number: Sets the lane number (Lane0 to
Lane15) used for encoding in the TS1s/TS2s and sent to the DUT
during loopback training. If the option ‘Auto’ is selected, each lane is
encoded with its own number.
• Relax Time: Select the time span between the points when the stress
signal is changed and the BER starts to be measured.
• Equalization optimization: Select as either ‘Fine’ or ‘Fast’.

Receiver Error Detector

The CDR is used to generate a clock signal for the JBERT error detector. If
not selected, the clock is supplied by the JBERT data generator. The
JBERT error detector performs better when used with CDR.
The following CDR settings can be configured:
• Loop bandwidth: Sets the loop bandwidth in MHz.
• Equalization: Sets the Analyzer equalization.

Lanes Configuration
The Lanes window appears, as shown in Figure 15, when you click the
“Lanes Configuration” button in the Configure DUT Panel.
Figure 15 Lanes window for configuring lanes
• Lanes for Rx tests: Select the corresponding check box for one or more
lanes, where testing must be performed. The selection of one or more
lanes depends on the following conditions in the “Station
Configuration” stage of the Valiframe Configuration Wizard:
• If Use Switch for Rx test check box is left unchecked, you can select
all lanes for testing. While the tests are being performed, it is
recommended that you must manually switch cables from lane to
lane.
• If Use Switch for Rx test check box is selected, the number of lanes
to be tested depends on the module type selected. For example, if
SPT4 module type is chosen, up to 4 lanes can be selected for
testing. Similarly, if SPT6 module type is chosen, up to 6 lanes can
be selected for testing.

• Lanes for Calibration: Choose one of the following options:

• Use Lane 0 calibration for all lanes in Rx tests: Select this option to
calibrate only Lane 0. The calibration results for lane 0 are used in
the Rx tests for all lanes.
• Calibrate all Rx lanes: Select this option to perform calibrations for
each Rx lane selected. Then, each Rx test uses the corresponding
calibration value of each specific lane to be tested.
If the Map DUT lanes to test instrument channels check box is selected in
the “Station Configuration” stage of the Valiframe Configuration Wizard,
the Lanes dialog appears as shown in Figure 16. You may select all lanes
and each tested lane can be mapped to one of the available generator and
analyzer channels. Therefore, mapping of different lanes to various
instruments helps you to avoid cable re-connections.
Figure 16 Configuration of the Lanes dialog for mapping


Platform
User Guide

Introduction / 44
Selecting, Modifying & Running Tests / 46
PCIe Parameters / 50
Introduction
Once the DUT has been configured, click OK in the Configure DUT Panel.
All calibration and test procedures are included in the respective groups in
a manner similar to how they are organized in the CTS document.
Figure 17 PCIe main window
The parameter grid on the right side of the window shows the parameters
which are related to the selected procedures.
The log list at the bottom of the window shows calibration and test status
messages (regular progress updates as well as warnings and error
messages).
To start one or more procedures, select the corresponding check box. The
Start button is enabled and turns green in color. Click Start to run the
selected procedures.

Using the Software 3
Once all the procedures are run, the N5991 configuration can be stored as
a single ‘.vfp’ file using the Save button and recalled using the Load button
without the need to configure the DUT again.
Before executing the calibration or test procedures, ensure that the PCIe
CAUTION Station Configuration is configured properly with all necessary
instruments such as the Infiniium oscilloscope set to “online”. All
calibrations can be run in offline mode, that is, without any instrument
connected. The offline mode is intended for product demonstrations with
simulated data. CALIBRATIONS RUN IN OFFLINE MODE DO NOT
GENERATE VALID CALIBRATION DATA.

Selecting, Modifying & Running Tests
Selecting Procedures
The calibration, receiver, and transmitter test procedure groups can be

selected globally by selecting the check box at the top of the group.
Alternatively, an individual test procedure can be selected by checking the
corresponding check box. Click Start to run the selected test procedures.
Modifying Parameters
Most calibration and test procedures, as well as the groups containing

them, have parameters that control the details of how the procedures are
run. In compliance mode, most of these parameters are read-only. In
expert mode, almost all the parameters can be modified. First, select a
specific calibration or test procedure or one of the groups contained in the
N5991 procedure tree, as shown in Figure 18. The parameters are
displayed in a property list on the right side of the window. These
parameters can be configured only before the selected procedure
subgroup or procedure is started. All selected test parameters are listed in
the MS Excel/HTML test results worksheets.

Figure 18 Modifying parameters
Running Procedures
To run the selected procedures, click the “Start” icon on the toolbar (see
Figure 17). The procedures are run sequentially in the order shown in the
procedure selection tree. Some procedures may require user intervention,
such as changing cable connections or entering DUT parameters. The
required action is prompted in pop-up dialog boxes prior to running the
calibration/test procedures. To view the connection diagram, right-click
the desired test or calibration. From the right-click menu, select “Show
Connection”.

Results
Runtime Data Display
Most procedures generate data output. While the procedure is running,

the data is displayed in a temporary MS Excel worksheet or HTML
document (depending on the selected viewer in the Station configuration),
which opens automatically for each individual procedure.
Any MS-Excel worksheet or HTML documents, which are open during the
procedure runs are closed automatically once the specific procedure is
finished. As long as the N5991 Software is running, each result file (MS
Excel worksheet or HTML Page) can be reopened by double-clicking the
respective procedure. However, the individual files are lost when the
N5991 main window is closed, unless you save the individual files or a
collection of them.
Results Workbook
For your convenience, all individual results are summarized in an MS Excel

workbook or HTML document at the end of the test run. All calibration and
test data worksheets can be saved in a workbook by clicking the “Export”
button on the toolbar of the PCIe N5991 Test Automation window.
Keysight recommends performing this action at least once at the end of
each N5991 procedure runs to avoid any data loss. If the calibration and
test procedures are conducted several times during the same N5991 run,
the resulting worksheets are combined in the workbook. If a test
procedure is conducted without prior execution of calibration procedures
in the same test run, only the test results will be saved to the workbook.
As a safety feature, all calibration and test results are saved by default to
NOTE the N5991 “Tmp” directory. The sub-folder “Results/PCIe Station”
contains the Excel files of the final results measured at each calibration
and test procedure. In addition to the calibration data worksheets,
calibration data files are generated. These files are saved by default to
the N5991 calibrations folder. If these calibrations are run again, the
data file is overwritten. To save the calibration data files at each
configuration, the files must be copied from the directory: C:\
ProgramData\BitifEye\N5991\PCIe\Calibrations and saved manually in
any folder before rerunning the calibrations.

Icon Representation
Once the selected procedures are run successfully, the icons that appear
for individual procedures indicates the result (Pass / Fail / Incomplete) as
described in Table 4.
Table 4 Icon Result description
Smiley Description
Indicates that the procedures have not run yet.
Indicates that the procedures are running.
Indicates that the selected procedures passed successfully in the previous run and the results are available.
Indicates that the selected procedures were passed in offline mode and the results are available.
Indicates that the procedure was not run completely in the previous run.
Indicates that the procedure could not be run in the present run. Most likely, the DUT failed during initialization, so no test
was conducted.
Indicates that the procedure failed in the previous run.
Indicates that the procedure failed in the current run.

PCIe Parameters
The PCIe parameters are of three types:

• Sequencer Parameters
• Common Parameters
• Procedure Parameters Sufficient to use
Sequencer Parameters
The sequencer parameters control the flow of the test sequencer, not the
behavior of individual procedures. They are identical across all versions of
ValiFrame. One of them, Repetitions, is available for all procedures and
groups in the procedure tree. The others are only available for procedures.
Like all other parameters the sequencer parameters are shown on right
side of the ValiFrame user interface and you may manually change them,
as illustrated in Figure 19.
Figure 19 PCIe Sequencer Parameters

All sequencer parameters are listed in alphabetical order in Table 5.
Table 5 PCIe Sequencer Parameters
Parameter Name Parameter Description
Procedure Error Case Behavior • “Proceed With Next Procedure”: If an error occurs in the current test or calibration procedure, continue by
running the next procedure in the sequence.
• “Abort Sequence”: Abort further running of the sequence.
Procedure Failed Case Behavior • “Proceed With Next Procedure”: If the current test or calibration procedure fails, continue by running the next
procedure in the sequence.
• “Abort Sequence”: Abort further running of the sequence.
Repetitions The number of times the group or procedure is going to be repeated. If the value is '0', it runs only once.
Common Parameters
The common parameters are used for several related calibration or test
procedures. They are shown on the right side of the ValiFrame user
interface when the selected entry of the procedure tree on the left is a
group instead of an individual procedure.
The PCIe Receiver Test Software has some group parameters (in addition
to “Repetitions”) on the top-level entry of the PCIe tree. These are
common for all Valiframe calibration and receiver procedures respectively.
Table 6 PCIe Common Calibration Parameters
Parameter Name Description
Scope Connection for All calibrations can be done with either a single-ended direct connection to channels 1&3 or to channels 2&4. For
Calibration 32.0GT/s, RealEdge is also available when a DSO-Z is connected.
2.5 & 5.0GT/S ASIC
PCIe 1 Transfer Function on This is the path to the package model, which is located on the oscilloscope. The package model must be embedded
Scope to perform some calibrations. The file cannot be copied to the oscilloscope by the automation software. If the file is
not on the oscilloscope, the automation software instructs you to copy the package model file manually.
PCIe1 M8048A ISI Channel The M8048A ISI Channel used for PCIe1 ASIC Rx Calibration.
PCIe1 M8048A ISI Channel Set to true if the internal ISI of the M8020A is used, else set to false.
Emulation

PCIe 2 Transfer Function on This is the path to the package model, which is located on the oscilloscope. The package model must be embedded
Scope to perform some calibrations. The file cannot be copied to the oscilloscope by the automation software. If the file is
PCIe2 M8048A ISI Channel The M8048A ISI Channel used for PCIe2 ASIC Rx Calibration.
PCIe2 M8048A ISI Channel Set to true if the internal ISI of the M8020A is used, else set to false.
Emulation
8.0GT/S ASIC
Transfer Function File for This is the path to the package model, which is located on the oscilloscope. The package model must be embedded
Package Model on Scope to perform some calibrations. The file cannot be copied to the oscilloscope by the automation software. If the file is
Transfer Function File for This is available only if “Embed Replica Channel” was selected in Configure DUT > Show Parameters > Rx 8.0GT/s.
Replica on Scope This is the path to the transfer function of the replica channel, which is located on the oscilloscope.
Transfer Function File for This is available only if “Embed Replica Channel” was selected in Configure DUT > Show Parameters > Rx 8.0GT/s.
Replica and Package Model on This is the path to the transfer function, which includes replica channel and package model, located on the
Scope oscilloscope.
Step Response Low Time The length in UIs prior to the low-to-high transition.
Step Response High Time The length in UIs after the low-to-high transition.
Number of Averages for Step The number of averages for the step response.
Response
16.0 GT/s
Gen4 ASIC Fixtures The Rx tests can be performed either with the Generic fixtures or with the BIT CEM Connector + M8048A.
Gen4 ISI Adjustment The Inter Symbol Interference can be generated with Hardware Traces or can be emulated internally if the M8020A
JBERT option M8041A-0G5 is available.
Gen 4 ASIC Eye Calibration Select either Seasim or SigTest. The selected software is used for jitter and eye measurements.
Method

Start with Minimum Loss It defines how the Initial Equalization Preset Optimization Calibration starts. If true, the calibration starts with
Channel minimum loss channel and increases it until the specification eye is reached. If false, the calibration starts with
maximum loss channel and decreases it until the specification eye is reached.
32.0 GT/s
Gen 5 ASIC Eye Calibration Select either Seasim or SigTest. The selected software is used for jitter and eye measurements.
Method
Table 7 PCIe Common Receiver Parameters
Reference Clock The frequency of the reference clock.
Data Rate Deviation Deviation of the data rate.
Loopback Training
Link Training Mode Static Sequence: JBERT sends a loopback training sequence to the DUT. The training pattern is defined by several
blocks, following the standard sequence, which is described in the CTS.
Interactive Sequence: The training sequence consists of three blocks: a “Link Down”, a “Wait” block, and “Link Up”.
The loop-back training is managed by the JBERT internally. It can run the link equalization phase to optimize the
performance of communication.
Vendor Specific: The loopback training can be performed on the vendor’s DUT using custom tools, such as JTEC,
I2C and so on.
Link Training Suite Settings File, The Link Training Suite settings file (script file) is used for loopback training.
Interactive Training Script File, Note: Some DUTs require a special training sequence, which can be optimized with the PCIe Link Suite. This
Link EQ Tx Test Script File sequence can be used for Rx testing.
Default Link Training Lane This parameter is only available when the link training mode is set to “static sequence”.
Number for every Lane In such a case, during the loopback training, the lane number are encoded in TS1s/TS2s and sent to the DUT. By
default, this value is set for all lanes. If the option “Auto” is selected, each lane is encoded with its own number.
Suppress Loopback Training When set to true, this hides all popup messages related to loopback training.
Messages
Use Custom Training Voltage Set to true to specify the differential voltage amplitude used during the DUT training.
Interactive Link Training

Training Through For Interactive Link Training Mode, you may select if training should go through L0-Recovery or Configuration.
Note: If you select “Link Training Mode” as ‘Static Sequence’, training always goes through Configuration.
Generator Full Swing Full Swing of generator used with LTSSM. It is applied to all data rates.
Generator Start Preset The generator uses this preset in link equalization phase 1.
Note that this setting is applied for the Jitter Tolerance and Sensitivity tests only.
DUT Initial Preset The DUT Tx uses this preset in link equalization phase 0.
DUT Target Preset The generator (downstream port) requests this preset in link equalization phase 3.
Generator Start Preset Gen4/5 The generator Tx uses this preset in link equalization phase 1.
Note that this setting is applied for the Jitter Tolerance and Sensitivity tests only.
DUT Initial Preset Gen4/5 The DUT Tx uses this preset in link equalization phase 0.
DUT Target Preset Gen4/5 The generator (upstream port) requests this preset in link equalization phase 2.
Drop Link Method Select the method to drop the link during link training.
Error Detector
Use CDR If set to true, CDR is used to generate a clock signal for the JBERT error detector. If set to false, the clock is
supplied by the JBERT data generator. The JBERT error detector performs better when used with CDR.
CDR Loop Bandwidth The loop bandwidth of the JBERT error detector CDR.
Peaking Select the CDR Peaking in dB (between 0-1dB).
Analyzer Equalization Select the analyzer equalization. The available values depend on the analyzer used.
Sensitivity Mode Set to Normal or High.

Capture and Compare Mode If it is enabled, the received data is captured and saved in a pattern. A new analyzer sequence is generated with a
single block containing the captured pattern. This mode is available only with a common reference clock
architecture.
Pause before Auto-Align It is the pause before the BER measurement, so that you can perform manual optimization of the DUT receiver.
Polarity Set to Normal or Inverted.
BER Measurement
Relax Time Time span between the points when the stress signal is changed and the BER starts to be measured.
Equalization
Use Preset Set to true to use a preset.
Generator Preset Select the generator preset (P7 as default).
Pre Shoot Pre-shoot level of the signal. By default, it is set to 0.
De-Emphasis De-emphasis level of the signal. It is set to the optimum de-emphasis using the Insertion Loss Calibration.

Procedure Parameters
The Procedure Parameters are all such parameters that are not part of any
of the previously described categories. They are shown on the right side of
the ValiFrame user interface when the selected entry of the procedure tree
on the left is an individual procedure. Their purpose is to modify the
behavior of that single procedure. Procedures often have parameters with
the same name, but pre-configured settings always apply on the selected
procedure, while their meaning may be slightly different.
Table 8 shows a list of PCIe Calibration parameters that are used in several
procedures individually.
Table 8 PCIe Calibration Parameters
Verification Mode If set to false, the procedure behaves as a normal calibration and the results are saved as usual.
If set to true, the procedure uses a previous calibration to set the calibrated parameter. In this case, the purpose of
the procedures is to certify that the available calibration is valid and the desired values can be achieved.
Generator
TP1 Voltage, Generator Launch Nominal differential voltage amplitude used for calibration. The default value is 800mV and should not be changed.
Voltage, Set Amplitude
Pre-shoot Pre-shoot value set to the signal.
De-Emphasis De-Emphasis value set to the signal.
DMSI Differential mode sinusoidal interference added to the signal.
CMSI Common mode sinusoidal interference added to the signal.
Random Jitter Amount of RJ added to the signal.
Sinusoidal Jitter Amount for SJ added to the signal.
Sinusoidal Jitter Frequency Frequency of the sinusoidal jitter.

Oscilloscope
Scope Bandwidth Bandwidth selected in the oscilloscope.
Number of Averages Number of averages for each jitter measurement.
Number of UIs Number of unit intervals tested.
Number of Waveforms Averages Number of waveform that are averaged during the scope acquisition. This will reduce the noise floor.
Capture
Capture Mode Select one of the following options:

• Do only local eye measurements
• Only save waveform on the oscilloscope
• Do local eye measurements and save waveform on the oscilloscope
Channel
Trace Number Hardware trace number used for ASIC.
CBB var. ISI pair ISI pair used for CEM calibrations.
Total Channel Loss Total insertion loss of the calibration channel.
Seasim
Optimize CTLE Set to true to apply the optimal CTLE with the Seasim software.
Insertion Loss
Measurement Method If Step Response is selected, the test automation measures the insertion loss for different traces. If VNA is selected,
the test automation does not perform any measurement, you must measure the trace with a VNA.

Automatic Trace Selection If true, the Trace Number Start Value and Trace Number Stop Value will be internally calculated. They are
calculated to be closest to the target ISI at 16GHz.
Trace Loss Increment It is the expected insertion loss variation between each trace number.
Trace Number Start The minimum trace number that is calibrated.
Trace Number Stop The maximum trace number that is calibrated.
Save Calibration Data Set to true to save results in a calibration table.
Table 9 shows a list of PCIe Receiver parameters that are used in several
procedures individually.
Table 9 PCIe Receiver Parameters
Eye-Height The eye height of the signal when it is stressed with all the impairments.
Eye-Width The eye width of the signal when it is stressed with all the impairments.
Generator Launch Voltage The differential voltage amplitude set to the signal.
Common Mode Interference The amount of CMSI added to the signal.
Differential Mode Interference The amount of DMSI added to the signal.
Random Jitter The amount of RJ added to the signal.
Sinusoidal Jitter The amount of SJ added to the signal.
Sinusoidal Jitter Frequency Frequency of the sinusoidal jitter.

2nd Tone Sinusoidal Jitter It is used to fine adjust the Eye-Height and Width.
2nd Tone Sinusoidal Jitter The frequency of the SJ second tone.

Frequency
Pre-shoot The pre-shoot value added to the signal.
De-Emphasis The de-emphasis value added to the signal.
Force Retraining at each Force training at each BER measurement for different frequencies.
Frequency
BER Measurement
BER Mode The BER measurement can be run for a fixed time or until a target BER is achieved.
BER Measurement Duration The duration of the BER measurement when mode is FixedTime.
Allowed Bit Error The allowed number of bit errors to pass the test during the BER measurement, when mode is FixedTime.
Target BER The target BER for the BER measurement used in the test.
Confidence Level The confidence level value when BER mode is TargetBER.
Equalization for remaining Rx tests
Allow user to enter optimum Controls the appearance of a window at the end of the test, which lets you set the pre-shoot and de-emphasis
equalization for remaining Rx values to be used for the following tests.
tests
Channel
Trace Number Hardware trace number used for ASIC.

CBB var. ISI pair ISI pair used for CEM calibrations.
Total Channel Loss Total insertion loss of the calibration channel.
Coefficient Matrix Scan
Force Retraining at each BER Force training at each BER measurement for different PS/DE combination.
measurement
Pre-Shoot used for LB Training The pre-shoot value used during loopback training (not during the BER test).
De-Emphasis used for LB The de-emphasis value used during loopback training (not during the BER test).
Training
Coefficient Divider The coefficient divider for C-1 and C+1.
Maximum Boost Coefficient C+1 is increased until this Boots Level is exceeded.
Start Pre-shoot The Start Pre-shoot value in dB.
Start De-Emphasis The Start De-Emphasis value in dB.
Pre-shoot De-Emphasis Scan
Scan Order Select whether de-emphasis or pre-shoot should be tested first.
Initial De-emphasis The initial de-emphasis used for BER adjustment and pre-shoot scan.
Initial Pre-Shoot The initial pre-shoot used for BER adjustment and de-emphasis scan.
Force training at each Preset If set to true, every time de-emphasis or pre-shoot is changed the DUT is trained into loopback again.
Start De Emphasis Start amplitude for the de-emphasis scan.

Stop De Emphasis Stop amplitude for the de-emphasis scan.
De Emphasis Step Size Step size for the de-emphasis scan.
Start Pre Shoot Start amplitude for the pre-shoot scan
Stop Pre Shoot Stop amplitude for the pre-shoot scan
De Pre Shoot Size Step Step Size for the pre-shoot scan
Jitter Tolerance
Frequency Mode Select one of the options:

• Compliance Frequencies
• Equally Spaced Frequencies
• User Defined Frequencies
• Single Frequency
Frequency Points, Jitter List of frequencies to be tested. In compliance mode, they are read-only; otherwise they can be edited.
Frequency
Start Frequency It is the minimum value of jitter frequency that must be tested.
Stop Frequency It is the maximum value of jitter frequency that must be tested.
Frequency Steps The number of different jitter frequencies that are tested. The distribution of frequencies between minimum and
maximum is equidistant on a logarithmic or linear scale.
Frequency Scale It is chosen as Linear or Logarithmic scale.
Jitter Start Value It is the initial value of the SJ amplitude tested in the search algorithm.

Jitter Step Size It is the jitter value to be increased at each step of the search algorithm.
Show Min. Failed Points If True, the result shows the first SJ a mplitude that didn’t pass the BER test at each frequency.
RJ Low Pass Jitter Frequency 1000MHz low-pass filter frequency is compliant to the specification but reduces the total amount of SJ for high
jitter frequencies. In order to have full amount of SJ, switch to 500MHz.

Platform
User Guide
4 2.5 & 5.0 GT/s ASIC

Tests
Overview / 64
2.5 & 5.0 GT/s ASIC Calibrations / 65
Receiver Tests / 74
Receiver Setup Tests / 87
Overview
Before any receiver test procedure can be run, the PCIe receiver test
system must be calibrated.
The ValiFrame calibration plane is given by the DUT input ports. The
receiver test signal characteristics such as the PCIe signal generator
output voltage level and jitter parameters are typically affected by the
signal transmission between the generator output ports and the DUT input
ports. Thus, for any signal output parameter that you select (set value), the
jitter and the signal received at the DUT input ports (actual value) deviate
from the set value. Additional deviations can be caused by effects such as
offset errors, hysteresis, and nonlinear behavior of the signal generator.
The ValiFrame calibration procedures compensate for the deviations of the
relevant signal output parameter actual values from the set values over the
required parameter range.
All calibration procedures required for PCIe receiver testing are included in
the ValiFrame software. The ValiFrame calibration procedures are
implemented such that the calibration process is conducted as fast as
possible and is automated as much as possible, for example, by minimizing
the number of re-configuration of the hardware connections.
Common Parameters for 2.5 & 5.0 GT/s ASIC Calibrations
Data rate specific parameters:

• Scope Connection
• PCIe 1 Transfer Function on Scope
• PCIe1 M8048A ISI Channel
• PCIe1 M8048A ISI Channel Emulation
• PCIe 2 Transfer Function on Scope
• PCIe2 M8048A ISI Channel
• PCIe2 M8048A ISI Channel Emulation
For the description of each parameter, refer to Table 6, “PCIe Common
Calibration Parameters”.

2.5 & 5.0 GT/s ASIC Tests 4
2.5 & 5.0 GT/s ASIC Calibrations
2.5G/5G Random Jitter Calibration
Purpose and Method
While performing Rx tests, the input signal is stressed with a combination

of jitter sources to simulate the possible impairments that are expected at
the Rx input when operating in a target system. Random jitter is added to
simulate the effects of thermal noise. Due to system intrinsic jitter, the
effective jitter level is different from the value set in the data generator;
therefore, jitter amplitude is calibrated.
The test automation starts with a small RJ amplitude and increases that
value with several steps over a defined range. For each step, the procedure
measures the actual random jitter.
The generator sends a clock pattern during this calibration procedure.
The measurement is done on a real-time oscilloscope using the
RJ/DJ-separation software EZJIT.
The calibration data is stored in a Cal-table. This calibration table is used
during measurements to calculate the RJ amplitude that must be set on
the generator to get the expected RJ amplitude at the test point.
Figure 20 Connection Diagram for 2.5 & 5.0 GT/s ASIC Calibrations (M8020A)
Parameters in Expert Mode

• None

Result Description
Figure 21 Result for 2.5 & 5.0 GT/s Random Jitter Calibration
• Set Random Jitter: The jitter amplitude set in the instrument.

• Actual Random Jitter: The measured jitter amplitude.

2.5G/5G ISI Calibration
Purpose and Method
In ASIC Rx tests, the Inter Symbol Interference is generated to provide a

close to real environment. As a result of the system intrinsic jitter, the
therefore, the jitter amplitude is calibrated.
The test automation calibrates the ISI trace, which was selected in the
“Configure DUT” dialog. ISI can be injected by routing the signal through
the M8048A ISI traces or can be generated internally with the M8020A.
The actual value is calculated as the difference between the eye width,
which is obtained when the JBERT sends a clock pattern and the eye
width, which is obtained when it sends a compliance pattern. The eye
width is measured with a DSO using horizontal histograms.
The calibration data is stored in a Cal-table. There is a Cal-table for Gen1
ASIC and another one for Gen2 ASIC. For the measurements, these
calibration tables are used to display the ISI amplitude.

• None

Result Description
Figure 23 Result for 2.5 & 5.0 GT/s ISI Calibration
• Measured ISI: The measured ISI, in ps.

2.5G/5G CMSI Calibration
Purpose and Method
The Common Mode Sinusoidal Interference (CMSI) is generated internally

with the data generator. The resulting amplitude at the input of the Rx is
attenuated and must be calibrated.
The test automation starts with a small CMSI amplitude and increases that
value with several steps over a defined range. The minimum amplitude is
0mV and the maximum amplitude is the maximum value that the data
generator can generate.
For each step, the procedure measures the actual CMSI with a real time
oscilloscope.
The calibration data is stored in a Cal-table. During measurements, these
calibration tables are used to adjust the voltage amplitude to the desired
output CMSI.

• Number of Averages
For description of the parameters, refer to Table 6, “PCIe Common

Result Description
Figure 25 Result for 2.5 & 5.0 GT/s CMSI Calibration
• Set CMSI: The amount of CMSI set in the data generator.

• Measured CMSI: The actual CMSI measured with the oscilloscope.

2.5G/5G Eye Height Calibration
Purpose and Method
The test fixtures attenuate the data signal. To compensate for the
attenuation, the data signal differential swing is calibrated.
The test automation calibrates five equally-spaced differential voltage
amplitudes. The minimum amplitude is 300mV and the maximum
amplitude is the maximum value that the data generator can generate.
For this calibration, the data generator sends the compliance pattern. It
adds random jitter, ISI, swept sinusoidal jitter (that has undergone sweep)
and CMSI to the signal. For Gen2, it adds high frequency sinusoidal jitter
and SSC residual to the signal. The eye height is measured on the
oscilloscope using horizontal histograms.
ASIC and another one for Gen2 ASIC. During measurements, these
calibration tables are used to adjust the differential voltage amplitude to
the desired eye height.

• Verification Mode
For description of the parameters, refer to Table 8, “PCIe Calibration
Parameters”.

Used Calibrations (Prerequisite)

• 2.5G/5G Random Jitter Calibration on page 65.
• 2.5G/5G ISI Calibration on page 67.
• 2.5G/5G CMSI Calibration on page 69.

Result Description
Figure 27 Result for 2.5 & 5.0 GT/s Eye Height Calibration
• Set Diff Voltage [mV]: The differential voltage amplitude set in the
instrument.
• Measured Eye Height [mV]: The measured eye height amplitude.

Receiver Tests
The basic principles underlying all PCIe receiver tests are:

• Train the DUT into Loopback Mode
• Send the training pattern with defined stress characteristics
• Use the error detector to verify that the DUT loops back the correct
pattern without errors
Most of the Rx tests constantly change the signal stress to collect more
data and re-initialize the loopback mode if the DUT terminates from it. If
calibration data is available, the data confirms that the signal stress is at
the specified level and test point. If calibration data is missing, a warning
message pops up. If you ignore the warning messages explicitly, you can
run tests without the calibration data.
You do not require a real-time oscilloscope to perform Receiver Tests.

NOTE
Common Parameters for Receiver Tests
• Reference Clock
• Use Power Switch Automation
• Power Switch Channel Number
• Power Cycle Off-On Duration
• Power Cycle Settling Time
• Power Cycle Max. Retries
Common Parameters specific for Data Rates
Loopback Training
• Link Training Mode
• Link Training Suite Settings File
• Default Link Training Lane Number for every Lane
• Suppress Loopback Training Messages
Error Detector
• Use CDR

• CDR Loop Bandwidth

• Peaking
• Analyzer Equalization
• Sensitivity
• Polarity
BER Measurement
• Relax Time
All these parameter are described in detail in the section PCIe Parameters
on page 50.

2.5G/5G Rx Compliance Test
Purpose and Method
This test determines if the DUT meets the receiver specifications. The
procedure measures the BER when all jitter types and the eye height are
set to their specification limit values (that is, maximum values for jitter,
minimum value for eye height). In expert mode, these values can be
changed.
Figure 28 Connection Diagram for 2.5 & 5.0 GT/s Receiver Tests (M8020A)

• ISI
• CMSI Amplitude
Generator Jitter
• Random Jitter
• Swept Sinusoidal Jitter
• SSC Residual (for 5 GT/s)
Eye-Height

• Eye-Height
BER Measurement
• BER Mode
• BER Measurement Duration
• Allowed Bit Error
• Target BER
• Confidence Level
For description of the parameters, refer to Table 9, “PCIe Receiver
Parameters”.

• 2.5G/5G Eye Height Calibration on page 71.

Result Description
Figure 29 Result for 2.5 & 5.0 GT/s ASIC Rx Compliance Test
• Result: The BER measured should be smaller than the Target BER.
• Target BER: The target BER that must be achieved.
• BER: The measured BER that has been achieved.

2.5G/5G Rx Jitter Tolerance Test
Purpose and Method
This test procedure searches the maximum sinusoidal jitter, where the
DUT passes the BER test.
There are different methods to find the jitter tolerance limits. It can be
selected with “search algorithm” parameters, such as: Binary, Linear,
Linear with two sizes, Linear with Hysteresis or Logarithmic.
• If Binary is selected, the binary search algorithm is used. At first, the
jitter amplitude is set to the middle of the tested range. When the BER
test passes, it goes up and when the test fails, it goes down, At each
step, the step size is reduced until the target resolution is reached.
• If Linear is selected, the test uses the defined step size to go up linearly
from “Start Jitter” until the BER test fails.
• If Linear with two step size is selected, the test first uses relatively large
steps to go up linearly from “Start Jitter”. When BER test fails, it goes
back to the last passed point and steps up again with small steps until
an error is found again.
• If Linear with Hysteresis is selected, the test first uses relatively large
back down with mid-sized steps until it passes again. From that point, it
steps up again with small steps until an error is found again.
• If Logarithmic is selected, the test uses the defined step factor to
increase with a logarithmic scale from “Start Jitter” until the BER test
fails.
The maximum passed value is the last test point that did not return an
error. Each point occurs separately for each frequency.
The Rx Jitter Tolerance Test is available only in Expert Mode.

NOTE


• ISI
• CMSI Amplitude
Sinusoidal Jitter Variation
• Frequency Mode
• If the option ‘User Defined Frequencies’ is selected, parameter is:
• Frequency Points
• If the option ‘Single Frequency’ is selected, parameter is:
• Jitter frequencies
• If the option ‘Equally Spaced Frequencies’ is selected, parameter is:
• Frequency Scale
• Start frequency
• Stop frequency
• Frequency Steps
• Search algorithm

• Jitter Step Size

• Jitter Start Value
• Show Min. Failed Points
Parameter
• Force retraining on each frequency
Generator
• Random Jitter
• HF Sinusoidal Jitter
• HF Sinusoidal Jitter Frequency
• SSC Residual
Eye-Height
• Eye-Height
BER Measurement
• BER Mode
• Target BER
Parameters”.


Result Description
Figure 31 Result for 2.5 & 5.0 GT/s ASIC Rx Jitter Tolerance Test

• Result: Max. passed jitter should be greater than min. specification.

• Sinusoidal Jitter Frequency [MHz]: The tested frequency points.
• Min Failed Total Jitter [ps]: The minimum jitter that failed the test.
• Max Passed Total Jitter [ps]: The maximum jitter that passed the test.
• Jitter Capability Test Setup [ps]: The maximum jitter that the hardware
can generate.
• Measured ISI [ps]: The measured BER.
• Min Spec [ps]: The minimum jitter that has to pass the test to meet the
specification.
• Margin [%]: The margin between the max. passed jitter and the
specification.

2.5G/5G Rx Sensitivity Test
Purpose and Method
This test searches the minimum eye height, where the DUT passes the BER
test. The method starts with “Start Eye Height” and decreases with steps
of “Step Size”. The minimum passed value is the last test point that did not
return an error.
The Rx Sensitivity Test is available only in Expert Mode.

NOTE

• ISI
• CMSI Amplitude
Generator Jitter

• Use Jitter
• Random Jitter
• SSC Residual (for 5GT/s)
Eye-Height
• Loopback Training Eye-Height
• Start Eye-Height
• Stop Eye-Height
• Step Size
BER Measurement
• BER Mode
• Target BER
Parameters”.


Result Description
Figure 33 Result for 2.5 & 5.0 GT/s ASIC Rx Sensitivity Test
• Result: It is the min. passed Eye Height measured that should be

smaller than the min. specification.
• Min Passed Eye Height [mV]: It is the smallest eye height at which the
• Min Spec [mV]: It is the smallest eye height at which the DUT has to
pass the BER test to meet the specification.
• Margin [%]: It is the margin between the min. passed Eye Height and
the min. specification.

Receiver Setup Tests
Common Parameters for Receiver Setup Tests
• Reference Clock
on page 50.

2.5G/5G Rx Compliance Setup
Purpose and Method
The purpose of this procedure is to configure the data generator with

those parameters that are needed in the Rx Compliance Test, using the
calibration data saved on the PC where the N5991A software is running.
The method initiates in the same manner as the Rx Compliance Test but it
doesn't proceed any further after the setup is prepared. The set
parameters are differential amplitude, random jitter, swept sinusoidal jitter
and common mode sinusoidal interference.

• ISI
• CMSI Amplitude
Generator Jitter
• Random Jitter
• SSC Residual (for 5 GT/s)

Eye-Height
• Eye-Height
Parameters”.



Platform
User Guide

Overview / 92
8.0 GT/s ASIC Calibrations / 93
Receiver Tests / 124
Link Equalization Transmitter Tests / 149
Overview
Common Parameters for 8.0 GT/s ASIC Calibrations

• Transfer Function File for Package Model on Scope
• Transfer Function File for Replica on Scope
• Transfer Function File for Replica and Package Model on Scope
• Step Response Low Time
• Step Response High Time
• Number of Averages for Step Response

8.0 GT/s ASIC Tests 5
8.0 GT/s ASIC Calibrations
8G TxEQ and Launch Voltage Calibration
Purpose and Method
This procedure calibrates the De-Emphasis, Pre-shoot and Differential

Voltage amplitude at TP1.
The pattern generator sends an equalization pattern to the oscilloscope
and performs a sweep of the whole equalization range.
First, the pre-cursor is set to the initial value (-0.28dB). For this set value,
the post cursor is swept from -0.28 to 0.02dB with linear steps of 0.02dB.
At each post-cursor value, the de-emphasis, pre-shoot and differential
voltage are measured with the oscilloscope. Then, the pre-cursor is
increased with a step size of 0.02dB and the process is repeated until
0.02dB is attained. The Launch Voltage is always fixed to 800mV.
The procedure explained above is specific for the M8040A data

NOTE generator setup. For the M8020A setup, the procedure is very similar but
the sweep is not performed over the pre-cursor and post-cursor values.
In this case, the sweep is performed directly for the de-emphasis (from
-6dB to 2dB) and pre-shoot (from 6dB to -1dB).
As result, three calibration data tables are generated. Then, in further
procedures, these calibrations are used to set equalization values that
provide the desired de-emphasis, pre-shoot and voltage in the test point.

Figure 35 to Figure 38 show the connection diagrams for calibrations at

TP1.
Figure 35 Setup for 8.0GT/s ASIC Calibrations (TP1, No TTC, DSOz, M8040A)
Figure 36 Setup for 8.0GT/s ASIC Calibrations (TP1, No TTC, 2CH DSO, M8040A)

Figure 37 Setup for 8.0GT/s ASIC Calibrations (TP1, With TTC, M8040A)
Figure 38 Setup for 8.0GT/s ASIC Calibrations (TP1, M8020A)


• EQ Calibration Pattern: Pattern used for this calibration
Generator
• Set Amplitude
Oscilloscope
• Scope Bandwidth
• Number of Waveform Averages
Parameters”.

Result Description
Figure 39 Result for 8.0 GT/s TxEQ and Launch Voltage Calibration (Pre-shoot)


• C+1 (x dB): The Pre-shoot measured for the combination of post-cursor
(x dB) and pre-cursor values set on the data generator.
Figure 40 Result for 8.0 GT/s TxEQ and Launch Voltage Calibration (De-Emphasis)

• Set Post-Cursor: The post-cursor value set in the data generator.

• C-1 (x dB): The De-Emphasis measured for the combination of
post-cursor and pre-cursor values set on the data generator.
Figure 41 Result for 8.0 GT/s TxEQ and Launch Voltage Calibration (Launch Voltage)


• C-1 (x dB): The Differential voltage amplitude measured for the
combination of post-cursor and pre-cursor values set on the data
generator.
8G Random Jitter Calibration
Purpose and Method


TP1.
For DSOz without TCCs, the oscilloscope connections must be changed

NOTE from HF channels to LF channels.

• Stop Random Jitter: The maximum RJ amplitude that is calibrated.
• Random Jitter Step Size: The step size that defines how much jitter is
increased for every step.
Parameters”.
Result Description
Figure 46 Result for 8.0 GT/s ASIC Random Jitter Calibration

• Measured Random Jitter: The measured jitter amplitude.
8G Insertion Loss Calibration
Purpose and Method
The Insertion Loss (IL) of the calibration channels + the replica channel
must be in a well-defined range. This calibration calculates the Insertion
Loss from the step response at three different de-emphasis levels. By
adding de-emphasis, IL can be reduced to a certain degree. This
procedure is used to compensate IL during the Rx tests.
For every de-emphasis level, the insertion loss is measured from 1GHz to
4GHz with steps of 100MHz. The IL is measured using the Seasim
software.
The calibration data is stored in a Cal-table. This calibration data is used to
evaluate the optimum amount of de-emphasis for the Rx tests.
Figure 47 and Figure 48 show the connection diagrams for the long
channel calibrations. Note that the setup can differ depending on the
selected ISI Channel.
Figure 47 Setup for 8.0GT/s ASIC Calibrations Long Channel M8040A

• None
Result Description
Figure 49 Result for 8.0 GT/s ASIC Insertion Loss Calibration
• Frequency: The frequency that was tested.

• Insertion Loss at x dB de-emphasis: The measured insertion loss for
specific de-emphasis at each frequency.
8G CMSI Calibration
Purpose and Method

generator can generate.
For each step, the procedure measures the actual CMSI with a real-time
oscilloscope.
The calibration data is stored in a Cal-table. When measurements are
performed, these calibration tables are used to adjust the voltage
amplitude to the desired output CMSI.
Figure 50 and Figure 51 show the connection diagrams for the CMSI
calibrations.
Figure 50 Setup for 8.0GT/s ASIC CMSI Calibrations M8040A

• For description of the parameters, refer to Table 8, “PCIe Calibration
Parameters”.
Result Description
Figure 52 Result for 8.0 GT/s ASIC CMSI Calibration

8G DMSI Calibration
Purpose and Method
The Differential Mode Sinusoidal Interference (DMSI) is generated

internally with the data generator. The resulting amplitude at the input of
the Rx is attenuated and must be calibrated.
The test automation starts with a small DMSI amplitude and increases that
value with several steps over a defined range.
For each step, the procedure measures the actual DMSI with a real-time
oscilloscope.
performed, this calibration table is used to adjust the DMSI amplitude to
the desired value in the Rx input.
Figure 53 and Figure 54 show the connection diagrams for the DMSI
calibrations.
Figure 53 Setup for 8.0GT/s ASIC DMSI Calibrations M8040A

• For description of the parameters, refer to Table 8, “PCIe Calibration
Parameters”.

• 8G CMSI Calibration on page 111.
Result Description
Figure 55 Result for 8.0 GT/s ASIC DMSI Calibration
• Set DM Interference: The amount of DMSI set in the data generator.

• Measured DMSI Amplitude: The actual DMSI measured with the
oscilloscope.
8G Stressed Jitter Eye Calibration
Purpose and Method
This procedure calibrates the eye-height and eye-width by adding

differential mode sinusoidal interference at different random jitter levels.
The calibration is done for 1ps, 1.5ps, 2ps, 2.5ps and 3ps of random jitter.
For each jitter value, the DM sinusoidal interference is increased from 0 to
30mV with equally spaced steps. The eye height and width are measured
by capturing a step response and using Seasim software. Sinusoidal Jitter
is always fixed to 12.5ps.
The calibration data is stored in two Cal-tables. This calibration data is
used to evaluate the optimum amount of random jitter and DM voltage to
get the desired eye.
Figure 56 and Figure 57 show the connection diagrams for the Stressed
Jitter Eye calibrations.
Figure 56 Setup for 8.0GT/s ASIC Stressed Jitter Eye Calibrations M8040A
Figure 57 Setup for 8.0GT/s ASIC Stressed Jitter Eye Calibrations M8020A

• Sinusoidal Jitter: The amount of SJ added to the simulation of Stressed
Eye.
• DM Interference Step Size: The amount of DM Interference added to
the simulation at each step.

• 8G TxEQ and Launch Voltage Calibration on page 93.
• 8G Random Jitter Calibration on page 101.
• 8G Insertion Loss Calibration on page 107.
Result Description
Figure 58 Result for 8.0 GT/s ASIC Stressed Jitter Eye Calibration (Eye height)
• Set DM Interference: The amount of DM Interference set in the data

generator.
• Eye Height (x ps RJ): The measured Eye Height for the set RJ and
DMSI.
Figure 59 Result for 8.0 GT/s ASIC Stressed Jitter Eye Calibration (Eye width)
• Set DM Interference: The amount of DM Interference set in the data

generator.
• Eye Width (x ps RJ): The measured Eye Width for the set RJ and DMSI.
Receiver Tests


NOTE
• Reference Clock
• Manually align error detector sampling point
• Data Rate Deviation

Loopback Training
• User Custom Training Voltage

• Training through
• Generator Full Swing
• Generator Start Preset
• DUT Initial Preset
• DUT Target Preset
• Drop Link Method
Error Detector
• Use CDR
• Peaking
• Capture and Compare Mode
• Sensitivity
• Polarity
BER Measurement
• Relax Time
on page 50.
8G Rx EQ Coefficient Matrix Scan
Purpose and Method
This procedure measures the BER with a combination of coefficients C+1

(Pre-cursor) and C-1 (Post-cursor) to create a co-efficient matrix with the
BER results. At each step, the BER value is measured for different values of
C+1 coefficient while the C-1 coefficient value is kept constant. The
resulting values are mapped on to a triangular matrix, where each element
contains four entries (measured BER, pre-shoot, de-emphasis, and boost).
Elements on a diagonal line from bottom left to top right have the same
maximum boost value. The elements of the matrix are displayed in
different colors depending on the measured BER value. If the element
appears in green color, the entry values are valid and they can be used for
testing. As the color changes to red, such values are invalid for testing.
If the parameter “Allow user to enter optimum equalization” for remaining
tests is set to ‘True’, a window appears where you can select the values of
pre-shoot and de-emphasis from the resulting graph.
Figure 60 and Figure 61 show the connection diagram for ASIC endpoints
for M8040A and M8020A, respectively. Note that the setup can differ
depending on the ISI channel, clock architecture and external reference
clock selections.
For ASIC RootComplex DUTs, the setup differs in the reference clock
connection.
Figure 60 Setup for 8.0GT/s ASIC Receiver Tests M8040A
Eye Parameter
• Eye Height
• Eye Width
• Random Jitter
• Sinusoidal Jitter
• Sinusoidal Jitter Frequency
• Differential Mode Sinusoidal Interference
• Generator Launch Voltage
• Common Mode Sinusoidal Interference
Coefficient Variation
• Coefficient Divider
• Maximum Boost
• Start Pre-Shoot
• Start De-Emphasis
BER Measurement
• BER Mode
• Target BER
Parameters”.

• 8G DMSI Calibration on page 115.
Result Description
Figure 62 Result for 8.0 GT/s ASIC Rx EQ Coefficient Matrix Scan
• C-1/C+1: Result of the BER measurement for the specific combination

of the coefficient matrix.
8G Rx Pre-Shoot De-Emphasis Scan
Purpose and Method
The purpose of this test is to find the optimum combination of

de-emphasis and pre-shoot amplitude. As a first step, the procedure sets
initial de-emphasis and pre-shoot values and adjusts the eye height to
obtain the desired BER (slightly above 1e-9). Then, it retains the initial
pre-shoot and performs a de-emphasis scan, measuring the BER for every
de-emphasis value. After that, it retains the initial de-emphasis amplitude
and makes a pre-shoot scan. Finally, the test shows the result tables, one
for the de-emphasis scan and one for the pre-shoot scan. The results let
you see the best combination with the initial values that were selected.
Figure 63 and Figure 64 show the connection diagram for ASIC Rx
Pre-shoot De-Emphasis Scan for M8040A and M8020A, respectively.
Eye Parameter
• Scan Order
• Initial De-Emphasis
• Initial Pre-shoot
• Force Retraining at each Preset
De-Emphasis Variation
• Stop De-Emphasis
• De-Emphasis Step Size
BER Measurement
• BER Mode
• Target BER
Pre-Shoot Variation
• Start Pre-shoot
• Stop Pre-shoot
• Pre-shoot Step Size
Equalization for remaining Rx Tests
• Allow user to enter optimum equalization for remaining Rx tests
Parameters”.

Result Description
Figure 65 Result for 8.0 GT/s ASIC Rx De-Emphasis Scan
• x-column [dB]: The de-emphasis level added to the signal at each step.
• BER for De-Emphasis Scan: The BER measured at each step.
Figure 66 Result for 8.0 GT/s ASIC Rx Pre-Shoot Scan
• x-column [dB]: The pre-shoot level added to the signal at each step.
• BER for Pre-Shoot Scan: The BER measured at each step.
8G Rx Stressed Jitter Eye Test
Purpose and Method
This test verifies that the receiver meets the eye width specification. Eye
width is set to the minimum of the specification, which is 37.5ps, and the
eye height must be between 22.5 and 27.5mVpp.
Eye width is generated by adding the combination of Random Jitter and
DMSI that also gets as close as possible to the desired eye height. Launch
Voltage is fixed to the value used in Stressed Jitter Eye Calibration. Then,
the BER test is performed for different frequencies and amplitudes of the
sinusoidal jitter.
Stressed Jitter Eye Test for M8040A and M8020A, respectively.

• Enable Impairments for Loopback Training
• Eye Height
• Eye Width
• Random Jitter: The amount of RJ added to the signal that, in
combination with the DMSI, generates an eye with the desired eye
width.
• Sinusoidal Jitter: The amount of SJ added to the signal. For 100MHz, it
is fixed to the value used in the Stressed Jitter Eye Calibration. To
change the value, it is necessary to repeat that calibration.
• Differential Mode Sinusoidal Interference: The amount of DMSI added
to the signal that, in combination with the RJ, creates an eye with the
desired eye width.
• Generator Launch Voltage: The Launch Voltage added to the signal. It
cannot be changed; it is fixed to the value used in the Stressed Jitter
Eye Calibration.
Parameter
BER Measurement
• BER Mode
• Target BER
Parameters”.

• 8G Stressed Jitter Eye Calibration on page 119.
Result Description
Figure 69 Result for 8.0 GT/s ASIC Rx Stressed Jitter Eye Test
• Result: “Pass”/“Fail”, if the BER test at a specific frequency is passed,

the value is “Pass” otherwise “Fail”.
• SJ Frequency: The sinusoidal jitter frequency set at each step.
• SJ Amplitude: The sinusoidal jitter amplitude set at each step.
• Allowed Bit Errors: The maximum number of allowed errors to consider
the BERT test as a Pass.
• Measured Bit Errors: The number of bit errors that occurred during the
test.
8G Rx Jitter Tolerance Test
Purpose and Method
The Rx Jitter Tolerance Test determines how much jitter a DUT can
tolerate at different SJ frequencies.
The test procedure applies a search algorithm that is sequentially used
over a range of jitter frequencies. The range of frequencies to be tested is
defined with the “Frequency Mode” property. At each jitter frequency
value, the maximum jitter amplitude where the DUT produced no more bit
errors than the Number of Allowed Bit Errors is stored as the max. passed
jitter value. The result is a curve that shows the maximum jitter that the
DUT can tolerate over the SJ frequency.
There are different methods to find the maximum passed jitter amplitude.
It can be selected with “search algorithm” parameters, such as: Binary,
Linear, Linear with two sizes, Linear with Hysteresis or Logarithmic.
fails.
Figure 70 and Figure 71 show the connection diagram for ASIC Rx Jitter
Tolerance Test for M8040A and M8020A, respectively.

• Frequency Mode
• Frequency Scale
• Start frequency
• Stop frequency
• Frequency Steps

Parameter
• Random Jitter
BER Measurement
• BER Mode
• Target BER
Parameters”.

Result Description
Figure 72 Result for 8.0 GT/s ASIC Rx Jitter Tolerance Test

• SJ Frequency: The value of SJ frequency applied to the test signal.
• Min Failed Jitter: The first value of SJ amplitude where the DUT didn’t
pass the BER test at a specific frequency.
• Max Passed Jitter: The maximum value of SJ that the DUT can tolerate
at a specific SJ frequency.
• Jitter Capability: The maximum value of jitter that the test setup can
generate at a specific SJ frequency.
Link Equalization Transmitter Tests
Common Parameters for Link Equalization Transmitter Tests
• Scope connection for Link EQ Tx Tests

• Generator Output Voltage Compensation
• Skip BER Check
Loopback Training
• Link EQ Tx Test Script File
Error Detector
• Sensitivity
on page 50.
8G LEQ Tx Initial Preset Compliance Test
Purpose and Method
This test is valid for End Point DUTs (or addInCards or devices) only. It uses
the interactive link training feature of the JBERT.
The JBERT runs the link training, setting several initial equalization
transmitter presets on the DUT and skipping the link equalization phase.
Once the DUT is in loopback, the DUT signal is captured and analyzed to
check whether or not the DUT is using the preset requested by the JBERT.
Figure 73 Setup for 8.0GT/s ASIC LEQ Tx Tests M8040A
Result Description
Figure 75 Result for 8.0 GT/s ASIC LEQ Tx Initial Preset Compliance Test
• Result: The measured Pre-Shoot and De-Emphasis must be within the

specification limits.
• DUT Initial Preset: Set by the JBERT.
• Pre-Shoot [dB]: Measured Pre-Shoot on the DUT waveform.
• Min Spec PS [dB]: Pre-Shoot lower specification limit.
• Max Spec PS [dB]: Pre-Shoot upper specification limit.
• De-Emphasis [dB]: Measured De-Emphasis on the DUT waveform.
• Min Spec DE [dB]: De-Emphasis lower specification limit.
• Max Spec DE [dB]: De-Emphasis upper specification limit.
• Comment: A comment can be added to each test step if fails,
explaining the reason.
8G LEQ Tx Response Time Compliance Test
Purpose and Method
This test uses the interactive link training feature of the JBERT to train the
DUT into loopback mode, running the link equalization phase completely.
A certain initial transmitter preset is set to the DUT. A successful link
training raises an event, which is used to capture the waveforms of the
JBERT and the DUT. At that moment, the captured waveform from the
JBERT contains the preset change request and the waveform from the
DUT contains the acknowledgment of that request. Additionally, waveform
from the DUT also contains the physical transition from the initial
transmitter preset to the requested preset.
The captured data is decoded and two time-spans are calculated: one
between the request and the acknowledgment, and other between the
request and the electrical transition.
Finally, once the DUT is in the loopback mode, a similar preset
measurement is performed for the Initial Preset.
The test is divided in two parts. In the first part, the JBERT requests for
transmitter presets. In the second part, the JBERT requests the
pre-cursor, cursor and post-cursor reported by the DUT.
For End Point DUTs (or AddInCards or devices), the initial transmitter
preset is set by the JBERT. For RootComplex DUTs (or Systems or Hosts),
you must manually set the DUT initial transmitter preset.
Parameter
• Max Number of Retries: If the acquired data cannot be decoded, the
link training can be repeated to get new data.
• Scope visible range: Waveform range, used at the moment when the
link equalization phase is performed.
Oscilloscope
• Scope Horizontal Range
• Scope Request Vertical Range
• Scope Response Vertical Range
Result Description
Figure 78 Result for 8.0 GT/s ASIC LEQ Tx Response Time Compliance
• Result: Max. passed Jitter should be bigger than Min. Specification.

• DUT Target Preset: The transmitter preset that is requested to the DUT
at each step.
• Electrical response time [ns]: The calculated timespan between the
request from the JBERT and the physical preset transition on the DUT
waveform.
• Protocol response time [ns]: The calculated timespan between the
request from the JBERT and the acknowledgment.
• Pre-Shoot [dB]: The measured Pre-Shoot on the DUT waveform.
• Min Spec ps [dB]: The pre-Shoot lower specification limit.
• Max Spec ps [dB]: The pre-Shoot upper specification limit.
• De-Emphasis [dB]: The measured De-Emphasis on the DUT waveform.
• Min Spec DE[dB]: The De-Emphasis lower specification limit.
• Max Spec DE[dB]: The De-Emphasis upper specification limit.
• Comment: A comment can be added to each test step.
• Reference Clock

on page 50.
8G Rx Stressed Jitter Eye Setup
Purpose and Method
The purpose of this procedure is to configure the data generator with the
parameters that are required in the Stressed Jitter Eye Rx. The set
parameters are the differential amplitude, random jitter, common mode
sinusoidal interference jitter and differential mode sinusoidal interference.

• Eye Height
• Eye Width
width.
• Sinusoidal Jitter: The amount of SJ added to the signal. It cannot be
changed; it is fixed to the value used in the Stressed Jitter Eye
Calibration. To change the value it is necessary to repeat that
calibration.
desired eye width.
cannot be changed; it is fixed to the value used in the Stressed Jitter
Eye Calibration.

Parameters”.

Result Description
• None
Platform
User Guide

Overview / 164
Link Equalization Receiver Tests / 279
Overview

• Gen 4 Fixture
• Gen4 ISI Adjustment
• Gen4 ASIC Eye Calibration Method
• Start With Minimum Loss Channel
• Scope Connection for Calibration
Purpose and Method
This procedure calibrates the De-Emphasis, Pre-shoot and DC amplitude

at TP1.


TP1.

• EQ Calibration Pattern
Generator
• Set Amplitude
Oscilloscope
• Scope Bandwidth
Parameters”.
Result Description (similar to that for 8.0GT/s ASIC Calibrations)


Figure 87 Result for 16.0 GT/s TxEQ and Launch Voltage Cal (Launch Voltage)

generator.
Purpose and Method

The measurement is done using a real-time oscilloscope
RJ/DJ-separation software EZJIT or the SigTest Application.

TP1.

Generator
• Pre-shoot
• De-Emphasis
• Generator Voltage
Oscilloscope
• Scope Bandwidth
• Number of UIs
Parameters”.
Figure 92 Result for 16.0 GT/s ASIC Random Jitter Calibration

16G LF SJ Calibration
Purpose and Method
This procedure calibrates the sinusoidal jitter amplitude for a set of low
frequencies (200KMHz, 500KHz, 1MHz, 2MHz and 4MHz).
The test automation starts with small SJ amplitude and increases that
measures the actual sinusoidal jitter for all the frequencies. The
measurement is done using a real-time oscilloscope RJ/DJ-separation
software EZJIT or the SigTest Application.
during measurements to adjust the SJ amplitude to the desired output SJ
amplitudes.
TP1.

Generator
• Pre-shoot
• De-Emphasis
Oscilloscope
• Scope Bandwidth
• Number of UIs
Parameters”.
Result Description
Figure 97 Result for 16.0 GT/s ASIC LF SJ Calibration
• Set SJ: The SJ jitter amplitude set in the instrument.

• SJ (x frequency): The measured sinusoidal jitter amplitude for the set SJ
amplitude and frequency.
16G HF SJ Calibration
Purpose and Method
This procedure calibrates the sinusoidal jitter amplitude for a set of high
frequencies (5MHz, 10MHz and 100MHz).
amplitudes.
TP1.

Generator
• Pre-shoot
• De-Emphasis
Oscilloscope
• Scope Bandwidth
• Number of UIs
Parameters”.
Result Description
Figure 102 Result for 16.0 GT/s ASIC HF SJ Calibration

16G Unit Interval Calibration
Purpose and Method
This procedure is only required when the SigTest software is used. It

measures the unit interval of the signal.
The test automation sends a clean signal without adding any jitter sources.
Then, the actual unit interval is measured with the oscilloscope.
to measure eye height and eye width with SigTest.
TP1.

Generator
• Pre-shoot
• De-Emphasis
Oscilloscope
• Scope Bandwidth
• Number of UIs
Parameters”.
Result Description
Figure 107 Result for 16.0 GT/s ASIC Unit Interval Calibration
• Mean Unit Interval [ps]: The unit interval measured.
16G TxEQ and Launch Voltage Measurement
Purpose and Method
This procedure sets the calibrated Differential Voltage, Pre-Shoot and

De-Emphasis values at TP1 and re-measure them. The measurement can
be repeated as many times as a new impairment combination is selected.
The procedure is useful to check if the TxEQ and Launch Voltage
Calibration is correct and the desired values at TP1 can be achieved.
It is only available in “Expert Mode” when the “Include Advanced
Measurement” option is selected. To set this option, refer to PCIe
Parameters on page 50.
TP1.

Generator
• Pre-shoot
• De-Emphasis
Oscilloscope
• Scope Bandwidth
• Number of UIs
Parameters”.

Result Description
Figure 112 Result for 16.0 GT/s ASIC Tx EQ and Launch Voltage Measurement
• Pre-Shoot [dB]: The pre-shoot value set at the signal generator.

• De-Emphasis [dB]: The de-emphasis value set at the signal generator.
• Generator Voltage [mV]: The generator voltage value set at the signal
generator.
• Measured Pre-Shoot [dB]: The pre-shoot measured with the scope.
• Measured De-Emphasis [dB]: The de-emphasis measured with the
scope.
• Measured Differential Voltage [dB]: The generator measured with the
scope.
Purpose and Method
must be in a well-defined range. This procedure calibrates the insertion
loss for different hardware traces.
If the “Measurement Method” parameter is set to 'VNA (manual)', the
procedure does not perform any measurement. At the beginning of the
calibration, it is necessary to specify the variable ISI pair numbers that
generate a channel loss of -27dB, -28dB and -30dB, respectively. In this
case, the var. ISI pair number for the certain channels must be determined
manually by a VNA. The package loss must be added to VNA IL value. With
these values, the procedure calculates for every ISI trace the insertion loss
from 1GHz to 8GHz with steps of 100MHz. This is the default and the
recommended method.
If the “Measurement Method” parameter is set to 'Step Response', the test
automation calibrates several traces given by the parameters “Trace
Number Start Value” and “Trace Number Stop Value”. For every ISI trace,
the insertion loss is measured from 1GHz to 8GHz with steps of 100MHz.
The Insertion Loss is measured using the Seasim software.
to evaluate the optimum ISI trace for the Rx tests.
A compensation of -1.0dB is applied at 8GHz because of 1m length SMA

NOTE cable connected to the generator. This cable counts per CTS to the total
channel loss but the calibration reference point is located after that
cable. Therefore, the cable is not included in the step regarding insertion
loss measurement and the cable’s insertion loss must be added after the
measurement.
channel calibrations.
If the Measurement Method is set as ‘Step Response’, the following
connection setup is required. At each step, the software prompts to
increase the hardware trace. If ‘VNA Method’ is set, no connections are
needed.

• Measurement Method
• Automatic Trace Selection
• Generator Cable Loss
• Trace Loss Increment
• Trace Number Start Value
• Trace Number Stop Value
• Save Calibration Data
Oscilloscope
• Scope Bandwidth
Variable ISI pairs
• CBB Var. ISI pair -27dB

Result Description
Figure 115 Result for 16.0 GT/s ASIC Insertion Loss Calibration
• Frequency [GHz]: The frequency where the insertion loss is measured.

• Insertion Loss (Trace X) [dB]: Insertion Loss measured at each
frequency when trace X is selected.
16G ISI Adjustment Calibration
This calibration is available with the M8020A setup only.

NOTE
Purpose and Method
If the M8020A internal ISI feature is available, the emulated ISI can be
combined with the hardware traces to adjust the desired insertion loss.
The test automation calibrates several internal traces given by the
parameters “ISI M8020A Start Value” and “ISI M8020A Stop Value”.
For every M8020A ISI trace, the insertion loss is measured from 1GHz to
8GHz with steps of 100MHz. The insertion loss is measured using the
Seasim software.
to evaluate the optimum internal ISI for the Rx tests.
Generator
• ISI from M8020A Start Value
• ISI form M8020A Stop Value
• Trace Number
Oscilloscope
• Scope Bandwidth
Variable ISI pairs
Parameters”.

Result Description
Figure 117 Result for 16.0 GT/s ASIC ISI Adjustment Calibration

• Insertion Loss (X_ISI) [dB]: Insertion Loss measured at each frequency
for X dB of insertion loss.
16G Initial Equalization Preset Optimization
Purpose and Method
This procedure measures the Eye-Height and Eye-Width for each Tx

equalization preset. When the “Start with minimum loss channel” option is
not selected in the Configure DUT dialog, the measurement is performed
with a channel loss of -30dB. When the “Start with minimum loss channel”
option is selected, the measurement is performed with a channel loss of
-27dB.
Depending on the Eye Cal Method selected, the eye measurement is
performed either with Seasim or with SigTest software.
With Seasim, a step is applied at the input of the calibration channel and
the step response is captured at the output of the replica channel. The
oscilloscope averages the step response, which minimizes noise. With the
step response, the complete electrical behavior of the channel is defined.
With this data, a statistical eye can be calculated. The different
impairments are simulated by Seasim.
With SigTest, a compliance pattern is applied and the different
impairments like random jitter, sinusoidal jitter and differential and
common mode sinusoidal inference are added to the signal.
The calibration data is stored in a Cal-table. This calibration data is used in
the Channel calibration to set the preset that gets the largest eye.
channel calibrations. The hardware trace is set to either the one that gives
the maximum loss channel (if “Start with minimum loss channel” is
unchecked) or the one that gives the minimum loss channel (if “Start with
minimum loss channel” option is checked).

• Equalization Preset Range: The set of presets values that are calibrated.
• CTLE Start Value
• CTLE Stop Value
Generator
• DMSI
• CMSI
• Random Jitter
Oscilloscope
• Scope Bandwidth
• Number of UIs
Channel
• Trace Number
• ISI from M8020A
• Total Channel Loss
Parameters”.

• 16G ISI Adjustment Calibration on page 203.
Result Description
Figure 120 Result for 16.0 GT/s ASIC Initial Eq. Preset Optimization (Eye height)
• Set Equalization Preset: The equalization preset selected.

• Measured Eye Height [mV]: The measured Eye-Height for each preset.
Figure 121 Result for 16.0 GT/s ASIC Initial Eq. Preset Optimization (Eye width)

• Measured Eye Width [mV]: The measured Eye-Width for each preset.
16G Channel Calibration
Purpose and Method
This procedure searches for the calibration channel loss that gets an eye
closest to the target.
When the “Start with Minimum Loss Channel” option is not selected in the
“Configure DUT” dialog, the hardware trace is set to achieve -30dB at
8GHz and the Tx EQ preset to the value that gets the largest eye. Then, at
each step, the channel loss is decreased by 0.5dB and the eye measured
until the eye width and the eye height exceed the target, or until the
insertion loss at 8GHz reaches the minimum of -27dB.
When the “Start with Minimum Loss Channel” option is selected, the
hardware trace is set to achieve -27dB at 8GHz and the Tx EQ preset to
the value that gets the largest eye. Then, at each step, the channel loss is
increased and the eye measured until either the eye width or the eye
height have fallen below the target, or until the insertion loss at 8GHz
reaches the -30dB.
If the “Emulated ISI option” is selected, the channel loss is increased by
changing the internal M8020A ISI traces. If not, the procedure increases
the hardware ISI trace number.
evaluate the optimum ISI trace for the Rx tests.
minimum loss channel” option is checked). Note that for each step, you
are required to change the hardware trace until the optimum channel is
found.

• CTLE Stop Value
Generator
• DMSI
• CMSI
• Random Jitter
Oscilloscope
• Scope Bandwidth
• Number of UIs
Channel
• Trace Number
• ISI from M8020A
Parameters”.

Result Description
Figure 124 Result for 16.0 GT/s ASIC Channel Calibration (Eye height)
• Set Trace Number: The tested trace number.

• Measured Eye Height: The measured Eye Height value for each trace
number.
Figure 125 Result for 16.0 GT/s ASIC Channel Calibration (Eye width)

• Measured Eye Width: The measured Eye Width value for each trace
number.
16G DMSI Calibration
Purpose and Method

oscilloscope.
calibrations. The hardware trace is set to the optimal number according to
the Channel Calibration.

Oscilloscope
• Scope Bandwidth
Channel
• Trace Number
• ISI from M8020A
Parameters”.

Figure 128 Result for 16.0 GT/s ASIC DMSI Calibration

oscilloscope.
16G CMSI Calibration
Purpose and Method

generator can generate. For each step, the procedure measures the actual
CMSI with a real-time oscilloscope.
Figure 129 and Figure 130 show the connection diagrams for the CMSI
calibrations. The hardware trace is set to the optimal number according to

Oscilloscope
• Scope Bandwidth
Channel
• Trace Number
• ISI from M8020A
Parameters”.
Result Description
Figure 131 Result for 16.0 GT/s ASIC CMSI Calibration

16G Final Equalization Preset
Purpose and Method

equalization preset when the channel loss has been adjusted to the
optimum value. Depending on the ‘Eye Cal Method’ selected, the eye
measurement is performed with Seasim or SigTest software.
Then, in further procedures, this calibration is used to set the preset that
helps in obtaining the largest eye.
channel calibrations. The hardware trace is set to the optimal number
according to the Channel Calibration.

• Use Calibration data from 16G Initial Equalization Preset Optimization.
• CTLE Stop Value
Generator
• DMSI
• CMSI
• Random Jitter
Oscilloscope
• Scope Bandwidth
• Number of UIs
Channel
• Trace Number
• ISI from M8020A
Parameters”.

Result Description
Figure 134 Result for 16.0 GT/s ASIC Final Equalization Preset (Eye height)
• Set Equalization Preset: The set equalization preset value in the

instrument.
• Measured Eye Height: The measured Eye Height value for each step.
Figure 135 Result for 16.0 GT/s ASIC Final Equalization Preset (Eye width)

instrument.
• Measured Eye Width: The measured Eye Width value for each step.
16G Pre-Compliance Eye Calibration
Purpose and Method
This procedure measures the effects on the Eye-Height and Eye-Width

caused by changes made to each impairment (SJ, DMSI and Launch
Voltage) individually.
The calibration measures the eye in four situations:
1 all the impairments are set to the nominal values;
2 the DMSI is set to the maximum value allowed by the specifications;
3 the SJ is set to the maximum specification amplitude;
4 the differential voltage is set to the minimum spec level.
At each step, the eye is measured either with the Seasim or with the
SigTest software.
The calibration data is stored in a Cal-table. This Calibration data is used in
the Compliance Eye Calibration to calculate DMSI, SJ and Vdiff
adjustment to meet the target eye.

• CTLE
Generator
• Pre-shoot
• De-Emphasis
• CMSI
• Random Jitter
Oscilloscope
• Scope Bandwidth
• Number of UIs
Channel
• Trace Number
• ISI from M8020A

Parameters”.

• 16G HF SJ Calibration on page 184.
Result Description
Figure 138 Result for 16.0 GT/s ASIC Pre-Compliance Eye Calibration
• DMSI: The amount of DMSI set using the calibrations.

• SJ: The amount of SJ set using the calibrations.
• Vdiff: The amount of differential voltage set using the calibrations.
• Eye Height: The measured eye height.
• Eye Width: The measured eye width.
16G Compliance Eye Calibration
Purpose and Method
This calibration searches for the optimum combination of DMSI, SJ and

Launch Voltage values to generate an eye with the closest possible
Compliance Eye-Height and Eye-Width.
In the first step, the eye is measured when the impairments are set to the
nominal values. Then, a search algorithm is used to re-calculate the
optimum amount of SJ, DMSI and Vdiff. This process is repeated until the
eye is in the middle of the specifications or until the “Max number of
Search Steps” is reached.
If the automatic search does not find a suitable combination of
impairments that generates an eye within the specifications (EH between
14 and 16mV and EW between 18.5 and 19ps), it is possible to perform a
manual search by manually setting the SJ, DMSI and Vdiff values.

• Adjust Vdiff
• Max Number of Search: Maximum number of times that the optimal eye
is searched automatically.
• Use nominal EH/EW results from Pre-Compliance Cal: If set to 'True',
the measurement in the first step is skipped and the eye result is
directly copied from the 16G Pre-Compliance Eye Calibration.
• CTLE
Generator
• Pre-shoot
• De-Emphasis
• CMSI
• Random Jitter
Oscilloscope
• Scope Bandwidth
• Number of UIs
Channel
• Trace Number
• ISI from M8020A
Parameters”.

Result Description
Figure 141 Result for 16.0 GT/s ASIC Compliance Eye Calibration

16G Eye-Height and Width Measurement
Purpose and Method
This procedure measures the Eye-Height and Eye-Width for the selected
signal impairments.
The Differential Voltage, Pre-Shoot, De-Emphasis, DMSI, Random and
Sinusoidal jitter values can be defined. The eye is measured each time a
new impairment combination is selected.
This measurement is available only in ‘Expert Mode’ when the “Include
Advanced Measurement” option is selected. To set this option, refer to
PCIe Parameters on page 50.
Generator
• Pre-shoot
• De-Emphasis
• Differential Voltage
• Differential Mode Interference
• Random Jitter
Oscilloscope
• Scope Bandwidth
• Number of UIs
• SigTest Template for EH/EW Measurements
• Add SigTest Results Details
• CTLE
Channel
• Trace Number
• ISI from M8020A
Parameters”.

16G Eye-Height and Width Scan
Purpose and Method
This procedure measures the Eye-Height and Eye-Width for a scan of one
or more impairments.
The “Loop levels” property determines the number of impairments to scan.
For each loop, it is necessary to specify the impairment type and define the
range to scan. Then, the test automation combines the defined loops and
the eye is measured at each step.

• Loop Levels: The number of impairments to scan.
• Show Plots
• Equalization Mode: If it is set to ‘Presets’, you may choose the
equalization presets to scan. If it is set to ‘Custom Values’, you may
choose the Pre-Shoot and De-Emphasis values to scan.
Loop
• Scan Parameter: The impairment that must be scanned. It can be
selected as:
• Equalization Preset
• Random Jitter
• CTLE
• ISI
• <Parameter> Start Value: The start value for the scan of the selected
impairment.
• <Parameter> Stop Value: The stop value for the scan of the selected
impairment.
• <Parameter> Scale Type: The scale type of the scan.
• <Parameter> Number of Steps: The number of steps for the scan of the
selected impairment.
Fixed Parameters:
• <Parameter>: For all the parameters that are not scanned, set the fixed
value used in all the steps.
Oscilloscope
• Scope Bandwidth
• Number of UIs
Parameters”.

Receiver Tests


NOTE
• Reference Clock

• Pause before Auto-Align
Loopback Training

• Generator Start Preset Gen4
• DUT Initial Preset Gen4
• DUT Target Preset Gen4
Error Detector
• User Gen3 EIEOS
• Use CDR
• Peaking
• Sensitivity
• Polarity
BER Measurement
• Relax Time
Common Parameters specific for Lanes
• Use Preset
• Generator Preset
• Pre-shoot
• De-Emphasis
on page 50.
Purpose and Method

Figure 146 and Figure 147 show the connection diagram for ASIC
endpoints for M8040A and M8020A, respectively. Note that the setup can
differ depending on the clock architecture and external reference clock
selections.
connection.
Loopback Training
• Force Retraining at each BER measurement
• Pre-shoot used for LB Training
• De-Emphasis used for LB Training
• Maximum Boost
• Start Pre-Shoot
BER Measurement
• BER Mode
• Target BER
Impairments
• Residual SSC
• Random Jitter
• 2nd Tone Jitter Frequency
Channel
• Trace Number
• ISI from M8020A
• Allow user to enter optimum equalization for remaining Rx tests:
Controls the appearance of a window at the end of the test, which lets
you set the pre-shoot and de-emphasis values to be used for the
following tests.
Parameters”.

• 16G Compliance Eye Calibration on page 243.
Figure 148 Result for 16.0 GT/s ASIC Rx EQ Coefficient Matrix Scan

Purpose and Method

Pre-shoot De-Emphasis Scan for M8040A and M8020A, respectively. Note
that the setup can differ depending on the clock architecture and external
reference clock selections.
Pre-Shoot Variation
• Start Pre-shoot
• Stop Pre-shoot
Parameter
• Scan Order
BER Measurement
• BER Mode
• Target BER
Impairments
• Residual SSC
• Random Jitter
• 2nd Tone Jitter Frequency
Channel
• Trace Number
• ISI from M8020A
Parameters”.

Figure 151 Result for 16.0 GT/s ASIC Rx De-Emphasis Scan
Figure 152 Result for 16.0 GT/s ASIC Rx Pre-Shoot Scan
16G Rx Stressed Jitter Eye Test
Purpose and Method
This test verifies that the DUT properly functions in presence of the
compliance eye defined in the specification.
The target eye height and eye width is generated by adding the optimum
combination of Differential Mode Sinusoidal Interference, Sinusoidal Jitter
and Launch Voltage. Random Jitter and Common Mode Sinusoidal
interference are fixed to the nominal values. Then, the BER test is
performed for different frequencies and amplitudes of the sinusoidal jitter.
Stressed Jitter Eye Test for M8040A and M8020A, respectively. Note that
the setup can differ depending on the clock architecture and external

• BER Mode
• Target BER
Parameter
Impairments
• Residual SSC
• Random Jitter: The random Jitter is fixed to 1ps.
• 2nd Tone Sinusoidal Jitter: The amount of SJ added to the signal is
fixed to 6.25ps. If it is required to add more jitter to adjust the Rx eye,
that amount is added to the 2nd tone of SJ. If it is required to reduce
the jitter, that amount is subtracted from the RJ.
• Differential Mode Sinusoidal Interference: The amount of DMSI that

must be added to achieve the desired eye height and eye width.
• Generator Launch Voltage: The amount of differential amplitude that
Channel
• Trace Number
• ISI from M8020A
Link Training
Parameters”.

Figure 155 Result for 16.0 GT/s ASIC Rx Stressed Jitter Eye Test

test.
Purpose and Method
fails.
Figure 156 and Figure 157 show the connection diagram for ASIC Rx Jitter
Tolerance Test for M8040A and M8020A, respectively. Note that the setup
can differ depending on the clock architecture and external reference
clock selections.

• Frequency Mode
• Frequency Scale
• Start frequency
• Stop frequency
• Frequency Steps

Parameter
BER Measurement
• BER Mode
• Target BER
Impairments
• Jitter Eye Adjustment Mode: If ASIC, either a 2nd tone of SJ or RJ
reduction is used to adjust to the target EH and EW. SJ is set to the
nominal. If CEM, the 1st tone of SJ is used to adjust to the target EH
and EW. RJ stays at nominal and 2nd tone is off. SJ is set to the level
from the 16G Compliance Eye Calibration.
• Residual SSC
• Random Jitter
• 2nd Tone Sinusoidal Jitter
Channel
• Trace Number
• ISI from M8020A
Link Training
Parameters”.


Figure 158 Result for 16.0 GT/s ASIC Rx Jitter Tolerance Test

Link Equalization Receiver Tests
Common Parameters for Link Equalization Receiver Tests


Loopback Training
• Interactive Training Script File
• Use Custom Training Voltage
Error Detector
• User Gen3 EIEOS
• Use CDR
• Peaking
• Sensitivity
• Polarity
BER Measurement
• Relax Time
on page 50.
16G LEQ Rx Stressed Jitter Eye Test
Purpose and Method
This test uses the interactive link training feature of the JBERT to let the
DUT negotiate the generator transmitter preset that shall be used.
Once the equalization training is finished and the DUT is in loopback
mode, the test behaves in the same manner as the Rx Stressed Jitter Eye
Test. See 16G Rx Stressed Jitter Eye Test on page 267.
16G LEQ Rx Jitter Tolerance Test
Purpose and Method
mode, the test behaves in the same manner as the Rx Jitter Tolerance
Test. See 16G Rx Jitter Tolerance Test on page 272.

• Skip BER Check
Loopback Training
Error Detector
• Use Gen 3 EIOS
• Sensitivity
on page 50.
Purpose and Method
Connection Diagram

Purpose and Method
Connection Diagram
Parameter
Oscilloscope
Figure 164 Result for 16.0 GT/s ASIC LEQ Tx Response Time Compliance

at each step.
waveform.
• Reference Clock
• Use Preset
• Pre-shoot
• De-Emphasis
on page 50.
16G Rx Stressed Jitter Eye Setup
Purpose and Method
parameters that are required in the Stressed Jitter Eye Rx. The set
parameters are the differential amplitude, random jitter, common mode
sinusoidal interference jitter and differential mode sinusoidal interference.
endpoints for M8040A and M8020A, respectively.
Figure 165 Setup for 16.0GT/s ASIC Receiver Setup Tests M8040A
Figure 166 Setup for 16.0GT/s ASIC Receiver Setup Tests M8020A
Parameter
Impairments
• Residual SSC
width.
• 2nd Tone Sinusoidal Jitter: The amount of SJ added to the signal. It
cannot be changed; it is fixed to the value used in the Compliance Eye
Calibration. To change the value, it is necessary to repeat that
calibration.
desired eye width.

cannot be changed; it is fixed to the value used in the Compliance Eye
Calibration.
Channel
• Trace Number
• ISI from M8020A
Parameters”.

Result Description
• None
Platform
User Guide

Overview / 296
Overview
• Gen 5 ASIC Eye Calibration Method: Read-only parameter that shows

the software method used for the jitter measurements. This parameter
can be changed in the “PCIe Parameters” dialog.
• Scope Connection for Calibration: Select the scope connection as
‘Direct Connect’ or ‘RealEdge’.
Purpose and Method

at TP1.

Figure 167 and Figure 168 show the connection diagrams for calibrations
at TP1.
Figure 167 Setup for 32GT/s ASIC Calibrations at TP1, M8040A
Generator
• Set Amplitude
Oscilloscope
• Scope Bandwidth
Parameters”.
Figure 169 Result for 32GT/s TxEQ and Launch Voltage Calibration (Pre-shoot)

Figure 170 Result for 32 GT/s TxEQ and Launch Voltage Calibration (De-Emphasis)

Figure 171 Result for 32GT/s TxEQ and Launch Voltage Cal (Launch Voltage)

generator.
Purpose and Method

at TP1.
Generator
• Pre-shoot
• De-Emphasis
Oscilloscope
• Scope Bandwidth
• Number of UIs
Parameters”.
Figure 174 Result for 32GT/s ASIC Random Jitter Calibration

32G HF Sinusoidal Jitter Calibration
Purpose and Method
amplitudes.
at TP1.

• TP1 Voltage
Oscilloscope
• Scope Bandwidth
• Number of UIs
Parameters”.
Figure 177 Result for 32GT/s ASIC HF SJ Calibration

Purpose and Method

Measurement” option is selected. To set this option, refer to PCIe
at TP1.

• TP1 Voltage
• Scope Bandwidth
Parameters”.

Figure 180 Result for 32GT/s ASIC Tx EQ and Launch Voltage Measurement

generator.
scope.
scope.
Purpose and Method
By default, the “Measurement Method” parameter is set to 'VNA (manual)'.
The procedure does not perform any measurement. At the beginning of
the calibration, it is necessary to specify the variable ISI pair numbers that
recommended method.
No connections are needed for this calibration.

Oscilloscope
• Scope Bandwidth
Variable ISI pairs
• Var. ISI Trace -34dB Channel

Figure 181 Result for 32GT/s ASIC Insertion Loss Calibration

Purpose and Method

not selected in the “Configure DUT” dialog, the measurement is performed
-34dB.
minimum loss channel” option is checked).
Figure 182 Setup for 32GT/s ASIC Calibrations Long Channel M8040A

• Equalization Preset Range
• DMSI
• CMSI
• Random Jitter
• Scope Bandwidth
• Number of Waveforms
• Capture Mode
• Trace Number
• Optimize CTLE
Parameters”.

• 32G HF Sinusoidal Jitter Calibration on page 308.
Figure 184 Result for 32GT/s ASIC Initial Eq. Preset Optimization (Eye height)

Figure 185 Result for 32GT/s ASIC Initial Eq. Preset Optimization (Eye width)

Purpose and Method
reaches the -34dB.
minimum loss channel” option is checked). Note that for each step, you
are required to change the hardware trace until the optimum channel is
found.

• Equalization Preset Range
• DMSI
• CMSI
• Random Jitter
• Scope Bandwidth
• Capture Mode
• Trace Number
• Optimize CTLE

Parameters”.

Figure 188 Result for 32GT/s ASIC Channel Calibration (Eye height)

number.
Figure 189 Result for 32GT/s ASIC Channel Calibration (Eye width)

number.
32G AWG Amplitude Correction Calibration
Purpose and Method
This procedure calibrates the correction factor of the AWG.

The test automation measures the amplitude of each channel at TP2 with
the oscilloscope when the AWG corrector factor is set to 1. With the
measured values, the new correction factor is calculated.
based on Channel Calibration.

• Scope Bandwidth
• Trace Number
Parameters”.

• 32G Channel Calibration on page 326.
Result Description
Figure 192 Result for 32GT/s ASIC AWG Amplitude Correction Calibrations
• Amplitude Correction Factor: The corrector factor that must be applied

to the data channels of the AWG.
32G DM Sinusoidal Interference Calibration
Purpose and Method

oscilloscope.

Oscilloscope
• Scope Bandwidth
Channel
• Trace Number
Parameters”.


• 32G AWG Amplitude Correction Calibration on page 334.
Result Description (similar to that for 8.0GT/s and 16.0GT/s ASIC Calibrations)
Figure 195 Result for 32GT/s ASIC DMSI Calibration

oscilloscope.
32G CM Sinusoidal Interference Calibration
Purpose and Method


Oscilloscope
• Scope Bandwidth
Channel
• Trace Number
Parameters”.

Figure 198 Result for 32GT/s ASIC CMSI Calibration

32G Final Equalization Preset Optimization
Purpose and Method


• Use Cal data from 32G Initial Equalization Preset Optimization
Generator
• DMSI
• CMSI
• Random Jitter
Oscilloscope
• Scope Bandwidth
Capture
• Capture Mode
Channel
• Trace Number
Seasim
• Optimize CTLE
Parameters”.

• 32G TxEQ and Launch Voltage Measurement on page 312.
• 32G DM Sinusoidal Interference Calibration on page 337.
• 32G CM Sinusoidal Interference Calibration on page 342.
Figure 201 Result for 32GT/s ASIC Final Equalization Preset (Eye height)

instrument.
Figure 202 Result for 32GT/s ASIC Final Equalization Preset (Eye width)

instrument.
Purpose and Method

SigTest software.
Generator
• Pre-shoot
• De-Emphasis
• CMSI
• Random Jitter
Oscilloscope
• Scope Bandwidth
Capture
• Capture Mode
Channel
• Trace Number

Seasim
• Optimize CTLE
Parameters”.

Figure 205 Result for 32GT/s ASIC Pre-Compliance Eye Calibration

Purpose and Method

13.5 and 16.5mV and EW between 9.35 and 9.4ps), it is possible to
perform a manual search by manually setting the SJ, DMSI and Vdiff
values.

• Use nominal EH/EW results from Pre-Compliance Cal: If set to 'True',
Generator
• Pre-shoot
• De-Emphasis
• CMSI
• Random Jitter
Oscilloscope
• Scope Bandwidth
Capture
• Capture Mode
Channel
• Trace Number
Seasim
• Optimize CTLE
Parameters”.

• 32G Pre-Compliance Eye Calibration on page 354.
Figure 208 Result for 32GT/s ASIC Compliance Eye Calibration

Purpose and Method
signal impairments.
Generator
• Pre-shoot
• De-Emphasis
• DMSI
• Random Jitter
Oscilloscope
• Scope Bandwidth
• CTLE
Capture
• Capture Mode
Channel
Seasim
• Optimize CTLE
Parameters”.

Purpose and Method

Loop
selected as:
• Random Jitter
• CTLE
• ISI
impairment.
impairment.
Fixed Parameters:
Oscilloscope
• Scope Bandwidth
• Capture Mode
• Optimize CTLE
Parameters”.

Receiver Tests


NOTE
• Reference Clock
• Sensitivity
Loopback Training
Error Detector
• Use CDR
• Polarity
BER Measurement
• Relax Time
All these parameter are described in detail in the sectionPCIe Parameters
on page 50.
Purpose and Method

endpoints for M8040A and M8020A, respectively. The hardware trace is
set to the optimal number based on Channel Calibration. Note that the
setup can differ depending on the clock architecture and external
connection.
Figure 213 Setup for 32GT/s ASIC Receiver Tests M8040A
Loopback Training
• Maximum Boost
• Start Pre-Shoot
BER Measurement
• BER Mode
• Target BER
Generator
• Pre-shoot
• De-Emphasis
• Common Mode Interference
• Random Jitter
• 2nd Tone Sinusoidal Jitter Frequency
Parameters”.

Figure 215 Result for 32GT/s ASIC Rx EQ Coefficient Matrix Scan

32G Rx Pre-Compliance Test
Purpose and Method
The target eye height and eye width are generated by adding the optimum
combination of Differential Mode Sinusoidal Interference, Sinusoidal Jitter
and Launch Voltage. Random Jitter and Common Mode Sinusoidal
interference are fixed to the nominal values. Then, the BER test is
performed for different frequencies and amplitudes of the sinusoidal jitter.
BER Measurement
• BER Mode
• Target BER
Generator
• Pre-shoot
• De-Emphasis
• Differential Voltage: The differential voltage amplitude set to the signal.
By default, it is set to the value that gets the desired eye.
• Common Mode Interference: The amount of CMSI added to the signal.
By default, it is set to the nominal value (150mV).
• Differential Mode Interference: The amount of DMSI added to the

signal. By default, it is set to the value that gets the desired eye.
• Random Jitter: The amount of RJ added to the signal. By default, it is
set to the nominal value (0.5ps).
• Sinusoidal Jitter: The amount of SJ added to the signal. It is always set
to the nominal value (3.125ps). When the required amount fo SJ for
getting the compliance eye, is below the nominal, the corresponding
difference is subtracted to the RJ component. When the required
amount is above the nominal, thw difference is added to the a second
tone of SJ at 210MHz.
Parameters”.

Figure 218 Result for 32GT/s ASIC Rx Pre-Compliance Test

test.
Purpose and Method
A linear algorithm, defined by “Start Jitter Amplitudes” and “Jitter Linear
Step Sizes” parameters, is used to search the maximum passed jitter
amplitude.

• Frequency Mode
• If one of the options ‘Compliance Frequencies’, ‘User Defined
Frequencies’ or ‘Single Frequency’ is selected, parameter is:
• Jitter Frequencies
• Start frequency value
• Stop frequency value
• Number of Frequency Steps
• Frequency Sweep Scale
• Start jitter amplitude
• Use fixed number of steps
• Number of jitter steps
• Jitter linear step size

Impairments
• RJ Low Pass Jitter Frequency
Parameter
BER Measurement
• BER Mode
• Target BER
Generator
• Pre-shoot
• De-Emphasis
• Random Jitter
Parameters”.

Result Description
Figure 221 Result for 32GT/s ASIC Rx Jitter Tolerance Test

• First Failed: The first value of SJ amplitude where the DUT didn’t pass
the BER test at a specific frequency.
• Last Passed: The maximum value of SJ that the DUT can tolerate at a
specific SJ frequency.
• Setup Capability: The maximum value of jitter that the test setup can
• Manually align error detector sampling point

on page 50.
32G LEQ Rx Compliance Test
Purpose and Method
This tests uses the interactive link training feature of the JBERT to let the
mode, the test behaves in the same manner as the Rx Pre-Compliance
Test. See 32G Rx Pre-Compliance Test on page 377.
Purpose and Method
This tests uses the interactive link training feature of the JBERT to let the
• Once the equalization training is finished and the DUT is in loopback
• Reference Clock
on page 50.
32G Rx Impairments Setup
Purpose and Method
parameters that are required in the Rx Pre-Compliance Test, using the
calibration data saved on the machine where Valiframe is running. The
procedure begins in the same manner as the Rx Pre-Compliance Test but
the entire procedure does not run, only the setup is prepared.
Generator
• Pre-shoot
• De-Emphasis
• Random Jitter
Parameters”.

Result Description
• None
Platform
User Guide
8 2.5 & 5.0 GT/s CEM

Tests
Overview / 394
2.5 & 5.0 GT/s CEM Calibrations / 395
Overview
Common Parameters for 2.5 & 5.0 GT/s CEM Calibrations
Data Rate specific:

• Scope connection for calibrations
2.5 & 5.0 GT/s CEM Tests 8
2.5 & 5.0 GT/s CEM Calibrations
2.5G/5G Random Jitter Calibration
Purpose and Method

Figure 224 Connection Diagram for 2.5 & 5.0 GT/s CEM Calibrations (M8020A)

• None
Result Description (similar to that for 2.5 & 5.0GT/s ASIC Calibrations)
Figure 225 Result for 2.5 & 5.0 GT/s CEM Random Jitter Calibration

• Actual Random Jitter: The measured jitter amplitude.
2.5G/5G De-Emphasis Calibration
Purpose and Method
This procedure calibrates the de-emphasis.

By default, the test automation starts with -6 dB of de-emphasis,
increasing it with a step size of 0.5 dB and measuring the corresponding
de-emphasis for every set value. The calibration ends when the set
de-emphasis is 0 or the measured de-emphasis is above 0dB.
The calibration data is stored in a Cal-table. The calibration must be
performed for Generation 1 and 2 for add-in-cards and systems. These
calibration tables are used during measurements to calculate the
de-emphasis level that must be set on the generator to get the desired
de-emphasis level at the test point.

• Eye Height: The eye height in this procedure.
• Start De-Emphasis: The minimum de-emphasis that is calibrated.
Result Description
Figure 227 Result for 2.5 & 5.0 GT/s CEM De-Emphasis Calibration
• Set De-Emphasis [dB]: The de-emphasis set in the instrument.

• Actual De-Emphasis [dB]: The measured de-emphasis.
2.5G/5G Eye Height Calibration
Purpose and Method
The test fixtures attenuate the data signal. To compensate for the
attenuation, the data signal differential swing is calibrated.
The test automation calibrates five equally-spaced differential voltage
amplitudes. The minimum amplitude is 300mV and the maximum
amplitude is the maximum value that the data generator can generate.
For this calibration, the data generator sends the compliance pattern. It
adds random jitter, ISI, swept sinusoidal jitter (that has undergone sweep)
and CMSI to the signal. For Gen2, it adds high frequency sinusoidal jitter
and SSC residual to the signal. The eye height is measured on the
oscilloscope using horizontal histograms.
ASIC and another one for Gen2 ASIC. During measurements, these
calibration tables are used to adjust the differential voltage amplitude to
the desired eye height.

Parameters”.

• 2.5G/5G De-Emphasis Calibration on page 398.
Figure 229 Result for 2.5 & 5.0 GT/s CEM Eye Height Calibration
• Set Diff Voltage [mV]: The differential voltage amplitude set in the
instrument.
• Measured Eye Height [mV]: The measured eye height amplitude.
Receiver Tests


NOTE

Loopback Training
Error Detector
• Use CDR
• Peaking
• Sensitivity
• Polarity
BER Measurement
• Relax Time
on page 50.
2.5G/5G Rx Compliance Test
Purpose and Method
This test determines if the DUT meets the receiver specifications. The
procedure measures the BER when all jitter types and the eye height are
set to their specification limit values (that is, maximum values for jitter,
minimum value for eye height). In expert mode, these values can be
changed.
Figure 230 Connection Diagram for 2.5 & 5.0 GT/s CEM Receiver Tests (M8020A)
Generator Jitter
• Random Jitter
• SSC Residual
Eye-Height
• Eye-Height
BER Measurement
• BER Mode
• Target BER
Parameters”.

Figure 231 Result for 2.5 & 5.0 GT/s CEM Rx Compliance Test
• Target BER: The target BER that must be achieved.
• BER: The measured BER that has been achieved.
2.5G/5G Rx Jitter Tolerance Test
Purpose and Method
This test procedure searches the maximum sinusoidal jitter, where the
There are different methods to find the jitter tolerance limits. It can be
selected with “search algorithm” parameters, such as: Binary, Linear,
Linear with two sizes, Linear with Hysteresis or Logarithmic.
fails.
The maximum passed value is the last test point that did not return an
error. Each point occurs separately for each frequency.
The Rx Jitter Tolerance Test is available only in Expert Mode.

NOTE

• Frequency Mode
• Frequency Scale
• Start frequency
• Stop frequency
• Frequency Steps

Parameter
Generator
• Random Jitter
• SSC Residual
Eye-Height
• Eye-Height
BER Measurement
• BER Mode
• Target BER
Parameters”.

Figure 233 Result for 2.5 & 5.0 GT/s CEM Rx Jitter Tolerance Test
• Result: Max. passed jitter should be greater than min. specification.

• Sinusoidal Jitter Frequency [MHz]: The tested frequency points.
• Min Failed Total Jitter [ps]: The minimum jitter that failed the test.
• Max Passed Total Jitter [ps]: The maximum jitter that passed the test.
• Jitter Capability Test Setup [ps]: The maximum jitter that the hardware
can generate.
• Measured ISI [ps]: The measured BER.
• Min Spec [ps]: The minimum jitter that has to pass the test to meet the
specification.
• Margin [%]: The margin between the max. passed jitter and the
specification.
2.5G/5G Rx Sensitivity Test
Purpose and Method
This test searches the minimum eye height, where the DUT passes the BER
test. The method starts with “Start Eye Height” and decreases with steps
of “Step Size”. The minimum passed value is the last test point that did not
return an error.
The Rx Sensitivity Test is available only in Expert Mode.

NOTE
Generator Jitter
• Use Jitter
• Random Jitter

• SSC Residual (for 5GT/s)
Eye-Height
• Loopback Training Eye-Height
• Start Eye-Height
• Stop Eye-Height
• Step Size
BER Measurement
• BER Mode
• Target BER
Parameters”.

Figure 235 Result for 2.5 & 5.0 GT/s CEM Rx Sensitivity Test
• Result: It is the min. passed Eye Height measured that should be

smaller than the min. specification.
• Min Passed Eye Height [mV]: It is the smallest eye height at which the
• Min Spec [mV]: It is the smallest eye height at which the DUT has to
pass the BER test to meet the specification.
• Margin [%]: It is the margin between the min. passed Eye Height and
the min. specification.


on page 50.
2.5G/5G Rx Compliance Setup
Purpose and Method

those parameters that are needed in the Rx Compliance Test, using the
calibration data saved on the PC where the N5991A software is running.
The method initiates in the same manner as the Rx Compliance Test but it
doesn't proceed any further after the setup is prepared. The set
parameters are differential amplitude, random jitter, swept sinusoidal jitter
and common mode sinusoidal interference.
Generator Jitter
• Random Jitter
• SSC Residual
Eye-Height
• Eye-Height
Parameters”.

Platform
User Guide

Overview / 420
8.0 GT/s CEM Calibrations / 421
Overview
Common Parameters for 8.0 GT/s CEM Calibrations

8.0 GT/s CEM Tests 9
8.0 GT/s CEM Calibrations
Purpose and Method
This procedure calibrates the De-Emphasis, Pre-shoot and Differential

Voltage amplitude at TP1.

TP1.
Figure 237 Setup for 8.0GT/s CEM Calibrations (TP1, No TTC, DSOz, M8040A)
Figure 238 Setup for 8.0GT/s CEM Calibrations (TP1, No TTC, 2CH DSO, M8040A)
Figure 239 Setup for 8.0GT/s CEM Calibrations (TP1, With TTC, M8040A)
Figure 240 Setup for 8.0GT/s CEM Calibrations (TP1, M8020A)

• EQ Calibration Pattern: Pattern used for this calibration
Generator
• Set Amplitude
Oscilloscope
• Scope Bandwidth
Parameters”.



generator.
Purpose and Method

The measurement is done on a real-time oscilloscope using the SigTest
software.
TP1.


• Number of averages for jitter measurement: The number of averages
(SigTest measurements) for one RJ measurement.
Parameters”.
Figure 248 Result for 8.0 GT/s CEM Random Jitter Calibration

8G Sinusoidal Jitter Calibration
Purpose and Method
This procedure calibrates the sinusoidal jitter amplitude for a set of

frequencies (5MHz and 100MHz).
amplitudes.
TP1.


• CDR loop-bandwidth: The CDR loop bandwidth that passed SigTest.
Note that the higher loop bandwidth filters the SJ with high frequency.
Parameters”.
Figure 253 Result for 8.0 GT/s CEM SJ Calibration

8G DMSI Calibration
Purpose and Method

oscilloscope.
calibrations.
Figure 254 Setup for 8.0GT/s CEM Long Channel Calibration M8040A
Figure 255 Setup for 8.0GT/s CEM Long Channel Calibration M8020A

Parameters”.
Figure 256 Result for 8.0 GT/s CEM DMSI Calibration

oscilloscope.
8G Eye-Height and Width Calibration
Purpose and Method
This procedure calibrates eye-height and eye-width by adding random

jitter and differential mode sinusoidal interference (DMSI).
Starting with “Start DMSI”, the Jitter is increased with equally spaced
steps from “Start RJ” to “Stop RJ” and the eye-height and eye-width are
measured. This procedure is now repeated for all remaining DMSI
amplitudes.
The eye is measured by using the SigTest software.
performed, this calibration table is used to evaluate the optimum amount
of DMSI and Random Jitter to get the desired Eye Height and Width.
Figure 257 and Figure 258 show the connection diagrams for the
Eye-Height and Width calibrations for Add-In cards.
Figure 257 Setup for 8.0GT/s CEM Long CH Cal M8040A (for Add-in cards)
Eye-Height and Width calibrations for Systems.
Figure 259 Setup for 8.0GT/s CEM Long CH Cal M8040A (for Systems)

• Optimize CTLE: Select when CTLE optimization is used. By default, it is
set to False.
• RJ for CTLE optimization: Random Jitter is set if CTLE optimization is
used.
• DMSI for CTLE optimization: DMSI is set if CTLE optimization is used.
• CTLE Index: CTLE index is set if CTLE optimization is not used.
• Start DMSI: The first set DMSI value.
• Stop DMSI: The last set DMSI value.
• Start RJ: The first set RJ value.
• Stop RJ: The last set RJ value.
Parameters”.


• 8G Sinusoidal Jitter Calibration on page 435.
Result Description
Figure 261 Result for 8.0 GT/s CEM Eye-Height Calibration
• Set DM Interference [mV]: The DMSI set in the instrument.

• Eye Height (x RJ) [mV]: The measured eye height for x RJ.
Figure 262 Result for 8.0 GT/s CEM Eye-Width Calibration

• Eye Width (x RJ) [ps]: The measured eye width for x RJ.
Purpose and Method
This procedure checks the possibility to generate an eye-height and an

eye-width that meet the specifications by adding Random Jitter and
Differential Mode Sinusoidal Interference.
The method starts with nominal RJ and DMSI values and checks if the
obtained eye-height and eye-width are the target values. If they are not,
RJ and DMSI are recalculated with an algorithm that uses the difference
between the measured and the target values of the eye amplitudes. The
procedure is repeated until the target values are reached or until the “Max
Number of Search Steps” is reached. If the “Max Number of Search Steps”
is reached, it checks whether or not the optimum combination of the
tested RJ and DMSI meet the specification.
Compliance Eye calibrations for Add-In cards.
Compliance Eye calibrations for Systems.

• Target Eye-Height: (Read-only) Max. specification value (1mV).
• Target Eye-Width: (Read-only) Max. specification value (5ps).
• Max Number of Search Steps: Max. number of times that the RJ and
DMSI can be recalculated to get the target values.
Parameters”.

• 8G Eye-Height and Width Calibration on page 444.
Result Description
Figure 267 Result for 8.0 GT/s CEM Compliance Eye Calibration
• DMSI [mV]: Optimum DMSI added to the signal.

• RJ [ps]: Optimum RJ added to the signal.
• Eye Width [mV]: Eye width measured.
• Eye Height [ps]: Eye height measured.
Receiver Tests


NOTE


Loopback Training

Error Detector
• Use CDR
• Peaking
• Sensitivity
• Polarity
BER Measurement
• Relax Time
• Use Preset
• Pre-shoot
• De-Emphasis
on page 50.
Purpose and Method

Figure 268 and Figure 269 show the connection diagram for Add-in cards
for M8040A and M8020A, respectively. Figure 270 and Figure 271 show
the connection diagram for Systems for M8040A and M8020A,
respectively. Note that the setup can differ depending on the clock
architecture and external reference clock selections.
Figure 268 Setup for 8.0GT/s CEM Add-In-Card Receiver Tests M8040A
Figure 270 Setup for 8.0GT/s CEM Systems Receiver Tests M8040A
Loopback Training
• Force Retraining at each BER Measurement
• Eye Parameter
• Eye Height
• Eye Width
• Differential Mode Sinusoidal Interference: The amount of DMSI, which
must be added to the signal to achieve the desired eye-height and
eye-width in combination with the RJ.
• Random Jitter: The amount of RJ, which must be added to the signal to
achieve the desired eye-height and eye-width in combination with the
DMSI.
• Test Presets Only

• Maximum Boost
• Start Pre-Shoot
BER Measurement
• BER Mode
• Target BER
Equalization for remaining Tests
Parameters”.

Result Description (similar to that for 8.0GT/s ASIC Rx Tests)
Figure 272 Result for 8.0 GT/s CEM Rx EQ Coefficient Matrix Scan

Purpose and Method

Eye Parameter
• Scan Order
BER Measurement
• BER Mode
• Target BER
Pre-Shoot Variation
• Start Pre-shoot
• Stop Pre-shoot
Parameters”.

Figure 277 Result for 8.0 GT/s CEM Rx De-Emphasis Scan
Figure 278 Result for 8.0 GT/s CEM Rx Pre-Shoot Scan
8G Rx Preset Pre-Compliance Test
Purpose and Method
This test determines if the DUT meets the receiver specifications for
different presets.
Eye-height, eye-width and sinusoidal jitter are set to the specified values.
Eye-height and eye-width are generated adding the adequate amount of
random jitter and DMSI.
The procedure measures the number of errors during “BER Measurement
duration” and checks if the “Target BER” is met. In this procedure, presets
P7 and P8 are tested.
Loopback Training
Eye Parameter
• Eye Height
• Eye Width
must be added to achieve the desired eye height and eye width in
combination with RJ.
• Random Jitter: The amount of RJ, which must be added to achieve the
desired eye height and eye width in combination with DMSI.
• Sinusoidal Jitter: 12.5ps of SJ must be added for this test.
BER Measurement
• Target BER

Parameters”.

Result Description
Figure 283 Result for 8.0 GT/s CEM Preset Pre-Compliance Test
• Preset: The Preset that was tested.
• Target BER: Max. BER allowed to pass the test.
• Measured BER
Purpose and Method
This test determines if the DUT meets the receiver specifications for Preset
P7 only.
duration” and checks if the “Target BER” is met.
Loopback Training
Eye Parameter
• Eye Height
• Eye Width
BER Measurement
• BER Mode
• Target BER
Parameters”.

Result Description
Figure 288 Result for 8.0 GT/s CEM Pre-Compliance Test
• Measured BER
Purpose and Method
fails.

• Frequency Mode
• Frequency Scale
• Start frequency
• Stop frequency
• Frequency Steps
Parameter
• Use Compliance RJ and DMSI values
• Random Jitter
BER Measurement
• BER Mode
• Target BER
Parameters”.

Figure 293 Result for 8.0 GT/s CEM Rx Jitter Tolerance Test

8G Rx Sensitivity Test
Purpose and Method
This test searches the minimum eye-height, where the DUT passes the
BER test.
The method starts with “Start Eye Height” and decreases with steps of
“Step Size”. The minimum passed value is the last test point that did not
return an error. Eye height is generated, thereby, changing the Differential
Mode Sinusoidal Interference; the random jitter is fixed to the compliance
value.
Sensitivity Variation
• Start Eye Height
• Stop Eye Height
• Eye Height Step Size
Parameter
• Random Jitter
BER Measurement
• BER Mode
• Target BER

Parameters”.

Result Description
Figure 298 Result for 8.0 GT/s CEM Rx Sensitivity Test
• Result: Pass, if the main passed eye-height is lower than the

specification limit.
• Max Passed Eye Height: This is the maximum value of eye-height that
the DUT can tolerate.
• Spec Limit: This is the minimum value of eye-height that the DUT
should tolerate according to the specifications.
• Margin: Ratio between the min. eye height tolerated and the minimum
defined in the specifications.

Loopback Training
Error Detector
• Use CDR
• Peaking
• Sensitivity
• Polarity
BER Measurement
• Relax Time
on page 50.
Purpose and Method
These tests use the interactive link training feature of the J-BERT to enable
the DUT to negotiate the generator transmitter preset that must be used.
The Compliance Test for Add-in Cards can be divided in two phases. In the
first phase, the CBB rev.3 is used and the starting generator transmitter
presets are P7 and P8. In the second phase, the CBB rev.2 is used and the
starting generator transmitter presets are P1, P7 and P8.
The Compliance Test for System Boards consists of one phase, which use
CLB rev.3.
Loopback Training
Parameter
• Eye Height
• Eye Width
• Sinusoidal Jitter: 12.5ps of SJ that must be added for this test.
BER Measurement
• Target BER

Parameters”.

Result Description
Figure 303 Result for 8.0 GT/s CEM LEQ Rx Compliance Test
• Initial Generator Preset: Initial Generator Preset (used for Add-in Card
only).
• Final Generator Preset: Final Generator Preset (requested by the DUT).
• Final Generator Pre-Shoot [dB]: The pre-shoot sent by the generator.
• Final Generator De-Emphasis [dB]: The de-emphasis sent by the
generator after the negotiation.
• Allowed Bit Errors: Number of allowed bit errors to pass the test.
• Measured Bit Errors: Number of measured bit errors after the BER test.
Purpose and Method
This test characterizes how much jitter a DUT can tolerate at different
frequencies of sinusoidal jitter.
It uses the interactive link training feature of the JBERT to enable the DUT
to negotiate the generator transmitter preset that must be used. Once the
equalization training is finished and the DUT is in loopback mode, the test
behaves in the same manner as the 8G Rx Jitter Tolerance Test. See 8G Rx
Jitter Tolerance Test on page 486.
8G LEQ Rx Sensitivity Test
Purpose and Method
This test searches the minimum eye height where the DUT passes the BER
test. It uses the interactive link training feature of the JBERT to enable the
DUT to negotiate the generator transmitter preset that must be used.
mode, the test behaves in the same manner as the 8G Rx Sensitivity Test.
See 8G Rx Sensitivity Test on page 494.

• Skip BER Check
Loopback Training
Error Detector
• Sensitivity
on page 50.
Purpose and Method
This test is valid for End Point DUTs (or Add-In Cards or devices) only. It
uses the interactive link training feature of the JBERT.
Figure 304 Setup for 8.0GT/s CEM Add-In Card LEQ Tx Tests M8040A
Figure 306 Result for 8.0 GT/s CEM LEQ Tx Initial Preset Compliance Test

Purpose and Method
For End Point DUTs (or Add-In Cards or devices), the initial transmitter
Figure 309 Setup for 8.0GT/s CEM Systems LEQ Tx Tests M8040A
Parameter
Oscilloscope
Figure 311 Result for 8.0 GT/s CEM LEQ Tx Response Time Compliance

at each step.
waveform.
• Reference Clock
• Use Preset
• Pre-shoot
• De-Emphasis
on page 50.
8G Rx Compliance Setup
This procedure is only available if specification version is selected as

NOTE 'Gen3'.
Purpose and Method
parameters needed in the 8G Rx Pre-Compliance Test using the
calibration data saved on the machine where N5991A software is running.
The method initiates in the same manner as the Pre-Compliance test but it
does not run completely; it only leaves the setup prepared. The set
parameters are the eye height and the eye width.
Figure 312 Setup for 8.0GT/s CEM Add-In-Card Receiver Setup Tests M8040A
Figure 313 Setup for 8.0GT/s CEM Add-In-Card Receiver Setup Tests M8020A
Figure 314 Setup for 8.0GT/s CEM Systems Receiver Setup Tests M8040A
Figure 315 Setup for 8.0GT/s CEM Systems Receiver Setup Tests M8020A

• Eye Height
• Eye Width
DMSI.
Parameters”.


Result Description
• None.
Platform
User Guide

Overview / 526
16.0 GT/s CEM Calibrations / 527
Overview
Common Parameters for 16.0 GT/s CEM Calibrations

• Start With Minimum Loss Channel
16.0 GT/s CEM Calibrations
Purpose and Method

at TP1.

TP1.

Generator
• Set Amplitude
Oscilloscope
• Scope Bandwidth
Parameters”.


Figure 322 Result for 16.0 GT/s TxEQ and Launch Voltage Cal (Launch Voltage)

generator.
16G RJ Calibration
Purpose and Method

TP1.


Generator
• Pre-shoot
• De-Emphasis
Oscilloscope
• Scope Bandwidth
• Number of UIs
Parameters”.
Figure 327 Result for 16.0 GT/s CEM Random Jitter Calibration

16G LF SJ Calibration
Purpose and Method
This procedure calibrates the sinusoidal jitter amplitude for a set of low
frequencies (200KMHz, 500KHz, 1MHz, 2MHz and 4MHz).
amplitudes.
TP1.

Generator
• Pre-shoot
• De-Emphasis
Oscilloscope
• Scope Bandwidth
• Number of UIs
Parameters”.
Figure 332 Result for 16.0 GT/s CEM LF SJ Calibration

16G HF SJ Calibration
Purpose and Method
amplitudes.
TP1.

Generator
• Pre-shoot
• De-Emphasis
Oscilloscope
• Scope Bandwidth
• Number of UIs
Parameters”.
Figure 337 Result for 16.0 GT/s CEM HF SJ Calibration

16G Unit Interval Calibration
Purpose and Method
This procedure is only required when the SigTest software is used. It

measures the unit interval of the signal.
The test automation sends a clean signal without adding any jitter sources.
Then, the actual unit interval is measured with the oscilloscope.
to measure eye height and eye width with SigTest.
TP1.

Generator
• Pre-shoot
• De-Emphasis
Oscilloscope
• Scope Bandwidth
• Number of UIs
Parameters”.
Figure 342 Result for 16.0 GT/s CEM Unit Interval Calibration
• Mean Unit Interval [ps]: The unit interval measured.
Purpose and Method

Measurement” option is selected. To set this option, refer toPCIe
TP1.


Generator
• Pre-shoot
• De-Emphasis
Oscilloscope
• Scope Bandwidth
Parameters”.

Figure 347 Result for 16.0 GT/s CEM Tx EQ and Launch Voltage Measurement

generator.
scope.
scope.
Purpose and Method
If the “Measurement Method” parameter is set to 'VNA (manual)', the
procedure does not perform any measurement. At the beginning of the
calibration, it is necessary to specify the variable ISI pair numbers that
recommended method.
If the “Measurement Method” parameter is set to 'Step Response', the test
automation calibrates several traces given by the parameters “Trace
Number Start Value” and “Trace Number Stop Value”. For every ISI trace,
the insertion loss is measured from 1GHz to 8GHz with steps of 100MHz.
The Insertion Loss is measured using the Seasim software.
A compensation of -1.0dB is applied at 8GHz because of 1m length SMA

NOTE cable connected to the generator. This cable counts per CTS to the total
channel loss but the calibration reference point is located after that
cable. Therefore, the cable is not included in the step regarding insertion
loss measurement and the cable’s insertion loss must be added after the
measurement.
If the Measurement Method is set as ‘Step Response’, the following

connection setup is required. At each step, the software prompts to
increase the hardware trace. If ‘VNA Method’ is set, no connections are
needed.
Figure 348 to Figure 351 show the connection diagrams for Long Channel
Calibrations using the M8040A and M8020A, respectively, for Add-In
Cards and Systems.
Figure 348 Setup for 16.0GT/s CEM Add-In Cards Long CH Calibration (M8040A)
Figure 349 Setup for 16.0GT/s CEM Systems Long CH Calibration (M8040A)
Figure 351 Setup for 16.0GT/s CEM Systems Long CH Calibration (M8020A)
Generator
Oscilloscope
• Scope Bandwidth
Variable ISI pairs
• CLB Var. ISI pair
Parameters”.

Figure 352 Result for 16.0 GT/s CEM Insertion Loss Calibration

16G DMSI Calibration
Purpose and Method

oscilloscope.
Figure 353 and Figure 354 show the connection diagrams for Long
Channel Calibrations using the M8040A and M8020A, respectively, for
Add-In Cards. The Var. ISI Pair is set to the value, which returns -28dB of
loss channel.

Oscilloscope
• Scope Bandwidth
Channel
• CLB. Var. ISI pair
• CBB Var. ISI pair
Parameters”.

Figure 355 Result for 16.0 GT/s CEM DMSI Calibration

oscilloscope.
16G CMSI Calibration
Purpose and Method

Add-In Cards. The Var. ISI Pair is set to the value, which returns -28dB of
loss channel.

Oscilloscope
• Scope Bandwidth
Channel
• CBB Var. ISI pair
Parameters”.

Figure 358 Result for 16.0 GT/s CEM CMSI Calibration

Purpose and Method

not selected in the Configure DUT dialog, the measurement is performed
-27dB.
Add-In Cards. The Var. ISI Pair is set to the value, which returns the
maximum loss channel (if “Start with minimum loss channel” is unchecked)
or the one that returns the minimum loss channel (if “Start with minimum
loss channel” option is checked).
Setup for 16.0GT/s CEM Add-In Cards Long CH Calibration (M8020A)

• CTLE Stop Value
Generator
• DMSI
• CMSI
• Random Jitter
Oscilloscope
• Scope Bandwidth
• Number of UIs
Channel
• CBB Var. ISI Pair

• CLB. Var. ISI Pair
Parameters”.

Figure 360 Result for 16.0 GT/s CEM Initial Eq. Preset Optimization (Eye height)

Figure 361 Result for 16.0 GT/s CEM Initial Eq. Preset Optimization (Eye width)

Purpose and Method
reaches the -30dB.
Add-In Cards. The Var. ISI Pair is set to the value, which returns the
maximum loss channel (if “Start with minimum loss channel” is unchecked)
or the one that returns the minimum loss channel (if “Start with minimum
loss channel” option is checked). Note that for each setup, it is required to
change the hardware trace until the optimum channel is found.

• Use Calibration data from 16G Initial Equalization Preset Optimization
• Trace Number Start Value
• Trace Number Stop Value
• CTLE Stop Value
Generator
• Pre-shoot
• De-Emphasis
• DMSI
• Random Jitter
Oscilloscope
• Scope Bandwidth
• Number of UIs
Channel
• CLB. Var. ISI Pair
Parameters”.

Figure 364 Result for 16.0 GT/s ASIC Channel Calibration (Eye height)

number.
Figure 365 Result for 16.0 GT/s ASIC Channel Calibration (Eye width)

number.
16G Final Equalization Preset
Purpose and Method

Add-In Cards. The Var. ISI Pair is set to the optimal number according to

• Use Calibration data from 16G Initial Equalization Preset Optimization.
• CTLE Stop Value
Generator
• DMSI
• Random Jitter
Oscilloscope
• Scope Bandwidth
• Number of UIs
Channel

• CLB Var. ISI Pair
Parameters”.

Figure 368 Result for 16.0 GT/s CEM Final Equalization Preset (Eye height)

instrument.
Figure 369 Result for 16.0 GT/s CEM Final Equalization Preset (Eye width)

instrument.
Purpose and Method

SigTest software.

• CTLE
Generator
• Pre-shoot
• De-Emphasis
• Random Jitter
Oscilloscope
• Scope Bandwidth
• Number of UIs
Channel
Parameters”.

• 16G RJ Calibration on page 535.
Figure 372 Result for 16.0 GT/s CEM Pre-Compliance Eye Calibration

Purpose and Method

14 and 16mV and EW between 18.5 and 19ps), it is possible to perform a
manual search by manually setting the SJ, DMSI and Vdiff values.

• Adjust Vdiff
• Use nominal EH/EW results from Pre-Compliance Cal: If set to ‘True’,
• CTLE
Generator
• Pre-shoot
• De-Emphasis
• Random Jitter
Oscilloscope
• Scope Bandwidth
• Number of UIs
Channel
Parameters”.

Figure 375 Result for 16.0 GT/s CEM Compliance Eye Calibration

Purpose and Method
signal impairments.
Generator
• Pre-shoot
• De-Emphasis
• Random Jitter
Oscilloscope
• Scope Bandwidth
• Number of UIs
• CTLE
Channel

Parameters”.

Purpose and Method

• Show Plots
Loop
selected as:
• Random Jitter
• CTLE
• ISI
impairment.
impairment.
Fixed Parameters:
Oscilloscope
• Scope Bandwidth
• Number of UIs
Parameters”.

Receiver Tests


NOTE


Loopback Training

Error Detector
• User Gen3 EIEOS
• Use CDR
• Peaking
• Sensitivity
• Polarity
BER Measurement
• Relax Time
• Use Preset
• Pre-shoot
• De-Emphasis
on page 50.
Purpose and Method

respectively. The Var. ISI Pair is set to the optimal trace according to the
calibrations. Note that the setup can differ depending on the clock
Loopback Training
• Maximum Boost
• Start Pre-Shoot
BER Measurement
• BER Mode
• Target BER
Impairments
• Residual SSC
• Random Jitter
Channel
• Allow user to enter optimum equalization for remaining Rx tests:
Controls the appearance of a window at the end of the test, which lets
you set the pre-shoot and de-emphasis values to be used for the
following tests.
Parameters”.

Figure 384 Result for 16.0 GT/s CEM Rx EQ Coefficient Matrix Scan

Purpose and Method

Pre-Shoot Variation
• Start Pre-shoot
• Stop Pre-shoot
Parameter
• Scan Order
BER Measurement
• BER Mode
• Target BER
Impairments
• Residual SSC
• Random Jitter
Channel
Parameters”.

Figure 389 Result for 16.0 GT/s CEM Rx De-Emphasis Scan
Figure 390 Result for 16.0 GT/s CEM Rx Pre-Shoot Scan
Purpose and Method
The target eye-height and eye-width are generated by adding the
optimum combination of Differential Mode Sinusoidal Interference,
Sinusoidal Jitter and Launch Voltage. Random Jitter and Common Mode
Sinusoidal interference are fixed to the nominal values. Then, the BER test
is performed for different frequencies and amplitudes of the sinusoidal
jitter.
BER Measurement
• BER Mode
• Target BER
Impairments
• Residual SSC
• Random Jitter: The random Jitter is fixed to 1ps.
• Sinusoidal Jitter: The amount of SJ, which must be added to achieve
the desired eye height and eye width.

• Generator Launch Voltage: The amount of differential amplitude, which
Channel
Link Training
Parameters”.

Result Description (similar to that for 8.0GT/s ASIC Rx Stressed Eye Test)
Figure 395 Result for 16.0 GT/s CEM Rx Pre-Compliance Test

test.
Purpose and Method
fails.

• Frequency Mode
• Frequency Scale
• Start frequency
• Stop frequency
• Frequency Steps

Parameter
BER Measurement
• BER Mode
• Target BER
Impairments
• Jitter Eye Adjustment Mode
• Residual SSC
• Random Jitter
Channel
Parameters”.

Result Description (similar to that for 8.0GT/s ASIC Rx Jitter Tolerance Test)
Figure 400 Result for 16.0 GT/s CEM Rx Jitter Tolerance Test



Loopback Training
Error Detector
• User Gen3 EIEOS
• Use CDR
• Peaking
• Sensitivity
• Polarity
BER Measurement
• Relax Time
on page 50.
Purpose and Method
mode, the test behaves in the same manner as the Rx Pre-Compliance
Test. See 16G Rx Pre-Compliance Test on page 631.
Purpose and Method

• Skip BER Check
Loopback Training
Error Detector
• Use Gen 3 EIOS
• Sensitivity
on page 50.
Purpose and Method
Connection Diagram
Figure 401 Setup for 16.0GT/s CEM Add-in Cards LEQ Tx Tests M8040A

Purpose and Method
Connection Diagram
Parameter
Oscilloscope
Figure 408 Result for 16.0 GT/s CEM LEQ Tx Response Time Compliance

at each step.
waveform.

• Use Preset
• Pre-shoot
• De-Emphasis
on page 50.
16G Rx Pre-Compliance Setup
Purpose and Method

those parameters that are needed in the Rx Pre-Compliance Test, using
the calibration data saved on the PC where the N5991A software is
running. The method initiates in the same manner as the Rx
Pre-Compliance Test but it doesn't proceed any further after the setup is
prepared. The set parameters are differential amplitude, random jitter,
swept sinusoidal jitter and differential mode sinusoidal interference.
Figure 409 Setup for 16.0GT/s CEM Add-In-Card Receiver Setup M8040A
Figure 410 Setup for 16.0GT/s CEM Add-In-Card Receiver Setup M8020A
Figure 411 Setup for 16.0GT/s CEM Systems Receiver Setup M8040A
Figure 412 Setup for 16.0GT/s CEM Systems Receiver Setup M8020A
Impairments
• Residual SSC
• Random Jitter
Channel
Parameters”.

Result Description
• None.
Platform
User Guide

Overview / 666
8.0 GT/s U2 Calibrations / 667
Overview
Common Parameters for 8.0 GT/s U2 Calibrations

8.0 GT/s U2 Tests 11
8.0 GT/s U2 Calibrations
Purpose and Method

at TP1.

TP1.
Figure 413 Setup for 8.0GT/s U2 Calibrations (TP1, No TTC, DSOz, M8040A)
Figure 414 Setup for 8.0GT/s U2 Calibrations (TP1, No TTC, 2CH DSO, M8040A)
Figure 415 Setup for 8.0GT/s U2 Calibrations (TP1, With TTC, M8040A)
Figure 416 Setup for 8.0GT/s U2 Calibrations (TP1, M8020A)

Generator
• Set Amplitude
Oscilloscope
• Scope Bandwidth
Parameters”.



generator.
Purpose and Method

The measurement is done on a real-time oscilloscope using the SigTest
software.
TP1.


Parameters”.
Figure 424 Result for 8.0 GT/s U2 Random Jitter Calibration

8G Sinusoidal Jitter Calibration
Purpose and Method
This procedure calibrates the sinusoidal jitter amplitude for a set of

frequencies (5MHz and 100MHz).
amplitudes.
TP1.


• CDR loop-bandwidth: The CDR loop bandwidth that passed SigTest.
Note that the higher loop bandwidth filters the SJ with high frequency.
Parameters”.
Figure 429 Result for 8.0 GT/s U2 SJ Calibration

8G DMSI Calibration
Purpose and Method

oscilloscope.
calibrations.
Figure 430 Setup for 8.0GT/s U2 Long Channel Calibration M8040A
Figure 431 Setup for 8.0GT/s U2 Calibration TP2 M8020A

Parameters”.
Figure 432 Result for 8.0 GT/s U2 DMSI Calibration

oscilloscope.
8G Eye-Height and Width Calibration
Purpose and Method
This procedure calibrates eye-height and eye-width by adding random

jitter and differential mode sinusoidal interference (DMSI).
Starting with “Start DMSI”, the Jitter is increased with equally spaced
steps from “Start RJ” to “Stop RJ” and the eye-height and eye-width are
measured. This procedure is now repeated for all remaining DMSI
amplitudes.
The eye is measured by using the SigTest software.
performed, this calibration table is used to evaluate the optimum amount
of DMSI and Random Jitter to get the desired Eye Height and Width.
Eye-Height and Width calibrations.

• Optimize CTLE: Select when CTLE optimization is used. By default, it is
set to False.
• RJ for CTLE optimization: Random Jitter is set if CTLE optimization is
used.
• DMSI for CTLE optimization: DMSI is set if CTLE optimization is used.
• CTLE Index: CTLE index is set if CTLE optimization is not used.
• Start DMSI: The first set DMSI value.
• Stop DMSI: The last set DMSI value.
• Start RJ: The first set RJ value.
• Stop RJ: The last set RJ value.
Parameters”.


Result Description (similar to that for 8.0GT/s CEM Calibrations)
Figure 435 Result for 8.0 GT/s U2 Eye-Height Calibration

• Eye Height (x RJ) [mV]: The measured eye height for x RJ.
Figure 436 Result for 8.0 GT/s U2 Eye-Width Calibration

• Eye Width (x RJ) [ps]: The measured eye width for x RJ.
Purpose and Method
This procedure checks the possibility to generate an eye-height and an

eye-width that meet the specifications by adding Random Jitter and
Differential Mode Sinusoidal Interference.
The method starts with nominal RJ and DMSI values and checks if the
obtained eye-height and eye-width are the target values. If they are not,
RJ and DMSI are recalculated with an algorithm that uses the difference
between the measured and the target values of the eye amplitudes. The
procedure is repeated until the target values are reached or until the “Max
Number of Search Steps” is reached. If the “Max Number of Search Steps”
is reached, it checks whether or not the optimum combination of the
tested RJ and DMSI meet the specification.
Compliance Eye calibrations.

• Target Eye-Height: (Read-only) Max. specification value (1mV).
• Target Eye-Width: (Read-only) Max. specification value (5ps).
• Max Number of Search Steps: Max. number of times that the RJ and
DMSI can be recalculated to get the target values.
Parameters”.

Result Description (similar to that for 8.0GT/s CEM Calibrations)
Figure 439 Result for 8.0 GT/s U2 Compliance Eye Calibration
• DMSI [mV]: Optimum DMSI added to the signal.

• RJ [ps]: Optimum RJ added to the signal.
• Eye Width [mV]: Eye width measured.
• Eye Height [ps]: Eye height measured.
Receiver Tests


NOTE


Loopback Training

Error Detector
• Use CDR
• Peaking
• Sensitivity
• Polarity
BER Measurement
• Relax Time
• Use Preset
• Pre-shoot
• De-Emphasis
on page 50.
Purpose and Method

Connection Diagram
Figure 440 Setup for 8.0GT/s U2 Receiver Tests M8040A
Loopback Training
• Force Retraining at each BER Measurement
Eye Parameter
• Eye Height
• Eye Width
DMSI.
• Test Presets Only

• Maximum Boost
• Start Pre-Shoot
BER Measurement
• BER Mode
• Target BER
Equalization for remaining Tests
Parameters”.

Figure 442 Result for 8.0 GT/s U2 Rx EQ Coefficient Matrix Scan

Purpose and Method

Connection Diagram
Eye Parameter
• Scan Order
BER Measurement
• BER Mode
• Target BER
Pre-Shoot Variation
• Start Pre-shoot
• Stop Pre-shoot
Parameters”.

Figure 445 Result for 8.0 GT/s U2 Rx De-Emphasis Scan
Figure 446 Result for 8.0 GT/s U2 Rx Pre-Shoot Scan
8G Rx Preset Pre-Compliance Test
Purpose and Method
This test determines if the DUT meets the receiver specifications for
different presets.
duration” and checks if the “Target BER” is met. In this procedure, presets
P7 and P8 are tested.
Connection Diagram
Loopback Training
Eye Parameter
• Eye Height
• Eye Width
BER Measurement
• Target BER

Parameters”.

Result Description (similar to that for 8.0GT/s CEM Rx Tests)
Figure 449 Result for 8.0 GT/s U2 Preset Pre-Compliance Test
• Preset: The Preset that was tested.
• Measured BER
Purpose and Method
This test determines if the DUT meets the receiver specifications for Preset
P7 only.
duration” and checks if the “Target BER” is met.
Connection Diagram
Loopback Training
Eye Parameter
• Eye Height
• Eye Width
BER Measurement
• BER Mode
• Target BER

Parameters”.

Figure 452 Result for 8.0 GT/s U2 Pre-Compliance Test
• Measured BER
Purpose and Method
fails.
Connection Diagram

• Frequency Mode
• Frequency Scale
• Start frequency
• Stop frequency
• Frequency Steps
Parameter
• Use Compliance RJ and DMSI values
• Random Jitter
BER Measurement
• BER Mode
• Target BER
Parameters”.

Figure 455 Result for 8.0 GT/s U2 Rx Jitter Tolerance Test

8G Rx Sensitivity Test
Purpose and Method
This test searches the minimum eye-height, where the DUT passes the
BER test.
The method starts with “Start Eye Height” and decreases with steps of
“Step Size”. The minimum passed value is the last test point that did not
return an error. Eye height is generated, thereby, changing the Differential
Mode Sinusoidal Interference; the random jitter is fixed to the compliance
value.
Connection Diagram
Sensitivity Variation
• Start Eye Height
• Stop Eye Height
• Eye Height Step Size
Parameter
• Random Jitter
BER Measurement
• BER Mode
• Target BER

Parameters”.

Figure 458 Result for 8.0 GT/s CEM Rx Sensitivity Test
• Result: Pass, if the main passed eye-height is lower than the

specification limit.
• Max Passed Eye Height: This is the maximum value of eye-height that
the DUT can tolerate.
• Spec Limit: This is the minimum value of eye-height that the DUT
should tolerate according to the specifications.
• Margin: Ratio between the min. eye height tolerated and the minimum
defined in the specifications.
Purpose and Method
These tests use the interactive link training feature of the J-BERT to enable
the DUT to negotiate the generator transmitter preset that must be used.
For U2 DUTs, the starting generator transmitter preset is P7. Once the
behaves the same as 8G Rx Pre Compliance Test. See 8G Rx
Pre-Compliance Test on page 715.
Purpose and Method
This test characterizes how much jitter a DUT can tolerate at different
frequencies of sinusoidal jitter.
It uses the interactive link training feature of the JBERT to enable the DUT
to negotiate the generator transmitter preset that must be used. Once the
behaves in the same manner as the 8G Rx Jitter Tolerance Test. See 8G Rx
Jitter Tolerance Test on page 719.
8G LEQ Rx Sensitivity Test
Purpose and Method
This test searches the minimum eye height where the DUT passes the BER
test. It uses the interactive link training feature of the JBERT to enable the
DUT to negotiate the generator transmitter preset that must be used.
mode, the test behaves in the same manner as the 8G Rx Sensitivity Test.
See 8G Rx Sensitivity Test on page 725.

• Skip BER Check
Loopback Training
Error Detector
• Sensitivity
on page 50.
Purpose and Method
This test is valid for End Point DUTs (or Add-In Cards or devices) only. It
uses the interactive link training feature of the JBERT.
Connection Diagram
Figure 459 Setup for 8.0GT/s U2 LEQ Tx Tests M8040A
Figure 461 Result for 8.0 GT/s U2 LEQ Tx Initial Preset Compliance Test

Purpose and Method
For End Point DUTs (or Add-In Cards or devices), the initial transmitter
Connection Diagram
Parameter
Oscilloscope
Figure 464 Result for 8.0 GT/s U2 LEQ Tx Response Time Compliance

at each step.
waveform.

• Use Preset
• Pre-shoot
• De-Emphasis
on page 50.
8G Rx Compliance Setup
Purpose and Method
parameters needed in the 8G Rx Pre-Compliance Test using the
calibration data saved on the machine where N5991A software is running.
The method initiates in the same manner as the Pre-Compliance test but it
does not run completely; it only leaves the setup prepared. The set
parameters are the eye height and the eye width.
Connection Diagram
Figure 465 Setup for 8.0GT/s U2 Receiver Setup M8040A
Figure 466 Setup for 8.0GT/s U2 Receiver Setup M8020A

• Eye Height
• Eye Width
DMSI.
Parameters”.


Result Description
• None.
This information is subject to
change without notice.
© Keysight Technologies 2019
Edition 1.0, October 2019
www.keysight.com

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Keysight N5991 PCIe Test

2 Keysight N5991 PCIe Test Automation Software Platform User Guide

2 ValiFrame PCIe Station

3 Using the Software

4 2.5 & 5.0 GT/s ASIC Tests

Keysight N5991 PCIe Test Automation Software Platform User Guide 3

2.5 & 5.0 GT/s ASIC Calibrations 65

Receiver Setup Tests 87

5 8.0 GT/s ASIC Tests

Receiver Tests 124

4 Keysight N5991 PCIe Test Automation Software Platform User Guide

Link Equalization Transmitter Tests 149

Receiver Setup Tests 158

6 16.0 GT/s ASIC Tests

Keysight N5991 PCIe Test Automation Software Platform User Guide 5

Receiver Tests 253

Link Equalization Receiver Tests 279

Link Equalization Transmitter Tests 281

Receiver Setup Tests 290

7 32.0 GT/s ASIC Tests

6 Keysight N5991 PCIe Test Automation Software Platform User Guide

32.0 GT/s ASIC Calibrations 297

Receiver Tests 369

Link Equalization Receiver Tests 387

Receiver Setup Tests 388

8 2.5 & 5.0 GT/s CEM Tests

Keysight N5991 PCIe Test Automation Software Platform User Guide 7

2.5 & 5.0 GT/s CEM Calibrations 395

Receiver Tests 403

Receiver Setup Tests 416

9 8.0 GT/s CEM Tests

8 Keysight N5991 PCIe Test Automation Software Platform User Guide

Receiver Tests 456

Link Equalization Receiver Tests 500

Link Equalization Transmitter Tests 508

Receiver Setup Tests 519

10 16.0 GT/s CEM Tests

Keysight N5991 PCIe Test Automation Software Platform User Guide 9

16.0 GT/s CEM Calibrations 527

Receiver Tests 613

Link Equalization Receiver Tests 646

10 Keysight N5991 PCIe Test Automation Software Platform User Guide

Link Equalization Transmitter Tests 648

Receiver Setup Tests 659

11 8.0 GT/s U2 Tests

Keysight N5991 PCIe Test Automation Software Platform User Guide 11

Receiver Tests 698

Link Equalization Transmitter Tests 730

Receiver Setup Tests 739

12 Keysight N5991 PCIe Test Automation Software Platform User Guide

14 Keysight N5991 PCIe Test Automation Software Platform User Guide

First Edition (October 2019)

The first edition of this user guide describes functionality of software

Keysight N5991 PCIe Test Automation Software Platform User Guide 15

16 Keysight N5991 PCIe Test Automation Software Platform User Guide

ValiFrame PCIe Station Configuration

Test Station Selection

Figure 1 Icon for PCIe Station Configurator

When the ValiFrame PCIe Station Configuration is launched, the Valiframe

18 Keysight N5991 PCIe Test Automation Software Platform User Guide

Figure 2 Station selection window

Keysight N5991 PCIe Test Automation Software Platform User Guide 19

Test Station Configuration

ASIC 8.0 and 16.0GT/s 8.0, 16.0 and 32.0GT/s