TESTOP AT-01 IN-CIRCUIT TESTER Ta ln http://www.testop.kr E-mail : sales@testop.kr02 AT-01 Out line of TESTOP / Features The TESTOP AT-01 is a powerful In-Circuit Tester designed to detect board assembly faults. The AT-O1 accurately detects shorts, opens, wrong components, missing INT EIREURETES TER components, and reversed mounted components for resistor, capacitor, diode, transistor, inductor, LED, and FET. And AT-01 is especially designed to detect open pins of ICs, When used together with the Options(FrameScan & DeltaScan), it covers, some of the test capabilities(Finding opens, other faults common to digital & mixed signal VLSI and ASIC device package) of the high-end testers in the market, way ahead of its closest competitors, Is Windows Platform AT-O1 Operating Software, overwhelmed by its user-friendly and dynamic features has adopted Windows-based testing concept. it runs on Windows XP, which is today’s newest technology. Being Windows-based also enables its compatbiity with other Windows-based supporting sottwares, further enhancing the functions and competitiveness of AT-O1 system, In Auto-Test Mode When pressed down, the AT-01 executes PCB assembly test and automatically performs Press Up functions thereafter. In addition, the AT-O1 contributes on the work efficiency minimizing the false inferiority under test by adding the functions for detecting the error components Ju Data-Edit Editing of data can be done by a mouse or a keyboard, Icons are available for the easy and quick access to the supporting functions, Aids such as graphical presentation of measurement and V/I source are provided in the program bebugging, [ln Expandable Test Nodes The number of the AT-O1's standard test node is 384 and is expendable to 2048 The nodes can be expendable to 8192 when ordered with special specication, The caters to more sophisticated requirements of SMT process. Ila Special Design of Press Down Unit The standard height measured trom POU to fixture when fully pressed down is 128,5mm, For the taller components, which exceed 100mm, special customization aliows the height to be adjusted to 193,5mm, In Excel Data Compatibility Windows muti-tasking capability has enabled copying of the AT-0t test data from / to Excel data format by using “Cut” and "Paste’, for proper documentation, In Powerful Automatic Guarding Guarding pins are automaticaly assigned in the actual measurement, I ellectively isolates other ciculs of the accurate and consistent measurement of all the components on PCB assembly.It tests the priority of the Range and Mode seting or automatically search for the Range ‘and Mode that are appropriate for the designated component value. Consequently, the program writing can now be precisely executed with higher speed PCB Graphic display indicates the actual location of defective components, This assists the operator to find the position of the faults on the PCB during rework, thereby reducing the rework time, S-levels of password protection are set for Operator, Technician & Engineer to prevent unauthorized modification to the test data, Relay board checks and DC/AC measurement board checks are available 10 help isolating and identifying system failures, Kelvin Measurement (4~pin measurement) measures from 0,010 resistance and lower 03 capacitance trom pF can be measured by applying IMHz AC signal, Capacitance between system and fixture is automatically eliminated from the measurement and offset to ensure more accurate measurement, ‘The newly designed DYM-5700 board assists the operation test for photo coupler with the maximum current of 100mA, Collection of individual "Fai PCB step data and identiication of the PCB by either Dale/Time or by a serial number using bar code reader, This is usetul for traceabilty, This data can also be used for off-line rework station PC through networking to establish paperless rework system, Information on the quantity of the tested boards and test yield (est time/board), can be collected and printed out for the management reference purposes, The AT-01 provides the stamping tool to print OK" or 'NG" fon the PCB assembly according to the testing results, The AT-01 provides the smooth migration for fixture and data program from all the In-Circult Testers of Okano family, Takaya's 200N, TCO-series and etc, AT-O1 Windows XP operating system allows the user to enjoy the built-in networking and connectivity functions, Networking allows the user to store test programs centrally and to control program revisions, LAN networking allows hast PC to monitor the machines in production,Pin Board Size Gross Weight ‘AC80V~260V 500VA 50H or Bol 4-Btalot Dry Air 100~351, 205~80% 1o6Om: WX 7I5m: D X 1485m: H (Over than INTEL DUAL Core 2.608 Over than 168, (Over than 2506 17 inch LoD Windows XP 00m: WX StS: DX 150m: H 33049 Measurement point Relay Board SShort/Open Speed Threshold Level Test Time Test Siep Resistance Capacitance Inductance Diode De Voltage De current Zener Diods “Transistor Photo Coupler Guard Pin Jumper Wie Connector Pass/Fail Tolerance Measurement Signal Measurement Range 384 Pins(STD), 8192 pinsiMax) 128 pins / BOARD 2ns / Pin so~allo 1.5ns~t2ns / Step Unites 0.010 to aot 0.0010 DF to 40m 0.010 {ul to 400H 0.00104 onv~4oy 0.001 —4ov~40y 0.001 5A to 200mA o.tna. VF=0,.v~d0V 0.001 Bias=5V ON/OFF Blas=5V ON/OFF Up to 10 Pins so~allo so~alho +1%-1990% 100% or Absolute Value DO Constant Voltage : 300mW(0~250mA) 6 Cott Cure Low Yap: Wo OMA GargedO~4toe) 16 Cant Cert Hh tae: uA OMA Banos) AC Frequency : 1,60u/16xt/100(0,3Vp-p) DC Veltage Measurement: OV to 10V I(Granges) DO Votlage Measurement#2 : ~BV to 5V 1s DC Volage Measurement : —A0V to 40V {2ranges) DO Curent Measurement: Sn to 200nA(7ranges)In-Line System IN-CIRCUIT TESTER In= Line AT-Of, a fully automated In-Circuit Teste, can be customized fo sult various production requiremenls, Loader & Unioader can be incorporated to aulo feed and collect the boards under test, NG stocker or Traverser can be added fo divert the failed boards to rework stations, Significant Lprovement in the producity of the tester & reduction in labor costs can be achieved, Specification | TrasierSpecifcaton — Drecten Reterence Medium Heit ‘Speed PCB loader wich 708 Size Right Frontside reference FLAT BELT TYPE 900-20 15~18m/in 20 '80%80~250%300m 08~2,0nn ccmponent sid ~ 100m, ‘ubstate soe 0mm PLC Control aKvs 046010 200% 4000 4~lat ry Air 10v~350, 20%~80%Te ae Cg awl Stamens, oe ao FrameScan test & DeltaScan test FrameScan and DeltaScan are developed by U.S company, Teradyne Inc, These are used to filter out manulacturing delecis such as cold solders and resislive solder joints of 'Cs, The trend of an increasing usage of SMT ICs has resulted in the increased number of packaging density trom DIP to PGABGA.CSP and etc, AT-01, it incorporated with these Scans, provides a high speed, reliable and low-cost testing, 1 FrameScan Test FrameScan test detects the opens on SMT connectors, sockets and some RAM arrays, FrameScan uses capacitive coupling to test the opens of the pins, Unlike the DeltaScan technique, which relies on the internal device circuitry, FrameScan relies on the presence of the metalic lead frame of the device to test the pins, Connectors and sockets, in addition to devices with lead frames, can be tested with FrameScan, ™ DeltaScan Test DeltaScan technique involves measuring the variation in the current of the electrostatic discharge (ESD) protection diodes that are intrinsic to most of 'Cs by applying low DC voltages to two pins at a time(As shown in Diagram), In order to check the connection problems, other common faults, besides pin opens can also be reviewed, including opens on single ground pins,a1 N-CRCUT TESTER 1» BoundaryScan test and Flash Programming BoundaryScan test now comes with the standard AT-O1 Tester, BoundaryScan test, as defined by IEEE Std.1149.1 standard, is an integrated method for testing interconnects on printed circuit boards that are implemented al the IC level, The inability to test highly complex and dense printed circuit boards using traditional In-Circuit Tester and bed of nail fixture was already evident in the mid eighties, Due to physical space constraints and loss of physical access to fine pitch components and BGA devices, fixturing cost increased dramatically while fixture reliablity decreased at the same time, Applications are found in high volume, high-end consumer products, telecommunication products, defense systems, computers, peripherals, and avionics, 1» Advantage of Boundary Scan test stuck-at fault, Bridge fault 100% Detection Fast test preparation time Cost effective Testing + Easy to find Fault Location “Flash memory programming "= Flash Memory Download Flash memory and in System Programming can be download at the board level slate 07Ag TESTOP Overseas Agents Country JAPAN SSNGAPORE, ‘SNGAPORE. aLarsia Awan THALAN cana cana cna HONG KONG ‘Now INDONESIA PUPPIES 21 usarcaoa DMOHGREEDREOOe Ag TESTOP TESTOP CO,, LTD ‘Agent (OKANOELECTRE CO LTD (xaO)PTE LID NEWSPEEDINDUSTRESPTELTD (ka NO TECHNOLOGY) SEN EHD (OKTEK CORPORATION (OKANOHITEDHCO. LID SHENZHEN OKANOELECTRONC LTD (OkANO TESTES KUNSHAN CO, LTD HEISE SHENZHEN LTD HEISEI HONGKONG LTD AAINSYSTEMPVT, LTD caer [MAEDANENTERFRISENC scouoac ne 808RM Hanshin IT Tower , Digital-ro 27: +82-2-856-2100 FAX : +8: 6 Homepage : www.testop.kr E-mail : sales@testop.kr