Distance.

dst:
Test Object - Distance Settings
. . . .
System parameters:
Line length: 2.283 Ω Line angle: 63.40 °
PT connection: at line CT starpoint: Dir. line
Impedance correction no
1A/I nom:
Impedances in primary no
values:
. . . .
Tolerances:
Tol. T rel.: 1.000 %
Tol. T abs. +: 30.00 ms Tol. T abs. -: 30.00 ms
Tol. Z rel.: 5.000 % Tol. Z abs.: 0.00 Ω
. . . .
Grounding factor:
kL mag.: 1.037000 kL angle: 16.900000°
Separate arc resistance: yes

Zone Settings:
Label Type Fault loop Trip time Tol. T rel Tol. T abs+ Tol. T abs- Tol. Z rel. Tol. Z abs
Zone 1 Tripping L-L 30.00 ms 1.000 % 30.00 ms 30.00 ms 5.000 % 91.50 mΩ
Phase
Zone 2 Tripping L-L 380.0 ms 1.000 % 30.00 ms 30.00 ms 5.000 % 125.5 mΩ
Phase
Zone 3 Tripping L-L 1.030 s 1.000 % 30.00 ms 30.00 ms 5.000 % 226.5 mΩ
Phase
Zone 4 Tripping L-L 530.0 ms 1.000 % 30.00 ms 30.00 ms 5.000 % 23.00 mΩ
Phase
Zone 1 Tripping L-E 30.00 ms 1.000 % 30.00 ms 30.00 ms 5.000 % 91.50 mΩ
Ground
Zone 2 Tripping L-E 380.0 ms 1.000 % 30.00 ms 30.00 ms 5.000 % 125.5 mΩ
Ground
Zone 3 Tripping L-E 1.030 s 1.000 % 30.00 ms 30.00 ms 5.000 % 226.5 mΩ
Ground
Zone 4 Tripping L-E 530.0 ms 1.000 % 30.00 ms 30.00 ms 5.000 % 23.00 mΩ
Ground
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-20 -15 -10 -5 0 5 10 15

R/O

Linked XRIO References

Reference Name Unit Value XRIO Path
RIO.DEVICE.NOMINALVALUES.INOM In 1.00 A RIO/Device/Nominal Values/In
RIO.DEVICE.NOMINALVALUES.VNO V_nom 110.00 V RIO/Device/Nominal Values/V nom
M

Test Results
Shot Test: Fault Type L1-E
|Z| Phi t nom t act. Dev. ITest Result
400.0 mΩ 50.00 ° 30.00 ms 6.273 ms -79.09 % 2.000 A Passed
924.8 mΩ 70.00 ° 30.00 ms 9.551 ms -68.16 % 2.000 A Passed
1.442 Ω 56.31 ° 30.00 ms 30.69 ms 2.286 % 2.000 A Passed
2.062 Ω 62.02 ° 380.0 ms 379.5 ms -0.1419 % 2.000 A Passed
2.191 Ω 65.90 ° 380.0 ms 359.0 ms -5.521 % 2.000 A Passed
2.338 Ω 62.09 ° 380.0 ms 398.0 ms 4.737 % 2.000 A Passed
2.987 Ω 63.40 ° 1.030 s 1.044 s 1.32 % 2.000 A Passed
3.633 Ω 66.20 ° 1.030 s 1.019 s -1.027 % 2.000 A Passed
4.151 Ω 60.00 ° 1.030 s 1.058 s 2.736 % 2.000 A Passed
149.9 mΩ -130.00 ° 530.0 ms 553.7 ms 4.475 % 2.000 A Passed
231.5 mΩ -110.00 ° 530.0 ms 520.6 ms -1.765 % 2.000 A Passed
340.2 mΩ -116.60 ° 530.0 ms 557.8 ms 5.244 % 2.000 A Passed
8.066 Ω 121.88 ° no trip no trip n/a 2.000 A Passed
5.751 Ω -50.00 ° no trip no trip n/a 2.000 A Passed
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Shot Test: Fault Type L2-E

|Z| Phi t nom t act. Dev. ITest Result
3.549 Ω 66.62 ° 1.030 s 1.011 s -1.869 % 2.000 A Passed
2.702 Ω 67.85 ° 1.030 s 1.003 s -2.623 % 2.000 A Passed
4.299 Ω 58.66 ° 1.030 s 1.053 s 2.202 % 2.000 A Passed
2.294 Ω 66.32 ° 380.0 ms 361.4 ms -4.883 % 2.000 A Passed
2.259 Ω 55.29 ° 380.0 ms 394.7 ms 3.873 % 2.000 A Passed
1.949 Ω 70.00 ° 380.0 ms 399.3 ms 5.079 % 2.000 A Passed
1.600 Ω 70.00 ° 30.00 ms 57.23 ms 90.78 % 2.000 A Passed
1.352 Ω 53.72 ° 30.00 ms 27.76 ms -7.468 % 2.000 A Passed
703.8 mΩ 50.00 ° 30.00 ms 29.44 ms -1.859 % 2.000 A Passed
123.2 mΩ -116.60 ° 530.0 ms 469.5 ms -11.42 % 2.000 A Passed
253.6 mΩ -110.00 ° 530.0 ms 505.2 ms -4.675 % 2.000 A Passed
400.0 mΩ -120.00 ° 530.0 ms 513.0 ms -3.199 % 2.000 A Passed
8.860 Ω 103.91 ° no trip no trip n/a 2.000 A Passed
12.78 Ω 42.89 ° no trip no trip n/a 2.000 A Passed
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Shot Test: Fault Type L3-E

|Z| Phi t nom t act. Dev. ITest Result
289.3 mΩ 70.00 ° 30.00 ms 57.80 ms 92.66 % 2.000 A Passed
200.0 mΩ -130.00 ° 530.0 ms 550.3 ms 3.834 % 2.000 A Passed
345.4 mΩ -110.00 ° 530.0 ms 511.7 ms -3.461 % 2.000 A Passed
400.0 mΩ -130.00 ° 530.0 ms 537.6 ms 1.436 % 2.000 A Passed
919.2 mΩ 60.00 ° 30.00 ms 35.75 ms 19.16 % 2.000 A Passed
1.448 Ω 68.34 ° 30.00 ms 35.58 ms 18.59 % 2.000 A Passed
2.000 Ω 61.61 ° 380.0 ms 400.6 ms 5.426 % 2.000 A Passed
2.177 Ω 66.73 ° 380.0 ms 391.4 ms 3.004 % 2.000 A Passed
2.400 Ω 61.51 ° 380.0 ms 378.7 ms -0.3308 % 2.000 A Passed
3.433 Ω 65.00 ° 1.030 s 1.010 s -1.942 % 2.000 A Passed
2.941 Ω 65.92 ° 1.030 s 1.044 s 1.327 % 2.000 A Passed
4.197 Ω 62.41 ° 1.030 s 1.007 s -2.265 % 2.000 A Passed
7.500 Ω 80.00 ° no trip no trip n/a 2.000 A Passed
5.687 Ω -166.92 ° no trip no trip n/a 2.000 A Passed
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Shot Test: Fault Type L1-L2

|Z| Phi t nom t act. Dev. ITest Result
2.619 Ω 66.02 ° 1.030 s 1.024 s -0.599 % 2.000 A Passed
3.600 Ω 65.30 ° 1.030 s 1.045 s 1.486 % 2.000 A Passed
4.472 Ω 63.43 ° 1.030 s 1.013 s -1.65 % 2.000 A Passed
2.400 Ω 63.40 ° 380.0 ms 601.8 ms 58.38 % 2.000 A Passed
2.064 Ω 64.90 ° 380.0 ms 368.0 ms -3.151 % 2.000 A Passed
2.000 Ω 61.98 ° 380.0 ms 400.3 ms 5.352 % 2.000 A Passed
1.447 Ω 60.00 ° 30.00 ms 36.70 ms 22.32 % 2.000 A Passed
956.2 mΩ 70.00 ° 30.00 ms 5.671 ms -81.1 % 2.000 A Passed
346.6 mΩ 50.00 ° 30.00 ms 4.484 ms -85.05 % 2.000 A Passed
64.33 mΩ -130.00 ° 530.0 ms 458.2 ms -13.55 % 2.000 A Passed
165.8 mΩ -110.00 ° 530.0 ms 544.1 ms 2.657 % 2.000 A Passed
282.5 mΩ -120.00 ° 530.0 ms 558.6 ms 5.393 % 2.000 A Passed
8.193 Ω 77.55 ° no trip no trip n/a 2.000 A Passed
2.500 Ω -100.00 ° no trip no trip n/a 2.000 A Passed
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Shot Test: Fault Type L2-L3

|Z| Phi t nom t act. Dev. ITest Result
400.0 mΩ -118.34 ° 530.0 ms 540.2 ms 1.922 % 2.000 A Passed
263.8 mΩ -114.65 ° 530.0 ms 528.4 ms -0.308 % 2.000 A Passed
125.4 mΩ -123.75 ° 530.0 ms 358.4 ms -32.37 % 2.000 A Passed
2.818 Ω 66.87 ° 1.030 s 1.056 s 2.525 % 2.000 A Passed
3.924 Ω 60.00 ° 1.030 s 1.027 s -0.3322 % 2.000 A Passed
3.577 Ω 70.00 ° 1.030 s 1.053 s 2.204 % 2.000 A Passed
2.400 Ω 62.20 ° 380.0 ms 880.1 ms 131.6 % 2.000 A Passed
2.200 Ω 64.39 ° 380.0 ms 409.6 ms 7.778 % 2.000 A Passed
1.934 Ω 62.46 ° 380.0 ms 186.3 ms -50.96 % 2.000 A Passed
1.352 Ω 63.40 ° 30.00 ms 16.63 ms -44.57 % 2.000 A Passed
837.4 mΩ 50.00 ° 30.00 ms 51.62 ms 72.08 % 2.000 A Passed
447.3 mΩ 80.00 ° 30.00 ms 55.84 ms 86.14 % 2.000 A Passed
9.093 Ω 113.88 ° no trip no trip n/a 2.000 A Passed
5.270 Ω -150.00 ° no trip no trip n/a 2.000 A Passed
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Shot Test: Fault Type L3-L1

|Z| Phi t nom t act. Dev. ITest Result
149.8 mΩ -116.60 ° 530.0 ms 531.4 ms 0.261 % 2.000 A Passed
324.9 mΩ -120.00 ° 530.0 ms 517.9 ms -2.287 % 2.000 A Passed
400.0 mΩ -110.00 ° 530.0 ms 557.8 ms 5.238 % 2.000 A Passed
339.3 mΩ 70.00 ° 30.00 ms 33.10 ms 10.33 % 2.000 A Passed
909.8 mΩ 60.00 ° 30.00 ms 35.42 ms 18.07 % 2.000 A Passed
1.505 Ω 70.00 ° 30.00 ms 31.14 ms 3.787 % 2.000 A Passed
2.142 Ω 64.89 ° 380.0 ms 406.0 ms 6.839 % 2.000 A Passed
2.000 Ω 61.56 ° 380.0 ms 408.2 ms 7.411 % 2.000 A Passed
2.400 Ω 63.40 ° 380.0 ms 607.0 ms 59.74 % 2.000 A Passed
4.000 Ω 65.23 ° 1.030 s 1.053 s 2.185 % 2.000 A Passed
3.507 Ω 58.81 ° 1.030 s 1.039 s 0.8964 % 2.000 A Passed
3.000 Ω 67.61 ° 1.030 s 1.055 s 2.476 % 2.000 A Passed
7.323 Ω 45.01 ° no trip no trip n/a 2.000 A Passed
5.128 Ω -40.00 ° no trip no trip n/a 2.000 A Passed
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Shot Test: Fault Type L1-L2-L3

|Z| Phi t nom t act. Dev. ITest Result
7.161 Ω 48.04 ° no trip no trip n/a 2.000 A Passed
3.705 Ω -150.00 ° no trip no trip n/a 2.000 A Passed
4.000 Ω 67.90 ° 1.030 s 1.057 s 2.604 % 2.000 A Passed
3.513 Ω 60.00 ° 1.030 s 1.048 s 1.743 % 2.000 A Passed
2.808 Ω 70.00 ° 1.030 s 1.051 s 2.021 % 2.000 A Passed
2.374 Ω 65.09 ° 380.0 ms 819.1 ms 115.6 % 2.000 A Passed
2.200 Ω 61.93 ° 380.0 ms 383.7 ms 0.963 % 2.000 A Passed
1.975 Ω 64.85 ° 380.0 ms 382.1 ms 0.5438 % 2.000 A Passed
1.718 Ω 62.24 ° 30.00 ms 31.01 ms 3.36 % 2.000 A Passed
1.423 Ω 66.05 ° 30.00 ms 3.448 ms -88.51 % 2.000 A Passed
1.042 Ω 60.00 ° 30.00 ms 57.91 ms 93.03 % 2.000 A Passed
101.3 mΩ -130.00 ° 530.0 ms 385.0 ms -27.36 % 2.000 A Passed
225.2 mΩ -116.60 ° 530.0 ms 510.9 ms -3.607 % 2.000 A Passed
375.2 mΩ -120.00 ° 530.0 ms 528.9 ms -0.2106 % 2.000 A Passed
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Shot Details:
.
Parameters:
Fault Type: L1-E
| Z |: 5.751 Ω Phi: -50.00 °
R: 3.697 Ω X: -4.405 Ω
ITest: 2.000 A
.
Fault Quantities (natural):
VL1: 19.72 V 0.00 °
VL2: 63.51 V -120.00 °
VL3: 63.51 V 120.00 °
IL1: 2.000 A 73.28 °
IL2: 0.00 A n/a
IL3: 0.00 A n/a
VFault: 19.72 V 0.00 °
IFault: 2.000 A 73.28 °
.

.
Test State:
Test passed.