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IRL40SC228
IRL40SC228
IRL40SC228
StrongIRFET™
IRL40SC228
Benefits S
Optimized for Logic Level Drive SS
SS
S
Improved Gate, Avalanche and Dynamic dV/dt Ruggedness G
Standard Pack
Base Part Number Package Type Orderable Part Number
Form Quantity
IRL40SC228 D2PAK-7Pin Tape and Reel Left 800 IRL40SC228
RDS(on), Drain-to -Source On Resistance ( m )
5 600
ID = 100A LIMITED BY PACKAGE
4
500
ID, Drain Current (A)
400
3
300
2
200
TJ = 125°C
1
100
TJ = 25°C
0 0
0 4 8 12 16 20 25 50 75 100 125 150 175
V GS, Gate-to-Source Voltage (V) TC, Case Temperature (°C)
Fig 1. Typical On-Resistance vs. Gate Voltage Fig 2. Maximum Drain Current vs. Case Temperature
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IRL40SC228
Absolute Maximum Rating
Symbol Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V (Silicon Limited) 557
ID @ TC = 100°C Continuous Drain Current, VGS @ 10V (Silicon Limited) 393
A
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V (Wire Bond Limited) 360
IDM Pulsed Drain Current 1440
PD @TC = 25°C Maximum Power Dissipation 416 W
Linear Derating Factor 2.8 W/°C
VGS Gate-to-Source Voltage ± 20 V
TJ Operating Junction and
-55 to + 175
TSTG Storage Temperature Range °C
Soldering Temperature, for 10 seconds (1.6mm from case) 300
Avalanche Characteristics
EAS (Thermally limited) Single Pulse Avalanche Energy 1275
mJ
EAS (Thermally limited) Single Pulse Avalanche Energy 2150
IAR Avalanche Current A
See Fig 15, 16, 23a, 23b
EAR Repetitive Avalanche Energy mJ
Thermal Resistance
Symbol Parameter Typ. Max. Units
RJC Junction-to-Case ––– 0.36
RCS Case-to-Sink, Flat Greased Surface 0.50 ––– °C/W
RJA Junction-to-Ambient ––– 62
Notes:
Calculated continuous current based on maximum allowable junction temperature. Bond wire current limit is 360A. Note that
Current imitations arising from heating of the device leads may occur with some lead mounting arrangements.
(Refer to AN-1140)
Repetitive rating; pulse width limited by max. junction temperature.
Limited by TJmax, starting TJ = 25°C, L = 0.146mH, RG = 50, IAS = 100A, VGS =10V.
ISD 100A, di/dt 1008A/µs, VDD V(BR)DSS, TJ 175°C.
Pulse width 400µs; duty cycle 2%.
Coss eff. (TR) is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS.
Coss eff. (ER) is a fixed capacitance that gives the same energy as Coss while VDS is rising from 0 to 80% VDSS.
R is measured at TJ approximately 90°C.
Limited by TJmax, starting TJ = 25°C, L = 1mH, RG = 50, IAS = 65A, VGS =10V.
Pulse drain current is limited to 1440A by source bonding technology.
When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended footprint and soldering techniques
refer to application note #AN-994: http://www.infineon.com/technical-info/appnotes/an-994.pdf
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1000 1000
3.25V
3.25V
100 100
VGS VGS
TOP 15V TOP 15V
10V 10V
6.0V 6.0V
5.0V 5.0V
60µs PULSE WIDTH 4.5V 60µs PULSE WIDTH 4.5V
4.0V Tj = 175°C 4.0V
Tj = 25°C 3.5V
3.5V
BOTTOM 3.25V BOTTOM 3.25V
10 10
0.1 1 10 100 0.1 1 10 100
V DS, Drain-to-Source Voltage (V) V DS, Drain-to-Source Voltage (V)
100 1.8
TJ = 175°C
(Normalized)
TJ = 25°C
10 1.4
1 1.0
V DS = 10V
60µs PULSE WIDTH
0.1 0.6
0 1 2 3 4 5 -60 -20 20 60 100 140 180
TJ , Junction Temperature (°C)
V GS, Gate-to-Source Voltage (V)
1000000 14
VGS = 0V, f = 1 MHZ
C iss = C gs + C gd, C ds SHORTED ID= 100A
C rss = C gd
12
V DS= 32V
V GS, Gate-to-Source Voltage (V)
C oss = C ds + C gd
100000 V DS= 20V
10
C, Capacitance (pF)
V DS= 8V
Ciss 8
10000
Coss 6
Crss
4
1000
100 0
1 10 100 0 50 100 150 200 250 300 350 400 450 500
V DS, Drain-to-Source Voltage (V) QG, Total Gate Charge (nC)
Fig 7. Typical Capacitance vs. Drain-to-Source Voltage Fig 8. Typical Gate Charge vs. Gate-to-Source Voltage
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IRL40SC228
1000
OPERATION IN THIS AREA
LIMITED BY RDS(on)
1000
100 100µsec
100
TJ = 175°C
TJ = 25°C 1msec
10
10 LIMITED BY PACKAGE
10msec
1
1 Tc = 25°C
Tj = 175°C DC
V GS = 0V Single Pulse
0.1 0.1
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1 0.1 1.0 10.0
Fig 9. Typical Source-Drain Diode Forward Voltage Fig 10. Maximum Safe Operating Area
V (BR)DSS, Drain-to-Source Breakdown Voltage (V)
52 2.0
Id = 5.0mA
50 1.6
46 0.8
44 0.4
42 0.0
0 10 20 30 40
-60 -20 20 60 100 140 180
TJ , Temperature ( °C ) V DS, Drain-to-Source Voltage (V)
Fig 11. Drain-to-Source Breakdown Voltage Fig 12. Typical Coss Stored Energy
1.0
RDS(on), Drain-to -Source On Resistance ( m )
V GS = 3.5V
0.8
V GS = 4.5V
V GS = 6.0V
V GS = 8.0V
V GS = 10V
0.6
0.4
0 40 80 120 160 200
ID, Drain Current (A)
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IRL40SC228
1
0.001
SINGLE PULSE
Notes:
( THERMAL RESPONSE )
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
0.0001
1E-006 1E-005 0.0001 0.001 0.01 0.1
t1 , Rectangular Pulse Duration (sec)
100
1
1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01
tav (sec)
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2.5 28
IF = 60A
24
V GS(th) , Gate threshold Voltage (V)
V R = 34V
2.0
TJ = 25°C
20
TJ = 125°C
1.5
16
IRRM (A)
ID = 250µA
ID = 1.0mA 12
1.0 ID = 1.0A
8
0.5
4
0.0 0
-75 -25 25 75 125 175 0 200 400 600 800 1000
TJ , Temperature ( °C ) diF /dt (A/µs)
Fig 17. Threshold Voltage vs. Temperature Fig 18. Typical Recovery Current vs. dif/dt
28 2400
IF = 60A IF = 60A
24 V R = 34V 2000 V R = 34V
TJ = 25°C TJ = 25°C
20
TJ = 125°C 1600 TJ = 125°C
16
QRR (nC)
IRRM (A)
1200
12
800
8
400
4
0 0
0 200 400 600 800 1000 0 200 400 600 800 1000
diF /dt (A/µs) diF /dt (A/µs)
Fig 19. Typical Recovery Current vs. dif/dt Fig 20. Typical Stored Charge vs. dif/dt
2400
IF = 100A
2000 V R = 34V
TJ = 25°C
1600 TJ = 125°C
QRR (nC)
1200
800
400
0
0 200 400 600 800 1000
diF /dt (A/µs)
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Fig 22. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs
V(BR)DSS
15V
tp
L DRIVER
VDS
RG D.U.T +
V
- DD
IAS A
20V
tp 0.01 I AS
Fig 23a. Unclamped Inductive Test Circuit Fig 23b. Unclamped Inductive Waveforms
Fig 24a. Switching Time Test Circuit Fig 24b. Switching Time Waveforms
Id
Vds
Vgs
VDD
Vgs(th)
Fig 25a. Gate Charge Test Circuit Fig 25b. Gate Charge Waveform
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IRL40SC228
D2Pak - 7 Pin Package Outline (Dimensions are shown in millimeters (inches))
PART NUMBER
INTERNATIONAL
RECTIFIER LOGO F1324S-7P
YWWP
17 89 DATE CODE
ASSEMBLY Y = YEAR
LOT CODE W = WEEK
P = LEADFREE
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Qualification Information
Industrial
Qualification Level
(per JEDEC JESD47F) †
MSL1
Moisture Sensitivity Level D2PAK-7Pin
(per JEDEC J-STD-020D†)
RoHS Compliant Yes
Revision History
Date Comments
05/12/2017 Corrected package picture added “s” on pin number 4 - page 1.
Published by
Infineon Technologies AG
81726 München, Germany
© Infineon Technologies AG 2015
All Rights Reserved.
IMPORTANT NOTICE
The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics
(“Beschaffenheitsgarantie”). With respect to any examples, hints or any typical values stated herein and/or any
information regarding the application of the product, Infineon Technologies hereby disclaims any and all warranties and
liabilities of any kind, including without limitation warranties of non-infringement of intellectual property rights of any third
party.
In addition, any information given in this document is subject to customer’s compliance with its obligations stated in this
document and any applicable legal requirements, norms and standards concerning customer’s products and any use of
the product of Infineon Technologies in customer’s applications.
The data contained in this document is exclusively intended for technically trained staff. It is the responsibility of
customer’s technical departments to evaluate the suitability of the product for the intended application and the
completeness of the product information given in this document with respect to such application.
For further information on the product, technology, delivery terms and conditions and prices please contact your nearest
Infineon Technologies office (www.infineon.com).
WARNINGS
Due to technical requirements products may contain dangerous substances. For information on the types in question
please contact your nearest Infineon Technologies office.
Except as otherwise explicitly approved by Infineon Technologies in a written document signed by authorized
representatives of Infineon Technologies, Infineon Technologies’ products may not be used in any applications where a
failure of the product or any consequences of the use thereof can reasonably be expected to result in personal injury.
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