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NIPPON KAIJI .

KYOKAI

Certificate No. A-534-A of


TYPE APPROV2L

MANUFACTURER : Siemens AG A&D AS RD 423, Amberg, Germany

ARTICLE Programmable Electronic System

TYPE NO. SIMATIC S7-200

TYPE TEST NO. 01A027

PARTICULARS : Power Supply DC 24V, AC 120V or AC 230V

EQUIPMENT : Shown on the attached sheet.

DOCUMENTATION : Catalog ST 70 1999, Catalog ST 70 .News 2000,


Catalog ST 80 1999, Siemens Katalog CA 01 04/00SED,
0

Test report: AUT 7-B 8.4P-9602, A&D AS E423-0101


A&D AS RD 423-0301

TEST ITEMS : Shown on the attached sheet

THIS IS TO CERTIFY that the above mentioned type of article has been approved by the
"PON KAIJI KYOKAI in accordance with the requirements for the environmental tests
specified in the Society's Rules.
This certificate will remain in force until the 5th day of November 2007,

Issued at Tokyo on the 6th day of August 2003

YOkayama
General Manager,
Machinery Department

Note: The manufacturer, if desired, is requested to apply to the Society for renewal prior to the expiration date.

CS-2 e 2002.01
(PPON KAM1 KYOKAI
/
/
/

Attached sheet - 112


Ceriificate No. A-534-A

EQUIPMENT : CPU 210 I 212 1 214 I 215 / 216 I221 I 222 I224 I 226
SIM 274
MC 291
EM 221 I 222 1223 1231 I 232 / 235 I 241 1253
TD 200
CP 243

CS-2-Ae 2002-01
\ --

i
I
NIPPON KAM KYOKAI
/
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Attached sheet - 2/2
Certificate No. A-534-A

Test items: Applied test items are marked with X.

IWRONMENTAL TESTS Mark

{xtemal examination X

lperation test and performance test X

3lectric power supply failure test X

3lectric power supply fluctuation test X

'ower supply fluctuation test --


nsulation resistance test X

3igh voltage test X

'ressure test --
Dry heat test (Temperature 70°C x 16 hours) X

Damp heat test (Temperature 55"C, Humidity 97%, 16 hours, 2 cycles) X


____

Vibration test (Acceleration +l.Og x 90 min) X

inclination test

Cold test (Temperature -25°C x 16 hours) X

Salt mist test

Electrostatic discharge test X

Radiated radio Frequency i m m d t y test X


~~

Conducted low fiequency immunity test X

Conducted high frequency immunity test X

Burst/Fast transient immdty test X

Surge h u n i t y test X

Radiated emission test X

Conducted emission test X


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