7ME4-23 - Quality Control Lab

Swami Keshvanand Institute of Technology, Management &Gramothan,
Ramnagaria, Jagatpura, Jaipur-302017, INDIA

Approved by AICTE, Ministry of HRD, Government of India
Recognized by UGC under Section 2(f) of the UGC Act, 1956
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E-mail: info@skit.ac.in Web: www.skit.ac.in
Lab Manual
(7ME4-23: QUALITY CONTROL LAB)
Programme: B. Tech. Mechanical Engineering

Semester: VII
Session: 2021-22
Dr. Achin Srivastav

Associate Professor
Department of Mechanical Engineering
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Contents
1. Institute Vision/Mission/Quality Policy
2. Departmental Vision/Mission
3. RTU Scheme & Syllabus
4. List of Experiments
5. Index
6. Time Table
7. Course Outcomes
8. CO-PO-PSO Mapping Using Performance Indicators(PIs)
9. Experiments Write ups
10. Case Study (Sample)
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INSTITUTE VISION / MISSION / QUALITY POLICY
VISION
“To promote higher learning in advanced technology and industrial research to make
our country a global player.”
MISSION
“To promote quality education, training and research in field of Engineering by
establishing effective interface with industry and to encourage faculty to undertake
industry sponsored projects for students.”
QUALITY POLICY
We are committed to ‘achievement of quality’ as an integral part of our institutional
policy by continuous self-evaluation and striving to improve ourselves.
Institute would pursue quality in
• All its endeavours like admissions, teaching- learning processes, examinations, extra
and co-curricular activities, industry institution interaction, research & development,
continuing education, and consultancy.
• Functional areas like teaching departments, Training & Placement Cell, library,
administrative office, accounts office, hostels, canteen, security services, transport,
maintenance section and all other services.”
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VISION AND MISSION OF DEPARTMENT OF MECHANICAL ENGINEERING
Vision of the Department:
To become a nationally visible mechanical engineering department with excellence in

teaching- learning, research and development, entrepreneurship and industry outreach
activities.
Mission of the Department:
M1. To provide facilities and environment conducive to high quality education and
research and development in the field of mechanical engineering.
M2. To inculcate technical, professional and communication skills in students, staﬀ
and faculty members.
M3. To instil innovative skills, critical thinking, leadership & teamwork in students
through various teaching-learning activities and industry linkages.
M4. To inculcate strong ethical qualities in the students and faculty for realizing
lifelong learning and serving the society and nation at large.
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RTU Scheme & Syllabus

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List of Experiments
1. Case study on X bar and R charts and process capability analysis of an industrial process output
and process capability analysis of the process.
2. p Chart:
(a)To verify the Binomial Distribution of the number of defective balls by treating the balls
with a red colour to be defective.
(b) Plot a P-chart by taking a sample of n=20 and establish control limits
3. Case study on C-chart of a product and establish control limits.
4. Operating Characteristics Curve:
(a) To plot the operating characteristics curve for single sampling attribute plan for n = 20;
c = 0 , 1 , 2, 3. Designate the coloured ball to defective
(b) Compare the actual O.C. curve with theoretical O.C. curve using approximation for the
nature of distribution
5. Distribution Verification:
(a) To verify Normal Distribution using the experimental setup.
(b) To find the distribution of numbered cardboard chips by random drawing one at a time
with replacement. Make 25 subgroups in size 5 and 10 find the type of distribution of
sample average in each case. Comment on your observations
6. To carry out verification of Poisson distribution using experimental set up.
7. Central Limit Theorem
(a) To show that a sample means for a normal universe follow a normal distribution.
(b)To show that the sample means for a non normal universe also follow a normal Distribution.
8. Solve quality control problems using SPC software like STATGRAPHICS/MINITAB/SIGMA

XL /SYSTAT/EXCEL etc.
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Department of Mechanical Engineering

B.E. Semester – VII
Quality Control Lab (7ME4-23)
List of Experiments
Sr. Date of Date of

No. Title Performance submission Sign Remark
Case study on X bar and R charts and
1. process capability analysis
P Chart:
2. (a)Verify the Binomial Distribution of the
number of defective balls by treating the balls
with a red colour to be defective.
(b) Plot a P-chart by taking a sample of
n=20 and establish control limits
3.
To plot C-chart using given experimental
setup
Operating Characteristics Curve:

4. (a) Plot the operating characteristics curve for
single sampling attribute plan for n = 20; c = 0
, 1 , 2 Designate the coloured ball to defective
(b) Compare the actual O.C. curve with
theoretical O.C. curve using approximation
for the nature of distribution
5. Distribution Verification:
(a) Verification of Normal Distribution
(b) To find the distribution of numbered
cardboard chips by random drawing one at a
time with replacement. Make 25 subgroups
in size 5 and 10 find the type of distribution
of sample average in each case. Comment
on your observations
To carry out verification of Poisson distribution

6.
using experimental set up.
7. Central Limit Theorem:

(a) To show that a sample means for a normal
universe follow a normal distribution
(b) To show that the sample means for a non
normal universe also follow a normal
Distribution.
8. Solve problems using Statistical Process
Control software
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Applicable Programme Outcomes (POs) / Programme Specific Outcomes (PSOs)

for Quality Control Lab
The students will be able to:
PO1: Engineering knowledge: Apply the knowledge of mathematics, science, engineering

fundamentals, and mechanical engineering specialization to the solution of complex engineering
problems.
PO2: Problem analysis: Identify, formulate, review research literature, and analyze complex
engineering problems reaching substantiated conclusions using first principles of mathematics,
natural sciences, and engineering sciences.
PO4: Conduct investigations of complex problems: Use research-based knowledge and research
methods including design of experiments, analysis and interpretation of data, and synthesis of the
information to provide valid conclusions.
PO5: Modern tool usage: Create, select, and apply appropriate techniques, resources, and modern
engineering and IT tools including prediction and modeling to complex engineering activities with
an understanding of the limitations.
PO9: Individual and team work: Function effectively as an individual, and as a member or leader
in diverse teams, and in multidisciplinary settings.
PSO2: Participate and succeed in competitive examinations.
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Lab Planning
Swami Keshvanand Institute of Technology, Management &Gramothan, Ramnagaria, Jagatpura, Jaipur
Lab: Quality Control Lab Lab code 7ME4-23 MM 50 VII/A Duration 2 Hrs.
VII/A1
S. No. Roll No. Name of the student Group Week 1 Week 2 Week 3 Week 4 Week 5 Week 6 Week 7 Week 8
1 18ESKME002 Aadil Khan 1 2 3 4 5 6 7 8
2 18ESKME003 Aakarsh Mehta 1 2 3 4 5 6 7 8
3 18ESKME004 Aakash Sharma G1 1 2 3 4 5 6 7 8
4 18ESKME005 Abhishek Gupta 1 2 3 4 5 6 7 8
5 18ESKME006 Abhishek Sharma 1 2 3 4 5 6 7 8
6 18ESKME007 Abhishek Sharma 2 3 4 5 6 7 8 1
7 18ESKME008 Abhishek Singh 2 3 4 5 6 7 8 1
8 18ESKME009 Aditya Z Gupta G2 2 3 4 5 6 7 8 1
9 18ESKME010 Akshat Godha 2 3 4 5 6 7 8 1
10 18ESKME011 Akshay Mewara 2 3 4 5 6 7 8 1
11 18ESKME012 Aman Kumar Gupta 3 4 5 6 7 8 1 2
12 18ESKME013 Aman Sharma 3 4 5 6 7 8 1 2
13 18ESKME014 Amartya Pareek G3 3 4 5 6 7 8 1 2
14 18ESKME015 Aniket Arya 3 4 5 6 7 8 1 2
15 18ESKME016 Anshul Sharma 3 4 5 6 7 8 1 2
16 18ESKME018 Arnav Pareek 1 2 3 4 5 6 7 8
17 18ESKME019 Arpit Khandelwal 1 2 3 4 5 6 7 8
18 18ESKME020 Arvind Singh Khangarot G4 1 2 3 4 5 6 7 8
19 18ESKME021 Aryan Kumawat 1 2 3 4 5 6 7 8
20 18ESKME022 Asit Jain 1 2 3 4 5 6 7 8
21 18ESKME024 Avinash Singh 2 3 4 5 6 7 8 1
22 18ESKME025 Ayush Khandelwal G5 2 3 4 5 6 7 8 1
23 18ESKME026 Ayush Sharma 2 3 4 5 6 7 8 1
VII/A2
1 18ESKME027 Beni Ram 1 2 3 4 5 6 7 8
2 18ESKME028 Bhanu Kumar Mudgal 1 2 3 4 5 6 7 8
3 18ESKME029 Bhanu Prakash Singh G1 1 2 3 4 5 6 7 8
4 18ESKME030 Bhaskar Mathur 1 2 3 4 5 6 7 8
5 18ESKME032 Chetanya Jangir 1 2 3 4 5 6 7 8
6 18ESKME033 Chirag Patni 2 3 4 5 6 7 8 1
7 18ESKME034 Chitesh Garg 2 3 4 5 6 7 8 1
8 18ESKME035 Deepak Verma G2 2 3 4 5 6 7 8 1
9 18ESKME037 Dileep Menaria 2 3 4 5 6 7 8 1
10 18ESKME038 Divanshu Garg 2 3 4 5 6 7 8 1
11 18ESKME039 Divik Mathur 3 4 5 6 7 8 1 2
12 18ESKME041 Gagan Rajora 3 4 5 6 7 8 1 2
13 18ESKME042 Gaurav Hada G3 3 4 5 6 7 8 1 2
14 18ESKME043 Gunjan Khandelwal 3 4 5 6 7 8 1 2
15 18ESKME044 Harsh Kumar Sharma 3 4 5 6 7 8 1 2
16 18ESKME045 Harshit Mehta 1 2 3 4 5 6 7 8
17 18ESKME046 Himanshu Gothwal 1 2 3 4 5 6 7 8
18 18ESKME047 Himanshu Kushwah G4 1 2 3 4 5 6 7 8
19 18ESKME049 Hitesh Mishra 1 2 3 4 5 6 7 8
20 18ESKME050 Hritik Gaur 1 2 3 4 5 6 7 8
21 18ESKME051 Jatin Dhyawana 2 3 4 5 6 7 8 1
22 18ESKME052 Jatin Mehra G5 2 3 4 5 6 7 8 1
23 18ESKME053 Jaya Soni 2 3 4 5 6 7 8 1
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Lab: Quality Control Lab Lab code 7ME4-23 MM 50 VII/B Duration 2 Hrs.
VII/B1
1 18ESKME054 Jayesh Verma 1 2 3 4 5 6 7 8
2 18ESKME055 Juber Khan 1 2 3 4 5 6 7 8
3 18ESKME056 Kalpit Arya G1 1 2 3 4 5 6 7 8
4 18ESKME057 Kapil Raj Tanwar 1 2 3 4 5 6 7 8
5 18ESKME059 Karan Chawda 1 2 3 4 5 6 7 8
6 18ESKME060 Kartik Singhal 2 3 4 5 6 7 8 1
7 18ESKME061 Kashish Nawal 2 3 4 5 6 7 8 1
8 18ESKME062 Khushal Singh Panwar G2 2 3 4 5 6 7 8 1
9 18ESKME063 Kishlay Thakur 2 3 4 5 6 7 8 1
10 18ESKME065 Kshitiz Anurag 2 3 4 5 6 7 8 1
11 18ESKME066 Love Kumar 3 4 5 6 7 8 1 2
12 18ESKME067 Luckey Sharma 3 4 5 6 7 8 1 2
13 18ESKME068 Mannat Mehta G3 3 4 5 6 7 8 1 2
14 18ESKME069 Manoj Kumar Sahu 3 4 5 6 7 8 1 2
15 18ESKME070 Mohammed Danish 3 4 5 6 7 8 1 2
16 18ESKME071 Mohit Gautam 1 2 3 4 5 6 7 8
17 18ESKME072 Mohit Kumar Meena 1 2 3 4 5 6 7 8
18 18ESKME073 Mohit Tolani G4 1 2 3 4 5 6 7 8
19 18ESKME074 Naincy Kamthan 1 2 3 4 5 6 7 8
20 18ESKME075 Naitik Popli 1 2 3 4 5 6 7 8
21 18ESKME076 Navdeep Singh Rathore 2 3 4 5 6 7 8 1
22 18ESKME077 Naveen Pareek 2 3 4 5 6 7 8 1
G5
23 18ESKME078 Neeraj Choudhary 2 3 4 5 6 7 8 1
24 18ESKME079 Nikhil Bhatia 2 3 4 5 6 7 8 1
VII/B2
1 18ESKME080 Omprakash Dhakar 1 2 3 4 5 6 7 8
2 18ESKME081 Palash Madhukar 1 2 3 4 5 6 7 8
3 18ESKME082 Pankaj Yadav G1 1 2 3 4 5 6 7 8
4 18ESKME083 Panna Dan Rav 1 2 3 4 5 6 7 8
5 18ESKME084 Parth Sharma 1 2 3 4 5 6 7 8
6 18ESKME085 Pawan Kumar 2 3 4 5 6 7 8 1
7 18ESKME086 Pimpale Dipesh Gajanan 2 3 4 5 6 7 8 1
8 18ESKME088 Pradeep Jangid G2 2 3 4 5 6 7 8 1
9 18ESKME089 Pradyuman 2 3 4 5 6 7 8 1
10 18ESKME090 Prakhar Bhardwaj 2 3 4 5 6 7 8 1
11 18ESKME091 Prateek Kumar 3 4 5 6 7 8 1 2
12 18ESKME092 Praveen Kathat 3 4 5 6 7 8 1 2
13 18ESKME093 Priyanka Soni G3 3 4 5 6 7 8 1 2
14 18ESKME094 Puneet Kumawat 3 4 5 6 7 8 1 2
15 18ESKME095 Raghuraj Singh Shekhawat 3 4 5 6 7 8 1 2
16 18ESKME096 Rajan Sharma 1 2 3 4 5 6 7 8
17 18ESKME097 Rajat Gagar 1 2 3 4 5 6 7 8
G4
18 18ESKME098 Rajat Gautam 1 2 3 4 5 6 7 8
19 18ESKME099 Rajat Kumar Saini 1 2 3 4 5 6 7 8
20 18ESKME101 Ravi Shankar Suthar 2 3 4 5 6 7 8 1
21 18ESKME102 Rhythm Purohit G5 2 3 4 5 6 7 8 1
22 18ESKME103 Rishabh Shrivastava 2 3 4 5 6 7 8 1
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Lab: Quality Control Lab Lab code 7ME4-23 MM 50 VII/C Duration 2 Hrs.
VII/C1
1 18ESKME104 Ritik Gupta 1 2 3 4 5 6 7 8
2 18ESKME105 Rohan Sharma 1 2 3 4 5 6 7 8
3 18ESKME106 Rohit Singh Dhakar G1 1 2 3 4 5 6 7 8
4 18ESKME107 Roshan Nama 1 2 3 4 5 6 7 8
5 18ESKME108 Rudraksh Shringi 1 2 3 4 5 6 7 8
6 18ESKME109 Sagar Naval 2 3 4 5 6 7 8 1
7 18ESKME111 Saksham Jain 2 3 4 5 6 7 8 1
8 18ESKME112 Samardeep Singh Chopra 2 3 4 5 6 7 8 1
9 18ESKME113 Sankit Sharma 2 3 4 5 6 7 8 1
10 18ESKME114 Sarthak Agarwal G2 2 3 4 5 6 7 8 1
11 18ESKME115 Satendra Singh 3 4 5 6 7 8 1 2
12 18ESKME116 Saurabh Boswal 3 4 5 6 7 8 1 2
13 18ESKME117 Shadab Qureshi 3 4 5 6 7 8 1 2
14 18ESKME118 Shekhar Sharma 3 4 5 6 7 8 1 2
15 18ESKME120 Shivam Sharma G3 3 4 5 6 7 8 1 2
16 18ESKME121 Shobhit Sharma 1 2 3 4 5 6 7 8
17 18ESKME122 Shubham Jaiman 1 2 3 4 5 6 7 8
18 18ESKME123 Sohail Khan Jatu 1 2 3 4 5 6 7 8
19 18ESKME124 Somin Seth 1 2 3 4 5 6 7 8
20 18ESKME125 Sourabh Kumawat G4 1 2 3 4 5 6 7 8
21 18ESKME126 Suleman Ahmed 2 3 4 5 6 7 8 1
22 18ESKME127 Sunny Motwani 2 3 4 5 6 7 8 1
G5
23 18ESKME128 Suraj Singh Rathore 2 3 4 5 6 7 8 1
24 18ESKME129 Surbhi Agarwal 2 3 4 5 6 7 8 1
25 18ESKME130 Tanmay Pandey 1 2 3 4 5 6 7 8
26 18ESKME131 Tanmay Verma G6 1 2 3 4 5 6 7 8
27 18ESKME133 Tanveer Singh Nathawat 1 2 3 4 5 6 7 8
VII/C2
1 18ESKME134 Tejasv Kumar Sharma 1 2 3 4 5 6 7 8
2 18ESKME135 Tushar Jain 1 2 3 4 5 6 7 8
3 18ESKME136 Tushar Purohit G1 1 2 3 4 5 6 7 8
4 18ESKME137 Tushar Sharma 1 2 3 4 5 6 7 8
5 18ESKME138 Umesh Kumar Jangir 1 2 3 4 5 6 7 8
6 18ESKME139 Vaibhav Bhardwaj 2 3 4 5 6 7 8 1
7 18ESKME140 Vaibhav Karwasra 2 3 4 5 6 7 8 1
8 18ESKME141 Vikas Kumar Tank 2 3 4 5 6 7 8 1
9 18ESKME142 Vikas Yadav 2 3 4 5 6 7 8 1
10 18ESKME143 Vikash Saini G2 2 3 4 5 6 7 8 1
11 18ESKME144 Virendra Sharma 3 4 5 6 7 8 1 2
12 18ESKME145 Vishal Gupta 3 4 5 6 7 8 1 2
13 18ESKME146 Vishal Kumar Sonwal 3 4 5 6 7 8 1 2
14 18ESKME148 Vishnu Kumar Sharma 3 4 5 6 7 8 1 2
15 18ESKME149 Yagyashish Choudhary G3 3 4 5 6 7 8 1 2
16 18ESKME150 Yagyesh Sharma 1 2 3 4 5 6 7 8
17 18ESKME151 Yash Maheshwari 1 2 3 4 5 6 7 8
18 18ESKME152 Yash Rathore G4 1 2 3 4 5 6 7 8
19 18ESKME153 Yogendra Singh 1 2 3 4 5 6 7 8
20 18ESKME154 Yogit Kumar 1 2 3 4 5 6 7 8
21 18ESKME155 Yugal Sharma 2 3 4 5 6 7 8 1
22 19ESKME200 Abhishek Ajmera 2 3 4 5 6 7 8 1
G5
23 19ESKME201 Akash Kumar Pandey 2 3 4 5 6 7 8 1
24 19ESKME202 Harsh Upadhyay 2 3 4 5 6 7 8 1
25 19ESKME203 Jatin Sharma 1 2 3 4 5 6 7 8
26 19ESKME204 Jay Kumar Sharma G6 1 2 3 4 5 6 7 8
27 19ESKME205 Prem Pal Kumawat 1 2 3 4 5 6 7 8
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Lab: Quality Control Lab Lab code 7ME4-23 MM 50 VII/D Duration 2 Hrs.
VII/D1
1 18ESKME701 Aditya Narayan Sharma 1 2 3 4 5 6 7 8
2 18ESKME702 Akshay Kumar Sharma 1 2 3 4 5 6 7 8
3 18ESKME703 Akshay Verma G1 1 2 3 4 5 6 7 8
4 18ESKME704 Anupam Roy 1 2 3 4 5 6 7 8
5 18ESKME705 Ashok Sharma 1 2 3 4 5 6 7 8
6 18ESKME706 Asif Mohmmad 2 3 4 5 6 7 8 1
7 18ESKME707 Atul Jangid 2 3 4 5 6 7 8 1
8 18ESKME708 Awani Audichya 2 3 4 5 6 7 8 1
9 18ESKME709 Bharat Sharma 2 3 4 5 6 7 8 1
10 18ESKME710 G2
Bhupeshwar Pal Singh Chandawat 2 3 4 5 6 7 8 1
11 18ESKME711 Deepak Kumar Mina 3 4 5 6 7 8 1 2
12 18ESKME712 Deepak Yadav 3 4 5 6 7 8 1 2
13 18ESKME714 Divyansh Soni 3 4 5 6 7 8 1 2
14 18ESKME716 Harsh Sharma 3 4 5 6 7 8 1 2
15 18ESKME717 Harshit Kannariya G3 3 4 5 6 7 8 1 2
16 18ESKME720 Hritik Maratha 1 2 3 4 5 6 7 8
17 18ESKME721 Ishan Dewat 1 2 3 4 5 6 7 8
18 18ESKME722 Kalyan Singh 1 2 3 4 5 6 7 8
19 18ESKME723 Kartikay Singh 1 2 3 4 5 6 7 8
20 18ESKME725 Keshav Kantharia G4 1 2 3 4 5 6 7 8
21 18ESKME726 Luv Sharma 2 3 4 5 6 7 8 1
22 18ESKME127 Sunny Motwani 2 3 4 5 6 7 8 1
G5
23 18ESKME128 Suraj Singh Rathore 2 3 4 5 6 7 8 1
24 18ESKME129 Surbhi Agarwal 2 3 4 5 6 7 8 1
25 18ESKME130 Tanmay Pandey 1 2 3 4 5 6 7 8
26 18ESKME131 Tanmay Verma G6 1 2 3 4 5 6 7 8
27 18ESKME133 Tanveer Singh Nathawat 1 2 3 4 5 6 7 8
VII/D2
1 18ESKME727 Manish Gaur 1 2 3 4 5 6 7 8
2 18ESKME728 Mohammed Younus 1 2 3 4 5 6 7 8
3 18ESKME729 Nishant Jain G1 1 2 3 4 5 6 7 8
4 18ESKME730 Pankaj 1 2 3 4 5 6 7 8
5 18ESKME731 Pavan Kumar Meena 1 2 3 4 5 6 7 8
6 18ESKME732 Piyush Kucheria 2 3 4 5 6 7 8 1
7 18ESKME733 Piyush Meena 2 3 4 5 6 7 8 1
8 18ESKME734 Priyambada Singh Shekhawat 2 3 4 5 6 7 8 1
9 18ESKME735 Priyansh Indoria 2 3 4 5 6 7 8 1
10 18ESKME736 Pushpendra Singh Shekhawat G2 2 3 4 5 6 7 8 1
11 18ESKME738 Rahul Yadav 3 4 5 6 7 8 1 2
12 18ESKME739 Raj Kumar Meena 3 4 5 6 7 8 1 2
13 18ESKME740 Rajat Sharma 3 4 5 6 7 8 1 2
14 18ESKME741 Rajkumar Gangwar 3 4 5 6 7 8 1 2
15 18ESKME743 Rohit Kumar G3 3 4 5 6 7 8 1 2
16 18ESKME745 Rohit Verma 1 2 3 4 5 6 7 8
17 18ESKME746 Sahil Soni G4 1 2 3 4 5 6 7 8
18 18ESKME747 Shani Sen 1 2 3 4 5 6 7 8
19 18ESKME749 Sourabh Maharshi 1 2 3 4 5 6 7 8
20 18ESKME750 Suprit Sharma G5 1 2 3 4 5 6 7 8
21 18ESKME753 Vibhore Gupta 1 2 3 4 5 6 7 8
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Marking Scheme
Internal
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EXPERIMENT No. 01
OBJECTIVE:
To plot 𝑋̅ and R charts for a given manufacturing process and thereby conduct the process
capability analysis.
EQUIPMENTS REQUIRED:
1) 50 pieces of mild steel workpiece obtained from the manufacturing process for which
control charts are to be established.
2) A Vernier Caliper.
3) Appendices for estimating values of constants.
THEORY:
1. Types of Data: The data seen in daily life can be broadly categorized into two types:
a. Quantitative or Variable data that deals with numbers and things we can measure
objectively such as height, width, length, temperature, humidity prices, area, volume etc.
Variable data can be further classified as continuous data (for example pressure, weight,
length etc.) and discrete data (for example number of accidents that happened in a city
in a year, persons eligible for voting in a country, number of movies in the 300 crores
club etc.)
b. Qualitative or Attribute data that deals with characteristics and descriptors that can’t
be easily measured but can be observed subjectively such as smells, tastes, textures,
attractiveness, color etc. These types of data are generally binary in nature such as
right/wrong, true/false or accept/reject etc.
2. Control Charts: A control chart is a statistical tool used to distinguish between variation
in process resulting from common causes and variation resulting from special causes. It
presents a graphic display of process stability or instability over time. A control chart
always has a central line for the average an upper line for upper control limit and a lower
line for the lower control limit. Depending upon the type of data encountered there are
two main categories of control charts: control chart for variables and control chart for
attributes.
a. Control Chart for variables: This category of control chart displays values resulting
from the measurement of a continuous variable. Examples of variables data are elapsed
time, temperature, radiation dose etc. Examples include 𝑋 chart, R chart, σ chart etc.
b. Control Chart for attributes: This category of control chart displays data that result
from counting the number of occurrences or items in a single category of items or
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occurrences. These count data may be expressed aa pass/fail, yes/no or presence/absence

of a defect. For example, p-chart, c-chart etc.
3. ̅ and R charts: An 𝑋̅ and R charts are a type of statistical process control charts used
𝑿
with continuous data collected in subgroups at set time interval usually between 3 to 5
pieces per subgroup. The 𝑋̅ charts is used to analyze the average level of a process the R
chart is used to analyze the spread or dispersion. Taken together they indicate whether
or not the process is stable that is whether a constant system of chance causes appears to
be operating.
4. Process Capability : It is the ability of a process to meet the product design and technical
specification when process is under statistical control. process capability index (Cp) can
be expressed as :
𝑎𝑙𝑙𝑜𝑤𝑎𝑏𝑙𝑒 𝑝𝑟𝑜𝑐𝑒𝑠𝑠 𝑣𝑎𝑟𝑖𝑎𝑡𝑖𝑜𝑛 𝑈𝑆𝐿−𝐿𝑆𝐿

Cp= =
𝑎𝑐𝑡𝑢𝑎𝑙 𝑝𝑟𝑜𝑐𝑒𝑠𝑠 𝑣𝑎𝑟𝑖𝑎𝑡𝑖𝑜𝑛 6σ’
where, USL= Upper speci fication limit for the dimension LSL= Lower specification limit
for the dimension
σ' = standard deviation of the process
In general,
Value of Cp Interpretation
Cp<1.0 Poor process
Cp=1 Nearly OK
Cp=1.3-1.5 Good
Cp=2 Excellent that is 6 σ
PROCEDUR .AL STEPS:
Let us consider a manufacturing process in which pieces of nearly 22 mm diameter and 40

mm length mild steel rod to be turned to 20+ 0.1 mm diameter by a skilled operator ,
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selecting suitable speed , feed and depth of cut one lathe machine the process capability of
which is to be studied.
1) Record all preliminary information on the observation sheet.

Name of Quality Inspector Date of Inspection Supervisor’s
Verification
----------------------
--------------------- -------------
Title: Variable Control chart Operation :Turning
No of sub X1 X2 X3 X4 X5 Sub group Sub

groups(n) mean(X) Group
Range(R)
10
2) Draw five pieces from finished pieces to form one sub group.
3) Continue this till 10 sub group are drawn at regular intervals from the process.
4) Arrange the sub groups in serial order.
5) Measure the diameter of the pieces in each sub group and enter the measurement on the
calculation sheet.
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6) Compute 𝑋̅ and R charts for each group and post at appropriate places.
7) Compute 𝑋̅ and R and post in the observation sheet.
8) Estimate control limits for 𝑋̅ and R charts using formulas given below:
UCLx = X̿ + A2𝑅̅
LCLx = X̿ - A2𝑅̅ (A2=0.58 for sub group size 5)
UCLR = D4R ( D4 = 2.11 for sub group size 5)

LCLR=D3 R (D3 =0 for sub group size 5)
9) Plot the control charts and post the value 𝑋̿ as mean line on the 𝑋̅ chart and value of 𝑅̅
as mean line on R chart.
10) Plot the values of 𝑋̅ and R for individual sub groups in the respective charts.
X Bar Control Chart

22
21.5 X BAR
21
20.5 UCL
Mean
20
19.5 LCL
19
18.5 CL
18
1 2 3 4 5 6 7 8 9 10
Sample No.
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R chart
4
3.5
3 R
2.5 UCL
Range
2 LCL
1.5
1 CL
0.5
0
1 2 3 4 5 6 7 8 9 10
Sample No.
11) Examine the charts to see whether all points are within control limits.
(if any point falls outside the control limit it means that assignable causes are present
which could be found and eliminated. On this assumption eliminate such points and
recalculate 𝑋̿ and corresponding values until all sub groups are within control limits)
12) Calculate the dispersion of the process 𝜎 = 𝑅̅/d2 (d2=2.326 for sub group size 5) and
thereby calculate the actual process variation 6 𝜎.
13) Estimate the value of process capability index using the formula
14) Estimate the value of allowable process variation as USL-LSL.
15) Comment the nature of process on the basis of obtained result.
RESULT: 𝑋̅ and R charts for the process have been established as shown. The process
capability index has been found to be………………………………….
CONCLUSION:
……………………………………………………………………………………………
……………………………………………………………………………………………
………………
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EXPERIMENT NO. 02
OBJECTIVES:
p Chart
(a) Verify the Binomial distribution of the number of defective balls by treating the balls with red
colour to be defective.
(b) Plot a p-chart by taking a sample of n=20 and establish control limits.
MATERIALS REQUIRED:
Plastic box with 100 balls. White balls (70) represent normal product and Red balls (30)
represent defective ones.
I. Wooden paddle to scoop balls at a time.
II. Data sheet for calculation of p Chart
THEORY:
In probability theory and statistics, the binomial distribution with parameter N and p is the discrete
probability distribution of the number of success in a sequence of N independent yes/no experiments
each of which yields success with probability p. A success/failure experiment on Bernoulli
experiment when N = 1 the binomial distribution is a Bernoulli distribution. The Binomial distribution
is frequently used to model the number of successes in a sample of size n drawn with replacement
from a population of size N.
In Statistical Quality Control the p chart is a type of control chart used to monitor the proportion of
nonconforming units in a sample, where the sample proportion is defined as the ratio of the number
of nonconforming units to sample size n. it is an Attributes control chart.
PROCEDURE
1. Record all preliminary information on the calculation sheet.

2. Take the subgroup of 10 balls each and count the defective balls from each subgroup with
replacement.
3. Take out total 20 samples and make a table.
4. Calculate total number for zero defects,1 defect, 2 defects and so on.
𝛴𝐷
5. Calculate % defectives of each sample, 𝑝̂𝑖 = 𝑛 𝑖 , 𝑖 = 1,2,3 … 𝑚
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Where, 𝑝̂𝑖 = sample i, fraction nonconforming.

6. Record values of fraction nonconforming in the below observation table.
Table 1: Fraction defective (nonconformity) in each sample
Sample No. Sample ̂𝒊

No of defective balls Fraction defective, 𝒑
(i =1 to m) Size, n in sample, Di
7. Calculate average fraction defective =Total no of defectives /Total no of pieces inspected.

∑𝑚
𝑖=1 𝐷𝑖 ∑𝑚
𝑖=1 𝑝̂𝑖
𝑝̅ = =
𝑚𝑛 𝑚
Di = number of nonconforming items in a sample i
n = sample size
m = number of samples
8. Estimate control limits.
CL = 𝑝̅
𝑝̅ (1−𝑝̅ )
UCL = 𝑝̅ + 3√
𝑛
𝑝̅ (1−𝑝̅ )
LCL = 𝑝̅ - 3√
𝑛
9. Plot p chart.
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p Chart
0.8
Sample fraction nonconforming, p^
0.7
0.6
p
0.5
CL
0.4
UCL
0.3
LCL
0.2
0.1
0
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20
Sample Number
10. Calculate experimental probability for P0, P1, P2 etc., referring the observation Table 1 and
record the values of frequency and experimental probability in the Table 2.
Table 2: Practical (Experimental) Probability
S.no No of Frequency Practical Practical (Experimental)

defective balls (Occurrence of (Experimental) Probability Value is equal
in sample, Di Di defect in N Probability to Frequency/N
(0 to n) trials)
1 0 P0
2 1 P1
3 2 P2
n+1 n Pn
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11. Calculate the theoretical probability by using binomial expression for P 0, P1, P2 etc.
P(X = r) = (𝑁𝑟)𝑝𝑟 𝑞 𝑁−𝑟 , r = 0,1, 2…n
𝑁!
Where, (𝑁𝑟) = 𝑟!(𝑁−𝑟)!
N = number of trials
p = probability of success
q = probability of failure
r = number of successes
n = sample size
12. Record the values of theoretical probability in Table 3.
Table 3: Theoretical Probability
S.no No of defective balls in Theoretical Theoretical Probability

sample, Di or ri (0 to n) Probability Value
1 0 P0
2 1 P1
3 2 P2
n+1 n Pn
13. Record the values of experimental and theoretical probability referring Table 2 and 3 in the
Table 4.
Table 4: Comparison of Theoretical and Practical Probability
No of Probability Practical Theoretical

defective balls (Experimental) probability
in sample, Di Probability
or ri (0 to n)
0 P0
1 P1
2 P2
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n Pn
14. Plot the experimental and theoretical probability curves.
Experimental Probability Curve

0.35
0.3
0.25
Probability
0.2
0.15
0.1
0.05
0
0 1 2 3 4 5 6 7 8 9 10
Defective
0.25
Theoritical Probability Curve

0.2
0.15
Probability
0.1
0.05
0
0 1 2 3 4 5 6 7 8 9 10
Defective
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Comparing Theoritical and Experimental Probability

0.35
0.3
0.25
Experimental
Probability
0.2 Probability
0.15
Theoritical Probability
0.1
0.05
0
0 1 2 3 4 5 6 7 8 9 10
Defective
RESULT:
CONCLUSION:
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EXPERIMENT No. 3
OBJECTIVE: Case study on c chart of a product and to establish control limits.
CASE STUDY: To inspect a manufacturing lot of lathe jobs on the basis of 5 parameters and to
count total number of defects in each job.
MATERIALS AND EQUIPMENT REQUIRED:
1. About 30 similar jobs (products) from workshop.

2. Data Sheet, measuring instruments etc.
THEORY:
In statistical quality control the c chart is a type of control chart used to monitor count type data
typically total no of nonconformities per unit. It is also occasionally used to monitor total number of
events occurring in a given time. The C chart differs from p chart in that it accounts for the possibility
of more than one nonconformity per inspection unit and that it requires a fixed sample size. The p
chart models pass fail type inspection only while the c Chart give the ability to distinguish between,
for example there are 2 items which fail inspection because of one fault each and the same two items
failing inspection with 5 faults each in the former case the p chart will show two non-conformant
items while the c chart will show 10 faults.
PROCEDURE:
1. Draw randomly a job from the lot. Inspect 5 parameters or attributes to identify defect in the
job.
2. Repeat it till 30 jobs are inspected from the lot and count total number of defects in each job.
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Figure 1: Defects in a job
3. Record the number of defects in Table 1.
Table 1: Fraction defective (nonconformity) in each sample
Count
Sample Number
No. Turning Facing Grooving Threading Knurling of Defects
1 OKAY OKAY OKAY DEFECT DEFECT 2
2
3
… … … … … …
30
4. Add up, the total the number of defects and divide by the number of jobs inspected to obtain
the value of 𝑐̅.
Total Number of Defects
𝑐̅ = Number of Jobs Inspected
5. Compute trial control limits using the formula

CL = 𝑐̅
UCL= 𝑐̅ +3√𝑐̅
LCL = 𝑐̅ - 3√𝑐̅
6. Prepare a graph sheet to mark job number 1 to 30 on the abscissa and number of defects on
the ordinate.
7. Draw 3 firm lines at appropriate heights to represent CL, UCL and LCL(remember if the value
of LCL comes to be negative LCL is to be assumed as equal to 0).
8. Mark the number of defects for each job for all the 30 jobs.
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10 c Chart
Numer of Defects
No.of
Defects
5 CL
0
1 3 5 7 9 11 13 15 17 19 21 23 25 27 29
Samples (Jobs)
Figure 2: c Chart
9. Check whether any point has fall outside the control limit.
10. If so, discard the data for such jobs and recalculate 𝑐̅ and upper and lower control limits. These
will be forwarded for the future production.
SIGNIFICANCE:
Some products may have defects which may not make them defective i.e. unsuitable to render the
intended services, However the number of such defects increases. The product tends to become
defective example are surface imperfection on a dining table such as scratches, nicks etc., air
inclusions on a glass plate, minor defect on castings etc. The manufacturer needs the information
regarding the occurrence of such defects to know whether production process is proceeding
normal or any assignable causes has set in, so that he could maintain the desired quality level.
The C chart is a tool towards this end.
RESULT:
CONCLUSION:
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EXPERIMENT No. 04
OBJECTIVES
Operative characteristics curve:
a. Plot the operating characteristics curve for single sampling attribute plan for n=20, c=1,2,3
designate the red ball to defective.
b. Compare the actual O.C. curve with theoretical O.C. curve using approximation for the nature
of distribution.
MATERIALS REQUIREMENTS
Plastic box with 100 white and colored balls. White balls represent normal product and colored
balls represent % of defective when these are considered separate. One typical specification of
the context is
White 82
Yellow 10
Green 5
Red 2
Blue 1
These balls together can be used to simulate lots containing varying % of defectives as follows:-
When yellow balls alone are considered defectives and all the remaining balls are classified as
good it represents a lot with 10 % defectives. Similarly, green balls represent 5%, red 2% and
blue 1% defectives.
PROCEDURE
1. Enter the percent values for the different lots with green, yellow, red, blue as defectives
respectively.
2. Thoroughly mix the balls and randomly draw 10 balls.
3. Record the number of yellow, green, red and blue balls as well if any of these are absent
enter zero in respective column. Return the balls mix it again and repeat it till 20 times.
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Percent defective
10% 5% 2% 1%
Yellow Green Red Blue
Sample No. Ball Ball Ball Ball
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Count No. of Defectives (0)
Acceptance No. C(0) =count(0)
Acceptance No. C(1)
=count(0)+count(1)
Acceptance No. C(2)
=count(0)+count(1)+count(2)
Acceptance No. C(2)
=count(0)+count(1)+count(2)+count(3)
Probability of Acceptance C(0)=
Acceptance No. C(0)/ 20
Probability of Acceptance C(1) =
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4.Determine for each sampling plan having acceptance numbers c=0,1,2 and 3 whether the lots
should be accepted or not depending on the number of defectives found in the sample. If accepted
leave the square below the acceptance number blank and if rejected mark in the square
5. Using this data plot the o.c. curve for c=0 to c=3 on the graph sheet taking % defectives on
the abscissa and probability of acceptance along the ordinate.
6. Compute theoretical probability as:
Experimental OC Curve
Probability of Acceptance, Pa
1
C=0
0.8
C=1
0.6
0.4 C=2
0.2 C=3
0
0% 2% 4% 6% 8% 10%
Perecent Defectives
𝐶
𝜆𝑥 𝑒 −𝜆
𝑃𝑟𝑜𝑏𝑎𝑏𝑖𝑙𝑖𝑡𝑦 𝑜𝑓 𝐴𝑐𝑐𝑒𝑝𝑡𝑎𝑛𝑐𝑒, 𝑃𝑎 (𝑥 = 𝑑𝑒𝑓𝑒𝑐𝑡 ≤ 𝐶 ) = ∑
𝑥!
𝑥=0
Here 𝜆 = 𝑛𝑝
Where n= sample size

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p= probability of defective item
7. Plot Theoretical OC Curve
Theoretical OC Curve
1
Probability of Acceptance, Pa
0.8 C=0
C=1
0.6
C=2
0.4 C=3
0.2
0
0% 2% 4% 6% 8% 10%
Percent Defectives
SIGNIFICANCE:
The operating characteristics curve for a sampling plan having a particular combination of sample
size and acceptance no shows how well the plan discriminates between good and bad lots. It
shows how the probability of acceptance varies as the quality level of lots submitted change. If
the quality of the lots submitted changes. If the quality of the lots submitted is good the probability
of acceptance should be high but if the quality of incoming lots is poor the probability of
acceptance should be low.
In this simulation the same set of balls were used to represent lots with varying % defectives. The
sample size was kept constant but the acceptance number varied from 0 to 3. Thus we had 4
sampling plans in operation resulting in 4 set of o.c. curves.
A study of these curve will show how each plan discriminate good and bad lots controls the
quality of accepted lots.
RESULT
CONCLUSION
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EXPERIMENT NO. 5
OBJECTIVE- Distribution Verification
a) Verification of Normal distribution

b) To find the distribution of numbered chits by random drawings one at a time with
replacement. Make 20 subgroups of size 5 and 10. Find the type of distribution of sample
average in each case Comment on your observations.
(1) Plastic Box with chit papers.
(2) Normal distribution calculation sheet.
THEORY-
A normal distribution is a very important statistical data distribution pattern occurring in many natural
phenomena such as height, blood pressure, lengths of objects produced by machines etc. Certain data
of when graphed as a histogram (data on horizontal axis , amount of data on vertical axis created a
bell shaped curve known as Normal curve or Normal distribution.
Normal distributions are symmetrical with a central peak at the mean(average) of the data. The shape
of the curve is distributed as bell shape with graph falling off evenly on either side of the mean. 50%
of the distribution lies to the left of the mean and 50% lies to the right of the mean. The spread of
Normal distribution is controlled by the standard deviation. The smaller the standard deviation the
more concentrated the data.
The mean and the median are the same in Normal distribution.
A continuous random variable is a variable whose possible value from sum internal of number
typically a continuous probability distribution a function that tells the probability that any real
observation will falls between any two real limits or real numbers as the curve approach 0 on the
other side.
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If you add percentages you will see that approximately:
 68% of the distribution lies within one standard deviation of the mean.
 95% of the distribution lies within two standards deviation of the mean.
 99.7% of the distribution lies within three standard deviation of the mean.
PROCEDURE
1) Record all preliminaries information on the calculation sheet.

2) Take the subgroup of 5 chits and write down reading from each subgroup with replacement.
Sample X1 X2 X3 X4 X5 Mean
No.
… … … … … … …
20
3) Total 20 samples are drawn.

4) Find out the mean value for each sub group.
5) Group the data of averages and prepare frequency table.
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Class Xi (Mid Frequency, fi Xi μ Xi - μ (Xi – μ)2 fi(Xi – μ)2

Interval Value) fi
16-18 17
18-20 19
20-22 21
22-24 23
24-26 25
26-28 27
28-30 28
⅀ fi = ⅀ fi Xi = ⅀fi(Xi – μ)2=
6) Compute mean and standard deviation.

MEAN μ = ⅀ fi Xi / ⅀ fi
⅀fi(Xi – μ)2
STANDARD DEVIATION= √ N−1
Here N= ⅀ fi
7) Plot the Normal Distribution Curve
Normal DistributionnCurve
40
30
Frequency
20
10
0
0 20 40 60 80 100
-10
Random Variable, Xi
RESULT-
CONCLUSION-
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EXPERIMENT NO. 6
OBJECTIVE: Verification of Poisson Distribution
MATERIALS, EQUIPMENT REQUIRED:
Plastic box with total 300 matchsticks, non-defective (280) and represent normal procedure and 20
represent defective products.
1. Wooden paddle
2. Data sheet
THEORY
A Poisson experiment is a statistical experiment that has the following properties:
 The experiment results in outcomes that can be classified as successes or failures.

 The average number of successes that occur in a specified region is known.
 The probability that a success will occur is proportional to the size of the region.
 The probability that a success will occur in an extremely small region is virtually zero.
Note that the specified region could take many forms. For instances it could be a length, an area, a
volume, a period of time etc.
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PROCEDURE:
1. Record all preliminary information on the calculation sheet.

2. Take the subgroups of 5-5 matchsticks and count the defective sticks.
3. Each subgroup is drawn with replacement.
4. Total 10 samples are taken out and record the number of defectives in the observation table.
OBSERVATION TABLE:
Sample Number Sample Size No of Defectives
5. Calculate the total number for zero defect, one defect,2 defect and so on.
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6. Calculate the probability for p0,p1 and p2 ………………etc

7. Plot experimental probability curve.
Experimental Probability
0.3
0.25
0.2
Probability
0.15
0.1
0.05
0
0 1 2 3 4 5 6 7 8 9 10
k
8. Calculate theoretical probability by using Poisson expression for each p0,p1,p2………..etc
𝜆𝑘 𝑒 −𝜆
𝑃(𝑥 = 𝑘) =
𝑘!
Here 𝜆 = 𝑛𝑝
n= sample size
p= probability of defective item
p=defective matchsticks =20/300
k=0,1,2,3…..
9. Plot Theoretical Probability Curve

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0.3 Theoretical Probability

Probability
0.2
0.1
0
0 1 2 3 4 5 6 7 8 9
k
COMPARISON TABLE:
No. of Defectives (k) Practical Probability Theoretical Probability
RESULT-
CONCLUSION-
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EXPERIMENT NO. 7
OBJECTIVE- Central Limit Theorem:
(a) To show that a sample means for a normal universe follow a normal distribution
(b) To show that the sample means for a non normal universe also follow a normal Distribution.
THEORY-
In probability theory, the central limit theorem (CLT) establishes that, in many situations,
when independent random variables are summed up, their properly normalized sum tends toward
a normal distribution even if the original variables themselves are not normally distributed.
The theorem is a key concept in probability theory because it implies that probabilistic
and statistical methods that work for normal distributions can be applicable to many problems
involving other types of distributions.
PROCEDURE

2) Take the subgroup of 5 chits and write down reading from each subgroup with replacement
from a non -normal universe.
No.
… … … … … … …
30

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Interval Value) fi
⅀ fi = ⅀ fi Xi = ⅀fi(Xi – μ)2=

⅀fi(Xi – μ)2
Here N= ⅀ fi
7) Plot the Non Normal Distribution Histogram and Curve
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Non-Universe Means Groups Distribution Curve

25
20
15
Frequency
10
5
0
0 10 20 30 40
Mid value of Sample Means group

9) Take the subgroup of 5 chits and write down reading from each subgroup with replacement
from a normal universe.
No.
… … … … … … …
30


Interval Value) fi
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⅀ fi = ⅀ fi Xi = ⅀fi(Xi – μ)2=
⅀fi(Xi – μ)2
Here N= ⅀ fi
14) Plot the Norma Universe Histogram and Distribution Curve

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Normal Universe Sample Means group

Distribution Curve
20
15
Frequency
10
5
0
0 2 4 6
Sample Means Group Mid Values
RESULT-
CONCLUSION-
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Experiment No. 8
OBJECTIVE- Solve problems using available Statistical Process Control software
Statistical process control problem: A process manufacture 20 ± 1 mm diameter specimens of 100

mm length. Determine whether the process is in control. Compute the process capability index.
THEORY-
Software- Minitab
Minitab is an easy-to-use statistical package which can carry out a wide variety of statistical tasks. It
provides a simple, effective way to input the statistical data, manipulate that data, identify trends and
patterns, and then extrapolate answers to the current issues. This is most widely used software for
business of all sizes - small, medium and large. It provides a quick, effective solution for the level of
analysis required in most of the statistical process control problems. Minitab company headquarter is in
the State College, Pennsylvania, USA.
Minitab software has:

Session Window:
This window displays the statistical results of data analysis.
Worksheet Window:
This window contains rows and columns which are used to enter and manipulate the data. This window
looks like a spread sheet but the changes cannot be saved automatically.
The Graph window:
This window will be opened when the graph is generated.
Report Window:
With this window one can sort out the results
Solution:
The 5 specimens are picked randomly from the lots of 100 and diameter is inspected with the Vernier
Calipers. 10 different samples (sub groups of size 5) are inspected. The diameter obtained for each
sample of 5 specimens are listed below. Minitab Software is used to solve the above statistical process
control problem.
PROCEDURE-
Load the Minitab software

Start > Programs > Statistical Software > Minitab File > New > Save Worksheet > Exp8.MTW
From Menu Toolbar select calc
Calc > Make Patterned Data > Simple Set of Numbers
Enter: Store patterned data in : C1 from first value: 1 to last value: 10 > Ok>
Enter the diameters of specimens for sample 1 to 10 in columns C2 to C6 below X1 to X5.
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From Menu Toolbar select calc

Calc > Row statistics > Select > Mean > Input variables > X1-X5 > Select > Store results in > Mean >
OK
Calc > Row statistics > Select > Range > Input variables > X1-X5 > Select > Store results in > Range >
OK
From Menu Toolbar select stat

Stat > Control Charts > Variable Charts for Subgroups > X bar
Observations of subgroups are in one row of columns > Select C2 to C6 > X bar options > Estimate
pooled standard deviation > OK
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Xbar Chart of X1, ..., X5

21.5 1
UCL=21.274
21.0
Sample Mean
20.5
_
_
X=20.210
20.0
19.5
LCL=19.145
19.0
1 2 3 4 5 6 7 8 9 10
Sample
From Menu Toolbar select stat
Stat > Control Charts > Variable Charts for Subgroups > R
Observations of subgroups are in one row of columns > Select C2 to C6 > R options > Estimate > R
bar> OK
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R Chart of X1, ..., X5

4
1
UCL=3.464
3
Sample Range
2
_
R=1.638
0 LCL=0
1 2 3 4 5 6 7 8 9 10
Sample
From Menu Toolbar select Quality Tools
Quality Tools > Capability analysis > Normal >
Select > Subgroups across rows of > X1-X5> Lower Spec > 19 > Upper Spec> 21 > Options >
Perform Analysis> Within Subgroup analysis > Include confidence intervals > 95 > OK
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Process Capability of X1, ..., X5

(using 95.0% confidence)
LSL Target USL

P rocess Data P otential (Within) C apability
LS L 19 Cp 0.47
Target 20 Low er C L 0.36
USL 21 U pper C L 0.58
S ample M ean 20.314 C PL 0.62
S ample N 50 C PU 0.32
S tDev (Within) 0.704213 C pk 0.32
Low er C L 0.21
U pper C L 0.44
18.4 19.2 20.0 20.8 21.6

O bserv ed P erformance E xp. Within P erformance
% < LS L 4.00 % < LS L 3.10
% > U S L 18.00 % > U S L 16.50
% Total 22.00 % Total 19.60
Save> Project as > EXP 8.MPJ
Result: The X bar Control Chart shows observation (sample 2) is out of control. R Control Chart
shows observation (sample 7) is out of control. Process capability index is computed as 0.47. As, Cp
< 1, process is found as poor.
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CASE STUDY (Sample)

Consider the problem of quality control in the manufacturing process of turning ingots of silicon into
polished wafers used to make microchips. (See Figure1). Assume that the manufacturer wants the
polished wafers to have consistent thickness with a target thickness of 0.5 millimetres.
Figure 1: Silicon Ingots and Polished Wafers

A sample of 50 polished wafers is selected as a batch is being produced. Table 1 contains these data.
0.555 0.543 0.533 0.538 0.533 0.529 0.526 0.522 0.518 0.519
0.516 0.515 0.513 0.515 0.512 0.510 0.508 0.507 0.507 0.507
0.506 0.506 0.506 0.505 0.503 0.502 0.500 0.498 0.499 0.496
0.497 0.493 0.492 0.491 0.487 0.488 0.486 0.485 0.483 0.484
0.482 0.479 0.476 0.476 0.474 0.471 0.471 0.469 0.454 0.447
Figure 2: Histogram
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The histogram indicates that distribution of wafer thickness is approximately normal. The sample
mean is 0.50064, which is pretty close to the target value. Furthermore, the standard deviation is
0.02227, which is relatively small compared to the mean. The analysis thus far supports the
conclusion that the process is in control.
The sample mean and standard deviation together with the histogram provide information on the
overall pattern of the sample data.
However, there is more to quality control than simply studying the overall pattern. Manufacturers
also keep track of the run order, the order in which the data are collected.
For the data in Table 1, the run order may relate to which part of the ingot – top, middle, or bottom –
the wafers came from, or it may relate to the order in which wafers were fed through the grinding and
polishing machines.
If a process is stable or in control, the order in which data are collected, or the time in which they are
processed, should not affect the thickness of polished wafers. One way to check that the production
processes of polished wafers are in control is by creating a run chart.
A run chart is a scatterplot of the data versus the run order. To help visualize patterns over time, the
dots in the scatterplot are usually connected.
Table 1 lists the data values in the order they were collected, starting with the first row 0.555, 0.543,
. . . , 0.519, followed by the second row, third row, fourth row and ending with 0.447, the last entry
in the fifth row. So, the run order for 0.555 is 1, for 0.543 is 2, and so forth until you get to the run
order for 0.447, which is 50.
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Figure 3: Run Chart
Figure 3 shows the run chart for the wafer thickness data. A center line has been drawn on the chart
at the target thickness of 0.05 millimeters.
Even though the overall pattern of the data gave no indication that there were any problems with the
grinding and polishing processes, it is clear from the run chart in Figure 3 that the thickness of
polished wafers is decreasing over time. Processes need to be stopped so that adjustments can be
made to the grinding and polishing processes.
The run chart involved plotting individual data values over time (run order).
Another approach is to select samples from batches produced over regular time intervals.
For example, a quality control plan for the polished wafers might call for routine collection of a
sample of n polished wafers from batches produced each hour. The thickness of each wafer in the
sample is recorded and the mean thickness, x , is calculated. The information on mean thickness can
be used to determine if the process is out of control at a particular time and to track changes in the
process over time.
Suppose when the grinding and polishing processes are in control, the distribution of the individual
wafers can be described by a normal distribution with mean μ = 0.5 millimeters and standard deviation
σ = 0.02 millimeters (similar to the data pattern in Figure 2). From, Sampling Distributions, we know
that under this condition the distribution of the hourly sample means, x , based on samples of size n
are normally distributed with the following mean and standard deviation:
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μx̅ = μ = 0.5 millimeters

𝜎 0.02 0.02
σx = = = = 0.01millimiters
√𝑛 √4 2
Assume that the quality control plan calls for taking samples of four polished wafers each hour. In
this case, our standard deviation for x is:
σ x = 0.024 = 0.01 millimeter
Each hour a technician collects samples of four polished wafers, measures their thickness, records
the values, and then calculates the sample mean. Suppose that the data in Table 2 come from samples
collected over an eight-hour period.
Table 2: Data collected
According to the 68-95-99.7% Rule, if the process is in control, we would expect:

68% of the x values to be within the interval 0.5 mm ± 0.1 mm or between 0.49 mm and 0.51 mm.
95% of the x values to be within the interval 0.5 mm ± 2(0.1) mm or between 0.48 mm and 0.52 mm.
99.7% of the x values to be within the interval 0.5 mm ± 3(0.1) mm or between 0.47 mm and 0.53
mm.
Next, we make an x chart, which is a scatterplot of the sample means versus the sample order. We
draw a reference line at μ = 0.5 called the center line. We use the values from the 68-95-99.7% Rule
to provide additional reference lines in our x chart. The lower and upper endpoints on the 99.7%
interval are called the lower control limit (LCL) and upper control limit (UCL), respectively. Figure
4 shows the completed x chart.
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Figure 4: Wafer thickness over time
The x chart in Figure 4 does not appear to indicate any problems that warrant stopping the grinding
or polishing processes to make adjustments. All of the points except one fall within one σ n of the
mean, in other words, fall between the reference lines corresponding to 0.49 and 0.51. However, as
we add additional points, we will need some guidelines – a set of decision rules – that tell us when
the process is going out of control. The decision rules below are based on a set of rules developed by
the Western Electric Company. Although they are widely used, they are not the only set of decision
rules
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None of the decision rules apply to the control chart in Figure 4. Hence, the processes are allowed to
continue. Table 3 contains data on the next seven hourly samples.
Table 3: Samples for additional 7 hours
Figure 5 shows the updated x chart that includes the means from the seven additional samples.
Figure 5: Updated X̅ chart
Now, we apply the decision rules. This time, we find that Rule 2 applies. Data points associated with
Samples 10 and 11 fall above 0.52 (which, in this case, is above the 2σ / n limit). According to Rule
2 the process should be stopped after observing Sample 11’s x -value.
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The x chart monitors one statistic, the sample mean, over time. The x chart is only one type of control
chart. As mentioned earlier, the manufacturer is also interested in producing a consistent product. So,
instead of tracking the sample mean, the quality control plan could also track the sample standard
deviations, or the sample ranges over time. More generally, control charts are scatterplots of sample
statistics (or individual data values) versus sample order and are commonly used tools in statistical
process control.
Before control charts were popular, there was a tendency to adjust processes whenever a slight change
was noted. This led to over-adjustment, which often caused more problems than it solved. In addition,
it meant that the process was stopped for adjustment more frequently than was necessary, which was
a waste of money. Control charts and decision rules give manufacturers concrete guidelines for
deciding when processes need attention.

7ME4-23 - Quality Control Lab

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Swami Keshvanand Institute of Technology, Management &Gramothan,

Ramnagaria, Jagatpura, Jaipur-302017, INDIA

Programme: B. Tech. Mechanical Engineering

Dr. Achin Srivastav

INSTITUTE VISION / MISSION / QUALITY POLICY

VISION AND MISSION OF DEPARTMENT OF MECHANICAL ENGINEERING

Vision of the Department:

To become a nationally visible mechanical engineering department with excellence in

Mission of the Department:

RTU Scheme & Syllabus

8. Solve quality control problems using SPC software like STATGRAPHICS/MINITAB/SIGMA

Department of Mechanical Engineering

Sr. Date of Date of

Operating Characteristics Curve:

To carry out verification of Poisson distribution

7. Central Limit Theorem:

Applicable Programme Outcomes (POs) / Programme Specific Outcomes (PSOs)

The students will be able to:

PO1: Engineering knowledge: Apply the knowledge of mathematics, science, engineering

Swami Keshvanand Institute of Technology, Management &Gramothan, Ramnagaria, Jagatpura, Jaipur

Swami Keshvanand Institute of Technology, Management &Gramothan, Ramnagaria, Jagatpura, Jaipur

Swami Keshvanand Institute of Technology, Management &Gramothan, Ramnagaria, Jagatpura, Jaipur

occurrences. These count data may be expressed aa pass/fail, yes/no or presence/absence

𝑎𝑙𝑙𝑜𝑤𝑎𝑏𝑙𝑒 𝑝𝑟𝑜𝑐𝑒𝑠𝑠 𝑣𝑎𝑟𝑖𝑎𝑡𝑖𝑜𝑛 𝑈𝑆𝐿−𝐿𝑆𝐿

σ' = standard deviation of the process

Cp<1.0 Poor process

Cp=2 Excellent that is 6 σ

PROCEDUR .AL STEPS:

Let us consider a manufacturing process in which pieces of nearly 22 mm diameter and 40

1) Record all preliminary information on the observation sheet.

Title: Variable Control chart Operation :Turning

No of sub X1 X2 X3 X4 X5 Sub group Sub

UCLR = D4R ( D4 = 2.11 for sub group size 5)

X Bar Control Chart

1. Record all preliminary information on the calculation sheet.

Where, 𝑝̂𝑖 = sample i, fraction nonconforming.

Sample No. Sample ̂𝒊

7. Calculate average fraction defective =Total no of defectives /Total no of pieces inspected.

Di = number of nonconforming items in a sample i

8. Estimate control limits.

Table 2: Practical (Experimental) Probability

S.no No of Frequency Practical Practical (Experimental)

S.no No of defective balls in Theoretical Theoretical Probability

Table 4: Comparison of Theoretical and Practical Probability

No of Probability Practical Theoretical

14. Plot the experimental and theoretical probability curves.

Experimental Probability Curve

Theoritical Probability Curve

Comparing Theoritical and Experimental Probability

OBJECTIVE: Case study on c chart of a product and to establish control limits.

MATERIALS AND EQUIPMENT REQUIRED:

1. About 30 similar jobs (products) from workshop.

Figure 1: Defects in a job

3. Record the number of defects in Table 1.

Table 1: Fraction defective (nonconformity) in each sample

5. Compute trial control limits using the formula

Operative characteristics curve:

6. Compute theoretical probability as:

Where n= sample size

p= probability of defective item

7. Plot Theoretical OC Curve

OBJECTIVE- Distribution Verification