Sensor Noise

Sensor Noise

• Two types of noise & interference can be defined in the DAS.

• In the first type, noise comes from the inner electronic components. Sources
contain ADC Conversion development noise and harmonic distortion, buffer
amplifier noise and distortions, and reference noise and constancy.
• A second type of noise source contains interference in the system's external
environment. Examples comprise exterior electromagnetic noise, power-supply
noise & ripple, I/O pin crosstalk, and digital system noise and interference.

• A power-line DAS signal-processing chain contains of the CT, PT measurement

transformers; anti-aliasing low pass filters (LPF); buffer amplifiers; instantaneous
sampling ADCs; and the central processing unit (CPU).
• A simultaneous-sampling ADC calculates voltages and currents scaled to standard
industry input dynamic ranges of +5V, ±5V, or ±10V. Each of the MAX130x,
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Sensor Noise
MAX132x, and MAX1104x device families contains derivatives which are used to
support these extended ranges without supplementary signal-conditioning circuits.
• Quantization noise decides the system's final noise ground.
• Low pass filters are used to reduce man-made electrical interference noise, to
reduce electronic noise, and to control the bandwidth of the analog signal to less
than half the sampling frequency so as to remove frequency folding. This filter is
called a pre-sampling filter or anti-aliasing filter.
• Man-made electrical noise is usually periodic, such as power line interference and
it is sometimes reduced through a particular filter for example a notch filter.
• On the other hand, electronic noise is random noise by means of noise which is
power proportional to bandwidth and it is present in transducer resistances, circuit
resistances, and also in amplifiers themselves.
• It is reduced by controlling the bandwidth of the system to the minimum which is
necessary to pass required signal components.

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