1. Wave optics describes the behavior of light and other electromagnetic waves. Interference and diffraction phenomena can be observed when light passes through multiple slits or apertures.
2. Interference patterns produced by double slits can be used to determine the wavelength of light. The displacement and shift of interference fringes occurs when the path of one beam is altered, such as by inserting a transparent sheet.
3. Thin films can produce vivid color displays due to interference between light waves reflected from the upper and lower surfaces of the film. The thickness and refractive index of the film determine the observed interference pattern.
1. Wave optics describes the behavior of light and other electromagnetic waves. Interference and diffraction phenomena can be observed when light passes through multiple slits or apertures.
2. Interference patterns produced by double slits can be used to determine the wavelength of light. The displacement and shift of interference fringes occurs when the path of one beam is altered, such as by inserting a transparent sheet.
3. Thin films can produce vivid color displays due to interference between light waves reflected from the upper and lower surfaces of the film. The thickness and refractive index of the film determine the observed interference pattern.
1. Wave optics describes the behavior of light and other electromagnetic waves. Interference and diffraction phenomena can be observed when light passes through multiple slits or apertures.
2. Interference patterns produced by double slits can be used to determine the wavelength of light. The displacement and shift of interference fringes occurs when the path of one beam is altered, such as by inserting a transparent sheet.
3. Thin films can produce vivid color displays due to interference between light waves reflected from the upper and lower surfaces of the film. The thickness and refractive index of the film determine the observed interference pattern.
minima will be 1. Young's double slit experiment. In Young's I max (a +a )2 r+1 2 Imin = (a1 −a2 )2 = (r−1) double slit experiment, two identical narrow 1 2 a1 I slits S1 and S2 are placed symmetrically with where r = a2 = √I1 , is the amplitude ratio of 2 respect to narrow slit S illuminated with monochromatic light. The interference pattern two waves. If w1 and w2 are the wldths of the is obtained on an observation screen placed at two slits, then large distance D from S1 and S2. w1 I1 a21 = = . The position of nth bright fringe from the w2 I2 a22 centre of screen is 𝐷λ 4. Displacement of interference fringes. When a 𝑥𝑛 = 𝑛 thin transparent sheet of thickness t and 𝑑 The position of nth dark fringe from the centre refractive index μ is inserted in the path of one of the screen is of the interfering beams, the extra path 𝐷λ difference introduced is 𝑥𝑛′ = (2𝑛 − 1) 2𝑑 Fringe width is the separation between two ∆p = Length t in transparent sheet successive bright or dark fringes and is given by 𝐷λ β= - Length t in air 𝑑
2. Resultant amplitude and intensity of or ∆p = μt – t = (μ-1)t
interfering waves. If a1 and a2 are the amplitudes and I1 and I2 are the intensities of ∴ Net path difference for any point on the two coherent waves having phase difference ϕ, screen then their resultant amplitude and intensity at the point of superposition are given by 𝑥𝑑 = 𝐷 - (μ – 1) t a = √a21 + a22 + 2a1 a2 cos ϕ and I = I1 + I2 + 2 .√𝐼1 𝐼2 cos ϕ For the central point of the screen, If amplitude of each wave is and intensity I0, then 𝑥𝑑 𝐷 - (μ - 1) t = 0 or x = 𝑑 (μ - 1) t I =2 𝑘𝑎02 (1 + cos ϕ) = 2I0 (1 + cos ϕ) 𝐷 ϕ = 4I0 cos2 2 Thus the shift in the central bright fringe and The term 2√𝐼1 𝐼2cos ϕ is called interference hence shift of any other fringe is ∆x = term. D β 𝑑 (μ-1)t = λ (μ-1)t (i) When cos ϕ remains constant with time, the two sources are coherent. The intensity will be maximum at points for which cos ϕ = +1 and 5. Interference in thin films. A soap film or thin film of oil spread over water shows beautiful minimum at points for which cos ϕ = -1. colours, when seen in the reflected light. This is (ii) When cos ϕ varies continuously with time due to interference between light waves so that its average value is zero over the time reflected by the upper and lower surfaces of interval of measurement, the resultant thin films, as shown in the figure below. The ray intensity at all points will be I1 – I2 . No reflected from the upper denser surface of thin interference fringes are observed. The sources film suffers a phase change of π or path are incoherent. difference of λ/2. 3. Ratio of intensity at maxima and minima of an interference pattern. If a1 and a2 are the amplitudes of two interfering waves, then the
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Width of central maximum, 2Dλ β0 = 2β = a Angular spread of central maximum on either side of the centre of the screen is λ θ=± a Total angular spread of the central maximum is 2λ 2θ= 𝑎 For diffraction to be more pronounced, the size of the slit should be comparable to the Reflected system. The path difference wavelength of light used. between the two consecutive rays reflected from the upper and the lower surfaces of a thin 7. Diffraction at a circular aperture. For film of refractive index μ and thickness t is diffraction of light at a circular aperture of given by diameter a, the angular spread of central λ P = 2μt cos r – 2 maximum is λ 1.22 λ For maximum intensity. 2 μt cos r = (2 n + 1) θ= 𝑎 2 For minimum intensity. 2 μt cos r = nλ. If D is the distance at which the effect is Transmitted system. observed, then For maximum intensity. 2μt cos r = nλ Linear spread, x = Dθ For minimum intensity. Areal spread, x2 = (Dθ)2. λ 2 μt cos r = (2n + 1) , where n = 0,1,2,3.... 2 8. Fresnel's distance. It is the distance at which the diffraction spread of a beam becomes 6. Diffraction at a single slit. A plane wave of equal to the size of the aperture. If a is the wavelength λ on passing through a narrow slit width of the aperture, then of width a suffers diffraction producing a 𝑎2 central bright fringe (θ=0°), flanked on both DF = λ sides by minima and maxima. The intensity of The ray optics is valid for a distance D< DF. secondary maxima decreases with the increase in distance from the centre. 9. Diffraction grating. It is an arrangement of a For nth minimum : very large number of very narrow, equidistant Asinθn=nλ, n =1,2,3, .... and parallel slits. The diffraction pattern has For nth secondary maximum : the central principal maximum of maximum λ intensity and a number of higher order a sin θn =(2n + 1) =1,2,3,.... 2 intensity maxima whose intensity decreases Angular position of nth minimum, with the increase of n, the order of the 𝑛λ θn = spectrum. The direction of nth principal 𝑎 Distance of nth minimum from the centre of maximum is given by the screen,DX (a + b) sin θn = nλ 𝐷λ where n =0,1,2,3.... xn = n 𝑎 This equation is known as grating law. Here (a Angular position of nth secondary maximum, + b) is called grating dement, where a is width λ θ′ n = (2n + 1) of each slit and b is the width of opaque space 2a between two consecutive slits. Distance of nth secondary maximum from the centre of the screen, Dλ X n′ = (2n + 1) 2a 10. Resolving power of a microscope. The Width of a secondary maximum, resolving power of a microscope is defined as Dλ the reciprocal of the smallest distance d β= a
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θ between two point objects at which they can [𝑠]𝑇𝐷 = 𝑙×𝑐 be just resolved when seen in the microscope. 1 2𝜇 𝑠𝑖𝑛 𝜃 R.P. of a microscope = 𝑑 = λ 15. Doppler effect It is the phenomenon of the where θ is half the angle of cone of light from apparent change in the frequency of light due each point object and μ is the refractive index to the relative motion between the source and of the medium between the object and the observer. The apparent frequency v’ is given by objective. 𝑣 𝑣 ′ = 𝑣 (1 ± 𝑐 ) The factor μ sin θ is called numerical aperture When source moves towards the observer, (N.A.). velocity v is taken +ve and when it moves away from the observer, v is taken -ve. 11. Resolving power of a telescope. The resolving power of a telescope is defined as the 16. Doppler shift. The apparent change in the reciprocal of the smallest angular separation frequency of light due to Doppler effect is 'dθ' between two distant objects whose images called Doppler shift. can be just resolved by it. 𝑣 1 𝐷 (i) Δ v = ± 𝑐 v R.P. of a telescope = dθ = 1.22 λ 𝑣 (ii) ∆ λ = ∓ 𝑐 . λ. where D is the diameter of the telescope objective and λ is the wavelength of light used.
12. Law of Malus. This law states that when a
beam of completely plane polarised light is passed through an analyser, the intensity T of the transmitted light varies directly as the square of the angle '& between the transmission directions of polariser and analyser. I = I0 cos2 θ where I0 is the maximum intensity of transmitted light.
13. Brewster law. This law states that the tangent
of the polarising angle of incidence of a transparent medium is equal to its refractive index. μ = tan ip
14. Specific rotation. It is the angle through which
the plane of polarisation rotates when plane polarised light is passed through one decimetre length of solution containing one gram of the substance per cm3. The measurement is done at a given temperature T, using sodium light (the D-line). Specific rotation
Observed angle of rotation in degrees
Length of the tube in decimetre × Grams of substance in 1 cm3 of solution
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