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1 s2.0 003810987190278X Main
1 s2.0 003810987190278X Main
arises
four oxygen
from aligands
defect around
electron
a substitutional
trapped at one alu-
of the ~ao~ QUARTZ POWDER
CRYSTALLINE
minium ion in the a —SiO2 lattice.1’2 The ESR
spectrum rapidly broadens beyond detection above b
77°K.We want to show that this line broadening
is likely to arise from a thermally activated hop-
ping of the defect electron among the different
oxygen ligands around the aluminum impurity. In
such a process, the hole can lose its phase mem- C
159
160 TRAPPED-HOLE CENTER IN SMOKY QUARTZ Vol. 9, No. 2
3 obtained in the temperature anism for ultrasonic relaxation: King5 has measured
De Vos and Volger
region of 100.—170°Ka similar activation energy the Q-value of X-irradiated quartz crystal resonators
W = (85 ±5) meV for the relaxation time of the and obtained an activation energy W = 100meV
dielectric loss. Since this type of dielectric loss from the analysis of the temperature dependence
is not present in silica glass,4 there is a close of the ultrasonic relaxation time.
correspondence between the two experiments.
Apparently the temperature dependence of the In conclusion, we note that the different mani-
ESR line-width and the dielectric loss are caused festations of the hopping motion give strong sup-
by the same mechanism, i.e. the hopping of the port for the model on which the present investi-
hole. gation is based.
REFERENCES
1. GRIFFITHS J.H.E., OWEN J. and WARD I.M., Defects in crystalline solids; report of Bristol confer-
ence p.81. Physical Society, London (1954).
2. SCHNADT R. and SCHNEIDER J., Phys. kondens. liaterie 11, 19 (1970).
3. de VOS W.J. and VOLGER J., Physica 47, 13 (1970).
4. VOLGER J. and STEVELS J.M., Philips Res. Rep. 11, 79 (1956).
5. KING J.C., Bell System Techn. J. 38, 573 (1959).