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Ece 4103 03
Ece 4103 03
• These areas are subsequently readily etched away together with the underlying silicon
dioxide so that the wafer surface is exposed in the window defined by the mask
concentration and depth will affect the threshold voltages as well as the
• However, deep wells require larger spacing between the n- and p-type transistors and
• Negative mask: hardened when exposed under UV light. Positive mask: soften when
exposed under UV light.
• If two parts of an electronic circuit are in close proximity to one another, there
is a likelihood of a capacitance effect – known as parasitic or stray capacitance
– between them
Dr. Md. Mahbub Hossain
Associate Professor, ECE Discipline, KU 18
CMOS Fabrication (n-well)