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Chapter 1 DIFFRACTION
Session 2 : Fraunhofer Diffraction at a double slit

FRAUNHOFFER DIFFRACTION AT DOUBLE SLIT :

Consider two slits S1 and S2 each of width ‘a’ with separation ‘b’ between them. Let parallel rays
of monochromatic light of wavelength ‘’ be incident on these slits.

a S1 P



b P0
K1

S2
a

Fraunhoffer diffraction at double slit

Consider light rays diffracted at an angle  with the horizontal direction. These light rays
converge at point P on the screen after getting refracted through the lens. We want to decide
intensity of light at point P. For this, we will find resultant amplitude of wave disturbance at
point P.

When the plane wavefront reaches the plane of these slits, each point in the slit emits secondary
wavelets.

In diffraction at a single slit, we know, the resultant amplitude of the wave disturbance due to all
such wavelets diffracted at an angle  is
sin 
E  E m ------------------------------ (1)

where, Em is maximum amplitude at P0
π
and α  a sinθ -------------------------------- (2)
λ
Let us represent disturbance due to all waves from a single slit S1 by a single wave starting from
midpoint of S1 and due to all waves from a single slit S2 by a single wave starting from midpoint
of S2.

The path difference between these two waves coming from midpoints of S1 and S2 is –
S2K1 = S1S2 sin
= (a + b) sin

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Corresponding phase difference is
2π
(a  b) sinθ  2β   (say) --------------------------- (3)
λ
Resultant amplitude at point P can be calculated by vector addition method where AB and BC
represent amplitude of two waves originating from midpoints of S1 and S2. Angle  is phase
difference between them.

R

E


A
E B
Resultant amplitude in double slit diffraction

AC2 = AB2 + BC2 + 2 (AB) (BC) cos

R 2  E 2  E 2  2 E  E  cos
R 2  2 E 2  2 E 2 cos
R 2  2 E 2 1  cos 

R 2  4 E 2 cos 2
2

sin  π  π
Substituting, E  Em where α  a sinθ and  (a  b) sinθ  β
 λ 2 λ
sin 2
R 2  4 E 2m cos2 
2

The resultant intensity at point P,

I  R 2
sin 2
 I  4 E 2m cos2  --------------------------- (4)
 2

sin 2
The term E 2m gives a diffraction pattern similar to that of a single slit. The factor cos2
2
gives the diffraction pattern due to light waves of same amplitude from two slits.

sin 2
E 2m gives principal maximum at the centre. i.e. at  = 0. On either side of this principal
2
maximum, alternate minima and secondary maxima of decreasing intensity are obtained as
shown in intensity distribution for diffraction at double slit.

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For minima in single slit diffraction, The cos2 gives maximum intensity when,

sin  0 but   0 cos 2   1

i.e.    m , m  1,2,3, ..... i.e.    n ; n  0,1,2,3,........
π π
i.e. a sinθ   m i.e. (a  b) sinθ   n
λ λ
i.e. a sinθ   m i.e. (a  b) sinθ   n
Secondary maxima from a single slit due to
sin 2
E 2m is obtained at
 2

 1
   m   , m  1,2,3, .....
 2

INTENSITY DISTRIBUTION FOR FRAUNHOFER DIFFRACTION AT DOUBLE SLIT

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