C37.081 Syn Fault Test of HV Breakers Rated On A Sym Cur Basis

~~
ANSI/IEEE C37.081-1981
guide forsynthetic fault testingof

ac high-voltage circuit breakers
rated on a symmetrical current basis
COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

Licensed June 12, 1981
by Information Handling Services SH08227
l L l 8 0 5 7 0 2 0024bLL b I
ANWIEEE C37.081-1981
e
An American National Standard
IEEE Guide for Synthetic Fault Testing of
AC High-Voltage Circuit Breakers
Rated on a Symmetrical Current Basis
Sponsor
Switchgear Committee of the
IEEE Power Engineering Society
Approved September 14,1978

IEEE Standards Board
Secretariat
Institute of Electrical and Electronics Engineers, Inc
National Electrical Manufacturers Association
Approved December 1,1980

American National Standards Institute
@Copyright 1981 by
The Institute of Electrical and Electronics Engineers, Inc

345 East 47th Street, New York, NY 10017
No part o f this publication may be reproducedin any form,

in an electronic retrieval system or otherwise,
without the prior
COPYRIGHT Institute of Electrical and Electronics written Inc
Engineers, permissionof the publisher.
Licensed by Information Handling Services
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Foreword
(ThisForeword is not a part of ANSI/IEEEC37.081-1981,IEEEGuide€orSyntheticFaultTesting of AC
High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis.)
This is a new guide developed to provide a basis for synthetic testing of circuit breakers and to
establish the criteria for testing to demonstrate the short circuit
rating of circuit breakers.
The guide contains typical circuits for use in demonstrating interrupting capabilities, but these
circuits are those in general use and they should not exclude the development or introduction of
additional circuits.
The Standards Committee on Power Switchgear, C37, which reviewed and approved this Guide,
had the following personnel at thetime of approval:
Wagner, C.L. Chairman John D. Hopkins, Secretary
J.E. Beehler, Executive Vice-Chairman of High Voltage Switchgear Standards
W.E. Laubach, Executive Vice-Chairman of Low Voltage Switchgear Standards
S. H. Telender, Executive Vice-Chairman of IEC Activities
Represented Organization of Representative
Association of American Railroads . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Vacant
Association of Iron and Steel Engineers. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . J. M. Tillman
Electric Light and Power Group. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . K. G . Adgate
J. E. Beehler
R. L. Capra (Alt)
H. G . Darron
H. F. Frus
K. D. Hendrix
R. L. Lindsey (Alt)
E. E. Ramm (Alt)
F. R. Solis
Institute of Electrical and Electronics Engineers . . . . . . . . . . . . . . . . . . . . . . . . . M. J. Beachy (Alt)
R. N. Bell (Alt)
H. H. Fahnoe
R. E. Friedrich
M. J. Maier
C. A. Mathews (Alt)
D. C. Musgrave (Alt)
G. W. Walsh
H. F. White
National Electrical Manufacturers Association. . . . . . . . . . . . . . . . . . . . . . . . . . . A. P. Colaiaco
R. W. Dunham
D. G . Portman
G . A. Wilson
W. R. Wilson
Tennessee Valley Authority. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Robert C. St. Clair
Testing Laboratory Group. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . L. Frier
E. J. Huber
R. W. Seelbach (Alt)
U.S. Department of the Army . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Robert H. Bruck
U.S. Department of the Interior, Bureau of Reclamation. . . . . . . . . . . . . . . . . . . . Edward M. Tomsic
U.S. Department of Defense, Defense Communications Agency . . . . . . . . . . . . . . . Vacant
U.S. Department of the Navy, Naval Facilities Engineering Command . . . . . . . . . . . D. M. Hannemann
This guide was prepared by the Working Group on SyntheticTesting of the Power Circuit Breaker
Subcommittee.At thetimethis guide wasapproved the workinggrouphad the following
membership :
T.F. Garrity, Chairman
D. M. Benenson J. G. Recklef€* H. N . Schneider
R. G. Colclaser A. Rishworth E. G. Solorzano
C. F. Cromer W. N. Rothenbuhler J. A. Urbanek
C. D. Fahrnkopf E. Ruoss E. F. Veverka
J. Porter G. St. Jean G. A. Votta
*Chairman at time of publication

C37-081-81 1 4 8 0 5 7 0 2 0024614 1 1
At the time this guide was approved, the Power Circuit Breaker Subcommittee had the following
membership:
G.A. Wilson, Chairman
H. W. Anderl K. I. Gray J. G. Reckleff
J. E. Beechler R. D. Hambrick A. B. Rishworth
D. M, Benenson G. R. Hanks W. N, Rothenbuhler
L. E. Brothers W. E. Harper L. H. Schmidt
R. G. Colclaser M. Hudis H. N. Schneider
B. G. Coursey W. C. Huening, Jr G, G. Schockelt
J. C. Coon P. L. Kolarik R. D. Settembrini
C. F. Cromer S. R. Lambert E. G. Solorzano
C. R. Cusick D. M. Larson T. J. Toybin
A. Dupont G. N. Lester C. J. Truax
C. J. Dvorak M. J. Maier E. F. Veverka
P. W. Dwyer J. A. Maneatis G. A. Votta
J. D. Finley R. A. McMaster C. L. Wagner
R. E. Friedrich G. J. Meinders D. R. Webster
T. F. Garrity Z. Neri W. R. Wilson
J. P. Geraghty I. E. Oliver B. F. Wirtz
W. F. Giles R. A. Pace C. E. Zanzie
G. O. Perkins
When the IEEE Standards Board approved this guide on September 14,1978, it had the following
membership:
Joseph L. Koepfinger, Chairman Irvin N. Howell, Jr, Vice Chairman
Ivan G. Easton, Secretary
William E. Andrus Jay Forster Donald T. Michael
C. N. Berglund Ralph I. Hauser Voss A. Moore
Edward J. Cohen Loering M. Johnson William S. Morgan
Warren H. Cook Irving Kolodny Robert L. Pritchard
David B. Dobson William R. Kruesi Blair A. Rowley
R. O. Duncan Thomas J. Martin Ralph M. Showers
Charles W. Flint John E. May B. W. Whittington

i4805702 0024615 3
Contents
SECTION PAGE
1. Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
1.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
1.2
ScopeandPurpose .................................................... 7
2 . Definitions .............................................................. 7
3. References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
4 . Short Circuit Current Interruption Process . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
4.1 Circuit Breaker Performance During Interruption; Basic Intervals . . . . . . . . . . . . . . . . 8
4.2 State of Interrupting Process . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
5. Basic Principles of Synthetic Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
5.1 Principles . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
5.2
BasicComponents .................................................... 9
6 . SyntheticTest Circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
6.1CurrentInjection Method- . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
6.2 Voltage InjectionMethod . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
6.3DuplicateCircuitMethod ............................................... 12
6.4 Synthetic Test Circuits; Choice of Methods. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
7 . Requirements for Synthetic Test Methods ...................................... 13
7.1 High CurrentInterval . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
7.2 InteractionInterval . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
7.3 High Voltage Interval . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
7.4 Discussion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
8. Parameters, Test Procedures, and Tolerances . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
8.1 High CurrentInterval; Voltage of Current Circuit ............................ 14
8.2 Interaction Interval - CurrentInjection Circuit .............................. 15
8.3 High Voltage Circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
9 . Short Line Fault ........................................................... 18
10. MultipleLoops ........................................................... 18
10.1 Method with Single Application of the Voltage Circuit ........................ 18
10.2 Method with Multiple Application of Voltage Circuits ......................... 18
11. Circuit Breakers Equipped with Parallel Impedance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
11.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
11.2 Four Part Test Method . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
12. Dutycycle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
12.1 Test Duties for Synthetic Testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
12.2TestMethods . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
13. TestRecords . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
13.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
13.2Current Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
13.3 Voltage Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
FIGURES
Fig 1 Three Basic Intervals of Interrupting Process . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Fig 2 Parallel Current Injection Test Circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Fig 3 Parallel Current Injection - Current Waveshape . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11

C37.08l-fll m4805702 0 0 2 4 b l b 5 m
FIGURES PAGE
Fig 4 Series CurrentInjectionTestCircuit ........................................ 11
Fig 5 Series Current Injection Current Waveshapes .................................. 11
Fig 6 Voltage InjectionTestCircuit ............................................. 12
Fig 7 .......................................
Voltage Injection; Voltage Waveshapes 12
Fig 8 Duplicate Circuit Test Arrangement......................................... 13
Fig 9 Effect of Arc Voltage on Current Waveform .................................. 14
Fig 10 Power Frequency Recovery Voltage ......................................... 17
TABLE
Table 1 Duty Cycles for Synthetic Testing ......................................... 21
APPENDIX
Appendix A Distorted Current; Derivation......................................... 25
A l Introduction ............................................................ 25
A2 Derivation .............................................................. 25
................. 25
A3 The Influence of the Distortion Current During the Period of Arcing
APPENDIX FIGURE
Fig A l Distortion Current ...................................................... 26

An American National Standard
IEEE Guide for Synthetic Fault Testing of
AC High-Voltage Circuit Breakers
Rated o n a Symmetrical Current Basis
1. Introduction 2. Definitions
1.1 General. To develop and test high-voltage auxiliarycircuit breaker. The circuitbreaker
circuit breakers to meetpresentandfuture used to disconnectthecurrent circuitfrom
system capabilities requires demonstration of directconnectionwiththetestcircuitbreaker.
performance at power levels in excess of the
current circuit. That part of the synthetic test
capacity of test laboratories or utility systems.
circuit from which the major part of the power
Various means have been developed in the past
frequency current is obtained.
to extendtest capabilities such as twopart
testing or unit testing. A majorextension of currentinjectionmethod. A synthetictest
test capability results from the use of multiple method in which the voltage circuit is applied
source circuits. to the testcircuitbreakerbeforepowerfre-
',
ANSI C37.06-1979, [l] establishes current quency current zero.
and requirements which may not be direct
test. A test in which the applied voltage,
possible to achieve ondirecttests. Multiple
current, and recovery voltage is obtained from
source circuits, generally identified as synthetic
a single power source, which may be comprised
circuits, can achieve the required character- of generators, transformers, networks, or
istics.
binations of these.
Scope and This guide is intended distorted current. The currentthrough the test
to provide a basis forsynthetictesting of
circuit breaker which is influenced by the arc
circuit breakers (see ANSI/IEEE C37.04-1979 voltage of both the test and auxiliary circuit
[2] ) and to establish the criteria for testing to
breakers during the high current interval (Fig
demonstrate the short-circuit current rating of
circuit
breakers on a single phase basis. 9).
It is recognized that other test requirements injected
current.The current which flows
exist
(such as capacitor switching, or line throughthetest circuit breaker fromthe
dropping) but they will be reserved for future voltage source of a current injectioncircuit
consideration. when this circuit is applied to the test circuit
The guide contains typical
circuits
breaker.
for
demonstratinginterruptingcapability.These
injected-currentfrequency.Thefrequency of
circuits are those in general use andtheir
the injected current.
inclusion should not exclude the development
of additionalcircuits to demonstrate specific injectiontime. Thetimewithrespect to the
capabilities. power frequency current zero when the voltage
Thepurpose of this guide is to establish circuit is applied.
criteria forsynthetictestingandfortheproper post-arc current. The current which flows
evaluation of results. Such criteria will establish through the arc gap of a circuit breaker
validity ofthetestmethodwithout imposing immediatelyafter current zero, and which has
restraints on innovationandimprovement of
a substantially lower magnitude than the test
test circuitry.
current.
a 1 Numbers in brackets correspond to those of the

References, Section 3 of this guide.
prospective current.Thecurrent
breaker.
that would
flow if it were notinfluenced by the circuit
COPYRIGHT Institute of Electrical and Electronics Engineers,7Inc

C37.0BL-BL ~ V l 3 0 5 . i U 2 UUd.LtbL~ Y 4
ANSI/IEEE
C37.081-1981 GUIDE FOR SYNTHETIC FAULT TESTING OF AC HIGH-VOLTAGE
synthetic test. A test in which the major part Rated on aSymmetricalCurrent Basis (Con-
of, or the total current, is obtained from one solidated
Edition,
including
Supplements
source (current circuit), and the major part of,. C37.04aY C37.04b,and C37.04~)
or all of the transient recovery voltage from a [3] ANSI/IEEE C37.09-1979,TestProcedure
separate source or sources(voltage circuit). for AC High-Voltage Circuit Breakers Rated on
test circuit breaker. The circuit breaker under Symmetrical
a Current Basis (Consolidated
test. Edition)
voltage circuit. That part of the synthetic test
circuit from which the major part of the test
4. Short-circuit Current
voltage is obtained.
Interruption Process
voltage-injection method. A synthetic test
method in which the voltage circuit is applied 4.1 Circuit Breaker Performance During Inter-
tothetest circuitbreaker afterpowerfre- ruption; Basic Intervals. The Circuit breaker
quency current zero. has two basic positions: closed and opened. In
the closed position the circuit breaker conducts
full current with negligible voltage drop across
3. References its contacts. In the open position it conducts
negligible current but with full voltage across
[l] ANSI C37.06-1979, Preferred Ratings and thecontacts. This defines two main stresses,
Related Required Capabilities for AC High- the current stress and the voltage stress, that
Voltage Circuit Breakers Rated on a Sym- are separated in time.
metrical Current Basic (Consolidated Edition)2 However, t h e main function of the circuit
breaker is neither to conduct nor to isolate. It
[2] ANSI/IEEEC37.04-1979,RatingStruc-
performsits main functionin changing from
ture
for AC High-Voltage Circuit Breakers
one condition to the other, thatis, the switch-
ing operation. If closer attention is paid to the
voltage and current stresses during the inter-
2ANSI documents areavailable fromTheAmerican
National Standards Institute, 1430 Boardway, New rupting test (Fig l), three main intervals can be
York, N.Y. 10018. recognized.
Fig 1
Three Basic Intervals of Interrupting Process
ICONTACT SEPARATION
I
t
CURRENT
\
L
TIMESCALE
-EXPANDED
J
START OF
t
VOL~AGE
VOLTAGE
SIGNIFICANT CHANGE
IN ARC VOLTAGE-
ACROSS
BREAKER rl /c
L J
INTERACTION
\
INTERVAL
I
HIGH VOLTAGE
Rv
INTERVAL INTERVAL

Licensed by Information Handling Services 8
ANSI/IEEE
CIRCUIT BREAKERS RATED ON A SYMMETRICAL CURRENT BASIS C37.081-1981
4.1.1 High-Current Interval. The high-cur- zero (that is, during the interaction interval) is
rent interval is the time from contact separa- of extreme importance
the
toswitching
tion to the significant changein arc voltage process.
preceding the interaction and high-voltage in- 4.2.4 High-Voltage Interval. During the
tervals. high-voltage interval, the gap of the breaker is
4.1.2 Interaction Interval. Theinteraction stressed by recovery voltage. The circuit
interval is the time from the significant change breaker is now a passive element in the circuit.
in arc voltage prior t o current zero to thetime
when the current including the post arc cur-
rent, if any, ceases to flowthrough thetest 5. Basic Principles of Synthetic Test
breaker.
4.1.3 High-Voltage Interval. The high-volt- 5.1 Principles. Synthetictestingmethodsare
age interval is the time from the moment when based onthefactthatthe circuitbreaker is
the current including the post arc current, if stressed by high current and by high voltage at
any, ceases to flow through the test breaker to differenttimeswithonlyashortinterval of
the end of the test. overlap, It is possible, therefore, to apply the
4.2 State of Interrupting Process. Thethree stresses by means of separate test circuits. The
intervals described in 4.1.1 to 4.1.3 follow each current stress occursduring thehigh-current
otherimmediately, that is, they cover the interval followed by the voltage stress during
whole interrupting process without any dis- the high-voltage interval. The period of overlap
continuities, even though it might be difficult of thecurrentand voltage stress takes place
to establish precisely themomentwhenone during the interactioninterval,
intervalendsand theother begins. However, 5.2 Basic Components. A synthetic testing cir-
this accuracy may not be required. cuit is characterized by two basic components:
4.2.1 State of Interrupting Process During 5.2.1 Current Circuit. Thecurrent source
Three Basic Intervals. The quantities determin- supplies the required current through the test
ing the physics of theinterrupting process breakerduring the high-currentinterval. The
change considerably during the circuit breaking required voltage of the current circuit is sub-
operation. In fact, the prevailing physical con- stantially lower than that of the corresponding
ditions have differentimportanceduringthe direct circuit but sufficiently high to drive the
three time intervals. necessary currentto establish the arc condi-
4.2.2 High-Current rnterval. During the tions.
Typically, the high-current circuit is
high-current interval, short-circuitcurrent is supplied from generators, transformers, power
flowing throughthecircuit breakerwitha systems, or combinations of these.
relatively small voltage drop across thecon- 5.2.2 Voltage Circuit. The voltage circuit
tacts. A large amount of energy is supplied to supplies the required voltage across thetest
the arc establishing thestate of ionization, circuit breaker during the high voltage interval.
temperature, dynamic pressure, etc, important The available current of the high-voltage source
for the switching function. may be substantially lower thanthat of the
4.2.3 Interaction Interval. During the inter- corresponding direct circuit.
action interval, the short-circuit current stress Practically, the high-voltage circuit may be
changes into high-voltage stress and the breaker supplied with high voltage whichmay valy
performance can significantly influence the from dcto high frequencies. A precharged
currentsand voltages in the circuit. As the capacitor bank is the high voltage source most
current decreases to zero, the arc voltage may commonly usedin synthetictestinglabora-
rise to charge parallel capacitance and distort tories.
current passing throughthe arc. After the
currentzerothepost arcconductivity may
result in additionaldamping of thetransient
recovery voltage and thus influence the voltage 6. Synthetic Test Circuits
across the breaker and the energy supplied to
the ionized contact gap. Themutualinter- 6.1 CurrentInjectionMethod.Thecurrent
actionbetween the circuit and the circuit injection method can be described in terms of
breaker immediatelybeforeand aftercurrent general requirements or principles:
9 Inc
COPYRIGHT Institute of Electrical and Electronics Engineers,
(1) The current injection method introduces and current i, is injected and flows throughthe
a current from the high-voltage source into the high-voltage reactor L,, and test circuit
testcircuitbreakerprior tothe interaction breaker.
interval. (3) The currentthrough the test breaker is il
(2) An auxiliarycircuitbreakerinterrupts plus i, until time t2 when the auxiliary breaker
the current from the high-current source prior isolates thecurrent circuitfrom the voltage
to theinteraction interval. circuit.
di (4) The current through the test breakeris i,
(3) The dt of the injected current at current until time t,, when the test breaker interrupts
di and thetransient recovery voltage (TRV) is
zero is equal to,or greater than,thethat impressed across the test breaker.
would have been produced by the fault current 6.1.2 Series CurrentInjectionCircuit.In
uilder direct test conditions. thiscircuit, the high-voltage source is con-
(4) Consequently, the breakerduring the nectedin series with the high-currentsource
interaction period is connected with and inter- voltage (see Fig 4). A description of the circuit
actswitha voltage source having the circuit operation follows:
parameters similar to those in the direct test. (1) Thetest is initiated by closing the
Two current injection methods are described making switch which allows il to flow through
in 6.1.1 and 6.1.2. components L,, the auxiliarycircuitbreaker,
6.1.1 Parallel CurrentInjectionCircuit.In and the test circuit breaker.
this circuit the high-voltage source is connected (2) The spark gap is triggered at time tl , (see
in parallel with the high-current source (Fig2). Fig 5) andcurrent i, flowsthroughcompo-
This method is used by the majority of test nents of the voltage circuit. This current, i,, is
laboratories. The test circuit operation can be in the oppositedirection of il throughthe
described as follows: auxiliary breaker.
(1) Thetest is initiated by closing the
(3) The instantaneous value of il equals that
making switch which allows current i, to flow
through thecurrent limitingreactor L,, the ofi, (in the opposite direction) at time t, as
indicated in Fig 5 and the current through the
auxiliarycircuitbreaker,and the test circuit
auxiliary breaker is extinguished.
breaker.
(2) Prior totheinteractioninterval,the (4)Thecurrentthroughthetestcircuit
spark gapis triggered at time tl , (see Fig 3) breaker from time t2 t o t3 is i,, that is, the
Fig 2
Parallel Current Injection Test Circuit
HIGH
CURRENT
LIMITING VOLTAGE TRIGGERED
MAKING
REACTOR AU)r" IADV
REACTOR SPARK GAP
L-
CURRENT VOLTAGE
SOURCE CIRCUIT SOURCE
I l - I
L
-
-
+-HIGH CURRENT4 -HIGH VOLTAGE CIRCUIT"------c
CIRCUIT

ANSI/IEEE
il + i*
i1
i, t i, = CURRENT INTEST BREAKER
i,. CURRENT IN AUXILIARY BREAKER
i t s INJECTED CURRENT
Y'
\ POWER FREQUENCY
CURRENTZERO
Fig 3
Parallel Current Injection; Current Waveshape
'AK
0
CURRENT
LIMITING
MAKING REACTOR
SWITCH LC
l2 TRV VOLTAGE
AUXILIARY SHAPING SOURCE
CIRCUIT
T-{ H~GHVOLTAGE O &IGGERED

REACTOR
SPARK GAP
Lv
r""
I
SLF
i2 I"">
I
') TEST
BREAKER
P
-HIGH CURRENT-
CIRCUIT
- HIGH VOLTAGE CIRCUIT-
Fig 4
Series Current InjectionTest Circuit
. .
I = l1 + i, = CURRENT I N TESTBREAKER
i 1 - i, = CURRENT IN AUXILIARY BREAKER
i2= INJECTEDCURRENT
Fig 5
Series Current Injection Current Waveshapes
COPYRIGHT Institute of Electrical and Electronics Engineers, 11

Inc
ANSI/IEEE
C37.081-1981
CURRENT TRIGGERED
MAKING
AUXILIARY
i i SPARK GAP
HIGH-VOLTAGE
BREAKER REACTOR VOLTAGE
Fig 6
Voltage Injection Test Circuit
currentproduced by thecurrent sourceand (TRV) from the high-voltage circuit as shown

voltage source connected in series. Components in Fig 7.
L,, L, andthetest breaker now formthe
voltage circuit. 6.3 DuplicateCircuitMethod.Theprinciple
(5) At time t,, thetest breakerinterrupts of this method lies in the fact that the current
and thetransient recovery voltage (TRV) is and voltage circuits are supplied from the same
impressed across the testbreaker. source.
A typicalduplicatecircuitarrangement is
6.2 Voltage Injection Method. The voltage in- shown in Fig 8:
jectionmethod can be describedinterms of (1) Thetest is initiated by closing the
general requirements or principles: making switch.Current flows through com-
(1) The voltage injection method introduces ponents L,, the auxiliary circuit breaker, and
the voltage source after current zero near the the test circuit breaker.
peak of the recovery voltage of thecurrent (2) The current il is interrupted by both the
circuit. auxiliaryandtestcircuitbreakers,Theaux-
(2) An auxiliary circuit breaker with a par- iliary *circuit breaker isolates the high voltage
allel capacitor is used to apply the recovery from thecurrentsourceandthetestcircuit
voltage of the current source to the testcircuit breaker experiences the recovery voltage from
breaker. the transformer circuit. The resistance R in the
(3) Consequently,during the high-current high-voltage circuitshouldlimit thecurrent
intervaland the initial part of thetransient
recovery voltage (TRV) the test circuitbreaker Fig 7
interacts only with the high-current source. Voltage Injection;Voltage Waveshapes
A diagram of the voltage injection circuit is
TRANSIENT RECOVERY VOLTAGE
depicted in Fig 6. A description of the voltage FROM CURRENTCIRCUIT
injection circuit operation follows:
(1) The test is initiated by closing the
making switch which allows i, to flow through
components L,, the auxiliarycircuitbreaker
and the testcircuit breaker.
(2) At to the high current is interrupted by
boththe auxiliaryandtestcircuitbreakers.
Theinitial
part of thetransient recovery VOLTAGE ACROSS AUXILIARY
CIRCUITBREAKER
voltage is supplied from thehigh-current circuit
by division of voltage between the auxiliary
and test circuit breakers.
t
(3) The spark gap-is fired at t, to produce I
the remainder of the transient recovery voltage 4,
12 Inc
1 4 8 0 5 7 0 2O 0 2 4 6 2 3 2
ANSI/IEEE
CIRCUIT BREAKERS RATED ON A SYMMETRICAL CURRENT BASIS (237.081-1981
MAKING
SWITCH ,- AUXILIARY
BREAKER
CURRENT
LIMITING
1,
REACTOR
1{
CURRENT RESISTOR
SOURCE HIGH -VOLTAGE TE ST ’)
TRANSFORMER BREAKER
P
-
L t
Fig 8
Duplicate Circuit Test Arrangement
contribution of the high-voltage circuit during of thesemethodsbyboththe userand the

the-high-current interval, controlthe condi- manufacturer. These methods can be useful for
tions around current zero, andallow for proper testing specific aspects of circuit breaker per-
voltage stress after the test breaker interrupts formance such as tests for dielectric restrikes,
the test current. particularly for late peaks of transient recovery
voltage, phase opposition tests, etc.
6.4 Synthetic Test Circuits; Choice of Other methods may prove correct andadvan-
Methods. Any particular
synthetic
method tageous for testing of breakers with specific
chosen for testing must adequately stress the characteristics or
for specific performance.
test breaker. Generally, the adequacy is estab- Even though these methods are not covered by
lished when the test method meets the require- this guide they can be used subject to under-
ments set forth in Section 7. standing of theirapplicationandagreement
Theinteractionperiodpresentsthecritical between the manufacturer and theuser.
time for the adequacy of voltage and current
stresses. The current injection methods offer a
great advantage because during the interaction
interval, the test breaker is exposed t o a circuit 7. Requirements for Synthetic
which has basically the same parameters within Test Methods
certain tolerances as the corresponding direct
circuit. For this reason the interaction of the A synthetictestmethod is considered a
circuit breaker with the circuit and the stresses satisfactoryequivalent t o adirecttest for
on the test breakerapproachthose of direct short-circuit currentinterruptiontests if the
tests. This establishes the general validity of following requirements are met:
current injection methods.
7.1 High-Current Interval. During the high-
Current injection methods have become the
current interval thecircuit breaker shall be
most widely used synthetic test circuits. There-
stressed by the current circuit so that its arc
fore the remainder of this guide primarily
gap at the end of the high-current interval will
covers current injection methods.
be in a state presenting the same conditions as
It is difficult t o demonstratethe general
during thedirect
test.
Thisincludes
such
validity of voltage injection methods, particu-
conditions as state of ionization, temperatures,
larly for the interaction interval. However, it gas flow pressures, electrode heating, etc.
may be possible to establish the validityfor
some circuit breakers. As these problems 7.2 Interaction Interval. During the inter-
depend on specific breaker characteristics,they action interval, the current and voltage wave-
are not treatedin this guide. forms shall be the same for a synthetic test as
Before voltage injection methods are used in thedirecttest,takingintoaccountthe
thereshouldbe commonagreementand an possible deviations of the currents and voltages
understanding of the operation and limitations from the prospective values due to the inter-
C37-081-81 m 4 8 0 5 7 0 2 0024624 4 1
ANSI/IEEE
action of the circuitbreakerand the circuit injectionmethod, or somedifferentmethod

parameters. which is shown to stress the breaker correctly.
The application of current and voltage Proof of satisfaction of the requirements of
stresses shall becontinuousthroughoutthe 7.1,7.2 and 7.3 can be based eitheron
interaction interval, The auxiliary breaker must theoreticaloronexperimentalgrounds,or
not unduly influence the switching phenomena both, and may be specific only to certain types
in the test breaker. The available current in the of circuit breakers, or to certain parts of the
testcircuitduring the whole interactionin- testing program on a breaker.
terval must be of sufficient
magnitudein Theforegoing discussion is consistentwith
relation to the maximum of ‘the expected post the approach for indirect testing as covered in
arc currentso the latteris not limited. ANSI/IEEE C37.09-1979 [ 31 .
7.3 High-Voltage Interval. The voltage during
the entire high-voltage interval shall be equal to 8. Parameters, Test Procedures, and
or greater thanthe specified envelope for Tolerances
transient recovery voltages specified by ANSI
C37.06-1979. [l]The impedance of the circuit The parameters of the synthetic test circuit
must be low enough to provide for reignitions and the test procedure shall be such that the
or restrikesif they occur. short-circuit current and the resultant recovery
voltage meet the specified requirements for the
7.4 Discussion. The requirements of 7.1, 7.2,
circuit breaker under test.
and 7.3 areformulated in a general way to
facilitate the use of any syntheticmethod 8.1 High-Current Interval; Voltage of Current
which can give satisfactory results. Circuit.During the high-currentinterval the
It is possible that test methods other than circuitbreaker shall be stressed by thetest
those previously describedinthisguide will circuit so thatit presents the same starting
satisfy the above requirements. Methods, which conditions for the interaction interval as during
may not be correctfor -general use, may be the direct test.
correct for a specific type of circuit breaker or In synthetic testing the ratio of high-current
specific part of the testing program.
For circuit voltage to arc voltage is low due to the
example, the performance of abreakerfor iower voltage required for the current circuit
dielectricrestrike can be tested by voltage and the summation of the arc voltage of both
injection or other methods that meet only the the auxiliary and test circuit breakers. The arc
requirements stated in 7.3, provided that the voltage has amorepronouncedinfluenceon
performanceforthermalreignitions is tested the current, reducing both the peak and dura-
also. This can be accomplishedbydemon- tion of the cument loop. The peak value of the
stratingseparately the performance in the current occurs after the midpoint of the loop
interactioninterval using eitherthecurrent (Fig 9).
Fig 9
Effect of Arc Voltage on CurrentWaveform
PROSPECTIVE OR UNDISTORTED
CURRENT WAVEFORM
CURRENT WAVEFORM
ISTORTED BY ARCVOLTAGE
TI M E TO PEAK I t
P R 0 S P E C T IO
VFE”y “
WAVE
I T I M E TO PEAK
”J OF DISTORTED
I WAVE

14 Inc
ANSI/IEEE
Actual or calculateddistortioneffects en- methodsdescribedapply to the final current

counteredondirecttests may be used as loopprior to the application of the voltage
guidelines of allowable currentdistortionon circuit. In the case of tests with multiple loops
synthetic tests (see Appendix A). of arcing, care should be taken to ensure that
In the absence of equivalent direct test data, compensation of the final loop, by introducing
to assure full severity insynthetictesting,a additional asymmetry, doesnot cause excessive
maximum permissible influence is stated in reduction of the peak value of the preceding
terms of tolerance of current, amplitude and current loop. Therefore compensation through
loop duration. increased asymmetry should be keptto a
minimum,
8.1.1 Final Current Loop. Thetestshort-
circuit current shall be measured at the instant 8.2 InteractionInterval - CurrentInjection
of contact separation as done in directtests Circuit. The synthetic circuit shall be such that
(see ANSI/IEEE C37.09-1979 [3]. The ampli- the circuit breaker and the circuit interact in a
tude of the final current loop shall not be less manner similar to that of an equivalent direct
than 95% of the ac component as measured at test.
contact separationtaking into consideration In order to achieve this, the transition from
the test duty, and the procedures of 8.1.3. thehigh-currentcircuit tothe high-voltage
circuit shall becompletedbeforethere is a
8.1.2 Duration of Final Current Loop. The
significant change in the arc voltage of the
duration of the final currentloop shall not
circuit breaker (Fig 1 and see 8.2.5).
depart in either direction by more than 10%of
the prospective value of thetest frequency 8.2.1 Rate-of-Change of Injected Current
loop duration.
8.1.3 Procedures for Adjusting the Current
(.)* The
di
the prospective injected current
di
Circuit. To keepwithin the tolerances spec- shall be at least as greatas the a ofthe
ified in 8.1.1 and 8.1.2, it is permissible to
prospectiveshort-circuitcurrent.Therate-of-
introduce some compensation in the high-cur-
di
rent circuit. If the circuit breaker arc voltage change, -of injected current, shall be meas-
dt
characteristic is such thatit modifies the
wed at the end of the first loop by switching
current in service or in a direct test, then this
the voltage circuitintoashortedtestcircuit
influence on current amplitude and loop dura-
di
tion is acceptable when considering the toler- breaker. In determining the value of - for an
dt
ances given in 8.1.1 and 8.1.2. However, when
di
this modifying effect exceeds 5% of the ampli- asymmetrical test, the reduction of - due to
dt
tude, compensation techniques can be used to the dc component shall be taken into account.
adjust the peak of the last loop of current to The wave shape of the injected current should
satisfy the requirements. In lieu of compensa- be free of superimposed oscillations for a
tion, if justification that such distortion is a period extending to notless than 100 ps before
function of thecircuit breakerinterrupting current zero.
characteristics
can
be
demonstrated, then
modifying effects in excess of 5% of the final 8.2.2 Inductance of High-Voltage Circuit.
loop are permitted. Compensation of the peak While it is desirable to have the inductance of
current may be achieved by reducing the the high-voltage circuit the same as that of a
inductance of the current circuit or increasing direct test, it is recognized that deviation from
the currentsource voltage, or both. thisrequirement may be both advisable and
Reduction in loop duration can be offset by practical. Such deviation may be beneficial in
closing the fault making switch so as to demonstrating a much wider range of transient
introduce a small degree of asymmetry (in case recovery voltage (TRV)performance. A t this
of asymmetrical tests a small additional degree time is is deemed desirable to keep the max-
of asymmetry)andthis to some extent will imum deviation of the value of inductance t o
also compensate forthereduction in peak 50%. For the parallel current injection circuit,
current. Compensation for loop duration may the equivalentinductance is shownschemat-
be accomplished by a reduction in the power ically as L, (see Fig 2). The equivalent induc-
frequency when such control is available. tance of the series injection circuit is L, and L,
The
distortion
effects
andcompensating (see Fig 4).
C37.08L-81 1 4 8 0 5 7 0 2 O024626 B
ANSI/IEEE
The capacitance of the voltagesourceis period of arcing (8.2.1). The injected current
related to the frequency f, and the equivalent
inductance (I& in Fig 2 and L, and L, in Fig 4)
of thecurrent injectioncircuit. The wave-
frequencyshould be sufficientlybelow
basic frequency of the transient recovery
volt-
age so that adjustments tothe high-voltage
the
a
shaping capacitor (TRV shaping circuit in Figs circuitelementsareminimized. The range of
2 and 4) should be chosen in combination the injectedcurrentfrequency, f,, should be
with any other capacitor, damping resistor and, between 300 Hz and 1000 Hz. Otherfre-
if used,short-linefaultnetwork, to give the quencies fiay be used provided sufficient justi-
specified inherenttransient recovery voltage fication of test validity is demonstrated.
characteristics as required by 4.6.5.3 and It may be difficult t o determine the period of
4.6.5.4 of ANSI/IEEE C37.09-1979, [3], significant changeof arc voltage because:
8.2.4 Frequency of InjectedCurrent.The
(1) The arc voltage remains nearly constant
or is steadily rising during thecurrentloop
limits of the frequency, f,, of the injected
almost t o the instantof current zero.
currentdepend mainly uponthe arcvoltage
(2) Changes in the arc voltage occurcon-
characteristics of the circuit breaker. A check
siderably before the current zero,
should be made to determine the period of
significant change of arc voltage as shown in
In these cases an injection current frequency
as low as possible, and not exceeding 750 Hz,
Fig 1. The arc voltages of circuit breakers vary
shall be used, taking into account the limita-
considerably in general shape.Inmany cases
tions inherent in the choice of injected current
the voltage is not steady but fluctuates about a
frequency.
mean value. For the purpose of determining a
8.2.5 Injection Timing. The initiation of the
significant change of arc voltage whenap-
injected current shall be adjusted such that the
proachingcurrentzero, the meanvalue,ob-
time during which the test circuit breaker is fed .
tained by drawing a smooth curve between the by the injecied current alone is not more than
instantaneous crests and troughs, is used. The ?4 of the period of the injected current fre-
shape of the mean arcvoltagecharacteristics quency f, , (see Figs 3 and 5 ) .
may also vary widely.
Some circuit breakers show a nearly constant
orsteadily rising voltageduring thecurrent
8.3 High-Voltage Circuit. The
inherent
tran-
sient recovery voltage (TRV) of the synthetic
a
loop, with an appreciable increase just prior to test circuit shall comply with the requirements
current zero (see Fig 1). In other cases there is ofANSI C37.06-1979 [l] andshall in prin-
anappreciable decrease just prior to current ciple comply with the requirements of ANSI/
zero. In such cases it is notdifficult to IEEE C37.09-1979 [3] for the
power-fre-
determine from the oscillogram the instant at quency recovery voltage. The actual test TRV
which a significant changebegins. may differfrom the circuit TRV because of
For this purpose, it is preferable to use an effects of the circuit breaker. This is permis-
oscillograph giving a relatively high deflection sible if the circuit breaker affects the system
for the arc voltage and having a time scale fast voltage in the same manner. However, for the
enough to enable the period of significant synthetictest circuitadditionaldetailsand
changeof arcvoltage to be measuredaccu- tolerances must be given.
rately. 8.3.1 Recovery Voltage for Terminal Faults;
The maximumfrequency, f, maximum,of Symmetrical Short-circuit Current.Indirect
injected current is determined by the period of testing the transient recovery voltage is super-
significant change of arc voltage which period imposed on the power-frequency system volt-
shall be smaller than the time forwhich the arc age to obtain the total circuit breaker stress. In
is fed by the injected current alone. To achieve synthetictestingthe recovery voltage is sup-
this the period of the injectedfrequency, f, plied from the voltage circuit. This gives a dc
maximum,should be at leastfourtimes the voltage, an ac voltage or combined ac and dc
period of significant change of arc voltage. The voltage which in most cases decays due to the
frequency, 4,, of the injected current should be limited energy of the voltage source. If it is not
less than f, maximum, but high enough to possible to maintain the recovery voltage as
prevent unduecurrentdistortiondue to the specified in 4.6.5.3 ANSI/IEEE C37.09-1979.
superposition of injectedcurrentand
frequency short-circuit
current
during
the
power- [3], the following method is one alternative of
demonstrating conformance.
a
16
ANSI/IEEE
I \ /
i l '6Tp
(a) (b)
Explanation of curves:
@ Recovery
voltage
with
exponential
decrement Pz Point
below which
therecovery voltage @ shall
across thecircuitbreakerduringasynthetictest.not fall duringthespecifiedtimeinterval (6Tp)as
outlined in 8.3.1.
@ Power frequency recovery voltage of the first pole
to clearin the equivalentdirecttestwhere K=l.5. Pl Pointbelowwhichtherecovery voltage @\shall
not fall during the specified time interval ('/STp) as
@ Powerfrequencyphaserecovery voltage afterinter-outlined in 8.3.1.
ruption of all 3 poles in the equivalent direct test.
TP Period of rated power frequency.
Fig 10
Power Frequency Recovery Voltage
Forsynthetictesting the value of the re- not, before 0.1 S , fall below 50% of
covery voltage (that is, excluding TRV) during
a period equal t o '/S th of the cycle at the rated
frequency of the circuit breaker, shall not be
less thanthe equivalent value of the power
frequency recovery voltage which starts with
the minimum peak value of: If an exponentially decaying dc or combined
dc and ac recovery voltage imposes a greater
stress on the circuit breaker
than the ac
0.95 KCf V
recovery voltage in the equivalent direct test,
or if the value cannot be maintained for the
where : statedtime interval thenamoreappropriate
KCf = first pole to clear factor (1.5) circuit may be used taking intoaccountthe
V = maximum rated voltage of the circuit previously stated limits of both transient and
breaker, (see Fig 10 (a). power frequency recovery voltage.
8.3.2 Recovery Voltage for Terminal Faults;
Within 0.1 S , an exponentiallydecaying dc Asymmetric Short-circuit Current. The re-
recovery voltage shall not fall below 50% of covery voltage envelope for asymmetrical faults
needs t o be modified in accordancewith the
degree of asymmetry. A ratingstructurefor
TRV waveshapes under asymmetric fault con-
ditions is presently under study.
(See Fig 10(b). 8.3.3 Recovery Voltage for Short-Line
Faults. Synthetic testing under short-line fault
If the recovery voltage oscillates (an ac conditions shall be in accordance with ANSI/
voltage, or combined ac and dc voltage) then IEEE C37.09-1979 [3], especially with respect
the minimum value of the voltage peak shall to test current, recovery voltage and transient

17
C37=08L-81 (4805702 00246218 L
ANSI/IEEE
recovery voltage of lineand

source sides. example, reignition circuits) canbe used.
Further discussion of theseprinciples is in- 10.1.1 Todeterminethe maximumarcing
cluded in Section9. time the following step by step procedure may
be used. The arcing time may be varied until
9. Short-Line Fault the minimum arcing time is established. Min-
imum arcing time is that below which the
Short-line fault tests performed in a synthetic breaker would not clear. As in direct testing,
circuit shall meet the same conditions as the maximum arcingtime of abreaker is
outlined in ANSI/IEEE C37.09-1979 [ 31 . considered to be equal to minimum arcingtime
For direct tests the circuit parameters spec- plus one half cycle, except as modified by the
ified result in a proper sawtooth waveshape of requirements of 4.9,ANSI/IEEE C37.09-1979,
transient recovery voltage (TRV). [3], for single-phase testing t o demonstrate
Forshort-linefaultsynthetictesting the 3-phase ungrounded faults, or for asymmetrical
parameters of the short-line circuit shall bethe tests.
same as in a direct test and the shortline shall 10.1.2 When the arcing timeextendsfor
be in the current-carryingcircuitduring the more than one-half cycle, the test breaker may
entire interaction interval. If other parameters interruptthecurrentsuppliedonlybythe
and circuits are used, their equivalency mustbe current source while it would fail at the same
demonstrated. To obtain the steep initial rate- current zero if the voltage circuit were applied. .
or-rise of transient recovery voltage specified To check whether the test breaker clears the
for short-line fault tests it is necessary to use a full circuit at the subsequent current zero, it is
short-linefault
network giving sawtooth
a necessary to maintain or re-establish the con-
waveform with the correct voltage/time char- ductivity of thetestbreakerandauxiliary
acteristics. breaker.
With current injection circuits the short-line In some cases arcingcanbeprolongedby
fault circuit may be connected in series with delaying the opening of the auxiliarycircuit
the voltagecircuit, itsinductancebecoming breaker or by increasing the rate-of-rise of the
part of L,, as shown in Figs 2 and 4. transient recovery voltage of the power-fre-
The presence of the short-line fault circuit in quencycurrentcircuit.Theeffectiveness of
the voltage circuit may cause oscillations to be this method depends upon the characteristics
superimposed onthe injected current wave. of the high-currentcircuitand the circuit
These oscillationsshould be damped out, (to breaker.
satisfy the requirements of 8.2.1) so as not to For those cases where these methods are not
affect the current during the period of signifi- sufficient,aseparatecircuitcanbe used for
cant change of arc voltage or at least 100 ps reigniting both auxiliary
and test circuit
before current
zero. A resistance may be breakers. This circuit should provide a rapidly
connectedin series with the TRV shaping rising pulse of current of opposite polarity to
circuit (seeFig 2 and 4). Inmost cases, this that of the power-frequency current 10-100 ps
resistance, selected t o control theinitial rate of before current zero. The current through the
rise of recovery voltage, is sufficient to supply test circuitbreaker andthe auxiliarycircuit
the necessary damping. breaker is thus rapidly reversed and conduction
in the arc gaps is maintained for another loop
of power-frequencycurrent. Several suchcir-
IO. Multiple Loops cuits can be used forprolonging the arcing
through several loops of current.
Todemonstrate
the
performance of the
10.2 Methodwith Multiple Application of
breaker atthe maximum arcing time,the Voltage Circuits. With this method the voltage
following methodsmay be used. circuit is connected to the test circuit breaker
10.1 Methodwith Single Application of the at each currentzero, however if the breaker
Voltage Circuit. If the test facility provides for clears the procedure is stopped. If the breaker
only a single application of recovery voltage, reignites, the current source is reconnected and
then
appropriate
testing
procedures
and a voltage of the proper polarity is reapplied at
methodsforarcingtimeprolongation(for the next currentzero.

ANSI/IEEE
If the voltage circuit has insufficient energy fourparttestmethodto establish thatthe

forapplication at several current zeros, it is overall testing of thetestcircuit breaker is
necessary t o have as many voltages sources as satisfactory. This method establishes con-
the breaker has reignitions, plus one. ditions covering thermal, dielectric, and resistor
This method is practically the sameproce- duties under test.
dure as with direct testing, taking into account It is essential that theoperation and perform-
the relationship between breaking at the first ance of the resistor interrupter is not effected
zero and at thefollowing zeros. by the operation of the main interrupter for
these separate test procedures to be acceptable.
11.2.1 TermalReignitionTest onthe Main
Interrupter. The object of this part of the test
11. Circuit Breakers Equipped with is t o establish the performance of the main
Parallel Impedance interrupterduringtheinteraction interval. A
synthetictest is made with the resistor
11.1 General. Impedances in parallel with the mounted in its normal position in the circuit
arc may beeithercapacitors or resistors, or breaker. This test circuit breaker is subject to
both, in various combinations. Although such the normal requirements of 8.2 during a time
impedances modify the shape of the specified interval which is longwithrespect tothe
inherenttransient recovery voltage, thetype interaction interval. Care should be taken not
and degree of modification in the synthetic test to exceed the integrated thermal duty of the
should be the same as in the direct test. resistor as defined in ANSI/IEEE C37.04-1979
For example, the insertion of a resistor equal L21 *
to the surge impedance of the line will reduce 11.2.2 DielectricReignition Testonthe
the line siderate-of-rise to half value. The Main Interrupter. This part of the test covers
effect is not as pronouncedforabusfault the dielectric interval not covered in the
where a large number of lines are in parallel thermal reignition test described in 11.2.1.
because theircombined surge impedance is The resistor is disconnected in the test circuit
much lower than the resistance in parallel with breaker and the testis made with an equivalent
the arc. transient recovery voltage. This equivalent test
Where theshunt impedance is aresistor, voltage is the inherent transient recovery volt-
particularly if the ohmic value of the resistor is ageas would be modified by the presence of
low, the actual peak transient recovery voltage the resistor.
(TRV) in a synthetic test may not attain the Because theinteraction of thetestcircuit
value it would in a direct test because of the parameterswith the testcircuitbreakerhas
limited energy available from the voltage been demonstrated by the thermal tests during
source. Furthermore, theshunt resistor may the
interaction interval,
one
easement is
cause a too rapiddecay of thedc voltage allowed;namely, that asubstituteresistor in
following the TRV crest. the externalcircuitcan be switched into the
In somecases, t o meet theTRV requirements circuit or other circuit changes can be made at
of ANSI/IEEEC37.09-1979 [3] , it may be theappropriatetime to provide the required
possible voltage waveshape.
(1) To adjust the parameters of the voltage Problems can arise during the dielectric test
circuit to provide the necessary additional onamultipleconnected interiupter.For ex-
energy absorbed by the shuntresistor ample, the disconnection of the shunt resistors
(2) To switch over to an additional ac means thatthere is no longer any voltage
voltage source capable of maintaining voltage grading apartfromthat provided by capaci-
across the resistor. An equivalenttransient tance which in itself may not be sufficient to
recovery voltage waveform across the terminals prevent overstressing one interrupter. One way
of the test circuit breaker can be produced by of overcoming this problem is to attach higher-
replacement of resistance at other appropriate value resistors across the multiplebreaks to
places in test circuits. provide the voltage grading.
The effect of these resistors must of course
c 11.2 FourPartTest Method. One possible
approach t o demonstrate validity is to use a
be taken into account in providing the correct
transient recovery voltage waveform. In all
19

ANSI/IEEE
cases the applicable procedures for unit testing ages, making currents,interruptingcurrents,
outlined
ANSI/IEEE
in C37.09-1979 [3] and percent asymmetry.
should be followed. While it would be desirable to demonstrate
11.2.3 Teston Resistor. Power frequency exact compliance with the required test duties,
tests are required todemonstratethatthe practical limitations of synthetic circuit facil-
resistor and connections can meet the thermal ities necessitate some allowances as described
and voltage conditions,transientandpower below.
frequency, imposed by the duty cycle of the 12.1.1 Time Intervals. Testduties having
circuit breaker in accordance with ANSI/IEEE time intervals of O S (15 to 20 cycles) and 15 S
C37.04-1979 [2]. These two requirements can associated with reclosing operations usually ~
be established separately if it can be demon- cannot be performed with thefull value of

strated that the heating of the resistor does not recovery voltage unless multiple voltage circuits
effect theinsulation strength. andother special techniquesareemployed.
11.2.4 TestonResistorInterrupter.This However, for these duty cycles, it is acceptable
part of the test demonstrates that the resistor to use a single voltage circuit but additional
interrupter has the required performance. For tests may berequired as described forthe
thesetests thecurrentthroughthe resistor various tests.
interrupter shall be equal to that which would One testmethodwouldincludethetime
be obtained on afull power direct test. interval as shown in ANSI/IEEE C37.04-1979,
The ideal direct circuit,
withwhich the [2] but with the recovery voltage for the initial
resistor and resistor interruptershouldbe open operation from the current source. The
tested, requires the full MVA source at the test firstopeningoperation of a high-speed re-
voltage. This is clearly impossible and a com- closing cycle performed at current-source volt-
promise permitsthe use of a lowerMVA source age should provide the release of arc energy to
having higher inductanceandhighersource be expected under a similar full voltage test.
. voltage to obtain the required power frequency The secondopenoperation of thetestduty
current. This may result in the resistor inter- cycle would be made at full recovery voltage.
rupter being stressed with a higher voltagethan Under these conditions, the high-speed re-
is required by thetest specification.
This closing operationat reduced applied voltage
generally imposesamore severe testthan shouldresult in aperformancesufficiently
required on theresistor interrupter. close tothat which wouldresultfromfull
The resistor interrupter performance may be applied voltage for both operations.
demonstrated also by using differentresistor For those breakers where the appropriate arc
values provided theinterrupterseesproper energy cannot be supplied by thecurrent
voltage and current stresses. source for the first opening operation further
Othermethodsofdemonstratingperform- justification of the test procedure is required,
ance such as directtestat less thanrated Generally it may be sufficient if the arcing time
short-circuit current can be used provided the of thefirst openingoperation is withinone
resistor interrupter is subjected to the appro- half cycle of the maximum arcing time.
priate current and voltage stresses. 12.2.2 Closing Test Voltage. The making of
rated currents on close-open tests usually can-
not be made at full rated voltage. However, the
importance of the fullratedvoltage being
12. Duty Cycle applied on the closing operation of the close-
open tests depends on thecharacteristics of the
12.1 TestDuties forSynthetic Testing. The circuit breaker.
test duties required to demonstrate the single- Normally it is required to demonstrate that
phase short-circuit interrupting performance of the circuit breaker has the capability of closing
acircuitbreakerarelisted in Table2 of against and withstanding the maximum electro-
ANSI/IEEE C37.09-1979 [3] . The related re- magnetic forces associated with the rated asym-
quiredtransientrecovery voltage capabilities metrical current. If the pre-arcing time is short
are given in ANSI C37.06-1979 [ I ] . These or not appreciablydependent on the applied
requirements include operating sequences and voltage, and the surroundingmedium is un-
duty cycles with specified time intervals, volt- likely to generateappreciablepressure in the
20 Inc
ANSI/IEEE
CIRCUIT BREAKERS RATEDON A SYMMETRICAL CURRENT BASIS C37.081-1981
vicinity of the contacts, then the currentis the shall bedemonstratedbytestduties8.2and

most important factor and the close operation 8.3 as in direct testing.
can be made a t current source voltage. This will 12.2.4 TestDuty 7. Testduty7demon-
result in aperformancesufficiently close to strates the performance of the circuit breaker
that which would result from full rated voltage. at rated maximum voltage / K y and service
This procedure is not in conflict with present capability(ANSI/IEEE C37.09-1979, [3] ,
direct testson close-open duty cycles. 4.6.3) which is the ability of the circuit breaker
Forthose cases where prestriking is appre- to meetthetotalnumberofoperations re-
ciable, appropriatesyntheticcircuits may be quired and still be in a specified condition. The
used. test duty required varies with the rating andin
12.2 Test Methods. The methods for demon- each case testduties followed by -2 or - 3
stratingtheshort-circuitcurrentrating of a together constitute an alternate tothetest
circuit breaker are shown in Table 2 of duty followed by -1. (See note 7 of Table 2,
ANSI/IEEE C37.09-1979 [3] . A review of ANSI/IEEE C37.09-1979 [3] ). If full voltage
these test duties with regard t o modifications interruptions having a time interval of 1 5 S
for synthetictesting are listed below. cannot be met, the duty cycles listed in Table
12.2.1 Test Duties 1, 2, and 3. Test duties 1 may be adoptedforsynthetictesting as a
1, 2, and 3 specify short-circuit currents, both substitute for test duty 7.
symmetrical and asymmetrical, less than rating, Based onlimitations in the testingstation,
and consist of both opening (O) and close-open time T is the minimum practicaltime and
(CO) operations. should not exceed 6 min.
Since closing at rated maximum current is The voltage for theclosing operations may be
required onother duties, the voltage onthe provided by the current circuit. The recovery
close part of the CO operation can be applied voltages associated with openingoperations
by the current circuit. The transient recovery shall be as specified with due regard for
voltage shouldbe the relatedcapability en- asymmetry.
e velope for
rating.
the
appropriate circuit-breaker
12.2.2 TestDuties 4 and 5. Testduties4

12.2.5TestDuty 8. Test duty 8 demon-
strates the service capability of circuit breakers
which do not have to perform test duty 7A,
and 5demonstrate the ability of the circuit and shows the effect of several interruptions
breaker tointerruptcurrentsequaltothe below the ratedshort-circuitcurrent as spec-
requiredsymmetricalinterruptingcapabilities ified in 5.10.3.3.1 of ANSI/IEEE C37.04-1979,
at rated maximum voltage and rated maximum [2]. The close part of the CO operations may
voltage /K, with K representing the rated be made with the currentcircuit.
voltage range factor. 12.2.6 Test Duties 9 and 10. Test duties 9
If circuit capabilities preclude having full and 10 demonstrate high speed reclosing when
recovery voltage for both open operations of thecircuitbreaker is rated for that purpose.
the 0-15 S zero duty cycle, it isdeemed When K, the rated voltage range factor, is less
satisfactory t o have the initial interruption at than 1.2 the test at the higher current of test
currentsource voltage andthe secondinter- duty 1 0 is adequatedemonstrationandtest
ruption atfull voltage. duty 9 is omitted. The initial interruption and
12.2.3TestDuty 6. Testduty6 demon- reclosing operation may be made at the current
strates the performance of the circuit breaker circuit voltage, with the final interruption
at rated maximum voltage: closing against made at thefull recovery voltage.
currentsequal to the requiredcapability and
interruptingcurrentsequal tothe required Table 1
asymmetrical interrupting capability with due Duty Cycles for SyntheticTesting
regard for the reduced transient recovery volt-
age. Because of the inability of testing circuits 7.4-2 C-Tmin-C-15min-C-Tmin-C-1hour-C
to produce all the specified currents and 7A-3 0-2'min-0-15min-0-2'min-0-1hour-O
voltages at the specified times, it may not be 7B-2
C-T
min-C-1
h-C
possible t o make test duty 8.1 as specified. In 7B-3 O-Tmin-0-1 h-O
this case, the closing and opening capabilities
COPYRIGHT Institute of Electrical and Electronics Engineers, 21

Inc
C37.0BZ-BL m4805702
0024632 i-m-
ANSI/IEEE
12.2;7 Test Duty 11. Test duty 11 demon- specific requirements of synthetictesting as
strates the ability of the circuitbreaker to close prescribed in this guide have been met. These
againsi a short circuit, to remain closed until measurements should be made on a scale which
tripped,and to interrupt when tripped as presents ?5% accuracy.
required by ANSI/IEEE C37.09-1979 [3]. 13.2 Current Measurements
Because of difficulties in sustaining the cur- 13.2.1 ProspectiveInjected
Current. In
rents, either the current at contact separation order to determine the frequency and rate-of-
may be below KIorthecurrent may be change of the injected current as it approaches
supplied for the greater part of the carry time zero, high-speed cathoderayoscillography or
from a low-voltage circuit. This circuit will be otherhigh-frequencyrecordinginstrumenta-
switched off by another circuit breaker and a tion is required.The oscillogram shouldbe
circuitcapable of supplying the specifiedre- recorded with time and amplitude scales such
covery voltage shall beconnectedbefore the that accuratemeasurementsare possible over
test circuit breaker is opened. The time, T, is the last 100 ps priortocurrent zero.These
controlled in accordance with the provisions of measurements shall be taken by discharging the
5.10.2.4.of ANSI/IEEE C37.04-1979 [2] so as high-voltage circuit into the closed test circuit
to obtain the same value of i2t, and, conse- breaker. These records will serve to verify that
quently,approximately the same heatingef- the requirements of 8.2.1 have been met.
fect, regardless of the currentdecrement. 13.2.2 CurrentThrough theTest Circuit
12.2.8 TestDuties 12,13, and 14. No re- Breaker. This current il + i2, for the parallel
quirementsarelistedin ANSI/IEEE C37.09- or series current injection test (see Figs 2 and
1979 for these test duties. 4) should be recorded with reasonable ampli-
12.2.9 TestDuties 15 and 16. Testduties tude so that the slope of the current toward
15 and 16 demonstrate the performance of the zerocan be checkedwith thetransient re-
circuitbreakerduring the
interruption of covery voltagerecord to makesure thatno
short-line faults. When K is less than 1.2, test reignitionoccursfollowing the initialcurrent
duty 16 is omitted. These testsaremade zero.
on a phase-to-ground basis with a test circuit Adequate resolution in time can be obtained
specified
as in 4.5.6.4 of ANSI/IEEE using an electromagnetic-type oscillograph pro-
C37.09-1979 [3] , Each circuitbreakernor- vided that the time scale is such that one loop
mally has acriticalshort-line fault location is of the order of 2.0 cm to 2.5 cm.
which producesmaximum stress. The condi-
13.2.3 Injection Current Timing. It is neces-
tions specified in test duties 15 and 16 in Table
sary to measure the timing of injection current
2 of that standard, may not correspond to the
relative tothe zero of the power-frequency
critical valuesof aparticularcircuitbreaker
current.Inorder to determinewhether the
and are intended only as a standard demonstra-
requiredlimits of timingaccuracy have been
tiontest.Thedemonstrationtest is not re-
achieved, high-speed recording of the current in
quired for circuit breakers rated 72.5 kV and
the test circuit breaker is necessary t o evaluate
below.
the point of injectionand the whole of the
For synthetic testing purposes the time in-
period of injection. This will enable the related
terval may be altered to 3 min or less and if a
requirements of 8.2.5 to be verified.
duty involving closing operationsis used t o
13.2.4 CurrentThrough the Auxiliary Cir-
demonstrate this duty, theclose operation may
cuit Breaker Loop. For convenience in evalu-
be made at thecurrenbcircuit voltage.
ating the auxiliary circuit breaker and overall
circuit performance, it is helpful to record the
currentsthrough thecurrent circuitand the
high-voltage circuit, as well as the test circuit-
13. Test Records
breaker.
13.1 General. Data to be recorded during 13.3 Voltage Measurements
synthetictestsshouldincludethoselisted in 13.3.1 Current Circuit Voltage. The cur-
the pertinent sections of ANSI/IEEE C37.09- rent circuit voltages across the test and auxil-
1979 [ 31 . In addition, themeasurements listed iary circuit breakers shallbe recorded to enable
below- shall be made to demonstrate that the theratio of the arc voltage tothe driving

ANSI/IEEE
voltage to bechecked as requiredby 8.1.3. 13.3.3 Voltage Across TestCircuit Breaker

O Adequateresolution of these ..measurements
can be madewithalow-frequencyelectro-
13.3.3.1 Transient Recovery Voltage
(TRV). Todeterminetheinherentoractual
magnetic oscillograph. TRV a high-speed cathode ray oscillograph or
13.3.2 Arc Voltage of Test Circuit Breaker. equivalent recordingdevice is required.
This measurement will indicate the form of the It is recommended that where convenientthe
arc voltage, that is, constantor linear. It current as it approacheszero be recorded on
further enables a check to be made regarding the TRV record with the same resolution.
thetimingandfrequency of thecurrent in- 13.3.3.2 Recovery Voltage. The recovery
jectionrelative tothe period of significant voltage may be recorded on an electromagnetic
change of arc voltage (8.2.5). Such arecord oscillograph or equivalent t o verify the param-
should have sufficient scale for evaluation of eters set forth in 8.3.1.
the critical arcing period.
CAUTION: Care should be taken into account for the
inductive voltage drop of the test circuit breaker which
may be of thesame order of magnitudeasthe arc
voltage.

1 4 8 0 5 7 0 20 0 2 4 6 3 4 7
Appendix A
(This Appendix is not a part of ANSI/IEEE C37.081-1981, IEEE Guide for Synthetic Fault Testing of AC High-
Voltage Circuit Breakers Rated on a Symmetrical Current Basis.)
Distorted Current;Derivation
Al. Introduction
The distorted current mathematically repre- If both the voltages U and u are present (see
sents the differencebetween the prospective Figs Al(b) and Al(c), then
the resulting
current and the distortion current. The method current is given by
of calculationpresentedhere will derive the
distorted current, which will then be related to i = ik - id where
the prospective current to arrive at an expres-
ik = prospective current
sion for the distortion current.
A3. The Influenceof the Distortion

A2. Derivation
Current During the Period
of Arcing
Thedistortioncurrent which flows during
the period of significant arcing may be cal-
During this period, the distortion current id,
culated as follows:
influences thereductionto zero of thepro-
Referring to Fig. Al(c), if the supply voltage
spective current ik, and is a function of the
is assumed t o be equal to zero, (U=O), then the
characteristics of the arc gap and the param-
arc voltage v, will produce a current flow id the
eters of the network.
distortion current. This current flows partly as
In comparison with the prospective current,
ia through the inductance L, and partly as idc
the resulting arc current presents a distortion
through the capacitance C. For this condition
of the four physical parameters: current ampli-
the following equations apply:
di
tude, loop duration, arc energy, and - .
dt
As afirstapproximationtwodifferentarc
voltage characteristics can be considered:
(1) A constant arc voltage v = V,,
(2) A linearly rising arc voltage, v = S t
where
From these the following equation for id can T
be obtained: Vb = S -is
4 assumed
f = 0 = power frequency
2T
For the more general case the formula for the
distortion current is:
Taking into account that the current through
id = &"i
A(t- T) - u ( T ) d7
the capacitance C in Fig Al(a) is small in this
period of arcing, thecircuit diagrammay be
simplified by neglecting C. Forboth of the
where above arc voltages, the following formulae can
A(t) = transitory response of the system seen be derived, related to asymmetrical current
from the terminals of the test breaker. having no dc component:

25
C37-0BL-BL p 0 5 7 0 2 0024635 9 r
ANSI/IEEE
L A I
@wiFnt arc
(b)
voltage
Fig A l
Distortion Current
26
1 4 8 0 5 7 0 20 0 2 4 6 3 6 O I
ANSI/IEEE
C37.081-1981
These formulae are valid for a single loop of for linearlyrising arc voltage:
arcing,
sw
V=L W *I = peak value of driving voltage sin wt, = -t;2v
of powerfrequency current
circuit
I = peak
value
current
of prospective A3.4 Rate of change of i at the moment t l -
for constant arcvoltage:
i = instantaneous value of arc
current (reduced by arc volt-
age)
Il = peak value of arccurrent
(reduced by arc voltage)
di
-
dt =-WI [J- ++]
t, = instant of peak value of Il
for linearly rising arc voltage:
A3.1 Ratio of current amplitudes for constant r 1
arc voltage : di
dt 2v
A3.5 Reduction of arc energy. The arc energy

for linearlyrising arc voltage: released duringonearcing loop is dependent
upon arc voltage and currentso that
Il sw
- =sin wt, - - t&
I 2v
A3.2 Moment t, of maximumcurrent for

constant arcvoltage:
for constant arc voltage:
Ub
t= -
cos w
,
v
for linearly rising arc voltage:
St, for linearly rising arc voltage:

cos wt, = -
V
A3.3 Moment tl of currentinterruptionfor War, sin w t l - wt, cos wt, - -

8Uw
constant arc voltage :
sin wt, = OVb

-t
V
I

27
C37.081-81 1 4 8 0 5 7 0 20 0 2 4 6 3 8 Y I
Related Standards in the C37 Series

C37.04-1979RatingStructurefor AC High-Voltage C37.17-1979 Trip Devices for AC and General Purpose
Circuit Breakers Rated on a symmetrical Current Basis DC Low-Voltage Power Circuit Breakers (ANSI)
(Consolidated edition, Including supplements C37.04a,
C37.04b, and C37.04c), (ANSI/IEEE) C37.18-1979 Standard Field Discharge Circuit Breakers
Used inEnclosures forRotatingElectricMachinery
C37.06-1979PreferredRatingsandRelatedRequired (ANSI/IEEE)
Capabilities for AC High-Voltage Circuit
Breakers
Rated on aSymmetricalCurrent Basis (Consolidated C37.20-1974 Switchgear Assemblies,IncludingMetal-
edition, ANSI) EnclosedBus
(includes
supplement
C37.20a-1970,
C37.09-1979 Test
Procedure
for AC High-Voltage C37.20b-1972,C37.20~-1974,C37.20d-1978)(Con-
Circuit
Breakers Ratedon Symmetrical
a Current solidated edition, ANSI/IEEE)
Basis (Consolidated edition, ANSI/IEEE)
C37.23-1970 (R 1977) Guide for Calculating Losses in
C37.010-1979 Application Guide for AC High-Voltage Isolated-Phase Bus (ANSI/IEEE)
Circuit
Breakers Rated on Symmetrical
a Current
Basis (Consolidated edition, ANSI/IEEE) C37.24-1971 (R 1976) Guide for Evaluating the Effect
C37.011-1979ApplicationGuideforTransientRe- of Solar Radiation on Outdoor Metal-Clad Switchgear
coveryVoltagefor AC High-VoltageCircuitBreakers (ANSI/IEEE)
Rated o n a Symmetrical Current Basis' (Consolidated C37.26-1972 (R 1977) GuideforMethods of Power
edition, ANSI/IEEE) (Revisionof C37.0721-1971) FactorMeasurementforLow-VoltageInductiveTest
C37.012-1979 Application Guide for Capacitance Cur- Circuits (ANSI/IEEE)
rentSwitching of AC High-VoltageCircuitBreakers
Rated o n a Symmetrical Current Basis, (Consolidated C37.27-1972ApplicationGuide for Low-Voltage AC
edition) (ANSI/IEEE) (Revision of C37.0731-1973) Non-IntegrallyFusedPowerCircuitBreakers(Using
SeparatelyMountedCurrent-LimitingFuses)(ANSI/
C37.1-1979 StandardDefinition,
Specification
and IEEE)
Analysis of Manual, Automatic, and Supervisory Sta- C37.29-1974 Standard
for Low-Voltage AC Power
tion Control and Data Acquisition (ANSI/IEEE) CircuitProtectors Used in Enclosures(ANSI/IEEE)
C37.2-1979StandardElectricalPowerSystemDevice
Function Numbers (ANSI/IEEE) C37.30-1971DefinitionsandRequirementsforHigh-
C37.4-1953(R 1976) DefinitionsandRatingStruc- VoltageAirSwitches,Insulators,and Bus Supports
ture for AC High-Voltage Circuit Breakers Rated on a (ANSI/IEEE)
TotalCurrent Basis [includessupplementsC37.4a- C37.30a-1975Supplement to C37.30-1971,(ANSI/
1958 (R 1966) and C37.4b-1970 (R 1971) (reaffirmed IEEE) (sold separately)
with change in title)] (ANSI) and C37.4~-1980 (ANSI/
IEEE) C37.31-1962 (R 1969) Electrical and Mechanical Char-
C37.5-1979GuideforCalculation of FaultCurrents acteristics of Indoor Apparatus Insulators (ANSI)
forApplication of AC High-VoltageCircuitBreakers C37.32-1972SchedulesofPreferredRatings,Manu-
Rated ona Total Current Basis (ANSI/IEEE) facturingSpecifications,andApplicationGuidefor
C37.6-1971 (R 1976) Schedules of PreferredRatings High-Voltage Air Switches, Bus Supports, and Switch
for AC High-Voltage Circuit Breakers Rated o n a Total Accessories (ANSI)
Current Basis (ANSI) C37.33-1970(R 1976) RatedControl Voltages and
C37.7-1960 (R 1976) (reaffirmed with change in title) their Ranges for High-VoltageAirSwitches (ANSI)
InterruptingRating
Factors
for
Reclosing Service
for AC High-Voltage Circuit Breakers Rated on a Total C37.34-1971 ( R 1 9 7 7 ) Test Code for High-Voltage Air
Current Basis (ANSI) Switches (ANSI/IEEE)
C37.34a-1975
supplement to C37.34-1971,sold
C37.9-1953 (R 1976) (reaffirmed with change in title) separately
Test Code for AC High-Voltage Circuit Breakers Rated
o n a Total Current Basis [includes supplement C37.9a- C37.35-1976Guidefor theApplication,Installation,
1970 (R 1971)] (ANSI) Operation, and Maintenance of High-Voltage Air Dis-
connecting and Load Interrupter Switches (ANSI)
C37.11-1975RequirementsforElectricalControlfor
ACHigh VoltageCircuitBreakersRated o n aSym- C37.37-1979 Loading Guide for AC High-Voltage Air
metrical
Current Basis and Total
a Current Basis Switches (In Excess of 1000 Volts) (revision of C37.37-
(ANSI) 1971) (ANSI/IEEE)
C37.12-1969(R1974)GuideSpecificationsfor AC C37.40-1969 (R 1974) Service Conditions and Defini-
High-Voltage Circuit Breakers Rated on a Symmetrical tionsforDistributionCutoutsandFuseLinks,Sec-
Current Basis and a Total CurrentBasis (ANSI) ondaryFuses,DistributionEnclosed Single-Pole Air
(237.13-1981 Low-Voltage AC Power Circuit Breakers Switches,PowerFuses,FuseDisconnectingSwitches,
Used in Enclosures (ANSI/IEEE) and Accessories (ANSI)
C37.14-1979 Low-Voltage DC Power Circuit Breakers C37.41-1969 (R1974) Design TestsforDistribution
Used in Enclosures (ANSI/IEEE) CutoutsandFuseLinks,SecondaryFuses,Distribu-
tion Enclosed Single-PoleAirSwitches,PowerFuses,
C37.16-1979 Preferred Ratings, Related Requirements Fuse Disconnecting Switches, and Accessories (ANSI)
for andApplicationRecommendations for
LOW-
VoltagePowerCircuitBreakersand AC Power Cir- C37.42-1969 (R 1974) Specifications for Distribution
cuit Protectors
COPYRIGHT Institute (revision ofand
of Electrical C37.16-1973) (ANSI)
Electronics Enclosed, Open, and Open-Link Cutouts (ANSI)
Engineers, Inc
C37.43-1969 (R 1974) Specifications for Distribution C37.63-1969 (R 1974) RequirementsforAutomatic
FuseLinksfor Use inDistributionEnclosed,Open, LineSectionalizersforAlternating-CurrentSystems,
and Open-Link Cutouts (ANSI) (includes supplement C37.63a-1973) (ANSI)
C37.44-1969 (R 1974) Specifications for Distribution C37.66-1969 (R 1974)Requirementsfor Oil-Filled
Oil Cutouts and Fuse Links (ANSI) CapacitorSwitchesforAlternating-CurrentSystems
C37.45-1969 (R 1974) Specifications for Distribution (ANSI)
Enclosed Single-Pole Air Switches (ANSI) C37.85-1972 (R 1978) SafetyRequirementsfor X-
Radiation Limits for AC High-Voltage Power Vacuum
C37.46-1969 (R 1974) Specifications for Power Fuses Interrupters Used in PowerSwitchgear(includes sup-
and Fuse Disconnecting Switches (ANSI) plement C37.85a-1972) (ANSI)
C37.47-1969 (R 1974) Specifications for Distribution C37.90-1978 Relays and Relay Systems Associated
Fuse Disconnecting Switches, Fuse Supports, and Cur- with Electric Power Apparatus (ANSI/IEEE)
rent-Limiting Fuses (ANSI)
C37.90a-1974 (R 1979) Guide forSurge Withstand Ca-
C37.48-1969 (R 1974) Guide for Application, Opera- pability (SWC) Tests (Supplement t o ANSI/IEEE
tion,andMaintenance of DistributionCutoutsand C37.90-1978) (ANSI/IEEE)
Fuse Links, Secondary Fuses,DistributionEnclosed
Single-Pole Air Switches,PowerFuses,FuseDiscon- C37.91-1972 (R 1979) Guide for Protective Relay Ap-
necting Switches, andAccessories (ANSI) plications t o Power Transformers (ANSI/IEEE)
C37.48aTrial-Use StandardApplication of Fusesin C37.93-1976 Guide for Protective Relay Applications
Enclosures
(Revision of Section 8, ANSI C37.47- ofAudioTones over Telephone Channels (ANSI/
1969) (ANSI/IEEE) IEEE)
C37.50-1973TestProcedures for Low-Voltage AC C37.95-1974 (R 1979) Guide for Protective Relaying
PowerCircuitBreakers Used in Enclosures,(includes of Utility-Consumer Interconnections (ANSI/IEEE)
supplements C37.50a-1975 and C57.50b-1975) (ANSI)
C37.96-1975 Guide for AC Motor Protection (super-
C37.51-1979 Conformance Testing of Metal-Enclosed sedes C37.92-1972 and C37.94-1972) (ANSI/IEEE)
Low-Voltage AC Power Circuit Breaker Switchgear As-
semblies (ANSI) C37.97-1979 Guide for Protective Relay Applications
to Power System Buses (ANSI/IEEE)
C37.52-1974TestProcedures for Low-Voltage AC
PowerCircuitProtectors Used in Enclosures(ANSI) C37.98-1978 Standard for SeismicTesting of Relays
(This standardcomplementsANSI/IEEE344-1975)
C37.60-1974 Requirementsfor
AutomaticCircuit (ANSI/IEEE)
Reclosers forAlternatingCurrentSystems(ANSI/
IEEE) C37.99-1980 Guide for the Protection of Shunt Capa-
citor Banks (ANSI/IEEE)
C37.61-1973Guide forthe Application,Operation,
and
Maintenance of Automatic Circuit Reclosers C37.100-1972 Definitions for Power Switchgear (ANSI)
(ANSI/IEEE) (Includes definitions from C37.03-1964)


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~~

guide forsynthetic fault testingof

COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

Approved September 14,1978

Approved December 1,1980

The Institute of Electrical and Electronics Engineers, Inc

No part o f this publication may be reproducedin any form,

COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

a 1 Numbers in brackets correspond to those of the

COPYRIGHT Institute of Electrical and Electronics Engineers,7Inc

COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

T-{ H~GHVOLTAGE O &IGGERED

COPYRIGHT Institute of Electrical and Electronics Engineers, 11

currentproduced by thecurrent sourceand (TRV) from the high-voltage circuit as shown

contribution of the high-voltage circuit during of thesemethodsbyboththe userand the

action of the circuitbreakerand the circuit injectionmethod, or somedifferentmethod

COPYRIGHT Institute of Electrical and Electronics Engineers,

Actual or calculateddistortioneffects en- methodsdescribedapply to the final current

COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

recovery voltage of lineand

COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

If the voltage circuit has insufficient energy fourparttestmethodto establish thatthe

COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

be established separately if it can be demon- cannot be performed with thefull value of

vicinity of the contacts, then the currentis the shall bedemonstratedbytestduties8.2and

12.2.2 TestDuties 4 and 5. Testduties4

COPYRIGHT Institute of Electrical and Electronics Engineers, 21

COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

voltage to bechecked as requiredby 8.1.3. 13.3.3 Voltage Across TestCircuit Breaker

COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

A3. The Influenceof the Distortion

COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

A3.5 Reduction of arc energy. The arc energy

A3.2 Moment t, of maximumcurrent for

St, for linearly rising arc voltage:

A3.3 Moment tl of currentinterruptionfor War, sin w t l - wt, cos wt, - -

sin wt, = OVb

COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

Related Standards in the C37 Series

COPYRIGHT Institute of Electrical and Electronics Engineers, Inc

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