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Infineon IMZ120R030M1H DataSheet v02 - 02 EN
Infineon IMZ120R030M1H DataSheet v02 - 02 EN
Infineon IMZ120R030M1H DataSheet v02 - 02 EN
IMZ120R030M1H
CoolSiC™ 1200V SiC Trench MOSFET
Silicon Carbide MOSFET
Features Drain
Very low switching losses pin 1
Benefits
Efficiency improvement
Enabling higher frequency
Increased power density
Cooling effort reduction
Reduction of system complexity and cost
Potential applications
Energy generation
o Solar string inverter and solar optimizer
Industrial power supplies
o Industrial UPS
o Industrial SMPS
Infrastructure – Charge
o Charger
Product validation
Qualified for industrial applications according to the relevant tests of JEDEC 47/20/22
Note: the source and sense pins are not exchangeable, their exchange might lead to malfunction
Datasheet Please read the Important Notice and Warnings at the end of this document 2.2
www.infineon.com page 1 of 17 2020-12-11
IMZ120R030M1H
CoolSiC™ 1200V SiC Trench MOSFET
Table of contents
Datasheet 2 of 17 2.2
2020-12-11
IMZ120R030M1H
CoolSiC™ 1200V SiC Trench MOSFET
Maximum ratings
1 Maximum ratings
For optimum lifetime and reliability, Infineon recommends operating conditions that do not exceed 80% of the
maximum ratings stated in this datasheet.
1
verified by design
2
Important note: The selection of positive and negative gate-source voltages impacts the long-term behavior
of the device. The design guidelines described in Application Note AN2018-09 must be considered to ensure
sound operation of the device over the planned lifetime.
Datasheet 3 of 17 2.2
2020-12-11
IMZ120R030M1H
CoolSiC™ 1200V SiC Trench MOSFET
Thermal resistances
2 Thermal resistances
Table 3
Value Unit
Parameter Symbol Conditions
min. typ. max.
MOSFET/body diode
thermal resistance, Rth(j-c) - 0.51 0.66 K/W
junction – case
Thermal resistance,
Rth(j-a) leaded - - 62 K/W
junction – ambient
Datasheet 4 of 17 2.2
2020-12-11
IMZ120R030M1H
CoolSiC™ 1200V SiC Trench MOSFET
Electrical Characteristics
3 Electrical Characteristics
3.1 Static characteristics
Table 4 Static characteristics (at Tvj = 25°C, unless otherwise specified)
Parameter Symbol Conditions Value Unit
min. typ. max.
Drain-source on-state RDS(on) VGS = 18V, ID = 25A,
resistance Tvj = 25°C - 30 42
Tvj = 100°C - 38 -
mΩ
Tvj = 175°C - 57 -
VGS = 15V, ID = 25A,
Tvj = 25°C - 42 56
Body diode forward VSD VGS = 0V, ISD = 25A
voltage Tvj = 25°C - 4.1 5.2
V
Tvj = 100°C - 4.0 -
Tvj = 175°C - 3.9 -
Gate-source threshold VGS(th) (tested after 1 ms pulse at
voltage VGS = 20V)
ID = 10mA, VDS = VGS V
Tvj = 25°C 3.5 4.5 5.7
Tvj =175°C - 3.6 -
Zero gate voltage drain IDSS VGS = 0V, VDS = 1200V
current Tvj = 25°C - 1.1 200 µA
Tvj = 175°C - 3.4 -
Gate-source leakage IGSS VGS = 23V, VDS = 0V - - 120 nA
current VGS = -7V, VDS = 0V - - -120 nA
Transconductance gfs VDS = 20V, ID = 25A - 14 - S
Internal gate resistance RG,int f = 1MHz, VAC = 25mV - 3 - Ω
Datasheet 5 of 17 2.2
2020-12-11
IMZ120R030M1H
CoolSiC™ 1200V SiC Trench MOSFET
Electrical Characteristics
Datasheet 6 of 17 2.2
2020-12-11
IMZ120R030M1H
CoolSiC™ 1200V SiC Trench MOSFET
Electrical Characteristics
Datasheet 7 of 17 2.2
2020-12-11
IMZ120R030M1H
CoolSiC™ 1200V SiC Trench MOSFET
Electrical characteristic diagrams
Ptot [W]
IDS [A]
80
60 100
40
50 Rth(j-c,max)
20
Rth(j-c,typ)
0 0
0 400 800 1200 0 25 50 75 100 125 150 175
VDS [V] TC [ C]
Figure 1 Safe operating area (SOA) Figure 2 Power dissipation as a function of case
(VGS = 0/18V, Tc = 25°C, Tj ≤ 175°C) temperature limited by bond wire
(Ptot = f(TC))
60 60
50 50
40 40
ISD [A]
IDS [A]
30 30
20 20
Rth(j-c,max) Rth(j-c,typ)
10 10
Rth(j-c,typ) Rth(j-c,max)
0 0
0 25 50 75 100 125 150 175 0 25 50 75 100 125 150 175
TC [ C] TC [ C]
Figure 3 Maximum DC drain to source current as Figure 4 Maximum source to drain current as a
a function of case temperature limited function of case temperature limited by
by bond wire (IDS = f(TC)) bond wire (ISD = f(TC), VGS = 0V)
Datasheet 8 of 17 2.2
2020-12-11
IMZ120R030M1H
CoolSiC™ 1200V SiC Trench MOSFET
Electrical characteristic diagrams
240 6
25°C
200 175°C 5
160 4
120 3
80 2
40 1
0 0
0 5 10 15 20 -40 10 60 110 160
VGS [V] Tvj [ C]
240 240
20V 20V
18V 18V
200 16V 200 16V
15V 15V
14V 14V
160 12V 160 12V
10V 10V
IDS [A]
IDS [A]
120 8V 8V
120
6V 6V
80 80
40 40
0 0
0 4 8 12 16 20 0 4 8 12 16 20
VDS [V] VDS [V]
Figure 7 Typical output characteristic, VGS as Figure 8 Typical output characteristic, VGS as
parameter parameter
(IDS = f(VDS), Tvj=25°C, tP = 20µs) (IDS = f(VDS), Tvj=175°C, tP = 20µs)
Datasheet 9 of 17 2.2
2020-12-11
IMZ120R030M1H
CoolSiC™ 1200V SiC Trench MOSFET
Electrical characteristic diagrams
80 18
VGS = 18V
16
VGS = 15V
60 14
RDS (ON) [mOhm]
12
VGS [V]
10
40
8
6
20
4
2
0
0
-40 10 60 110 160
0 10 20 30 40 50 60
Tvj [ C]
QG [nC]
Figure 9 Typical on-resistance as a function of
Figure 10 Typical gate charge
junction temperature
(VGS = f(QG), IDS = 25A, VDS = 800V, turn-on
(RDS(on) = f(Tvj), IDS = 25A)
pulse)
10000 6
5
1000
4
C [pF]
VSD [V]
100 3
2
10 Ciss
Coss 1
Crss
1 0
1 10 100 1000 -40 10 60 110 160
VDS[V] Tvj [ C]
Figure 11 Typical capacitance as a function of Figure 12 Typical body diode forward voltage as
drain-source voltage function of junction temperature
(C = f(VDS), VGS = 0V, f = 1MHz) (VSD=f(Tvj), VGS=0V, ISD=25A)
Datasheet 10 of 17 2.2
2020-12-11
IMZ120R030M1H
CoolSiC™ 1200V SiC Trench MOSFET
Electrical characteristic diagrams
60 60
VGS=18V
VGS=18V
50 VGS=15V 50
VGS=15V
40 40
ISD [A]
ISD [A]
30 30
20 VGS=0V 20 VGS=0V
VGS=-2V VGS=-2V
10 10
0 0
0 1 2 3 4 5 6 0 1 2 3 4 5 6
VSD [V] VSD [V]
Figure 13 Typical body diode forward current as Figure 14 Typical body diode forward current as
function of forward voltage, VGS as function of forward voltage, VGS as
parameter parameter
(ISD = f(VSD), Tvj = 25°C, tP = 20µs) (ISD = f(VSD), Tvj = 175°C, tP = 20µs)
800 1000
Etot Etot
Eon Eon
800
600 Eoff Eoff
600
E [µJ]
E [µJ]
400
400
200
200
0 0
25 50 75 100 125 150 175 0 10 20 30 40 50
Tvj [ C] ID [A]
Figure 15 Typical switching energy losses as a Figure 16 Typical switching energy losses as a
function of junction temperature function of drain-source current
(E = f(Tvj), VDD = 800V, VGS = 0V/18V, (E = f(IDS), VDD = 800V, VGS = 0V/18V,
RG,ext = 2Ω, ID = 25A, ind. load, test circuit RG,ext = 2Ω, Tvj = 175°C, ind. load, test
in Fig. E, diode: body diode at VGS = 0V) circuit in Fig. E, diode: body diode at
VGS = 0V)
Datasheet 11 of 17 2.2
2020-12-11
IMZ120R030M1H
CoolSiC™ 1200V SiC Trench MOSFET
Electrical characteristic diagrams
5000 400
Etot td(on)
Eon tr
4000 Eoff 320 td(off)
tf
Time [ns]
3000 240
E [µJ]
2000 160
1000 80
0 0
0 20 40 60 80 100 120 0 20 40 60 80 100 120
RG [Ohm] RG [Ohm]
Figure 17 Typical switching energy losses as a Figure 18 Typical switching times as a function of
function of gate resistance gate resistor
(E = f(RG,ext), VDD = 800V, VGS = 0V/18V, (t = f(RG,ext), VDD = 800V, VGS = 0V/18V,
ID = 25A, Tvj = 175°C, ind. load, test circuit ID = 25A, Tvj = 175°C, ind. load, test circuit
in Fig. E, diode: body diode at VGS = 0V) in Fig. E, diode: body diode at VGS = 0V)
0.7 50
175°C
0.6
40 25°C
0.5
QRR [µC]
30
IRRM [A]
0.4
0.3
20
0.2
175°C 10
0.1
25°C
0.0 0
0 2000 4000 6000 0 2000 4000 6000
diF /dt[A/µs] diF /dt[A/µs]
Figure 19 Typical reverse recovery charge as a Figure 20 Typical reverse recovery current as a
function of diode current slope function of diode current slope
(Qrr = f(dif/dt), VDD = 800V, VGS = 0V/18V, (Irrm = f(dif/dt), VDD = 800V, VGS = 0V/18V,
ID = 25A, ind. load, test circuit in Fig.E, ID = 25A, ind. load, test circuit in Fig.E,
body diode at VGS = 0V) body diode at VGS = 0V)
Datasheet 12 of 17 2.2
2020-12-11
IMZ120R030M1H
CoolSiC™ 1200V SiC Trench MOSFET
Electrical characteristic diagrams
1.00
Zthjc [K/W]
0.5
0.10 0.2
0.1
0.05
0.02
0.01
Single Pulse
i: 1 2 3 4
ri: [K/W] 2.78E-01 2.01E-01 1.58E-01 2.34E-02
τi: [s] 1.78E-02 2.98E-03 5.23E-04 1.52E-05
0.01
1E-6 1E-5 1E-4 1E-3 1E-2 1E-1 1E0
tp [s]
Figure 21 Max. transient thermal resistance (MOSFET/diode)
(Zth(j-c,max) = f(tP), parameter D = tp/T, thermal equivalent circuit in Fig. D)
Datasheet 13 of 17 2.2
2020-12-11
IMZ120R030M1H
CoolSiC™ 1200V SiC Trench MOSFET
Package drawing
5 Package drawing
PG-TO247-4
Datasheet 14 of 17 2.2
2020-12-11
IMZ120R030M1H
CoolSiC™ 1200V SiC Trench MOSFET
Test conditions
6 Test conditions
Datasheet 15 of 17 2.2
2020-12-11
IMZ120R030M1H
1200V SiC Trench MOSFET
Revision history
Revision history
Datasheet 16 of 17 2.2
2020-12-11
Trademarks
All referenced product or service names and trademarks are the property of their respective owners.
Published by
Infineon Technologies AG
81726 München, Germany
© Infineon Technologies AG 2019.
owners.
All Rights Reserved.
Important notice
The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics
(“Beschaffenheitsgarantie”). With respect to any examples, hints or any typical values stated herein and/or any
information regarding the application of the product, Infineon Technologies hereby disclaims any and all warranties and
liabilities of any kind, including without limitation warranties of non-infringement of intellectual property rights of any third
party.
In addition, any information given in this document is subject to customer’s compliance with its obligations stated in this
document and any applicable legal requirements, norms and standards concerning customer’s products and any use of
the product of Infineon Technologies in customer’s applications.
The data contained in this document is exclusively intended for technically trained staff. It is the responsibility of
customer’s technical departments to evaluate the suitability of the product for the intended application and the
completeness of the product information given in this document with respect to such application.
For further information on the product, technology, delivery terms and conditions and prices please contact your nearest
Infineon Technologies office (www.infineon.com).
Please note that this product is not qualified according to the AEC Q100 or AEC Q101 documents of the Automotive
Electronics Council.
Warnings
Due to technical requirements products may contain dangerous substances. For information on the types in question
please contact your nearest Infineon Technologies office.
Except as otherwise explicitly approved by Infineon Technologies in a written document signed by authorized
representatives of Infineon Technologies, Infineon Technologies’ products may not be used in any applications where a
failure of the product or any consequences of the use thereof can reasonably be expected to result in personal injury.