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1 Current transformers (CTs) show large errors when they are magnetized by dc current. This error can be reduced after proper
2 demagnetization. One of the methods to demagnetize the CT is to increase the core flux by increasing its burden. The burden
3 should be adjusted according to the measured ac current. In this paper, we show that pulsewidth modulation switchable resistor
4 can be used as variable burden for this application. This method enables to restore the nominal precision of the heavily magnetized
5 CT from 2.5% back to 0.2% without interruption of the CT operation.
6 Index Terms— Current transformer (CT), lock-in amplifier, pulsewidth modulation (PWM).
7 I. I NTRODUCTION
8
10
C URRENT transformers (CTs) are susceptible to rema-
nence caused by dc magnetization. In such case, the
precision of the CT can be seriously degraded especially at
11 low measured currents [1]–[4]. Magnetization can be caused
12 by temporary unipolar transients from lightning or switching
13 of power devices to the supply grid. When the CT operates
at >80% of its nominal current I N , the CT is spontaneously
14
15
16
17
18
19
20
21
Pr E
demagnetized. For lower measured ac current the CT remains
permanently magnetized. This effect can cause large errors
especially when measuring energy transferred in unloaded
supply network. The origin of this error is that magnetized
core has lower apparent permeability [2].
E
Method for measuring the dc component of the cur-
rent using fluxgate effect in the CT was described
Fig. 1. Ratio error of 500 A/5 A CT in the virgin state and after magnetization
to remanence and two methods of demagnetization.
f
22 in [5]–[7]. The dc current can be compensated to restore the
23 CT precision [8], [9]. These methods can also be used to
24
25
oo
demagnetize the CT and keep it without remanence. However,
the instrumentation is complicated and requires an additional Fig. 2. Resistor network for increase of burden.
IE
26 source of power [10]. The aim of this paper is to develop a
Then, we describe and discuss two methods how to 43
27 simple device for demagnetizing the CTs in the field. adjust R2 . Section III describes in detail the principle of 44
28 The magnetized CT can be demagnetized by increasing
the pulsewidth modulation (PWM) switched resistor method, 45
29 the measured current, e.g., to 120% of the nominal value I N
which was selected for our device. In Section IV, we experi- 46
30 and slowly decreasing it to zero. This is easy in the lab, but mentally verify the proposed method. 47
31 not very practical when implemented in a network. Another
32 technique consists in increasing the burden so as to increase II. D EMAGNETIZATION M ETHODS 48
33 the voltage at the ends of the secondary winding and therefore
Fig. 1 shows the ratio (amplitude) error of the class 0.2 CT 49
34 the magnetic flux in the core. For a measured current of
with 500 A/5 A ratio. The core of this transformer is made of 50
35 0.1 I N the required increase or the burden is theoretically
high-permeability oriented Si–Fe. The perfectly demagnetized 51
36 12 times R N. The transient from switching the burden back
CT has ratio error <0.2% in the wide range from 2% to 52
37 to R N should be controlled to prevent another magnetization.
120% I N . After magnetization by large dc current to the 53
38 In some cases this is not trivial.
remanence this transformer is out of its accuracy class for 54
39 This paper is organized as follows. In Section II, we first
I < 30% I N . Only after I > 80% I N , the core slowly starts 55
40 show that by increased burden we are able to effectively
to demagnetize. We magnetized the transformer again and 56
41 demagnetize CT so that resulting error is very similar to
demagnetized it by manually increasing the burden to 20 R N 57
42 CT demagnetized by conventional method.
at 10% I N . The quality of demagnetization is very similar as 58
Manuscript received June 8, 2014; revised August 26, 2014; accepted before; although it is not ideal, the CT specs are again met. 59
September 7, 2014. Corresponding author: P. Ripka (e-mail: For real application R2 should be adjusted according to the 60
ripka@fel.cvut.cz). actual value of I1 . We can either use conventional switched 61
Color versions of one or more of the figures in this paper are available
online at http://ieeexplore.ieee.org. network of weighed resistors (Fig. 2), or PWM of switched 62
0018-9464 © 2014 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.
See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.
XXX IEEE TRANSACTIONS ON MAGNETICS
be calculated as 111
Ts
1
v̄ = v(t)dt. (1) 112
Ts 0
When we consider PWM principle and replace voltage by 113
R(t) that has value of rDSon for t ∈ [0, tON ] and R2 for 114
tON Ts
Fig. 3. PWM switched resistor. 1 Ts 1
R̄ = R(t)dt = rDS(ON) dt + R2 dt 116
Ts 0 Ts 0 tON
64 Resistor network is a simple solution, but it has a sub- ton tOFF
65 stantial problem for fine resistance adjustment it needs six = rDS(ON) + R2 (2) 117
68 plicated control logic, but allows fine adjustment with single Because the rDSon can be connected to the circuit during the 119
69 switch. In this paper, we therefore verify the demagnetization normal operation of the CT, it can be included in the value of 120
70 by PWM switched resistor. the burden. Equation (2) will be therefore simplified as 121
tOFF
R̄ = R2 . (3) 122
71 III. PWM S WITCHED R ESISTOR Ts
If the switching period TS is several times shorter than the 123
72 The development of the semiconductor devices and
period of the measured current signal, the switching transition 124
73 improvement of their parameters have already influenced area
of the transistors can be neglected and the value of R2 can be 125
74 of electric drives and energy conversion. However, a limit-
calculated according to (3). Equation (3) then defines the value
75
76
77
78
79
80
81
Pr E
ing parameter of these devices is the amount of heat that
needs to be dissipated because the heat is proportional to the
power losses caused mainly during the switching transition
and the inner resistance of the semiconductor, switching of
these devices was limited. Recent development in the area of
MOS transistors has led to devices with very low resistance
E
rDSon in the range of 10 m. Such devices can be used in
of equivalent resistance connected in series with the burden to
demagnetize the transformer.
In analog technique, the PWM modulator can be realized
as an operational amplifier that is comparing triangular carrier
with variable threshold value. However, analog devices suffer
from ageing, this is why analog solutions are replaced by
digital solutions in a microprocessor.
126
127
128
129
130
131
132
133
f
82 circuits, where power electronics is needed and its influence
83 should be negligible.
84 As stated previously, the burden value can be increased
oo IV. E XPERIMENTAL VALIDATION OF THE 134
85 either by a resistor network or by PWM switched resistor. D EMAGNETIZATION OF A CT U SING A PWM B URDEN 135
IE
86 First, solution is simpler but requires more space and con- For our experiment, we used a CT with transformation ratio 136
87 tinuous change of the resistance is not possible. Therefore, of 500 A/5 A and real 5 VA nominal secondary burden, 137
88 we have focused on the PWM switched resistor solution. The corresponding to a resistor of 0.2 . The output of the 138
89 PWM controlled variable resistor is already used in [11] as transformer was loaded by sensing resistor RN = 0.1 . 139
90 a damping resistor for protecting the power capacitor/passive A VISHAY MPR resistor with value of 2 was used as 140
91 power filter. PWM switched resistor R2 . The CT errors were measured 141
92 Because the secondary winding of the CT cannot be using a lock-in amplifier. Switching pulses for the transistors 142
93 unloaded the solution shown in Fig. 2 was selected for PWM were generated by Freescale DSP56F8257 microcontroller. 143
94 controlled resistor realization. The scheme is the same as The period of PWM TCS was 5 ms. 144
95 in [12], but the switching scheme is different, whereas in [12] The experimental setup shown in Fig. 4 is used to implement 145
96 the switching time is the multiple of power line frequency, the proposed CT demagnetization method and to determine the 146
97 we used much higher frequency. The solution in [12] was errors on the measured currents. The principle of the exper- 147
98 developed for protective CTs, where accuracy is not critical iments basically relies on the use of a differential structure 148
99 parameter. Our solution was developed for instrument CTs. implementing a CT under test (denoted CT) as well as a 149
100 In normal operation mode, both transistors are switched ON reference CT (denoted CN) with very high accuracy. In the 150
101 and the secondary current is according to its polarity flow- experimental setup only CT may be submitted to a dc magne- 151
102 ing through one transistor and one antiparallel diode. When tization of its core. Therefore, an auxiliary winding featuring 152
103 demagnetization of the CT is needed, PWM is enabled and 50 turns and fed by a dc current is used. To demagnetize CT, 153
104 transistors begin to be switched. Current then flows through its secondary winding features a PWM switched resistor of 154
105 the transistor when it is switched ON or through increased equivalent value in series with a resistance RN . The ac current 155
106 burden when the transistor is switched OFF. to measure feeds both the primary windings of CT and CN. 156
107 The principle of PWM is well known from the semicon- The secondary windings of CT and CN (which are wound 157
108 ductor power converters, where PWM is employed for the in opposite directions) feed RN with opposite currents of 158
109 generation of voltages with variable frequency and mean value. similar intensity and the voltage VN at the ends of RN is 159
110 The mean value of the output voltage across one period can proportional to the difference between these two currents. 160
BAUER et al.: DEMAGNETIZATION OF CTs USING PWM BURDEN XXX
Pr E E
f
oo
IE
Re(I ) Re(V ) Rref After that the demagnetization by PWM switched resistor was 183
170 εI = = · · 100(%). (4) performed and the CT errors were measured once more. Both 184
IN RN Vref
methods of demagnetization by increased input current and by 185
171 The error of measured current phase can be obtained from PWM switched resistor were used. The results in Table I show 186
172 imaginary part of voltage as that for 10% of the nominal current IN the value of R2 = 2 187
Im(I ) Im(V ) Rref was not enough to fully CT demagnetization. The R2 have to 188
174 where Vref is a voltage measured across the Rref . Figs. 5–8. Upper trace (a) represents control signal for the tran- 191 AQ:2
175 The measurement results are summarized in Table I. sistors (u g ), second trace (b) is the CT secondary current (i ), 192
XXX IEEE TRANSACTIONS ON MAGNETICS
saturate the core, however, this method is not possible in real 204
the load of the CT was tested. This can be done either by the 207
one resistor in the whole range of current and the value of 211
typically in 15 min intervals and every time after the detected 219
Fig. 7. Waveforms for tON = 50%. because of magnetic viscosity of the core material. 221
R EFERENCES 222
Pr E E currents up to 100 000 A,” IEEE Trans. Instrum. Meas., vol. 26, no. 3,
pp. 263–267, Sep. 1977.
[2] K. Draxler and R. Stybliková, “Effect of magnetization on instrument
transformers errors,” J. Elect. Eng., vol. 61, no. 7S, pp. 50–53, 2010.
[3] A. Rezaei-Zare, R. Iravani, M. Sanaye-Pasand, H. Mohseni, and
S. Farhangi, “An accurate current transformer model based on Preisach
theory for the analysis of electromagnetic transients,” IEEE Trans. Power
Del., vol. 23, no. 1, pp. 233–242, Jan. 2008.
[4] B. Wrzecionko, L. Steinmann, and J. W. Kolar, “High-bandwidth high-
224
225
226
227
228
229
230
231
232
f
temperature (250 °C/500 °F) isolated DC and AC current measurement: 233
Bidirectionally saturated current transformer,” IEEE Trans. Power Elec- 234
tron., vol. 28, no. 11, pp. 5404–5413, Nov. 2013. 235
oo [5] G. Buticchi, E. Lorenzani, and G. Franceschini, “A DC offset current
compensation strategy in transformerless grid-connected power convert-
ers,” IEEE Trans. Power Del., vol. 26, no. 4, pp. 2743–2751, Oct. 2011.
236
237
IE
238
[6] C.-S. Yu, “Detection and correction of saturated current transformer 239
measurements using decaying DC components,” IEEE Trans. Power 240
Del., vol. 25, no. 3, pp. 1340–1347, Jul. 2010. 241
[7] P. Ripka, K. Draxler, and R. Styblikova, “Measurement of DC currents 242
in the power grid by current transformer,” IEEE Trans. Magn., vol. 49, 243
no. 1, pp. 73–76, Jan. 2013. 244
[8] P. Stachel and P. Schegner, “Detection and correction of current trans- 245
Fig. 8. Waveforms for tON = 0%.
former saturation effects in secondary current signals,” in Proc. IEEE 246
Power Energy Soc. General Meeting (PES), Jul. 2009, pp. 1–6. 247
[9] P. Ripka, K. Draxler, and R. Styblikova, “DC-compensated current trans- 248
193 third trace (c) is the CT flux (2 ) calculated as an integral former,” in Proc. IEEE Int. Instrum. Meas. Technol. Conf., May 2014, 249
pp. 212–215. 250
194 of the CT secondary voltage, and bottom trace (d) is the [10] V. Molcrette, J.-L. Kotny, J.-P. Swan, and J.-F. Brudny, “Reduction 251
195 voltage across the resistor R2 (u R2 ). The waveforms show that of inrush current in single-phase transformer using virtual air gap 252
196 switching frequency of the PWM was selected sufficiently high technique,” IEEE Trans. Magn., vol. 34, no. 4, pp. 1192–1194, Jul. 1998. 253
[11] J.-C. Wu, H.-L. Jou, and K.-D. Wu, “A PWM controlled variable 254
197 so that the CT flux is very close to sinewave, no distortion is damping resistor for protecting the power capacitor/passive power filter,” 255
198 visible. Electr. Power Syst. Res., vol. 73, no. 1, pp. 9–18, 2005. 256
[12] M. Davarpanah, M. Sanaye-Pasand, and R. Iravani, “A saturation 257
suppression approach for the current transformer—Part I: Fundamen- 258
199 V. C ONCLUSION tal concepts and design,” IEEE Trans. Power Del., vol. 28, no. 3, 259
200 The dc magnetization has great influence on the CT accu- pp. 1928–1935, Jul. 2013. 260
[13] K. Draxler and R. Styblikova, “Use of a lock-in amplifier for calibrating 261
201 racy, therefore demagnetization of CT is needed especially for an instrument current transformer,” in Proc. IEEE Int. Instrum. Meas. 262
202 high-accuracy CTs used for the energy meters. One way to Technol. Conf., May 2014, pp. 732–735. 263
AUTHOR QUERIES
AQ:1 = Please provide descriptions of all labeled subparts for Figs. 5–8.
AQ:2 = Please note that we have retained the author usage of “(a), (b), (c), and (d)” in the paragraph
beginning “Waveforms taken during the measurement are . . .”. Please confirm if this is OK.
Pr E E
f
oo
IE
IEEE TRANSACTIONS ON MAGNETICS XXX
1 Current transformers (CTs) show large errors when they are magnetized by dc current. This error can be reduced after proper
2 demagnetization. One of the methods to demagnetize the CT is to increase the core flux by increasing its burden. The burden
3 should be adjusted according to the measured ac current. In this paper, we show that pulsewidth modulation switchable resistor
4 can be used as variable burden for this application. This method enables to restore the nominal precision of the heavily magnetized
5 CT from 2.5% back to 0.2% without interruption of the CT operation.
6 Index Terms— Current transformer (CT), lock-in amplifier, pulsewidth modulation (PWM).
7 I. I NTRODUCTION
8
10
C URRENT transformers (CTs) are susceptible to rema-
nence caused by dc magnetization. In such case, the
precision of the CT can be seriously degraded especially at
11 low measured currents [1]–[4]. Magnetization can be caused
12 by temporary unipolar transients from lightning or switching
13 of power devices to the supply grid. When the CT operates
at >80% of its nominal current I N , the CT is spontaneously
14
15
16
17
18
19
20
21
Pr E
demagnetized. For lower measured ac current the CT remains
permanently magnetized. This effect can cause large errors
especially when measuring energy transferred in unloaded
supply network. The origin of this error is that magnetized
core has lower apparent permeability [2].
E
Method for measuring the dc component of the cur-
rent using fluxgate effect in the CT was described
Fig. 1. Ratio error of 500 A/5 A CT in the virgin state and after magnetization
to remanence and two methods of demagnetization.
f
22 in [5]–[7]. The dc current can be compensated to restore the
23 CT precision [8], [9]. These methods can also be used to
24
25
oo
demagnetize the CT and keep it without remanence. However,
the instrumentation is complicated and requires an additional Fig. 2. Resistor network for increase of burden.
IE
26 source of power [10]. The aim of this paper is to develop a
Then, we describe and discuss two methods how to 43
27 simple device for demagnetizing the CTs in the field. adjust R2 . Section III describes in detail the principle of 44
28 The magnetized CT can be demagnetized by increasing
the pulsewidth modulation (PWM) switched resistor method, 45
29 the measured current, e.g., to 120% of the nominal value I N
which was selected for our device. In Section IV, we experi- 46
30 and slowly decreasing it to zero. This is easy in the lab, but mentally verify the proposed method. 47
31 not very practical when implemented in a network. Another
32 technique consists in increasing the burden so as to increase II. D EMAGNETIZATION M ETHODS 48
33 the voltage at the ends of the secondary winding and therefore
Fig. 1 shows the ratio (amplitude) error of the class 0.2 CT 49
34 the magnetic flux in the core. For a measured current of
with 500 A/5 A ratio. The core of this transformer is made of 50
35 0.1 I N the required increase or the burden is theoretically
high-permeability oriented Si–Fe. The perfectly demagnetized 51
36 12 times R N. The transient from switching the burden back
CT has ratio error <0.2% in the wide range from 2% to 52
37 to R N should be controlled to prevent another magnetization.
120% I N . After magnetization by large dc current to the 53
38 In some cases this is not trivial.
remanence this transformer is out of its accuracy class for 54
39 This paper is organized as follows. In Section II, we first
I < 30% I N . Only after I > 80% I N , the core slowly starts 55
40 show that by increased burden we are able to effectively
to demagnetize. We magnetized the transformer again and 56
41 demagnetize CT so that resulting error is very similar to
demagnetized it by manually increasing the burden to 20 R N 57
42 CT demagnetized by conventional method.
at 10% I N . The quality of demagnetization is very similar as 58
Manuscript received June 8, 2014; revised August 26, 2014; accepted before; although it is not ideal, the CT specs are again met. 59
September 7, 2014. Corresponding author: P. Ripka (e-mail: For real application R2 should be adjusted according to the 60
ripka@fel.cvut.cz). actual value of I1 . We can either use conventional switched 61
Color versions of one or more of the figures in this paper are available
online at http://ieeexplore.ieee.org. network of weighed resistors (Fig. 2), or PWM of switched 62
0018-9464 © 2014 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.
See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.
XXX IEEE TRANSACTIONS ON MAGNETICS
be calculated as 111
Ts
1
v̄ = v(t)dt. (1) 112
Ts 0
When we consider PWM principle and replace voltage by 113
R(t) that has value of rDSon for t ∈ [0, tON ] and R2 for 114
tON Ts
Fig. 3. PWM switched resistor. 1 Ts 1
R̄ = R(t)dt = rDS(ON) dt + R2 dt 116
Ts 0 Ts 0 tON
64 Resistor network is a simple solution, but it has a sub- ton tOFF
65 stantial problem for fine resistance adjustment it needs six = rDS(ON) + R2 (2) 117
68 plicated control logic, but allows fine adjustment with single Because the rDSon can be connected to the circuit during the 119
69 switch. In this paper, we therefore verify the demagnetization normal operation of the CT, it can be included in the value of 120
70 by PWM switched resistor. the burden. Equation (2) will be therefore simplified as 121
tOFF
R̄ = R2 . (3) 122
71 III. PWM S WITCHED R ESISTOR Ts
If the switching period TS is several times shorter than the 123
72 The development of the semiconductor devices and
period of the measured current signal, the switching transition 124
73 improvement of their parameters have already influenced area
of the transistors can be neglected and the value of R2 can be 125
74 of electric drives and energy conversion. However, a limit-
calculated according to (3). Equation (3) then defines the value
75
76
77
78
79
80
81
Pr E
ing parameter of these devices is the amount of heat that
needs to be dissipated because the heat is proportional to the
power losses caused mainly during the switching transition
and the inner resistance of the semiconductor, switching of
these devices was limited. Recent development in the area of
MOS transistors has led to devices with very low resistance
E
rDSon in the range of 10 m. Such devices can be used in
of equivalent resistance connected in series with the burden to
demagnetize the transformer.
In analog technique, the PWM modulator can be realized
as an operational amplifier that is comparing triangular carrier
with variable threshold value. However, analog devices suffer
from ageing, this is why analog solutions are replaced by
digital solutions in a microprocessor.
126
127
128
129
130
131
132
133
f
82 circuits, where power electronics is needed and its influence
83 should be negligible.
84 As stated previously, the burden value can be increased
oo IV. E XPERIMENTAL VALIDATION OF THE 134
85 either by a resistor network or by PWM switched resistor. D EMAGNETIZATION OF A CT U SING A PWM B URDEN 135
IE
86 First, solution is simpler but requires more space and con- For our experiment, we used a CT with transformation ratio 136
87 tinuous change of the resistance is not possible. Therefore, of 500 A/5 A and real 5 VA nominal secondary burden, 137
88 we have focused on the PWM switched resistor solution. The corresponding to a resistor of 0.2 . The output of the 138
89 PWM controlled variable resistor is already used in [11] as transformer was loaded by sensing resistor RN = 0.1 . 139
90 a damping resistor for protecting the power capacitor/passive A VISHAY MPR resistor with value of 2 was used as 140
91 power filter. PWM switched resistor R2 . The CT errors were measured 141
92 Because the secondary winding of the CT cannot be using a lock-in amplifier. Switching pulses for the transistors 142
93 unloaded the solution shown in Fig. 2 was selected for PWM were generated by Freescale DSP56F8257 microcontroller. 143
94 controlled resistor realization. The scheme is the same as The period of PWM TCS was 5 ms. 144
95 in [12], but the switching scheme is different, whereas in [12] The experimental setup shown in Fig. 4 is used to implement 145
96 the switching time is the multiple of power line frequency, the proposed CT demagnetization method and to determine the 146
97 we used much higher frequency. The solution in [12] was errors on the measured currents. The principle of the exper- 147
98 developed for protective CTs, where accuracy is not critical iments basically relies on the use of a differential structure 148
99 parameter. Our solution was developed for instrument CTs. implementing a CT under test (denoted CT) as well as a 149
100 In normal operation mode, both transistors are switched ON reference CT (denoted CN) with very high accuracy. In the 150
101 and the secondary current is according to its polarity flow- experimental setup only CT may be submitted to a dc magne- 151
102 ing through one transistor and one antiparallel diode. When tization of its core. Therefore, an auxiliary winding featuring 152
103 demagnetization of the CT is needed, PWM is enabled and 50 turns and fed by a dc current is used. To demagnetize CT, 153
104 transistors begin to be switched. Current then flows through its secondary winding features a PWM switched resistor of 154
105 the transistor when it is switched ON or through increased equivalent value in series with a resistance RN . The ac current 155
106 burden when the transistor is switched OFF. to measure feeds both the primary windings of CT and CN. 156
107 The principle of PWM is well known from the semicon- The secondary windings of CT and CN (which are wound 157
108 ductor power converters, where PWM is employed for the in opposite directions) feed RN with opposite currents of 158
109 generation of voltages with variable frequency and mean value. similar intensity and the voltage VN at the ends of RN is 159
110 The mean value of the output voltage across one period can proportional to the difference between these two currents. 160
BAUER et al.: DEMAGNETIZATION OF CTs USING PWM BURDEN XXX
Pr E E
f
oo
IE
Re(I ) Re(V ) Rref After that the demagnetization by PWM switched resistor was 183
170 εI = = · · 100(%). (4) performed and the CT errors were measured once more. Both 184
IN RN Vref
methods of demagnetization by increased input current and by 185
171 The error of measured current phase can be obtained from PWM switched resistor were used. The results in Table I show 186
172 imaginary part of voltage as that for 10% of the nominal current IN the value of R2 = 2 187
Im(I ) Im(V ) Rref was not enough to fully CT demagnetization. The R2 have to 188
174 where Vref is a voltage measured across the Rref . Figs. 5–8. Upper trace (a) represents control signal for the tran- 191 AQ:2
175 The measurement results are summarized in Table I. sistors (u g ), second trace (b) is the CT secondary current (i ), 192
XXX IEEE TRANSACTIONS ON MAGNETICS
saturate the core, however, this method is not possible in real 204
the load of the CT was tested. This can be done either by the 207
one resistor in the whole range of current and the value of 211
typically in 15 min intervals and every time after the detected 219
Fig. 7. Waveforms for tON = 50%. because of magnetic viscosity of the core material. 221
R EFERENCES 222
Pr E E currents up to 100 000 A,” IEEE Trans. Instrum. Meas., vol. 26, no. 3,
pp. 263–267, Sep. 1977.
[2] K. Draxler and R. Stybliková, “Effect of magnetization on instrument
transformers errors,” J. Elect. Eng., vol. 61, no. 7S, pp. 50–53, 2010.
[3] A. Rezaei-Zare, R. Iravani, M. Sanaye-Pasand, H. Mohseni, and
S. Farhangi, “An accurate current transformer model based on Preisach
theory for the analysis of electromagnetic transients,” IEEE Trans. Power
Del., vol. 23, no. 1, pp. 233–242, Jan. 2008.
[4] B. Wrzecionko, L. Steinmann, and J. W. Kolar, “High-bandwidth high-
224
225
226
227
228
229
230
231
232
f
temperature (250 °C/500 °F) isolated DC and AC current measurement: 233
Bidirectionally saturated current transformer,” IEEE Trans. Power Elec- 234
tron., vol. 28, no. 11, pp. 5404–5413, Nov. 2013. 235
oo [5] G. Buticchi, E. Lorenzani, and G. Franceschini, “A DC offset current
compensation strategy in transformerless grid-connected power convert-
ers,” IEEE Trans. Power Del., vol. 26, no. 4, pp. 2743–2751, Oct. 2011.
236
237
IE
238
[6] C.-S. Yu, “Detection and correction of saturated current transformer 239
measurements using decaying DC components,” IEEE Trans. Power 240
Del., vol. 25, no. 3, pp. 1340–1347, Jul. 2010. 241
[7] P. Ripka, K. Draxler, and R. Styblikova, “Measurement of DC currents 242
in the power grid by current transformer,” IEEE Trans. Magn., vol. 49, 243
no. 1, pp. 73–76, Jan. 2013. 244
[8] P. Stachel and P. Schegner, “Detection and correction of current trans- 245
Fig. 8. Waveforms for tON = 0%.
former saturation effects in secondary current signals,” in Proc. IEEE 246
Power Energy Soc. General Meeting (PES), Jul. 2009, pp. 1–6. 247
[9] P. Ripka, K. Draxler, and R. Styblikova, “DC-compensated current trans- 248
193 third trace (c) is the CT flux (2 ) calculated as an integral former,” in Proc. IEEE Int. Instrum. Meas. Technol. Conf., May 2014, 249
pp. 212–215. 250
194 of the CT secondary voltage, and bottom trace (d) is the [10] V. Molcrette, J.-L. Kotny, J.-P. Swan, and J.-F. Brudny, “Reduction 251
195 voltage across the resistor R2 (u R2 ). The waveforms show that of inrush current in single-phase transformer using virtual air gap 252
196 switching frequency of the PWM was selected sufficiently high technique,” IEEE Trans. Magn., vol. 34, no. 4, pp. 1192–1194, Jul. 1998. 253
[11] J.-C. Wu, H.-L. Jou, and K.-D. Wu, “A PWM controlled variable 254
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AUTHOR QUERIES
AQ:1 = Please provide descriptions of all labeled subparts for Figs. 5–8.
AQ:2 = Please note that we have retained the author usage of “(a), (b), (c), and (d)” in the paragraph
beginning “Waveforms taken during the measurement are . . .”. Please confirm if this is OK.
Pr E E
f
oo
IE