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Fabrication of Typical Circuit
Fabrication of Typical Circuit
Fabrication of Typical Circuit
Unit 1: IC Fabrication
Lecture 1.4:
Fabrication of Typical Circuit
TYPICAL CIRCUIT
4
VARIOUS STEPS INVOLVED IN
FABRICATION OF THE CIRCUIT
➢Wafer Preparation and buried layer formation
➢Epitaxial Growth
➢Oxidation
➢Isolation Diffusion
➢Base Diffusion
➢Emitter Diffusion
➢Contact and Aluminium metallization
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Step 1: Wafer Preparation and Buried
Layer Formation
• A p-type silicon wafer is prepared by
• Crystal growth and doping
• Ingot Trimming and grinding
• Ingot slicing
• Wafer polishing and etching
• Wafer cleaning
• Size-10 cm to 30 cm in diameter and 0.4-0.5
mm thickness
• Resistivity is 10 ohm cm corresponding to
concentration of acceptor atom.
Step 1: Wafer Preparation and Buried 6
Layer Formation
• The masks for the whole circuit are included in
the summary slide at the end. Here only mask
openings are shown.
• A heavily doped buried n-type layer is formed
by Sb or As implant and diffusion(No P?)
• It is formed below only the bipolar transistors
to lower collector resistance.
• Sheet Resistivity is ~50 ohm per square.
• Not included in the follow-up slides due to
many components shown to avoid crowding.
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n++
P-type substrate 400 µm
10 Ω-cm resistivity;NA =1.4 * 1015 atoms / cm3
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Step 3: Oxidation
• A SiO2 layer of thickness of the order of 0.02
to 2 µm is grown on the n-epitaxial layer.
SiO2
0.02 – 2 µm
n-epi layer 0.1 – 0.5 Ω-cm
P-type substrate
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p p p p
nnn
n n n n
P-type substrate
n+ n+ n+ n+
p p p p
nnn
n n n n
P-type substrate
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n+ n
n+ n+ +
p p
p p
nnn
n n n n
Buried
P-type substrate Layer
References