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Data Table: Data collected to Find the Relationship Between the Length From Slits to

Screen and Average Nodal Line Distance from the Projected Pattern

Distance between slits Length Between Slits and Paper Average Nodal Line Distance
d L Δx
(mm) (mm) (mm)
[+/- 0.5] [+/- 0.5]
0.350 800.0 1.7
0.350 1000.0 2.1
0.350 1200.0 2.2
0.350 1400.0 2.6
0.350 1600.0 3.0

Graph 1 depicts the relationship between the length (from slits to the projection screen) and the average

distance between nodal lines, both in millimeters. By looking at the graph, we can see that as the length
(independent value) increases, the distance between nodal lines (dependent value) also increases,

indicating that the relationship is proportional. This relationship is best represented through a linear

trendline equation of 1.55E-03(L) + 0.46. Comparing our derived equation of Δx = (λ/d) x L to the

trendline equation, the slope of 1.55E-03 is equal to the value of λ/d, which can be used to derive the

value of the wavelength as the slit distance stayed consistent. The trendline has a good correlation with

the data which can be seen through the RMSE value of 0.973, which is close to 1.

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