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ELECTRONICS TESTING CENTER, TAIWAN

Lab Code 200133-0


CONFORMANCE TEST REPORT
FOR
FCC 47 CFR, Part 15 Subpart B
CSA Standard C108.8 / Interference-Causing Equipment
Standard ICES-003 (2016) / ICES-003 (2016) / CAN/CSA-
CISPR 22-10 (Class B)

Report No.: 17-05-MAR-037-01

Client: JET OPTOELECTRONICS CO.,LTD.


Product: EVO ASSEMBLY-0 / EVO ASSEMBLY-4/ EVO ASSEMBLY-5
Model: 620061 / 620062 / 620063
Comment Issues: ----
Manufacturer/supplier: JET OPTOELECTRONICS CO.,LTD.

Date test item received 2017/05/09


Date test campaign completed 2017/05/11
Date of issue 2017/05/25

The test result only corresponds to the tested sample. It is not permitted to copy this report,
in part or in full, without the permission of the test laboratory.
Total number of pages of this test report: 31 pages
Total number of pages of this test photos: 12 pages

Test Engineer Checked By Approved By

Andy Wang Kuang Chi Yu Jerry Huang

ELECTRONICS TESTING CENTER, TAIWAN TEL: (03) 3276170~4


No.8, Lane 29, Wenming Rd., INT: +886-3-3276170~4
Guishan Dist., Taoyuan City 33383, FAX: (03) 3276188
INT: +886-3-3276188
Taiwan, R.O.C.

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ELECTRONICS TESTING CENTER, TAIWAN
Table of Contents
Page
1. GENERAL INFORMATION ............................................................................................................ 4
1.1 Product Description ........................................................................................................................... 4
1.2 For Unintentional Radiators Frequency Range ................................................................................. 4
1.3 Related Information of EUT: ............................................................................................................ 4
1.4 Tested Configuration:........................................................................................................................ 5
1.5 Deviation Record: ............................................................................................................................. 5
1.6 Modification Record: .............................................................................................................................. 5
1.7 Test Methodology ............................................................................................................................. 5
1.8 Test Facility....................................................................................................................................... 5
1.9 Worst Case Mode EUT Configuration, Operating Condition, and Setup: ........................................ 5
1.10 The Worst Mode For Test ................................................................................................................. 6

2. PROVISIONS APPLICABLE ........................................................................................................... 7


2.1 Definition .......................................................................................................................................... 7
2.2 Requirement for Compliance ............................................................................................................ 7
2.3 Labelling Requirement .................................................................................................................... 10
2.4 User Information ............................................................................................................................. 10

3. SUMMARY OF TEST RESULTS ................................................................................................... 12


3.1 Emissions: ....................................................................................................................................... 12
3.2 Applied Level: ....................................................................................................................................... 12

4. RADIATED EMISSION MEASUREMENT .................................................................................. 13


4.1 Applicable Standard ........................................................................................................................ 13
4.2 Measurement Procedure (Below 1GHz) ......................................................................................... 13
4.3 Measurement Procedure (Above 1GHz) ......................................................................................... 14
4.4 Measuring Instrument ..................................................................................................................... 15
4.5 Field Strength Calculation............................................................................................................... 15
4.6 Radiated Emission Data .................................................................................................................. 16
ANEEX A: PHOTOS .......................................................................................................................A1~A12

Report No.: 17-05-MAR-037-01 Page 2 of 31


ELECTRONICS TESTING CENTER, TAIWAN
TEST REPORT CERTIFICATION
Applicant : JET OPTOELECTRONICS CO.,LTD.

Address : 3F.,No.300,Yangguang St.,Neihu Dist.,Taipei City 11491,Taiwan,R.O.C

Manufacturer : JET OPTOELECTRONICS CO.,LTD.

Address : 3F.,No.300,Yangguang St.,Neihu Dist.,Taipei City 11491,Taiwan,R.O.C

EUT : EVO ASSEMBLY-0 / EVO ASSEMBLY-4/ EVO ASSEMBLY-5

Brand/Trade : VOXXHirschmann Corporation.

Model : 620061 / 620062 / 620063

Comment Issues : ----


Power Source : DC 12V
Regulations Applied : FCC 47 CFR, Part 15 Subpart B (2015)
CSA Standard C108.8 / Interference-Causing Equipment Standard
ICES-003 (2016) / ICES-003 (2016) / CAN/CSA- CISPR 22-10 (Class B)
Test Specifications : Class B

The testing described in this report has been carried out to the best of our knowledge and
ability, and our responsibility is limited to the exercise of reasonable care. This certification
is not intended to believe the sellers from their legal and/or contractual obligations.
The compliance test is only certified for the test equipment and the results of the testing
report relate only to the item tested. The compliance test of this report was conducted in
accordance with the appropriate standards. It’s not intention to assure the quality and
performance of the product.
This report shall not be reproduced except in full, without the approval of ETC.
This report must not be used by the client to claim product endorsement by NVLAP or any
agency of the U.S. Government.

Laboratory Introduction: Electronics Testing Center, Taiwan is recognized, filed and mutual recognition
arrangement as following:
 ISO/IEC 17025: BSMI, TAF, NCC, NVLAP, CCIBLAC, UL, Compliance
 Filing: FCC, Industry Canada, VCCI
 MRA: Australia, Hong Kong, New Zealand, Singapore, USA, Japan, Korea, China, APLAC through TAF
 FCC Registration Number: 90588, 91094, 91095

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ELECTRONICS TESTING CENTER, TAIWAN

1. GENERAL INFORMATION

1.1 Product Description


EVO ASSEMBLY-0 / EVO ASSEMBLY-4/ EVO ASSEMBLY-5
1.2 For Unintentional Radiators Frequency Range
For an unintentional radiator, including a digital device, the spectrum shall be investigated from
the lowest radio frequency signal generated or used in the device, without going below the lowest
frequency for which a radiated emission limit is specified, up to the frequency shown in the
following table:
Highest frequency generated or Upper frequency of measurement
Used in the device or on which the
Range (MHz)
device operated or tunes (MHz)
Below 1.705 30
1.705 – 108 1000
108 – 500 2000
500 – 1000 5000
5th harmonic of the highest frequency or 40 GHz,
Above 1000
whichever is lower
1.3 Related Information of EUT:
Power Supply : DC 12V
* For more detailed features, please refer to User’s Manual.

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ELECTRONICS TESTING CENTER, TAIWAN

1.4 Tested Configuration:


The EUT connected with the following peripheral devices.
Following peripheral devices and interface cables were connected during the measurement:
The Table of peripheral devices and interface cables
Product Manufacturer Model No. I/O Cable
N/A N/A N/A N/A

1.5 Deviation Record:


(If any deviation from additions to or exclusions from test method must be stated)
N/A

1.6 Modification Record:


No modifications were required. (That is the EUT complied with the requirement as tested.)

1.7 Test Methodology


Both conducted AND radiated emissions were performed according to the procedures in ANSI C63.4.

1.8 Test Facility


The Semi-Anechoic Chamber and conducted measurement facility used to collect the radiated and
conducted data are located inside the Building at No.8, Lane 29, Wen-ming Road, Lo-shan Tsun,
Kweishan Hsiang, Taoyuan, Taiwan, R.O.C.
This site has been accreditation as a FCC filing site.

1.9 Worst Case Mode EUT Configuration, Operating Condition, and Setup:
1.9.1Operating Conditions of the EUT.
The EUT configuration, operating condition, and associated setup used during measurement is evaluated
to produce the worse case or highest level relative to the limit under the clauses set out in ANSI C63.4 and
FCC 47 FCR, Part 15 Subpart B as described in following sections
Refer to ANSI C63.4(2014):
The EUT and accessories shall be operated at the rated (normal) operating voltage , operating temperature,
and typical load conditions – mechanical,electrical,or both – for which they are designed . Loads may be
actual or simulated as described in the individual equipment requipments. It may be necessary to develop
a set of explicit requirements specifying the test conditions , EUT operation ,and so on , to be used in
testing a specific EUT or class of EUTs for radio-noise emissions. Such requirements shall be documented
for the EUT and may be used in determining compliance with the limits.The EUT shall be operated to
ensure that all the functions are exercised (software,etc.): for example ,see 11.2 on information technology
equipment (ITE). If software is used to exercise the EUT , then a description and all identifiers (e.g.,

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ELECTRONICS TESTING CENTER, TAIWAN
model/issue name / number and revision number) of the specific operating software shall be included in
the test report to ensure reproducible test results.
Note:Clause 11-Measurement of ITE. Clause 12.3-Measurement of TV interface devices.
Refer to FCC 47 CFR, Part 15 Subpart B (2015):
Section 15.5 – General conditions of operation.

1.10 The Worst Mode For Test

* The EUT additional used second sources. Previous pre-scan mode to identify the worst case. And a
configuration, which produced worst emission level was selected and recorded in this report.

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ELECTRONICS TESTING CENTER, TAIWAN

2. PROVISIONS APPLICABLE

2.1 Definition
Unintentional Radiator:
A device that intentionally generates radio frequency energy for use within the device, or that
sends radio frequency signals by conduction to associated equipment via connecting wiring, but
which is not intended to emit RF energy by radiation or induction.
Class A Digital Device:
A digital device which is marketed for use in commercial or business environment; exclusive of a
device which is marketed for use by the general public, or which is intended to be used in the
home.
Class B Digital Device:
A digital device which is marketed for use in a residential environment notwithstanding use in a
commercial, business and industrial environment. Examples of such devices include, but are not
limited to, personal computers, calculators, and similar electronic devices that are marketed for use
by the general public.

Note: A manufacturer may also qualify a device intended to be marketed in a commercial,


business, or industrial environment as a Class B digital device, and in fact is encouraged to
do so, provided the device complies with the technical specifications for a Class B Digital
Device. In the event that a particular type of device has been found to repeatedly cause
harmful interference to radio communications, the Commission may classify such a digital
device as a Class B Digital Device, Regardless of its intended use.

2.2 Requirement for Compliance


(1) Conducted Emission Requirement
For unintentional device, according to FCC§15.107(b) Line Conducted Emission Limits class
A is as following:
Frequency Quasi Peak Average
MHz dBμV dBμV
0.15 - 0.5 79 66
0.5 - 5.0 73 60
5.0 - 30.0 73 60
For unintentional device, according to CISPR 22 Line Conducted Emission Limits class A is
as following:
Frequency Quasi Peak Average
MHz dBμV dBμV
0.15 - 0.5 79 66
0.5 - 5.0 73 60
5.0 - 30.0 73 60

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ELECTRONICS TESTING CENTER, TAIWAN
For unintentional device, according to AS/NZS CISPR 22 Line Conducted Emission Limits
class A is as following:
Frequency Quasi Peak Average
MHz dBμV dBμV
0.15 - 0.5 79 66
0.5 - 5.0 73 60
5.0 - 30.0 73 60
For unintentional device, according to FCC§15.107(a) Line Conducted Emission Limits class
B is as following:
Frequency Quasi Peak Average
MHz dBμV dBμV
0.15 - 0.5 66-56 56-46
0.5 - 5.0 56 46
5.0 - 30.0 60 50
For unintentional device, according to CISPR 22 Line Conducted Emission Limits class B is
as following:
Frequency Quasi Peak Average
MHz dBμV dBμV
0.15 - 0.5 66-56 56-46
0.5 - 5.0 56 46
5.0 - 30.0 60 50
For unintentional device, according to AS/NZS CISPR 22 Line Conducted Emission Limits
class B is as following:
Frequency Quasi Peak Average
MHz dBμV dBμV
0.15 - 0.5 66-56 56-46
0.5 - 5.0 56 46
5.0 - 30.0 60 50
(2) Radiated Emission Requirement
For unintentional device, according to FCC § 15.109(b), the field strength of radiated
emissions from class A unintentional radiators at a distance of 10 meters shall not exceed the
following values: (Above 1G - Distance 1/ Distance 2 = Limit 2/ Limit 1)
Frequency Distance Radiated Radiated
MHz Meters μV/m dBμV/m
30 - 88 10 90 39.0
88 - 216 10 150 43.5
216 - 960 10 210 46.4
above 960 10 300 49.5

Frequency Distance Radiated(PK) Radiated(AV)


MHz Meters dBμV/m dBμV/m
above 1G-18G 3 79.5 59.5

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ELECTRONICS TESTING CENTER, TAIWAN
For unintentional device, according to CISPR 22 Radiated Emission Limits class A is as
following:
Frequency Distance Radiated
MHz Meters dBμV/m
30 to 230 10 40
230 to 1000 10 47

For unintentional device, according to AS/ NZS CISPR 22 Radiated Emission Limits class A
is as following:
Frequency Distance Radiated
MHz Meters dBμV/m
30 to 230 10 40
230 to 1000 10 47

For unintentional device, according to FCC § 15.109(a), the field strength of radiated
emissions from unintentional radiators at except for class B digital devices a distance of 3
meters shall not exceed the following values: (Distance 1/ Distance 2 = Limit 2/ Limit 1)

Frequency Distance Radiated Radiated


MHz Meters μV/m dBμV/m
30 - 88 3 100 40.0
88 - 216 3 150 43.5
216 - 960 3 200 46.0
above 960 3 500 54.0

Frequency Distance Radiated(PK) Radiated(AV)


MHz Meters dBμV/m dBμV/m
74
above 1G-18G 3 54
63

For unintentional device, according to CISPR 22 Radiated Emission Limits class B is as


following:
Frequency Distance Radiated
MHz Meters dBμV/m
30 to 230 10 30
230 to 1000 10 37

For unintentional device, according to AS/ NZS CISPR 22 Radiated Emission Limits class B
is as following:
Frequency Distance Radiated
MHz Meters dBμV/m
30 to 230 10 30
230 to 1000 10 37

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ELECTRONICS TESTING CENTER, TAIWAN

2.3 Labelling Requirement


The device shall bear the following statement in a conspicuous location on the device:

This device complies with part 15 of the FCC Rules. Operation is subject to the following two
conditions: (1) This device may not cause harmful interference, and (2) this device must accept
any interference received, including interference that may cause undesired operation.

2.4 User Information


The users manual or instruction manual for an intentional or unintentional radiator shall caution
the user that changes or modifications not expressly approved by the party responsible for
compliance could void the user's authority to operate the equipment.
(a)Class A:
For a Class A digital device or peripheral , the instructions furnished the user shall include the
following or similar statement, placed in a prominent location in the text of the manual:

Note:
This equipment has been tested and found to comply with the limits for a Class A digital device ,
pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection
against harmful intererence when the equipment is operated in a commerical environment. This
equipment generates ,uses,and can radiate radio frequency energy and, if not installed and used in
accordance with the instruction manual,may cause harmful intererence to radio communications.
Operation of this equipment in a residential area is likely to cause harmful intererence in which
case the user will be required to correct the intererence at his own expense.
(b)Class B:
For a Class B digital device or peripheral, the instructions furnished the user shall include the
following or similar statement, placed in a prominent location in the text of the manual:
Note:
This equipment has been tested and found to comply with the limits for a Class B digital device,
pursuant to Part 15 of the FCC Rules. These limits are designed to provide reasonable protection
against harmful interference in a residential installation.
This equipment generates, uses and can radiate radio frequency energy and, if not installed and
used in accordance with the instruction, may cause harmful interference to radio communication.
However, there is no guarantee that interference will not occur in a particular installation.
If this equipment does cause harmful interference to radio or television reception, which can be
determined by turning the equipment off and on, the user is encouraged to try to correct the
interference by one or more of the following measures:
-- Reorient or relocate the receiving antenna.
-- Increase the separation between the equipment and receiver.
-- Connect the equipment into an outlet on a circuit different from that to which the receiver is
connected.
-- Consult the dealer or an experienced radio / TV technician for help.

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ELECTRONICS TESTING CENTER, TAIWAN
(c)The provisions of paragraphs (a) and (b) do not apply to digital devices exempted from the
technical standards under the provisions of Section 15.103.
(d)For systems incorporating several digital devices , the statement shown in paragraph(a) or (b)
needs to be contained only in the instruction manual for the main control unit.
(e)In cases where the manual is provided only in a form other than paper, such as on a computer
disk or over the internet, the information required by this section me be included in the manual in
that alternative form ,provided the user can reasonably be expected to have the capability to access
information in that form.

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ELECTRONICS TESTING CENTER, TAIWAN

3. SUMMARY OF TEST RESULTS

3.1 Emissions:
3.1.2 Radiated Emissions(Below 1GHz)
■ -PASS
EMI value to the limit: -0.97 dB at 222.7564 MHz

3.1.3 Radiated Emissions(Above 1GHz)


■ -PASS
EMI value to the limit: -15.74 dB at 10384.000 MHz

3.2 Applied Level:

Manufacturer level requirements:


Applied Level
Emission Test Applied Level and
Test Item Test Result
Standard M.U.
FCC 47 CFR, Part 15 Subpart B §15.109(a)
Radiated
CSA Standard C108.8 / Interference-Causing PASS Class B
Emission
Equipment StandardICES-003 (2016) /
ICES-003 (2016) / CAN/CSA- CISPR 22-10

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ELECTRONICS TESTING CENTER, TAIWAN

4. RADIATED EMISSION MEASUREMENT

4.1 Applicable Standard


For unintentional radiator digital devices, the radiated emission shall comply with §15.109(a).
And according to §15.109 (g), as an alternative to the radiated emission limits is CISPR 22.

4.2 Measurement Procedure (Below 1GHz)


(1). Setup the configuration per figure 1.
(2). For emission frequencies measured below 1 GHz, a pre-scan is performed in a semi-anechoic
chamber to determine the accurate frequencies of higher emissions then each selected frequency
is precisely measured.
(3). The search antenna is to be raised and lowered over a range from 1 to 4 meters in horizontally
polarized orientation. Position the highness when the highest value is indicated on spectrum
analyzer, then change the orientation of EUT on test table over a range from 0 。 to 360。with a
speed as slow as possible, and keep the azimuth that the highest emission is indicated on the
spectrum analyzer. Vary the antenna position again and record the highest value as a final
reading. A RF test receiver is also used to confirm emissions measured.
(4). Repeat step 3 until all frequencies need to be measured were complete.
(5). Repeat step 4 with search antenna in vertical polarized orientations.
(6). Check the frequency of the highest emission with varying the placement of cables associated
with EUT to obtain the worse case and record the result.

Figure 1: Frequencies measured below 1 GHz configuration

Antenna Tower

EUT
10m Search
Antenna

4m
RF Test
Receiver

Turn 1m
0.8m
Table

Ground Plane

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ELECTRONICS TESTING CENTER, TAIWAN

4.3 Measurement Procedure (Above 1GHz)


(1). Setup the configuration per figure 1.
(2). For emission frequencies measured above 1 GHz, a pre-scan is performed in a semi-anechoic
chamber to determine the accurate frequencies of higher emissions then each selected frequency
is precisely measured.
(3). The search antenna is to be raised and lowered over a range from 1 to 4 meters in horizontally
polarized orientation. Position the highness when the highest value is indicated on spectrum
analyzer, then change the orientation of EUT on test table over a range from 0。 to 360。with a
speed as slow as possible, and keep the azimuth that the highest emission is indicated on the
spectrum analyzer. Vary the antenna position again and record the highest value as a final
reading. A RF test receiver is also used to confirm emissions measured.
(4). Repeat step 3 until all frequencies need to be measured were complete.
(5). Repeat step 4 with search antenna in vertical polarized orientations.
(6). Check the frequency of the highest emission with varying the placement of cables associated
with EUT to obtain the worse case and record the result.

Figure 1: Frequencies measured above 1 GHz configuration

Antenna Tower

EUT
3m Search
Antenna

4m
RF Test
Receiver

Turn 1m
0.8m
Table

Ground Plane

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ELECTRONICS TESTING CENTER, TAIWAN

4.4 Measuring Instrument


The following instrument are used for radiated emissions measurement:

Calibration Recommended
Item Name Manufacturer Model
Date Recal. Date
EMI Test
1 R&S ESIB 7 Aug. 30, 2016 Aug. 29, 2017
Receiver
EMI Test
2 R&S ESU May 04, 2017 May 03, 2018
Receiver

3 Bilog Antenna ETC&JYEBAO MCTD2786B Mar. 13, 2017 Mar. 12, 2018

4 Bilog Antenna ETC&JYEBAO MCTD2786B Mar. 20, 2017 Mar. 19, 2018

5 Horn Antenna ETS-LINDGREN 3117 Oct. 19, 2016 Oct. 18, 2017

6 Preamplifier EMCI EMC9135 Oct. 11, 2016 Oct. 10, 2017


Note: The standards used to perform this calibration are traceable to NML/ROC, NIST/USA and
NPL/UK.

Measuring instrument setup in measured frequency band when specified detector function is used:
Frequency Band Resolution Video
Instrument Function
(MHz) Bandwidth Bandwidth
RF Test Receiver Quasi-Peak 120 kHz 300 kHz
30 to 1000
Spectrum Analyzer Peak 120 kHz 300 kHz
Spectrum Analyzer Average 1MHz 100KHz or 10Hz
1GHz to 18GHz
Spectrum Analyzer Peak 1MHz 1MHz

4.5 Field Strength Calculation

The field strength is calculated by adding the Antenna Factor, High Pass Filter Loss and Cable
Loss, and subtracting the Amplifier Gain (if any) from the measured reading. The basic equation
calculation is as follows:
Result = Reading + Corrected Factor
where
Corrected Factor = Antenna Factor + Cable Loss - Amplifier Gain

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ELECTRONICS TESTING CENTER, TAIWAN

4.6 Radiated Emission Data

4.6.1 Limits below 1GHz


Test Mode: HDMI
Test Date : May 11, 2017 Temperature : 26 °C Humidity : 60 %
Antenna Polarization: Horizontal

Emission Meter CORR’d Results Limit Margins Ant. Table


Frequency Reading Factor (10m) High Degree
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (cm) (deg)
65.7532 45.77 -21.29 24.48 30.00 -5.52 102 281
235.1923 44.16 -17.11 27.05 37.00 -9.95 399 337
353.3333 44.37 -12.42 31.95 37.00 -5.05 301 256
493.2372 42.79 -9.54 33.25 37.00 -3.75 201 285
524.3270 41.25 -9.26 31.99 37.00 -5.01 201 198
594.2788 43.40 -8.99 34.41 37.00 -2.59 102 181
648.6860 38.71 -6.43 32.28 37.00 -4.72 102 164
741.9551 37.66 -6.29 31.37 37.00 -5.63 102 33

Notes: 1) Place of Measurement: ETC EMC LAB. (1F)


2) If the data table appeared symbol of “***” means the value was too low to be
measured.
3) The estimated measurement uncertainty of the result measurement is
±4.6dB (30MHz≦f≦300MHz).
±4.4dB (300MHz<f≦1000MHz).
4) Class B Limits.

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ELECTRONICS TESTING CENTER, TAIWAN

Antenna Polarization: Vertical

Emission Meter CORR’d Results Limit Margins Ant. Table


Frequency Reading Factor (10m) High Degree
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (cm) (deg)
35.8316 46.05 -17.98 28.07 30.00 -1.93 398 359
148.5772 43.75 -16.82 26.93 30.00 -3.07 102 203
321.5832 44.21 -12.90 31.31 37.00 -5.69 102 360
352.6854 43.22 -12.11 31.11 37.00 -5.89 102 355
418.7776 42.26 -10.28 31.98 37.00 -5.02 102 328
494.5892 39.91 -9.01 30.90 37.00 -6.10 299 0
636.4930 37.68 -6.29 31.39 37.00 -5.61 251 0
743.4068 36.73 -5.19 31.54 37.00 -5.46 235 0

Notes: 1) Place of Measurement: ETC EMC LAB. (1F)


2) If the data table appeared symbol of “***” means the value was too low to be
measured.
3) The estimated measurement uncertainty of the result measurement is
±4.6dB (30MHz≦f≦300MHz).
±4.4dB (300MHz<f≦1000MHz).
4) Class B Limits.

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ELECTRONICS TESTING CENTER, TAIWAN
Test Mode: DVD
Test Date : May 11, 2017 Temperature : 26 °C Humidity : 60 %
Antenna Polarization: Horizontal

Emission Meter CORR’d Results Limit Margins Ant. Table


Frequency Reading Factor (10m) High Degree
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (cm) (deg)
43.9904 43.21 -18.66 24.55 30.00 -5.45 101 2
163.6860 46.90 -18.37 28.53 30.00 -1.47 398 35
648.6860 40.49 -6.43 34.06 37.00 -2.94 101 108
746.6186 41.78 -6.21 35.57 37.00 -1.43 299 64
804.1346 38.91 -5.46 33.45 37.00 -3.55 101 335
861.6506 40.31 -4.38 35.93 37.00 -1.07 300 360
919.1667 37.73 -3.03 34.70 37.00 -2.30 101 34
975.3686 36.06 -1.52 34.54 37.00 -2.46 101 168

Notes: 1) Place of Measurement: ETC EMC LAB. (1F)


2) If the data table appeared symbol of “***” means the value was too low to be
measured.
3) The estimated measurement uncertainty of the result measurement is
±4.6dB (30MHz≦f≦300MHz).
±4.4dB (300MHz<f≦1000MHz).
4) Class B Limits.

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ELECTRONICS TESTING CENTER, TAIWAN

Antenna Polarization: Vertical

Emission Meter CORR’d Results Limit Margins Ant. Table


Frequency Reading Factor (10m) High Degree
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (cm) (deg)
113.5872 42.59 -16.05 26.54 30.00 -3.46 100 127
158.2966 46.42 -17.68 28.74 30.00 -1.26 301 111
498.4770 41.89 -8.96 32.93 37.00 -4.07 301 42
525.6914 41.04 -8.61 32.43 37.00 -4.57 200 360
745.3507 41.16 -5.17 35.99 37.00 -1.01 200 107
860.1904 38.26 -3.50 34.76 37.00 -2.24 168 303
918.3567 37.07 -2.09 34.98 37.00 -2.02 200 121
975.8917 35.46 -0.52 34.94 37.00 -2.06 397 87

Notes: 1) Place of Measurement: ETC EMC LAB. (1F)


2) If the data table appeared symbol of “***” means the value was too low to be
measured.
3) The estimated measurement uncertainty of the result measurement is
±4.6dB (30MHz≦f≦300MHz).
±4.4dB (300MHz<f≦1000MHz).
4) Class B Limits.

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ELECTRONICS TESTING CENTER, TAIWAN
Test Mode: MHL
Test Date : May 11, 2017 Temperature : 26 °C Humidity : 60 %
Antenna Polarization: Horizontal

Emission Meter CORR’d Results Limit Margins Ant. Table


Frequency Reading Factor (10m) High Degree
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (cm) (deg)
34.6635 40.47 -17.67 22.80 30.00 -7.20 218 0
222.7564 47.61 -18.58 29.03 30.00 -0.97 299 28
348.6700 44.44 -12.55 31.89 37.00 -5.11 299 286
370.4327 45.10 -11.96 33.14 37.00 -3.86 299 261
496.3462 41.95 -9.50 32.45 37.00 -4.55 199 290
519.6635 41.60 -9.29 32.31 37.00 -4.69 199 214
648.6860 37.22 -6.43 30.79 37.00 -6.21 199 111
891.1860 36.84 -4.08 32.76 37.00 -4.24 299 23
965.8013 34.12 -1.51 32.61 37.00 -4.39 101 45

Notes: 1) Place of Measurement: ETC EMC LAB. (1F)


2) If the data table appeared symbol of “***” means the value was too low to be
measured.
3) The estimated measurement uncertainty of the result measurement is
±4.6dB (30MHz≦f≦300MHz).
±4.4dB (300MHz<f≦1000MHz).
4) Class B Limits.

Report No.: 17-05-MAR-037-01 Page 20 of 31


ELECTRONICS TESTING CENTER, TAIWAN

Antenna Polarization: Vertical

Emission Meter CORR’d Results Limit Margins Ant. Table


Frequency Reading Factor (10m) High Degree
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (cm) (deg)
37.7756 46.02 -18.23 27.79 30.00 -2.21 301 82
115.5311 41.24 -15.94 25.30 30.00 -4.70 102 162
222.4450 44.15 -18.27 25.88 30.00 -4.12 102 172
327.4148 43.61 -12.75 30.86 37.00 -6.14 102 157
422.6653 42.14 -10.19 31.95 37.00 -5.05 102 325
519.8597 43.33 -8.69 34.64 37.00 -2.36 399 168
636.4930 38.65 -6.29 32.36 37.00 -4.64 301 5

Notes: 1) Place of Measurement: ETC EMC LAB. (1F)


2) If the data table appeared symbol of “***” means the value was too low to be
measured.
3) The estimated measurement uncertainty of the result measurement is
±4.6dB (30MHz≦f≦300MHz).
±4.4dB (300MHz<f≦1000MHz).
4) Class B Limits.

Report No.: 17-05-MAR-037-01 Page 21 of 31


ELECTRONICS TESTING CENTER, TAIWAN
Test Mode: DLNA
Test Date : May 11, 2017 Temperature : 26 °C Humidity : 60 %
Antenna Polarization: Horizontal

Emission Meter CORR’d Results Limit Margins Ant. Table


Frequency Reading Factor (10m) High Degree
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (cm) (deg)
37.7724 42.04 -18.13 23.91 30.00 -6.09 141 360
235.1923 43.30 -17.11 26.19 37.00 -10.81 398 183
350.2243 44.47 -12.50 31.97 37.00 -5.03 301 276
496.3462 41.22 -9.50 31.72 37.00 -5.28 301 301
527.4360 40.94 -9.24 31.70 37.00 -5.30 201 53
648.6860 37.93 -6.43 31.50 37.00 -5.50 102 129
757.5000 37.01 -6.06 30.95 37.00 -6.05 201 265

Notes: 1) Place of Measurement: ETC EMC LAB. (1F)


2) If the data table appeared symbol of “***” means the value was too low to be
measured.
3) The estimated measurement uncertainty of the result measurement is
±4.6dB (30MHz≦f≦300MHz).
±4.4dB (300MHz<f≦1000MHz).
4) Class B Limits.

Report No.: 17-05-MAR-037-01 Page 22 of 31


ELECTRONICS TESTING CENTER, TAIWAN

Antenna Polarization: Vertical

Emission Meter CORR’d Results Limit Margins Ant. Table


Frequency Reading Factor (10m) High Degree
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) (cm) (deg)
30.0000 44.28 -15.78 28.50 30.00 -1.50 398 89
109.6994 41.10 -16.34 24.76 30.00 -5.24 101 243
323.5271 44.16 -12.85 31.31 37.00 -5.69 101 360
416.8337 41.47 -10.32 31.15 37.00 -5.85 101 320
484.8697 40.57 -9.14 31.43 37.00 -5.57 299 56
549.0180 39.64 -8.33 31.31 37.00 -5.69 101 271
640.3808 36.87 -6.09 30.78 37.00 -6.22 299 7

Notes: 1) Place of Measurement: ETC EMC LAB. (1F)


2) If the data table appeared symbol of “***” means the value was too low to be
measured.
3) The estimated measurement uncertainty of the result measurement is
±4.6dB (30MHz≦f≦300MHz).
±4.4dB (300MHz<f≦1000MHz).
4) Class B Limits.

Report No.: 17-05-MAR-037-01 Page 23 of 31


ELECTRONICS TESTING CENTER, TAIWAN

4.6.2 Limits above 1GHz


Test Mode: HDMI
Test Date : May 09, 2017 Temperature : 22 °C Humidity : 67 %

Emission Meter CORR’d Results Limit Margins


Frequency Reading Detector Factor @3m
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB)
1850.000 47.53 peak -5.44 42.09 74.00 -31.91
2309.000 48.21 peak -3.16 45.05 74.00 -28.95
2972.000 46.11 peak -1.92 44.19 74.00 -29.81
4162.000 44.08 peak 0.16 44.24 74.00 -29.76
4876.000 46.33 peak 0.77 47.10 74.00 -26.90
5522.000 44.65 peak 1.41 46.06 74.00 -27.94

Notes: 1) Place of Measurement: ETC EMC LAB. (B1F)


2) If the data table appeared symbol of "***" means the value was too low to be
measured.
3) The estimated measurement uncertainty of the result measurement is
±5.18dB (1GHz≦f≦18GHz)
4) Class B Limits.

Report No.: 17-05-MAR-037-01 Page 24 of 31


ELECTRONICS TESTING CENTER, TAIWAN

Antenna Polarization: Vertical

Emission Meter CORR’d Results Limit Margins


Frequency Reading Detector Factor @3m
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB)
1833.000 47.22 peak -5.61 41.61 74.00 -32.39
2343.000 46.78 peak -3.07 43.71 74.00 -30.29
4519.000 43.84 peak 0.82 44.66 74.00 -29.34
5471.000 44.50 peak 1.35 45.85 74.00 -28.15
7239.000 45.52 peak 2.85 48.37 74.00 -25.63
8599.000 44.88 peak 3.54 48.42 74.00 -25.58

Notes: 1) Place of Measurement: ETC EMC LAB. (B1F)


2) If the data table appeared symbol of "***" means the value was too low to be
measured.
3) The estimated measurement uncertainty of the result measurement is
±5.18dB (1GHz≦f≦18GHz)
4) Class B Limits.

Report No.: 17-05-MAR-037-01 Page 25 of 31


ELECTRONICS TESTING CENTER, TAIWAN
Test Mode: DVD
Test Date : May 09, 2017 Temperature : 22 °C Humidity : 67 %

Emission Meter CORR’d Results Limit Margins


Frequency Reading Detector Factor @3m
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB)
1901.000 46.59 peak -4.98 41.61 74.00 -32.39
2377.000 47.38 peak -2.96 44.42 74.00 -29.58
4706.000 44.90 peak 0.80 45.70 74.00 -28.30
7205.000 45.29 peak 2.84 48.13 74.00 -25.87
8463.000 45.06 peak 3.44 48.50 74.00 -25.50
9007.000 45.18 peak 3.92 49.10 74.00 -24.90

Notes: 1) Place of Measurement: ETC EMC LAB. (B1F)


2) If the data table appeared symbol of "***" means the value was too low to be
measured.
3) The estimated measurement uncertainty of the result measurement is
±5.18dB (1GHz≦f≦18GHz)
4) Class B Limits.

Report No.: 17-05-MAR-037-01 Page 26 of 31


ELECTRONICS TESTING CENTER, TAIWAN

Antenna Polarization: Vertical

Emission Meter CORR’d Results Limit Margins


Frequency Reading Detector Factor @3m
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB)
1816.000 47.46 peak -5.76 41.70 74.00 -32.30
2275.000 47.33 peak -3.26 44.07 74.00 -29.93
5539.000 44.22 peak 1.44 45.66 74.00 -28.34
7392.000 46.07 peak 2.86 48.93 74.00 -25.07
9160.000 44.05 peak 3.95 48.00 74.00 -26.00
10384.000 46.14 peak 5.62 51.76 74.00 -22.24
10384.000 32.64 AVG 5.62 38.26 54.00 -15.74

Notes: 1) Place of Measurement: ETC EMC LAB. (B1F)


2) If the data table appeared symbol of "***" means the value was too low to be
measured.
3) The estimated measurement uncertainty of the result measurement is
±5.18dB (1GHz≦f≦18GHz)
4) Class B Limits.

Report No.: 17-05-MAR-037-01 Page 27 of 31


ELECTRONICS TESTING CENTER, TAIWAN
Test Mode: MHL
Test Date : May 09, 2017 Temperature : 22 °C Humidity : 67 %

Emission Meter CORR’d Results Limit Margins


Frequency Reading Detector Factor @3m
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB)
1833.000 47.67 peak -5.61 42.06 74.00 -31.94
2394.000 47.44 peak -2.91 44.53 74.00 -29.47
2955.000 45.71 peak -1.94 43.77 74.00 -30.23
4009.000 43.96 peak -0.15 43.81 74.00 -30.19
4876.000 44.43 peak 0.77 45.20 74.00 -28.80
5522.000 44.48 peak 1.41 45.89 74.00 -28.11

Notes: 1) Place of Measurement: ETC EMC LAB. (B1F)


2) If the data table appeared symbol of "***" means the value was too low to be
measured.
3) The estimated measurement uncertainty of the result measurement is
±5.18dB (1GHz≦f≦18GHz)
4) Class B Limits.

Report No.: 17-05-MAR-037-01 Page 28 of 31


ELECTRONICS TESTING CENTER, TAIWAN

Antenna Polarization: Vertical

Emission Meter CORR’d Results Limit Margins


Frequency Reading Detector Factor @3m
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB)
1204.000 48.68 peak -8.86 39.82 74.00 -34.18
1833.000 47.33 peak -5.61 41.72 74.00 -32.28
2360.000 47.42 peak -3.01 44.41 74.00 -29.59
3448.000 44.58 peak -1.62 42.96 74.00 -31.04
4638.000 45.13 peak 0.80 45.93 74.00 -28.07
5539.000 44.53 peak 1.44 45.97 74.00 -28.03

Notes: 1) Place of Measurement: ETC EMC LAB. (B1F)


2) If the data table appeared symbol of "***" means the value was too low to be
measured.
3) The estimated measurement uncertainty of the result measurement is
±5.18dB (1GHz≦f≦18GHz)
4) Class B Limits.

Report No.: 17-05-MAR-037-01 Page 29 of 31


ELECTRONICS TESTING CENTER, TAIWAN
Test Mode: DLNA
Test Date : May 09, 2017 Temperature : 22 °C Humidity : 67 %

Emission Meter CORR’d Results Limit Margins


Frequency Reading Detector Factor @3m
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB)
1816.000 48.38 peak -5.76 42.62 74.00 -31.38
2377.000 46.99 peak -2.96 44.03 74.00 -29.97
4876.000 44.43 peak 0.77 45.20 74.00 -28.80
7222.000 45.43 peak 2.85 48.28 74.00 -25.72
8582.000 44.10 peak 3.53 47.63 74.00 -26.37
10010.000 45.41 peak 4.77 50.18 74.00 -23.82

Notes: 1) Place of Measurement: ETC EMC LAB. (B1F)


2) If the data table appeared symbol of "***" means the value was too low to be
measured.
3) The estimated measurement uncertainty of the result measurement is
±5.18dB (1GHz≦f≦18GHz)
4) Class B Limits.

Report No.: 17-05-MAR-037-01 Page 30 of 31


ELECTRONICS TESTING CENTER, TAIWAN

Antenna Polarization: Vertical

Emission Meter CORR’d Results Limit Margins


Frequency Reading Detector Factor @3m
(MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB)
1799.000 47.80 peak -5.92 41.88 74.00 -32.12
2411.000 47.11 peak -2.86 44.25 74.00 -29.75
5454.000 44.08 peak 1.33 45.41 74.00 -28.59
7239.000 45.14 peak 2.85 47.99 74.00 -26.01
8667.000 44.21 peak 3.60 47.81 74.00 -26.19
10401.000 44.66 peak 5.65 50.31 74.00 -23.69

Notes: 1) Place of Measurement: ETC EMC LAB. (B1F)


2) If the data table appeared symbol of "***" means the value was too low to be
measured.
3) The estimated measurement uncertainty of the result measurement is
±5.18dB (1GHz≦f≦18GHz)
4) Class B Limits.

Report No.: 17-05-MAR-037-01 Page 31 of 31


ELECTRONICS TESTING CENTER, TAIWAN
ANNEX A: PHOTOS
1. Radiated Emissions Test Setup Photos (Below 1GHz)

Report No.: 17-05-MAR-037-01 Page A1 of A12


ELECTRONICS TESTING CENTER, TAIWAN

2. Radiated Emissions Test Setup Photos (Above 1GHz)

Report No.: 17-05-MAR-037-01 Page A2 of A12


ELECTRONICS TESTING CENTER, TAIWAN

1. Outside view 1 of EUT

2. Outside view 2 of EUT

Report No.: 17-05-MAR-037-01 Page A3 of A12


ELECTRONICS TESTING CENTER, TAIWAN

3. Outside view 3 of EUT

4. Outside view 4 of EUT

Report No.: 17-05-MAR-037-01 Page A4 of A12


ELECTRONICS TESTING CENTER, TAIWAN

5. Outside view 5 of EUT

6. Outside view 6 of EUT

Report No.: 17-05-MAR-037-01 Page A5 of A12


ELECTRONICS TESTING CENTER, TAIWAN

7. Inside view 1 of EUT

8. Inside view 2 of EUT

Report No.: 17-05-MAR-037-01 Page A6 of A12


ELECTRONICS TESTING CENTER, TAIWAN

9. Inside view 3 of EUT

10. Inside view 4 of EUT

Report No.: 17-05-MAR-037-01 Page A7 of A12


ELECTRONICS TESTING CENTER, TAIWAN

11. Inside view 5 of EUT

12. Inside view 6 of EUT

Report No.: 17-05-MAR-037-01 Page A8 of A12


ELECTRONICS TESTING CENTER, TAIWAN

13. Inside view 7 of EUT

14. Inside view 8 of EUT

Report No.: 17-05-MAR-037-01 Page A9 of A12


ELECTRONICS TESTING CENTER, TAIWAN

15. Inside view 9 of EUT

16. Inside view 10 of EUT

Report No.: 17-05-MAR-037-01 Page A10 of A12


ELECTRONICS TESTING CENTER, TAIWAN

17. Inside view 11 of EUT

18. Inside view 12 of EUT

Report No.: 17-05-MAR-037-01 Page A11 of A12


ELECTRONICS TESTING CENTER, TAIWAN

19. Inside view 13 of EUT

Report No.: 17-05-MAR-037-01 Page A12 of A12

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