BRITISH STANDARD BS EN

140101-806:2008
+A1:2013
Incorporating
corrigendum
October 2009

Detail Specification:
Fixed low power film
resistors — Metal film
resistors on high grade
ceramic, conformal
coated or molded, axial
or preformed leads

ICS 31.040.10

12&23<,1*:,7+287%6,3(50,66,21(;&(37$63(50,77('%<&23<5,*+7/$:
BS EN 140101-806:2008+A1:2013

National foreword

This British Standard is the UK implementation of

EN 140101-806:2008+A1:2013, incorporating corrigendum October 2009.
It supersedes BS EN 140101-806:2008, which is withdrawn.
The start and finish of text introduced or altered by amendment is indicated in
the text by tags. Tags indicating changes to CEN text carry the number of the
CEN amendment. For example, text altered by CEN amendment A1 is
indicated by !".
The UK participation in its preparation was entrusted to Technical
Committee EPL/40X, Capacitors and resistors for electronic equipment.
A list of organizations represented on this committee can be obtained
on request to its secretary.
This publication does not purport to include all the necessary
provisions of a contract. Users are responsible for its correct
application.
Compliance with a British Standard cannot confer immunity from
legal obligations.

This British Standard was Amendments/corrigenda issued since publication

published under the authority
of the Standards Policy and
Strategy Committee Date Comments
on 31 July 2008

31 January 2010 Implementation of CENELEC corrigendum October

© The British Standards 2009: Table 6 replaced
Institution 2014. Published
by BSI Standards Limited
2014 31 March 2014 Implementation of CEN amendment A1:2013

ISBN 978 0 580 83116 4

EUROPEAN STANDARD EN 140101-806+A1
NORME EUROPÉENNE
EUROPÄISCHE NORM November 2013

ICS 31.040.10

English version

Detail Specification:
Fixed low power film resistors -
Metal film resistors on high grade ceramic,
conformal coated or molded, axial or preformed leads

Spécification particulière: Bauartspezifikation:

Résistances fixes à couche Schicht-Festwiderstände
et à faible dissipation - niedriger Belastbarkeit -
Résistances à couche métallique Metallschichtwiderstände auf hochwertiger
sur céramique de qualité supérieure, Keramik, mit konformer Umhüllung und
moulée ou disposant axialen oder vorgeformten Anschlüssen
d'un revêtement enrobant,
avec des sorties préformées ou axiales

This European Standard was approved by CENELEC on 2007-11-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels

© 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 140101-806:2008 E

BS EN 140101-806:2008+A1:2013
EN 140101-806:2008+A1:2013 (E) –2–

Foreword
This European Standard was prepared by the Technical Committee CENELEC TC 40XB, Resistors.

The text of the draft was submitted to the formal vote and was approved by CENELEC as EN 140101-806 on
2007-11-01.

This European Standard supersedes CECC 40 101-806:1997.

The following dates were fixed:

– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2008-11-01

– latest date by which the national standards conflicting

with the EN have to be withdrawn (dow) 2010-11-01

Preceding documents on the subject covered by this specification have been:

– only on resistors without established reliability, now Version A:
− CECC 40 101-012: 1978-09; 1981-10; 1983-09; 1992-11
− CECC 40 101-013: 1978-09; 1981-10; 1983-09; 1992-11
− CECC 40 101-014: 1978-09; 1981-10
− CECC 40 101-015: 1981-10; 1983-09; 1992-11
− CECC 40 101-016: 1978-09; 1981-10; 1983-09; 1992-11
− CECC 40 101-017: 1978-09; 1981-10; 1983-09; 1992-11
− CECC 40 101-018: 1981-01; 1983-09; 1992-11
− CECC 40 101-022: 1977-07
− CECC 40 101-023: 1977-07
− CECC 40 101-025: 1977-06
− CECC 40 101-033: 1981-10; 1983-09
− CECC 40 101-039: 1982-04; 1986-05
− CECC 40 101-040: 1982-04; 1984-06
− CECC 40 101-041: 1984-00
− CECC 40 101-042: 1984-00
− CECC 40 101-045: 1985-07; 1987-01; 1992-11; 1995-05
− CECC 40 101-048: 1992-02; 1992-10
– only on resistors with established reliability, now Version E:
− CECC 40 101-046: 1987-11
− CECC 40 101-047: 1988-07; 1989-08; 1990-12; 1993-02; 1995-06

Compared to the superseded standard, the following changes have been implemented:
– modification of the title;
– elimination of style E;
– revised tables for resistance range and tolerance on rated resistance in 1.3;
-6 -6
– introduction of temperature coefficients ± 10 . 10 /K and ± 5 . 10 /K in 1.4;
– introduction of stability classes 0,25, 0,1 and 0,05 in 1.3 and 1.6;
– introduction of a test on the resistance to electrostatic discharge (ESD) in 1.6 and Annex A;
– introduction of description and test methods for lead-free soldering in 1.9.3 and Annex A;
– introduction of code letters for temperature coefficient (TCR) as in EN 60062;
– revision of ordering information in 1.8.4;
 BS EN 140101-806:2008+A1:2013
–3– EN 140101-806:2008+A1:2013 (E)

– revised information on pulse load capability in 1.9.5;

– revised information on resistance drift in 1.9.6;
– adoption of the IECQ rules of procedure, IEC QC 001002-3;
– revision of the sample quantities and the sequence of tests in Annex A;
– editorial revision.

This specification is part of a series of documents describing fixed low power film resistors as follows.
– EN 60115-1 Fixed resistors for use in electronic equipment – Part 1: Generic specification
(IEC 60115-1, mod.)
– EN 140100 Sectional specification: Fixed low power film resistors
– this detail specification.

Any detail specification within this series is written on the basis of

– EN 140101 Blank detail specification: Fixed low power film resistors.

—————

Foreword to amendment A1
This document (EN 140101-806:2008/A1:2013) has been prepared by CLC/TC 40XB "Resistors".

The following dates are fixed:

• latest date by which this document has (dop) 2014-10-14

to be implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2016-10-14
standards conflicting with this
document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent rights.
BS EN 140101-806:2008+A1:2013
EN 140101-806:2008+A1:2013 (E) –4–

Contents

1 Characteristics and ratings ................................................................................................................... 5

1.1 Dimensions and ratings ............................................................................................................................ 5
1.2 Derating curve .......................................................................................................................................... 7
1.3 Resistance range and tolerance on rated resistance ............................................................................... 7
1.4 Variation of resistance with temperature and temperature rise .............................................................11
1.5 Climatic categories .................................................................................................................................11
1.6 Limits for change of resistance at tests ..................................................................................................12
1.7 Non-linear properties ..............................................................................................................................13
1.8 Tests related to soldering .......................................................................................................................13
1.9 Marking, packaging and ordering designation .......................................................................................14
1.10 Additional information (not for inspection purpose) ................................................................................15
2 Quality assessment procedures .........................................................................................................21
2.1 General ...................................................................................................................................................21
2.2 Qualification Approval ............................................................................................................................23
2.3 Quality Conformance Inspection ............................................................................................................23
Annex A (normative) Fixed sample size Qualification Approval and Quality Conformance
Inspection test schedule for fixed low power film resistors ..................................25
Annex B (informative) Letter symbols and abbreviations .........................................................................33
Bibliography ....................................................................................................................................................35

Figure 1 – Outline and dimensions (see Table 1) .............................................................................................. 5

Figure 2 – Derating curve ................................................................................................................................... 7
Figure 3 – Limits of non-linearity in resistance .................................................................................................13
Figure 4 – Pulse parameter for rectangular and exponential pulses ................................................................13
Figure 5 – Maximum permissible pulse load Pi,max for continuous pulses .......................................................17
Figure 6 – Maximum permissible pulse load Pi,max for single pulses ...............................................................18
Figure 7 – Maximum permissible pulse voltage Ui,max .....................................................................................18
Figure 8a – Drift factor for UCT = 155 °C .........................................................................................................19
Figure 8b – Drift factor for UCT = 125 °C .........................................................................................................20
Figure 8c – Drift factor for UCT = 85 °C ...........................................................................................................20
Figure 9 – Current noise ..................................................................................................................................21
Table 1 – Style and dimensions ......................................................................................................................... 5
Table 2a – Ratings for stability classes 2; 1; 0,5 ................................................................................................ 6
Table 2b – Ratings for stability class 0,25 .......................................................................................................... 6
Table 2c – Ratings for stability class 0,1; 0,05 ................................................................................................... 6
Table 2d – Ratings for 0 Ω resistors ...................................................................................................................6
Table 3a – Resistance range and tolerance on rated resistance for Version A ................................................. 8
Table 3b – Resistance range and tolerance on rated resistance for Version E ...............................................10
Table 4 – Temperature coefficients and percentage change of resistance .....................................................11
Table 5 – Limits of temperature rise .................................................................................................................11
Table 6 – Climatic categories ...........................................................................................................................11
Table 7a – Limits for change of resistance at tests ..........................................................................................12
Table 7b – Limits for change of resistance at tests ..........................................................................................12
Table A.1 – Test schedule for Qualification Approval and Quality Conformance Inspection, lot-by-lot tests,
assessment level EZ ....................................................................................................................24
Table A.2 – Test schedule for Qualification Approval and Quality Conformance Inspection, periodic tests,
assessment level EZ ....................................................................................................................27
 BS EN 140101-806:2008+A1:2013
–5– EN 140101-806:2008+A1:2013 (E)

Specification available from: EN 140101-806

CENELEC Central Secretariat, Rue de Stassart 35,
B-1050 Brussels, or from the addresses shown on the inside cover
Electronic components of assessed quality in accordance with: Issue 2
EN 60115-1:2001 + A1:2001
March 2008
EN 140100:2008
EN 140101:2008
Fixed low power film resistors

Metal film resistors on high grade

ceramic, conformal coated or
molded, axial or preformed lead-
free leads
a
Assessment level EZ
Version A: with 100 %-test
Version E: with failure rate level
and 100 %-test
Stability classes 0,05; 0,1; 0,25;
0,5; 1; 2
Other shapes are permitted within the given dimensions.
Figure 1 – Outline and dimensions (see Table 1)
a
For explanation on assessment level EZ see 2.1.1.

1 Characteristics and ratings

Various parameters of this component are precisely defined in this specification. Unspecified parameters
may vary from one component to another.

1.1 Dimensions and ratings

Table 1 – Style and dimensions

a b c d
Style Length L Diameter D d e c Mass
mm mm mm mm mm mg
d
Code Size min. max. min. max. max. max.

A 0204 3,0 4,0 1,3 1,9 0,4 / 0,5 7,5 0,5 130
B 0207 5,0 6,5 2,0 2,5 0,6 10,0 0,5 280
C 0411 7,5 10,7 3,0 4,0 0,6 / 0,7 15,0 0,5 600
D 0414 10,0 12,0 3,6 4,1 0,8 17,5 1,0 790
a
Permissible tolerance according to HD 349 S1.
b
Standard distance for the axis to bent leads. Smaller modules may be agreed between manufacturer and customer.
c
Length of excess protective coating.
d
For information only.

The minimum lead length of 21 mm is valid for tape packaging according to EN 60286-1 only (free lead length).

Taping according to EN 60286-1 or preformed leads are permitted. Details to be agreed between
manufacturer and customer. For preformed leads the length of excess protective coating may be larger than
given in Table 1.

Information about manufacturers who have components qualified to this detail specification is available in the
approvals section of the website http://www.iecq.org
BS EN 140101-806:2008+A1:2013
EN 140101-806:2008+A1:2013 (E) –6–

Table 2a – Ratings for stability classes 2; 1; 0,5

Style Stability Rated dissipation Limiting element voltage Insulation voltage

class P70 d.c. or a.c. (r.m.s.) Umax d.c. or a.c. (peak) Uins
mW V V
1 min continuous
A 2; 1; 0,5 400 200 300 75
B 2; 1; 0,5 600 300 500 75
C 2; 1; 0,5 800 500 750 75
D 2; 1; 0,5 900 500 750 75

Table 2b – Ratings for stability class 0,25

Style Stability Rated dissipation Limiting element voltage Insulation voltage

class P70 d.c. or a.c. (r.m.s.) Umax d.c. or a.c. (peak) Uins
mW V V
1 min continuous
A 0,25 250 200 300 75
B 0,25 400 300 500 75
C 0,25 500 500 750 75
D 0,25 600 500 750 75

Table 2c – Ratings for stability class 0,1; 0,05

Style Stability Rated dissipation Limiting element voltage Insulation voltage

class P70 d.c. or a.c. (r.m.s.) Umax d.c. or a.c. (peak) Uins
mW V V
1 min continuous
A 0,1; 0,05 75 200 300 75
B 0,1; 0,05 125 300 500 75
C 0,1; 0,05 150 500 750 75
D 0,1; 0,05 175 500 750 75

Table 2d – Ratings for 0 Ω resistors

Style Maximum current Maximum resistance Insulation voltage

Imax Rmax d.c. or a.c. (peak) Uins
A mΩ V
1 min continuous
A 3 20 300 75
B 5 20 500 75
 BS EN 140101-806:2008+A1:2013
–7– EN 140101-806:2008+A1:2013 (E)

1.2 Derating curve

Resistors covered by this specification are derated according to the following diagram:

100 %

Stability class 0,1; 0,05

Percentage of rated dissipation

80 %

Stability class 0,25

60 %
Stability class 2; 1; 0,5

40 %

20 %

0%
-100 °C -50 °C 0 °C 50 °C 70 °C 100 °C 150 °C 200 °C
-55 °C -10 °C 85 °C 125 °C 155 °C
Lower category temperature (LCT) Upper category temperature (UCT)
Ambient temperature ϑ a

Figure 2 – Derating curve

Refer to Table 6 for the category temperatures of the stability classes.

1.3 Resistance range and tolerance on rated resistance

1.3.1 Version A

The following combinations of temperature coefficient and tolerance on rated resistance may be approved
only. Products from this extent shall be used for the Qualification approval according to 2.2.1 and for the
Quality conformance inspection according to 2.3. Resistance values of an E-series according to IEC 60063
shall be used.

The qualification of resistance values below or beyond the specified resistance values is permitted, if they
fulfil the requirements of the closest stability class (e.g. Style B 1 % > 10 MΩ shall fulfil the requirements of
stability class 2).
BS EN 140101-806:2008+A1:2013
EN 140101-806:2008+A1:2013 (E) –8–

Table 3a – Resistance range and tolerance on rated resistance for Version A

Style Tolerance on Temperature Resistance Stability

c
rated resistance coefficient range class
a -6 b
% Code 10 /K
A ±5 J ± 50 0,22 Ω to < 1 Ω 1
±1 F ± 50 1 Ω to < 10 Ω 0,5
± 50; ± 25 10 Ω to 332 kΩ 0,5
10 Ω to 332 kΩ 0,25
> 332 kΩ to 10 MΩ 2
± 0,5 D ± 50; ± 25 10 Ω to 332 kΩ 0,25
10 Ω to 332 kΩ 0,5
± 0,25 C ± 25; ± 15; ± 10 22 Ω to 332 kΩ 0,25
± 25; ± 15; ± 10; 43 Ω to < 100 Ω 0,1
±5
100 Ω to 100 kΩ 0,05
> 100 kΩ to 221 kΩ 0,1
± 0,1 B ± 25; ± 15; ± 10 43 Ω to 332 kΩ 0,25
± 25; ± 15; ± 10; 43 Ω to < 100 Ω 0,1
±5
100 Ω to 100 kΩ 0,05
> 100 kΩ to 221 kΩ 0,1
B ±5 J ± 50 0,22 Ω to < 1 Ω 1
> 10 MΩ to 22 MΩ 2
±1 F ± 50 1 Ω to < 10 Ω 0,5
± 50; ± 25 10 Ω to 1 MΩ 0,5
10 Ω to 1 MΩ 0,25
> 1 MΩ to 10 MΩ 2
± 0,5 D ± 50; ± 25 10 Ω to 1 MΩ 0,25
10 Ω to 1 MΩ 0,5
± 0,25 C ± 25; ± 15; ± 10 22 Ω to 1 MΩ 0,25
± 25; ± 15; ± 10; 43 Ω to < 100 Ω 0,1
±5
100 Ω to 270 kΩ 0,05
> 270 kΩ to 510 kΩ 0,1
± 0,1 B ± 25; ± 15; ± 10 43 Ω to 1 MΩ 0,25
± 25; ± 15; ± 10; 43 Ω to < 100 Ω 0,1
±5
100 Ω to 270 kΩ 0,05
> 270 kΩ to 510 kΩ 0,1
 BS EN 140101-806:2008+A1:2013
–9– EN 140101-806:2008+A1:2013 (E)

Table 3a – Resistance range and tolerance on rated resistance for Version A (continued)

Style Tolerance on Temperature Resistance Stability

b
rated resistance coefficient range class
a -6 b
% Code 10 /K
C ±5 J ± 50 0,22 Ω to < 1 Ω 1
±1 F ± 50 1 Ω to < 10 Ω 0,5
± 50; ± 25 10 Ω to 2,43 MΩ 0,5
10 Ω to 2,43 MΩ 0,25
> 2,43 MΩ to 22 MΩ 2
± 0,5 D ± 50; ± 25 10 Ω to 2,43 MΩ 0,25
10 Ω to 2,43 MΩ 0,5
± 0,25 C ± 25; ± 15; ± 10 22 Ω to 1,5 MΩ 0,25
± 25; ± 15; ± 10; 43 Ω to < 100 Ω 0,1
±5
100 Ω to 470 kΩ 0,05
> 470 kΩ to 1 MΩ 0,1
± 0,1 B ± 25; ± 15; ± 10 43 Ω to 1,5 MΩ 0,25
± 25; ± 15; ± 10; 43 Ω to < 100 Ω 0,1
±5
100 Ω to 470 kΩ 0,05
> 470 kΩ to 1 MΩ 0,1
D ±5 J ± 50 0,22 Ω to < 1 Ω 1
±1 F ± 50 1 Ω to < 10 Ω 0,5
± 50; ± 25 10 Ω to 2,43 MΩ 0,5
10 Ω to 2,43 MΩ 0,25
> 2,43 MΩ to 22 MΩ 2
± 0,5 D ± 50; ± 25 10 Ω to 2,43 MΩ 0,25
10 Ω to 2,43 MΩ 0,5
± 0,25 C ± 25; ± 15; ± 10 22 Ω to 1,5 MΩ 0,25
± 25; ± 15; ± 10; 43 Ω to < 100 Ω 0,1
±5
100 Ω to 470 kΩ 0,05
> 470 kΩ to 1 MΩ 0,1
± 0,1 B ± 25; ± 15; ± 10 43 Ω to 1,5 MΩ 0,25
± 25; ± 15; ± 10; 43 Ω to < 100 Ω 0,1
±5
100 Ω to 470 kΩ 0,05
> 470 kΩ to 1 MΩ 0,1
0 Ω resistors according to Table 2d for styles A and B.
a
Code letters according to EN 60062.
b
For the category temperatures of stability classes refer to Table 6.
BS EN 140101-806:2008+A1:2013
EN 140101-806:2008+A1:2013 (E) – 10 –

1.3.2 Version E

The following combinations of temperature coefficient, tolerance on rated resistance, resistance range and
E-series according to IEC 60063 are permitted only. Products from this extent shall be used for the
Qualification approval according to 2.2.2 and for the Quality conformance inspection according to 2.3.

Table 3b – Resistance range and tolerance on rated resistance for Version E

Style Tolerance on Temperature Resistance Stability E series

b
rated coefficient range class
resistance
a -6
% Code 10 /K
A ±1 F ± 50 1 Ω to 332 kΩ 0,5 E96
340 kΩ to 5,11 MΩ 2
± 0,5 D ± 25 49,9 Ω to 332 kΩ 0,5 E96
340 kΩ to 511 kΩ 2
± 0,1 B ± 15 100 Ω to 332 kΩ 0,25 E192
B ±1 F ± 50 1 Ω to 1 MΩ 0,5 E96
1,02 MΩ to 5,11 MΩ 1
5,23 MΩ to 10 MΩ 2
± 0,5 D ± 25 10 Ω to 1 MΩ 0,5 E96
± 0,1 B ± 15 100 Ω to 499 kΩ 0,25 E192
C ±1 F ± 50 1 Ω to 2,43 MΩ 0,5 E96
2,49 MΩ to 5,11 MΩ 1
5,23 kΩ to 10 MΩ 2
± 0,5 D ± 25 10 Ω to 1 MΩ 0,5 E96
± 0,1 B ± 15 100 Ω to 681 kΩ 0,25 E192
D ±1 F ± 50 1 Ω to 2,43 MΩ 0,5 E96
2,49 MΩ to 5,11 MΩ 1
5,23 MΩ to 21,5 MΩ 2
± 0,5 D ± 25 10 Ω to 1,5 MΩ 0,5 E96
± 0,1 B ± 15 100 Ω to 1 MΩ 0,25 E192

0 Ω resistors according to Table 2d for styles A and B.

a
Code letters according to EN 60062.
b
For the category temperatures of stability classes refer to Table 6.
 BS EN 140101-806:2008+A1:2013
– 11 – EN 140101-806:2008+A1:2013 (E)

1.4 Variation of resistance with temperature and temperature rise

Table 4 – Temperature coefficients and percentage change of resistance

Temperature coefficient Limit of resistance change ∆R/R

%
a b
Code Code LCT / Reference temp. Reference temperature / UCT
-6
10 /K °C °C
-55 / 20 -10 / 20 20 / 85 20 / 125 20 / 155
± 50 R C ± 0,375 ± 0,150 ± 0,325 ± 0,525 ± 0,675
± 25 Q D ± 0,188 ± 0,075 ± 0,163 ± 0,262 ± 0,338
± 15 P E ± 0,113 ± 0,045 ± 0,098 ± 0,158 —
± 10 N — ± 0,075 ± 0,030 ± 0,065 ± 0,105 —
±5 M — — ± 0,015 ± 0,033 — —
a
Code letters according to EN 60062.
b
Historical code letters according to CECC 40 101-806, for information only.

Table 5 – Limits of temperature rise

Stability class Limit of temperature rise

at rated dissipation
2; 1; 0,5 Tr ≤ 85 K
0,25 Tr ≤ 55 K
0,1; 0,05 Tr ≤ 15 K

1.5 Climatic categories

Table 6 – Climatic categories

Stability class Climatic category

LCT / UCT / Duration
2; 1; 0,5 55 / 155 / 56
0,25 55 / 125 / 56
0,1; 0,05 10 / 085 / 56
BS EN 140101-806:2008+A1:2013
EN 140101-806:2008+A1:2013 (E) – 12 –

1.6 Limits for change of resistance at tests

Table 7a – Limits for change of resistance at tests

Stability Limit of resistance change ∆R/R

class a a a
EN 60115-1 , EN 60115-1 , EN 60115-1 ,
4.23 Climatic 4.25.1 Endurance at 70 °C 4.13 Overload
sequence
4.16 Robustness of
4.24 Damp heat, terminations
steady state
4.18 Resistance to
4.25.3 Endurance at soldering heat
upper category
4.19 Rapid change
temperature
of temperature,
5 cycles
1 000 h Extended, 8 000 h 4.22 Vibration
c b b
2 ± (2 % R + 0,1 Ω) ± (0,5 % R + 0,05 Ω) ± (1 % R + 0,05 Ω) ± (0,5 % R + 0,05 Ω)
d b b
1 ± (1 % R + 0,05 Ω) ± (0,5 % R + 0,05 Ω) ± (1 % R + 0,05 Ω) ± (0,25 % R + 0,05 Ω)
0,5 ± (0,5 % R + 0,05 Ω) ± (0,5 % R + 0,05 Ω) ± (1 % R + 0,05 Ω) ± (0,1 % R + 0,02 Ω)
0,25 ± (0,25 % R + 0,05 Ω) ± (0,25 % R + 0,05 Ω) ± (0,5 % R + 0,05 Ω) ± (0,05 % R + 0,01 Ω)
0,1 ± (0,1 % R + 0,02 Ω) ± (0,1 % R + 0,02 Ω) ± (0,25 % R + 0,05 Ω) ± (0,05 % R + 0,01 Ω)
0,05 ± (0,05 % R + 0,01 Ω) ± (0,05 % R + 0,01 Ω) ± (0,1 % R + 0,02 Ω) ± (0,05 % R + 0,01 Ω)
a
EN 60115-1:2001 + A1:2001.
b
Tightening of the general definition of stability classes against the requirements of EN 140100:2008, 2.1.4.
c b
+(2 % R + 0,05 Ω)/-(0,5 % R + 0,05 Ω) for endurance at upper category temperature, see also .
d b
+(1 % R + 0,05 Ω)/-(0,5 % R + 0,05 Ω) for endurance at upper category temperature, see also .

Table 7b – Limits for change of resistance at tests

Stability Limit of resistance change ∆R/R

class a a a a
EN 60115-1 , EN 60115-1 , EN 60115-1 , EN 60115-1 ,
4.19 Rapid change 4.27 Single pulse 4.27 Periodic 4.40 Electrostatic
b
of temperature, high voltage electric discharge
≥ 100 cycles overload test overload
c
2
1 ± (0,5 % R + 0,05 Ω)
0,5
± (0,5 % R + 0,05 Ω) ± (1 % R + 0,05 Ω) ± (0,5 % R + 0,05 Ω)
0,25
0,1 ± (0,25 % R + 0,05 Ω)
0,05
a
EN 60115-1:2001 + A1:2001.
b
Human body model (HBM) according to EN 61340-3-1, 3 positive + 3 negative discharges.
c
Tightening of the general definition of stability classes against the requirements of EN 140100:2008, 2.1.4
 BS EN 140101-806:2008+A1:2013
– 13 – EN 140101-806:2008+A1:2013 (E)

1.7 Non-linear properties

If for resistors in the range 10 Ω ≤ R ≤ 10 MΩ measurement of non-linearity is required according to 2.1.2,

the measured values shall be above the limits given in the diagram below. The resistors shall be tested
according to IEC/TR 60440 where the test voltage shall be the rated voltage.

130 dB
Style D

Style C
120 dB
Style B
Attenuation of 3rd Harmonic A 3

Style A
110 dB

100 dB

90 dB

80 dB

70 dB

60 dB
10 Ω 100 Ω 1 kΩ 10 kΩ 100 kΩ 1 MΩ 10 MΩ
Resistance value R

Figure 3 – Limits of non-linearity in resistance

1.8 Tests related to soldering

1.8.1 Severities for solderability testing

Solderability testing shall be preceded by an accelerated ageing according to IEC 60068-2-20, Test Ta,
Ageing 3a: 4 h at 155 °C dry heat.

To prove the compatibility of resistors according to this specification with lead-free solder, e.g. SnCu,
SnCuNi, SnAg or SnAgCu, and traditional SnPb solder, solderability shall be tested with both types of solder.

a) Solderability with traditional SnPb solder shall be tested according to IEC 60068-2-20, Test Ta, solder
bath method, with the following conditions:
solder alloy: Sn60Pb40 or Sn63Pb37;
solder bath temperature: (235 ± 5) °C;
immersion time: (2 ± 0,2) s.
BS EN 140101-806:2008+A1:2013
EN 140101-806:2008+A1:2013 (E) – 14 –

b) Solderability with lead-free solder shall be tested according to IEC 60068-2-20, Test Ta, solder bath
method, with the following conditions:
solder alloy: Sn99,3Cu0,7;
solder bath temperature: (250 ± 5) °C;
immersion time: (3 ± 0,3) s,
or
solder alloy: Sn96,5Ag3,0Cu0,5;
solder bath temperature: (245 ± 5) °C;
immersion time: (3 ± 0,3) s.

1.8.2 Severities for testing resistance to soldering heat

The severity of the resistance to soldering heat test is determined by the peak temperature and by the
temperature slopes before and after the dwell time at the peak temperature. The choice of the solder alloy
from the range given below is not known to have any impact on the results of this test.

Resistance to soldering heat for a conventional SnPb soldering process and for a lead-free soldering process
shall be covered by one test and therefore tested according to IEC 60068-2-20, Test Tb, solder bath method
with the following conditions:
solder alloy: any alloy SnPb or SnCu or SnAgCu or SnAg;
solder bath temperature: (270 ± 5) °C;
immersion time: (10 ± 1) s.

1.9 Marking, packaging and ordering designation

1.9.1 Marking of the component

The resistor shall be marked with the rated resistance and tolerance on rated resistance according to
EN 60062:2005, 3.4 (colour code) or according to EN 60062:2005, 4.2 (alphanumeric code). Marking of the
temperature coefficient and of any other item from the list of EN 60115-1:2001 + A1:2001, 2.4.1 shall be the
choice of the manufacturer.

NOTE 0 Ω Resistors are marked with one black colour band or with the characters “000”.

1.9.2 Taping

Components may be taped or untaped.

Taping shall be in accordance with EN 60286-1.

1.9.3 Marking of the packaging

The packaging of the component shall be marked with ordering information in accordance to 1.9.4 and
additionally with

– CECC or IECQ sign of conformity,

– CECC or IECQ manufacturer code,
– NATO manufacturer code (only Version E, if required),
– date code of manufacture according to EN 60062.

Additional information is permissible.

 BS EN 140101-806:2008+A1:2013
– 15 – EN 140101-806:2008+A1:2013 (E)

1.9.4 Ordering information

Orders for resistors covered by this specification shall contain the following information:

– detail specification number;

– assessment level;
– style;
– temperature coefficient;
– rated resistance;
– tolerance on rated resistance;
– !failure rate level (only Version E, “E0” for Version A);"
– form of delivery, packaging method (in addition to the ordering information given in the examples below).

Example of the ordering information for 4,75 kΩ resistors:

Version A: EN140101–806EZBR4K75FE0

Version E (with failure rate level): EN140101–806EZBR4K75FE7

Example of the ordering information for 0 Ω resistors:

Version A: EN140101–806EZB–0R00–E0

Version E (with failure rate level): EN140101–806EZB–0R00–E7

The elements used in this ordering information have the following meaning:

EN140101–806 detail specification number;

EZ assessment level;

B style (see Table 1);

R temperature coefficient according to EN 60062 (see Table 4);

4K75 !resistance value, RKMG code system according to EN 60062, 4 characters;"

F tolerance on rated resistance (see Table 3a or Table 3b);

E0; E7 failure rate level according to EN 60115-1:2001 + A1:2001, Table ZB.1.

!The ordering information used for electronic order processing shall not contain any spaces."

1.10 Additional information (not for inspection purpose)

1.10.1 Storage

The permitted storage time is 20 years under the conditions of EN 60115-1:2001 + A1:2001, 2.7.

Solderability and resistance may be affected by storage. Therefore test of solderability and measurement of
resistance are recommended before delivery if the storage time exceeds two years.

1.10.2 Mounting

The resistors are suitable for mounting on all common printed boards and flexible foils.
BS EN 140101-806:2008+A1:2013
EN 140101-806:2008+A1:2013 (E) – 16 –

1.10.3 Soldering process

The resistors are suitable for all soldering methods according to EN 61760-1.

This includes full compatibility with

– lead-free solder, e.g. SnCu, SnCuNi, SnAg or SnAgCu,
– conventional SnPb solder.

1.10.4 Use of cleaning solvents

For the removal of flux residues the following agents may be used:
– alcohol, such as ethanol, propanol, isopropanol or butanol;
– aqueous solutions;
– deionized water.

Reaction time of the solvent shall not exceed 5 min.

Consultation with the resistor manufacturer is recommended if the use of other cleansing agents is intended.

1.10.5 Pulse load capability

1.10.5.1 General

The pulse load capability defines the ability of a resistor to withstand short overloads within the provided
working period. The pulse load capability is limited by the maximum pulse load Pi, max and the maximum
pulse voltage Ui, max both depending on a given pulse duration ti. The following condition shall be considered:

1.10.5.2 Average pulse power

The average pulse load P shall not exceed the rated dissipation P70 or the derated permissible dissipation
Pϑ according to Figure 2. For resistance values above the critical resistance the rated dissipation is
determined by the resistance value and the limiting element voltage Umax. The average pulse load is
calculated to
t2
1
P =
tp ⋅ R ∫ u ²(t )dt
t1
(1)

with ti = t2 – t1.

a) Rectangular pulse
For rectangular pulses the average pulse load is calculated to

1
P = ⋅ U i,2peak ⋅ t i (2)
tp ⋅ R

b) Exponential pulse
For exponential pulses the average pulse load is calculated to

1 τ
P = ⋅ U i,2peak ⋅ e (3)
tp ⋅ R 2

with τe = R⋅C or τe = L/R.

 BS EN 140101-806:2008+A1:2013
– 17 – EN 140101-806:2008+A1:2013 (E)

Figure 4 provides a further explanation of the pulse parameters.

Ui Ui
Ui, peak Ui, peak

tP

τe
ti 0,37 • Ui, peak

t1 t2 t t

Figure 4 – Pulse parameter for rectangular and exponential pulses

c) Other pulse shapes
Other pulse shape should be converted into a rectangular pulse having the same energy at given peak
voltage.

1.10.5.3 Pulse power Pi,max for continuous pulses

The permissible pulse load for continuous pulses as shown in Figure 5 is applicable to resistors R ≥ 10 Ω
under the following conditions:

– mean dissipation P ≤ Pϑ , where Pϑ is the dissipation permissible according to Figure 2;

– pulse voltage Ui,peak ≤ Ui,max, with Ui,max according to Figure 7

100 W
Style C

Style D
Style B
Permissible pulse power P i,max

Style A
10 W

1W

0,1 W
10 µs 100 µs 1 ms 10 ms 100 ms 1s 10 s
Pulse duration t i

Figure 5 – Maximum permissible pulse load Pi,max for continuous pulses

1.10.5.4 Pulse power Pi,max for single pulse

The permissible pulse load for single pulses as shown in Figure 6 is applicable to resistors R ≥ 10 Ω under
the following conditions:

– mean dissipation P → 0 ;
– number of pulses n < 1 000;
– pulse voltage Ui,peak ≤ Ui,max, with Ui,max according to Figure 7.
BS EN 140101-806:2008+A1:2013
EN 140101-806:2008+A1:2013 (E) – 18 –

1 000 W

Style C
100 W
Permissible pulse power P i,max

Style D
Style B

Style A

10 W

1W

0,1 W
10 µs 100 µs 1 ms 10 ms 100 ms 1s 10 s
Pulse duration t i

Figure 6 – Maximum permissible pulse load Pi,max for single pulses

1.10.5.5 Pulse voltage

For high ohmic resistors the pulse load capability is limited by the maximum pulse voltage as shown in
Figure 7.

10 000 V
Permissible pulse voltage U i,max

Style C, D

Style B
1 000 V
Style A

100 V
10 µs 100 µs 1 ms 10 ms 100 ms 1s 10 s
Pulse duration t i

Figure 7 – Maximum permissible pulse voltage Ui,max

NOTE The curves of this graph are described by the following equation:

2,5 ⋅ U max
U i, max = + U max (4)
1+ ti ⋅ K
-1
with K = 100 s .
 BS EN 140101-806:2008+A1:2013
– 19 – EN 140101-806:2008+A1:2013 (E)

1.10.5.6 Permitted change in resistance at pulse loads

The permissible pulse load is determined by the resistance changes as given in Table 7 for the extended
endurance test (8 000 h).

1.10.6 Variation of resistance value (drift) for life times up to 200 000 h

1.10.6.1 Lifetime assessment

Resistors described in this specification do not feature a limited lifetime when operated within the limits
defined in this specification. However, resistance value drift increasing over operating time may lead to a
situation where the observed drift exceeds an amount acceptable to a specific application, hence rendering
that particular application malfunctioning or inoperational. The predictability of resistance drift may be used to
assess a functional lifetime as the time required for the drift to increase to the considered critical amount.
This assessment is not only related to the resistor, but strongly depends on the load applied to the resistor
and on the conditions and requirements of the particular application.

1.10.6.2 Extended operating time

For an operating time > 8 000 h the surface temperature ϑs = 125 °C or the upper category temperature
(UTC), whichever is lower, should not be exceeded. The surface temperature ϑs may be found by
measurement or by the calculation based upon the thermal properties of the resistor in its circuit board and
its application environment.

1.10.6.3 Estimation of maximum drift

For a different operating time and surface temperature the expected maximum drift of the resistance value
may be estimated by

∆R
(t, ϑs ) ≤ M ⋅ ∆R (1 000 h, UCT ) (5)
R R

with the drift factor M to be determined from the relevant diagram below.

10
Drift factor M

0,1
40 °C 60 °C 80 °C 100 °C 120 °C 140 °C 160 °C
Surface temperature ϑ s

Figure 8a – Drift factor for UCT = 155 °C

BS EN 140101-806:2008+A1:2013
EN 140101-806:2008+A1:2013 (E) – 20 –

10

Drift factor M

0,1
40 °C 60 °C 80 °C 100 °C 120 °C 140 °C 160 °C
Surface temperature ϑ s

Figure 8b – Drift factor for UCT = 125 °C

10
Drift factor M

0,1
40 °C 60 °C 80 °C 100 °C 120 °C 140 °C 160 °C
Surface temperature ϑ s

Figure 8c – Drift factor for UCT = 85 °C

NOTE The curves of these graphs are described by the following equation:

ϑs −ϑref
t
M = 2 30 ⋅3 (6)
t ref
with ϑref = UCT
tref = 1 000 h
 BS EN 140101-806:2008+A1:2013
– 21 – EN 140101-806:2008+A1:2013 (E)

1.10.6.4 Negative resistance change

Negative change in resistance is

∆R ≥ – (0,5 % R + 0,05 Ω) (7)

regardless of the operation time.

1.10.7 Current noise

Current noise of resistors according to this specification shall be measured according to EN 60115-1:2001 +
A1:2001, 4.12, and should not exceed the limits as given in the following diagram.

10 µV/V

1 µV/V
Current Noise A 1

0,1 µV/V

0,01 µV/V
100 Ω 1 kΩ 10 kΩ 100 kΩ 1 MΩ 10 MΩ 100 MΩ
Resistance value R

Figure 9 – Current noise

2 Quality assessment procedures

2.1 General

2.1.1 Zero defect approach

This specification fulfils the requirements of the zero defect approach. The new assessment level EZ is
introduced to align the assessment procedures and levels with current industry practices. Therefore

− the agreed number of permissible non-conforming items (acceptance number) used in fixed sample size
schedules and in test schedules for Quality conformance inspections together with the AQL figures in
lot-by-lot schedules are replaced by the acceptance number “0”;
− the sample size for lot-by-lot testing will be determined from IEC 60410 by directly allotting the code
letter for sample size selected from Table I to Table II.

For the interpretation of sampling plans see EN 60115-1:2001 + A1:2001, Annex A.

BS EN 140101-806:2008+A1:2013
EN 140101-806:2008+A1:2013 (E) – 22 –

2.1.2 100 % Test

All resistors according to this specification are subject to a 100 % test during the manufacturing process. The
following tests shall be performed.

2.1.2.1 Resistance value and tolerance

Resistance value and tolerance on rated resistance shall be measured according to EN 60115-1, 4.5.
This test shall be followed by re-inspection by sampling in order to monitor outgoing quality level, to be
expressed in non-conforming units per million (ppm). The sampling level shall be established by the
manufacturer. For the calculation of the ppm values all non-conforming units shall be considered.
A lot shall not be released if one ore more non-conforming units occur in the sample.

2.1.2.2 Reduction of early-failure rate

One of the following methods shall be applied to resistance values ≥ 10 Ω in order to reduce the early-failure
rate:
− overload test according to the manufacturer specification; specification and limits agreed by the !IECQ
Certification Body;"
− non-linearity A3 measured according to EN 60115-1, 4.10 with limits given in 1.7.

2.1.3 0 Ω Resistors

All tests described in Annex A shall be carried out for 0 Ω resistors, except the tests
− Temperature characteristic of resistance
− Single pulse high voltage overload test

For 0 Ω resistors the following alterations shall apply to Table A.1 and Table A.2:
− in column “Conditions of test”,
the maximum current given in Table 2d shall be used where rated voltage is required;
− in column “Performance requirements”,
compliance with the maximum resistance value as given in Table 2d shall be used where electrical
requirements of Table 7a or Table 7b are referenced.
2.1.4 Certificate of Conformity (CoC)

The conformity is declared by marking the packaging in accordance to the relevant system rules if
components are qualified to this specification by a certification body of a quality assurance system (e.g.
IECQ-CECC) .

An additional Certificate of Conformity is not required for qualified components.

2.1.5 Certified test records

Certified test records according to EN 60115-1:2001 + A1:2001, 3.9 can be supplied if agreed between the
customer and the manufacturer.

2.1.6 Failure rate level

Components qualified to this detail specification, Version E, shall be delivered with a failure rate level:

Failure rate level = E5 or E6 or E7 or E8.

Components qualified to this detail specification, Version A, shall be delivered without a failure rate level:

Failure rate level = E0.

 BS EN 140101-806:2008+A1:2013
– 23 – EN 140101-806:2008+A1:2013 (E)

The procedure according to EN 60115-1:2001 + A1:2001, Annex ZB shall be applied for the determination
and qualification of the failure rate level and for the evaluation of the quality factor (πQ).

2.2 Qualification ap:proval

The fixed sample size procedure (see EN 60115-1:2001 + A1:2001, 3.5.3 (2)) shall be used for the
Qualification approval. The qualification is to be performed according to Annex A.

2.2.1 Version A

The Qualification approval for Version A shall be granted after successful completion of 1 000 h of the test
Endurance at 70 °C and all other tests of Annex A.

2.2.2 Version E

The Qualification approval for Version E, failure rate level E5 shall be granted after successful completion of
1 000 h of the test endurance at 70 °C and all other tests of Annex A.

Thereafter, the Qualification approval for Version E, failure rate level E6 shall be granted after successful
completion of 8 000 h of the test Endurance at 70 °C.

The Qualification approval for Version E shall be withdrawn, if the 8 000 h test is not completed successfully.

2.3 Quality Conformance Inspection

The quality of the components according to this detail specification is monitored using one of the following
quality evaluation procedures.

The Certificate of Approval shall state which quality evaluation procedure is used by the manufacturer.

2.3.1 Qualification Approval according to IEC QC 001002-3, Clause 3

For Quality conformance inspection the test schedule shown in Annex A includes provisions for periodicity,
sampling and requirements. Inspection lots shall be formed according to EN 140100:2008, 3.1.2.

2.3.2 Technology approval according to IEC QC 001002-3, Clause 6

If the manufacturer is certified according to CECC 240 001:1996, Technology approval schedule, the
following modifications and amendments apply to the lot-by-lot tests of Annex A.

The tests of groups A and B may be performed during the production process according to the established
Technology approval declaration document (TADD) of the manufacturer if equivalence of test results is
confirmed by the !IECQ Certification Body (IECQ CB)" .

The manufacturer’s TADD shall specify

− type and degree of non-conformity on which the !IECQ CB" shall be informed by the Designated
Management Representative (DMR), and permissible protraction period for this information,
− conditions for the withdrawal of the Technology approval,
− corrective actions for non-conformities.

As required by CECC 240 001:1996, 6.2, test results shall be continuously documented.
BS EN 140101-806:2008+A1:2013
EN 140101-806:2008+A1:2013 (E) – 24 –

2.3.3 Non-conforming items

All tests of a sub-group shall be repeated on a new sample if one non-conforming item is obtained during
Quality conformance inspection tests. Then no non-conforming items are permitted. Release of product may
continue during repeat testing.

For mounted specimen, any specimen found defective after mounting shall not be taken into account when
calculating the permissible non-performing items for the succeeding tests. They shall be replaced by spare
parts.
 Annex A
(normative)

Fixed sample size Qualification Approval and Quality Conformance Inspection test schedule
for fixed low power film resistors

Table A.1 – Test schedule for Qualification Approval and Quality Conformance Inspection, lot-by-lot tests, assessment level EZ

Qualification Quality
ASSESSMENT LEVEL EZ, ACCEPTANCE NUMBER C = 0 Approval Conformance
Inspection

a D or (Lot-by-lot tests) a
Tests Conditions of test b Performance requirements
ND b b b b
n c IL c
Group 1 Group A1
4.5 Resistan c
ND 260 / 355 0 100 % (see 2.1.2) As in 4.5.2
lue
Group 2 Group A2
– 25 –

d c c
4.4.1 Visual examination See 2.4.1 Marking ND 260 / 355 0 S-4 / II 0 As in 4.4.1
d (20 of the
4.4.2 Dimensions (gauging) A gauge plate of 4 mm according to S-4 0 As in Table 1
sample)
IEC 60294 shall be used
Group 3 Group B1
4.6 Insulation resistance See 4.6.1.1, V-block method ND 50 0 R ≥ 1 GΩ
4.7 Voltage proof See 4.6.1.1, V-block method S-3 0
Voltage: U = 1,4 ⋅ Uins
Duration: 1 min As in 4.7.3
EN 140101-806:2008+A1:2013 (E)
BS EN 140101-806:2008+A1:2013
 Qualification Quality
Approval Conformance
Inspection

a D or (Lot-by-lot tests) a
Tests Conditions of test b Performance requirements
ND b b b b
n c IL c
4.13 Overload Mounting: see EN 140100:2008, 2.4.3 D (20 of the
sample)
or unmounted

Voltage: U = 2,5 ⋅ P70 ⋅ R or U = 2 ⋅ U max ,

whichever is the less severe
Style Duration
EN 140101-806:2008+A1:2013 (E)
BS EN 140101-806:2008+A1:2013

A 2s
B 5s
C 10 s
D 10 s
Visual examination As in 4.13.3
– 26 –

Resistance value As in Table 7a

Group 4 Group B2
D 40 0 0
4.17 Solderability Ageing 4 h at 155 °C, dry heat (Half of the S-3
sample)
Method 1: Solder bath
Solder: Sn60Pb40
(235 ± 5) °C, (2 ± 0,2) s
Visual examination As in 4.17.3.2,
> 95 % of the surface shall be
covered by new solder
 Qualification Quality
Approval Conformance
Inspection

a D or (Lot-by-lot tests) a
Tests Conditions of test b Performance requirements
ND b b b b
n c IL c
4.17 Solderability Ageing 4 h at 155 °C, dry heat (The other S-3
half of the
Method 1: Solder bath (Group B2b)
sample)
Solder: Sn99,3Cu0,7
(250 ± 5) °C, (3 ± 0,3) s
or
Solder: Sn96,5Ag3Cu0,5
(245 ± 5) °C, (3 ± 0,3) s
Visual examination As in 4.17.3.2,
> 95 % of the surface shall be
covered by new solder
Group B3
4.8 Variation of resistance 20 °C / LCT / 20 °C / UCT / 20 °C D S-3
– 27 –

with temperature
Resistance value As in Table 4
(Only for resistors with
a temperature
coefficient lower than
-6
± 50 ⋅ 10 /K)
a
Clause numbers in this column refer to EN 60115-1:2001 + A1:2001.
b
For list of abbreviations refer to B.2.
c
First figure is sample size for Version A; second figure is sample size for Version E.
d
For Quality conformance inspection this tests may be replaced by in-production testing if the manufacturer installs SPC on dimensional measurements or other mechanisms to
void parts exceeding limits.
EN 140101-806:2008+A1:2013 (E)
BS EN 140101-806:2008+A1:2013
 Table A.2 – Test schedule for Qualification Approval and Quality Conformance Inspection, periodic tests, assessment level EZ

Qualification Quality Conformance

Approval Inspection

a
D or Periodic tests a
Tests Conditions of test b Performance requirements
ND b b b b b
n c P n c
Group 5 Group C1
D 20 0 3 20 0
4.16 Robustness of Tensile, bending and torsion tests (half of 0 3 (half of 0
the the
terminations sample) sample)
Visual examination As in 4.16.6.a
EN 140101-806:2008+A1:2013 (E)
BS EN 140101-806:2008+A1:2013

Resistance value As in Table 7a

4.19 Rapid change of ϑA = LCT, ϑB = UCT (see Table 6) (the other (the other
half of the half of the
temperature 5 cycles sample) sample)
Visual examination As in 4.19.3
Resistance value As in Table 7a
– 28 –

4.22 Vibration As in EN 60068-2-6:1995, 8.2.1:

Mounting of the specimen in such a way
that they are not exposed to resonances.
Frequency range: 10 Hz to 2 000 Hz
Amplitude: 1,5 mm or 200 m/s², whichever
is the less severe
10 sweep cycles in each axis
Visual examination As in 4.22.4
Resistance value As in Table 7a
 Qualification Quality Conformance
Approval Inspection

a
D or Periodic tests a
Tests Conditions of test b Performance requirements
ND b b b b b
n c P n c
4.23 Climatic sequence (all of the (all of the
sample) sample)
- Dry heat 16 h at UCT (see Table 6)
- Damp heat, cyclic 1 cycle at +55 °C
- Cold 2 h at LCT (see Table 6)
- Low air pressure 1 h / 1 kPa at +15 °C to +35 °C
- Damp heat, cyclic 5 cycles at +55 °C
- D.C. load Voltage: U = P70 ⋅ R or U = Umax ,
whichever is the less severe, 1 min
- Final measurements Visual examination As in 4.23.8
Resistance value As in Table 7a
Insulation resistance, V-block-method R ≥ 100 MΩ
– 29 –

Group 6 Group C2
4.25.1 Endurance at 70 °C Mounting: see EN 140100:2008, 2.4.2 D 20 / 0 3 20 0
c
or 2.4.3 115

Voltage: U = P70 ⋅ R or U = U max ,

whichever is the less severe
1,5 h on and 0,5 h off; duration 1 000 h
Visual examination As in 4.25.1.7
Resistance value As in Table 7a
Insulation resistance, V-block-method R ≥ 1 GΩ
4.25.1.8 Extended Duration extended to 8 000 h once a year 0 (12) (20) 0
endurance
Examination at 4 000 h (for information
only)
Resistance value As in Table 7a
EN 140101-806:2008+A1:2013 (E)
BS EN 140101-806:2008+A1:2013
 Qualification Quality Conformance
Approval Inspection

a
D or Periodic tests a
Tests Conditions of test b Performance requirements
ND b b b b b
n c P n c
Group 7 Group C3
4.18 Resistance to soldering As in 4.18.2 a): D 20 0 3 20 0
heat Solder bath method,
(270 ± 5) °C, (10 ± 1) s
Visual examination As in 4.18.3
Resistance value As in Table 7a
EN 140101-806:2008+A1:2013 (E)
BS EN 140101-806:2008+A1:2013

4.35 Flammability As in EN 60695-11-5 (5 of the 36 (5 of the

sample) sample)
Duration: 10 s Burning time: max. 30 s
Group 8 Group D1
4.8 Variation of resistance 20 °C / LCT / 20 °C / UCT / 20 °C D 20 0 12 20 0
– 30 –

with temperature
Resistance value As in Table 4
Group 9 Group D2
4.24 Damp heat, steady As in EN 60068-2-78, Test Cab: D 20 0 12 20 0
state Temperature: (40 ± 2) °C
Relative humidity: (93 ± 3) %
Duration: 56 days
Visual examination As in 4.24.4
Resistance value As in Table 7a
Insulation resistance, V-block-method R ≥ 100 MΩ
Group 10 Group D3
4.4.3 Dimensions (detail) D 20 0 36 20 0 As in Table 1
4.25.3 Endurance at upper Duration: 1 000 h
category temperature
Visual examination As in 4.25.3.7
Resistance value As in Table 7a
Insulation resistance, V-block-method R ≥ 1 GΩ
 Qualification Quality Conformance
Approval Inspection

a
D or Periodic tests a
Tests Conditions of test b Performance requirements
ND b b b b b
n c P n c
4.14 Temperature rise Mounting: see EN 140100:2008, 2.4.2 (6 of the (6 of the
sample) sample)
(Only for 0 Ω resistors
and for resistors below
the critical resistance
value) As in Table 5
Group 11 Group E1
4.40 Electrostatic discharge Human body model (HBM) as in D 20 0 12 20 0
EN 61340-3-1
3 positive and 3 negative discharges
Style Voltage
A 2 000 V
B 4 000 V
C 5 000 V
– 31 –

D 6 000 V
Visual examination As in 4.27.3.7.1
Resistance value As in Table 7b
4.29 Component solvent Solvent: Ethanol (half of (half of
the the
resistance Temperature: 50 °C
sample) sample)
Method 2
Visual examination As in 4.4.1
4.30 Solvent resistance of Solvent: Ethanol (the other (the other
half of the half of the
marking Temperature: 50 °C sample) sample)
(marked resistors only) Method 1, tooth brush
Visual examination As in 4.4.1
EN 140101-806:2008+A1:2013 (E)
BS EN 140101-806:2008+A1:2013
 Qualification Quality Conformance
Approval Inspection

a
D or Periodic tests a
Tests Conditions of test b Performance requirements
ND b b b b b
n c P n c
Group 12
4.37 Periodic electric Mounting: see EN 140100:2008, 2.4.3 D 20 0
overload or unmounted

Voltage: U = 15 ⋅ P70 ⋅ R or U = 2 ⋅ U max ,

whichever is the less severe
0,1 s on and 2,5 s off; 1 000 cycles
EN 140101-806:2008+A1:2013 (E)
BS EN 140101-806:2008+A1:2013

Visual examination As in 4.37.4

Resistance value As in Table 7b
Group 13 Group F
4.19 Rapid change of ϑA = LCT, ϑB = UCT (see Table 6) D 20 0 36 20 0
– 32 –

temperature
Style Cycles
A 500
B 200
C 100
D 100
Visual examination As in 4.19.3
Resistance value As in Table 7b
Group 14 Group G
4.27 Single pulse high Severity No. 4 (10/700) D 20 0 12 20 0
voltage overload test
Visual examination As in 4.27.3.7.1
Resistance value As in Table 7b
a
Clause numbers in this column refer to EN 60115-1:2001 + A1:2001.
b
For list of abbreviations refer to B.2.
c
First figure is sample size for Version A; second figure is sample size for Version E.
 BS EN 140101-806:2008+A1:2013
– 33 – EN 140101-806:2008+A1:2013 (E)

Annex B
(informative)

Letter symbols and abbreviations

B.1 Letter symbols

A1 Current noise index for one frequency decade, geometrically centered at 1 000 Hz µV/V
A3 Attenuation of the third harmonic (Ratio of the fundamental voltage over the e.m.f. dB
of the third harmonic generated in a resistor)
C Capacitance F
Imax Maximum permissible current A
L Inductance H
M Drift factor —
P Actual dissipation W
P70 Rated dissipation at 70 °C ambient temperature W
Pϑ Permissible dissipation at ambient temperature ϑ, derated above 70 °C W
P Average pulse load W
Pi, max Permitted pulse power depending on pulse duration ti W
Pi, peak Peak pulse power W
R Resistance value Ω
Rins Insulation resistance Ω
Rn Nominal resistance value Ω
Rr max Maximum permissible residual resistance Ω
∆R Change of resistance Ω
∆R/R Relative change of resistance (Resistance change related to prior resistance value) %
ϑa Ambient temperature °C
ϑA Low temperature of a change of temperature test °C
ϑB High temperature of a change of temperature test °C
ϑs Surface temperature °C
ta Duration of application of test flame s
tb Duration of burning after removal of test flame s
ti Pulse duration s
tp Pulse period s
Tr Temperature rise K
τe Time constant s
Uins Insulation voltage V
Ui, max Permitted pulse voltage depending on pulse duration ti V
Ui, peak Peak pulse voltage V
Umax Limiting element voltage, maximum permissible voltage V
Ur Rated voltage, U r = P70 ⋅ R V
 BS EN 140101-806:2008+A1:2013
EN 140101-806:2008+A1:2013 (E) – 34 –

B.2 Abbreviations
c Group acceptance criteria (permitted number of non-conformities per group)
CoC Certificate of Conformity
D Destructive
DMR Designated management representative (Quality system manager)
ESD Electrostatic discharge
HBM Human body model, representation of the capacitance and resistance of a human body for ESD
testing
!IECQ CB IECQ Certification Body"
IL Inspection level
LCT Lower category temperature
n Sample size
ND Non-destructive
NSI National supervising inspectorate
!NOTE 1 IECQ 01, IEC Quality Assessment System for Electronic Components (IECQ Scheme) - Basic Rules, has implemented in
its 2007-12 revision a change of the term Supervising Inspectorate to IECQ Certification Body (IECQ CB).

ONS Organisme National de Surveillance (National Supervising Inspectorate)

NOTE 2 This term has been used in specifications prior to the using the term National Supervising Inspectorate (NSI).

p" Periodicity, given in months

!RKMG code Coding system for resistance values, where the SI prefix indicating the decimal multiple of the
system unit Ohm is used to replace the decimal sign.
3
NOTE 3 The code characters R, K, M, G are written in upper case, even though the SI prefix for kilo (10 ) is a lower case k.

NOTE 4 The RKMG code system is not prescribed to provide a code of a fixed length. However, trailing zeros can be used to fill to a
fixed length, if required."

TA Technology approval
TAS Technology approval schedule
TADD Technology approval declaration document
TCR Temperature coefficient of resistance
UCT Upper category temperature
 BS EN 140101-806:2008+A1:2013
– 35 – EN 140101-806:2008+A1:2013 (E)

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