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Semiconductor
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Parametric
Characterization
Basic Training - Part 1
Cursos • 7 Itens

Learn about the basics of semiconductor parametric testing focusing on

device and process parameters rather than testing functional products.
Learn:

Source/Measure Units (SMUs) for Parametric

Test Tips for Making Accurate Low-Level Measurements
Keysight B2900B/BL SMU, E5207B I/V Analyzer, B1500A
Semiconductor Device Analyzer, B1506A Power Device Analyzer for
Circuit Deisgn

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Lessons
Lesson 1 - What is
Semiconductor…
Introduces the concept of
capacitance in semiconductor
devices and discusses the…

Lesson 2 -
Measurement…
Discusses the different
methods that can be used to
measure capacitance,…

Lesson 3 -
Source/Measure…
Provides a detailed overview of
the quasi-static method for
measuring capacitance.
Lesson 4 - Tips for
Making Accurate…
A detailed overview of the
high-frequency method for
measuring capacitance.

Lesson 5 - SMU
Portfolio
Discusses the different
components that are required
to create a complete CV-IV…

Lesson 6 -
Summary and…
Summary of the key concepts
covered in the course and
provides links to additional…
 Notas de Aplicação

The Parametric
Measurement
Preface
“An expert is a man who has
made all the mistakes, which
can be made, in a very narrow
field” — Niels Bohr

Related Content

hardware

B1500A Semiconductor Device Parameter Analyzer /

Semiconductor Characterization System Mainframe

Keysight B1500A Semiconductor Device Parameter Analyzer is

complete device characterization solution supporting versatile
measurement capabilities for IV, CV and leading-edge fast pulsed IV
measurement with uncompromised measurement reliability.

How to Characterize Low-Power Integrated Circuits

Use an SMU with integrated pulser / digitizer and IV curve

measurement software to characterize low-power ICs

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