PH5074: Thin Film and Low Temperature

Physics Laboratory
EXPT. 04: Resistance measurement of a conducting
material at low temperature.

By PRIYANSHU PANDA
417PH5030
DEPT. OF PHYSICS & ASTRONOMY

SUPERVISED BY: PROF. PRAKASH NATH VISHWAKARMA

DEPT. OF PHYSICS & ASTRONOMY
1. Objective:
To study resistance measurement of a conducting material at low temperature.

2. Apparatus Required:
• DC power supply
• DC Ammeter
• DC Voltmeter
• current probe
• superconducting sample (YBCO)

3. Observations:

Sr No. Temp. (K) R (μΩ)

1 5 0.000655
2 10 0.000825
3 15 0.000782
4 20 0.000259
5 25 0.000295
6 30 0.000139
7 35 0.00012
8 40 0.000129
9 45 0.0002
10 50 0.000289
11 55 0.000145
12 60 0.000299
13 65 0.000138
14 70 0.000399
15 75 0.001
16 76 0.0019
17 77 0.00359
18 78 0.00642
19 79 0.01013
20 80 0.015
21 81 0.02148
22 83 0.02957
23 85 0.04241
 24 87 0.06128
25 90 0.11491
26 95 0.12214
27 100 0.12597
28 110 0.12978
29 120 0.13265
30 130 0.13509
31 140 0.13754
32 150 0.13945
33 160 0.14125
34 170 0.14322
35 180 0.14487
36 190 0.14649
37 200 0.14816
38 210 0.14999
39 220 0.15168
40 230 0.15335
41 240 0.15533
42 250 0.15712
43 260 0.15889
44 270 0.16101
45 280 0.16295
46 290 0.16494
47 300 0.16732

4. Plots:
4.1. Resistance vs Temperature:
5. Conclusion:
The temperature dependence of resistance was measured for YBCO
superconductor, illustrating the two mechanisms contributing to resistance:
availability of charge carriers and ability of charge carriers to move unimpeded
through the solid. The resistivity of the copper sample was controlled by the
latter effect, which caused its resistance to decrease as we decreased the
temperature and thus the number of phonon vibrations.