LCOE

Metrology for future HV transmission: HV

measuring techniques: course &workshop.
24 May 2023

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Laboratory PD Measuring systems in accordance

with IEC 60270. Wideband and narrowband partial
discharge methods. Calibration. Expected
uncertainty of PD measurements in the laboratory.
Abderrahim Khamlichi

24/05/2023. Rev. 1
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PARTIAL DISCHARGE MEASUREMENTS
“Measurement of partial discharges which occur in electrical apparatus,
components or systems when tested with alternating voltages up to 400 Hz or
with direct voltage”

 IEC 60270:2000: High-voltage test techniques - Partial discharge measurements.

 IEC 60270:2000/AMD1:2015: Amendment 1 - High-voltage test techniques -

Partial discharge measurements.

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Content

I. Test Circuit: 4.2 + PD Measuring System (PDSM): 4.3

II. 3.3.1 Apparent charge q
III. 4.3.2 Coupling Device (CD)
IV. PD Measuring Instruments (Digital PD instrument)
V. PD Measuring Instruments (f1, f2, Tr)
VI. PD Charge: PD current pulse integration
VII. PD Charge: Quasi-integration method
VIII. 5. Calibration of a measuring system in the complete test circuit
IX. Reducing integration errors for Wide-band PD instruments
X. 7 Maintaining the characteristics of calibrators and measuring systems
XI. Measuring uncertainty: Some of contributing factors
XII. Measuring uncertainty: PD pulse waveshape & quasi-integration method error

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PD measurements according to IEC 60270
Test Circuit: 4.2 + PD Measuring System (PDSM): 4.3
Basic PD Test Circuits sufficiently low level of PD
Ca: Test object equivalent capacity.
CD in series with Ck
Z Ck :Coupling capacitor (low inductance)/2nd test object Ca1
Z: Filter to avoid interferences from
Ck
the high-voltage source. PDSM
U~ Ca
CC
Zmi: input impedance of PDMS
CC Zmi CD MI
CD MI
OL

CD in series with Ca OL

Z Coupling Device (CD): active or

passive four terminal network
Ca (“quadrupole”)
U~ Ck

CC
Transmission System:
CD MI Connecting cable (CC) /
OL
optical link (OL)
24/05/2023. Rev. 1 Measuring Instrument (MI)
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PD measurements according to IEC 60270
3.3.1 Apparent charge q
apparent charge q
of a PD pulse is that charge which, if injected within a very short time between the
terminals of the test object in a specified test circuit, would give the same reading
on the measuring instrument as the PD current pulse itself. The apparent
charge is usually expressed in picocoulombs (pC).
NOTE The apparent charge is not equal to the amount of charge locally involved at the site of the
discharge, which cannot be measured directly.

q
Ck
uR=q(pC)
Ca U1 uR
CC
CD MI

OL

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PD measurements according to IEC 60270
um  Z mi  im
4.3.2 Coupling Device (CD) im
- Active or passive four terminal network (“quadrupole”). Z CD um
mi

- Converts the input currents im to output voltage signals um.

- The frequency response, defined by output voltage to input current. Normally
chosen to effectively prevent the test voltage frequency and its harmonics
2
from reaching the instrument.
10
quadrupole 3
im
Ck
Zm()

quadrupole 2
Rm um
quadrupole 1 Lm
1
10 Cm

4 5 6 7
10 10 f (Hz) 10 CC 10
CD MI
24/05/2023. Rev. 1 RMI
um is affected by the MI input impedance RMI 7
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PD measurements according to IEC 60270
PD Measuring Instruments (Digital PD instrument)
(a) Attenuator (c) Band-pass filter
(b) Amplifier (d), (e) Analog/Digital converters
Digital
signal
Direct A/D A D
processing
Storage
Evaluation
&
conversion of memory Visualization
Phase unit
the PD input (a) (b) (c) (d) Sinchroni‐
(g)
zation
pulses Control
AC A D
PD Voltage
Pulse signal (f)
(e)

(c) Digital Band-pass filter

(h) Numerical integrator
Digital
signal
A/D conversion
after integration
A D
 processing
Storage
memory
Evaluation
&
Visualization
Phase unit
of the PD pulses (a) (d) (c’) (h) Sinchroni‐
(g)
zation
Control
AC A D
PD
24/05/2023. Rev. 1 Voltage
signal (f)
Pulse
(e) 8
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PD measurements according to IEC 60270
PD Measuring Instruments (f1, f2, Tr)
3.9.1 Transfer impedance Z(f): ratio of the output voltage amplitude to a constant
input current amplitude, as a function of frequency f, when the input is sinusoidal
Z(f)
4.3.4 Wide-band PD instruments -6 dB
In combination with (CD)

30 kHz ≤ f1 ≤ 100 kHz f

130 kHz ≤ f2 ≤1,000 kHz (500kHz*)

100 kHz ≤ f ≤ 900 kHz (400kHz*) f1 f2
f1 lower frequency & f2 upper frequency (see 3.9.2)

4.3.5 Wide-band PD instruments Wideband amplifier + Electronic integrator:

with active integrator Typical time constant 1s
Z(f)
4.3.6 Narrow-band PD instruments -20 dB

9 kHz ≤ f ≤ 30 kHz f
50 kHz ≤ fm ≤ 1,000 kHz
* For IEC 60270:2000 fm–f/2= f1 fm f2= fm+f/2
24/05/2023. Rev. 1
fm midband frequency & f bandwith (see 3.9.2) 9
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PD measurements according to IEC 60270
PD Measuring Instruments (f1, f2, Tr)
3.9.5
pulse resolution time Tr
shortest time interval between two consecutive input pulses of very short duration, of
same shape, polarity and charge magnitude for which the peak value of the resulting
response will change by not more than 10 % of that for a single pulse. The pulse
resolution time is in general inversely proportional to the bandwidth f of the
measuring system. It is an indication of the measuring system's ability to resolve
successive PD events.
NOTE It is recommended that the pulse resolution time be measured for the whole test circuit, as well as for
the measuring system, as superposition errors can be caused by the test object, for example reflections from
cable ends. The relevant technical committees should specify the procedure for handling superposition errors
and particularly, the allowable tolerances including their signs.
T<Tr
T>Tr

q q q q q

24/05/2023. Rev. 1 |qreading –q|  0.1·|q| |qreading –q| > 0.1·|q|

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PD measurements according to IEC 60270
PD Charge: PD current pulse integration
i(t) = current signal representing a PD pulse
t
q(t) = PD pulse charge as a function of time q( t )  0 i( t )  d
i( t )  I(  )   2   f
I() = Fourier transform of i(t) q( t )  Q(  )  I(  ) j
1

0.8

0.6
q = Total PD pulse charge

i(pu)
0.4

0.2
Time domain integration
0
 -50 0 50 100 150 200 250 300 350 400 450 500
q   i( t )  d t (ns)
0
0 I(0)
Frequency domain integration
Normalized |I(f)|

10

q  lim  j  Q(  )  lim I(  )  I( 0 ) -1
 0  0 10

fc
-2
10 3 4 5 6 7 8
10 10 10 10 10 10
24/05/2023. Rev. 1 f (Hz)
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PD measurements according to IEC 60270
PD Charge: Quasi-integration method
0
PD pulse spectrum
10 Ideal band-pass filter

um uf
Normalized |I(f)|

-1
10
f
PD pulse polarity
can be determined
-2
10 f f f
1 m
2 for wide-band PD
3 4 5 6 7 8 instruments
10 10 f-fm 10 f+fm 10 f (Hz) 10 10
Wide-band filter
1
Peak value of output filter
Filtered signal uf(t)

0.5

uf_peak is proportional to the 0

total PD pulse charge q -0.5

-25 -20 -15 -10 -5 0 5 10 15 20 25
t(s)
Narrow-band filter

u f _ peak  2  ( f 2  f1 )  Z mi  q
1
Filtered signal uf(t)

-1
24/05/2023. Rev. 1 -25 -20 -15 -10 -5 0
t(s)
5 10 15 20 25

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PD measurements according to IEC 60270
5. Calibration of a measuring system in the complete test circuit
100 pC Ca  Ck (recomended) Ck  1nF For aceptable sensitivity
4
PD calibration pulse duration  30ns
C0  0.1·Ca Not for high voltaje C0 if left in the test circuit
q0 U1 
C0
U 0
i(mA)

2 Z
C0
C0   Ca  Ck 
q0
0 U0 Ck C0
0 20 40 60 80 100 120 U1  U 0
t (ns)
Ca u
0 Ca U1 R0
10 CC
Normalized |I(f)|

CD MI

OL
q0  C0  U 0  Ca  U1
-2
10 5 6 7 8 C0
10 10 10 Z
f (Hz) 10
q0
Scale factor k (3.11): U0
uR =Reading on the MI Ca U1

uR0 =Reading on the MI during calibration Ck Ck uR0

CC
k= q0/ uR0 CD MI
Rm
During test: qa =k·uR = q0· uR / uR0 Lm
OL
Cm
24/05/2023. Rev. 1 Ck & Rm work as a high pass filter: Attention
mut be take if Ca>Ck is not meet 13
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PD measurements according to IEC 60270
integration errors
see 3.9.3 Reducing integration errors for Wide-band PD instruments
0
10
-6 dB
Normalized |I(f)|

Bandpass of measuring system

-1 PD pulse spectrum
10 Calibration pulse spectrum

-2
10
f1 f2
3 4 5 6 7 8
10 10 10 f (Hz) 10 10 10

- Bandwidth of spectrum of calibration pulse > bandwidth of spectrum of PD pulse.

- Bandpass of the PD measuring system (f1 & f2) on the flat part of the spectrum.

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PD measurements according to IEC 60270
7 Maintaining the characteristics of calibrators and
measuring systems
7.2.3 Routine tests on calibrators

Calibrators 7.2.3 Performance tests on calibrators

7.2.4 Performance checks on calibrators
Measuring systems
7.3.2 Routine tests on measuring systems
- By the manufacturer of the measuring system (by the user if test results not available)
- Shall include all the tests required in a performance test
7.3.3 Performance tests on measuring systems
- Z(f), f1 & f2 up to -20dB (not mandatory for the IEC 60270 future revision, but recommended)
- Linearity of k from 50% to 200% of highest specified PD magnitude: k<±5%
7.3.4 Performance checks for measuring systems
- Z(f) at one frequency Z(fi): f1 < fi < f2 :  Z(fi)  10% Z(fi) Performance tests

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PD measurements according to IEC 60270
Measuring uncertainty: Some of contributing factors
9 Measuring uncertainty and sensitivity
Apparent charge q measuring uncertainty: ±10 % or ±1 pC, whichever is the greater.

Some of factors contributing to uncertainty:

- Coupling device (CD)/Measuring system (MI) transfer impedance Z(f)

- Integration method
- Background noise
- Capacitance ratio Ca/Ck
- But also, PD pulse duration (quasi-integration method)

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PD measurements according to IEC 60270
Measuring uncertainty: PD pulse waveshape &
quasi-integration method error
0
10
PD pulse Normalized spectrum

5 ns

10 ns

30 ns

150 ns

-1 f1 f2 f2
10 2 3 4 5 6 7 8
10 10 10 10 10 10 10
f (Hz)

Error integration increases with PD pulse duration if 3.9.3 is not meet:

If PD pulse duration during test > PD pulse duration during calibration!
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PD measurements according to IEC 60270
Measuring uncertainty: PD pulse waveshape &
quasi-integration method error
f2 =500 kHz (IEC 60270:2000)
0

-2
Error < 5%
 (%)

-4

-6
20 40 60 80 100 120 140 160 180 200
PD pulse duration (ns)
f2 =1,000 kHz (IEC 60270:2000/AMD1:2015: Amendment 1 )
0

-5
 (%)

-10 The error can reach 10 %

-15
20 40 60 80 100 120 140 160 180 200
PD pulse duration (ns)
Error integration increases with PD pulse duration if 3.9.3 is not meet
<5% if f2=500kHz can reach 10% if f2=1,000kHz
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References
[1] E. Kuffel, W. S. Zaengl, and J. Kuffel, ‘Chapter 3 - Measurement of high
voltages’, in High Voltage Engineering Fundamentals (Second Edition), E.
Kuffel, W. S. Zaengl, and J. Kuffel, Eds. Oxford: Newnes, 2000, pp. 77–200.
doi: 10.1016/B978-075063634-6/50004-6.

[2] K. Schon, High Impulse Voltage and Current Measurement Techniques.

Hei-delberg: Springer International Publishing, 2013. doi: 10.1007/978-3-319-
00378-8.

[3] Cigre TB. 366 -- Guide for electrical Partial Discharge Measurements in
compliance to IEC 60270.

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Thanks for your attention!

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