LCD Screens and Optoelectronics

INDUSTRIAL APPLICATIONS OF FT-IR MICROSCOPY

Defect Analysis of a CMOS Sensor by FT-IR Microscopy
The analysis of optoelectronic devices is quite complex since modern systems are highly miniaturized and
composed of a multitude of materials. Especially the identification of microscopic contaminations is of particular
interest as they can cause malfunctioning of the electronic device. Revealing the origin of the contamination and
therefore allowing effective troubleshooting is one of the key applications of FT-IR microscopy.
It allows users to obtain an IR-spectrum of very small structures with a high lateral resolution, thereby revealing the
chemical composition of an defined part of the sample. This makes FT-IR an indispensable tool for quality control
and failure analysis of electronic sensors and other optoelectronics. It can help characterize defects, damages,
contaminations and much more. It can even stimulate product development by characterizing infrared sensors.
Application Note on CMOS Chip analysis Contact FT-IR Microscopy Expert
https://www.bruker.com/en/applications/industrial/electronics-and-manufacturing/LCD-screens-and-
optoelectronics/_jcr_content/root/sections/section/sectionpar/twocolumns_145188722/contentpar-1/
calltoaction.download-asset.pdf/primaryButton/AN_M106_LUMOS_electronic_EN.pdf

file:///M:/en/applications/industrial/electronics-and-manufacturing/LCD-screens-and-optoelectronics/_jcr_content/
root/herostage/backgroundImageVPS.coreimg.jpeg/1601456643044/bopt-cml-industrial-electronics-manufacturing-
cmos-sensor-optoelectronics.jpeg
bopt-cml-industrial-electronics-manufacturing-cmos-sensor-optoelectronics.jpeg
https://www.bruker.com/en/applications/industrial/electronics-and-manufacturing/LCD-screens-and-
optoelectronics/_jcr_content/root/sections/section/sectionpar/twocolumns_145188722/contentpar-1/text.download-
asset.pdf/e70724bf-fc19-4a17-9f74-a477
Visual image of the CMOS sensor showing the typical Bayer-matrix.
INDUSTRIAL APPLICATIONS OF RAMAN MICROSCOPY
Investigate Contaminant Inside LCD Panel with Raman Microscopy
Watch how the SENTERRA II is used to investigate a piece from an LCD screen.
https://www.youtube.com/watch?v=hVotD9HmW50&embeds_referring_euri=https%3A%2F%2Fwww.bruker.com
%2F&feature=emb_imp_woyt
Displays, LEDs, LCDs and many more optoelectronical parts are laminated with protective layers of polymers or
simply glued to glas surfaces. In both cases, meaning if the materials are transparent, confocal Raman microscopy
has the power to look inside such assemblies.
Usually, very small contaminants like particles, fibers, dust and dirt are the culprits in such kinds of damages.
Raman microscopy can not only find those microscopic impurities, it can identify them chemically to help discover
the root cause of these product defects. Use it for damage analysis of:
 Screen and LCD assemblies
 Touchpanels
 Mounted sensors
Learn more about our confocal Raman microscopes Contact Raman expert
https://www.bruker.com/en/products-and-solutions/infrared-and-raman/raman-microscopes/what-is-raman-
microscopy.html
OPTOELECTRONICS APPLICATIONS
Sensor and Detector Characterization Using FT-IR

bopt-industrial-electronics-manufacturing-optoelectronics-sensor-detector-characterization.jpeg
Detectors are everywhere nowadays - in smartphones, thermometers, cameras, light switches and many other
devices. But before these detectors can start their work in our everyday life, they have to be thoroughly
characterized and optimized.

This is exactly where an FT-IR spectrometer can be broadly applied, examining detectors for the three basic
parameters:
 Spectral bandwidth of response (UV/VIS/IR/etc.)
 Radiant power needed for a response
 Sensor response time
Want to know more? Download our application note demonstrating the characterization of a detector using a
powerful research FT-IR instrument.
Download AppNote on detector characterization
https://www.bruker.com/en/applications/industrial/electronics-and-manufacturing/LCD-screens-and-
optoelectronics/_jcr_content/root/sections/section_233574877/sectionpar/textimage/calltoaction.download-
asset.pdf/primaryButton/AN_M161_Detector_Characterization_using_FTIR_Spectrometer_EN.pdf
OPTOELECTRONICS APPLICATIONS
Applying FT-IR in the Development of VCSELs for Face Recognition

bopt-cml-industrial-electronics-manufacturing-optoelectronics-face-recognition.jpeg
Vertical Cavity Surface Emitting Lasers (VCSEL) are a special type of semiconductor laser diodes which, unlike
conventional edge-emitting laser diodes, emit perpendicular to the chip surface. This makes them easy to package as
emitter arrays with hundreds of emitters on a single chip, which can then be placed in a smartphone (e.g. for face
recognition).

In the analysis of VCSELs, FT-IR spectroscopy has proven to be a superior method compared to irradiance sensors
and fast photodiodes. One of the many advantages is the possibility to determine emission spectra. Currently,
research is focused on methods for characterizing VCSELs to support the theoretical modeling of VCSELs in basic
research. You want to learn more?
Correlating the Chemical Composition and Microstructure with Electrical and
Optoelectronic Properties
Optoelectronic devices primarily rely on an optical stimulus to generate electrical pulses, and vice versa. They are
commonly used as sensors or detectors in electronic devices.
SEM-based EDS and EBSD techniques are common analytical tools used in combination to investigate the
correlation of the chemical composition and microstructure with optical, electrical and mechanical properties, and
this down to the nanoscale. In-depth knowledge is possible with Bruker's advanced solutions for WDS, EDS, EBSD
and TKD techniques to quantitatively measure the phase and orientation distributions. It allows, for instance, to
investigate the effect of specific crystal orientation, strain and nature of grain or subgrain boundaries on the
optoelectronic properties. In-situ correlation studies can also be conducted with Bruker's QUANTAX EBSD
and Hysitron PI Series PicoIndenters.

industrial-electronics-optoelectr-ema-bna-adobestock-216459701.jpeg
Related Products
Electron Microscope Analyzers
https://www.bruker.com/en/products-and-solutions/elemental-analyzers/eds-wds-ebsd-SEM-Micro-XRF.html
To extend your SEM/TEM analytical power, Bruker ’s electron microscope analyzers EDS, WDS, EBSD and Micro-
XRF on SEM offer the most comprehensive compositional and structural analysis of materials, including analytical
software for advanced materials research, process development and failure analysis.
FT-IR Microscopes

https://www.bruker.com/en/products-and-solutions/infrared-and-raman/ft-ir-microscopes.html
Bruker Optics offers a broad product line in FT-IR and Raman microscopy.
https://www.bruker.com/en/products-and-solutions/infrared-and-raman/ft-ir-microscopes.html
FT-NIR Spectrometers
https://www.bruker.com/en/products-and-solutions/infrared-and-raman/ft-nir-spectrometers.html
Today, FT-NIR spectroscopy is well established for quality control applications in all industries, including the
pharmaceutical, food, agricultural and chemical sector.
Nanomechanical Instruments for SEM/TEM
https://www.bruker.com/en/products-and-solutions/test-and-measurement/nanomechanical-instruments-for-sem-
tem.html
Hysitron PicoIndenters for in-situ mechanical experiments in scanning electron and transmission electron
microscopes
Raman Microscopes
https://www.bruker.com/en/products-and-solutions/infrared-and-raman/raman-microscopes.html
High resolution, high performance raman microscopes for analytical and research applications