Designation: E572 − 13

Standard Test Method for

Analysis of Stainless and Alloy Steels by Wavelength
Dispersive X-Ray Fluorescence Spectrometry 1
This standard is issued under the fixed designation E572; the number immediately following the designation indicates the year of
original
original adoption or, in the case of revis
revision,
ion, the year of last revision.
revision. A number in paren
parenthese
thesess indicates the year of last reappr
reapproval.
oval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.

1. Sco
Scope
pe E1361 Gu
Guid
idee fo
forr Cor
Corre
recti
ction
on of InInter
terel
eleme
ement
nt Ef
Effe
fects
cts in
1.1 Thi
Thiss test method 2
method covers the analysis of stainless and X-Ray Spectrometric Analysis
alloy stee
alloy steels
ls by wav
wavelen
elength
gth dis
disper
persiv
sivee X-r
X-ray
ay Flu
Fluore
oresce
scence
nce E1621 Guide for Elemental Analysis by Wavelength Disper-
Spectrometry
Spectr ometry for the determination
determination of the following elements: sive X-Ray Fluor
Fluorescenc
escencee Spectr
Spectrometry
ometry
E l em e n t Range, Mass Fraction % 3. Terminology
Chromium 1 to 25
Cobalt 0 . 0 5 to 0 .4 5 3.1 For definitions
definitions of terms used
used in this test method, refer
refer to
Copper 0. 06 t o 3. 5 Terminology E135
E135..
M a n g an es e 0 .3 to 5 .5
-

M o l y b de n um
-
`
,
,
0 .0 5 to 3 .5 4. Summ
Summary
ary of Test
Test Method
`

Nickel`
`
,
,
0 .7 to 3 5
4.1 The test specimen
specimen is finished to a clean, uniform
uniform surface
,

Niobium
,
`
`
`
0 .0 6 to 1 . 3
`

Phosphorus
-
0 .0 1 to 0 .0 3
`
-
` and then irradiated with an X-ray beam of high energy. The
S i l i c on
,
,
` 0 . 2 to 2
,
,

S u l f ur
`
,
` 0 . 0 2 t o 0 .3 5 secondary X-rays produced are dispersed by means of crystals
,

and
and ththee co
coununtt ra
rates
tes ar
aree me
meas
asur
ured
ed by su
suita
itabl
blee de
dete
tecto
ctors
rs at
,

Titanium
`
-
-
-
0 .0 1 3 to 0 . 5
Vanadium 0 . 0 4 to 0 . 2 5
selected wavelengths. The outputs of the detectors in voltage
NOTE 1—Mass fraction ranges can be extended upward by demonstra- pulses are counted. Radiation measurements are made based on
tion of accura
accurate
te calibr
calibrations
ations using suitable refer
reference
ence materials. the time required to reach a fixed number of counts, or on the
1.2 This standar
standard d doe
doess not purport
purport to add
addreress
ss all of the total counts obtained for a fixed time (generally expressed in
safet
sa fetyy co
conc
ncer
erns
ns,, if an
anyy, as
asso
socia
ciated
ted wi
with
th ititss us
use.
e. It is th
thee coun
counts
ts peperr un
unit
it tim
time)
e).. Ma
Mass
ss fr
fract
actio
ions
ns of ththee ele
elemen
mentsts ar
aree
responsibility of the user of this standard to establish appro- determ
determineined
d by rel relatin
ating
g the meas
measure
uredd rad
radiati
iation
on of unk
unknow
nown n
priate safety and health practices and determine the applica- specimens to analytical curves prepared using suitable refer-
bility of regulatory limitations prior to use. Specific precau- ence materials. Both simultaneous spectrometers containing a
tionary statements are given in Section 1010.. fixed-channel monochromator for each element and sequential
spectrometers using a goniometer monochromator can be used
2. Referenc
Referenced
ed Documents
Documents for measurement of the elements.
2.1 ASTM Standards: 3
5. Signi
Significanc
ficancee and Use
E135 Term
ermino
inolog
logy
y Rela
Relating
ting to Ana
Analyt
lytical
ical Che
Chemist
mistry
ry for
Metals, Ores, and Related Materials 5.1 This procedure is suitable for manufacturing control and
E177 Practice for Use of the Terms Precision and Bias in for verifying that the product meets specifications. It provides
ASTM Test Methods rapid, multi-element determinations with sufficient accuracy to
E691 Practic
Practicee for Conducting an Inter
Interlabora
laboratory
tory Study to assuree produ
assur product
ct qualit
quality
y. The analyti
analytical
cal perfo
performance
rmance data in-
Determine the Precision of a Test Method cluded may be used as a benchmark to determine if similar
X-ray
X-r ay spe
spectro
ctromete
meters
rs pro
provide
vide equi
equivale
valent
nt prec
precisio
ision
n and
accuracy, or if the performance of a particular spectrometer has
1
Thiss tes
Thi testt met
method
hod is und
under
er the jur
jurisd
isdict
iction
ion of AS
ASTM
TM Com
Committ
mittee
ee E01 on
changed.
Analytical Chemistry
Analytical Chemistry for Metals, Ores, and RelatRelated
ed Materials and is the direct
responsibility of Subcommittee E01.01 on Iron, Steel, and Ferroalloys. 5.2 It is expected
expected that thi
thiss sta
standa
ndard
rd will be emp
employ
loyed
ed by
Current edition approved Nov. 1, 2013. Published December 2013. Originally
analysts
analys ts kno
knowle
wledge
dgeable
able in the fiel
field
d of X-r
X-ray
ay fluo
fluores
rescen
cence
ce
approved
approv ed in 1976. Last previous edition approved in 2012 as E572 – 12. DOI:
10.1520/E0572-13. spectr
spectrome
ometry
try and experienc
experienced
ed in the use of the appappara
aratus
tus
2
Supporting data for this test method as determined by cooperative testing have specified in this standard.
been filed at ASTM International Headquarters as RR:E01-1118.
3
For referenced ASTM standards, visit the ASTM website, www.astm.org, or 6. Interfere
Interferences
nces
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
Standards volume information, refer to the standard’s Document Summary page on 6.1 Intere
Interelement
lement effects
effects or matrix effects
effects exist for some of
the ASTM website. the elements listed. Mathematical correction may be used to

Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States

Copyright ASTM International

Provided by IHS under license with ASTM
1
No reproduction or networking permitted without license from IHS Not for Resale
 E572 − 13

solve for the

solve these
se elem
element
ents.
s. Vari
arious
ous math
mathema
ematica
ticall cor
correct
rection
ion 8. Reag
Reagents
ents and Materials
Materials
proced
procedure
uress are com
common
monlyly uti
utilize
lized.
d. See Gui
Guides
des E1361 and 8.1 Detector Gas (P-10), consisting of a mixture of 90 %
E1621.. An
E1621 Any y of ththes
esee pr
proc
oced
edur
ures
es th
that
at ac
achi
hiev
eves
es an
analy
alytic
tical
al argon and 10 % methane, for use with gas-flow proportional
accurac
accuracy
y equ
equiva
ivalent
lent to tha
thatt pro
provid
vided
ed by thi
thiss test method is counters only.
acceptable.
9. Referenc
Referencee Materials
Materials
7. Appar
Apparatus
atus
9.1 Certified Reference Materials are available from com-
7.1 Specimen Preparation Equipment: mercial and government sources.
7.1.1 Su
Surfa
rface
ce Gri
Grinde
nderr or San
Sander
der wit
with
h Abr
Abrasi
asive
ve Belt
Beltss or 9.2 Reference Materials with matrices similar to those of the
Disks, or Lathe, capable of providing a flat, uniform surface on test specimens and containing varying amounts of the elements
the reference materials and test specimens. Aluminum oxide to be dedete
term
rmin
ined
ed mamay
y be us used
ed pr
prov
ovid
ided
ed th
they
ey hahave
ve be
been
en
and zirconium oxide belts and discs with a grit size of between analyz
ana lyzed
ed in acco
accorda
rdance
nce wit
with
h AST
ASTMM stan
standar
dard
d met
method
hodss or
60 and 180 have been found suitable. similar procedures established by the certifying body. These
reference materials shall be homogeneous and free of voids and
7.2 Excitation Source: porosity.
7.2.1 X-ray Tube Power Supply, providing a constant poten-
9.3 The reference
reference mat
materia
erials
ls sha
shall
ll cov
cover
er the mas
masss fra
fractio
ction
n
tial or rectified power of sufficient energy to produce secondary
ranges of the ele
ranges elemen
ments
ts bei
being
ng sou
sought
ght.. A min
minimu
imum
m of thrthree
ee
radiation from the specimen for the elements specified. The reference materials shall be used for each element. A greater
generator may be equipped with a line voltage regulator and number of calibrants may be required if the analyst chooses to
current stabilizer. perform mathematical corrections for interelement effects. See
7.2.2 X-ray Tubes, with targets of various high-purity ele- Guide E1361
E1361..
ments
men ts tha
thatt are cap
capabl
ablee of con
continu
tinuous
ous ope
operat
ration
ion at req
requir
uired
ed
potentials and currents and that will excite the elements to be 10. Haza
Hazards
rds
determined. 10.1 U.S Nuc
10.1 Nuclea
learr Reg
Regula
ulator
tory
y Com
Commis
missio
sion
n Stan
Standar
dards
ds for
7.3 Spectrometer, designed for X-ray fluorescence analysis ionizing radiation as found in the Code of Federal Regulations
and equipped with specimen holders and a specimen chamber. 10 CFR Part 19, “Notices, Instructions and Reports to Workers: -
-
-
`
,
,

Inspection and Investigations” and 10 CFR Part 20, “Standards

`
,

The chamber shall contain a specimen spinner, and must be

`
,
,
`

n”4 sh
,

equipped for vacuum or helium-flushed operation for measure- for Protec

Protection
tion Against Radiatio
Radiation” shall
all be ob
obse
serv
rved
ed at al
alll ,
`
-
`
-
`

ment of elements of atomic number 20 (calcium) and lower. X-ray emission spectrometer installations in the U.S. It is also `
`
`
,
,
,

recommended that operating and maintenance personnel fol-

,
`
`
`

7.3.1 Analyzing Crystals, flat or curved crystals with opti- ,

,
`

low the guidelines of safe operating procedures given in similar -

-

mized
mize d cap
capabi
ability
lity for the dif
diffra
fractio
ction
n of the wav
wavelen
elength
gthss of
handbooks on radiation safety.
interest.
interest. Synthetic multilayer
multilayer structures can be used in place of
crystals. 10.2 Expo
Exposure
sure to excess
excessive
ive quantities of high energy radia-
tion such as those produced by X-ray spectrometers is injurious
7.3.2 Collimators or Slits, for controlling the divergence of
to health. The operator should take appropriate actions to avoid
the characteristic X rays.
exposing any part of their body, not only to primary X rays, but
7.3.3 Detectors, seal
sealed
ed and gas
gas-flo
-flow
w pro
propor
portio
tional
nal typ
types,
es, also to secondary or scattered radiation that might be present.
scintillation counters or equivalent. Some spectrometers may The X-ray spectrometer should be operated in accordance with
allow
allow for tandem use of two differ
different
ent det
detecto
ectors
rs to incr
increase
ease regulat
reg ulation
ionss gov
govern
erning
ing the use of ion ionizin
izing
g rad
radiati
iation.
on. Dur
During
ing
sensitivity. manufacturing, manufacturers of X-ray fluorescence spectrom-
7.3.4 V acuum System, prov
Vacuum providin
idingg for the det determ
ermina
inatio
tion
n of eters generally build into X-ray equip
equipment
ment appropriate
appropriate shield
shield--
element
elem entss who
whosese rad
radiati
iation
on is absabsorb
orbed
ed by air (fo (forr exa
exampl
mple,
e, ing and safety interlocks that minimize the risk of excessive
silicon, phosphorus, and sulfur). The system shall consist of a radiation exposure to operators. Operators should not attempt
vacuum pump, gage, and electrical controls to provide auto- to byp
bypass
ass or def
defeat
eat the
thesese saf
safety
ety dev
devices
ices.. Onl
Onlyy auth
authori
orized
zed
matic
mat ic pu
pumpmp do
down
wn of th thee op
optictical
al pa
path
th,, an
andd to ma
main intai
tain
n a personnel
perso nnel shoul
shouldd servic
servicee X-ray spectrometers.
spectrometers.
cont
co ntro
rolle
lledd pr
pres
essu
sure
re,, us
usua
ually
lly 13 Pa (1 (100
00 µm Hg Hg)) or lesless,
s,
controlled to 6 3 Pa (6 20 µm Hg) or better. A helium-flushed 11. Preparation
Preparation of Reference Materials and Test
Test
system is an alternative to a vacuum system, and it must be Specimens
demons
dem onstrat
trated
ed to pro
provid
videe suf
suffficie
icient
nt stab
stabilit
ility
y to ach
achiev
ievee the 11.
1.1
1 The an
anal
alys
ystt mu
must
st ch
choo
oose
se a memeas
asur
ureme
ement
nt ar
area
ea or
demonstrated
demon strated repeatability
repeatability perfo
performance
rmance of this standa
standard.rd. diameter from the options built into the spectrometer. All test
specimens and reference materials must have a flat surface of
7.4 Measuring System, consisting of electronic circuits ca-
greater diameter than the chosen viewed area.
pable of amplifying and integrating pulses received from the
detectors. For some measurements, a pulse height selector in
conjunction with the detectors may be required to provide more 4
Available from the Nuclear Regulatory Commission, Public Document Room,
accurate measurements. The system shall be equipped with an Mail Stop:OWFN-1 F13, Washington, DC 20555, (800) 397-4209, or via email at
appropriate device. PDR.Resource@nrc.gov, or via the website at www.nrc.gov.

Copyright ASTM International

Provided by IHS under license with ASTM
2
No reproduction or networking permitted without license from IHS Not for Resale
 E572 − 13

11.2 Prepar
11.2 Preparee the refere
reference
nce materials and test specim
specimens
ens to 13. Calibration and
and Standardization
Standardization
prov
provid
idee a cle
clean
an,, fla
flatt un
unif
ifor
orm
m su
surf
rfac
acee to be ex
expo
pose
sed
d to th
thee 13.1 Cal
Calibr
ibrati
ation
on (Pr
(Prepa
eparat
ration
ion of Ana
Analyti
lytical
cal Cur
Curves
ves)—
)—
primary X-ray beam One surface of a reference material may Using
Usi ng the con
conditi
ditions
ons esta
establis
blished
hed in Sect
Section
ion 12
12,, meas
measure
ure a
be des
design
ignated
ated by the pro
produc
ducer
er as the cer
certifie
tified
d sur
surfac
face.
e. The series
ser ies of ref
refere
erence
nce mat
materia
erials
ls tha
thatt cov
cover
er the req
requir
uired
ed mas
masss
same surface preparation medium shall be used for all refer- fraction ranges. Use at least three reference materials for each
ence materials and test specimens. element. Prepare an analytical curve for each element being
11.
1.3
3 As neneed
eded
ed,, re
refin
finis
ish
h th
thee su
surf
rface
acess of th
thee re
refe
fere
renc
ncee determined (refer to Guide E1621 E1621)). For information on correc-
materials and test specimens to eliminate oxidation. tion
tion of int
intere
ereleme
lementnt ef
effec
fects
ts in X-r
X-ray
ay fluo
fluores
rescen
cence,
ce, ref
refer
er to
Guide E1361
E1361.. In Infor
format
mation
ion on corcorrec
rection
tion of spe
spectr
ctral
al lin
linee
12. Preparat
Preparation
ion of Apparatus
Apparatus
overlaps in wavelength dispersive X-ray spectrometry can be
12.1 Pre
12.1 Prepar
paree and ope
operat
ratee the spe
spectr
ctrome
ometer
ter in acc
accord
ordanc
ancee found in Guide E1621
E1621..
with the manuf
manufacture
acturer’s
r’s instru
instructions
ctions..
13.2 Standardization (Analytical Curve Adjustment)— Using
NOTE 2—It is not within the scope of this test method to prescribe control reference materials, check the calibration of the X-ray
minute details relative to the preparation of the apparatus. For a descrip- spectrometer at a frequency consistent with the process control
tion
tion and sp
speci
ecific
fic det
detail
ailss co
conce
ncern
rning
ing the op opera
eratio
tion
n of a par
partic
ticula
ularr
spectrometer, refer to the manufacturer’s manual.
practice of the laboratory or when the detector gas or major
spectrometer components have been changed. If the calibration
12.1.1 Start-up—Turn on the power supply and electronic check indicates that the spectrometer has drifted, make appro-
circuits and allow sufficient time for instrument warm-up prior priate adjustments according to the instructions in the manu-
to taking measurements. factur
facturer’
er’ss man
manual
ual.. Ref
Refer
er to Gui
Guide
de E1621 for frefreque
quency
ncy of
12.2 TTube
ube Pow
Power
er Sup
Supply
ply—
— The pow
powerer sup
supply
ply con
conditi
ditions
ons verification of standardization.
should
sho uld be set acco
accordi
rding
ng to the man
manufa
ufactu
cturer
rerss reco
recomme
mmenda
nda--
tions. 14. Procedur
Proceduree
12.2.1
12.2.1 The voltage and current established
established as optimu
optimum
m for
14.1 Specimen Loading—Place each reference material or
the X-ray tube power supply in an individual laboratory shall
test specimen in the appropriate specimen holding container. If
be reproduced for subsequent measurements.
thee sp
th spect
ectro
romet
meter
er is eqequi
uipp
pped
ed wi
with
th an auauto
tomat
mated
ed loload
adin
ing
g
12.3 PrProport
oportional
ional Coun ter Gas Flow—Whe
Counter When n a gasgas-flo
-floww device,, repeat
device repeatability
ability may be impro
improved
ved by loadin
loading
g and unload-
proportional counter is used, adjust the flow of the P-10 gas in ing all specimens from the same holder. The container shall
accordance
accord ance with the equipequipment
ment manuf
manufacture
acturer’s
r’s instru
instructions
ctions.. have a suitable opening to achieve the required precision in an
When changing P-10 tanks, the detectors should be adequately acceptable amount of time. The holder must be equipped to
flushed with detector gas before the instrument is used. After keep the specimen from moving inside the holder.
changi
cha nging
ng P-1
P-10
0 tan
tanks,
ks, che
check
ck pul
pulse
se hei
height
ght sele
selecto
ctorr and gain
14.2 Excitation—Exp
Expose
ose the spe
specim
cimen
en to pri
primar
mary
y X-r
X-ray
ay
settingss accord
setting according
ing to the manuf
manufacture
acturer’s
r’s instru
instructions
ctions..
radiation in accordance with Section 12
12..
12.4 Measurement Conditions—The Kα (K-L2,3) lines are
14.3 Radi
Radiation
ation Measur
Measurements—
ements—Ob Obtai
tain
n and re
recor
cord
d th
thee
used for all elements in this standard. When using a sequential
counting rate for each element. Either fixed count or fixed time
spectro
spectromete
meter,r, gon
goniom
iomete
eterr ang
anglele sett
setting
ingss sha
shall
ll be cal
calibr
ibrated
ated
modes may be used.
according
according to the manuf
manufacture
acturer’s
r’s guide
guidelines.
lines.
12.4.1 Crystals and Detectors—The following crystals and 14.4 Spectral Interfer ences—Some X-ra
Interferences— X-ray
y spec
spectrom
trometers
eters
detector choices are used for the elements indicated: willl not com
wil comple
pletely
tely res
resolv
olvee rad
radiati
iation
on fro
from
m sev
several
eral elem
element
ent
El ement Crystal Detector
combinations (for example, molybdenum and sulfur; molyb-
Chromium L 1, L 2 FP, SP, Sc denum and phosphorus; and iron and cobalt). Therefore, care
Cobalt L 1, L2 FP, SP, Sc must be exercised in the interpretation of count rates when both
Copper L1 , L 2 SP, FP, Sc
M an g an es e L1, L2 FP, SP, Sc
elements are present. Mathematical calculations must be used
M o l y b d e n um L1 , L2 Sc , SP to correct for the interferences.
Nickel L1 , L 2 SP, FP, Sc
Niobium L 1, L 2 Sc , SP 14.5 Replicate Measurements—Make a single measurement
Phosphorus Ge FP, SP on each test specimen. The performance of an X-ray spectrom-
Si l i c on PET, InSb FP, SP eter is not improved significantly by making multiple measure-
S u l fu r Ge FP, SP
Titanium L1, L2 FP, SP ments on the same surface of the specimen. Confidence in the
Vanadium L 1, L 2 FP, SP accuracy of analysis may improve by making multiple mea-
surements on freshly prepared surfaces of the same specimen.
L1 = LiF
LiF(20
(200),
0), L2 = LiF
LiF(22
(220)
0)
FP = Flow Proport
Proportional,
ional, SP = Sealed Propor
Proportional
tional,, Sc = Scinti
Scintillatio
llation
n
12.4.2 Co
Countin
unting
g Time—ColCollec
lectt a suf
sufffici
icient
ent num
number
ber of 15. Calc
Calculat
ulation
ion of Results
coun
co unts
ts so ththat
at th
thee ra
rand
ndom
om na
natu
ture
re of X-
X-raray
y em
emiss
issio
ion
n an
andd 15.1 Usi
15.1 Using
ng the cou
count
nt rates for the test specimen
specimen and the -
-
-
`

counting does not significantly influence the repeatability of appropriate analytical curves, calculate the mass fractions of
,
,
`
,
`
,
,

the measurements.
measurements. A minimu
minimumm of 10 000 counts is required
required for the various elements. `
,
,
`
-
`

a relative counting uncertainty of 1 % at a level of one standard 15.1.1

15.1. 1 If mathematical
mathematical calculations
calculations must be made to correct
-
`
`
`
`
,

deviation, and 40 000 counts is required for 0.5 % relative the mass fractions for interelement effects, any one of a number
,
,
,
`
`
`
,

uncertainty. of co
corr
rrec
ectio
tion
n pr
proc
oced
edur
ures
es ma
mayy be emempl
ploy
oyed
ed.. Ref
Refer
er to th
thee ,
`
-
-

Copyright ASTM International

Provided by IHS under license with ASTM
3
No reproduction or networking permitted without license from IHS Not for Resale
 E572 − 13

equipment manufacturer’s manual for the applicable procedure 16.2 Bias—At the time of the interlaboratory study, a set of
for the instrument being used. See Guide E1361
E1361.. certified reference materials was provided for determining the
bias of this test method. Bias estimates are represented by the
16. Pre
Precisio
cision
n and Bias
difference, D, in Tables 13-24 below.
16.1 The pr
16.1 prec
ecis
isio
ionn of ththis
is te
test
st me
meth
thod
od is ba base
sedd on an
interlaboratory study conducted in the 1980s. Each of seven 16.3 The pre
16.3 precisi
cision
on and bias stat
statemen
ements ts wer
weree det
determ
ermine
inedd
laboratories tested 11 different steel alloy reference materials. through
throu gh statistical examination of result
resultss from seven labor
laborato-
ato-
Practice E691 was followed for the design of the study and the ries on these 11 materials:
analysis of the results. The details are given in RR:E01-1118. Samp
Sample
le 1: Stan
Standadard
rd Re
Refefere
renc
ncee Ma
Mateteri
rial
al (S
(SRMRM)) C1
C115
152,
2, U.
U.S.
S.
National Institute of Standards and Technology
16.1.1 Rep
Repeatab
eatability
ility Limit (r)—Two tes testt res
results
ults obt
obtaine
ained
d
Samp
Sample
le 2: SRM
SR M 121219
19,, U.
U.S.
S. Na
Nati
tion
onal
al In
Inst
stit
itut
utee of St
Stan
anda
dard
rds
s
within one laboratory shall be judged not equivalent if they and Technology
differ by more than the “ r” value for that material; “r” is the Samp
Sample
le 3: SRM
SR M 121267
67,, U.
U.S.
S. Na
Nati
tion
onal
al In
Inst
stit
itut
utee of St
Stan
anda
dard
rds
s
and Technology
interval representing the critical difference between two test Samp
Sample
le 4: SRM
SR M C1C128
287,
7, U.
U.S.
S. Na
Nati
tiona
onall Ins
Instititut
tute
e of St
Stand
andar
ards
ds
results for the same material, obtained by the same operator and Technology
usin
usingg th
thee sa
same
me eqequi
uipm
pmenentt on th thee sa
same
me da dayy in ththee sa
same
me Samp
Sample
le 5: Cert
Ce rtifi
ified
ed Re
Refefere
renc
ncee Ma
Mateteri
rial
al (C
(CRMRM)) SS
SS46
467,
7,
Jernknororets Sweden
laboratory. S a m p l e 6: CRM S20
16.1.1
16.1.1.1
.1 Repeata
Repeatabili
bility
ty Lim
Limitsits are list
listed
ed in T Tables
ables 1-12 Samp
Sa mplele 7: CRM
CR M BSBS80
80E,
E, Br
Bram
amme
merr St
Stan
andadardrd Co
Comp
mpananyy
below. Samp
Sa mplele 8: CRM
CR M BSBS85
85C,
C, Br
Bram
ammemerr St
Stananda
dardrd Co
Comp
mpananyy
Samp
Sa mplele 9: CRM
CR M BSBS18
187,
7, Br
Bram
amme
merr St
Stan
anda
dardrd Co
Comp
mpanany
y
16.1.2 Reprodu
Reproducibility
cibility limit (R)—Two test results shall be Samp
Sa mplele 10
10:: CRM
CR M BSBS18
180,
0, Br
Bram
amme
merr St
Stan
anda
dardrd Co
Comp
mpanany
y
judged not equivalent if they dif differ
fer by more than t he “R” value
t han the Sample 11: CRM S26
for that material; “R” is the interval representing the critical
16.4 To ju
16.4 judg
dgee th
thee eq
equi
uiva
valen
lency
cy of tw
two
o te
test
st re
resu
sults
lts,, it is
differ
differenc
encee betw
between
een two test res result
ultss for the samsamee mat
materia
erial,
l,
recommended to choose the reference material most similar in
obtained
obtain ed by dif
different
ferent operators using dif differen
ferentt equip
equipment
ment in
characteristics to the test material.
different laboratories.
16.1.2
16.1.2.1
.1 Rep
Reprod
roduci
ucibil
bility
ity limi
limits
ts are givgiven
en in T Tables
ables 1-12
below. 17. Keyw
Keywords
ords
16.1.3
16.1. 3 The above terms (repe (repeatabilit
atabilityy limit and reproduc-
reproduc- 17.1 elemental
elemental analys
analysis;
is; spectr
spectrometric
ometric analysis; stainle
stainless
ss
ibility limit) are used as specified in Practice E177 E177.. steel; wavelen
wavelength
gth disper
dispersive;
sive; X-ray fluorescence
fluorescence
16.1.4
16.1. 4 Any judgment
judgment in accord
accordance
ance with statements 16.1.1
and 16.1.2 would have an approximate 95 % probability of
being correc
correct.
t.

TABLE 1 Nickel (%)

Repeatability Reproducibility Repeatability Reproducibility
Average Standard Deviation Standard Deviation Limit Limit
Material ¯
X̄
X sr sR r R
3 0. 24 3 6 0. 00 3 8 0.11 0.011 0 .3 1
2 2.118 0 .0 4 8 0. 09 1 0. 14 0 .2 5
11 3 .2 9 9 0 .0 1 5 0 .0 6 1 0. 0 43 0 .1 7
7 8 .1 5 6 0 .0 2 7 0. 06 1 0 .0 7 5 0. 17
5 9 .2 3 7 0 .0 3 3 0. 07 9 0 .0 9 4 0. 22
8 1 0 .0 5 3 0 .0 3 9 0 . 06 7 0.11 0. 19
1 1 0 .9 3 8 0 .0 3 1 0 . 07 5 0. 0 87 0 .2 1
10 1 3 .2 4 7 0 .0 6 4 0. 31 0 .1 8 0. 86
6 1 8 .5 8 4 0 .0 6 8 0 .5 8 0. 19 1 .6
4 2 1 .1 9 0.11 0 .1 9 0 .2 9 0. 53
9 34.11 0.11 0 .1 7 0 .3 1 0. 47

--`,,```,,,,````-`-`,,`,,`,`,,`---

Copyright ASTM International

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4
No reproduction or networking permitted without license from IHS Not for Resale
 E572 − 13
TABLE 2 Chromium (%)
Repeatability Reproducibility Repeatability Reproducibility
Average Standard Deviation Standard Deviation Limit Limit
Material ¯
X̄
X sr sR r R
6 2 .0 6 7 0 .0 1 0 0 .0 8 6 0. 02 9 0 .2 4
2 1 5. 75 0.116 0. 34 0 .3 2 0 .9 5
7 1 7. 30 0 .0 5 4 0. 19 0 .1 5 0 .5 3
8 1 7. 72 0 .0 4 6 0. 21 0 .1 3 0 .5 9
1 1 7 .8 8 6 0 .0 7 3 0 .2 1 0 .2 0 0. 60
5 1 8. 19 0 .0 6 0 0. 16 0 .1 7 0 .4 4
11 1 9 .0 5 0 .0 7 0 0 .2 4 0 .2 0 0. 68
9 1 9. 98 0 .0 7 3 0. 27 0 .2 0 0 .7 5
10 2 1 .2 5 0 .0 8 5 0 .1 8 0 .2 4 0. 51
3 2 4. 12 0 .0 7 2 0. 65 0 .2 0 1 .8
4 2 4. 15 0 .1 0 0. 42 0. 29 1 .2

TABLE 3 Manganese (%)

Repeatability Reproducibility Repeatability Reproducibility
Average Standard Deviation Standard Deviation Limit Limit
Material ¯
X̄
X sr sR r R
3 0. 31 20 0. 00 2 3 0. 04 7 0. 00 66 0. 13
2 0. 42 42 0. 00 3 5 0. 03 3 0. 00 97 0 .0 9 3
9 0. 44 30 0. 00 3 9 0. 03 5 0.011 0 .0 9 8
5 0. 76 37 0. 00 4 9 0. 02 6 0 .0 1 4 0 .0 7 4
11 0 .9 5 9 3 0 .0 0 5 0 0 .0 3 4 0. 01 4 0 .0 9 5
1 0. 96 58 0. 00 7 7 0. 02 9 0 .0 2 2 0 .0 8 0
6 1. 46 66 0. 00 5 3 0. 08 4 0 .0 1 5 0 .2 4
8 1. 63 13 0. 00 5 1 0. 03 8 0 .0 1 4 0.11
4 1. 65 87 0. 00 7 9 0. 04 9 0 .0 2 2 0 .1 4
7 1 .7 3 5 0.011 0 .0 5 7 0. 03 1 0 .1 6
10 4. 94 6 0 .0 1 7 0 .1 6 0. 04 6 0 .4 4

TABLE 4 Copper (%)

Repeatability Reproducibility Repeatability Reproducibility
Average Standard Deviation Standard Deviation Limit Limit
Material ¯
X̄
X sr sR r R
5 0. 02 96 0. 00 1 2 0. 01 8 0. 00 33 0 .0 5 0
3 0. 05 91 0. 00 1 2 0. 01 2 0. 00 34 0 .0 3 3
10 0 .0 8 0 9 0 .0 0 0 9 0 .0 1 6 0 .0 0 2 6 0 .0 4 6
1 0. 10 84 0. 00 1 2 0. 01 3 0. 00 33 0 .0 3 6
11 0 .1 3 5 3 0 .0 0 1 2 0.011 0 .0 0 3 4 0 .0 3 1
2 0. 16 15 0. 00 1 3 0 .0 0 8 9 0 .0 0 3 5 0 .0 2 5
8 0. 31 04 0. 00 2 0 0 .0 0 5 2 0 .0 0 5 5 0 .0 1 4
7 0. 36 72 0. 00 2 0 0 .0 0 9 0 0 .0 0 5 7 0 .0 2 5
6 0. 44 19 0. 00 3 1 0. 02 1 0. 00 88 0 .0 5 7
4 0. 58 73 0. 00 3 2 0. 01 4 0. 00 89 0 .0 4 0
9 3. 29 14 0. 01 4 5 0. 12 0. 04 0 7 0 .3 2 6

--`,,```,,,,````-`-`,,`,,`,`,,`---

Copyright ASTM International

Provided by IHS under license with ASTM
5
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 E572 − 13
TABLE 5 Molybdenum (%)
Repeatability Reproducibility Repeatability Reproducibility
Average Standard Deviation Standard Deviation Limit Limit
Material ¯
X̄
X sr sR r R
5 0 .0 0 3 7 6 0 .0 0 0 2 8 0 .0 0 3 7 0 .0 0 0 8 0 0 .0 1 0
3 0 .0 1 3 5 0 0 .0 0 0 2 1 0 .0 0 7 1 0 .0 0 0 6 0 0 .0 2 0
2 0 .1 6 5 8 8 0 .0 0 0 9 6 0 .0 0 4 7 0. 00 27 0 .0 1 3
8 0 .3 3 2 8 1 0 .0 0 0 7 2 0 .0 0 3 2 0. 00 20 0 . 0 09 0
1 0. 43 34 0.0011 0 .0 0 2 8 0 .0 0 3 1 0 .0 0 7 7
4 0. 46 13 0. 00 1 8 0 .0 0 4 9 0 .0 0 5 0 0 .0 1 4
7 0. 56 60 0. 00 2 9 0 .0 0 9 9 0 .0 0 8 1 0 .0 2 8
9 2 .0 6 4 0 .0 1 5 0 .0 6 0 0. 04 2 0 .1 7
10 2 .2 0 5 4 0 .0 0 7 0 0 .0 3 4 0. 02 0 0 .0 9 6
11 2 .6 3 7 6 0 .0 0 6 4 0 .0 6 9 0. 01 8 0. 19
6 3 .0 9 6 0 .0 5 2 0 .0 6 7 0 .1 4 0. 19

TABLE 6 Silicon (%)

Repeatability Reproducibility Repeatability Reproducibility
Average Standard Deviation Standard Deviation Limit Limit
Material ¯
X̄
X sr sR r R
9 0. 25 64 0. 00 7 4 0. 02 6 0 .0 2 1 0 .0 7 4
10 0 .3 2 1 0 0 .0 0 6 5 0 .0 2 2 0. 01 8 0 .0 6 1
8 0. 39 47 0. 00 6 8 0. 02 0 0 .0 1 9 0 .0 5 7
5 0. 50 30 0. 00 7 1 0. 02 0 0 .0 2 0 0 .0 5 5
2 0. 55 22 0. 00 7 7 0. 02 3 0 .0 2 1 0 .0 6 3
7 0. 57 77 0. 00 8 1 0. 01 8 0 .0 2 3 0 .0 5 0
3 0. 59 78 0. 00 8 9 0. 02 5 0 .0 2 5 0 .0 7 1
11 0 .6 7 2 6 0 .0 0 9 2 0 .0 2 1 0. 02 6 0 .0 6 0
1 0 .8 2 5 0.011 0 .0 2 3 0. 03 2 0 .0 6 5
4 1 .6 7 9 0 .0 1 6 0 .0 2 9 0. 04 5 0 .0 8 0
6 1 .7 8 9 0 .0 1 7 0 .0 6 0 0. 04 8 0 .1 7

TABLE 7 Niobium (%)

Repeatability Reproducibility Repeatability Reproducibility
Average Standard Deviation Standard Deviation Limit Limit
Material ¯
X̄
X sr sR r R
3 0 .0 0 6 2 0 0 .0 0 0 1 4 0 .0 0 5 7 0 .0 0 0 4 0 0 .0 1 6
2 0 .0 1 4 6 9 0 .0 0 0 2 8 0 .0 0 5 6 0 .0 0 0 7 7 0 .0 1 6
8 0 .0 1 5 4 2 0 .0 0 0 3 6 0 .0 0 5 4 0. 00 10 0 .0 1 5
7 0 .0 1 6 4 8 0 .0 0 0 2 5 0 .0 0 6 1 0 .0 0 0 7 1 0 .0 1 7
11 0. 06 65 9 0. 00 0 38 0 .0 0 5 7 0.0011 0 .0 1 6
-
-
`
,
4 0 .0 7 1 9 1 0 .0 0 0 4 2 0 .0 0 7 1 0. 00 12 0 .0 2 0
,
`
`
`
,
1 0 .1 9 3 7 8 0 .0 0 0 5 6 0 .0 0 8 7 0. 00 16 0 .0 2 4
,
,
,
`
`
10 0. 21 34 1 0. 00 0 83 0.011 0. 00 23 0 .0 3 1
`
`
-
`
9 0 .4 8 3 1 7 0 .0 0 0 9 6 0. 03 1 0. 00 2 7 0. 08 7
-
`
,
,
`
5 0. 94 31 0. 00 3 2 0. 03 4 0. 00 90 0 .0 9 6
,
,
`
,
`
6 1. 15 14 0. 00 3 2 0. 07 4 0. 00 88 0. 21
,
,
`
-
-
-

Copyright ASTM International

Provided by IHS under license with ASTM
6
No reproduction or networking permitted without license from IHS Not for Resale
 E572 − 13
TABLE 8 Titanium (%)
Repeatability Reproducibility Repeatability Reproducibility
Average Standard Deviation Standard Deviation Limit Limit
Material ¯
X̄
X sr sR r R
7 0 .0 0 0 7 5 0 .0 0 0 3 4 0 .0 0 0 6 5 0 .0 0 0 9 4 0 . 00 1 8
2 0 .0 0 0 8 7 0 .0 0 0 3 8 0 .0 0 1 3 0.0011 0 . 0 03 6
3 0 .0 0 0 9 1 0 .0 0 0 4 5 0 .0 0 1 3 0. 00 12 0 . 0 03 7
5 0. 00 14 0.0011 0 .0 0 1 4 0 .0 0 3 0 0 .0 0 3 8
9 0. 00 20 0. 00 3 2 0 .0 0 3 3 0 .0 0 8 9 0 .0 0 9 3
10 0. 00 20 8 0. 00 0 23 0 .0 0 1 2 0 .0 0 0 6 5 0 . 00 3 3
6 0 .0 0 6 7 7 0 .0 0 0 7 0 0 .0 0 3 2 0. 00 20 0 . 0 09 1
1 0. 00 91 0. 00 1 2 0 .0 0 5 5 0 .0 0 3 3 0 .0 1 5
4 0 .0 4 8 9 2 0 .0 0 0 9 2 0 .0 0 4 0 0. 00 26 0.011
11 0 .1 0 1 6 0 .0 0 2 0 0 .0 0 6 7 0. 00 5 7 0. 01 9
8 0. 43 57 0. 00 2 5 0. 01 4 0. 00 70 0 .0 3 8

TABLE 9 Cobalt (%)

Repeatability Reproducibility Repeatability Reproducibility
Average Standard Deviation Standard Deviation Limit Limit
Material ¯
X̄
X sr sR r R
11 0 .0 1 7 9 0.0011 0 .0 0 9 7 0. 00 3 0 0. 02 7
3 0. 02 38 0. 00 1 4 0. 01 2 0. 00 39 0 .0 3 3
10 0 .0 3 5 3 0 .0 0 1 7 0 .0 1 2 0 .0 0 4 8 0 .0 3 3
2 0. 04 74 0. 00 1 3 0. 01 7 0. 00 37 0 .0 4 9
5 0. 04 90 0. 00 1 5 0. 05 4 0. 00 41 0. 15
6 0. 05 34 0. 00 2 2 0. 06 0 0. 00 63 0. 17
7 0. 15 57 0. 00 2 1 0 .0 0 6 9 0 .0 0 5 9 0 .0 1 9
8 0. 22 20 0. 00 1 5 0 .0 0 4 8 0 .0 0 4 3 0 .0 1 3
1 0. 23 34 0. 00 2 7 0. 01 0 0. 00 75 0 .0 2 8
4 0. 29 22 0. 00 3 0 0. 02 6 0. 00 84 0 .0 7 2
9 0. 40 20 0. 00 2 0 0. 03 8 0. 00 55 0.11

TABLE 10 Sulfur (%)

Repeatability Reproducibility Repeatability Reproducibility
Average Standard Deviation Standard Deviation Limit Limit
Material ¯
X̄
X sr sR r R
9 0 .0 0 2 3 9 0 .0 0 0 9 4 0 .0 0 2 7 0. 00 26 0 . 0 07 6
2 0. 00 39 0. 00 1 5 0 .0 0 2 5 0 .0 0 4 1 0 .0 0 7 1
10 0 .0 0 4 1 0 .0 0 1 9 0 .0 0 2 3 0. 00 5 4 0 .0 0 6 5
8 0. 00 42 0. 00 2 0 0 .0 0 2 4 0 .0 0 5 5 0 .0 0 6 7
1 0. 00 86 0. 00 1 6 0 .0 0 2 0 0 .0 0 4 6 0 .0 0 5 5
3 0. 01 69 0. 00 3 1 0 .0 0 3 9 0 .0 0 8 6 0.011
11 0 .0 1 8 8 0 .0 0 2 2 0 .0 0 4 6 0. 00 6 3 0. 01 3
5 0 .0 1 9 8 7 0 .0 0 0 9 4 0 .0 0 2 0 0. 00 26 0 . 0 05 6
6 0. 02 25 0. 00 1 7 0 .0 0 6 7 0 .0 0 4 9 0 .0 1 9
4 0. 02 41 0. 00 1 7 0 .0 0 1 9 0 .0 0 4 8 0 .0 0 5 4
7 0. 24 94 0. 00 4 4 0. 02 1 0 .0 1 2 0 .0 5 8
-
-
`
,
,
`
`
`
,
,
,
,
`
`
`
`
-
`
-
`
,
,
`
,
,
`
,
`
,
,
`
-
-
-

Copyright ASTM International

Provided by IHS under license with ASTM
7
No reproduction or networking permitted without license from IHS Not for Resale
 E572 − 13
TABLE 11 Vanadium (%)
Repeatability Reproducibility Repeatability Reproducibility
Average Standard Deviation Standard Deviation Limit Limit
Material ¯
X̄
X sr sR r R
5 0 .0 1 4 0 2 0 .0 0 0 6 5 0 .0 0 3 7 0. 00 18 0 .0 1 0
11 0. 02 39 2 0. 00 0 79 0 .0 0 3 7 0. 00 22 0 .0 1 0
1 0. 02 79 0. 00 1 6 0 .0 0 5 6 0 .0 0 4 3 0 .0 1 6
2 0 .0 5 6 6 3 0 .0 0 0 6 5 0 .0 0 5 3 0. 00 18 0 .0 1 5
9 0. 06 23 0. 00 1 0 0 .0 0 4 7 0 .0 0 2 9 0 .0 1 3
7 0 .0 7 0 9 0 0 .0 0 0 8 1 0 .0 0 4 2 0. 00 23 0 .0 1 2
6 0 .0 7 6 5 8 0 .0 0 0 9 8 0 .0 0 6 8 0. 00 27 0 .0 1 9
3 0 .0 9 0 4 9 0 .0 0 0 9 9 0 .0 0 5 8 0. 00 28 0 .0 1 6
4 0. 09 14 0. 00 1 0 0 .0 0 4 6 0 .0 0 2 9 0 .0 1 3
8 0. 13 72 0. 00 1 4 0 .0 0 8 9 0 .0 0 3 9 0 .0 2 5
10 0 .2 3 0 9 0 .0 0 2 4 0 .0 0 5 0 0. 00 6 7 0. 01 4

TABLE 12 Phosphorus (%)

Repeatability Reproducibility Repeatability Reproducibility
Average Standard Deviation Standard Deviation Limit Limit
Material ¯
X̄
X sr sR r R
6 0. 01 09 0. 00 2 8 0 .0 0 4 2 0 .0 0 7 9 0 .0 1 2
3 0 .0 1 6 0 5 0 .0 0 0 7 6 0 .0 0 1 0 0. 00 21 0 . 0 02 8
9 0. 01 65 0. 00 1 0 0 .0 0 2 8 0 .0 0 2 9 0 .0 0 7 8
1 0 .0 1 9 7 9 0 .0 0 0 7 7 0 .0 0 1 0 0. 00 22 0 . 0 02 9
5 0. 01 98 0.0011 0 .0 0 1 5 0 .0 0 3 1 0 .0 0 4 2
8 0 .0 2 1 4 2 0 .0 0 0 9 6 0 .0 0 1 4 0. 00 27 0 . 0 04 1
2 0. 02 29 0. 00 1 2 0 .0 0 1 4 0 .0 0 3 4 0 .0 0 3 9
10 0 .0 2 5 7 0 .0 0 4 5 0 .0 0 4 5 0 .0 1 3 0 .0 1 3
11 0 .0 2 6 2 0 .0 0 3 1 0 .0 0 4 8 0. 00 8 7 0. 01 3
4 0. 02 69 0. 00 2 9 0 .0 0 2 9 0 .0 0 8 1 0 .0 0 8 1
7 0. 02 76 0. 00 1 2 0 .0 0 1 7 0 .0 0 3 4 0 .0 0 4 7

TABLE 13 Nickel (%)

Assumed Deviation from Assumed
Material True Value Average Result True Value
3 0 .2 9 0 .2 4 3 6 -0.0464
2 2 .1 6 2.118 -0.042
11 3. 31 3 .2 9 9 -0.011
7 8 .1 4 8. 15 6 0 .0 1 6
5 9 .2 1 9. 23 7 0 .0 2 7
8 1 0. 01 1 0 .0 5 3 0 .0 4 3
1 1 0. 88 1 0 .9 3 8 0 .0 5 8
10 1 3 .1 0 1 3 .2 4 7 0 .1 4 7
6 1 8 .2 1 8 .5 8 4 0. 38 4
4 2 1. 15 2 1 .1 9 2 0 .0 4 2
9 3 4 .1 34.114 0. 01 4

TABLE 14 Chromium (%)

Assumed Deviation from Assumed
Material True Value Average Result True Value
6 2 .0 6 2. 06 7 0 .0 0 7
2 1 5. 64 1 5 .7 5 0.11
7 1 7. 21 1 7 .3 0 4 0 .0 9 4
8 1 7. 68 1 7 .7 2 1 0 .0 4 1
1 1 7. 81 1 7 .8 8 6 0 .0 7 6
5 1 8. 09 1 8 .1 8 5 0 .0 9 5
11 1 8 .9 0 1 9 .0 5 0 0 .1 5 0
9 1 9. 81 1 9 .9 8 0 0 .1 7 0
10 2 1 .1 7 2 1 .2 5 3 0 .0 8 3
3 2 4. 14 2 4 .1 2 1 -0.019
4 2 3. 98 2 4 .1 5 0. 16 8

-
-
`
,
,
`
`
`
,
,
,
,
`
`
`
`
-
`
-
`
,
,
`
,
,
`
,
`
,
,
`
-
-
-

Copyright ASTM International

Provided by IHS under license with ASTM
8
No reproduction or networking permitted without license from IHS Not for Resale
 E572 − 13
TABLE 15 Manganese (%)
Assumed Deviation from Assumed
Material True Value Average Result True Value
3 0 .3 1 5 0. 31 2 0 -0.0030
2 0 .4 2 0 .4 2 4 2 0. 00 42
9 0 .4 6 0 .4 4 3 0 -0.0170
5 0 .7 8 8 0. 76 3 7 -0.0243
11 0. 99 0. 95 9 3 -0.0307
1 0 .9 6 0 .9 6 5 8 0. 00 58
6 1 .5 0 1 .4 6 6 6 -0.0334
8 1 .6 3 1 .6 3 1 3 0. 00 13
4 1 .6 6 1 .6 5 8 7 -0.0013
7 1 .6 8 1. 73 5 0 .0 5 5
10 5. 09 4 .9 4 3 -0.147

TABLE 16 Copper (%)

Assumed Deviation from Assumed
Material True Value Average Result True Value
5 0 .0 2 9 6
3 0 .0 5 9 1
10 0 .0 7 5 0. 08 09 0. 00 5 9
1 0 .1 0 4 0. 10 8 4 0 .0 0 4 4
11 0. 14 0. 13 5 3 -0.0047
2 0 .1 6 2 0. 16 1 5 -0.0005
8 0 .3 0 0 .3 1 0 4 0. 01 04
7 0 .3 6 0 .3 6 7 2 0. 00 72
6 0 .4 4 0 .4 4 1 9 0. 00 19
4 0 .5 8 0 .5 8 7 3 0. 00 73
9 3 .2 6 3. 29 1 0 .0 3 1

TABLE 17 Molybdenum (%)

Assumed Deviation from Assumed
Material True Value Average Result True Value
5 0 .0 0 3 8
3 0 .0 1 3 5
2 0 .1 6 4 0. 16 5 9 0 .0 0 1 9
8 0 .3 3 0 .3 3 2 8 0. 00 28
1 0 .4 3 3 4
4 0 .4 6 0 .4 6 1 3 0. 00 13
7 0 .5 5 0 .5 6 6 0 0. 01 60
9 2 .1 0 2. 06 4 -0.036
10 2. 19 2 .2 0 5 0. 01 5
11 2. 59 2 .6 3 8 0. 04 8
6 3 .1 5 3. 09 6 -0.054

TABLE 18 Silicon (%)

Assumed Deviation from Assumed
Material True Value Average Result True Value
9 0 .2 4 0 .2 5 6 4 0. 01 64
10 0. 32 0. 32 1 0 0 .0 0 1 0
8 0 .4 0 0 .3 9 4 7 -0.0053
5 0 .5 2 0 .5 0 3 0 -0.0170
2 0 .5 4 5 0. 55 2 2 0 .0 0 7 2
7 0 .5 8 0 .5 7 7 7 -0.0023
3 0 .5 8 0 .5 9 7 8 0. 01 78
11 0. 67 0. 67 2 6 0 .0 0 2 6
1 0 .8 2 0. 82 5 0 .0 0 5
4 1 .6 6 1. 67 9 0 .0 1 9
6 1 .8 0 1. 78 9 -0.011
-
-
`
,
,
`
`
`
,
,
,
,
`
`
`
`
-
`
-
`
,
,
`
,
,
`
,
`
,
,
`
-
-
-

Copyright ASTM International

Provided by IHS under license with ASTM
9
No reproduction or networking permitted without license from IHS Not for Resale
 E572 − 13
TABLE 19 Niobium (%)
Assumed Deviation from Assumed
Material True Value Average Result True Value
3 0 .0 0 6 2
2 0 .0 1 4 7
8 0 .0 1 0 .0 1 5 4 0. 00 54
7 0 .0 1 6 5
11 0. 07 0. 06 6 6 -0.0034
4 0 .0 5 0 0. 07 1 9 0 .0 2 1 9
1 (0.16) 0. 19 3 8 0 .3 5 3 8
10 0. 22 0. 21 3 4 -0.0066
9 0 .5 1 0 .4 8 3 2 -0.0268
5 0 .9 9 0. 94 3 -0.047
6 1 .2 2 1. 15 1 -0.069

TABLE 20 Titanium (%)

Assumed Deviation from Assumed
Material True Value Average Result True Value
7 0. 00 0 75
2 0 .0 0 0 9
3 0 .0 0 0 9
5 0. 00 1 45
9 0 .0 0 2 0. 00 2 0 0 .0 0 0 0
10 0 .0 0 2 0. 00 21 0. 00 0 1
6 0 .0 0 6 8
1 (0.01) 0. 00 9 1
4 0 .0 5 0 0. 04 8 9 -0.0011
11 0.11 0. 10 1 6 -0.0084
8 0 .4 5 0. 43 6 -0.014

TABLE 21 Cobalt (%)

Assumed Deviation from Assumed
Material True Value Average Result True Value
11 0 .0 1 7 9
3 0. 02 4
10 0 .0 3 4 0 .0 3 5 0 .0 0 1
2 0. 04 7
5 0. 04 9
6 0. 05 3
7 0 .1 6 0 .1 5 5 7 -0.0043
8 0 .2 3 0 .2 2 2 0 -0.0080
1 0 .2 2 0 .2 3 3 4 0. 01 34
4 0 .3 1 0. 29 2 -0.018
9 0 .4 1 0. 40 2 -0.008

TABLE 22 Sulfur (%)

Assumed Deviation from Assumed
Material True Value Average Result True Value
9 0 .0 0 2 0. 00 2 39 0 .0 0 0 3 9
2 0 .0 0 1 0. 00 3 9 0 .0 0 2 9
10 0 .0 0 3 0. 00 41 0.0011
8 0. 00 18 0. 00 42 0. 00 2 4
1 0. 00 64 0. 00 86 0. 00 2 2
3 0 .0 1 5 0. 01 6 9 0 .0 0 1 9
11 0 .0 2 6 0. 01 88 -0.0072
5 0 .0 1 9 0. 01 9 87 0 .0 0 0 8 7
6 0 .0 2 5 0. 02 2 5 -0.0025
4 0 .0 2 4 0. 02 4 1 0 .0 0 0 1
7 0 .3 0 9 0. 24 9 4 -0.0596

--`,,```,,,,````-`-`,,`,,`,`,,`---

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 E572 − 13
TABLE 23 Vanadium (%)
Assumed Deviation from Assumed
Material True Value Average Result True Value
5 0. 01 4 02
11 0 .0 3 0 0 .0 2 3 9 2 -0.00608
1 0 .0 5 6 0. 02 7 9 -0.0281
2 0 .0 5 9 0. 05 6 63 -0.00237
9 0 .0 7 0 .0 6 2 3 -0.0077
7 0. 07 0 90
6 0. 07 6 58
3 0 .0 8 0 .0 9 0 4 9 0. 01 04 9
4 0 .0 9 0 .0 9 1 4 0. 00 14
8 0 .1 3 0 .1 3 7 2 0. 00 72
10 0. 23 0. 23 0 9 0 .0 0 0 9

TABLE 24 Phosphorus (%)

Assumed Deviation from Assumed
Material True Value Average Result True Value
6 0.011 0. 01 0 9 -0.0001
-
-
`
,
,
`
`
`
,
3 0 .0 1 8 0. 01 6 05 -0.00195
,
,
,
`
`
9 0 .0 1 8 0. 01 6 5 -0.0015
`
`
-
`
-
1 0 .0 2 1 0. 01 9 79 -0.00121
5 0 .0 1 8 0. 01 9 8 0 .0 0 1 8
`
,
,
`
,
,
`
,
`
8 0 .0 2 2 0. 02 1 42 -0.00058
,
,
`
-
-
2 0 .0 2 6 0. 02 2 9 -0.0031
-

10 0 .0 2 8 0. 02 57 -0.0023
11 0 .0 2 7 0. 02 62 -0.0008
4 0 .0 2 9 0. 02 6 9 -0.0021
7 0 .0 3 0 0. 02 7 6 -0.0024

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