Université La sagesse

Faculté d’Ingénierie
Polytech – Beirut

LAB # 3:
Node Voltage and Mesh Current

PHY 205
Nancy El-Hajj: 202300390
Charbel Makhlouf: 202301225

Dr. Fouad Farah

Feb-19-2024

1|P a g e
Université La sagesse
Faculté d’Ingénierie
Polytech – Beirut

TABLE OF CONTENTS
I. Materials and equipement: ................................................................................................................. 3
II. Objectifs:............................................................................................................................................... 3
III. Abstarct: ............................................................................................................................................... 3
IV. Introduction:......................................................................................................................................... 4
V. Part I: Node Voltage Analysis............................................................................................................... 4
Experiment 1: ........................................................................................................................................... 5
1.1.Theorical basics: .................................................................................................................................. 5
1.2. Multisim: ............................................................................................................................................ 6
1.3.Results: ................................................................................................................................................ 8
Experiment 2: ........................................................................................................................................... 9
2.1.Theorical basics: .................................................................................................................................. 9
2.2. Multisim: .......................................................................................................................................... 10
2.3. Results: ............................................................................................................................................. 12
VI. Part II: Mesh Current Analysis ........................................................................................................... 14
3.1.Theorical basics: ................................................................................................................................ 14
3.2.Multisim: ........................................................................................................................................... 15
3.3.Results: .............................................................................................................................................. 16
VII. CONCUSION ........................................................................................................................................ 17

TABLE OF FIGURES
Figure 1: Exp1-Voltage value measured by multisim.................................................................................... 6
Figure 2:Exp1- Current value measured by multisim.................................................................................... 7
Figure 3:Exp2- Voltage value measured by multisim.................................................................................. 10
Figure 4:Exp2-Current value measured by multisim .................................................................................. 11
Figure 5:Exp3-Voltage value measured bu multisim .................................................................................. 15
Figure 6:Exp3-Current value measured by multisim .................................................................................. 16

LIST OF TABLES:
Table 1: Exp1- Theorical, Measured and Multisim Values in different parameters ..................................... 9
Table 2: Exp2- Theorical, Measured and Multisim Values in different parameters ................................... 13
Table 3: Exp3- Theorical, Measured and Multisim Values in different parameters ................................... 17

2|P a g e
Université La sagesse
Faculté d’Ingénierie
Polytech – Beirut
I. MATERIALS AND EQUIPEMENT :
1. Resistors
2. Multimeter
3. Breadboard
4. DC power supply
5. Wires
6. Mutlisim

II. OBJECTIFS:
1. Utilize Node Voltage and Mesh Current methods to analyze the circuit and determine the
voltages and currents present.
2. Conduct a comparative analysis between the theoretical values (obtained through
computation) of resistance, voltage, and current in the circuit with the experimental
values.
3. Demonstrate the consistency and accuracy of the computed theoretical values derived
from Nodal and Mesh analyses by showing their close alignment with the experimental
values.

III. ABSTARCT:
This lab project focuses on the exploration and practical application of node voltage and mesh
current analysis techniques in electrical circuits. The study aims to deepen understanding and
proficiency in solving complex circuits by systematically investigating the relationships between
node voltages and mesh currents. Through theoretical foundations and practical experiments,
the project evaluates the effectiveness of both node voltage and mesh current analyses,
highlighting their versatility in handling circuits with multiple components and interconnected
nodes. The comparison of calculated results with experimental measurements and consideration
of practical factors contribute to a comprehensive learning experience, providing students with
essential skills for analyzing and troubleshooting intricate electrical circuits in real-world
scenarios.

..

3|P a g e
Université La sagesse
Faculté d’Ingénierie
Polytech – Beirut
IV. INTRODUCTION :
The analysis of complex circuits is a fundamental skill that underpins the design and
troubleshooting of various electronic systems. This laboratory project embarks on a journey to
explore and apply two essential techniques—node voltage and mesh current analysis—in the
context of electrical circuit analysis. Nodal and mesh methods serve as powerful tools for
understanding and solving intricate circuits by systematically addressing the relationships
between node voltages and mesh currents. This project aims to not only deepen theoretical
knowledge but also provide hands-on experience through practical experiments. By delving into
the practical applications of these techniques and comparing calculated results with
experimental measurements, the project equips students with the skills necessary to analyze and
comprehend the behavior of complex electrical circuits, fostering a solid foundation for future
endeavors.

V. PART I: NODE VOLTAGE ANALYSIS

Voltage is consistently described as the potential difference between two points within a circuit.
When referring to the voltage at a specific point in the circuit, it implies that the measurement is
conducted between that point and another point, often referred to as ground. The node method,
or node voltage method, proves to be a highly effective technique for analyzing circuits, utilizing
Kirchhoff's Current Law (KCL), Kirchhoff's Voltage Law (KVL), and Ohm’s Law. The steps involved
in circuit analysis using the node method are as follows:

• Identify and distinguish all circuit elements and values, separating those sought after from
those given.
• Recognize all essential nodes in the circuit, which are points where two or more elements
connect.
• Select one node as the reference or ground, assigning it a value of 0 Volts. The voltages
of other nodes are measured in relation to this reference node.
• Label the voltages at all remaining nodes.
• Apply KCL at each node, expressing branch currents as functions of node voltages.
• Solve the resulting system of equations to determine the node voltages.
• With known node voltages, use Ohm’s Law to obtain branch currents.

4|P a g e
Université La sagesse
Faculté d’Ingénierie
Polytech – Beirut
EXPERIMENT 1:
1.1. THEORICAL BASICS:
In the lab experiment, nodal analysis was employed to determine the voltages at nodes A and B
in the given circuit, as depicted in Figure 1. This analytical technique involves applying Kirchhoff's
Current Law (KCL) at essential nodes of the circuit and solving resulting equations to find node
voltages. By systematically applying nodal analysis, the voltages at nodes A and B were
calculated, providing valuable insights into the distribution of potential within the circuit.
Concurrently, the experimental setup involved using a multimeter to directly measure voltages
across various components of the circuit, such as resistors and the voltage source. These
experimental measurements served as empirical validation of the theoretical values obtained
through nodal analysis, thereby confirming the accuracy of the analytical approach. Additionally,
the currents flowing through each resistor were measured using the multimeter. This step
allowed for a comprehensive understanding of the circuit's behavior, as it provided insight into
the distribution of current throughout the circuit and facilitated comparisons between
theoretical predictions and experimental observations. Overall, the combination of nodal
analysis and experimental measurements facilitated a thorough characterization of the circuit,
highlighting the importance of both theoretical analysis and practical experimentation in
electrical engineering studies.

5|P a g e
Université La sagesse
Faculté d’Ingénierie
Polytech – Beirut
1.2. MULTISIM:
1.2.1. V OLTAGE ACROSS RESISTORS
A closed loop which contains 4 resistors and also with a DC Power Supply with the value of 10V
is connected. The resistors each respectfully having the units below: two 1kΩ, 2.2kΩ and 4.7kΩ.
Their voltages are measured by using a multimeter.

FIGURE 1: EXP1-VOLTAGE VALUE MEASURED BY MULTISIM

6|P a g e
Université La sagesse
Faculté d’Ingénierie
Polytech – Beirut
1.2.2.C URRENT ACROSS RESISTOR :
A closed loop which contains 4 resistors and with a DC Power Supply with the value of 10V is
connected. The resistors each respectfully having the units below: 1kΩ, 2.2kΩ and 4.7kΩ. Their
current is measured by using a multimeter

FIGURE 2:EXP1- CURRENT VALUE MEASURED BY MULTISIM

7|P a g e
Université La sagesse
Faculté d’Ingénierie
Polytech – Beirut
1.3.RESULTS:

By applying the node voltage analysis:

VA-Vo=10⇒ VA=10V

Using KCL at node B:

-I1+12+13=0

=> -(Va+Vb) /R1 + (Vb-Vc) /R2 + Vb/R3 = 0

⇒R2R3(VB-VA) +R1Rз(VB-VC) +R1R2VB=0

⇒ R2R3VB-R2R3VA+R1R3VB-R1R3VC+R1R2VB-0

⇒(R2R3+R1R3+R1R2) VB-R1R3VC=R2R3VA

⇒ 1724VB-220VC= 10340

Using KCL at node C:

-I2+I4=0

⇒ -(Vb-Vc)/ R2 + (Vc+15/ R4 = 0

⇒ R4(VC-VB) +R2(Vc+15) =0

⇒ R4VC-R4VB+R2Vc+15R2=0

⇒-10 VB+57Vc=-705 (2)

By solving the system of 2 equations, VB-4.52V, Vc=-11.57V

VI=VA-VB-10-4.52=5.48V

V2=VB-VC-4.52-(-11.57) =16.09V

V3=VB-VO-VB=4.52V

V4=VC+15=-11.57+15=3.43V

Using Ohm's law, I=V/R

I1=V1/R1-5.48/1000=5.48×10-3A

I2=V2/R2-16.09/4700=3.42×10-3A

I3=V3/R3-4.52/2200=2.05×103A

I4=V4/R4-3.43/1000=3.43×103A Is=I1=3.43×10-3A

8|P a g e
Université La sagesse
Faculté d’Ingénierie
Polytech – Beirut
TABLE 1: EXP1- THEORICAL, MEASURED AND MULTISIM VALUES IN DIFFERENT PARAMETERS

Parameters Theorical values Measured values Multisim

R1 1 kΩ 0.977 kΩ 1 kΩ
R2 4.7 kΩ 4.67 kΩ 4.7 kΩ
R3 2.2 kΩ 2.19 kΩ 2.2 kΩ
R4 1 kΩ 0.971 kΩ 1 kΩ
VA 10V 9.7V Non-mesurée
VB 4.52V 4.35V Non-mesurée
V across R1 5.48V 5.34 V 5.479 V
V across R2 16.09V 15.97 V 16.096 V
V across R3 4.52V 4.52 V 4.524 V
V across R4 3.43V 3.41 V 3.425 V
I1 5.48×10-3A 5.53 mA 5.479 mA
I2 3.42×10-3A 3.47 mA 3.425 mA
I3 2.05×103A -2.04 mA -2.055 mA
I4 3.43×103A 3.43 mA 3.425 mA
Is 3.43×10-3A 5.5 mA 5.479 mA

EXPERIMENT 2:
2.1.THEORICAL BASICS:
In this experiment, a circuit is constructed as shown in Figure 2 and performed various analyses
to understand its behavior. Firstly, nodal analysis is applied to determine the voltages at nodes
A, B, and C, with the calculated values recorded in Table 2 along with the detailed working.
Additionally, a multimeter is used to measure voltages across different components of the circuit,
such as resistors and the voltage source, and these experimental values were also documented
in Table 2. Furthermore, the currents flowing through each resistor were measured using the
multimeter and recorded these values in the same table. Finally, they computed the percent
deviation between the theoretical and measured values to assess the accuracy of our theoretical
predictions compared to the experimental observations. This comprehensive analysis allowed us
to gain insights into the performance of the circuit and validate our theoretical understanding
against real-world measurements.

9|P a g e
Université La sagesse
Faculté d’Ingénierie
Polytech – Beirut
2.2. MULTISIM:
2.2.1. V OLTAGE ACROSS RESISTORS :
In this setup, another resistor was introduced with the value of 2.2kΩ which is in derivation with
R1 and R2 and another DC Power Supply of 12V and the voltage of these 5 resistors was measured
using Multisim.
FIGURE 3:EXP2- VOLTAGE VALUE MEASURED BY MULTISIM

10 | P a g e
Université La sagesse
Faculté d’Ingénierie
Polytech – Beirut

2.2.2.CURRENT ACROSS RESISTOR:

In this setup, another resistor was introduced with the value of 2.2kΩ which is in derivation with
R1 and R2 and another DC Power Supply of 12V and current of these 5 resistors was measured
using Multisim

FIGURE 4:EXP2-CURRENT VALUE MEASURED BY MULTISIM

11 | P a g e
Université La sagesse
Faculté d’Ingénierie
Polytech – Beirut

2.3. RESULTS:

By applying the node voltage analysis:

VA-V0-10⇒ VA=10V

Using KCL at node B:

-I1+12+13=0

=> -(Va-Vb) /R1 + (Vb-Vc) /R2 + Vb/R3 = 0

⇒ R2R3(VB-VA) +R1R3(VB-VC) +R1R2VB=0

⇒R2R3VB-R2R3VA+R1R3VB-R1R3VC+R1R2VB-0

⇒(R2R3+R1R3+R1R2) VB-R1RзVC=R2R3VA

⇒ 1724VB-220Vc=10340 (1)

Using KCL at node C:

-I2-I5+I4=0

⇒ -(VB-VC) /R2- (VA-VC) /R5 + (VC+15) /R4= 0

⇒ R4R5(VC-VB) +R2R4(Vc-V^)+R2Rs(Vc+15)=0

⇒ R4R5VC-R4R5VB+R2R4Vc-R2R4VA+R2R5Vc+15R2R5=0

⇒(-R4R5) Vb+(R4R5+R2R4+R2R5) Vc-R2R4VA-15R2R5

⇒-220 Vb+1724Vc=-10810 (2)

By solving the system of 2 equations, VB-5.28V, Vc--5.5V

VI=Va-Vb=10-5.28=4.72V

V2=Vb-Vc=-5.28-(-5.5) =10.78V

V3=Vb-V0-VB=5.28V

V4=Vc+15=-5.5+15=9.5V

V5=V1+V2=4.72+10.78=15.5V

Using Ohm's law, I=V/R

I1=V1/R1-4.72/1000=4.72×10-3A

12 | P a g e
Université La sagesse
Faculté d’Ingénierie
Polytech – Beirut
I2=V2/R2=10.78/4700=2.29×10-3A

I3=V3/R3-5.28/2200=2.4×10-3A

I4=V4/R4-9.5/1000=9.5×10-3A

Is=Vs/Is=15.5/2200=7.04×103A

Is=I1=4.72×10-3A

These values are compared to the measured ones in the table below:

TABLE 2: EXP2- THEORICAL, MEASURED AND MULTISIM VALUES IN DIFFERENT PARAMETERS

Parameters Theorical values Measured values Multisim

R1 1 kΩ 0.974 kΩ 1 kΩ
R2 4.7 kΩ 4.68 kΩ 4.7 kΩ
R3 2.2 kΩ 2.18 kΩ 2.2 kΩ
R4 1 kΩ 0.976 kΩ 1 kΩ
R5 2.2 kΩ 2.2 kΩ 2.2 kΩ
VA 10 V 9.7 V Not-measured
VB 5.28 V 5.15V Not-measured
VC -5.5 V -5.35V Not-measured
V across R1 4.72V 5.34 V 4.716 V
V across R2 10.78V 15.97 V 10.88 V
V across R3 5.28V 4.52 V 5.284 V
V across R4 9.5V 3.41 V 9.404 V
V across R5 15.5V 15.47 V 15.596 V
I1 4.72×10-3A 5.53 mA 4.716 mA
I2 2.29×10-3A 3.47 mA 2.315 mA
I3 2.4×10-3A -2.04 mA -2.402 mA
I4 9.5×10-3A 3.43 mA 9.404 mA
I5 4.72×10-3A 5.5 mA 7.89

13 | P a g e
Université La sagesse
Faculté d’Ingénierie
Polytech – Beirut
VI. PART II: MESH CURRENT ANALYSIS
The mesh method employs mesh currents as the circuit variables, and the approach to obtaining
a solution is akin to that employed in the Node method. The sequential steps involved in this
method are outlined below:

1. Clearly define and categorize all circuit parameters, distinguishing between unknown and
known parameters.
2. Identify all meshes within the circuit.
3. Attribute mesh currents and designate polarities.
4. Apply Kirchhoff's Voltage Law (KVL) at each mesh, expressing voltages in terms of the
assigned mesh currents.
5. Solve the resulting system of simultaneous equations to determine the mesh currents.
6. With the mesh currents known, derive voltages using Ohm’s Law.

Experiment 3:
3.1.THEORICAL BASICS:
Our primary objective was to perform voltage and current measurements across various
components to characterize its behavior. Utilizing a multimeter, the voltages across the DC
supplies and all resistors within the circuit are measured, recording these values meticulously in
Table 3. This step provided valuable insights into the voltage distribution across different
elements of the circuit, facilitating a comprehensive understanding of its operation. Additionally,
an ammeter was employed to measure the mesh currents Ia and Ib, representing the currents
flowing through R5 and R4, respectively. These current measurements were essential for
analyzing the flow of current within the circuit, allowing us to assess how current is distributed
through different branches and components. By recording these values in Table 3, a
comprehensive dataset was compiled that serves as a basis for further analysis and interpretation
of the circuit's behavior.

14 | P a g e
Université La sagesse
Faculté d’Ingénierie
Polytech – Beirut
3.2.MULTISIM:
3.2.1. V OLTAGE ACROSS RESISTORS :
This is a circuit with 2 DC power supply each having the value of 10 and 12V, five resistors with
the respected values of 1kΩ, 1.8kΩ, 2.2kΩ ,4.7kΩ and 6.8kΩ in which the voltage is measured.

FIGURE 5:EXP3-VOLTAGE VALUE MEASURED BU MULTISIM

3.2.2. C URRENT ACROSS RESISTORS :

This is a circuit with 2 DC power supply each having the value of 10 and 12V, five resistors with
the respected values of 1kΩ, 1.8kΩ, 2.2kΩ ,4.7kΩ and 6.8kΩ in which the current is measured.

15 | P a g e
Université La sagesse
Faculté d’Ingénierie
Polytech – Beirut
FIGURE 6:EXP3-CURRENT VALUE MEASURED BY MULTISIM

3.3.RESULTS:
Using KVL in mesh a:

-12+V1+V3+V5-0 (Ohm's law V=R/I)

⇒-12+R1I1+R313+R5I5-0 (I1-Is-Ia same current in a series circuit)

-12+R1la+R5la+R3I3=0 (I3-Ia+Ib KCL)

⇒(R1+R5) la+R3(la+Ib) =12

⇒(R1+R3+R5) la+R3Ib=12

⇒96001a +18001-12 (1)

Using KVL in mesh b,

-V2+10-V4-V3-0 (Ohm's law V=R/I)

-R212+10-R414-R313-0 (12-14-Ib same current in a series circuit)

-R2Ib+10-R4Ib-R313-0 (I3-Ia+lb KCL)

(R2+R4) Ib+R3(Ia + Ib) =10

R3la+(R2+R4+R3) Ib=10.

18001+ 87001ь=10 (2)

By solving the system of 2 equations, la=1.076×103A, Ib=9.26×10 4A, I3=2.002×10-3A

16 | P a g e
Université La sagesse
Faculté d’Ingénierie
Polytech – Beirut
By using Ohm's law,

V1=R1Ia=1000×1.076×10^3=1.076 V

V2=R2Ib=4700×9.26×10^4=4.352 V

V3=R313=1800×2.002×10^-3=3.6036 V

V4=R4Ib=2200×9.26×10^4=2.0372 V

VS=RsIa-6800×1.076x10^-3=7.3168

TABLE 3: EXP3- THEORICAL, MEASURED AND MULTISIM VALUES IN DIFFERENT PARAMETERS

Parameters Theorical values Measured values Multisim

R1 1 kΩ 0.973 kΩ 1 kΩ
R2 4.7 kΩ 4.67 kΩ 4.7 kΩ
R3 1.8 kΩ 1.74 kΩ 1.8 kΩ
R4 2.2 kΩ 2.19 kΩ 2.2 kΩ
R5 6.8 kΩ 6.74 kΩ 6.8 kΩ
V across R1 1.076 V 1.05 V 1.076 V
V across R2 4.352 V 4.33 V 4.356 V
V across R3 3.6036 V 3.52 V 3.605 V
V across R4 2.0372 V 2.01 V 2.039 V
V across R5 7.3168 V 7.34 V 7.318 V
Ia 1.076×103 A 1.06 mA 1.08 mA
Ib 9.26×104A 0.93 mA 0.927 mA
I3 2.002×10-3A 2.96 mA 2 mA
I4 9.26×104A 0.92 mA 0.927 mA
I5 1.076×103 A 1.06 mA 1.08 mA

VII. CONCUSION
The theoretical analysis of the circuit provided insights into the behavior of each component
within the circuit. By applying fundamental principles of circuit analysis such as Ohm's Law and
Kirchhoff's Voltage Law, they were able to determine the theoretical values of voltage across
each resistor and the current flowing through them. This process not only helped in
understanding how the circuit operates but also provided a basis for comparing theoretical
predictions with experimental results, allowing for validation or refinement of theoretical
models. Additionally, the experience underscored the importance of systematic analysis
techniques in electrical engineering, emphasizing the significance of understanding circuit
fundamentals for designing and troubleshooting complex electrical systems.

17 | P a g e