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Simulations in Engineering:
Proceedings of ICCES2019 Hiroshi
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Mechanisms and Machine Science 75
Hiroshi Okada
Satya N. Atluri Editors
Computational
and Experimental
Simulations in
Engineering
Proceedings of ICCES2019
Mechanisms and Machine Science
Volume 75
Series Editor
Marco Ceccarelli
Department of Industrial Engineering,
University of Rome Tor Vergata, Roma, Italy
Editorial Board
Alfonso Hernandez
Mechanical Engineering, University of the Basque Country, Bilbao, Vizcaya, Spain
Tian Huang
Department of Mechatronical Engineering, Tianjin University, Tianjin, China
Yukio Takeda
Mechanical Engineering, Tokyo Institute of Technology, Tokyo, Japan
Burkhard Corves
Institute of Mechanism Theory, Machine Dynamics and Robotics, RWTH Aachen
University, Aachen, Nordrhein-Westfalen, Germany
Sunil Agrawal
Department of Mechanical Engineering, Columbia University,
New York, NY, USA
This book series establishes a well-defined forum for monographs, edited Books,
and proceedings on mechanical engineering with particular emphasis on MMS
(Mechanism and Machine Science). The final goal is the publication of research that
shows the development of mechanical engineering and particularly MMS in all
technical aspects, even in very recent assessments. Published works share an
approach by which technical details and formulation are discussed, and discuss
modern formalisms with the aim to circulate research and technical achievements
for use in professional, research, academic, and teaching activities.
This technical approach is an essential characteristic of the series. By discussing
technical details and formulations in terms of modern formalisms, the possibility is
created not only to show technical developments but also to explain achievements
for technical teaching and research activity today and for the future.
The book series is intended to collect technical views on developments of the
broad field of MMS in a unique frame that can be seen in its totality as an
Encyclopaedia of MMS but with the additional purpose of archiving and teaching
MMS achievements. Therefore, the book series will be of use not only for
researchers and teachers in Mechanical Engineering but also for professionals and
students for their formation and future work.
The series is promoted under the auspices of International Federation for the
Promotion of Mechanism and Machine Science (IFToMM).
Prospective authors and editors can contact Mr. Pierpaolo Riva (publishing
editor, Springer) at: pierpaolo.riva@springer.com
Indexed by SCOPUS and Google Scholar.
Editors
Computational
and Experimental
Simulations in Engineering
Proceedings of ICCES2019
123
Editors
Hiroshi Okada Satya N. Atluri
Department of Mechanical Engineering Department of Mechanical Engineering
Tokyo University of Science Texas Tech University
Noda, Chiba, Japan Lubbock, TX, USA
This Springer imprint is published by the registered company Springer Nature Switzerland AG
The registered company address is: Gewerbestrasse 11, 6330 Cham, Switzerland
Preface
v
Contents
vii
viii Contents
Index . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1341
Part I
Advances in Experimental Solid Mechanics
Chapter 1
Investigation of Systematic Error
Characteristics and Error Elimination
Method in Digital Image Correlation
Abstract In this study, systematic errors and an error elimination method in digital
image correlation are investigated for improving accuracy and spatial resolution of
deformation measurements. Characteristics of the systematic error of measured dis-
placements in DIC are investigated using an imaging process simulation. The speckle
size of the random pattern on the target surface, the gap between each micro lens on
the imaging sensor, and the relative position between the micro lenses and the imaged
pattern on the micro lenses are considered in the simulation. The error investigation
results show that those factors affect the characteristics of the systematic error. Pos-
sible error characteristics in actual DIC measurements using random patterns are
considered. It is then found that the function of the possible error characteristics
shows complex profile and the error becomes zero at integer displacements in pixel.
In practical deformation measurement in DIC, the error profile can be obtained using
additional measured shift data, if the actual shift amount as the relative translation
amount of the target and the camera is known. The function approximation of the
error profile and an error elimination method are investigated.
S. Arikawa (B)
Meiji University, 1-1-1 Higashimita, Tama-ku, Kawasaki, Kanagawa 214-8571, Japan
e-mail: arikawa@meiji.ac.jp
Y. Kume
Graduate School of Science and Technology, Meiji University, 1-1-1 Higashimita, Tama-ku,
Kawasaki, Kanagawa 214-8571, Japan
S. Yoneyama
Aoyama Gakuin University, 5-10-1 Fuchinobe, Chuo-ku, Sagamihara, Kanagawa 252-5258, Japan
Y. Fujimoto
Mitsubishi Electric Corporation, 8-1-1 Tsukaguchi-honmachi, Amagasaki, Hyogo 661-8661,
Japan
1.1 Introduction
Recently digital image correlation (DIC) [1] is widely used for various deformation
measurements because of its usefulness. The error of measurement results by DIC
depends on interpolation functions for the subpixel calculation in the image correla-
tion [2] and is affected by subset shape functions [3]. The measurement accuracy is
improved by using high order functions for the subpixel interpolation and by using
the large subset area for image correlation. However, using the high order interpola-
tion functions and the large subset area cause degradation of the spatial resolution of
the measurement. Therefore, the realization of the coexistence of the high accuracy
measurement with the high spatial resolution is still difficult. One of the solutions
in a real object scale is using a high resolution camera with optimizing the optical
magnification of the imaging lens. However, the image resolution of cameras and
the optical resolution of lenses have limitations. On the other hand, if the error that
occurs with a small subset area or a low order interpolation function can be elimi-
nated, the coexistence of the high accuracy with the high spatial resolution will be
attained. Authors have developed an error elimination method [4, 5]. But some low
level errors have remained. To develop a high accuracy error elimination method, the
error generation mechanism of DIC measurement should be elucidated more clearly.
Also the authors have reported that some physical factors of the imaging process
affect the error profile and there is a possibility to develop a high accuracy error
elimination method [6].
In this study, imaging process simulations are performed for investigating the
effect of various factors such as the arrangement of the micro-lens array on the
imaging sensor, the imaged speckle size on the micro-lens array and their relative
positions. The effects of various factors for the error profiles are then investigated.
Additionally, an error elimination method is considered.
Not only the data processes, but also some physical factors affect the error generation.
As shown in Fig. 1.1, the shape and the size of the micro-lens relating the sampling
area of light intensities are not the same as those of the pixel. Therefore, some of the
light intensity of the imaged pattern enter gaps between the micro-lenses and are lost
in the sampling process. This means that the shape and the size of the micro-lens,
the imaged speckle size and their relative position affect characteristics of the error
in DIC.
In the imaging process simulation in this study, the light intensity is calculated
from the overlap area of the imaged spackle and the micro-lens array which the
shape and the gap between the lenses are considered. Various initial conditions such
as the center position distance for the initial state as shown in Fig. 1.1 and various
known displacements are given for the simulation images. In this study, grid layout
1 Investigation of Systematic Error Characteristics and Error … 5
speckle pattern images and random layout speckle pattern images are generated. The
generated images have the size of 500 × 500 pixels with 250 speckles. For the grid
layout, each speckle is arranged on each centers of regions of 10 × 10 pixels. For the
random layout, each speckle is arranged as random position without their overlaps.
When speckle diameter is 5 pixels, the area ratio of the speckles is about 20%. The
simulated images are saved as a general data format. The DIC measurements are
applied for the images made by the simulation. In the DIC calculation, bi-linear
interpolation is used for the sub-pixel calculation. The subset size is set to 31 × 31
pixels. Effects of various factors for the error are then investigated.
Error profiles of various center position distance using the grid arranged speckle
patterns without the gaps between the micro-lenses are shown in Fig. 1.2a. The center
position distance is calculated from 0 to 0.9 pixel with a pitch of 0.1 pixel. Results of
0, 0.2, 0.4, 0.5, 0.6, 0.8 pixel of the center position distance are shown in the figure.
These error profiles show various shapes. The averaged profile is also shown in the
figure. The averaged profile has relatively small amplitude and becomes zero at the
displacements of 0 and 0.5 pixel. In this simulation using the grid arranged speckle
pattern, relative positions of the speckles and the micro-lenses in the subset region are
the same. Thus each error profile indicates the characteristics of each relative position
of the speckle and the micro-lens. The averaged profile means that effects of various
initial positions of the speckle on the micro-lens array are averaged. Therefore, if
randomly arranged speckle pattern is used, the characteristics of sufficient number
of speckles in an enough size of a subset becomes the same as the averaged profile
6 S. Arikawa et al.
(a) Without gaps between micro-lenses (b) Without gaps, bi-cubic interpolation
(c) With gaps, lens diameter of 0.8 pixel (d) With gaps, square lens of 0.8 × 0.8 pixel
using the grid pattern [6]. The maximum amplitude of the error profiles is 0.051 pixel
and that of the averaged profile is 0.021 pixel. The amplitude of the averaged profile
is not flat because of the sub-pixel intensity interpolation. If high-order interpolation
functions are used, the amplitude can be reduced [2]. Error profiles using bi-cubic
polynomial interpolation for the same simulation images are shown in Fig. 1.2b. The
maximum amplitude of the error profiles is 0.034 pixel and that of the averaged profile
is 0.003 pixel. Especially the amplitude of the averaged profile drastically decreases.
Figure 1.2c shows error profiles with the gaps between the micro-lenses. The round
shaped micro-lenses with the diameter of 0.8 pixel are used for the simulation.
Amplitudes of the error profiles are larger than those without the gaps as shown (a).
The maximum amplitude of the error profiles is 0.120 pixel and that of the averaged
profile is 0.025 pixel. There is no big difference in the averaged error profile with
that without the gaps. Figure 1.2d shows error profiles with the gaps between square
shaped micro-lenses. The dimension of the square shaped micro-lenses is 0.8 × 0.8
pixel. Amplitudes of the error profiles slightly decrease from those using the round
shaped micro-lenses as shown (c). The maximum amplitude of the error profiles is
1 Investigation of Systematic Error Characteristics and Error … 7
0.097 pixel and that of the averaged profile is 0.027 pixel. The amplitude of the
averaged error profile slightly increases from that using the round shaped micro-
lenses. From the above results, it is found that the existence of the gaps between the
micro-lenses and the shape of the micro-lenses affect the error profiles.
Figure 1.3 shows the error profile using randomly arranged speckle patterns with
the gaps between square shaped micro-lenses of 0.8 × 0.8 pixel. About nine speckles
are included in the subset region of 31 × 31 pixels. In this situation, the error profile
is complex and is not close to the averaged profile using the grid pattern, because the
characteristics of each speckle position are not averaged enough. Actually, various
patterns of complex error profiles are obtained at the another coordinates. To improve
the spatial resolution by reducing the subset size, such error profile must be identified
and eliminated.
Then the actual displacement for the target S0 can be obtained. To apply the
proposed error elimination method for actual deformation measurements, image
capturing of a single rigid body rotation and some rigid body translations of the
relative position of the measurement object and the camera at the initial state is
required before the deformation measurement.
1.5 Summary
In this study, it was found that the existence of the gaps between the micro-lenses
and the shape of the micro-lenses affected the error profiles by using the imaging
process simulation. When the subset size was not large enough, complex error profile
was obtained. For improving spatial resolution, the error elimination method using
Lagrange polynomial with additional shift amount data was proposed by the authors.
It is expected that practical verifications and optimizations of the proposed method
will be performed and highly accurate displacement measurements with high spatial
resolution will be possible.
References
1. Sutton, M.A., Wolters, W.J., Peters, W.H., Ranson, W.H., McNeill, W.R.: Determination of
displacements using an improved digital correlation method. Image Vis. Comput. 1(3), 133–139
(1983)
2. Schreier, H.W., Braasch, J.R., Sutton, M.A.: Systematic errors in digital image correlation caused
by intensity interpolation. Opt. Eng. 39(11), 2915–2921 (2000)
3. Schreier, H.W., Sutton, M.A.: Systematic errors in digital image correlation due to undermatched
subset shape functions. Exp. Mech. 42(3), 303–310 (2002)
1 Investigation of Systematic Error Characteristics and Error … 9
4. Arikawa, S., Yoshida, R., Yoneyama, S., Fujimoto, Y., Omoto, Y.: A method for eliminating
periodical error for highly accurate measurement in digital image correlation. In: Proceedings
of the International Conference on Advanced Technology in Experimental Mechanics 2015,
p. 31 (2015)
5. Arikawa, S., Murata, M., Yoneyama, S., Fujimoto, Y., Omoto, Y.: Elimination of periodical
error for bi-directional displacement in digital image correlation method. In: Advancement of
Optical Methods in Experimental Mechanics, vol. 3. Conference Proceedings of the Society for
Experimental Mechanics Series, pp. 151–155 (2017)
6. Arikawa, S., Kume, Y., Zhang, Y., Yoneyama, S., Fujimoto, Y.: Investigation of error generation
mechanism in digital image correlation based on imaging process simulation (in Japanese). J.
Jpn. Soc. Exp. Mech. 18(1), 37–42 (2018)
Chapter 2
Simultaneous Identification
of Two-Independent Viscoelastic
Characteristics with the Virtual Fields
Method
Abstract In this study, a method for determining the viscoelastic material properties
from displacement fields is proposed. Stress-strain relationship represented by the
superposition integral is employed as the viscoelastic constitutive equation. Thus, the
unknown properties are relaxation bulk and shear moduli. The virtual fields method
based on the principle of virtual work is used as a method for the inverse analysis.
The unknown material properties are determined by solving nonlinear simultaneous
equations of the virtual work containing the constitutive equations. The validity of the
proposed method is demonstrated by identifying the viscoelastic properties of a soft
epoxy resin. Results show that the two independent viscoelastic material properties
can be identified by proposed method.
2.1 Introduction
data in the experiment. The relaxation bulk and shear moduli can be determined from
the relation between the relaxation modulus and the viscoelastic Poisson’s ratio [3,
4]. However, viscoelastic Poisson’s ratio has been frequently treated as a constant.
In this case, it is difficult to obtain the viscoelastic material properties correctly.
There is a method for obtaining the relaxation bulk modulus and the relaxation shear
modulus directly, but research to measure them at the same time is not sufficient [5].
Two independent viscoelastic material properties should be obtained simultaneously
on the same specimen under the same conditions [6]. This is described by Tschoegl
et al. [7] as the standard protocol of the material properties evaluation of viscoelastic
solids.
In this study, a method for determining the viscoelastic material properties from
measured displacement distributions is proposed. Stress-strain relationship repre-
sented by convolution integral is employed as the viscoelastic constitutive equation.
Thus, the unknown parameters in material properties are relaxation bulk modulus and
relaxation shear modulus. The virtual fields method (VFM) based on the principle
of virtual work is used as a method for the inverse analysis. The unknown material
properties are determined by solving the nonlinear simultaneous equation of virtual
work substituted into the constitutive equations. The validity of the proposed method
is demonstrated by identifying the viscoelastic properties of soft epoxy resin. Results
show that the material properties are identified by proposed method.
The principle of virtual work can be written that the work done by the external forces
by the virtual displacement is zero when the object in equilibrium under various forces
is given arbitrary virtual displacements. The principle of virtual work is expressed
by the following equation.
σi j εi∗j d = Ti u i∗ d (2.1)
q
where σij represents the stress components, ε*ij expresses the virtual strain compo-
nents, u*i gives the virtual displacement, T i is the traction (the external force compo-
nents), i and j are the x and y directions, is the inside of the object, and is the
boundary of the object. As shown in Fig. 2.1, is composed of Dirichlet boundary
u and Neumann boundary q .
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